PHILIPS PHX23NQ10T

Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
FEATURES
PHX23NQ10T
SYMBOL
QUICK REFERENCE DATA
• ’Trench’ technology
• Low on-state resistance
• Fast switching
d
VDSS = 100 V
ID = 13 A
g
RDS(ON) ≤ 70 mΩ
s
GENERAL DESCRIPTION
N-channel enhancement mode field-effect power transistor in a plastic full pack envelope using ’trench’ technology.
Applications:• d.c. to d.c. converters
• switched mode power supplies
• T.V. and computer monitor power supplies
The PHX23NQ10T is supplied in the SOT186A (FPAK) conventional leaded package.
PINNING
SOT186A (FPAK)
PIN
DESCRIPTION
case
1
gate
2
drain
3
source
case
isolated
1 2 3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDSS
VDGR
VGS
ID
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Continuous drain current
Tj = 25 ˚C to 150˚C
Tj = 25 ˚C to 150˚C; RGS = 20 kΩ
IDM
PD
Tj, Tstg
Pulsed drain current
Total power dissipation
Operating junction and
storage temperature
- 55
100
100
± 20
13
8
52
27
150
V
V
V
A
A
A
W
˚C
September 1999
Tmb = 25 ˚C; VGS = 10 V
Tmb = 100 ˚C; VGS = 10 V
Tmb = 25 ˚C
Tmb = 25 ˚C
1
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
AVALANCHE ENERGY LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
EAS
Non-repetitive avalanche
energy
IAS
Peak non-repetitive
avalanche current
CONDITIONS
MIN.
MAX.
UNIT
-
93
mJ
-
23
A
Unclamped inductive load, IAS = 14 A;
tp = 100 µs; Tj prior to avalanche = 25˚C;
VDD ≤ 25 V; RGS = 50 Ω; VGS = 10 V; refer
to fig:15
THERMAL RESISTANCES
SYMBOL PARAMETER
Rth j-mb
Rth j-a
Thermal resistance junction
to mounting base
Thermal resistance junction
to ambient
CONDITIONS
MIN.
SOT186a package, in free air
TYP. MAX. UNIT
-
-
4.6
K/W
-
55
-
K/W
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
V(BR)DSS
VGS(TO)
Drain-source breakdown
voltage
Gate threshold voltage
CONDITIONS
VGS = 0 V; ID = 0.25 mA;
Tj = -55˚C
VDS = VGS; ID = 1 mA
Tj = 150˚C
Tj = -55˚C
RDS(ON)
IGSS
IDSS
Drain-source on-state
VGS = 10 V; ID = 13 A
resistance
Gate source leakage current VGS = ± 10 V; VDS = 0 V
Zero gate voltage drain
VDS = 100 V; VGS = 0 V
current
Tj = 150˚C
Tj = 150˚C
MIN.
TYP. MAX. UNIT
100
89
2
1.25
-
3
49
115
10
0.05
-
4
6
70
163
100
10
500
V
V
V
V
V
mΩ
mΩ
nA
µA
µA
Qg(tot)
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain (Miller) charge
ID = 23 A; VDD = 80 V; VGS = 10 V
-
22
5
10
-
nC
nC
nC
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 50 V; RD = 2.2 Ω;
VGS = 10 V; RG = 5.6 Ω
Resistive load
-
8
39
26
24
-
ns
ns
ns
ns
Ld
Ls
Internal drain inductance
Internal source inductance
Measured from drain lead to centre of die
Measured from source lead to source
bond pad
-
4.5
7.5
-
nH
nH
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
890
139
83
1187
167
109
pF
pF
pF
September 1999
2
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
VSD
Continuous source current
(body diode)
Pulsed source current (body
diode)
Diode forward voltage
trr
Qrr
Reverse recovery time
Reverse recovery charge
IS
ISM
CONDITIONS
MIN.
TYP. MAX. UNIT
-
-
13
A
-
-
92
A
IF = 11 A; VGS = 0 V
-
0.9
1.2
V
IF = 11 A; -dIF/dt = 100 A/µs;
VGS = 0 V; VR = 25 V
-
64
120
-
ns
nC
ISOLATION LIMITING VALUE & CHARACTERISTIC
Ths = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
Visol
R.M.S. isolation voltage from all
three terminals to external
heatsink
f = 50-60 Hz; sinusoidal
waveform;
R.H. ≤ 65% ; clean and dustfree
Cisol
Capacitance from T2 to external f = 1 MHz
heatsink
September 1999
3
MIN.
TYP.
-
-
10
MAX.
UNIT
2500
V
-
pF
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
Normalised Power Derating, PD (%)
Transient thermal impedance, Zth j-a (K/W)
10
100
90
D = 0.5
80
0.2
1
70
60
0.1
50
0.05
40
0.02
0.1
30
single pulse
20
10
0.01
1E-06
0
0
25
50
75
100
125
Mounting Base temperature, Tmb (C)
150
100
50
90
45
80
40
70
35
60
30
50
25
40
20
30
15
20
10
10
5
0
0
9V
1E-01
1E+00 1E+01
8V
7V
6V
5V
4V
0
150
1
2
3
4
5
6
7
8
9
10
Drain-Source Voltage, VDS (V)
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 10 V
1000
1E-02
Drain Current, ID (A)
55
50
75
100
125
Mounting Base temperature, Tmb (C)
1E-03
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
Normalised Current Derating, ID (%)
25
1E-04
Pulse width, tp (s)
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
0
1E-05
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS)
Drain-Source On Resistance, RDS(on) (Ohms)
Peak Pulsed Drain Current, IDM (A)
0.8
0.7
RDS(on) = VDS/ ID
100
0.6
tp = 10 us
0.5
100us
0.4
1 ms
0.3
4V
10
D.C.
6V
6.5V
5V
10 ms
1
5.5V
0.2
100 ms
7V
8V
0.1
VGS =9 V
0.1
0
1
10
100
1000
0
Drain-Source Voltage, VDS (V)
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
September 1999
10
20
30
Drain Current, ID (A)
40
50
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID)
4
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
ID / A
50
Threshold Voltage, VGS(TO) (V)
5
4.5
4
3.5
3
2.5
2
1.5
1
0.5
40
Tj / C = 25
30
150
20
10
-60 -40 -20 0 20 40 60 80 100 120 140 160
Junction Temperature, Tj (C)
0
0
2
4
6
8
10
VGS / V
Fig.7. Typical transfer characteristics.
ID = f(VGS)
Fig.10. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Transconductance, gfs (S)
1.0E-01
20
Drain current, ID (A)
Tj = 25 C
18
1.0E-02
16
14
minimum
1.0E-03
12
150 C
10
typical
8
1.0E-04
maximum
6
4
1.0E-05
2
0
1.0E-06
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30
Drain current, ID / (A)
0
Fig.8. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID)
0.5
1
1.5
2
2.5
3
3.5
Gate-source voltage, VGS (V)
4
4.5
5
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
Capacitances, Ciss, Coss, Crss (pF)
2.4
2.2
2
1.8
1.6
1.4
1.2
1
0.8
0.6
0.4
0.2
0
10000
Normalised On-state Resistance.
Ciss
1000
Coss
100
Crss
-60 -40 -20 0 20 40 60 80 100 120 140 160
Junction temperature , Tj (C)
10
0.1
Fig.9. Normalised drain-source on-state resistance.
RDS(ON)/RDS(ON)25 ˚C = f(Tj)
September 1999
1
10
Drain-Source Voltage, VDS (V)
100
Fig.12. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
5
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
Maximum Avalanche Current, IAS (A)
100
Gate-source voltage, VGS (V)
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
ID = 23A
Tj = 25 C
VDD = 20 V
25 C
10
VDD = 80 V
Tj prior to avalanche = 150 C
1
0
5
10
15
20
Gate charge, QG (nC)
25
30
0.1
0.001
35
0.01
0.1
1
10
Avalanche time, tAV (ms)
Fig.13. Typical turn-on gate-charge characteristics.
VGS = f(QG)
Fig.15. Maximum permissible non-repetitive
avalanche current (IAS) versus avalanche time (tAV);
unclamped inductive load
Source-Drain Diode Current, IF (A)
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
0
VGS = 0 V
150 C
Tj = 25 C
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5
Source-Drain Voltage, VSDS (V)
Fig.14. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
September 1999
6
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
MECHANICAL DATA
Dimensions in mm
Plastic single-ended package; isolated heatsink mounted; 1 mounting hole; 3 lead TO-220
SOT186A
Net Mass: 2 g
E
A
A1
P
q
D1
T
D
j
L2
L1
K
Q
b1
L
b2
1
2
3
b
c
w M
e
e1
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
(1)
UNIT
A
A1
b
b1
b2
c
D
D1
E
mm
4.6
4.0
2.9
2.5
0.9
0.7
1.1
0.9
1.4
1.2
0.7
0.4
15.8
15.2
6.5
6.3
10.3
9.7
e
2.54
e1
j
K
5.08
2.7
2.3
0.6
0.4
L
L1
14.4 3.30
13.5 2.79
L2
max.
P
Q
q
3
3.2
3.0
2.6
2.3
3.0
2.6
(2)
T
2.5
w
0.4
Notes
1. Terminal dimensions within this zone are uncontrolled. Terminals in this zone are not tinned.
2. Both recesses are ∅ 2.5 × 0.8 max. depth
OUTLINE
VERSION
SOT186A
REFERENCES
IEC
JEDEC
TO-220
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-06-11
Fig.16. SOT186A; The seating plane is electrically isolated from all terminals.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for F-pack envelopes.
3. Epoxy meets UL94 V0 at 1/8".
September 1999
7
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHX23NQ10T
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 1999
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
September 1999
8
Rev 1.000