FAIRCHILD FKN2L80

FKN2L80
FKN2L80
Application Explanation
•
•
•
•
Switching mode power supply, light dimmer, electric flasher unit, hair drier
TV sets, stereo, refrigerator, washing machine
Electric blanket, solenoid driver, small motor control
Photo copier, electric tool
2
1: T1
2: Gate
3: T2
3
TO-92
1
1 2 3
Bi-Directional Triode Thyristor Planar Silicon
Absolute Maximum Ratings TC=25°C unless otherwise noted
Symbol
VDRM
Parameter
Repetitive Peak Off-State Voltage (Note1 )
Rating
800
Units
V
Symbol
IT (RMS)
Parameter
RMS On-State Current
Conditions
Commercial frequency, sine full wave 360°
conduction, Tc=74℃
ITSM
Surge On-State Current
Sinewave 1 full cycle, peak value,
non-repetitive
Rating
1.5
Units
A
50Hz
9
A
60Hz
10
A
I2t
I2t for Fusing
Value corresponding to 1 cycle of halfwave,
surge on-state current, tp=10ms
0.4
A2s
IG = 2x IGT, tr ≤ 100ns
50
A/µs
di/dt
Critical Rate of Rise of On-State Current
PGM
Peak Gate Power Dissipation
PG (AV)
Average Gate Power Dissipation
VGM
IGM
TJ
TSTG
1
W
0.1
W
Peak Gate Voltage
6
V
Peak Gate Current
0.5
A
Junction Temperature
- 40 ~ 125
°C
Storage Temperature
- 40 ~ 125
°C
Thermal Characteristic
Symbol
Rth(J-C)
Parameter
Thermal Resistance
©2003 Fairchild Semiconductor Corporation
Test Condition
Junction to case (Note 4)
Min.
-
Typ.
-
Max.
40
Units
°C/W
Rev. A, September 2003
Symbol
IDRM
Parameter
Repetieive Peak Off-State Current
VTM
On-State Voltage
VGT
Gate Trigger Voltage (Note 2)
Test Condition
Min.
-
Typ.
-
Max.
20
Units
µA
-
-
1.6
V
T2(+), Gate (+)
-
-
1.5
V
T2(+), Gate (-)
-
-
1.5
V
III
T2(-), Gate (-)
-
-
1.5
V
I
T2(+), Gate (+)
-
-
10
mA
T2(+), Gate (-)
-
-
10
mA
T2(-), Gate (-)
-
-
10
mA
0.2
-
-
V
VDRM applied
TC=25°C, ITM=3A
Instantaneous measurement
I
II
Gate Trigger Current (Note 2)
IGT
II
VD=12V, RL=20Ω
VD=12V, RL=20Ω
III
VGD
Gate Non-Trigger Voltage
TJ=125°C, VD=1/2VDRM
IH
Holding Current
VD = 12V, ITM = 1A
5
mA
IL
Latching Current
VD = 12V, IG = 1.2IGT
5
mA
I, III
II
5
VDRM = Rated, Tj = 125°C,
Exponential Rise
dv/dt
Critical Rate of Rise of
Off-State Voltag
(dv/dt)C
Critical-Rate of Rise of Off-State
Commutating Voltage (Note 3)
500
5
-
mA
V/µs
-
V/µs
Notes:
1. Gate Open
2. Measurement using the gate trigger characteristics measurement circuit
3. The critical-rate of rise of the off-state commutating voltage is shown in the table below
4. Case temperature is measured at the T2 terminal 1.5mm away from the molded case.
VDRM
(V)
FKN2L80
Commutating voltage and current waveforms
(inductive load)
Test Condition
1. Junction Temperature
TJ=125°C
2. Rate of decay of on-state
commutating current
(di/dt)C = - 0.5A/ms
3. Peak off-state voltage
VD = 400V
Supply Voltage
Time
(di/dt)C
Main Current
Time
Time
Main Voltage
(dv/dt)C
VD
Quadrant Definitions for a Triac
T2 Positive
+
(+) T2
Quadrant II
(-) IGT
GATE
(+) T2
Quadrant I
(+) IGT
GATE
T1
T1
IGT -
+ IGT
(-) T2
Quadrant III
(-) IGT
GATE
(-) T2
(+) IGT
GATE
T1
Quadrant IV
T1
T2 Negative
©2003 Fairchild Semiconductor Corporation
Rev. A, September 2003
FKN2L80
Electrical Characteristics TC=25°C unless otherwise noted
FKN2L80
Typical Curves
12
12
SURGE ON-STATE CURRENT [A]
11
ON-STATE CURRENT [A]
10
o
25 C
8
o
125 C
6
4
2
10
60Hz
9
8
7
50Hz
6
5
4
3
2
1
0
0.0
0
0.5
1.0
1.5
2.0
2.5
3.0
1
10
ON-STATE VOLTAGE [V]
Figure 1. Maximum On-state Characteristics
GATE VOLTAGE [V]
VGM=10V
PGM=3W
10
VGT=1.5V
PG(AV)=0.3W
IGT =10mA
IGM=1.6A
VGD=0.2V
0.1
1
10
100
Figure 2. Rated Surge On-state Current
NORMALIZED GATE TRIGGER CURRENT [%]
100
1
1000
1000
IⅡ, IⅢ
IⅠ
100
10
-60
-40
GATE CURRENT [mA]
0
20
40
60
80
100
120
140
o
Figure 4. Gate Trigger Current vs Tj
1000
1000
TRANSIENT THERMAL IMPEDANCE
o
[ C/W]
NORMALIZED GATE TRIGGER VOLTAGE [%]
-20
JUNCTION TEMPERATURE [ C]
Figure 3. Gate Characteristics
VGTⅡ, VGTⅢ
100
VGTⅠ
10
-60
100
NUMBER OF CYCLES AT 50Hz AND 60Hz
-40
-20
0
20
40
60
80
100
120
o
JUNCTION TEMPERATURE [ C]
Figure 5. Gate Trigger Voltage vs Tj
©2003 Fairchild Semiconductor Corporation
140
100
10
1
0.1
0.01
1E-3
1E-5
1E-4
1E-3
0.01
0.1
1
10
100
1000
CONDUCTION TIME [s]
Figure 6. Transient Thermal Impedance
Rev. A, September 2003
FKN2L80
Typical Curves (Continues)
4.0
ON-STATE POWER DISSIPATION [W]
MAXIMUM ALLOWABLE CASE, AMBIENT
o
TEMPERATURE TCMAX, TaMAX [ C/W]
140
120
TC
100
80
Ta
60
40
20
0
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0.0
2.0
0.2
0.4
0.6
ON-STATE CURRENT [A]
NORMALIZED REPETIVITE OFF-STATE CURRENT [%]
Figure 7. Allowable Case, Ambient Temperature
vs Rms On-state Current
1.2
1.4
1.6
1.8
2.0
2.2
2.4
2.6
2.8
3.0
1000
5
NORMALIZED HOLDING CURRENT [%]
TYPICAL EXAMPLE
4
10
3
10
100
10
-60
2
-60
1.0
Figure 8. Maximum On-state Power Dissipation
10
10
0.8
RMS ON-STATE CURRENT [A]
-40
-20
0
20
40
60
80
100
120
140
-40
-20
0
20
40
60
80
100
120
140
o
JUNCTION TEMPERATURE [ C]
JUNCTION TEMPERATURE [V]
Figure 9. Repetitive Peak Off-state Current
vs Junction Temperature
Figure 10. Holding Current vs
Junction Temperature
1000
TYPICAL EXAMPLE
NORMALIZED GATE TRIGGER CURRENT [%]
NORMALIZED BREAKOVER VOLTAGE [%]
160
140
120
100
80
60
40
20
0
-60
-40
-20
0
20
40
60
80
100
120
JUNCTION TEMPERATURE [V]
Figure 11. Breakover Voltage vs
Junction Temperature
©2003 Fairchild Semiconductor Corporation
140
IⅡ
IⅢ
100
IⅠ
10
1
10
100
GATE CURRENT PULSE WIDTH [uS]
Figure 12. Gate Trigger Current vs
Gate Current Pulse Width
Rev. A, September 2003
FKN2L80
Typical Curves (Continues)
NORMALIZED BREAKOVER VOLTAGE [%]
160
TYPICAL EXAMPLE
Tj=125℃
140
120
100
Ⅰ QUADRANT
80
60
Ⅲ QUADRANT
40
20
1
10
2
10
10
3
10
4
RATE OF RISE OF-STATE VOLTAGE [V/us]
Figure 13. Breakover Voltage vs
Rate of Rise of Off-state Voltage
©2003 Fairchild Semiconductor Corporation
Rev. A, September 2003
FKN2L80
Package Dimension
TO-92
Dimensions in Millimeters
©2003 Fairchild Semiconductor Corporation
Rev. A, September 2003
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
2. A critical component is any component of a life support
which, (a) are intended for surgical implant into the body,
device or system whose failure to perform can be
or (b) support or sustain life, or (c) whose failure to perform
reasonably expected to cause the failure of the life support
when properly used in accordance with instructions for use
device or system, or to affect its safety or effectiveness.
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
©2003 Fairchild Semiconductor Corporation
Rev. I5