PD - 91372B IRF1010NS/L HEXFET® Power MOSFET l l l l l l Advanced Process Technology Surface Mount (IRF1010NS) Low-profile through-hole (IRF1010NL) 175°C Operating Temperature Fast Switching Fully Avalanche Rated D RDS(on) = 0.011W G ID = 84A Description S Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The D2Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible onresistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF1010NL) is available for lowprofile applications. D 2 Pak Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TA = 25°C PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG VDSS = 55V TO-262 Parameter Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds 84 60 290 3.8 170 1.1 ± 20 360 43 17 5.0 -55 to + 175 Units A W W W/°C V mJ A mJ V/ns 300 (1.6mm from case ) °C Thermal Resistance Parameter RqJC RqJA Junction-to-Case Junction-to-Ambient ( PCB Mounted,steady-state)** www.irf.com Typ. Max. Units 0.90 40 °C/W 1 5/13/99 Powered by ICminer.com Electronic-Library Service CopyRight 2003 IRF1010NS/L Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage DV(BR)DSS/DTJ Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 55 2.0 29 Typ. 0.06 11 66 40 46 LS Internal Source Inductance 7.5 Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance 2900 880 330 V(BR)DSS IDSS IGSS Drain-to-Source Leakage Current Max. Units Conditions V V GS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 1mA 0.011 W V GS = 10V, ID = 43A 4.0 V V DS = V GS, ID = 250µA S VDS = 25V, I D = 43A 25 V DS = 55V, V GS = 0V µA 250 V DS = 44V, VGS = 0V, TJ = 150°C 100 V GS = 20V nA -100 V GS = -20V 130 ID = 43A 23 nC V DS = 44V 53 VGS = 10V, See Fig. 6 and 13 VDD = 28V ID = 43A ns RG = 3.6W RD = 0.62W, See Fig. 10 Between lead, nH and center of die contact V GS = 0V pF VDS = 25V = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS I SM VSD t rr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol 84 showing the A G integral reverse 390 S p-n junction diode. 1.3 V TJ = 25°C, IS = 43A, VGS = 0V 81 120 ns TJ = 25°C, IF = 43A 240 370 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Pulse width £ 300µs; duty cycle £ 2%. VDD = 25V, starting TJ = 25°C, L = 390 µH Uses IRF1010N data and test conditions RG = 25W, IAS = 43A. (See Figure 12) ISD £ 43A, di/dt £ 260A/µs, VDD £ V(BR)DSS, TJ £ 175°C Caculated continuous current based on maximum allowable junction temperature; for recommended current-handling of the package refer to Design Tip # 93-4 ** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to application note #AN-994. 2 Powered by ICminer.com Electronic-Library Service CopyRight 2003 www.irf.com IRF1010NS/L 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 4.5V 10 0.1 20µs PULSE WIDTH TCJ == 25°C T 25°C 1 10 A 100 4.5V 100 R DS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 3.0 TJ = 25°C TJ = 175°C 10 V DS = 25V 20µs PULSE WIDTH 5 6 7 8 9 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 10 A 100 Fig 2. Typical Output Characteristics 1000 1 1 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 100 20µs PULSE WIDTH TCJ = T = 175°C 175°C 10 0.1 VDS , Drain-to-Source Voltage (V) 4 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP I , Drain-to-Source Current (A) D I , Drain-to-Source Current (A) D TOP 10 A I D = 72A 2.5 2.0 1.5 1.0 0.5 VGS = 10V 0.0 -60 -40 -20 0 20 40 60 A 80 100 120 140 160 180 TJ , Junction Temperature (°C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRF1010NS/L 4000 V GS = 0V, f = 1MHz C iss = Cgs + Cgd , Cds SHORTED C rss = C gd Ciss C oss = Cds + C gd 3000 Coss 20 V GS , Gate-to-Source Voltage (V) C, Capacitance (pF) 5000 I D = 43A V DS = 44V V DS = 28V 16 12 2000 Crss 1000 0 10 4 FOR TEST CIRCUIT SEE FIGURE 13 0 A 1 8 100 0 20 VDS , Drain-to-Source Voltage (V) 60 80 100 120 A 140 Q G , Total Gate Charge (nC) Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 1000 1000 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 ID , Drain Current (A) ISD , Reverse Drain Current (A) 40 TJ = 175°C TJ = 25°C 10µs 100 100µs 1ms 10 10ms VGS = 0V 10 0.4 0.8 1.2 1.6 2.0 2.4 VSD , Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 Powered by ICminer.com Electronic-Library Service CopyRight 2003 A 2.8 TC = 25°C TJ = 175°C Single Pulse 1 1 A 10 100 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF1010NS/L V DS V GS 100 LIMITED BY PACKAGE D.U.T. RG + V- DD I D , Drain Current (A) 80 10V Pulse Width £ 1 µs Duty Factor £ 0.1 % 60 Fig 10a. Switching Time Test Circuit 40 VDS 90% 20 0 25 50 75 100 125 150 175 TC , Case Temperature ( °C) 10% VGS td(on) Fig 9. Maximum Drain Current Vs. Case Temperature tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.1 0.10 0.05 0.02 0.01 0.01 0.00001 PDM t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 5 15V DRIVER L VDS D.U.T RG + - VDD IAS 20V 0.01Ω tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp A EAS , Single Pulse Avalanche Energy (mJ) IRF1010NS/L 1000 TOP BOTTOM 800 ID 18A 31A 43A 600 400 200 0 VDD = 25V 25 50 A 75 100 125 150 175 Starting TJ , Junction Temperature (°C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ 12V .2µF QG .3µF 10 V QGS D.U.T. QGD + V - DS VGS VG 3mA IG Charge Fig 13a. Basic Gate Charge Waveform 6 Powered by ICminer.com Electronic-Library Service CopyRight 2003 ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRF1010NS/L Peak Diode Recovery dv/dt Test Circuit Circuit Layout Considerations · Low Stray Inductance · Ground Plane · Low Leakage Inductance Current Transformer + D.U.T + - - + RG · · · · dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. D= Period + - V DD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * VGS www.irf.com ISD = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS Powered by ICminer.com Electronic-Library Service CopyRight 2003 7 IRF1010NS/L D2Pak Package Outline 10.54 (.415) 10.29 (.405) 1.40 (.055) MAX. -A- 1.32 (.052) 1.22 (.048) 2 1.78 (.070) 1.27 (.050) 1 10.16 (.400) REF. -B- 4.69 (.185) 4.20 (.165) 6.47 (.255) 6.18 (.243) 3 15.49 (.610) 14.73 (.580) 2.79 (.110) 2.29 (.090) 2.61 (.103) 2.32 (.091) 5.28 (.208) 4.78 (.188) 3X 1.40 (.055) 1.14 (.045) 5.08 (.200) 0.55 (.022) 0.46 (.018) 0.93 (.037) 3X 0.69 (.027) 0.25 (.010) M 8.89 (.350) REF. 1.39 (.055) 1.14 (.045) B A M MINIMUM RECOMMENDED FOOTPRINT 11.43 (.450) NOTES: 1 2 3 4 DIMENSIONS AFTER SOLDER DIP. DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. CONTROLLING DIMENSION : INCH. HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS. LEAD ASSIGNMENTS 1 - GATE 2 - DRAIN 3 - SOURCE 8.89 (.350) 17.78 (.700) 3.81 (.150) 2.08 (.082) 2X 2.54 (.100) 2X Part Marking Information D2Pak INTERNATIONAL RECTIFIER LOGO ASSEMBLY LOT CODE 8 Powered by ICminer.com Electronic-Library Service CopyRight 2003 A PART NUMBER F530S 9246 9B 1M DATE CODE (YYWW) YY = YEAR WW = WEEK www.irf.com IRF1010NS/L Package Outline TO-262 Outline Part Marking Information TO-262 www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 9 IRF1010NS/L Tape & Reel Information D2Pak TRR 1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153) FEED DIRECTION 1.85 (.073) 1.65 (.065) 1.60 (.063) 1.50 (.059) 11.60 (.457) 11.40 (.449) 0.368 (.0145) 0.342 (.0135) 15.42 (.609) 15.22 (.601) 24.30 (.957) 23.90 (.941) TRL 10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 4.72 (.136) 4.52 (.178) 16.10 (.634) 15.90 (.626) FEED DIRECTION 13.50 (.532) 12.80 (.504) 27.40 (1.079) 23.90 (.941) 4 330.00 (14.173) MAX. NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 60.00 (2.362) MIN. 26.40 (1.039) 24.40 (.961) 3 30.40 (1.197) MAX. 4 WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936 http://www.irf.com/ Data and specifications subject to change without notice. 5/99 10 Powered by ICminer.com Electronic-Library Service CopyRight 2003 www.irf.com