TI SN65LVCP23PW

SN65LVCP23
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SLLS554E – NOVEMBER 2002 – REVISED MAY 2006
2x2 LVPECL CROSSPOINT SWITCH
FEATURES
•
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High Speed 2x2 LVPECL Crosspoint Switch
LVDS Crosspoint Switch Available in
SN65LVCP22
50 ps (Typ), of Peak-to-Peak Jitter With
PRBS = 223– 1 Pattern
Output (Channel-to-Channel) Skew Is 10 ps
(Typ), 50 ps (Max)
Configurable as 2:1 Mux, 1:2 Demux,
Repeater or 1:2 Signal Splitter
Inputs Accept LVDS, LVPECL, and CML
Signals
Fast Switch Time of 1.7 ns (Typ)
Fast Propagation Delay of 0.75 ns (Typ)
16 Lead SOIC and TSSOP Packages
Operating Temperature: –40°C to 85°C
APPLICATIONS
•
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Gigabit Ethernet Redundant Transmission
Paths
Gigabit Interface Converters (GBICs)
Fibre Channel Redundant Transmission
Paths
HDTV Video Routing
Base Stations
Protection Switching for Serial Backplanes
Network Switches/Routers
Optical Networking Line Cards/Switches
Clock Distribution
DESCRIPTION
The SN65LVCP23 is a 2x2 LVPECL crosspoint
switch. The dual channels incorporate wide
common-mode (0 V to 4 V) receivers, allowing for
the receipt of LVDS, LVPECL, and CML signals. The
dual outputs are LVPECL drivers to provide
high-speed operation. The SN65LVCP23 provides a
single device supporting 2:2 buffering (repeating),
1:2 splitting, 2:1 multiplexing, 2x2 switching, and
LVDS/CML to LVPECL level translation on each
channel. The flexible operation of the SN65LVCP23
provides a single device to support the redundant
serial bus transmission needs (working and
protection switching cards) of fault-tolerant switch
systems found in optical networking, wireless
infrastructure, and data communications systems. TI
offers an additional gigabit repeater/translator in the
SN65LVDS101.
The SN65LVCP23 uses a fully differential data path
to ensure low-noise generation, fast switching times,
low pulse width distortion, and low jitter. Output
channel-to-channel skew is less than 10 ps (typ) and
50 ps (max) to ensure accurate alignment of outputs
in all applications. Both SOIC and TSSOP package
options are available.
OUTPUTS OPERATING SIMULTANEOUSLY
1.3 Gbps
223 -1 PRBS
OUTPUT 1
VCC = 3.3 V
|VID| = 200 mV, VIC = 1.2 V
Vertical Scale = 400 mV/div
OUTPUT 2
650 MHz
Horizontal Scale = 200 ps
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2006, Texas Instruments Incorporated
SN65LVCP23
www.ti.com
SLLS554E – NOVEMBER 2002 – REVISED MAY 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
PART NUMBER (1)
SYMBOLIZATION
SOIC
SN65LVCP23D
LVCP23
TSSOP
SN65LVCP23PW
LVCP23
PACKAGE DESIGNATOR
(1)
Add the suffix R for taped and reeled carrier
PACKAGE DISSIPATION RATINGS
(1)
(2)
PACKAGE
CIRCUIT
BOARD MODEL
TA ≤ 25°C
POWER RATING
DERATING FACTOR (1)
ABOVE TA = 25°C
TA = 85°C
POWER RATING
SOIC (D)
High-K (2)
1361 mW
13.9 mW/°C
544 mW
TSSOP (PW)
High-K (2)
1074 mW
10.7 mW/°C
430 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
In accordance with the High-K thermal metric definitions of EIA/JESD51-7.
THERMAL CHARACTERISTICS
PARAMETER
θJB
TEST CONDITIONS
Junction-to-board thermal resistance
θJC
Junction-to-case thermal resistance
PD
Device power dissipation
VALUE
UNITS
D
15.7
°C/W
PW
22.1
°C/W
D
26.1
°C/W
PW
17.3
°C/W
Typical
VCC = 3.3 V, TA = 25°C, 2 Gbps
165
mW
Maximum
VCC = 3.6 V, TA = 85°C, 2 Gbps
234
mW
FUNCTIONAL BLOCK DIAGRAM
OUT 0
OUT 1
EN 0
EN 1
SEL 1
SEL 0
0
1
0
IN 0
IN 1
2
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CIRCUIT FUNCTION TABLE
INPUTS (1)
OUTPUTS (1)
IN 0
IN 1
SEL 0
SEL1
EN 0
EN 1
OUT 0
OUT 1
X
X
X
X
L
L
L
L
>100 mV
X
L
L
H
L
H
L
<-100 mV
X
L
L
H
L
L
L
<-100 mV
X
L
L
H
H
L
L
>100 mV
X
L
L
H
H
H
H
>100 mV
X
L
L
L
H
L
H
<-100 mV
X
L
L
L
H
L
L
>100 mV
X
L
H
H
L
H
L
<-100 mV
X
L
H
H
L
L
L
<-100 mV
<-100 mV
L
H
H
H
L
L
<-100 mV
>100 mV
L
H
H
H
L
H
>100 mV
<-100 mV
L
H
H
H
H
L
>100 mV
>100 mV
L
H
H
H
H
H
X
>100 mV
L
H
L
H
L
H
X
<-100 mV
L
H
L
H
L
L
X
>100 mV
H
H
H
L
H
L
X
<-100 mV
H
H
H
L
L
L
X
<-100 mV
H
H
H
H
L
L
X
>100 mV
H
H
H
H
H
H
X
>100 mV
H
H
L
H
L
H
X
<-100 mV
H
H
L
H
L
L
X
>100 mV
H
L
H
L
H
L
X
<-100 mV
H
L
H
L
L
L
<-100 mV
<-100 mV
H
L
H
H
L
L
<-100 mV
>100 mV
H
L
H
H
H
L
>100 mV
<-100 mV
H
L
H
H
L
H
>100 mV
>100 mV
H
L
H
H
H
H
>100 mV
X
H
L
L
H
L
H
<-100 mV
X
H
L
L
H
L
L
(1)
LOGIC DIAGRAM
EN 0
IN 0
OUT 0
IN 1
OUT 1
EN 1
EN 0
IN 0
OUT 0
IN 1
OUT 1
EN 1
EN 0
IN 0
OUT 0
IN 1
OUT 1
EN 1
EN 0
IN 0
OUT 0
IN 1
OUT 1
EN 1
H = High level, L = Low level, Z = High impedance, X = Don't care
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EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
INPUTS
IN +
VCC
IN -
400 Ω
SEL, EN
7V
7V
7V
OUTPUTS
VCC
VCC
R
R
VCC
R
OUT +
VCC
7V
OUT -
7V
4
300 kΩ
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ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted (1)
UNITS
Supply voltage range, (2) VCC
–0.5 V to 4 V
CMOS/TTL input voltage (ENO, EN1, SEL0, SEL1)
–0.5 V to 4 V
Receiver input voltage (IN+, IN–)
–0.7 V to 4.3 V
LVPECL driver output voltage (OUT+, OUT–)
Output current
–0.5 V to 4 V
Continuous
50 mA
Surge
100 mA
Storage temperature range
–65°C to 125°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
Continuous power dissipation
Electrostatic discharge
(1)
(2)
(3)
(4)
235°C
See Dissipation Rating Table
Human body model (3)
All pins
±5 kV
Charged-device mode (4)
All pins
±500 V
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminals.
Tested in accordance with JEDEC Standard 22, Test Method A114-A.
Tested in accordance with JEDEC Standard 22, Test Method C101.
RECOMMENDED OPERATING CONDITIONS
MIN
VCC
Supply voltage
3
Receiver input voltage
0
Junction temperature
NOM MAX
3.3
3.6
UNIT
V
4
V
125
°C
TA
Operating free-air temperature (1)
–40
85
°C
|VID|
Magnitude of differential input voltage
0.1
3
V
(1)
Maximum free-air temperature operation is allowed as long as the device maximum junction temperature is not exceeded.
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INPUT ELECTRICAL CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
TYP (1)
MIN
MAX
UNIT
CMOS/TTL DC SPECIFICATIONS (EN0, EN1, SEL0, SEL1)
VIH
High-level input voltage
2
VCC
VIL
Low-level input voltage
0.8
V
IIH
High-level input current
VIN = 3.6 V or 2.0 V, VCC = 3.6 V
±3
±20
µA
IIL
Low-level input current
VIN = 0.0 V or 0.8 V, VCC = 3.6 V
±1
±10
µA
VCL
Input clamp voltage
ICL = –18 mA
–0.8
–1.5
V
GND
V
LVPECL OUTPUT SPECIFICATIONS (OUT0, OUT1)
VOH
Output high voltage
VOL
Output low voltage
|VOD|
Differential output voltage
CO
Differential output capacitance
RL = 50 Ω to VTT ,
VTT = VCC – 2.0 V, See Figure 2
VCC – 1.3
VCC – 0.85
VCC – 2.2
VCC – 1.65
600
VI = 0.4 sin(4E6πt) + 0.5 V
800
1000
3
V
mV
pF
RECEIVER DC SPECIFICATIONS (IN0, IN1)
VTH
Positive-going differential input voltage threshold See Figure 1 and Table 1
VTL
Negative-going differential input voltage
threshold
See Figure 1 and Table 1
100
–100
VID(HYS) Differential input voltage hysteresis
VCMR
Common-mode voltage range
IIN
Input current
CIN
Differential input capacitance
mV
25
VID = 100 mV,
VCC = 3.0 V to 3.6 V
0.05
mV
3.95
VIN = 4 V, VCC = 3.6 V or 0.0 V
±1
±10
VIN = 0 V, VCC = 3.6 V or 0.0 V
±1
±10
VI = 0.4 sin (4E6πt) + 0.5 V
mV
1
V
µA
pF
SUPPLY CURRENT
ICCD
(1)
6
DC supply current
No load
All typical values are at 25°C and with a 3.3-V supply.
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65
mA
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SWITCHING CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
tSET
Input to SEL setup time
Figure 5
1
0.5
ns
tHOLD
Input to SEL hold time
Figure 5
1.1
0.5
ns
tSWITCH
SEL to switched output
Figure 5
1.7
2.5
ns
tPHKL
Disable time, high-level-to-known LOW
Figure 4
2
2.5
ns
tPKLH
Enable time, known LOW-to-high-level output
Figure 4
2
2.5
ns
80%) (1)
tLHT
Differential output signal rise time (20% –
tHLT
Differential output signal fall time (20% – 80%) (1)
tJIT
Added peak-to-peak jitter
tJrms
Added random jitter (rms)
output (1)
Figure 3
80
110
220
ps
Figure 3
80
110
220
ps
VID = 200 mV, 50% duty cycle, VCM = 1.2 V,
650 MHz
15
30
ps
VID = 200 mV, PRBS = 223–1 data pattern
and K28.5 (0011111010),
VCM = 1.2 V at 1.3 Gbps
50
100
ps
VID = 200 mV, 50% duty cycle,
VCM = 1.2 V, 650 MHz
0.3
0.5
psRMS
tPLHD
Propagation delay time, low-to-high-level
VCC = 3.3 V, TA = 25°C, See Figure 3
400
750 1100
ps
tPHLD
Propagation delay time, high-to-low-level output (1) VCC = 3.3 V, TA = 25°C, See Figure 3
400
750 1100
ps
|) (2)
tskew
Pulse skew (|tPLHD– tPHLD
Figure 3
20
100
tCCS
Output channel-to-channel skew, splitter mode
Figure 3
10
50
fMAX
Maximum operating frequency (3)
(1)
(2)
(3)
1
ps
ps
GHz
Input: VIC = 1.2 V, VID = 200 mV, 50% duty cycle, 1 MHz, tr/tf = 500 ps
tskew is the magnitude of the time difference between the tPLHD and tPHLD of any output of a single device.
Signal generator conditions: 50% duty cycle, tr or tf ≤ 100 ps (10% to 90%), transmitter output criteria: duty cycle = 45% to 55% VOD ≥
300 mV.
PIN ASSIGNMENTS
D or PW PACKAGE
(TOP VIEW)
SEL1
SEL0
IN0+
IN0VCC
IN1+
IN1VCC
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
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EN0
EN1
OUT0+
OUT0GND
OUT1+
OUT1GND
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PARAMETER MEASUREMENT INFORMATION
IIN+
OUT +
IN+
VID
IN+ +IN-
VOD
VIN+
VIC
VIN-
2
VOY
IN-
OUT -
VOUT++VOUT-
VOZ
IIN-
2
Figure 1. Voltage and Current Definitions
Y
Driver
Device
Receiver
Device
VOD
Z
50 Ω
50 Ω
VTT = VCC -2 V
Figure 2. Typical Termination for LVPECL Output Driver
OUT+
IN+
1 pF
VID
VIN+
IN-
VOD
VOUT+
VTT
50 Ω
OUT-
VIN-
50 Ω
VOUT-
VTT
VIN+
1.4 V
VIN-
1V
0.4 V
0V
-0.4 V
VID
tPHLD
+VOD
tPLHD
80%
0V
Vdiff = (OUT+) - (OUT-)
20%
-VOD
tHLT
tLHT
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 0.25 ns, pulse-repetition rate
(PRR) = 0.5 Mpps, pulse width = 500 ±10 ns; CL includes instrumentation and fixture capacitance within 0,06 mm of
the D.U.T.
Figure 3. Timing Test Circuit and Waveforms
8
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PARAMETER MEASUREMENT INFORMATION (continued)
OUT+
1 V or 1.4 V
1 pF
1.2 V
50 Ω
VOUT+
OUT-
EN
50 Ω
VOUT-
VTT
VTT
3V
1.5 V
0V
EN
+VOD
0V
-VOD
Vdiff = (OUT+) - (OUT-)
tPHKL
tPKLH
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, pulse-repetition rate
(PRR) = 0.5 Mpps, pulse width = 500 ± 10 ns, CL includes instrumentation and fixture capacitance within 0,06 mm of
the D.U.T.
Figure 4. Enable and Disable Time Circuit and Definitions
Table 1. Receiver Input Voltage Threshold Test
APPLIED VOLTAGES
(1)
RESULTING DIFFERENTIAL
INPUT VOLTAGE
RESULTING COMMONMODE INPUT VOLTAGE
OUTPUT (1)
VIA
VIB
VID
VIC
1.25 V
1.15 V
100 mV
1.2 V
1.15 V
1.25 V
–100 mV
1.2 V
L
4.0 V
3.9 V
100 mV
3.95 V
H
3.9 V
4. 0 V
–100 mV
3.95 V
L
0.1 V
0.0 V
100 mV
0.05 V
H
0.0 V
0.1 V
–100 mV
0.05 V
L
1.7 V
0.7 V
1000 mV
1.2 V
H
0.7 V
1.7 V
–1000 mV
1.2 V
L
4.0 V
3.0 V
1000 mV
3.5 V
H
3.0 V
4.0 V
–1000 mV
3.5 V
L
1.0 V
0.0 V
1000 mV
0.5 V
H
0.0 V
1.0 V
–1000 mV
0.5 V
L
H
H = high level, L = low level
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IN0
IN1
SEL
tSET
tHOLD
OUT
IN0
IN1
tSWITCH
EN
IN0
IN1
SEL
tSET
OUT
tHOLD
IN1
IN0
tSWITCH
EN
NOTE: tSET and tHOLD times specify that data must be in a stable state before and after mux control switches.
Figure 5. Input to Select for Both Rising and Falling Edge Setup and Hold Times
10
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TYPICAL CHARACTERISTICS
SUPPLY CURRENT
vs
FREQUENCY
PROPAGATION DELAY TIME
vs
FREE-AIR TEMPERATURE
900
80
60
40
VCC = 3.3 V,
TA = 25°C,
VIC = 1.2 V,
|V ID| = 200 mV
Output = Loaded
20
0
500
1000
1500
2000
30
VCC = 3 − 3.6 V,
VIC = 1.2 V,
|V ID| = 300 mV
Input = 1 MHz
825
750
tPLH
tPHL
675
15
800 mV
500 mV
10
300 mV
600
−60 −40 −20
2500
0
0
20
40
60
80
0
100
100
200
300
400
500
600
TA − Free-Air Temperature − °C
f − Frequency − MHz
Figure 6.
Figure 7.
Figure 8.
PEAK-TO-PEAK JITTER
vs
DATA RATE
PEAK-TO-PEAK JITTER
vs
FREQUENCY
PEAK-TO-PEAK JITTER
vs
DATA RATE
30
VCC = 3.3 V,
TA = 25°C,
VIC = 400 mV,
Input = PRBS 223−1
60
VCC = 3.3 V,
TA = 25°C,
VIC = 1.2 V,
Input = Clock
Peak-to-Peak Jitter − ps
25
800 mV
40
300 mV
30
20
500 mV
20
15
500 mV
10
800 mV
700
800 mV
40
500 mV
30
20
300 mV
10
5
10
VCC = 3.3 V,
TA = 25°C,
VIC = 1.2 V
Input = PRBS 223-1
50
Peak-to-Peak Jitter − ps
60
300 mV
0
0
200
400
600
800
1000 1200 1400
0
Data Rate − Mbps
Figure 9.
100 200 300 400 500
f − Frequency − MHz
600
0
700
0
200
400
600
800
1000 1200 1400
Data Rate − Mbps
Figure 10.
Figure 11.
PEAK-TO-PEAK JITTER
vs
FREQUENCY
PEAK-TO-PEAK JITTER
vs
DATA RATE
70
30
VCC = 3.3 V,
TA = 25°C,
VIC = 3.3 V,
Input = Clock
25
60
Peak-to-Peak Jitter − ps
0
Peak-to-Peak Jitter − ps
Peak-to-Peak Jitter − ps
20
5
f − Frequency − MHz
50
VCC = 3.3 V,
TA = 25°C,
VIC = 400 mV,
Input = Clock
25
Peak-to-Peak Jitter − ps
t pd − Propagation Delay Time − ps
I CC − Supply Current − mA
100
0
PEAK-TO-PEAK JITTER
vs
FREQUENCY
20
15
500 mV
10
5
300 mV
50
500 mV
40
30
800 mV
20
VCC = 3.3 V,
TA = 25°C,
VIC = 3.3 V,
Input = PRBS 223−1
10
800 mV
500 mV
0
0
0
100
200
300
400
500
600
700
0
200
400
600
800
1000 1200 1400
Data Rate − Mbps
f − Frequency − MHz
Figure 12.
Figure 13.
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TYPICAL CHARACTERISTICS (continued)
DIFFERENTIAL OUTPUT VOLTAGE
vs
FREQUENCY
50
820
40
30
660
20
Added Random Jitter
10
170
140
110
80
50
500
0
0
250 500 750 1000 1250 1500 1750 2000
f − Frequency − MHz
20
0
500
1000 1500 2000 2500 3000 3500
Data Rate − Mbps
Figure 14.
12
VCC = 3.3 V,
TA = 25°C,
VIC = 1.2 V,
|V ID| = 200 mV
Input = PRBS 223−1
200
740
580
230
Peak-to-Peak Jitter − ps
VCC = 3.3 V,
TA = 25°C,
VIC = 1.2 V,
|V ID| = 200 mV
Period Jitter − ps
V OD − Differential Output Voltage − mV
900
PEAK-TO-PEAK JITTER
vs
DATA RATE
Figure 15.
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APPLICATION INFORMATION
TYPICAL APPLICATION CIRCUITS (ECL, PECL, LVDS, etc.)
50 Ω
3.3 V or 5 V
3.3 V
SN65LVCP23
A
ECL
B
50 Ω
50 Ω
50 Ω
VTT = VCC -2 V
VTT
Figure 16. Low-Voltage Positive Emitter-Coupled Logic (LVPECL)
3.3 V
50 Ω
3.3 V
50 Ω
SN65LVCP23
3.3 V
A
CML
B
50 Ω
50 Ω
3.3 V
Figure 17. Current-Mode Logic (CML)
3.3 V
3.3 V
50 Ω
SN65LVCP23
A
ECL
B
50 Ω
1.1 kΩ
VTT
1.5 kΩ
VTT = VCC -2 V
3.3 V
Figure 18. Single-Ended (LVPECL)
3.3 V or 5 V
50 Ω
3.3 V
SN65LVCP23
A
100 Ω
LVDS
B
50 Ω
Figure 19. Low-Voltage Differential Signaling (LVDS)
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PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN65LVCP23D
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23DG4
ACTIVE
SOIC
D
16
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23DR
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23DRG4
ACTIVE
SOIC
D
16
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23PW
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23PWG4
ACTIVE
TSSOP
PW
16
90
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23PWR
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65LVCP23PWRG4
ACTIVE
TSSOP
PW
16
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
12-Feb-2008
TAPE AND REEL BOX INFORMATION
Device
Package Pins
Site
Reel
Diameter
(mm)
Reel
Width
(mm)
A0 (mm)
B0 (mm)
K0 (mm)
P1
(mm)
W
Pin1
(mm) Quadrant
SN65LVCP23DR
D
16
SITE 60
330
16
6.5
10.3
2.1
8
16
Q1
SN65LVCP23PWR
PW
16
SITE 60
330
12
6.67
5.4
1.6
8
12
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
Device
12-Feb-2008
Package
Pins
Site
Length (mm)
Width (mm)
Height (mm)
SN65LVCP23DR
D
16
SITE 60
346.0
346.0
33.0
SN65LVCP23PWR
PW
16
SITE 60
346.0
346.0
29.0
Pack Materials-Page 2
MECHANICAL DATA
MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999
PW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0,30
0,19
0,65
14
0,10 M
8
0,15 NOM
4,50
4,30
6,60
6,20
Gage Plane
0,25
1
7
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
8
14
16
20
24
28
A MAX
3,10
5,10
5,10
6,60
7,90
9,80
A MIN
2,90
4,90
4,90
6,40
7,70
9,60
DIM
4040064/F 01/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
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