AD AD9229BCP-50

Quad 12-Bit, 50/65 MSPS
Serial LVDS 3V A/D Converter
Preliminary Technical Data
AD9229
FEATURES
•
•
•
•
•
•
•
•
•
•
•
Four ADCs in one package
Serial LVDS digital output data rates (ANSI-644)
Data clock output provided
On Chip Reference and SHA
SNR = 70 dB at Fin up to Nyquist
Excellent Linearity:
−
DNL = ±0.3 LSB (Typical)
−
INL = ±0.6 LSB (Typical)
500 MHz full power analog bandwidth
Per Channel Core Power Dissipation = 270mW at 65MSPS /
200mW at 50MSPS
1 Vpp – 2 Vpp input voltage range
+3.0 V supply operation
Power down mode
FUNCTIONAL BLOCK DIAGRAM
The AD9229 is a quad 12-bit monolithic sampling analog–to–
digital converter with an on–chip track–and–hold circuit and is
designed for low cost, low power, small size and ease of use. The
product operates up to a 65 MSPS conversion rate and is optimized
for outstanding dynamic performance where a small package size is
critical.
The ADC requires a single+3.0 V power supply and a TTL/CMOS
compatible sample rate clock for full performance operation. No
external reference or driver components are required for many
applications. A separate output power supply pin supports LVDS
compatible serial digital output levels.
Pipeline
ADC
SHA
Pipeline
ADC
VIN+C
VIN-C
SHA
Pipeline
ADC
VIN+D
VIN-D
SHA
Pipeline
ADC
Serial
LVDS
D1+A
D1-A
Serial
LVDS
D1+B
D1-B
Serial
LVDS
D1+C
D1-C
Serial
LVDS
D1+D
D1-D
12
VIN-B
12
12
VREF
SENSE
REFT
REFB
+
-
FCO+
FCO-
0.5 V
Ref
Select
Data Rate
Multiplier
AGND
LVDSBIAS
DCO+
DCO-
CLK
Figure 1. Functional Block Diagram
signal a new output byte. Power down is supported and consumes
less than 3mW when enabled.
Fabricated on an advanced CMOS process, the AD9229 is available
in a 48-LFCSP package specified over the industrial temperature
range (–40°C to +85°C).
PRODUCT HIGHLIGHTS
1.
2.
3.
4.
The ADC automatically multiplies up the sample rate clock for the
appropriate LVDS serial data rate. An MSB trigger is provided to
DRGND
12
SHA
VIN+B
Digital beam forming systems in ultrasound
Wireless and wired broadband communications
Communications test equipment
Radar and satellite imaging sub-systems
PRODUCT DESCRIPTION
DRVDD
AD9229
VIN+A
VIN-A
APPLICATIONS
•
•
•
•
PDWN
AVDD
Four analog-to-digital converters are contained in one small,
space saving package.
A Data Clock Output (DCO) is provided which operates up to
390 MHz.
The outputs of each ADC are serialized with a maximum data
output rate of 780 Mbps (12-bits x 65 MSPS).
The AD9229 operates from a single +3.0 V analog power
supply.
Rev. PrF 10/06/2003
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its
use. No license is granted by implication or otherwise under any patent or patent
rights of Analog Devices. Trademarks and registered trademarks are the property
of their respective companies.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703
© 2003 Analog Devices, Inc. All rights reserved.
AD9229
Preliminary Technical Data
TABLE OF CONTENTS
AD9229—Specifications ........................................................................ 3
Analog Inputs ....................................................................................11
DIGITAL SPECIFICATIONS ........................................................... 4
Voltage Reference..............................................................................11
AC SPECIFICATIONS....................................................................... 4
Digital Outputs ..................................................................................11
SWITCHING SPECIFICATIONS.................................................... 5
Timing ................................................................................................11
EXPLANATION OF TEST LEVELS................................................ 5
PLL ......................................................................................................11
Absolute Maximum Ratings .................................................................. 6
Pin Function Descriptions ...................................................................12
EQuivalent circuits.................................................................................. 7
Pin Configurations ................................................................................13
TYPICAL PERFORMANCE CHARACTERISTICS ......................... 8
Timing Diagram ....................................................................................14
Theory of Operation ............................................................................. 11
Ordering Guide .................................................................................15
REVISION HISTORY
Revision PrA: Initial Version
Revision PrB: Added Definition and Theory of Operation sections, updated Pin Configurations
Revision PrC: Deleted demux outputs
Revision PrD: Added Pin Info, Package Info
Revision PrE: Ch. 3.3V to 3.0V for supply, Updated Sinad spec typo, Added analog typical Cin, Overange Recovery Time, Latency
Revision PrF: Added 50MSPS Grade, Removed Clk-, Updated Power, SNR,LVDS Rset, Tpd Estimates, Added Equiv Ckts, Added FFT, VREF
figure, Corrected FCO, DCO polarity timing
Rev. PrF | Page 2 of 15
Oct. 6, 2003
Preliminary Technical Data
AD9229
AD9229—SPECIFICATIONS1
AVDD = 3.0V, DRVDD = 3.0V; INTERNAL REFERENCE; DIFFERENTIAL ANALOG INPUTS,MAXIMUM SAMPLE RATE,TMIN TO
TMAX, UNLESS OTHERWISE NOTED
Temp
Parameter
Test
Level
AD9229BCP-50
Min
RESOLUTION
ACCURACY
ANALOG INPUTS
POWER SUPPLY
Min
Typ
No Missing Codes
Full
VI
Offset Error
25°C
I
± 0.5
± 0.5
Gain Error
25°C
I
± 0.5
± 0.5
Offset Matching
25°C
I
Gain Matching2
25°C
I
Differential Nonlinearity (DNL)
25°C
Full
I
Offset Error
Gain Error2
Full
V
Reference
Full
V
25°C
Full
Full
Full
I
Output Current
Input Current
Input Resistance
Differential Input Voltage Range
Common Mode Voltage
Input Capacitance
Analog Bandwidth, Full Power
AVDD
Full
Full
Full
Full
Unit
Max
12
Guaran
teed
Bits
mV
%FS
mV
% FS
± 0.3
VI
I
25°C
Full
Full
Internal Reference Voltage
REFERENCE
Max
12
Guaran
teed
Integral Nonlinearity (INL)
TEMPERATURE
DRIFT
Typ
AD9229BCP-65
± 0.6
± 0.3
LSB
± 0.6
LSB
LSB
VI
V
LSB
ppm/°C
ppm/°C
0.5
ppm/°C
V
0.5
V
V
V
uA
uA
1 –2
1.5
7
500
V
V
V
IV
2.7
2.7
1 –2
1.5
7
500
3.0
3.6
2.7
3.0
3.6
2.7
3.0
3.6
3.0
3.6
kΩ
Vpp
V
pF
MHz
V
DRVDD
Full
IV
Power Dissipation3
Power Down Dissipation
Power Supply Rejection Ratio (PSRR)
Full
Full
VI
VI
I
940
<3
1250
<3
mW
mW
mV/V
VI
VI
VI
268
28
18
367
30
19
mA
mA
IAVDD3
IDRVDD3
IPLLVDD3
25°C
Full
Full
Full
Table 1: DC Specifications
1
Specifications subject to change without notice
Gain error and gain temperature coefficients are based on the ADC only (with a fixed 0.5 V external reference and a 1 V p-p differential analog input).
3
Power dissipation measured with rated encode and a dc analog input (Outputs Static, IVDD = 0.). IVCC and IVDD measured with TBD MHz analog input @ 0.5dBFS.
2
Rev. PrF | Page 3 of 15
Oct. 6, 2003
V
AD9229
Preliminary Technical Data
DIGITAL SPECIFICATIONS
AVDD = 3.0V, DRVDD = 3.0V
Parameter
CLOCK INPUT
PDWN INPUT
DIGITAL OUTPUTS
(LVDS Mode)*
*
VIH
VIL
Input Capacitance
Logic ‘1’ Voltage
Logic ‘0’ Voltage
Input Capacitance
Differential Output Voltage
(VOD)
Output Offset Voltage (VOS)
Output Coding
Temp
Test
Level
Full
Full
IV
IV
IV
2.0
IV
IV
IV
IV
2.0
25°C
Full
Full
Full
Full
Full
Full
IV
IV
AD9229BCP-50
Min
Typ
Unit
AD9229BCP-65
Max
Min
Typ
Max
2.0
0.8
0.8
2
2
2.0
0.8
0.8
2
247
1.125
2
454
247
1.375
1.125
454
1.375
Offset Binary
V
V
pF
V
V
PF
mV
V
Offset Binary
Table 2: Digital Specifications
LVDS Rset resistor = 3.6K, LVDS Output Termination Resistor= 100 Ohms.
AC SPECIFICATIONS1
AVDD = 3.0 V, DRVDD = 3.0V; INTERNAL REFERENCE; DIFFERENTIAL ANALOG INPUTS,MAXIMUM SAMPLE RATE,TMIN TO
TMAX, UNLESS OTHERWISE NOTED
Parameter
SIGNAL TO NOISE
RATIO (SNR) –
Without
Harmonics
SIGNAL TO NOISE
RATIO (SINAD) –
With Harmonics
EFFECTIVE
NUMBER OF BITS
(ENOB)
SPURIOUS FREE
DYNAMIC RANGE
(SFDR)
SECOND AND
THIRD
HARMONIC
DISTORTION
TWO TONE
INTERMOD
DISTORTION
(IMD)
1
Temp
Test
Level
AD9229BCP-50
Min
Typ
Max
AD9229BCP-65
Min
Typ
70.5
70.5
69.7
69.7
Unit
Max
fIN= 10.3 MHz
25°C
V
fIN= 19.6 MHz
25°C
V
fIN= 32.5 MHz
25°C
I
fIN= 51 MHz
25°C
V
fIN= 10.3 MHz
25°C
V
fIN= 19.6 MHz
25°C
V
fIN= 32.5 MHz
25°C
I
fIN= 51 MHz
25°C
V
dB
fIN= 10.3 MHz
25°C
V
Bits
fIN= 19.6 MHz
25°C
V
Bits
fIN= 32.5 MHz
25°C
I
Bits
fIN= 51 MHz
25°C
V
Bits
fIN= 10.3 MHz
25°C
V
dB
fIN= 19.6 MHz
25°C
V
fIN= 32.5 MHz
25°C
I
dB
fIN= 51 MHz
25°C
V
dB
fIN= 10.3 MHz
25°C
V
dBc
fIN= 19.6 MHz
25°C
V
fIN= 32.5 MHz
25°C
I
dBc
fIN= 51 MHz
25°C
V
dBc
fIN1= 19 MHz, fIN2= 20 MHz
25°C
V
fIN1= xx MHz, fIN2= xx MHz
25°C
V
dB
dB
dB
70.3
70.3
69.5
69.5
dB
dB
85
-85
-85
85
-85
-85
dB
dB
dBc
dBc
dBc
SNR/harmonics based on an analog input voltage of –0.5 dBFS referenced to a 1 Vpp full-scale input range.
Rev. PrF | Page 4 of 15
dB
Oct. 6, 2003
Preliminary Technical Data
Parameter
CROSSTALK
AD9229
Temp
Test
Level
Full
V
AD9229BCP-50
Min
Typ
AD9229BCP-65
Max
Min
Typ
Unit
Max
-80
-80
dB
AD9229BCP-50
AD9229BCP-65
Table 3: AC Specifications
SWITCHING SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V; DIFFERENTIAL ENCODE INPUT
Parameter
CLOCK
OUTPUT
PARAMETERS IN
LVDS MODE
APERTURE
Clock Rate
Clock Pulse Width High (tEH)
Clock Pulse Width Low (tEL)
Valid Time (tV)1
Propagation Delay (tPD) 1
MSB Propagation Delay (tMSB) 1
Rise Time (tR) (20% to 80%)
Fall Time (tF) (20% to 80%)
DCO Propagation Delay (tCPD)
Data to DCO Skew (tPD – tCPD)
Pipeline Latency
Aperture Delay (tA)
Aperture Uncertainty (Jitter)
Out of Range
Recovery Time
Temp
Test
Level
Full
Full
Full
Full
Full
Full
Full
Full
Full
Full
Full
VI
IV
IV
VI
VI
VI
V
V
VI
IV
VI
V
25°C
25°C
Full
Min
Typ
10
V
IV
Max
50
Min
Typ
10
Unit
Max
65
5
5
5
5
5
5
9
9
<1
<1
2
ps rms
2
Table 4: Switching Specifications
EXPLANATION OF TEST LEVELS
TEST LEVEL
I
100% production tested.
II
100% production tested at +25°C and guaranteed by design and characterization at specified temperatures.
III
Sample tested only.
IV
Parameter is guaranteed by design and characterization testing.
V
Parameter is a typical value only.
VI
100% production tested at +25°C and guaranteed by design and characterization for industrial temperature range.
tV and tPD are measured from the transition points of the CLK input to the 50%/50% levels of the digital outputs swing. The digital output load during test is
not to exceed an ac load of 5 pF or a dc current of ±40 µA. Rise and fall times measured from 20% to 80%.
1
Rev. PrF | Page 5 of 15
Oct. 6, 2003
MSPS
ns
ns
ns
ns
ns
ns
ns
ns
ns
cycles
ps
cycles
AD9229
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
Parameter
Electrical
Environmental
Rating
AVDD Voltage
DRVDD Voltage
Analog Input Voltage
Analog Input Current
Digital Input Voltage
Digital Output Current
VREF Input Voltage
Operating Temperature Range (Ambient)
3.9V
3.9V
Maximum Junction Temperature
Lead Temperature (Soldering, 10 sec)
Maximum Case Temperature
Storage Temperature Range (Ambient)
150°C
-40°C to +85°C
Table 5: Absolute Maximum Ratings
Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Rev. PrF | Page 6 of 15
Oct. 6, 2003
Preliminary Technical Data
AD9229
EQUIVALENT CIRCUITS
DRVDD
AVDD
3.5MA
ANALOG IN
V-
V+
DATAOUT-,
DCO-,FCO-
DATAOUT+,
DCO+,FCO+
V+
V-
Figure 2 Analog Inputs
3.5MA
Figure 4 LVDS Outputs
AVDD
AVDD
AVDD
AVDD
PDWN
CLK
Figure 5 PDWN Input
Figure 3 Clock Input
Rev. PrF | Page 7 of 15
Oct. 6, 2003
TYPICAL PERFORMANCE CHARACTERISTICS
0
-20
dB
-40
SNR = 68.7 dB
SINAD = 68.5 dB
SFDR = 88.6 dB
-60
-80
-100
-120
0
5
10
15
20
MHz
Measured FFT Performance 32MHz Ain at 65MSPS
25
30
Preliminary Technical Data
AD9229
Definitions
ANALOG BANDWIDTH
ENCODE PULSE WIDTH/DUTY CYCLE
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Pulse width high is the minimum amount of time that the
ENCODE pulse should be left in logic “1” state to achieve rated
performance; pulse width low is the minimum time ENCODE
pulse should be left in low state. See timing implications of
changing tENCH in text. At a give clock rate, these specs define an
acceptable Encode duty cycle.
APERTURE DELAY
The delay between the 50% point of the rising edge of the
ENCODE command and the instant at which the analog input is
sampled.
FULL SCALE INPUT POWER
Expressed in dBm. Computed using the following equation:
APERTURE UNCERTAINTY (JITTER)
The sample-to-sample variation in aperture delay.
PowerFullscale
CROSSTALK
Coupling onto one channel being driven by a low level (-40 dBFS)
signal when the adjacent interfering channel is driven by a fullscale signal.
2
 V Fullscale
rms

 Z Input
= 10 log
 .001









GAIN ERROR
DIFFERENTIAL ANALOG INPUT RESISTANCE,
DIFFERENTIAL ANALOG INPUT CAPACITANCE, AND
DIFFERENTIAL ANALOG INPUT IMPEDANCE
The real and complex impedances measured at each analog input
port. The resistance is measured statically and the capacitance and
differential input impedances are measured with a network
analyzer.
DIFFERENTIAL ANALOG INPUT VOLTAGE RANGE
The peak to peak differential voltage that must be applied to the
converter to generate a full scale response. Peak differential voltage
is computed by observing the voltage on a single pin and
subtracting the voltage from the other pin, which is 180 degrees out
of phase. Peak to peak differential is computed by rotating the
inputs phase 180 degrees and taking the peak measurement again.
Then the difference is computed between both peak measurements.
DIFFERENTIAL NONLINEARITY
Gain error is the difference between the measured and ideal full
scale input voltage range of the worst ADC.
GAIN MATCHING
Expressed in %FSR. Computed using the following equation:
GainMatching =
FSR max − FSR min
* 100%
 FSR max + FSR min 


2


where FSRmax is the most positive gain error of the ADCs and
FSRmin is the most negative gain error of the ADCs.
HARMONIC DISTORTION, SECOND
The ratio of the rms signal amplitude to the rms value of the
second harmonic component, reported in dBc.
HARMONIC DISTORTION, THIRD
The deviation of any code width from an ideal 1 LSB step.
The ratio of the rms signal amplitude to the rms value of the third
harmonic component, reported in dBc.
EFFECTIVE NUMBER OF BITS
The effective number of bits (ENOB) is calculated from the
measured SNR based on the equation:
INTEGRAL NONLINEARITY
The deviation of the transfer function from a reference line
measured in fractions of 1 LSB using a “best straight line”
determined by a least square curve fit.
SNRMEASURED − 1.76dB
ENOB =
6.02
Rev. PrF | Page 9 of 15
Oct. 6, 2003
AD9229
Preliminary Technical Data
MINIMUM CONVERSION RATE
The encode rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed limit.
the rms value of the sum of all other spectral components,
including harmonics but excluding dc.
SIGNAL-TO-NOISE RATIO (WITHOUT HARMONICS)
The encode rate at which parametric testing is performed.
The ratio of the rms signal amplitude (set at 1 dB below full scale)
to the rms value of the sum of all other spectral components,
excluding the first five harmonics and dc.
OFFSET ERROR
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
Offset error is the difference between the measured and ideal
voltage at the analog input that produces the midscale code at the
outputs. Offset error is given for the worst ADC.
The ratio of the rms signal amplitude to the rms value of the peak
spurious spectral component. The peak spurious component may
or may not be a harmonic. It also may be reported in dBc (i.e.,
degrades as signal level is lowered) or dBFS (i.e., always related back
to converter full scale).
MAXIMUM CONVERSION RATE
OFFSET MATCHING
Expressed in mV. Computed using the following equation:
OffsetMatching = OFF max − OFF min
where OFFmax is the most positive offset error and OFFmin is the
most negative offset error.
TWO-TONE INTERMODULATION DISTORTION
REJECTION
The ratio of the rms value of either input tone to the rms value of
the worst third order intermodulation product; reported in dBc.
TWO-TONE SFDR
OUTPUT PROPAGATION DELAY
The delay between a differential crossing of CLK+ and CLK- and
the time when all output data bits are within valid logic levels.
NOISE (FOR ANY RANGE WITHIN THE ADC)
Vnoise = Z * .001 * 10
The ratio of the rms value of either input tone to the rms value of
the peak spurious component. The peak spurious component may
or may not be an IMD product. It also may be reported in dBc (i.e.,
degrades as signal level is lowered) or in dBFS (i.e., always relates
back to converter full scale).
WORST OTHER SPUR
 FS dBm − SNRdBc − Signal dBFS 


10


Where Z is the input impedance, FS is the full scale of the device
for the frequency in question, SNR is the value for the particular
input level and Signal is the signal level within the ADC reported in
dB below full scale. This value includes both thermal and
quantization noise.
POWER SUPPLY REJECTION RATIO
The ratio of the rms signal amplitude to the rms value of the worst
spurious component (excluding the second and third harmonic)
reported in dBc.
TRANSIENT RESPONSE TIME
Transient response time is defined as the time it takes for the ADC
to reacquire the analog input after a transient from 10% above
negative full scale to 10% below positive full scale.
The ratio of a change in input offset voltage to a change in power
supply voltage.
OUT-OF-RANGE RECOVERY TIME
SIGNAL-TO-NOISE-AND-DISTORTION (SINAD)
Out of range recovery time is the time it takes for the ADC to
reacquire the analog input after a transient from 10% above positive
full scale to 10% above negative full scale, or from 10% below
negative full scale to 10% below positive full scale.
The ratio of the rms signal amplitude (set 1 dB below full scale) to
Rev. PrF | Page 10 of 15
Oct. 6, 2003
Preliminary Technical Data
AD9229
THEORY OF OPERATION
recommended to keep the trace length no longer than 1–2 inches
and to keep differential output trace lengths as equal as possible.
Analog Inputs
For best dynamic performance, the source impedances driving
VIN+ and VIN– should be matched such that common-mode
settling errors are symmetrical. These errors will be reduced by the
common-mode rejection of the A/D.
The format of the output data is offset binary.
Timing
Data from each A/D is serialized and provided on a separate
channel.
Voltage Reference
The AD9229 has a stable and accurate reference voltage on chip,
which sets the full-scale voltage at the analog input channels.
Internal reference mode is established by grounding the SENSE pin.
(Recommended decoupling capacitors shown below) The internal
reference can be bypassed by setting SENSE to AVDD and driving
VREF with an external 1V reference.
Two output clocks are provided to assist in capturing data from the
AD9229. The data clock out (DCO) is used to clock the output
data and is equal to 6 times the sample clock frequency. ( 390MHz
for 65MHz input clock) Data is clocked out of the AD9229 on the
rising and falling edges of DCO. The FCO clock signals the start of
a new serial word, the rising edge of FCO occurs at the start of an
MSB.
VINA
VINB
PLL
REFT
0.1 uF
ADC
CORE
10 uF
0.1uF
REFB
The AD9229 contains an internal PLL that is used to generate
internal clocking signals, if the PLL is unlocked, the data outputs
are static.
0.1 uF
VREF
10 uF
0.5V
0.1u F
SELECT
LOGIC
SENSE
AD9229
Internal Reference Mode Connection
Digital Outputs
The AD9229’s differential outputs conform to the ANSI-644 LVDS
standard. To set the LVDS bias current, place a resistor (RSET is
nominally equal to 3.6 kΩ) to ground at the LVDSBIAS pin. The
RSET resistor current (~ 1.2/RSET) is ratioed on-chip setting the
output current at each output equal to a nominal 3.5 mA. A 100 Ω
differential termination resistor placed at the LVDS receiver inputs
results in a nominal 350 mV swing at the receiver.
The AD9229’s LVDS outputs facilitate interfacing with LVDS
receivers in custom ASICs and FPGAs that have LVDS capability
for superior switching performance in noisy environments. Single
point-to-point net topologies are recommended with a 100 Ω
termination resistor as close to the receiver as possible. It is
Rev. PrF | Page 11 of 15
Oct. 6, 2003
AD9229
Preliminary Technical Data
PIN FUNCTION DESCRIPTIONS
Pin No.
Name
8,16,21,
29
9,12,15,
22,25,28,
31
2,35
AVDD
Description
Pin No.
Name
3.0 V Analog Supply
44
D+A
ADC A True Digital Output
AGND
Analog Ground
43
D-A
ADC A Complement Digital Output
DRVDD
3.0 V Digital Output Supply
42
D+B
ADC B True Digital Output
1,36
32
DRGND
PLLVDD
Digital Ground
41
40
D-B
D+C
ADC B Complement Digital Output
ADC C True Digital Output
33
30
18
17
20
19
10
11
14
13
23
24
27
26
PLLGND
CLK
VREF
SENSE
REFT
REFB
VIN+A
VIN-A
VIN+B
VIN-B
VIN+C
VIN-C
VIN+D
VIN-D
PLL Ground
Input Clock
Voltage Reference Input/Output
Reference Mode Selection
Differential Reference (Positive)
Differential Reference (Negative)
ADC A Analog Input – True
ADC A Analog Input – Complement
ADC B Analog Input – True
ADC B Analog Input – Complement
ADC C Analog Input – True
ADC C Analog Input – Complement
ADC D Analog Input – True
ADC D Analog Input – Complement
39
38
37
48
47
46
45
34
7
3,4,5,6
D-C
D+D
D1-D
DCO+
DCOFCO+
FCOLVDSBIAS
PDWN
DNC
PLL 3.0V Supply
Description
ADC C Complement Digital Output
ADC D True Digital Output
ADC D Complement Digital Output
Data Clock Output – True
Data Clock Output – Complement
Frame Clock Indicator – True Output
Frame Clock Indicator – Complement Output
LVDS Output Current Set Resistor Pin
Power Down Selection ( Logic ‘1’ = Power Down )
Do Not Connect
Table 6: Pin Function Descriptions
Rev. PrF | Page 12 of 15
Oct. 6, 2003
Preliminary Technical Data
AD9229
DRGND
48
1
D-D
D+D
D-C
D+C
D-B
D+B
D-A
D+A
FCO-
FCO+
DCO-
DCO+
PIN CONFIGURATIONS
37
36
DRGND
DRVDD
DRVDD
DNC
LVDSBIAS
DNC
PLLGND
DNC
PLLVDD
AD9229
DNC
PDWN
AGND
CLK
AVDD
AVDD
AGND
AGND
VIN+A
VIN+D
VIN-A
VIN-D
AGND
VIN-C
VIN+C
AGND
REFT
Rev. PrF | Page 13 of 15
AVDD
REFB
VREF
AVDD
SENSE
AGND
25
24
VIN+B
12
13
VIN-B
AGND
Oct. 6, 2003
AD9229
Preliminary Technical Data
TIMING DIAGRAM
N-1
AIN
tA
N
tEH
tEL
CLK
Data
Out
DCO+
tPD
LSB MSB D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
LSB MSB
tCPD
DCOFCO-
tFPD
FCO+
Figure 6: Serial LVDS Outputs
NOTE : Latency = 9 cycles
Rev. PrF | Page 14 of 15
Oct. 6, 2003
Preliminary Technical Data
AD9229
OUTLINE DIMENSIONS
Figure 7
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features proprietary
ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges.
Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Ordering Guide
Model
AD9229BCP-50
Temperature Range
AD9229BCP-65
-40°C to +85°C (Ambient)
25°C (Ambient)
AD9229/PCB
-40°C to +85°C (Ambient)
Description
48-LFCSP
48-LFCSP
Evaluation Board ( Supplied with –65 Grade )
Table 7: Ordering Guide
© 2002 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective companies.
Printed in the U.S.A.
C02959-0-11/02(0)
Rev. PrF | Page 15 of 15
Oct. 6, 2003