INFINEON HYS72D128020GU-7-A

HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
2.5 V 184-pin Unbuffered DDR-I SDRAM Modules
512 MByte & 1024 MByte Modules
PC1600, PC2100 & PC2700
Preliminary datasheet rev. 0.81
• Auto Refresh (CBR) and Self Refresh
• 184-pin Unbuffered 8-Byte Dual-In-Line
DDR-I SDRAM non-parity and ECC-Modules
for PC and Server main memory applications
• All inputs and outputs SSTL_2 compatible
• Serial Presence Detect with E2PROM
• One bank 64M x 64, 64M x 72 and two bank
128M x 64, 128M × 72 organization
• Jedec standard MO-206 form factor:
133.35 mm × 31.75 mm × 4.00 mm max.
• JEDEC standard Double Data Rate
Synchronous DRAMs (DDR-I SDRAM)
Single + 2.5 V (± 0.2 V) power supply
• Jedec standard reference layout
• Gold plated contacts
• Built with 512 Mbit DDR-I SDRAMs organized
as 64Mb x 8 in 66-Lead TSOPII package
• Programmable CAS Latency, Burst Length,
and Wrap Sequence (Sequential &
Interleave)
• Performance:
-6
-7
-8
Unit
Component Speed Grade
DDR333B DDR266A DDR200
Module Speed Grade
PC2700
PC2100
PC1600
fCK
Clock Frequency (max.) @ CL = 2.5
166
143
125
MHz
fCK
Clock Frequency (max.) @ CL = 2
133
133
100
MHz
The HYS64/72D64000GU and HYS64/72D128020GU are industry standard 184-pin 8-byte Dual
in-line Memory Modules (DIMMs) organized as 64M × 64 and 128M × 64 for non-parity and 64M x
72 and 128M x 72 for ECC main memory applications. The memory array is designed with 512Mbit
Double Data Rate Synchronous DRAMs. A variety of decoupling capacitors are mounted on the PC
board. The DIMMs feature serial presence detect based on a serial E2PROM device using the 2-pin
I2C protocol. The first 128 bytes are programmed with configuration data and the second 128 bytes
are available to the customer.
INFINEON Technologies
1
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Ordering Information
Type
Compliance Code
Description
SDRAM
Technology
PC2700 (CL=2.5):
HYS64D128320GU-6-A
PC2700-25330-B1
two banks 1024 MB DIMM
512 MBit
HYS72D128320GU-6-A
PC2700-25330-B1
two banks 1024 MB ECC-DIMM
512 MBit
HYS64D64000GU-7-A
PC2100-20330-A1
one bank 512 MB DIMM
512 MBit
HYS72D64000GU-7-A
PC2100-20330-A1
one bank 512 MB ECC-DIMM
512 Mbit
HYS64D128020GU-7-A
PC2100-20330-B1
two banks 1024 MB DIMM
512 MBit
HYS72D128020GU-7-A
PC2100-20330-B1
two banks 1024 MB ECC-DIMM
512 MBit
HYS64D64000GU-8-A
PC1600-20220-A1
one bank 512 MB DIMM
512 MBit
HYS72D64000GU-8-A
PC1600-20220-A1
one bank 512 MB ECC-DIMM
512 Mbit
PC2100 (CL=2):
PC1600 (CL=2):
HYS64D128020GU-8-A
PC1600-20220-B1
two banks 1024 MB DIMM
512 MBit
HYS72D128020GU-8-A
PC1600-20220-B1
two banks 1024 MB ECC-DIMM
512 MBit
Note:
All part numbers end with a place code, designating the silicon-die revision. Reference information
available on request. Example: HYS 72D64000GU-8-A, indicating Rev.A dies are used for the SDRAM
components.
The Compliance Code is printed on the module labels and describes the speed sort fe. “PC2100”, the
latencies (f.e. “20330” means CAS latency = 2, trcd latency = 3 and trp latency =3 ) and the Raw Card
used for this module.
INFINEON Technologies
2
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Pin Definitions and Functions
A0 - A12
Address Inputs
S0, S1
Chip Selects
BA0, BA1
Bank Selects
VDD
Power (+ 2.5 V)
DQ0 - DQ63
Data Input/Output
VSS
Ground
CB0 - CB7
Check Bits (x72 organization only)
VDDQ
I/O Driver power supply
RAS
Row Address Strobe
VDDID
VDD Indentification flag
CAS
Column Address Strobe
VREF
I/O reference supply
WE
Read/Write Input
VDDSPD
Serial EEPROM power supply
CKE0 - CKE1
Clock Enable
SCL
Serial bus clock
DQS0 - DQS8
SDRAM low data strobes
SDA
Serial bus data line
CLK0 - CLK2,
SDRAM clock (positive lines)
SA0 - SA2
slave address select
CLK0 - CLK2
SDRAM clock (negative lines)
NC
no connect
DM0 - DM8
DQS9 - DQS17
SDRAM low data mask/
high data strobes
note: S1 and CKE1 are used on two bank modules only
Address Format
Density
Organization
Memory
Banks
SDRAMs
# of
SDRAMs
# of row/bank/
columns bits
Refresh
Period
Interval
512 MB
64M x 64
1
64M x 8
8
13/2/11
8k
64 ms
7.8 µs
512 MB
64M x 72
1
64M x 8
9
13/2/11
8k
64 ms
7.8 µs
1024 MB 128M × 64
2
64M x 8
16
13/2/11
8k
64 ms
7.8 µs
1024 MB 128M × 72
2
64M x 8
18
13/2/11
8k
64 ms
7.8 µs
INFINEON Technologies
3
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Pin Configuration
PIN#
Frontside
Symbol
PIN#
Frontside
Symbol
PIN#
Backside
Symbol
PIN#
Backside
Symbol
1
2
VREF
DQ0
48
49
A0
NC / CB2
93
94
VSS
DQ4
140
141
NC / DM8/DQS17
A10
3
4
VSS
DQ1
50
51
VSS
NC / CB3
95
96
DQ5
VDDQ
142
143
NC / CB6
VDDQ
5
6
DQS0
DQ2
52
BA1
KEY
97
98
DM0/DQS9
DQ6
144
NC / CB7
KEY
7
8
VDD
DQ3
53
54
DQ32
VDDQ
99
100
DQ7
VSS
145
146
VSS
DQ36
9
10
NC
NC
55
56
DQ33
DQS4
101
102
NC
NC
147
148
DQ37
VDD
11
12
VSS
DQ8
57
58
DQ34
VSS
103
104
NC
VDDQ
149
150
DM4/DQS13
DQ38
13
14
DQ9
DQS1
59
60
BA0
DQ35
105
106
DQ12
DQ13
151
152
DQ39
VSS
15
16
VDDQ
CLK1
61
62
DQ40
VDDQ
107
108
DM1/DQS10
VDD
153
154
DQ44
RAS
17
CLK1
63
WE
109
DQ14
155
DQ45
18
19
VSS
DQ10
64
65
DQ41
CAS
110
111
DQ15
CKE1
156
157
VDDQ
S0
20
21
DQ11
CKE0
66
67
VSS
DQS5
112
113
VDDQ
NC (BA2)
158
159
S1
DM5/DQS14
22
23
VDDQ
DQ16
68
69
DQ42
DQ43
114
115
DQ20
NC / A12
160
161
VSS
DQ46
24
25
DQ17
DQS2
70
71
VDD
NC
116
117
VSS
DQ21
162
163
DQ47
NC
26
27
VSS
A9
72
73
DQ48
DQ49
118
119
A11
DM2/DQS11
164
165
VDDQ
DQ52
28
29
DQ18
A7
74
75
VSS
CLK2
120
121
VDD
DQ22
166
167
DQ53
NC (A13)
30
31
VDDQ
DQ19
76
77
CLK2
VDDQ
122
123
A8
DQ23
168
169
VDD
DM6/DQS15
32
33
A5
DQ24
78
79
DQS6
DQ50
124
125
VSS
A6
170
171
DQ54
DQ55
34
35
VSS
DQ25
80
81
DQ51
VSS
126
127
DQ28
DQ29
172
173
VDDQ
NC
36
37
DQS3
A4
82
83
VDDID
DQ56
128
129
VDDQ
DM3/DQS12
174
175
DQ60
DQ61
38
39
VDD
DQ26
84
85
DQ57
VDD
130
131
A3
DQ30
176
177
VSS
DM7/DQS16
40
41
DQ27
A2
86
87
DQS7
DQ58
132
133
VSS
DQ31
178
179
DQ62
DQ63
42
43
VSS
A1
88
89
DQ59
VSS
134
135
NC / CB4
NC / CB5
180
181
VDDQ
SA0
44
45
NC / CB0
NC / CB1
90
91
NC
SDA
136
137
VDDQ
CK0
182
183
SA1
SA2
46
47
VDD
NC / DQS8
92
SCL
138
139
CK0
VSS
184
VDDSPD
Note: Pins 44, 45, 47, 49, 51, 134, 135, 140 and 144 are NC (“no-connects”) on x64 organised non-ECC
modules.
INFINEON Technologies
4
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
S0
DQS0
DM0/DQS9
DQS4
DM4/DQS13
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DQS
CS
D0
DQS
D4
DQS5
DM5/DQS14
DQS1
DM1/DQS10
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D1
DQS
D5
DQS6
DM6/DQS15
DQS2
DM2/DQS11
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D2
DQS3
DM3/DQS12
DQS
D6
DQS7
DM7/DQS16
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D3
DQS
D7
* Clock Wiring
Serial PD
SDA
SCL
A0
A1
A2
SA0
SA1
SA2
BA0 - BA1
BA0, BA1: SDRAMs D0 - D7
A0 -A11, A12
A0 - A11,A12: SDRAMs D0 - D7
RAS
VDD, VDDQ
D0 - D7
VREF
D0 - D7
VSS
D0 - D7
Clock
Input
SDRAMs
*CK0/CK0
*CK1/CK1
*CK2/CK2
2 SDRAMs
3 SDRAMs
3 SDRAMs
* Wire per Clock Loading
Table/W iring Diagrams
RAS: SDRAMs D0 - D7
CAS
CAS: SDRAMs D0 - D7
CKE0
CKE: SDRAMs D0 - D7
WE
WE : SDRAMs D0 - D7
VDDID
Notes:
1. DQ-to-I/O wiring is shown as recommended but may be changed.
2. DQ/DQS/DM/CKE/S relationships must
be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
Block Diagram: One Bank 64M x 64 DDR-I SDRAM DIMM Module
HYS64D64000GU using x8 organized SDRAMs
INFINEON Technologies
5
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
S1
S0
DQS4
DM4/DQS13
DQS0
DM0/DQS9
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D0
CS DQS
D8
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D1
CS DQS
D9
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D2
CS
DQS
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
D10
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
DQS
D4
CS
DQS
D12
CS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
DQS
D5
CS
DQS
D13
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
DQS
D6
CS
DQS
D14
DQS7
DM7/DQS16
DQS3
DM3/DQS12
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
CS
DQS6
DM6/DQS15
DQS2
DM2/DQS11
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQS5
DM5/DQS14
DQS1
DM1/DQS10
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D3
CS
DQS
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
D11
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
DQS
D7
CS DQS
D15
* Clock Wiring
BA0, BA1
BA0, BA1: SDRAMs D0, D15
A0 - A12
A0 - A12: SDRAMs D0 - D15
VDD, VDDQ
VREF
VSS
Serial PD
SDA
D0 - D15
SCL
A0
A1
A2
SA0
SA1
SA2
Clock
Input
SDRAMs
*CK0/CK0
*CK1/CK1
*CK2/CK2
4 SDRAMs
6 SDRAMs
6 SDRAMs
* W ire per Clock Loading
Table/Wiring Diagrams
D0 - D15
D0 - D15
VDDID
CKE1
CKE: SDRAMs D8 - D15
RAS
RAS: SDRAMs D0 - D15
CAS
CAS: SDRAMs D0 - D15
CKE0
CKE: SDRAMs D0 - D7
WE
WE: SDRAMs D0 - D15
Notes:
1. DQ-to-I/O wiring is shown as recommended but may be changed.
2. DQ/DQS/DM/CKE/S relationships must
be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
Block Diagram: Two Bank 128M x 64 DDR-I SDRAM DIMM Modules
HYS64D128020GU using x8 Organized SDRAMs
INFINEON Technologies
6
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
S0
DQS0
DM0/DQS9
DQS4
DM4/DQS13
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DQS
D0
DQS
D4
DQS5
DM5/DQS14
DQS1
DM1/DQS10
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS DQS
D1
DQS
D5
DQS6
DM6/DQS15
DQS2
DM2/DQS11
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D2
DQS3
DM3/DQS12
DQS
D6
DQS7
DM7/DQS16
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D3
DQS
D7
DQS8
DM8/DQS17
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
SDA
SCL
BA0, BA1
BA0, BA1: SDRAMs D0 - D8
A0 - A11,A12
A0 - A11, A12: SDRAMs D0 - D8
VDD, VDDQ
VREF
VSS
Serial PD
DQS
D8
D0 - D8
D0 - D8
D0 - D8
A0
A1
A2
SA0
SA1
SA2
* Clock Wiring
RAS
RAS: SDRAMs D0 - D8
CAS
CAS: SDRAMs D0 - D8
CKE0
CKE: SDRAMs D0 - D8
WE
WE: SDRAMs D0 - D8
VDDID
Clock
Input
SDRAMs
*CK0/CK0
*CK1/CK1
*CK2/CK2
3 SDRAMs
3 SDRAMs
3 SDRAMs
* Wire per Clock Loading
Table/Wiring Diagrams
Notes:
1. DQ-to-I/O wiring is shown as recommended but may be changed.
2. DQ/DQS/DM/CKE/S relationships must
be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
Block Diagram: One Bank 64M x 72 DDR-I SDRAM DIMM Module
HYS72D64000GU using x8 organized SDRAMs
INFINEON Technologies
7
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
S1
S0
DQS4
DM4/DQS13
DQS0
DM0/DQS9
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQS
CS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D0
CS DQS
D9
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQS
CS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D1
CS DQS
D10
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D2
CS
DQS
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
D11
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
CS
DQS
D13
CS
DQS
D5
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
CS
DQS
D14
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D6
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
CS
DQS
D15
DQS7
DM7/DQS16
DQS3
DM3/DQS12
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
CS
D4
DQS6
DM6/DQS15
DQS2
DM2/DQS11
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DQS5
DM5/DQS14
DQS1
DM1/DQS10
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D3
CS
DQS
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
D12
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
DM
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
CS DQS
D7
CS DQS
D16
DQS8
DM8/DQS17
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D8
DM
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CS
DQS
D17
* Clock Wiring
BA0, BA1
BA0, BA1: SDRAMs D0 - D17
A0 - A12
A0 - A12: SDRAMs D0 - D17
Serial PD
SDA
VDD, VDDQ
VREF
VSS
D0 - D17
SCL
D0 - D17
A0
A1
A2
SA0
SA1
SA2
Clock
Input
SDRAMs
*CK0/CK0
*CK1/CK1
*CK2/CK2
6 SDRAMs
6 SDRAMs
6 SDRAMs
* Wire per Clock Loading
Table/Wiring Diagrams
D0 - D17
VDDID
CKE1
CKE: SDRAMs D9 - D17
RAS
RAS: SDRAMs D0 - D17
CAS
CAS: SDRAMs D0 - D17
CKE0
CKE: SDRAMs D0 - D8
WE
WE: SDRAMs D0 - D17
Notes:
1. DQ-to-I/O wiring is shown as recommended but may be changed.
2. DQ/DQS/DM/CKE/S relationships must
be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
Block Diagram: Two Bank 128M x 72 DDR-I SDRAM DIMM Modules
HYS72D128020GU using x8 Organized SDRAMs
INFINEON Technologies
8
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Clock Net Wiring
4 DRAM Loads
6 DRAM Loads
DR AM 1
DR AM 1
DRAM2
CK
DRAM2
R = 120
R =120
DRAM3
DIMM
Connector
Cap.
DIMM
Connector
CK
DR AM4
Cap.
DR AM5
DR AM5
DR AM6
DRAM6
DR AM 1
3 DRAM Loads
2 DRAM Loads
DR AM 1
Cap.
Cap.
R =120
R =120
Cap.
DIMM
Connector
DR AM3
DIMM
Connector
Cap.
Cap.
DR AM5
DR AM5
Cap.
Cap.
Absolute Maximum Ratings
Parameter
Symbol
Limit Values
min.
max.
Unit
Input / Output voltage relative to VSS
VIN, VOUT
– 0.5
3.6
V
Power supply voltage on VDD/VDDQ to VSS
VDD, VDDQ – 0.5
3.6
V
Storage temperature range
TSTG
-55
+150
o
Power dissipation (per SDRAM component)
PD
–
1
W
Data out current (short circuit)
IOS
–
50
mA
C
Permanent device damage may occur if “Absolute Maximum Ratings” are exceeded.
Functional operation should be restricted to recommended operation conditions.
Exposure to higher than recommended voltage for extended periods of time affect device reliability
INFINEON Technologies
9
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Supply Voltage Levels
Parameter
Symbol
Limit Values
min.
nom.
max.
Unit
Notes
Device Supply Voltage
VDD
2.3
2.5
2.7
V
–
Output Supply Voltage
VDDQ
2.3
2.5
2.7
V
1)
Input Reference Voltage
VREF
0.49 x VDDQ
0.5 x VDDQ
0.51 x VDDQ
V
2)
Termination Voltage
VTT
VREF – 0.04
VREF
VREF + 0.04
V
3)
EEPROM supply voltage
VDDSPD
2.3
2.5
3.6
V
1)
2)
3)
Under all conditions, VDDQ must be less than or equal to VDD.
Peak to peak AC noise on VREF may not exceed ± 2% VREF (DC). VREF is also expected to track noise variations
in VDDQ.
VTT of the transmitting device must track VREF of the receiving device.
DC Operating Conditions (SSTL_2 Inputs)
(VDDQ = 2.5 V, TA = 70 °C, Voltage Referenced to VSS )
Parameter
Symbol
Limit Values
min.
Unit
Notes
max.
DC Input Logic High
VIH (DC)
VREF + 0.15
VDDQ + 0.3
V
1)
DC Input Logic Low
VIL (DC)
– 0.30
VREF – 0.15
V
–
Input Leakage Current
IIL
–5
5
µA
2)
Output Leakage Current
IOL
–5
5
µA
2)
1)
2)
The relationship between the VDDQ of the driving device and the VREF of the receiving device is what determines
noise margins. However, in the case of VIH (max) (input overdrive), it is the VDDQ of the receiving device that is
referenced. In the case where a device is implemented such that it supports SSTL_2 inputs but has no SSTL_2
outputs (such as a translator), and therefore no VDDQ supply voltage connection, inputs must tolerate input
overdrive to 3.0 V (High corner VDDQ + 300 mV).
For any pin under test input of 0 V ≤ VIN ≤ VDDQ + 0.3 V. Values are shown per DDR-SDRAM component.
INFINEON Technologies
10
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Operating, Standby and Refresh Currents (PC1600)
512MB
x64
1bank
-8
512MB
x72
1bank
-8
1GB
x64
2bank
-8
1GB
x72
2bank
-8
Unit
Notes
Symbol
Parameter/Condition
MAX
MAX
MAX
MAX
IDD0
Operating Current: one bank; active / precharge; tRC = tRC MIN; tCK =
tCK MIN; DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles
1280
1440
1680
1890
mA
1
IDD1
Operating Current: one bank; active/read/precharge; Burst = 4;
Refer to the following page for detailed test conditions.
1360
1530
1760
1980
mA
1, 3
IDD2P
Precharge Power-Down Standby Current: all banks idle; power-down
mode; CKE <= VIL MAX; tCK = tCK MIN
96
108
192
216
mA
2
IDD2F
Precharge Floating Standby Current: /CS >= VIH MIN, all banks idle;
CKE >= VIH MIN; tCK = tCK MIN ,address and other control inputs
changing once per clock cycle, VIN = VREF for DQ, DQS and DM.
320
360
640
720
mA
2
IDD2Q
Precharge Quiet Standby Current: /CS >= VIH MIN, all banks idle;
CKE >= VIH MIN; tCK = tCK MIN ,address and other control inputs
stable at >= VIH MIN or <= VIL MAX; VIN = VREF for DQ, DQS and DM.
200
225
400
450
mA
2
IDD3P
Active Power-Down Standby Current: one bank active; power-down
mode; CKE <= VIL MAX; tCK = tCK MIN;VIN = VREF for DQ, DQS and
DM.
128
144
256
288
mA
2
IDD3N
Active Standby Current: one bank active; active / precharge;CS >= VIH
MIN; CKE >= VIH MIN; tRC = tRAS MAX; tCK = tCK MIN; DQ, DM, and
DQS inputs changing twice per clock cycle; address and control inputs
changing once per clock cycle
400
450
800
900
mA
2
IDD4R
Operating Current: one bank active; Burst = 2; reads; continuous burst;
address and control inputs changing once per clock cycle; 50% of data
outputs changing on every clock edge; CL = 2 for DDR200, and
DDR266A, CL=3 for DDR333; tCK = tCK MIN; IOUT = 0mA
1320
1485
1720
1935
mA
1, 3
IDD4W
Operating Current: one bank active; Burst = 2; writes; continuous burst;
address and control inputs changing once per clock cycle; 50% of data
outputs changing on every clock edge; CL = 2 for DDR200, and
DDR266A, CL=3 for DDR333; tCK = tCK MIN
1280
1440
1680
1890
mA
1
IDD5
Auto-Refresh Current: tRC = tRFC MIN, distributed refresh
2320
2610
2720
3060
mA
1
IDD6
Self-Refresh Current: CKE <= 0.2V; external clock on; tCK = tCK MIN
40
45
80
90
mA
IDD7
Operating Current: four bank; four bank interleaving with BL=4;
Refer to the following page for detailed test conditions.
2800
3150
3200
3600
mA
4
1, 3
1. The module IDD values are calculated from the component IDD datasheet values as:
n * IDDx[component]
for single bank modules (n: number of components per module bank)
n * IDDx[component] + n * IDD3N[component]
for two bank modules (n: number of components per module bank)
2. The module IDD values are calculated from the component IDD datasheet values as:
n * IDDx[component]
for single bank modules (n: number of components per module bank)
2 * n * IDDx[component]
for two bank modules (n: number of components per module bank)
3. DQ I/O (IDDQ) currents are not included into calculations: module IDD values will be measured differently depending on load conditions
4. Test condition for maximum values: VDD = 2.7V ,Ta = 10°C
INFINEON Technologies
11
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Operating, Standby and Refresh Currents (PC2100 and PC2700)
512MB 512MB 1GB
x64
x64
x72
1bank 1bank 2bank
-6
-7
-7
1GB
1GB
1GB
x72
x64
x72
2bank 2bank 2bank
-6
-7
-7
Unit
Notes
Symbol
Parameter/Condition
MAX
MAX
MAX
MAX
MAX
MAX
IDD0
Operating Current: one bank; active / precharge; tRC = tRC MIN; tCK =
tCK MIN; DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles
1360
1530
2200
2475
1920
2160
mA
1
IDD1
Operating Current: one bank; active/read/precharge; Burst = 4;
Refer to the following page for detailed test conditions.
1440
1620
2320
2610
2000
2250
mA
1, 3
IDD2P
Precharge Power-Down Standby Current: all banks idle; power-down
mode; CKE <= VIL MAX; tCK = tCK MIN
112
126
288
324
224
252
mA
2
IDD2F
Precharge Floating Standby Current: /CS >= VIH MIN, all banks idle;
CKE >= VIH MIN; tCK = tCK MIN ,address and other control inputs
changing once per clock cycle, VIN = VREF for DQ, DQS and DM.
400
450
960
1080
800
900
mA
2
IDD2Q
Precharge Quiet Standby Current: /CS >= VIH MIN, all banks idle;
CKE >= VIH MIN; tCK = tCK MIN ,address and other control inputs
stable at >= VIH MIN or <= VIL MAX; VIN = VREF for DQ, DQS and DM.
224
252
640
720
448
504
mA
2
IDD3P
Active Power-Down Standby Current: one bank active; power-down
mode; CKE <= VIL MAX; tCK = tCK MIN;VIN = VREF for DQ, DQS and
DM.
144
162
368
414
288
324
mA
2
IDD3N
Active Standby Current: one bank active; active / precharge;CS >= VIH
MIN; CKE >= VIH MIN; tRC = tRAS MAX; tCK = tCK MIN; DQ, DM, and
DQS inputs changing twice per clock cycle; address and control inputs
changing once per clock cycle
560
630
1200
1350
1120
1260
mA
2
IDD4R
Operating Current: one bank active; Burst = 2; reads; continuous burst;
address and control inputs changing once per clock cycle; 50% of data
outputs changing on every clock edge; CL = 2 for DDR200, and
DDR266A, CL=3 for DDR333; tCK = tCK MIN; IOUT = 0mA
1600
1800
2560
2880
2160
2430
mA
1, 3
IDD4W
Operating Current: one bank active; Burst = 2; writes; continuous burst;
address and control inputs changing once per clock cycle; 50% of data
outputs changing on every clock edge; CL = 2 for DDR200, and
DDR266A, CL=3 for DDR333; tCK = tCK MIN
1560
1755
2480
2790
2120
2385
mA
1
IDD5
Auto-Refresh Current: tRC = tRFC MIN, distributed refresh
2480
2790
3280
3690
3040
3420
mA
1
IDD6
Self-Refresh Current: CKE <= 0.2V; external clock on; tCK = tCK MIN
40
45
80
90
80
90
mA
IDD7
Operating Current: four bank; four bank interleaving with BL=4;
Refer to the following page for detailed test conditions.
3040
3420
3840
4320
3600
4050
mA
4
1, 3
1. The module IDD values are calculated from the component IDD datasheet values as:
n * IDDx[component]
for single bank modules (n: number of components per module bank)
n * IDDx[component] + n * IDD3N[component]
for two bank modules (n: number of components per module bank)
2. The module IDD values are calculated from the component IDD datasheet values as:
n * IDDx[component]
for single bank modules (n: number of components per module bank)
2 * n * IDDx[component]
for two bank modules (n: number of components per module bank)
3. DQ I/O (IDDQ) currents are not included into calculations: module IDD values will be measured differently depending on load conditions
4. Test condition for maximum values: VDD = 2.7V ,Ta = 10°C
INFINEON Technologies
12
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Electrical Characteristics & AC Timing for DDR-I components
(for reference only)
(0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V)
Symbol
DDR333
-6
Parameter
DDR266A
-7
DDR200
-8
Unit
Notes
+ 0.8
ns
1-4
+ 0.8
ns
1-4
0.45
0.55
tCK
1-4
0.45
0.55
Min
Max
Min
Max
Min
Max
DQ output access time from CK/CK
− 0.7
+ 0.7
− 0.75
+ 0.75
− 0.8
DQS output access time from CK/CK
− 0.7
+ 0.7
− 0.75
+ 0.75
− 0.8
tCH
CK high-level width
0.45
0.55
0.45
0.55
tCL
CK low-level width
0.45
0.55
0.45
0.55
tHP
Clock Half Period
tAC
tDQSCK
tCK
tCK
1-4
min (tCL, tCH)
min (tCL, tCH)
min (t CL, tCH)
ns
1-4
CL = 2.5
6
12
7
12
8
12
ns
1-4
CL = 2.0
7.5
12
7.5
12
10
12
ns
1-4
Clock cycle time
tCK
tDH
DQ and DM input hold time
0.45
–
0.5
0.6
ns
1-4
tDS
DQ and DM input setup time
0.45
–
0.5
0.6
ns
1-4
tIPW
Control and Addr. input pulse width (each
input)
2.2
2.2
2.5
ns
1, 10
tDIPW
DQ and DM input pulse width (each input)
1.75
1.75
2
ns
1-4,
11
tHZ
Data-out high-impedence time from CK/CK
− 0.7
+ 0.7
− 0.75
+ 0.75
− 0.8
+ 0.8
ns
1-4, 5
tLZ
Data-out low-impedence time from CK/CK
− 0.7
+ 0.7
− 0.75
+ 0.75
− 0.8
+ 0.8
ns
1-4, 5
tDQSS
Write command to 1st DQS latching transition
0.75
1.25
0.75
1.25
0.75
1.25
tCK
1-4
tDQSQ
DQS-DQ skew
(for DQS & associated DQ signals)
tQHS
Data hold skew factor
+ 0.55
tQH
Data Output hold time from DQS
+ 0.4
–
+ 0.5
+ 0.6
ns
1-4
+ 0.75
+ 1.0
ns
1-4
tHP-t QHS
tHP-tQHS
tHP-tQHS
ns
1-4
DQS input low (high) pulse width (write cycle)
0.35
0.35
0.35
tCK
1-4
tDSS
DQS falling edge to CK setup time (write
cycle)
0.2
0.2
0.2
tCK
1-4
tDSH
DQS falling edge hold time from CK (write
cycle)
0.2
0.2
0.2
tCK
1-4
tMRD
tDQSL,H
Mode register set command cycle time
12
14
16
ns
1-4
tWPRES
Write preamble setup time
0
0
0
ns
1-4, 7
tWPST
Write postamble
0.40
tCK
1-4, 6
tWPRE
Write preamble
0.25
0.25
0.25
tCK
1-4
0.75
0.9
1.1
ns
1.0
1.1
ns
0.75
0.9
1.1
ns
tIS
Address and control
input setup time
tIH
Address and control
input hold time
fast slew rate
slow slew rate
fast slew rate
slow slew rate
0.60
0.40
0.60
1.0
0.40
0.60
1.1
2-4,
10,11
ns
tRPRE
Read preamble
0.9
0.9
1.1
0.9
1.1
tCK
1-4
tRPST
Read postamble
0.40
0.40
0.60
0.40
0.60
tCK
1-4
tRAS
Active to Precharge command
42
45
120,000
50
120,000
ns
1-4
tRC
Active to Active/Auto-refresh command period
60
65
ns
1-4
INFINEON Technologies
13
70
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Electrical Characteristics & AC Timing for DDR-I components
(for reference only)
(0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V)
Symbol
Parameter
DDR333
-6
Min
Max
DDR266A
-7
Min
Max
DDR200
-8
Min
Unit
Notes
Max
tRFC
Auto-refresh to Active/Auto-refresh
command period
72
75
80
ns
1-4
tRCD
Active to Read or Write delay
18
20
20
ns
1-4
tRP
Precharge command period
18
20
20
ns
1-4
tRRD
Active bank A to Active bank B command
12
15
15
ns
1-4
tWR
Write recovery time
15
15
15
ns
1-4
tDAL
Auto precharge write recovery
+ precharge time
(twr/tck)
+ (trp/
tck)
(twr/tck)
+ (trp/
tck)
tCK
1-4,9
1-4
tWTR
Internal write to read command delay
1
1
1
tCK
tXSNR
Exit self-refresh to non-read command
75
75
80
ns
1-4
tXSRD
Exit self-refresh to read command
200
200
200
tCK
1-4
tREFI
Average Periodic
Refresh Interval
7.8
µs
1-4, 8
512 Mbit based
7.8
7.8
1. Input slew rate >=1V/ns for DDR266 and = 1V/ns for DDR200.
2. The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference
level for signals other than CK/CK, is VREF. CK/CK slew rate are >= 1.0 V/ns.
3. Inputs are not recognized as valid until VREF stabilizes.
4. The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (Note 3) is VTT.
5. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
6. The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but
system performance (bus turnaround) degrades accordingly.
7. The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge.
A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were
previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress,
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS.
8. A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.
9. For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock
cycle time.
10. These parameters guarantee device timing, but they are not necessarily tested on each device
11. Fast slew rate >= 1.0 V/ns , slow slew rate >= 0.5 V/ns and < 1V/ns for command/address and CK & CK slew rate >1.0 V/
ns, measured between VOH(ac) and VOL(ac)
INFINEON Technologies
14
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
SPD Codes for PC1600 Modules “-8”
Byte#
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
128
256
DDR-SDRAM
13
11
1 /2
x64 / x72
0
SSTL_2.5
8 ns
0.8 ns
non-ECC / ECC
Self-Refresh, 7.8 ms
x8
na / x8
512MB
x64
1bank
-8
HEX
80
08
07
0D
0B
01
40
00
04
80
80
00
82
08
00
512MB
x72
1bank
-8
HEX
80
08
07
0D
0B
01
48
00
04
80
80
02
82
08
08
1GB
x64
2bank
-8
HEX
80
08
07
0D
0B
02
40
00
04
80
80
00
82
08
00
1GB
x72
2bank
-8
HEX
80
08
07
0D
0B
02
48
00
04
80
80
02
82
08
08
Description
tccd = 1 CLK
01
01
01
01
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36-40
41
42
43
44
45
46-61
62
63
64
65-71
72
73-90
91-92
93-94
95-98
99-127
Number of SPD Bytes
Total Bytes in Serial PD
Memory Type
Number of Row Addresses
Number of Column Addresses
Number of DIMM Banks
Module Data Width
Module Data Width (cont’d)
Module Interface Levels
SDRAM Cycle Time at CL = 2.5
Access Time from Clock at CL = 2.5
DIMM Config
Refresh Rate/Type
SDRAM Width, Primary
Error Checking SDRAM Data Width
Minimum Clock Delay for Back-to-Back
Random Column Address
Burst Length Supported
Number of SDRAM Banks
Supported CAS Latencies
CS Latencies
WE Latencies
SDRAM DIMM Module Attributes
SDRAM Device Attributes: General
Min. Clock Cycle Time at CAS Latency = 2
Access Time from Clock for CL = 2
Minimum Clock Cycle Time at CL = 1.5
Access Time from Clock at CL = 1.5
Minimum Row Precharge Time
Minimum Row Act. to Row Act. Delay tRRD
Minimum RAS to CAS Delay tRCD
Minimum RAS Pulse Width tRAS
Module Bank Density (per bank)
Addr. and Command Setup Time
Addr. and Command Hold Time
Data Input Setup Time
Data Input Hold Time
Superset Information
Minimum Core Cycle Time tRC
Min. Auto Refresh Cmd Cycle Time tRFC
Maximum Clock Cycle Time tck
Max. DQS-DQ Skew tDQSQ
X-Factor tQHS
Superset Information
SPD Revision
Checksum for Bytes 0 - 62
Manufacturers JEDEC ID Code
Manufacturer
Module Assembly Location
Module Part Number
Module Revision Code
Module Manufacturing Date
Module Serial Number
–
2, 4 & 8
4
CAS latency = 2 & 2.5
CS latency = 0
Write latency = 1
unbuffered
–
10.0 ns
0.8 ns
not supported
not supported
20 ns
15 ns
20 ns
50 ns
512MByte
1.1 ns
1.1 ns
0.6 ns
0.6 ns
–
70 ns
80 ns
12 ns
0.6 ns
1.0 ns
Revision 0.0
–
–
–
–
–
–
–
–
–
0E
04
0C
01
02
20
C0
A0
80
00
00
50
3C
50
32
80
B0
B0
60
60
00
46
50
30
3C
A0
00
00
E8
C1
INFINEON
0E
04
0C
01
02
20
C0
A0
80
00
00
50
3C
50
32
80
B0
B0
60
60
00
46
50
30
3C
A0
00
00
FA
C1
INFINEON
0E
04
0C
01
02
20
C0
A0
80
00
00
50
3C
50
32
80
B0
B0
60
60
00
46
50
30
3C
A0
00
00
E9
C1
INFINEON
0E
04
0C
01
02
20
C0
A0
80
00
00
50
3C
50
32
80
B0
B0
60
60
00
46
50
30
3C
A0
00
00
FB
C1
INFINEON
128-255
open for Customer use
–
15
INFINEON Technologies
15
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
SPD Codes for PC2100 & PC2700 Modules “-7” & “-6”
Byte#
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36-40
41
42
43
44
45
46-61
62
63
64
Description
Number of SPD Bytes
Total Bytes in Serial PD
Memory Type
Number of Row Addresses
Number of Column Addresses
Number of DIMM Banks
Module Data Width
Module Data Width (cont’d)
Module Interface Levels
SDRAM Cycle Time at CL = 2.5
Access Time from Clock at CL = 2.5
DIMM Config
Refresh Rate/Type
SDRAM Width, Primary
Error Checking SDRAM Data Width
Minimum Clock Delay for Back-to-Back
Random Column Address
Burst Length Supported
Number of SDRAM Banks
Supported CAS Latencies
CS Latencies
WE Latencies
SDRAM DIMM Module Attributes
SDRAM Device Attributes: General
Min. Clock Cycle Time at CAS Latency = 2
Access Time from Clock for CL = 2
Minimum Clock Cycle Time at CL = 1.5
Access Time from Clock at CL = 1.5
Minimum Row Precharge Time
Minimum Row Act. to Row Act. Delay tRRD
Minimum RAS to CAS Delay tRCD
Minimum RAS Pulse Width tRAS
Module Bank Density (per bank)
Addr. and Command Setup Time
Addr. and Command Hold Time
Data Input Setup Time
Data Input Hold Time
Superset Information
Minimum Core Cycle Time tRC
Min. Auto Refresh Cmd Cycle Time tRFC
Maximum Clock Cycle Time tck
Max. DQS-DQ Skew tDQSQ
X-Factor tQHS
Superset Information
SPD Revision
Checksum for Bytes 0 - 62
Manufacturers JEDEC ID Code
128
256
DDR-SDRAM
13
11
1 /2
x64 / x72
0
SSTL_2.5
7 ns
0.75 ns
non-ECC / ECC
Self-Refresh, 7.8 ms
x8
na / x8
512MB
x72
1bank
-7
HEX
80
08
07
0D
0B
01
48
00
04
70
75
02
82
08
08
1GB
x64
2bank
-7
HEX
80
08
07
0D
0B
02
40
00
04
70
75
00
82
08
00
1GB
x72
2bank
-7
HEX
80
08
07
0D
0B
02
48
00
04
70
75
02
82
08
08
1GB
x64
2bank
-6
HEX
80
08
07
0D
0B
02
40
00
04
60
70
00
82
08
00
1GB
x72
2bank
-6
HEX
80
08
07
0D
0B
02
48
00
04
60
70
02
82
08
08
tccd = 1 CLK
01
01
01
01
01
01
2, 4 & 8
4
CAS latency = 2 & 2.5
CS latency = 0
Write latency = 1
unbuffered
–
7.5 ns
0.75 ns
not supported
not supported
20 ns
15 ns
20 ns
45 ns
512MByte
0.9 ns
0.9 ns
0.5 ns
0.5 ns
–
65 ns
75 ns
12 ns
0.5 ns
0.75 ns
–
Revision 0.0
–
–
0E
04
0C
01
02
20
C0
75
75
00
00
50
3C
50
2D
80
90
90
50
50
00
41
4B
30
32
75
00
00
F3
C1
INFINEON
0E
04
0C
01
02
20
C0
75
75
00
00
50
3C
50
2D
80
90
90
50
50
00
41
4B
30
32
75
00
00
05
C1
INFINEON
0E
04
0C
01
02
20
C0
75
75
00
00
50
3C
50
2D
80
90
90
50
50
00
41
4B
30
32
75
00
00
F4
C1
INFINEON
0E
04
0C
01
02
20
C0
75
75
00
00
50
3C
50
2D
80
90
90
50
50
00
41
4B
30
32
75
00
00
06
C1
INFINEON
0E
04
0C
01
02
20
C0
75
70
00
00
48
30
48
2A
80
75
75
45
45
00
3C
48
30
2D
55
00
00
42
C1
INFINEON
0E
04
0C
01
02
20
C0
75
70
00
00
48
30
48
2A
80
75
75
45
45
00
3C
48
30
2D
55
00
00
54
C1
INFINEON
65-71
Manufacturer
–
72
73-90
91-92
93-94
95-98
99-127
Module Assembly Location
Module Part Number
Module Revision Code
Module Manufacturing Date
Module Serial Number
–
–
–
–
–
–
–
128-255
open for Customer use
–
INFINEON Technologies
512MB
x64
1bank
-7
HEX
80
08
07
0D
0B
01
40
00
04
70
75
00
82
08
00
16
2002-09-10 (rev.0.81)
HYS64/72D64000/128020GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Package Outlines -Raw Card A1 (One Bank Modules)
DDR-SDRAM DIMM Module Package
133.35 -+ 0.15
4.0 max.
4.0
31.75
+
- 0.13
Front View
2.3 typ.
*)
52
pin 1
92
53
64.77
1.27 +- 0.1
49.53
2.3 typ.
6.62
Backside View
144
145
184
2.5D
10.0
17.80
pin 93
3
3
*) on ECC modules only
Detail of Contacts B
6.35
2.5 -+ 0.20
0.20 +- 0.15
Detail of Contacts A
3.8 typ.
0.9R
1+- 0.05
1.27
1.8
2.175
L-DIM-18429
INFINEON Technologies
17
2002-09-10 (rev.0.81)
HYS64/72D64000/128x20GU-7/8-A
Unbuffered DDR-I SDRAM-Modules
Package Outlines - Raw Card B1 (Two Bank Modules)
DDR-SDRAM DIMM Module Package
two bank modules
133.35 -+ 0.15
4.0 max.
4.0
31.75
-+ 0.13
Front View
2.3 typ.
*)
52
pin 1
92
53
64.77
1.27 -+ 0.1
49.53
2.3 typ.
6.62
Backside View
144
145
184
2.5D
10.0
17.80
pin 93
*)
3
3
*) on ECC modules only
Detail of Contacts B
6.35
2.5 +- 0.20
0.20 -+ 0.15
Detail of Contacts A
3.8 typ.
0.9R
1 +- 0.05
1.27
1.8
2.175
L-DIM-1849d
INFINEON Technologies
18
2002-09-10 (rev.0.81)