FAIRCHILD QED123UL

PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
PACKAGE DIMENSIONS
0.195 (4.95)
REFERENCE
SURFACE
0.305 (7.75)
0.040 (1.02)
NOM
0.800 (20.3)
MIN
0.050 (1.25)
CATHODE
0.100 (2.54)
NOM
SCHEMATIC
0.240 (6.10)
0.215 (5.45)
0.020 (0.51)
SQ. (2X)
ANODE
NOTES:
1. Dimensions for all drawings are in inches (mm).
2. Tolerance of ± .010 (.25) on all non-nominal dimensions
unless otherwise specified.
CATHODE
FEATURES
•
•
•
•
•
•
•
•
UL217 Approved
λ = 880 nm
Chip material = AlGaAs
Package type: T-1 3/4 (5mm lens diameter)
Matched Photosensor: QSB34
Narrow Emission Angle, 18°
High Output Power
Package material and color: Clear, peach
© 2004 Fairchild Semiconductor Corporation
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4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Unit
TOPR
-40 to + 100
°C
TSTG
-40 to + 100
°C
Operating Temperature
Storage Temperature
(Iron)(2,3,4)
TSOL-I
240 for 5 sec
°C
Soldering Temperature (Flow)(2,3)
TSOL-F
260 for 10 sec
°C
Continuous Forward Current
IF
100
mA
Reverse Voltage
VR
5
V
PD
200
mW
Soldering Temperature
Power
Dissipation(1)
NOTES:
1. Derate power dissipation linearly 2.67 mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
.4. Soldering iron 1/16" (1.6 mm) minimum from housing
ELECTRICAL / OPTICAL CHARACTERISTICS (TA =25°C)
Parameter
Test Conditions
Symbol
Min
Typ
Max
Units
IF = 20 mA
λPE
—
880
—
nm
Emission Angle
IF = 100 mA
2Θ1/2
—
18
—
Deg.
Forward Voltage
IF = 100 mA, tp = 20 ms
VF
—
—
1.7
V
VR = 5 V
IR
—
—
10
µA
IF = 100 mA, tp = 20 ms
IE
16
—
40
mW/sr
tr
—
800
—
ns
tf
—
800
—
ns
Peak Emission Wavelength
Reverse Current
Radiant Intensity QED121
Rise Time
Fall Time
© 2004 Fairchild Semiconductor Corporation
IF = 100 mA
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4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
Typical Performance Characteristics
NORMALIZED COLLECTOR CURRENT
NORMALIZED RADIANT INTENSITY
10
Normalized to:
IF= 100 mA, TA = 25˚C
Pulse Width = 100 µs
1
0.1
0.01
0.001
1
10
100
1
Normalized to:
Pulse Width = 100 µs
Duty Cycle = 0.1%
VCC = 5 V
RL = 100Ω
TA = 25˚C
IF = 100 mA
0.8
0.6
IF = 20 mA
0.4
0.2
0
1000
0
1
IF - INPUT CURRENT (mA)
2
3
4
5
6
LENS TIP SEPERATION (INCHES)
Fig. 1 Normalized Radiant Intensity vs. Input Current
Fig. 2 Coupling Characteristics of QED12X and QSD12X
NORMALIZED RADIANT INTENSITY
1.0
VF - FORWARD VOLTAGE (V)
2.5
IF = 100 mA
IF = 50 mA
2
1.5
1
IF = 10 mA
IF = 20 mA
Pulse Width = 100 µs
Duty Cycle = 0.1%
0.5
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-40
-30
-20
-10
0
10
20
30
40
50
60
70
80
775
90 100
800
825
850
875
900
925
950
λ (nm)
TA - TEMPERATURE (˚C)
Fig. 3 Forward Voltage vs. Temperature
Fig. 4 Normalized Radiant Intensity vs. Wavelength
Fig. 5 Radiation Pattern
20
10
0˚
-10
-20
30
-30
40
-40
50
-50
60
-60
70
-70
80
-80
90
-90
100
© 2004 Fairchild Semiconductor Corporation
80
60
40
20
0
Page 3 of 4
20
40
60
80
100
4/2/04
PLASTIC INFRARED
LIGHT EMITTING DIODE
QED123UL
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
© 2004 Fairchild Semiconductor Corporation
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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4/2/04