INFINEON BSP135

BSP135
SIPMOS® Small-Signal-Transistor
Product Summary
Features
• N-channel
• Depletion mode
V DS
600
V
R DS(on),max
60
Ω
I DSS,min
0.02
A
• dv /dt rated
SOT-223
Type
Package
Ordering Code
Tape and Reel Information
Marking
BSP135
SOT-223
Q62702-S655
E6327: 1000 pcs/reel
BSP135
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter
Symbol Conditions
Continuous drain current
ID
T A=25 °C
0.12
T A=70 °C
0.10
0.48
Pulsed drain current
I D,pulse
T A=25 °C
Reverse diode dv /dt
dv /dt
I D=0.12 A, V DS=20 V,
di /dt =200 A/µs,
T j,max=150 °C
Gate source voltage
V GS
6
±20
ESD sensitivity (HBM) as per
MIL-STD 883
Unit
A
kV/µs
V
Class 1
Power dissipation
P tot
Operating and storage temperature
T j, T stg
T A=25 °C
IEC climatic category; DIN IEC 68-1
Rev. 1.0
Value
1.8
W
-55 ... 150
°C
55/150/56
page 1
2003-04-03
BSP135
Parameter
Values
Symbol Conditions
Unit
min.
typ.
max.
-
-
25
minimal footprint
-
-
115
6 cm2 cooling area1)
-
-
70
Thermal characteristics
Thermal resistance,
junction - soldering point (pin 4)
R thJS
SMD version, device on PCB
R thJA
K/W
Electrical characteristics, at T j=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage
V (BR)DSS V GS=-3 V, I D=250 µA
600
-
-
Gate threshold voltage
V GS(th)
V DS=3 V, I D=94 µA
-2.1
-1.4
-1
Drain-source cutoff current
I D(off)
V DS=600 V,
V GS=-3 V, T j=25 °C
-
-
0.1
V DS=600 V,
V GS=-3 V, T j=125 °C
-
-
10
V
µA
Gate-source leakage current
I GSS
V GS=20 V, V DS=0 V
-
-
100
nA
On-state drain current
I DSS
V GS=0 V, V DS=10 V
20
-
-
mA
Drain-source on-state resistance
R DS(on)
V GS=0 V, I D=0.01A
-
30
60
V GS=10 V, I D=0.12 A
-
25
45
|V DS|>2|I D|R DS(on)max,
I D=0.1 A
0.08
0.16
-
Transconductance
g fs
Ω
S
1)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (single layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
Rev. 1.0
page 2
2003-04-03
BSP135
Parameter
Values
Symbol Conditions
Unit
min.
typ.
max.
-
98
146
-
8.5
13
Dynamic characteristics
Input capacitance
C iss
Output capacitance
C oss
Reverse transfer capacitance
Crss
-
3.4
5.1
Turn-on delay time
t d(on)
-
5.4
8.1
Rise time
tr
-
5.6
8.4
Turn-off delay time
t d(off)
-
28
42
Fall time
tf
-
182
273
Gate to source charge
Q gs
-
0.24
0.36
Gate to drain charge
Q gd
-
2.0
3.0
Gate charge total
Qg
-
3.7
4.9
Gate plateau voltage
V plateau
-
0.20
-
V
-
-
0.12
A
-
-
0.48
-
0.78
1.2
V
-
87
130
ns
-
70
104
nC
V GS=-3 V, V DS=25 V,
f =1 MHz
V DD=300 V,
V GS=-3...5 V,
I D=0.1 A, R G=6 Ω
pF
ns
Gate Charge Characteristics
V DD=400 V, I D=0.1 A,
V GS=-3 to 5 V
nC
Reverse Diode
Diode continous forward current
IS
Diode pulse current
I S,pulse
Diode forward voltage
V SD
Reverse recovery time
t rr
Reverse recovery charge
Q rr
Rev. 1.0
T A=25 °C
V GS=-3 V, I F=0.12 A,
T j=25 °C
V R=300 V, I F=0.1 A,
di F/dt =100 A/µs
page 3
2003-04-03
BSP135
1 Power dissipation
2 Drain current
P tot=f(T A)
I D=f(T A); V GS≥10 V
2
0.15
1.5
I D [A]
P tot [W]
0.1
1
0.05
0.5
0
0
0
40
80
120
0
160
40
80
T A [°C]
120
160
T A [°C]
3 Safe operation area
4 Max. transient thermal impedance
I D=f(V DS); T A=25 °C; D =0
Z thJA=f(t p)
parameter: t p
parameter: D =t p/T
1
100
10 µs
limited by on-state
resistance
100 µs
0.5
0.1
Z thJA [K/W]
I D [A]
1 ms
10 ms
0.2
10
0.1
0.05
0.01
single pulse
0.02
DC
0.01
0.001
1
1
10
100
1000
10
0 -3
100-2
100-1
10 01
10110 10 2 100
t p [s]
V DS [V]
Rev. 1.0
010-4
page 4
2003-04-03
BSP135
5 Typ. output characteristics
6 Typ. drain-source on resistance
I D=f(V DS); T j=25 °C
R DS(on)=f(I D); T j=25 °C
parameter: V GS
parameter: V GS
100
0.25
-0.2 V
1V
10 V
0.2 V
0V
-0.1 V
0.5 V
0.1 V
80
0.2
0.5 V
R DS(on) [Ω]
I D [A]
0.15
0.2 V
0.1 V
0.1
60
40
0V
1V
-0.1 V
-0.2 V
10 V
20
0.05
0
0
0
2
4
6
8
0
10
0.04
0.08
V DS [V]
0.12
0.16
0.2
I D [A]
7 Typ. transfer characteristics
8 Typ. forward transconductance
I D=f(V GS); |V DS|>2|I D|R DS(on)max
g fs=f(I D); T j=25 °C
0.25
0.2
0.2
0.15
I D [A]
g fs [S]
0.15
0.1
0.1
0.05
0.05
0
0
-2
-1
0
1
V GS [V]
Rev. 1.0
0.0
0.0
0.1
0.1
I D [A]
page 5
2003-04-03
BSP135
9 Drain-source on-state resistance
10 Typ. gate threshold voltage
R DS(on)=f(T j); I D=0.01 A; V GS=0 V
V GS(th)=f(T j); V DS=3 V; I D=94 µA
parameter: I D
160
0
140
-0.5
120
-1
V GS(th) [V]
R DS(on) [Ω]
100
80
98 %
98 %
typ
-1.5
60
-2
2%
40
typ
-2.5
20
0
-3
-60
-20
20
60
100
140
180
-60
-20
20
60
100
140
180
T j [°C]
T j [°C]
11 Typ. Capacitances
12 Forward characteristics of reverse diode
C =f(V DS); V GS=-3 V; f =1 MHz
I F=f(V SD)
parameter: T j
10
1000
100
150 °C
1
Ciss
25 °C
I F [A]
C [pF]
150 °C, 98 %
10
25 °C, 98 %
0.1
Coss
Crss
0.01
1
0
5
10
15
20
25
30
V DS [V]
Rev. 1.0
0
0.5
1
1.5
V SD [V]
page 6
2003-04-03
BSP135
14 Typ. gate charge
15 Drain-source breakdown voltage
V GS=f(Q gate); I D=0.1 A pulsed
V BR(DSS)=f(T j); I D=250 µA
parameter: V DD
8
700
0.5 VDS(max)
0.2 VDS(max)
6
660
0.8 VDS(max)
V BR(DSS) [V]
V GS [V]
4
2
620
580
0
540
-2
-4
500
0
1
2
3
4
5
Q gate [nC]
Rev. 1.0
-60
-20
20
60
100
140
180
T j [°C]
page 7
2003-04-03
BSP135
Package Outline:
Footprint:
Packaging:
Dimensions in mm
Rev. 1.0
page 8
2003-04-03
BSP135
Published by
Infineon Technologies AG
Bereich Kommunikation
St.-Martin-Straße 53
D-81541 München
© Infineon Technologies AG 1999
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as
warranted characteristics.
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We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement,
regarding circuits, descriptions and charts started herein.
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For further information on technology, delivery terms and conditions and prices, please contact your
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(see address list).
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Due to technical requirements, components may contain dangerous substances.
For information on the types in question, please contact your nearest Infineon Technologies office.
Infineon Technologies' components may only be used in life-support devices or systems with the
expressed written approval of Infineon Technologies if a failure of such components can reasonably
be expected to cause the failure of that life-support device or system, or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted
in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail,
it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0
page 9
2003-04-03