PD - 95855 IRFB16N50K SMPS MOSFET Applications HEXFET® Power MOSFET Switch Mode Power Supply (SMPS) Uninterruptible Power Supply High Speed Power Switching Hard Switched and High Frequency Circuits l l l l VDSS RDS(on) typ. 285m: 500V Benefits Low Gate Charge Qg results in Simple Drive Requirement Improved Gate, Avalanche and Dynamic dv/dt Ruggedness Fully Characterized Capacitance and Avalanche Voltage and Current Low RDS(on) l l l l ID 17A S D G TO-220AB Absolute Maximum Ratings Parameter ID @ TC = 25°C Max. Units Continuous Drain Current, VGS @ 10V 17 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V Pulsed Drain Current IDM 11 PD @TC = 25°C Power Dissipation 280 W VGS Linear Derating Factor Gate-to-Source Voltage 2.3 ± 30 W/°C V dv/dt TJ Peak Diode Recovery dv/dt Operating Junction and 8.0 -55 to + 150 V/ns TSTG Storage Temperature Range c A 68 e °C Soldering Temperature, for 10 seconds Mounting torqe, 6-32 or M3 screw 300 (1.6mm from case ) y y 10 lbf in (1.1N m) Avalanche Characteristics EAS Parameter Single Pulse Avalanche Energy IAR Avalanche Current EAR Repetitive Avalanche Energy c d c Typ. Max. Units ––– 310 mJ ––– 17 A ––– 28 mJ Thermal Resistance Typ. Max. Units RθJC Junction-to-Case Parameter ––– 0.44 °C/W RθCS Case-to-Sink, Flat, Greased Surface 0.50 ––– RθJA Junction-to-Ambient ––– 62 www.irf.com 1 03/11/04 IRFB16N50K Static @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units Conditions V(BR)DSS Drain-to-Source Breakdown Voltage 500 ––– ––– ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.58 ––– RDS(on) Static Drain-to-Source On-Resistance ––– 285 350 VGS(th) Gate Threshold Voltage 3.0 ––– 5.0 V VDS = VGS, ID = 250µA IDSS Drain-to-Source Leakage Current ––– ––– 50 µA VDS = 500V, VGS = 0V ––– ––– 250 Gate-to-Source Forward Leakage ––– ––– 100 nA VGS = 30V Gate-to-Source Reverse Leakage ––– ––– -100 IGSS V VGS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 10A f VDS = 400V, VGS = 0V, TJ = 125°C VGS = -30V Dynamic @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units ––– ––– S Conditions VDS = 50V, ID = 10A gfs Qg Forward Transconductance 5.7 Total Gate Charge ––– 60 89 Qgs Gate-to-Source Charge ––– 18 27 Qgd Gate-to-Drain ("Miller") Charge ––– 28 43 VGS = 10V td(on) Turn-On Delay Time ––– 20 ––– VDD = 250V tr Rise Time ––– 77 ––– td(off) Turn-Off Delay Time ––– 38 ––– RG = 8.8Ω tf Fall Time ––– 30 ––– VGS = 10V Ciss Input Capacitance ––– 2210 ––– VGS = 0V 240 ––– VDS = 25V ID = 17A nC ns VDS = 400V f ID = 17A f Coss Output Capacitance ––– Crss Reverse Transfer Capacitance ––– 26 ––– Coss Output Capacitance ––– 2620 ––– ƒ = 1.0MHz VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz Coss Output Capacitance ––– 63 ––– VGS = 0V, VDS = 400V, ƒ = 1.0MHz Coss eff. Effective Output Capacitance ––– 120 ––– VGS = 0V, VDS = 0V to 400V pF e Diode Characteristics Parameter IS Continuous Source Current Min. Typ. Max. Units Conditions ––– ––– 17 A ––– ––– 68 A (Body Diode) ISM D showing the Pulsed Source Current (Body Diode) MOSFET symbol ch G integral reverse p-n junction diode. VSD Diode Forward Voltage ––– ––– 1.5 V TJ = 25°C, IS = 17A, VGS = 0V trr Reverse Recovery Time ––– 490 730 ns TJ = 25°C, IF = 17A Qrr Reverse Recovery Charge ton Forward Turn-On Time Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 2.2mH, RG = 25Ω, IAS = 17A. 2 S f f ––– 5710 8560 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) ISD ≤ 17A, di/dt ≤ 340A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C. Pulse width ≤ 300µs; duty cycle ≤ 2%. www.irf.com IRFB16N50K 100 100 VGS 15V 10V 8.0V 7.5V 7.0V 6.5V 6.0V 5.5V 10 BOTTOM TOP 1 ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 5.5V 0.1 1 10 BOTTOM 5.5V 1 60µs PULSE WIDTH Tj = 150°C 60µs PULSE WIDTH Tj = 25°C 0.1 10 0.1 0.1 100 1 10 100 V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 3.0 T J = 150°C 10 T J = 25°C VDS = 100V 60µs PULSE WIDTH 1.0 RDS(on) , Drain-to-Source On Resistance (Normalized) ID, Drain-to-Source Current (Α) VGS 15V 10V 8.0V 7.5V 7.0V 6.5V 6.0V 5.5V 2.5 ID = 17A VGS = 10V 2.0 1.5 1.0 0.5 0.0 4 5 6 7 8 9 10 11 12 13 14 15 16 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com -60 -40 -20 0 20 40 60 80 100 120 140 160 T J , Junction Temperature (°C) Fig 4. Normalized On-Resistance vs. Temperature 3 IRFB16N50K 100000 ID= 17A VGS, Gate-to-Source Voltage (V) 10000 C, Capacitance(pF) 12.0 VGS = 0V, f = 1 MHZ Ciss = C gs + C gd, C ds SHORTED Crss = C gd Coss = C ds + C gd Ciss 1000 Coss 100 Crss 10 8.0 6.0 4.0 2.0 0.0 1 1 10 100 1000 0 Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 20 30 40 50 60 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 100.00 1000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 10 QG Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) OPERATION IN THIS AREA LIMITED BY R DS(on) 100 T J = 150°C 10.00 T J = 25°C 1.00 10 100µsec 1msec 1 Tc = 25°C Tj = 150°C Single Pulse VGS = 0V 0.10 10msec 0.1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 VSD, Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 VDS= 400V VDS= 250V VDS= 100V 10.0 1.6 1 10 100 1000 10000 VDS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRFB16N50K 20 V DS ID, Drain Current (A) VGS RD D.U.T. 15 RG 10 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % + - VDD 10V Fig 10a. Switching Time Test Circuit 5 VDS 90% 0 25 50 75 100 125 150 T C , Case Temperature (°C) 10% VGS Fig 9. Maximum Drain Current vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response ( Z thJC ) 1 D = 0.50 0.1 0.20 0.10 0.05 0.02 0.01 0.01 SINGLE PULSE ( THERMAL RESPONSE ) Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFB16N50K EAS , Single Pulse Avalanche Energy (mJ) 600 ID 7.6A 11A BOTTOM 17A TOP 500 15V 400 DRIVER L VDS 300 D.U.T RG 200 + - VDD IAS 20V tp A 0.01Ω 100 Fig 13a. Unclamped Inductive Test Circuit 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) V(BR)DSS Fig 12. Maximum Avalanche Energy vs. Drain Current tp I AS Fig 13b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. QG 50KΩ 12V VGS .2µF .3µF D.U.T. QGS + V - DS QGD VG VGS 3mA IG ID Current Sampling Resistors Fig 14a. Gate Charge Test Circuit 6 Charge Fig 14b. Basic Gate Charge Waveform www.irf.com IRFB16N50K Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + RG • • • • Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Period D= - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 15. For N-Channel HEXFET® Power MOSFETs www.irf.com 7 IRFB16N50K TO-220AB Package Outline Dimensions are shown in millimeters (inches) 2.87 (.113) 2.62 (.103) 10.54 (.415) 10.29 (.405) -B- 3.78 (.149) 3.54 (.139) 4.69 (.185) 4.20 (.165) -A- 1.32 (.052) 1.22 (.048) 6.47 (.255) 6.10 (.240) 4 15.24 (.600) 14.84 (.584) 1.15 (.045) MIN 1 2 14.09 (.555) 13.47 (.530) 4.06 (.160) 3.55 (.140) 3X 3X LEAD ASSIGNMENTS 1 - GATE 2 - DRAIN 3 - SOURCE 4 - DRAIN 3 1.40 (.055) 1.15 (.045) 0.93 (.037) 0.69 (.027) 0.36 (.014) 3X M B A M 0.55 (.022) 0.46 (.018) 2.92 (.115) 2.64 (.104) 2.54 (.100) 2X NOTES: 1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 2 CONTROLLING DIMENSION : INCH 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB. 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS. TO-220AB Part Marking Information ( ' 2 & 7 /2 / $ 1 2 7, $ 1 5 7( ,1 (5 % 0 8 1 7 5 3$ ) ,5 1 $ ,6 ,6 7+ ( 3/ 0 $ (; 5 ( ), 7, (& 5 ( ' 2 & 7( $ ' & ( ,1 / /< % 0 6( 6 $ ( + 7 ,1 2 * /2 : : 1 2 ' /( % 0 6( 6 $ /< % (0 66 $ 5 $ <( ( ' 2 & 7 /2 . (( : & ( 1 /, For GB Production (;$03/( 7+,6,6$1,5) /27&2'( $66(0%/('21:: ,17+($66(0%/</,1(& ,17(51$7,21$/ 5(&7,),(5 /2*2 /27&2'( 3$57180%(5 '$7(&2'( TO-220AB package is not recommended for Surface Mount Application. Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.03/04 8 www.irf.com