TI BQ29330DBTRG4

bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
2-SERIES, 3-SERIES, AND 4-SERIES CELL LITHIUM-ION OR
LITHIUM-POLYMER BATTERY PROTECTION AFE
Check for Samples: bq29330
FEATURES
1
•
•
•
•
•
•
•
2-Series, 3-Series, or 4-Series Cell Protection
Control
Can Directly Interface with the bq803x-Based
Gas Gauge Family
Watchdog and POR for the Host
Provides Individual Cell Voltages and Battery
Voltage to Battery Management Host
Capable of Operation With 5-mΩ Sense
Resistor Integrated Cell Balancing Drive
I2C Compatible User Interface Allows Access
to Battery Information
Programmable Threshold and Delay for
Overload Short Circuit in Discharge and Short
Circuit in Charge
•
•
•
•
•
•
NMOS FET Drive for Charge and Discharge
FETs
Host Control can Initiate Sleep and Ship Power
Modes
Integrated 2.5-V, 16-mA LDO
Integrated 3.3-V, 25-mA LDO
Supply Voltage Range from 4.5 V to 28 V
Low Supply Current of 100 μA Typical
APPLICATIONS
•
•
•
Notebook Computers
Medical and Test Equipment
Instrumentation and Measurement Systems
DESCRIPTION
The bq29330 is a 2-series, 3-series, and 4-series cell lithium-ion battery pack full-protection analog front end
(AFE) IC that incorporates a 2.5-V, 16-mA and 3.3-V, 25-mA low dropout regulator (LDO). The bq29330 also
integrates an I2C-compatible interface to extract battery parameters such as battery voltage, individual cell
voltages, and control output status. Other parameters such as current protection thresholds and delays can also
be programmed into the bq29330 to increase the flexibility of the battery management system.
SYSTEM DIAGRAM
Discharge / Charge /
Precharge FETs
Fuse
Pack +
Oscillator and PLL
System Interface
2K Bytes of
Data Flash
6K x 22
Mask ROM
Nch FET Drive
(Charge Pumps)
32.768 kHz
Watchdog &
Protection Timing
I2 C
System Interface
RAM Configuration, Status
and Control Registers
2K Bytes
of RAM
24K x 22 Program
Flash
LDO +
Reset
T1
TOUT and LEDOUT
Power Support
Standard Delta-Sigma A-to-D Converter
Analog Output Drive
Integrating Delta-Sigma A-to-D Converter
2-Tier Overcurrent
Protection
Precharge
Control
Cell, Bat and Pack
Voltage Translation
Host Interface UART
& Data Management
Internal
Only
SMBus
HDQ
UART
2.5 V
Reset
Cell Balancing Drive
16 Dig GPIO & Peripherals
8 Dig GPIO or Analog GPI
Pack –
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2012, Texas Instruments Incorporated
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The bq29330 provides safety protection for overload, short circuit in charge, and short circuit in discharge
conditions and can also provide cell overvoltage, battery overvoltage and battery undervoltage protection with the
battery management host. In overload, short circuit in charge and short circuit in discharge conditions, the
bq29330 turns off the FET drive autonomously, depending on the internal configuration setting. The
communications interface allows the host to observe and control the status of the bq29330, enable cell
balancing, enter different power modes, set current protection levels, and set the blanking delay times.
Cell balancing of each cell can be performed via a cell bypass path integrated into the bq29330, which can be
enabled via the internal control register accessible via the I2C-compatible interface. The maximum bypass current
is set via an external series resistor and internal FET on resistance (typ. 400 Ω).
ORDERING INFORMATION (1)
PACKAGE
TA
TSSOP(DBT)
–40°C to 110°C
(1)
(2)
(2)
QFN(RSM) (2)
bq29330DBT
bq29330RSM
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
The bq29330 can be ordered in tape and reel by adding the suffix R to the orderable part number, i.e., bq29330DBTR.
SPACER
THERMAL INFORMATION
bq29330
THERMAL METRIC
(1)
TSSOP (DBT)
QFN (RSM)
30 PINS
32 PINS
θJA, High K
Junction-to-ambient thermal resistance
81.4
37.4
θJC(top)
Junction-to-case(top) thermal resistance
16.2
30.6
θJB
Junction-to-board thermal resistance
34.1
7.7
ψJT
Junction-to-top characterization parameter
0.4
0.4
ψJB
Junction-to-board characterization parameter
33.6
7.5
θJC(bottom)
Junction-to-case(bottom) thermal resistance
N/A
2.6
(1)
2
UNITS
°C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
PACKAGE OPTION PIN DIAGRAMS
SRN
6
25
WDI
TOUT
SRP
VC5
7
24
LEDOUT
8
23
VC4
9
22
SDATA
SCLK
26
26
XRST
5
25
NC
CELLXALERT
27
27
SCLK
VSS
28
28
30
3
4
29
SDATA
XRST
XALERT
29
VSS
30
2
31
1
32
CELLCELL+
REG
REG
CELL+
RSM PACKAGE
(TOP VIEW)
TSSOP PACKAGE
(TOP VIEW)
TOUT
SRP
3
22
LEDOUT
VC5
4
21
VSS
VSS
VC4
5
20
NC
PMS
VC3
VC2
6
19
7
18
PMS
GPOD
VC1
8
17
ZVCHG
12
19
VCC
13
18
NC
CHG
14
17
PACK
NC
15
16
DSG
BAT
VC1
BAT
ZVCHG
16
VC2
PACK
VCC
GPOD
20
NC
21
11
NC
CHG
NC
DSG
10
9
VC3
15
23
14
2
13
WDI
NC
12
24
11
1
10
SRN
PIN FUNCTIONS
PIN
NAME
DESCRIPTION
DBT NO.
RSM NO.
CELL–
1
28
Output of scaled value of the measured cell voltage.
CELL+
2
29
Output of scaled value of the measured cell voltage.
REG
3
30
Integrated 2.5-V regulator output
VSS
4, 23
31,21
XRST
5
32
Power supply ground
Active-low output
SRN
6
1
Current sense terminal
SRP
7
3
Current sense positive terminal when charging relative to SRN; current sense negative terminal when
discharging relative to SRN
VC5
8
4
Sense voltage input terminal for most negative cell; balance current input for least positive cell.
VC4
9
5
Sense voltage input terminal for least positive cell, balance current input for least positive cell, and return
balance current for third most positive cell.
VC3
10
6
Sense voltage input terminal for third most positive cell, balance current input for third most positive cell,
and return balance current for second most positive cell.
VC2
11
7
Sense voltage input terminal for second most positive cell, balance current input for second most
positive cell, and return balance current for most positive cell.
VC1
12
8
Sense voltage input terminal for most positive cell, balance current input for most positive cell, and
battery stack measurement input
BAT
13
9
Device power supply input
CHG
14
11
Charge pump, charge N-CH FET gate drive
DSG
16
13
Charge pump output, discharge N-CH FET gate drive
PACK
17
15
PACK positive terminal and alternative power source
VCC
19
16
Power supply voltage
ZVCHG
20
17
Connect the precharge P-CH FET drive here
GPOD
21
18
NCH FET open-drain output
PMS
22
19
Determines CHG output state on POR
LEDOUT
24
22
3.3-V output for LED display power supply
TOUT
25
23
Provides thermistor bias current
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
3
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
PIN FUNCTIONS (continued)
PIN
NAME
DESCRIPTION
DBT NO.
RSM NO.
WDI
26
24
Digital input that provides the timing clock for the OC and SC delays and also acts as the watchdog
clock.
SCLK
28
25
Open-drain serial interface clock with internal 10-kΩ pullup to VREG
SDATA
29
26
Open-drain bidirectional serial interface data with internal 10-kΩ pullup to VREG
XALERT
30
27
Open-drain output used to indicate status register changes. With internal 100-kΩ
pullup to VREG
15,18,27
2, 10, 12,
14, 20
NC
Not electrically connected to the IC
FUNCTIONAL BLOCK DIAGRAM
GG VDD
GG RST
PACK–
RZVCHG
PACK+
C
PACK
DSG
CHG
ZVCHG
2nd
Protection
REG
REG
VCC
RST
GG LED
INPUT
LEDOUT
CHG_ON
NCH GATE
DRIVER
PMS
DSG_ON
FET
LOGIC
ZVCHG_ON
3.3-V LDO
GATE DRIVER
C
2.5-V LDO
POR
LED
BAT
VC1
CELL 4
VC2
GG INTERFACE
SDATA
GG INTERFACE
SCLK
WDI
WATCHDOG
TIMER
SHIP_ON
SLEEP_ON
SDATA
SCLK
SERIAL INTERFACE
32 kHz INPUT
FROM GG
CELL
SELECTION
SWITCHES
CELL 2
VC4
CELL 1
OUTPUT CTL
CELL+
STATE CTL
FUNCTION CTL
CELL SEL
0.975V
BAT/25
OLV
PACK/25
CELL VOLTAGE
TRANSLATION
SCC
DRIVE
CONTROL
SCD
OVERLOAD
COMPARATOR
OPEN
DRAIN
OUTPUT
C
CELL–
OLD
TOUT
R
GG ANALOG
INPUT
CELL
GG TS
INPUT
THERM
C
THERM
GND
THERMISTOR
OVERCURRENT
SRP
DELAY
SHORT CIRCUIT
COMPARATOR
SHORT_CIRCUIT
4
CELL 3
VC3
VC5
ALERT TO GG
GPOD
CELL1..4
REGISTERS
STATUS
XALERT
OPEN DRAIN
OUTPUT
POWER
MODE
CIRCUIT
Submit Documentation Feedback
R
SNS
SRN
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
SAFETY STATE DIAGRAM
LEGEND:
UVLO = Undervoltage Lock Out
KEY:
Disabled = OFF and cannot be changed via firmware
Enabled= Can be changed by firmware
No Power Supply
Power Supply to PACK
Power Supply to PACK
UVLO Mode
CHG: OFF
DSG: OFF
ZVCHG: OFF
VREG: OFF
RST: HIGH
I2 C: Disabled
Current Protection: Disabled
VCELL: Disabled
Watchdog: Disabled
Therm, Output: Disabled
Internal
VLED < 2.3 V
Internal VLED> 2.4 V
32 kHz Resumes
FirmwareCommand
32 kHz Input Halted
and tWTO expired
Firmware
Command
No supply PACK
DSG: OFF
voltage
Mode
DSG: OFF
Firmware
Command
Sleep Mode
Firmware
Command
Firmware
Command
WTO Mode
Firmware Command
& No Supply to PACK
Firmware
Command
Normal Mode
CHG: ON
DSG: ON
ZVCHG: OFF
VREG/VLED: 2.5V/3.3V
RST: Driven low after tRST
I2 C: Enabled
Current Protection: Enabled
VCELL: Enabled
Watchdog: Enabled
Therm, Output: Enabled
32 kHz Input Halted
and t WTO expired
CHG: OFF
DSG: OFF
ZVCHG: OFF
VREG/VLED: 2.5 V/3.3 V
RST: Pulsed
I2 C: Enabled
Current Protection: Enabled
VCELL: Enabled
Watchdog: Enabled
Therm, Output: Enabled
Ship Mode
CHG: OFF
DSG: OFF
ZVCHG: OFF
VREG/VLED: OFF/OFF
I2 C: Disabled
Current Protection: Disabled
VCELL: Disabled
Watchdog: Disabled
Therm, Output: Disabled
VSR > VOL or VSCD for a period of tOL or tSCD
Respectively, or VSR > VSCC for a period
of tSCC
Current Protection Mode
CHG: OFF
DSG: OFF
ZVCHG: OFF
VREG/VLED: 2.5 V/3.3 V
I2 C: Enabled
Current Protection: Enabled
VCELL: Enabled
Watchdog: Enabled
Therm, Output: Enabled
CHG: OFF
DSG: OFF
ZVCHG: OFF
VREG/VLED: ON/ON
I2 C: Enabled
Current Protection: Enabled
VCELL: Enabled
Watchdog: Enabled
Therm, Output: Disabled
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
5
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
(2)
bq29330
Supply voltage range
Input voltage range
Output voltage range
(VCC, BAT)
–0.3 to 34
(VC1, VC2, VC3, VC4, PACK, PMS)
–0.3 to 34
(VC5)
–0.3 to 1.0
(SRP, SRN)
–1.0 to 1.0
(VC1 to VC2, VC2 to VC3, VC3 to VC4, VC4
to VC5)
–0.3 to 8.5
(WDI, SCLK, SDATA)
–0.3 to 8.5
(DSG,CHG)
–0.3 to BAT
(ZVCHG)
–0.3 to 34
(GPOD)
–0.3 to 34
(TOUT, SDATA, CELL, XALERT, XRST,
LEDOUT)
–0.3 to 7
(CELL+)
–0.3 to 7
Current for cell balancing
Storage temperature range, Tstg
(1)
(2)
UNIT
V
10
mA
–65 to 150
°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltages are with respect to ground of this device except VCn–VC(n+1), where n=1, 2, 3, 4 cell voltage.
RECOMMENDED OPERATING CONDITIONS
MIN
VI(STARTUP)
Supply voltage ( VCC, BAT)
4.5
Start up voltage (VCC, BAT)
5.5
VC1, VC2, VC3, VC4
VC5
VI
Input voltage range
SRP, SRN
VCn – VC(n+1), (n=1, 2, 3, 4 )
NOM
VIL
VO
VO
Logic level input voltage
SCLK, SDATA, WDI
Output voltage
GPOD
Output voltage range
V
0
0.5
–0.5
0.5
0
5.0
0.8×REG
REG
0
0.2×REG
25
REG
CELL+, CELL–
0.975
CREG
1.0
External LEDOUT capacitor
CLED
2.2
Extend CELL output capacitor
CCELL
IOL
GPOD
6
V
V
μF
μF
1
WDI
V
μF
0.1
RPACK
TA
V
25
XALERT, SDATA, XRST
WDI high time
V
VDD
External 2.5-V REG capacitor
Input frequency
UNIT
25
0
PACK, PMS
VIH
MAX
mA
1
kΩ
32.768
kHz
μs
2
Operating temperature
–25
85
°C
Functional temperature
–40
110
°C
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
ELECTRICAL CHARACTERISTICS
SUPPLY CURRENT, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TA = 25°C
TYP
MAX
UNIT
140
190
μA
220
μA
ICC1
Supply Current 1
No load at REG, LEDOUT, TOUT, XALERT, SCLK, SDATA,
ZVCHG= off, WDI = 32 kHz
VMEN = on, VC5 = VC4 = VC3 = VC2 = VC1 = 0 V
select VC5 = VC4 = 0 V
ICC2
Supply Current 2
No load at REG, LEDOUT TOUT,
XALERT, SCLK, SDATA. ZVCHG = off, WDI = 32 kHz,
VMEN = off
TA = –40°C
to 110°C
105
185
μA
I(SLEEP)
Sleep current
CHG, DSG and ZVCHG = off,
REG = on, VMEN = off, WDI no clock, SLEEP = 1
TA = –40°C
to 110°C
30
50
μA
I(SHUTDOWN)
Shutdown mode
CHG, DSG and ZVCHG = off,
REG = off, VMEN = off, WDI no clock,
VPACK = 0 V, VC1 = VC2 = VC3 = VC4 = 3.5 V
TA = –40°C
to 110°C
0.1
1
μA
2.5
2.59
TA = –40°C
to 110°C
2.5 V LDO, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V, IOUT 33 = 0 mA (unless otherwise noted)
V(REG)
Regulator output
voltage
4.5 V < VCC or BAT ≤ 25 V, IOUT25 ≤ 16 mA
Regulator output
change with
temperature
VCC or BAT = 14 V, IOUT25 = 2 mA
ΔV(EGTEMP)
ΔV(REGLINE)
Line regulation
ΔV(REGLOAD)
I(REGMAX)
Load regulation
Current limit
TA = –40°C
to 110°C
2.41
V
TA = –40°C
to 110°C
±0.2%
5.4 V ≤ VCC or BAT ≤ 25 V, IOUT25 = 2 mA
TA = 25°C
3
10
mV
VCC or BAT = 14 V, 0.2 mA ≤ IOUT25 ≤ 2 mA
TA = 25°C
7
15
mV
VCC or BAT = 14 V, 0.2 mA ≤ IOUT25 ≤ 16 mA
TA = 25°C
15
50
mV
VCC or BAT = 14 V, REG = 2 V
TA = 25°C
16
75
VCC or BAT = 14 V, REG = 0 V
TA = 25°C
5
45
mA
3.3 V LED, TA = 25°C, CREG = 1.0 μF , CL = 2.2 μF, VCC or BAT = 14 V, IOUT25 = 0 mA (unless otherwise noted)
VO(LED)
Regulator output
voltage
4.5 V < VCC or BAT ≤ 25 V, IOUT33 ≤ 10 mA
Regulator output
change with
temperature
VCC or BAT = 14 V, IOUT33 = 2 mA
ΔV(LEDEMP)
ΔV(LEDLINE)
Line regulation
5.4 V ≤ VCC or BAT ≤ 25 V, IOUT33 = 2 mA
ΔV(LEDLOAD)
Load regulation
I(LEDMAX)
Current limit
6.5 V < VCC or BAT ≤ 25 V, IOUT33 ≤ 25 mA
VCC or BAT = 14 V, 0.2 mA ≤ IOUT33 ≤ 2 mA
VCC or BAT = 14 V, 0.2 mA ≤ IOUT33 ≤ 25 mA
VCC or BAT = 14 V, REG = 3 V
VCC or BAT = 14 V, REG = 0 V
TA = –40°C
to 110°C
3
3.3
3.6
3
3.3
3.6
TA = –40°C
to 110°C
±0.2%
TA = 25°C
3
10
7
15
40
100
TA = 25°C
TA = 25°C
V
mV
mV
25
125
12
50
2.4
2.6
V
100
Ω
1
μA
mA
THERMISTOR DRIVE, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
VTOUT
RDS(ON)
ITOUT = 0 mA
TOUT Pass-element
series resistance
ITOUT = –1 mA at TOUT pin,
RDS(ON) = [VREG – VOUT (TOUT)] / 1 mA
TA = –40°C
to 110°C
50
SHUTDOWN WAKE, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
VSTARTUP
PACK Exit shutdown
threshold
VCC or BAT = 14 V, PACK = 1.4 V
POR, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
VPOR
VREGTH–
Hysteresis
(Vregth+ – Vregth–)
–3%
1.8
3%
V
50
150
250
mV
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
7
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
ELECTRICAL CHARACTERISTICS (Continued)
CELL VOLTAGE MONITOR, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
V(CELLOUT)
REF
MIN
TYP
MAX
VCn – VCn+1 = 0 V, 8 V ≤ VDD ≤ 25 V
TEST CONDITIONS
0.950
0.975
1
VCn – VCn+1 = 4.5 V, 8 V ≤ VDD ≤ 25 V
0.275
0.3
0.325
Mode
(1)
, 8 V ≤ VDD ≤ 25 V
UNIT
V
–1%
0.975
1%
V
PACK
Mode
[Register Address = 0x03, b1(PACK) = 1, b0( VMEN) = 1]
–2%
PACK/18
2%
V
BAT
Mode
[Register Address = 0X03, b6(BAT) = 1, b0 ( VMEN) = 1]
–2%
BAT/18
2%
V
CELL output
CMRR
Common mode rejection
CELL max to CELL min
40
dB
V(CELLSLEW)
CELL output rise
Min to Max 10% to 90%
9
ms
K
CELL scale factor
I(VCELLOUT)
VICR
R(BAL)
(1)
K = {CELL output (VC5 = 0 V, VC4 = 4.5 V)
–CELL output (VC5 = VC4 = 0 V)} / 4.5
0.147
0.150
0.153
K = {CELL output (VC2 = 13.5 V, VC1 = 18 V)
–CELL output (VC2 = VC1 = 13.5 V)} / 4.5
0.147
0.150
0.153
12
18
μA
–1
mV
Drive current
VCn– VCn+1 = 0 V , Vcell = 0 V, TA = –40° to 110°
CELL output offset error
CELL output (VC2 = 18 V, VC1 = 18 V)
–CELL output (VC2 = VC1 = 0 V)
Cell balance internal resistance
RDS(ON) for internal FET switch at VDS = 2 V
–50%
400
50%
Ω
MAX
UNIT
Register Address = 0x04, b2(CAL0) = b3(CAL1) = 1, Register Address = 0x03, b0(VMEN) = 1
CURRENT PROTECTION DETECTION, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
V(OLT)
OL detection threshold voltage range, typical (1)
ΔV(OLT)
OL detection threshold voltage program step
SCC detection threshold voltage range, typical
V(SCCT)
(2)
ΔV(SCCT)
SCC detection threshold voltage program step
V(SCDT)
SCD detection threshold voltage range,
typical (3)
ΔV(SCDT)
SCD detection threshold voltage program step
VOL(acr)
OL detection threshold voltage accuracy(1)
V(SCC_acr)
V(SCD_acr)
(1)
(2)
(3)
8
SCC detection threshold voltage accuracy(2)
SCD detection threshold voltage accuracy(3)
TEST CONDITIONS
MIN
TYP
RSNS = 0
–50
–205
RSNS = 1
–25
–102.5
RSNS = 0
–5
RSNS = 1
–2.5
RSNS = 0
RSNS = 1
RSNS = 0
RSNS is set in
FUNCTION_CTL register
mV
100
475
50
237.5
25
RSNS = 1
RSNS = 0
–100
–475
RSNS = 1
–50
–237.5
–25
RSNS = 1
–12.5
mV
mV
12.5
RSNS = 0
mV
mV
mV
VOL = –25 mV (typ)
–15
–25
–35
VOL = –100 mV (typ) (RSNS = 0,1)
–90
–100
–110
VOL = –205 mV (typ)
–185
–205
–225
VSCC = 50 mV (typ)
30
50
70
VSCC = 200 mV (typ) (RSNS = 0,1)
180
200
220
VSCC = 475 mV (typ)
428
475
523
VSCD = –50 mV (typ)
–30
–50
–70
VSCD = –200 mV (typ) (RSNS = 0,1)
–180
–200
–220
VSCD = –475 mV (typ)
–426
–475
–523
mV
mV
mV
See OLV register for setting detection threshold
See SCC register for setting detection threshold
See SCD register for setting detection threshold
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
ELECTRICAL CHARACTERISTICS (Continued)
FET DRIVE CIRCUIT, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
VO(FETON)
V(ZCHG)
VO(FETOF
Output voltage, charge,
and discharge FETs on
ZVCHG clamp voltage
TEST CONDITIONS
VO(FETOND) = V(DSG) – Vpack
VGS connect 10 MΩ
TA = 25°C
VO(FETONC) = V(CHG) – VBAT
VGS connect 10 MΩ
TA = 25°C
TA = –40°C to 110°C
TA = –40°C to 110°C
BAT = 4.5 V
MIN
TYP
MAX
7.5
12
15.5
8
12
16
7.5
12
15.5
8
12
16
3.3
3.5
3.7
VFETOND = VDSG –
Vpack
0.2
VFETONC = VCHG – VBAT
0.2
F)
Output voltage, charge,
and discharge FETs off
tr
Rise time
CL = 4700 pF
tf
Fall time
CL = 4700 pF
UNIT
V
V
V
V
V(CHG):
Vpack ≥ Vpack + 4 V
400
1000
V(DSG):
VBAT ≥ VBAT + 4 V
400
1000
V(CHG):
Vpack + VCHG (FETON) ≥ pack + 1 V
40
200
V(DSG):
VC1 + VDSG (FETON) ≥ VC1 + 1 V
40
200
60
100
200
6
10
20
1
3
6
μs
μs
LOGIC, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
XALERT
R(PUP)
Internal pullup resistance SDATA, SCLK
TA = –40°C to 110°C
XRST
VOL
VIH
XALERT
0.2
SDATA, IOUT = 200 μA
0.4
Low Logic level output
voltage
GPOD, IOUT = 50 μA
SCLK (hysteresis input)
Hysteresis
0.6
TA = –40°C to 110°C
VCC or BAT = 7 V,
VREG = 1.5 V,
XRST, IOUT = 200 μA
kΩ
V
0.4
450
mV
AC ELECTRICAL CHARACTERISTICS
TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
MIN
TYP
MAX
UNIT
250
500
1000
ms
WDT detect time
50
100
150
μs
XRST Active high time
100
250
560
μs
tWDTINT
WDT start up detect time
tWDWT
tRST
TEST CONDITIONS
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
9
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
AC TIMING REQUIREMENTS (I2C compatible serial interface)
TA = 25°C, CREG = 1 μF, VCC or BAT = 14 V (unless otherwise noted)
PARAMETER
MIN
MAX
UNIT
ns
tr
SCLK, SDATA rise time
1000
tf
SCLK, SDATA fall time
300
tw(H)
SCLK pulse width high
4
μs
tw(L)
SCLK pulse width low
4.7
μs
tsu(STA)
Setup time for start condition
4.7
μs
th(STA)
Start condition hold time after which first clock pulse is generated
4
μs
tsu(DAT)
Data setup time
250
ns
th(DAT)
Data hold time
0
μs
tsu(STOP)
Setup time for Stop condition
4
μs
tsu(BUF)
Time the bus must be free before new transmission can start
4.7
μs
tv
Clock low to data out valid
th(CH)
Data out hold time after clock low
10
fSCL
Clock frequency
0
tsu(STA)
tw(H)
tf
tw(L)
ns
900
ns
100
kHz
ns
tr
SCLK
tr
SDATA
Start
Condition
SDA
Input
th(STA)
1
SCLK
tf
Stop
Condition
SDA
Change
th(DAT)
tsu(DAT)
3
7
2
th(ch)
8
9
MSB
SDATA
ACK
Start Condition
tv
tsu(STOP)
SCLK
SDATA
1
2
3
7
MSB
8
9
tsu(BUF)
ACK
Stop Condition
10
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
FUNCTIONAL DESCRIPTION
LOW DROP OUTPUT REGULATOR (LEDOUT)
The inputs for this regulator can be derived from the VCC or BAT terminals. The output is a fixed voltage of
typically 3.3 V with the minimum output capacitance for stable operation of 2.2 μF and is also internally current
limited. This output is used for LED drive, power supply source for REG (2.5 V) and bq29330 internal circuit.
During normal operation, the regulator limits output current to typically 50 mA. Until the internal regulator circuit is
correctly powered, the DSG and CHG FET drives are low (FETs = OFF).
LOW DROP OUTPUT REGULATOR (REG)
The inputs for this regulator can be derived from the LED (3.3 V). The output is typically 2.5 V with the minimum
output capacitance for stable operation of 1 μF and is also internally current limited. During normal operation, the
regulator limits output current to typically 50 mA.
INITIALIZATION
From a shutdown situation, the bq29330 requires a voltage greater that start-up voltage (VSTARTUP) applied to the
PACK pin to enable its integrated regulator and provide the regulators power source. Once the REG output is
stable, the power source of the regulator is switched to VCC.
After the regulator has started, it then continues to operate through the VCC input. If the VCC input is below the
minimum operating range, then the bq29330 will not operate if the supply to the PACK input is removed.
If the voltage at VLED falls below about 2.3 V, the internal circuit turns off the FETs and disables all controllable
functions including the REG, LEDOUT, and TOUT outputs.
The initial state of the CHG and DSG FET drive is low (OFF) and the ZVCHG FET drive is low (ON).
OVERLOAD DETECTION
The overload detection is used to detect abnormal currents in the discharge direction. This feature is used to
protect the pass FETs, cells, and any other inline components from excessive discharge current conditions. The
detection circuit also incorporates a blanking delay before driving the control for the pass FETs to the OFF state.
The overload sense voltage is set in the OLV register, and delay time is set in the OLD register. The thresholds
can be individually programmed from 50 mV to 205 mV in 5-mV steps with the default being 50 mV.
If the RSNS bit in the FUNCTION_CTL register is set to 1, then the voltage threshold, programmable step size,
and hysteresis is divided by 2.
SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE DETECTION
The short current circuit in charge and short circuit in discharge detections are used to detect severe abnormal
current in the charge and discharge directions, respectively. This safety feature is used to protect the pass FETs,
cells, and any other inline components from excessive current conditions. The detection circuit also incorporates
a blanking delay before driving the control for the pass FETs to the OFF state. The short circuit in charge
threshold and delay time are set in the SCC register. The short circuit in discharge threshold and delay time are
set in the SCD register. The short-circuit thresholds can be programmed from 100 mV to 475 mV in 25-mV steps.
If the RSNS bit in the FUNCTION_CTL register is set to 1, then the voltage threshold, programmable step size,
and hysteresis is divided by 2.
OVERLOAD, SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE DELAY
The overload delay (default = 1 ms) allows the system to momentarily accept a high current condition without
disconnecting the supply to the load. The delay time can be increased via the OLD register which can be
programmed for a range of 1 ms to 31 ms with 2-ms steps.
The short circuit in charge and short circuit in discharge delays (default = 0 μs) are programmable in the SCC
and SCD registers, respectively. These registers can be programmed from 0 μs to 915 μs with 61-μs steps.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
11
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
OVERLOAD, SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE RESPONSE
When an overload, short circuit in charge, or short circuit in discharge fault is detected, the FETs are turned off.
The STATUS (b0…b3) register reports the details of overload, short circuit in charge or short-circuit discharge.
The respective STATUS (b0…b3) bits are set to 1 and the XALERT output is triggered. This condition is latched
until the STATE_CONTROL (b7) is set and then reset. If a FET is turned on after resetting STATE_CONTROL
(b0) and the error condition is still present on the system, then the device again enters the protection response
state.
2-, 3-, or 4-CELL CONFIGURATION
In a 2-cell configuration, VC1 and VC2 are shorted to VC3. In a 3-cell configuration, VC1 is shorted to VC2.
CELL VOLTAGE
The cell voltage is translated to allow a system host to measure individual series elements of the battery. The
series element voltage is translated to a GND-based voltage equal to 0.15 ±0.003 of the series element voltage.
This provides a range from 0 to 4.5 V. The translation output is presented between CELL+ and CELL– pins of
the bq29330 and is inversely proportional to the input using the following equation.
Where, V(CELLOUT) = –K × V(CELLIN) + 0.975 (V)
Programming CELL_SEL (b1, b0) selects the individual series element. The CELL_SEL (b3, b2) selects the
voltage monitor mode, cell monitor, offset, etc.
CALIBRATION OF CELL VOLTAGE MONITOR AMPLIFIER GAIN
The cell voltage monitor amplifier has an offset, and to increase accuracy, this can be calibrated.
The following procedure shows how to measure and calculate the offset as an example.
Step 1
Set CAL1=1, CAL0=1, VMEN=1.
VREF is trimmed to 0.975 V within ±1%; measuring VREF eliminates its error.
Measure internal reference voltage VREF from VCELL directly.
VREF = measured reference voltage
Step 2
Set CAL1=0, CAL0=1, CELL1=0, CELL0=0, VMEN=1.
The output voltage includes the offset and represented by:
VOUT(4-5) = VREF + (1 + K) × VOS (V)
Where K = CELL Scaling Factor
VOS = Offset voltage at input of the internal operational amplifier
Step 3
Set CAL1=1, CAL0=0, CELL1=0, CELL0=0, VMEN=1.
Measure scaled REF voltage through VCELL amplifier.
The output voltage includes the scale factor error and offset and is represented by:
V(OUTR) = VREF + (1 + K) × VOS – K × VREF (V)
Step 4
Calculate (VOUT(4-5) –V(OUTR)) / VREF.
The result is the actual scaling factor, KACT and is represented by:
KACT = (VOUT(4-5) –V(OUTR)) / VREF = (VREF + (1 + K) × VOS) – (VREF + (1 + K) × VOS – K ×
VREF)/VREF = K × VREF/VREF = K
12
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
Step 5
Calculate the actual offset value where:
VOS(ACT) = (V(OUTR) – VREF) / (1 + KACT)
Step 6
Calibrated cell voltage is calculated by:
VCn – VC(n+1) = { VREF + (1 + KACT ) × VOS(ACT) – V(CELLOUT)}/KACT = {VOUT(4-5) – V(CELLOUT)}/KACT
To seek greater accuracy, it is better to measure VOS(ACT) for each cell voltage.
Set CAL1=0, CAL0=0, CELL1=0, CELL0=1, VMEN=1.
Set CAL1=0, CAL0=0, CELL1=1, CELL0=0, VMEN=1.
Set CAL1=0, CAL0=0, CELL1=1, CELL0=1, VMEN=1.
Measure VOUT(3-4), VOUT(2-3), VOUT(1-2),
VC4 – VC5 = {VOUT(4-5) – V(CELLOUT)}/KACT
VC3 – VC4 = {VOUT(3-4) – V(CELLOUT)}/KACT
VC2 – VC3 = {VOUT(2-3) – V(CELLOUT)}/KACT
VC1 – VC2 = {VOUT(1-2) – V(CELLOUT)}/KACT
BATTERY PACK AND BATTERY STACK MEASUREMENTS
The PACK (battery pack) and VC1 (battery stack) inputs can be translated to the CELL+, CELL– outputs of the
bq29330 through control bits in the FUNCTION_CONTROL register. If PACK is set, then the input at the PACK
is divided by 18 and presented at the CELL+, CELL– outputs. If the BAT bit is set, then the input to VC1 is
divided by 18 and presented at the CELL+, CELL– outputs. If setting both bits at the same time, VC1 is
presented at the CELL+, CELL– outputs.
CELL BALANCE CONTROL
The cell balance control allows a small bypass path to be controlled for any one series element. The purpose of
this bypass path is to reduce the current into any one cell during charging to bring the series elements to the
same voltage. Series resistors placed between the input pins and the positive series element nodes control the
bypass current value. Individual series element selection is made using bits 4 through 7 of CELL_SEL register.
Series input resistors between 500 Ω and 1 kΩ are recommended for effective cell balancing.
XALERT (XALERT)
XALERT is driven Low, when WDF, OL, SCC, or SCD OC are detected. To clear XALERT, toggle (from 0, set to
1, then reset to 0) STATE_CONTROL, LTCLR (bit 7), then read the STATUS register.
THERMISTOR DRIVE CIRCUIT (TOUT)
The TOUT pin can be enabled to drive a thermistor from REG. The typical thermistor resistance is 10 kΩ at
25°C. The default state for this is OFF to conserve power. The maximum output impedance is 100 Ω. TOUT is
enabled in FUNCTION_CONTROL register (bit 3).
GENERAL PURPOSE OPEN DRAIN DRIVE CIRCUIT (GPOD)
The General Purpose Open Drain output has 1-mA current source drive with a maximum output voltage of 25 V.
The OD output is enabled or disabled by OUTPUT_CONTROL register (bit 4) and has a default state of OFF.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
13
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
LATCH CLEAR (LTCLR)
When a protection fault occurs, the state is latched. To clear the fault flag, toggle (from 0, set 1, then reset to 0)
the LTCLR bit in the STATE_CONTROL register (bit 7). The OL, SCC, SCD, and WDF bits are unlatched by this
function. The FETs can now be controlled by programming the OUTPUT_CONTROL register, and the XALERT
output can be cleared by reading the STATUS register.
Fault Timeout
Expired
STATUS Register
Read
FET Control Access
by Host
Fault Flag Set
LTCLR Bit
XALERT Output
Figure 1. LTCLR and XLAERT Clear Timing
POR and WATCHDOG RESET (XRST)
The XRST pin is activated by activation of the REG output. This holds the host in reset for the duration of the
tRST period, allowing the VREG to stabilize before the host is released from reset. When the regulator power is
down, XRST is active below the regulator’s voltage of 1.8 V. Also, when a watchdog fault is detected, the XRST
is also activated to ensure a valid reset of the battery management host.
VREGTH+
REG Output
VREGTH-
tRST
RST Output
Figure 2. XRST Timing Chart – Power Up and Power Down
WATCHDOG INPUT (WDI)
The WDI input is required as a time base for delay timing when determining fault detection and is used as part of
the system watchdog.
Initially, the watchdog monitors the host oscillator start-up; if there is no response from the host within tWDINT of
tRST expiring, then the bq29330 turns CHG, DSG, and ZVCHG FETs off. It then activates the XRST output in an
attempt to reset the host.
Once the watchdog has been started during this wake-up period, it monitors the host for an oscillation stop
condition which is defined as a period of tWDWT where no clock input is received. If an oscillator stop condition is
identified, then the watchdog turns the CHG, DSG, and ZVCHG FETs off. The bq29330 then activates the XRST
output in an attempt to reset the host.
14
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
If the host clock oscillation is started after the reset, the bq29330 still has the WDF flag set until it is cleared. See
the LTCLR section for further details on clearing the fault flags.
During Sleep mode, the watchdog function is not disabled.
REG Output
tDWTINIT(500 ms)
tDWTINIT(500 ms)
REG Output
tRST
WDI Input
XALERT
CHG, DSG, and
ZVCHG = OFF
FET Control
Access by Host
WDRST = L
REG Output
tDWTINIT(500 ms)
tDWTINIT(500 ms)
REG Output
tRST
tRST
tRST
WDI Input
XALERT
CHG, DSG, and
ZVCHG = OFF
FET Control
Access by Host
WDRST = H
Figure 3. Watchdog Timing Chart – WDI Fault at Start-up
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
15
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
REG Output
Normal Operation tWDWT
tDWTINIT(500 ms)
tDWTINIT(500 ms)
REG Output
tRST
WDI Input
XALERT
CHG, DSG, and
ZVCHG = OFF
FET Control
Access by Host
WDRST = L
REG Output
Normal Operation tWDWT
tDWTINIT(500 ms)
tDWTINIT(500 ms)
REG Output
tRST
tRST
tRST
WDI Input
XALERT
CHG, DSG, and
ZVCHG = OFF
FET Control
Access by Host
WDRST = H
Figure 4. Watchdog Timing Chart – WDI Fault After Startup
DSG and CHG NCH FET DRIVER CONTROL
The bq29330 drives either the DSG or CHG FET off if an OL, SCC, or SCD safety threshold is breached
depending on the current direction. The host can force any FET on or off only if the bq29330 integrated
protection control allows.
The default-state of the FET drive is off. A host can control the FET drive by programming OUTPUT_CONTROL
(b2...b0), where b0 is used to control the discharge FET, b1 is used to control the charge FET, and b2 is used to
control the ZVCHG FET. These controls are only valid when not in the initialized state. The CHG drive FET can
be powered by PACK and the DSG FET can be powered by BAT.
When the bq29330 powers down, the NCH FET drivers power down to GND causing the FETs to turn off.
16
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
PRECHARGE AND 0 V CHARGING
The bq29330 supports both a charger that has a precharge mode and one that does not. The bq29330 also
supports charging even when the battery falls to 0 V. In order to charge, the charge FET (CHG) must be turned
on to create a current path. When the VBAT is ~0 V, the V(PACK) is as low as the battery voltage. In this case, the
supply voltage for the device is too low to operate.
POWER MODES
The bq29330 has three power modes, normal, sleep, and ship. The following table outlines the operational
functions during these power modes.
Table 1. Outlines the Operational Functions
POWER
MODE
Normal
TO ENTER POWER MODE
TO EXIT POWER MODE
STATE_CONTROL, SLEEP( b0) = 0 and
STATE_CONTROL, SHIP ( b1) = 0
MODE DESCRIPTION
The battery is in normal operation with protection,
power management and battery monitoring
functions available and operating.
The supply current of this mode varies as the host
can enable and disable various power
management features.
Sleep
STATE_CONTROL, SLEEP( b0) = 1 and
STATE_CONTROL, SHIP ( b1) = 0
STATE_CONTROL,
SLEEP( b0) = 0
CHG, DSG, and ZVCHG OFF, OL, SCC, and SCD
function is disabled.
Cell AMP, GPOD , CELL BAL, and WDF is not
disabled
Ship
STATE_CONTROL, SHIP ( b1) = 1
and supply at the PACK < VWAKE
Supply voltage to PACK
Supply
The bq29330 is completely shut down as in the
sleep mode. In addition, the REG output is
disabled, I2C interface is powered down, and
memory is not valid.
VOLTAGE BASED EXIT FROM SHUTDOWN
If a voltage greater than VSTARTUP is applied to the PACK pin, then the bq29330 exits shutdown and enters
normal mode.
COMMUNICATIONS
The I2C-compatible serial communications provides read and write access to the bq29330 data area. The data is
clocked via separate data (SDATA) and clock (SCLK) pins. The bq29330 acts as a slave device and does not
generate clock pulses. Communication to the bq29330 can be provided from GPIO pins or an I2C supporting port
of a host system controller. The slave address for the bq29330 is 7 bits, and the value is 0100 000 (0x20).
(MSB)
I2C Address +R/W bit
(MSB)
Write
0
(LSB)
I2C Address (0x20)
1
0
0
(LSB)
0
Read
0
0
0
1
The bq29330 does NOT have the following functions compatible with the I2C specification.
• The bq29330 is always regarded as a slave.
• The bq29330 does not support the General Code of the I2C specification, and therefore will not return an ACK
but may return a NACK.
• The bq29330 does not support the Address Auto Increment, which allows continuous reading and writing.
• The bq29330 will allow data to be written or read from the same location without re-sending the location
address.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
17
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
…
…
SCLK
SDATA
A6
A5
…
A4 … A0 R/W
ACK
0
Start
R7
R6
R5
…
… R0
D7
ACK
0
D6
… D0
D5
0
Slave Address
ACK
0
Data
Register Address
Stop
Note: Slave = bq29330
Figure 5. I2C-Bus Write to bq29330
SCLK
…
A6
SDATA
…
A5 … A0 R/W
ACK
0
Start
R7
R6 … R0 ACK
0
…
…
A0
A6
R/W ACK
0
Slave Address
1
Start
Register Address
D7
D6 … D0 NACK
0
Master
Drives
NACK and
Stop
Slave Drives
The Data
Slave Address
Note: Slave = bq29330
Stop
Figure 6. I2C-Bus Read from bq29330: Protocol A
…
SCLK
SDATA
A6
…
A5 … A0 R/W ACK
R7
…
R6 … R0 ACK
A6
A5
…
…
A0
R/W ACK D7 …
D0 NACK
0
Start
Slave
Register Address
Stop
Start
Slave Address
Note: Slave = bq29330
Slave Drives
The Data
Master
Drives
Stop
NACK and
Stop
Figure 7. I2C-Bus Read from bq29330: Protocol B
REGISTER MAP
The bq29330 has nine addressable registers. These registers provide status, control, and configuration
information for the battery protection system.
NAME
ADDR
TYPE
STATUS
0x00
R
OUTPUT_CONTROL
0x01
R/W
Output pin control from system host and external pin status
STATE_CONTROL
0x02
R/W
State control
FUNCTION_CONTROL
0x03
R/W
Function control
CELL _SEL
0x04
R/W
Battery cell select for cell translation and balance bypass and select mode for calibration
OLV
0x05
R/W
Overload voltage threshold
OLD
0x06
R/W
Overload delay time
SCC
0x07
R/W
Short circuit in charge current threshold voltage and delay
SCD
0x08
R/W
Short circuit in discharge current threshold voltage and delay
18
DESCRIPTION
Status register
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
NAME
ADDR
TYPE
STATUS
0x00
OUTPUT_ CONTROL
BIT MAP
B7
B6
B5
B4
B3
B2
B1
B0
R
0
0
0
ZV
WDF
OL
SCC
SCD
0x01
R/W
0
0
PMS_CHG
GPOD
XZV
CHG
DSG
LTCLR
STATE_ CONTROL
0x02
R/W
0
0
0
RSNS
WDRST
WDDIS
SHIP
SLEEP
FUNCTION_ CONTROL
0x03
R/W
0
0
0
0
TOUT
BAT
PACK
VMEN
CELL _SEL
0x04
R/W
CB3
CB2
CB1
CB0
CAL1
CAL0
CELL1
CELL0
OLV
0x05
R/W
0
0
0
OLV4
OLV3
OLV2
OLV1
OLV0
OLD
0x06
R/W
0
0
0
0
OLD3
OLD2
OLD1
OLD0
SCC
0x07
R/W
SCCD3
SCCD2
SCCD1
SCCD0
SCCV3
SCCV2
SCCV1
SCCV0
SCD
0x08
R/W
SCDD3
SCDD2
SCDD1
SCDD0
SCDV3
SCDV2
SCDV1
SCDV0
STATUS: Status register
7
0
6
0
5
0
STATUS REGISTER (0x00)
4
3
ZV
WDF
2
OL
1
SCC
0
SCD
The STATUS register provides information about the current state of the bq29330.
STATUS b0 (SCD): This bit indicates a short circuit in discharge condition.
0=
Voltage below the short circuit in discharge threshold (default).
1=
Voltage greater than or equal to the short circuit in discharge threshold.
STATUS b1 (SCC): This bit indicates a short circuit in charge condition in the charge direction.
0=
Voltage below the short circuit in charge threshold (default).
1=
Voltage greater than or equal to the short circuit in charge threshold.
STATUS b2 (OL): This bit indicates an overload condition.
0=
Voltage less than or equal to the overload threshold (default).
1=
Voltage greater than overload threshold.
STATUS b3 (WDF): This bit indicates a watchdog fault condition has occurred.
0=
32-kHz oscillation is normal (default).
1=
32-kHz oscillation stopped or not started, and the watchdog has timed out.
STATUS b4 (ZV): This bit indicates ZVCHG output is clamped.
0=
ZVCHG pin is not clamped (default).
1=
ZVCHG pin is clamped.
STATUS b5, b6, b7: Reserved
OUTPUT_CONTROL : Output control register
7
0
6
0
5
PMS_CHG
OUTPUT_CONTROL REGISTER (0x01)
4
3
GPOD
XZV
2
CHG
1
DSG
0
LTCLR
The OUTPUT_CONTROL register controls the outputs of the bq29330 and can show the state of the external pin
corresponding to the control.
OUTPUT_ CONTROL b0 (LTCLR): When a fault is latched, this bit releases the fault latch when toggled from 0
to 1 and back to 0 (default =0).
0=
(default)
0->1 ->0 clears the fault latches, allowing STATUS to be cleared on its next read.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
19
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
OUTPUT_ CONTROL b1 (DSG): This bit controls the external discharge FET.
0=
Discharge FET is off and is controlled by the system host (default).
1=
Discharge FET is on, and the bq29330 is in normal operating mode.
OUTPUT_ CONTROL b2 (CHG): This bit controls the external charge FET.
0=
Charge FET is off, and is controlled by the system host (default).
1=
Charge FET is on, and the bq29330 is in normal operating mode.
OUTPUT_CONTROL b3(ZV): This bit enables or disables the precharge function.
0=
ZVCHG FET is on, and is controlled by the system host (default).
1=
ZVCHG FET is off, and the bq29330 is in normal operating mode.
OUTPUT_CONTROL b4 (GPOD): This bit enables or disables the GPOD output.
0=
GPOD is high impedance (default).
1=
GPOD output is active (GND).
OUTPUT_CONTROL b5 (PMS_CHG): This bit enables the CHG output for 0-V charge, when PMS terminal is
connected to Pack.
0=
CHG FET is off (When PMS = GND, default).
1=
CHG FET is on by connecting CHG and PACK terminal. (When PMS = PACK, default).
STATE_CONTROL : State control register
7
0
6
0
5
0
STATE_CONTROL REGISTER (0x02)
4
3
RSNS
WDRST
2
WDDIS
1
SHIP
0
SLEEP
The STATE_CTL register controls the outputs of the bq29330 and can be used to clear certain states.
STATE_CONTROL b0 (SLEEP): This bit is used to enter the sleep power mode.
0=
bq29330 exits sleep mode (default).
1=
bq29330 enters the sleep mode.
STATE_CONTROL b1 (SHIP): This bit is used to enter the ship power mode when Pack supply voltage is not
applied.
0=
bq29330 is in normal mode (default).
1=
bq29330 enters ship mode when pack voltage is removed.
STATE_CONTROL b2 (WDDIS): This bit is used to enable the watchdog timer.
0=
Watchdog timer is enabled (default).
1=
Watchdog timer is disabled.
STATE_CONTROL b3 (WDRST): This bit is used to enable the reset for GC, when watchdog timer is active.
0=
Reset output is disabled, when watchdog timer is active (default).
1=
2 Times reset output is enabled, when watchdog timer is active.
STATE_CONTROL b4 (RSNS): This bit sets the OL, SCC, and SCD thresholds into a range suitable for a low
sense resistor value by dividing the OLV, SCCV, and SCDV selected voltage thresholds by 2.
0=
Current protection voltage threshold as programmed (default)
1=
Current protection voltage thresholds divided by 2 as programmed
STATE_CONTROL b6..7 (0): These bits are not used and should be set to 0.
20
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
FUNCTION_CONTROL : Function control register
7
0
6
0
FUNCTION_CTL REGISTER (0x03)
4
3
0
TOUT
5
0
2
BAT
1
PACK
0
VMEN
The FUNCTION_CONTROL register enables and disables features of the bq29330.
FUNCTION_CONTROL b0 (VMEN): This bit enables or disables the cell and battery voltage monitoring
function.
0=
Disable voltage monitoring (default). CELL output is pulled down to GND level.
1=
Enable voltage monitoring
FUNCTION_CONTROL b1 (PACK): This bit is used to translate the PACK input to the CELL+, CELL– pins
when VMEN = 1. The PACK input voltage is divided by 18 and is presented on CELL+, CELL– pins regardless
of the CELL_SEL register settings.
0=
CELL_SEL (b0, b1) settings determine CELL+, CELL– output when VMEN = 1(default).
1=
PACK input translated to CELL output regardless of CELL_SEL (b0, b1) selection when VMEN=1
FUNCTION_CTL b2 (BAT): This bit is used to translate the BAT input to the CELL+, CELL– pins when
VMEN=1. The VC5 input voltage is divided by 18 and is presented on CELL+, CELL– regardless of the
CELL_SEL register settings.
0=
CELL_SEL (b0, b1) settings determine CELL+, CELL– output when VMEN = 1(default).
1=
BAT input translated to CELL+, CELL– output regardless of CELL_SEL (b0, b1) selection when
VMEN = 1
This bit priority is higher than PACK(b1).
FUNCTION_CONTROL b3 (TOUT): This bit controls the power to the thermistor.
0=
Thermistor power is off (default).
1=
Thermistor power is on.
CELL_SEL : Cell select register
7
CB3
6
CB2
CELL_SEL REGISTER (0x04)
4
3
CB0
CAL1
5
CB1
2
CAL0
1
CELL1
0
CELL0
This register determines cell selection for voltage measurement and translation, cell balancing, and the
operational mode of the cell voltage monitoring.
CELL_SEL b0–b1 (CELL0–CELL1): These two bits select the series cell for voltage measurement translation.
CELL1
CELL0
0
0
VC4–VC5, Bottom series element (default)
SELECTED CELL
0
1
VC4–VC3, Second lowest series element
1
0
VC3–VC2, Second highest series element
1
1
VC1–VC2, Top series element
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
21
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
CELL_SEL b2–b3 (CAL1, CAL0): These bits determine the mode of the voltage monitor block
CAL1
CAL0
0
0
Cell translation for selected cell (default)
SELECTED MODE
0
1
Offset measurement for selected cell
1
0
Monitor the VREF value for gain calibration
1
1
Monitor the VREF directly value for gain calibration,
bypassing the translation circuit
CELL_SEL b4–b7 (CB0 – CB3): These 4 bits select the series cell for cell balance bypass path.
CELL_SEL b4 (CB0): This bit enables or disables the bottom series cell balance charge bypass path.
0=
Disable bottom series cell balance charge bypass path (default)
1=
Enable bottom series cell balance charge bypass path
CELL_SEL b5 (CB1): This bit enables or disables the second lowest series cell balance charge bypass path.
0=
Disable series cell balance charge bypass path (default)
1=
Enable series cell balance charge bypass path
CELL_SEL b6 (CB2): This bit enables or disables the second highest cell balance charge bypass path.
0=
Disable series cell balance charge bypass path (default)
1=
Enable series cell balance charge bypass path
CELL_SEL b7 (CB3): This bit enables or disables the highest series cell balance charge bypass path.
0=
Disable series cell balance charge bypass path (default)
1=
Enable series cell balance charge bypass path
OLV: Overload Voltage threshold register
7
0
6
0
5
0
OLV REGISTER (0x05)
4
3
OLV4
OLV3
2
OLV2
1
OLV1
0
OLV0
OLV (b4–b0): These four bits select the value of the overload threshold with a default of 0000.
OLV (b5–b7): These bits are not used and should be set to 0.
OLV (b4–b0) configuration bits with corresponding voltage threshold (1)
0x00
–0.050 V
0x08
–0.090 V
0x01
–0.055 V
0x09
–0.095 V
0x02
–0.060 V
0x0a
–0.100 V
0x03
–0.065 V
0x0b
–0.105 V
0x04
–0.070 V
0x0c
–0.110 V
0x05
–0.075 V
0x0d
–0.115 V
0x06
–0.080 V
0x0e
–0.120 V
0x07
–0.085 V
0x0f
–0.125 V
(1)
22
0x10
0x11
0x12
0x13
0x14
0x15
0x16
0x17
–0.130
–0.135
–0.140
–0.145
–0.150
–0.155
–0.160
–0.165
V
V
V
V
V
V
V
V
0x18
0x19
0x1a
0x1b
0x1c
0x1d
0x1e
0x1f
–0.170
–0.175
–0.180
–0.185
–0.190
–0.195
–0.200
–0.205
V
V
V
V
V
V
V
V
If RSNS bit is FUNCTION_CONTROL = 1, then the corresponding voltage threshold is divided by 2.
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
bq29330
www.ti.com
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
OLD: Overload Delay time configuration register
7
0
6
0
OLD REGISTER (0x07)
4
3
0
OLD3
5
0
2
OLD2
1
OLD1
0
OLD0
OLD(b3–b0): These four bits select the value of the delay time for overload with a default of 0000.
0x00
1 ms
0x04
9 ms
0x08
17 ms
0x01
3 ms
0x05
11 ms
0x09
19 ms
0x02
5 ms
0x06
13 ms
0x0a
21 ms
0x03
7 ms
0x07
15 ms
0x0b
23 ms
0x0c
0x0d
0x0e
0x0f
25
27
29
31
ms
ms
ms
ms
SCC : Short Circuit In Charge configuration register
7
SCCD3
6
SCCD2
5
SCCD1
SCC REGISTER (0x08)
4
3
SCCD0
SCCV3
2
SCCV2
1
SCCV1
0
SCCV0
This register selects the short circuit in charge voltage threshold and delay.
SCCV (b3–b0) : These lower nibble bits
0x00
0.100 V
0x01
0.125 V
0x02
0.150 V
0x03
0.175 V
(1)
select the value of the short circuit
0x04
0.200 V
0x05
0.225 V
0x06
0.250 V
0x07
0.275 V
in charge voltage threshold with 0000 as the default. (1)
0x08
0.300 V
0x0c
0.400 V
0x09
0.325 V
0x0d
0.425 V
0x0a
0.350 V
0x0e
0.450 V
0x0b
0.375 V
0x0f
0.475 V
If RSNS bit is FUNCTION_CTL = 1, then the corresponding voltage threshold is divided by 2.
SCCD (b7–b4): These upper nibble bits select the value of the short circuit in charge delay time. Exceeding the
voltage threshold for longer than this period turns off the CHG and DSG outputs. 0000 is the default.
0x00
0 μs
0x04
244 μs
0x08
488 μs
0x01
61 μs
0x05
305 μs
0x09
549 μs
0x02
122 μs
0x06
366 μs
0x0a
610 μs
0x03
183 μs
0x07
427 μs
0x0b
671 μs
short circuit in charge
0x0c
0x0d
0x0e
0x0f
732 μs
793 μs
854 μs
915 μs
1
SCDV1
0
SCDV0
SCD : Short Circuit In Discharge configuration register
7
SCDD3
6
SCDD2
5
SCDD1
SCD REGISTER (0x08)
4
3
SCDD0
SCDV3
2
SCDV2
This register selects the short circuit in discharge voltage threshold and delay.
SCDV(b3–b0) : These lower nibble bits
0x00
–0.100 V
0x01
–0.125 V
0x02
–0.150 V
0x03
–0.175 V
(1)
select the value of the short circuit in discharge voltage threshold with 0000 as the default. (1)
0x04
–0.200 V
0x08
–0.300 V
0x0c
–0.400
0x05
–0.225 V
0x09
–0.325 V
0x0d
–0.425
0x06
–0.250 V
0x0a
–0.350 V
0x0e
–0.450
0x07
–0.275 V
0x0b
–0.375 V
0x0f
–0.475
V
V
V
V
If RSNS bit is FUNCTION_CTL = 1, then the corresponding voltage threshold is divided by 2.
SCCD (b7–b4): These upper nibble bits select the value of the short circuit in charge delay time. Exceeding the
voltage threshold for longer than this period will turn off the CHG and DSG outputs. 0000 is the default.
0x00
0 μs
0x04
244 μs
0x08
488 μs
0x01
61 μs
0x05
305 μs
0x09
549 μs
0x02
122 μs
0x06
366 μs
0x0a
610 μs
0x03
183 μs
0x07
427 μs
0x0b
671 μs
Short Circuit in charge
0x0c
0x0d
0x0e
0x0f
732 μs
793 μs
854 μs
915 μs
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
23
bq29330
SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012
www.ti.com
REVISION HISTORY
Changes from Original (September 2005) to Revision A
Page
•
Changed package name From: SSOP(DBT) To: TSSOP(DBT) in the Ordering Information Table .................................... 2
•
Changed the SCLK pin description From: Open-drain bi-directional serial interface clock with internal 10-kΩ pullup
to VREG To: Open-drain serial interface clock with internal 10-kΩ pullup to VREG ................................................................. 4
•
Changed Supply Current 2 From: XALERT, SCLK, SDATA. ZVCHG = off, Input WDI, To: XALERT, SCLK, SDATA.
ZVCHG = off, WDI = 32 kHz, ................................................................................................................................................ 7
•
Changed Calibration of Cell Voltage Monitor Amplifier Gain, Step 3 - From: Set CAL1=1, CAL0=1, CELL1=0,
CELL0=0, VMEN=1. To: Set CAL1=1, CAL0=0, CELL1=0, CELL0=0, VMEN=1. ............................................................. 12
Changes from Revision A (December 2005) to Revision B
•
Page
Deleted the QFN(RHB) package from the Ordering Information Table, the Package Option Pin Diagrams, and the
Pin Functions table. .............................................................................................................................................................. 2
Changes from Revision B (August 2006) to Revision C
Page
•
Changed BAT Pin description From: Charge pump, charge N-CH FET gate drive To: Device power supply input ............ 3
•
Changed ELECTRICAL CHARACTERISTICS - CURRENT PROTECTION DETECTION section - positive and
negative values were not properly displayed. ....................................................................................................................... 8
•
Changed Figure 3 - Watchdog Timing Chart – WDI Fault at Start-up ................................................................................ 15
•
Added Figure 4 - Watchdog Timing Chart – WDI Fault After Startup ................................................................................ 16
Changes from Revision C (March 2009) to Revision D
Page
•
Added the RSM package to the Ordering Information Table ............................................................................................... 2
•
Added the RSM pin out package illustration. ........................................................................................................................ 3
Changes from Revision D (July 2009) to Revision E
Page
•
Changed the device numbers in the Ordering Information Table From: bq29330ADBT and bq29330ARSM To:
bq29330DBT and bq29330RSM ........................................................................................................................................... 2
•
Added Thermal Information .................................................................................................................................................. 2
•
Changed the AC Timing Requiremenst Table, fSCL - Clock frequency MAX value From: 400 kHz To: 100 kHz ............... 10
24
Submit Documentation Feedback
Copyright © 2005–2012, Texas Instruments Incorporated
Product Folder Link(s): bq29330
PACKAGE OPTION ADDENDUM
www.ti.com
22-Dec-2009
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
BQ29330DBT
ACTIVE
TSSOP
DBT
30
60
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
BQ29330DBTG4
ACTIVE
TSSOP
DBT
30
60
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
BQ29330DBTR
ACTIVE
TSSOP
DBT
30
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
BQ29330DBTRG4
ACTIVE
TSSOP
DBT
30
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
BQ29330DBTR
Package Package Pins
Type Drawing
TSSOP
DBT
30
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2000
330.0
16.4
Pack Materials-Page 1
6.95
B0
(mm)
K0
(mm)
P1
(mm)
8.3
1.6
8.0
W
Pin1
(mm) Quadrant
16.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
BQ29330DBTR
TSSOP
DBT
30
2000
367.0
367.0
38.0
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46C and to discontinue any product or service per JESD48B. Buyers should
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All
semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale supplied at the time
of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components which meet ISO/TS16949 requirements, mainly for automotive use. Components which
have not been so designated are neither designed nor intended for automotive use; and TI will not be responsible for any failure of such
components to meet such requirements.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Mobile Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2012, Texas Instruments Incorporated