ETC QPE1113

PLASTIC INFRARED
LIGHT EMITTING DIODE
QEE113
PACKAGE DIMENSIONS
0.175 (4.44)
0.087 (2.22)
Ø0.065 (1.65)
0.050 (1.27)
0.200 (5.08)
Ø0.095 (2.41)
0.500 (12.70)
MIN
CATHODE
ANODE
0.020 (0.51) SQ.
(2X)
SCHEMATIC
0.030 (0.76)
0.100 (2.54)
ANODE
0.100 (2.54)
NOM
CATHODE
NOTES:
1. Dimensions for all drawings are in inches (mm).
2. Tolerance of ± .010 (.25) on all non-nominal dimensions
unless otherwise specified.
DESCRIPTION
The QEE113 is a 940 nm GaAs LED encapsulated in a medium wide angle, plastic sidelooker package.
FEATURES
• != 940 nm
• Package Type = Sidelooker
• Chip Material = GaAs
• Matched Photosensor: QSE113
• Medium Wide Emission Angle, 50°
• Package Material: Clear Epoxy
• High Output Power
• Gray stripe on the top side
 2001 Fairchild Semiconductor Corporation
DS300341
7/19/01
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www.fairchildsemi.com
PLASTIC INFRARED
LIGHT EMITTING DIODE
QEE113
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Unit
TOPR
-40 to +100
°C
Operating Temperature
Storage Temperature
TSTG
-40 to +100
°C
Soldering Temperature (Iron)(2,3,4)
TSOL-I
240 for 5 sec
°C
(Flow)(2,3)
Soldering Temperature
TSOL-F
260 for 10 sec
°C
Continuous Forward Current
IF
50
mA
Reverse Voltage
VR
5
V
Power Dissipation(1)
PD
100
mW
NOTE:
1. Derate power dissipation linearly 1.33 mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Soldering iron 1/16” (1.6mm) minimum from housing.
ELECTRICAL / OPTICAL CHARACTERISTICS
PARAMETER
(TA =25°C)
TEST CONDITIONS
SYMBOL
MIN
TYP
MAX
Peak Emission Wavelength
IF = 100 mA
!PE
—
940
—
nm
Emission Angle
IF = 100 mA
"
—
±25
—
Deg.
Forward Voltage
IF = 100 mA, tp = 20ms
VF
—
—
1.5
V
Reverse Current
VR = 5 V
IR
—
—
10
µA
Radiant Intensity
IF = 100 mA, tp = 20 ms
IE
3
—
12
mW/sr
tr
—
1000
—
ns
tf
—
1000
—
ns
Rise Time
Fall Time
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IF = 100 mA
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UNITS
DS300341
PLASTIC INFRARED
LIGHT EMITTING DIODE
QEE113
Fig.2 Coupling Characteristics of QEE113 And QSE113
IC (ON) - NORMALIZED COLLECTOR CURRENT (mA)
Ie - NORMALIZED RADIANT INTENSITY
Fig.1 Normalized Radiant Intensity vs. Forward Current
10
Normalized to:
IF = 100 mA Pulsed
tpw = 100 µs
Duty Cycle = 0.1 %
TA = 25˚C
1
0.1
0.01
0.001
1
10
100
1000
1.0
Normalized to:
d=0
IF Pulsed
tpw = 100 µs
Duty Cycle = 0.1 %
VCC = 5 V
RL = 100 Ω
TA = 25˚C
0.8
0.6
0.4
IF = 100 mA
0.2
0.0
IF = 20 mA
0
1
2
6
1.0
IF = 100 mA
0.9
IF = 50 mA
0.8
NORMALIZED INTENSITY
VF - FORWARD VOLTAGE (V)
5
Fig. 4 Normalized Intensity vs. Wavelength
Fig.3 Forward Voltage vs. Ambient Temperature
2.0
1.5
1.0
IF = 20 mA
IF = 10 mA
0.0
-40
4
LENS TIP SEPARATION (INCHES)
IF - FORWARD CURRENT (mA)
0.5
3
Normalized to:
IF Pulsed
tpw = 100 µs
Duty Cycle = 0.1 %
-20
0
0.7
0.6
0.5
0.4
0.3
0.2
0.1
20
40
60
80
0.0
875
100
900
925
950
975
1000
1025
λ (nm)
TA - AMBIENT TEMPERATURE (˚C)
Fig. 5 Radiation Diagram
110
100
90
80
70
120
60
130
50
140
40
150
30
160
20
170
180
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1.0
10
0.8
0.6
0.4
0.2
0.0
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0.2
0.4
0.6
0.8
1.0
0
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PLASTIC INFRARED
LIGHT EMITTING DIODE
QEE113
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED
HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF
OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical
implant into the body,or (b) support or sustain life,
and (c) whose failure to perform when properly
used in accordance with instructions for use provided
in labeling, can be reasonably expected to result in a
significant injury of the user.
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2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
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