ROHM TCFGD1D686MCR

TCFG series D Case
Tantalum capacitors
Chip tantalum capacitors with
(Fail-safe open structure type)
TCFG series D Case
zFeatures
1) Safety design by open function built - in.
2) Wide capacitance range
3) Screening by thermal shock.
zDimensions (Unit : mm)
Anode mark
L
W1
H
W2
S
+
S
−
Case code
L
W1
W2
H
S
D 7343-30(2917)
7.3+
−0.2
4.3 +
−0.2
2.4+
−0.1
2.8+
−0.2
1.3+
−0.2
zPart No. Explanation
T C F G D 0 J 2 2 7 M C R
2
1
1 Series name
4
3
5
6
4 Capacitance
TCFG
Nominal capacitance in pF 3 digits : 2 significant figure
representing the number of 0's.
2 Case code
TCFG ······ D
5 Capacitance tolerance
3 Rated Voltage
Rated voltage (V)
CODE
4 6.3 10 16 20 25
0G 0J 1A 1C 1D 1E
M: +
− 20%
6 Taping
C : Tape width (12mm)
R : Positive electrode on the side opposite to sprocket hole
Rev.D
1/12
TCFG series D Case
Tantalum capacitors
zCapacitance range
TCFG series D Case
Rated voltage (V)
(μF)
4
0G
6.3
0J
10
1A
16
1C
20
1D
47 (476)
25
1E
D
68 (686)
100 (107)
D
150 (157)
D
220 (127)
330 (337)
D
D∗
Remark) Case size codes (D) in the above shown each size products line-up.
∗ : Under development
zMarking
The indication listed below should be given on the surface of a capacitor.
Polarity
Rated DC voltage
Nominal capacitance
[D Case]
: The polarity should be shown by
bar. (on the anode side)
note 1) Visual typical example (1) capacitance code (2) voltage code
(1) 220μF
(2) 6.3V
220
6.3V
note 2) voltage code and capacitance code are variable with parts number
Rev.D
2/12
TCFG series D Case
Tantalum capacitors
zCharacteristics
Item
Performance
Operating Temperature
−55 °C to +125 °C
Test conditions
(based on JIS C5101-1 and JIS C5101-3)
Voltage reduction when temperature exceeds +85°C
Maximum operating temperature +85 °C
with no voltage derating
4 6.3 10 16 20 25
at 85°C
Category Voltage (V.DC)
2.5 4 6.3 10 13 16
at 125°C
Surge Voltage
5.0 8
Rated Voltage (V.DC)
13 20 26 32
at 85°C
DC leakage current
0.5μA or 0.01CV whichever is greater
(Shown in "Standard list")
As per 4.9 JIS C 5101-1
As per 4.5.1 JIS C 5101-3
Voltage : Rated voltage for 1 min
Capacitance tolerance
Shall be satisfied allowance range.
±20%
As per 4.7 JIS C 5101-1
As per 4.5.2 JIS C 5101-3
Measuring frequency : 120±12Hz
Measuring voltage
: 0.5Vrms, +1.5 to 2V.DC
Measuring circuit
: DC Equivalent series circuit
Tangent of loss angle
(Df, tanδ)
Shall be satisfied the voltage on "Standard list"
As per 4.8 JIS C 5101-1
As per 4.5.3 JIS C 5101-3
Measuring frequency : 120±12Hz
Measuring voltage
: 0.5Vrms, +1.5 to 2V.DC
Measuring circuit
: DC Equivalent series circuit
Impedance
Shall be satisfied the voltage on "Standard list"
As per 4.10 JIS C 5101-1
As per 4.5.4 JIS C 5101-3
Measuring frequency : 100±10kHz
Measuring voltage : 0.5Vrms or less
Measuring circuit
: DC Equivalent series circuit
Resistance to Appearance There should be no significant abnormality.
The indications should be clear.
soldering heat
L.C
ΔC / C
tanδ
As per 4.14 JIS C 5101-1
As per 4.6 JIS C 5101-3
TCFGD1E476 : Less than 150% of initial limit Dip in the solder bath
Solder temp : 260±5°C
: Less than initial limit
Others
Duration
: 5±0.5s
Within ±10% of initial value
Repetition
:1
After the specimens, leave it at room temperature for
Less than 150% of initial limit
over 24h and then measure the sample.
Fail-Safe open unit actuation Within 330°C − 20s
Temperature
cycle
Dip in the solder bath
Solder temp : 330±5°C
As per 4.16 JIS C 5101-1
As per 4.10 JIS C 5101-3
Repetition : 5 cycles (1 cycle : steps 1 to 4)
TCFGD1E476 : Less than 150% of initial limit without discontinuation.
: Less than initial limit
Others
Step
Temp.
Time
Within ±20% of initial value
−55 +
30 +
1
− 3°C
−3min
Less than 150% of initial limit
2
Room temp. 3min. or less
+ 2°C
3
125 −
30 +
−3min
Appearance There should be no significant abnormality.
L.C
ΔC / C
tanδ
4
Room temp. 3min. or less
After the specimens, leave it at room temperature for
over 24h and then measure the sample.
Moisture
resistance
Appearance There should be no significant abnormality.
The indications should be clear.
L.C
ΔC / C
tanδ
As per 4.22 JIS C 5101-1
As per 4.12 JIS C 5101-3
TCFGD1E476 : Less than 150% of initial limit After leaving the sample under such atmospheric
condition that the temperature and humidity are
: Less than initial limit
Others
60±2°C and 90 to 95%RH, respectively, for
Within ±20% of initial value
500±12h level it at room temperature for over 24h
and then measure the sample.
Less than 150% of initial limit
Rev.D
3/12
TCFG series D Case
Tantalum capacitors
Item
Temperature Temp.
Stability
ΔC / C
tanδ
Performance
−55°C
As per 4.29 JIS C 5101-1
As per 4.13 JIS C 5101-3
Within 0/−20%of initial value
Shall be satisfied the voltage on "Standard list"
−
L.C
Surge
Voltage
Temp.
+85°C
ΔC / C
Within +12/0%of initial value
tanδ
Shall be satisfied the voltage on "Standard list"
L.C
5μA or 0.1CV whichever is greater
Temp.
+125°C
ΔC / C
Within +20/0%of initial value
tanδ
Shall be satisfied the voltage on "Standard list"
L.C
6.3μA or 0.125CV whichever is greater
Appearance There should be no significant abnormality.
: Less than 150% of initial limit
: Less than initial limit
L.C
TCFGD1E476
Others
ΔC / C
Within ±10%of initial value
tanδ
Less than 150% of initial limit
Loading at Appearance There should be no significant abnormality.
High
TCFGD1E476 : Less than 150% of initial limit
temperature L.C
: Less than 125% of initial limit
Others
Terminal
Strength
Test conditions
(based on JIS C5101-1 and JIS C5101-3)
ΔC / C
Within ±10%of initial value
tanδ
Less than 150% of initial limit
Capacitance The measured value should be stable.
Appearance There should be no significant abnormality.
As per 4.26 JIS C 5101-1
As per 4.14 JIS C 5101-3
Apply the specified surge voltage every 5±0.5min.
for 30±5 s. each time in the atmospheric condition
of 85±2°C.
Repeat this procedure 1,000 times.
After the specimens, leave it at room temperature for
over 24h and then measure the sample.
As per 4.23 JIS C 5101-1
As per 4.15 JIS C 5101-3
After applying the rated voltage for 2000+72/0h
without discontinuation via the serial resistance
of 3Ω or less at a temperature of 85±2°C, leave
the sample at room temperature/humidity for
over 24h and measure the value.
As per 4.35 JIS C 5101-1
As per 4.9 JIS C 5101-3
A force is applied to the terminal until it bends
to 1mm and by a prescribed tool maintain the
condition for 5s. (See the figure below.)
(Unit : mm)
20
50
F (Apply force)
R230
1
Thickness 1.6mm
45
Adhesiveness
The terminal should not come off.
45
As per 4.34 JIS C 5101-1
As per 4.8 JIS C 5101-3
Apply force of 5N in the two directions shown
in the figure below for 10±1s after mounting
the terminal on a circuit board.
product
YAA
C105
Apply force
a circuit board
Rev.D
4/12
TCFG series D Case
Tantalum capacitors
Item
Performance
Test conditions
(based on JIS C5101-1 and JIS C5101-3)
Dimensions
Be based on "External dimensions"
Measure using a caliper of JIS B 7505
Class 2 or higher grade.
Resistance to solvents
The indication should be clear.
As per 4.32 JIS C 5101-1
As per 4.18 JIS C 5101-3
Dip in the isopropyl alcohol for 30±5s,
at room temperature.
Solderability
3/4 or more surface area of the solder coated
terminal dipped in the soldering bath should be
covered with the new solder.
As per 4.15.2 JIS C 5101-1
As per 4.7 JIS C 5101-3
Dip speed = 25±2.5mm/s
Pre-treatment (accelerated aging) : Leave the
sample on the boiling distilled water for 1h.
Solder temp. : 245±5°C
Duration : 3±0.5s
Solder : M705
Flux : Rosin 25%, IPA 75%
Vibration Capacitance Measure value should not fluctuate during the
measurement.
Appearance
There should be no significant abnormality.
As per 4.17 JIS C 5101-1
Frequency : 10 to 55 to 10Hz/min.
Amplitude : 1.5mm
Time : 2h each in X and Y directions
Mounting : The terminal is soldered on a print
circuit board.
Rev.D
5/12
TCFG series D Case
Tantalum capacitors
zTable 1 standard list, TCFG series D Case
(D : 7343)
Leakage
Rated Derated Surge
Impedance
DF120Hz
Capacitance
(%)
100kHz Case
Tolerance current
Voltage Voltage Voltage
120Hz
25qC
@85°C @125°C @85°C
code
(%)
1WV.60s
(PF)
−55°C 25°C 125°C
(Ω)
(V)
(V)
(V)
(mA)
85˚C
Part No.
TCFG D 0J 227
6.3
4
8
220
±20
13.8
18
12
14
0.70
D
TCFG D 1A 157
10
6.3
13
150
±20
15.0
18
10
12
0.70
D
TCFG D 1C 107
16
10
20
100
±20
16
18
10
12
0.70
D
47
±20
11.8
14
10
12
0.70
D
25
TCFG D 1E 476
16
32
= Tolerance (M : ±20%)
zPackaging specifications
Taping
Case code
A±0.2
B±0.2
t1±0.1
t2±0.2
D (7343)
4.8
7.7
0.3
3.3
Taping
+0.1
0
5.5± 0.1
A
B
t1
12.0± 0.3
φ1.5
1.75± 0.1
D case
Products
8.0± 0.1
4.0± 0.1
t2
2.0± 0.1
Pull out direction
Rev.D
6/12
TCFG series D Case
Tantalum capacitors
zPackaging style
Case size
D Case
Packaging
Taping
Packaging style
Plastic taping
φ180mm reel
Symbol
Basic ordering unit
R
500
Reel
φ60 +10
φ180 −1.50
15.4±1.0
φ13±0.2
13.0 +1.00
Plastic reel
Label sticking position
EIAJ ET - 7200B compatible
Rev.D
7/12
TCFG series D Case
Tantalum capacitors
LEAKAGE CURRENT RATIO DCL / DCL
z Recommended condition of reflow soldering
(1) Leakage current-to-voltage ratio
1
0.1
0.01
0
20
40
60
80
100
% OF RATED VOLTAGE (VR)
Fig.1
(2) Derating voltage as function of temperature
PERCENT OF 85°C RVDC1 (VR)
100
90
80
70
60
50
75
125°C
85°C
85
95
105
115
Rated Voltage
Surge Voltage
Category Voltage
Surge Voltage
(V.DC)
(V.DC)
(V.DC)
(V.DC)
6.3
8
4
5
10
13
6.3
8
16
20
10
13
20
26
13
16
25
32
16
20
125
TEMPERATURE ( C)
Fig.2
(3) Reliability
The malfunction rate of tantalum solid state electrolytic capacitors varies considerably depending on the conditions of
usage (ambient temperature, applied voltage, circuit resistance).
Formula for calculating malfunction rate
Op = Ob u (SE u SSR u SQ u SCV)
Op
Ob
SE
SSR
SQ
SCV
: Malfunction rate stemming from operation
: Basic malfunction rate
: Environmental factors
: Series resistance
: Level of malfunction rate
: Capacitance
For details on how to calculate the malfunction rate stemming from operation, see the tantalum solid state electrolytic
capacitors column in MIL-HDBK-217.
Rev.D
8/12
TCFG series D Case
Tantalum capacitors
Malfunction rate as function of operating
temperature and rated voltage
FAILURE RATE COEFFICIENT
Ratio =
6.0
Applied Voltage
Rated Voltage
1.0
0.5
0.3
0.2
0.7
0.1
0.5
0.06
0.03
0.02
0.3
0.01
2.0
1.0
0.8
0.6
0.4
0.1
20
40
60
85
0.1
1.0
2.0 3.0
Fig.3
Fig.4
(5) Power vs. fuse blowout characteristics / Product
surface temperature
100
C case
D case
OPERATING TIME (sec)
340
failed
330
half failed
310
no failed
300
290
280
270
10
350
C case
D case 325
90
350
260
1
0.4 0.6
RESISTANCE OF CIRCUIT (Ω / V)
360
320
0.2
OPERATING TEMPERATURE ( C)
(4) External temperature vs. fuse blowout
EXTERNAL TEMPERATURE ( C)
4.0
RESISTANCE COEFFICIENT (π)
1.0
Malfunction rate as function of circuit resistance (:/V)
100
80
surface temp.
curve of the products(°C)
300
70
275
60
250
50
225
operating time(s)
40
200
30
175
20
150
10
125
0
0
1
2
3
4
5
6
7
8
OPERATING TIME (s)
ELECTRIC POWER (W)
Fig.5
Fig.6
9
100
10
Note: Solder the chip at 300qC or less. If it is soldered using
a temperature higher than 300qC, open function built-in may operate.
(6) Maximum power dissipation
Warming of the capacitor due to ripple voltage balances with warming caused by Joule heating and by radiated heat.
Maximum allowable warming of the capacitor is to 5qC above ambient temperature. When warming exceeds 5qC, it can
damage the dielectric and cause a short circuit.
Power dissipation (P) = I2¦R
Ripple current
P : As shown in table at right
R : Equivalent series resistance
Notes:
1. Please be aware that when case size is changed, maximum allowable power dissipation is reduced.
2. Maximum power dissipation varies depending on the package. Be sure to use a case which will keep warming within
the limits shown in the table below.
Rev.D
9/12
TCFG series D Case
Tantalum capacitors
Allowable power dissipation (W) and maximum temperature rising
Ambient
temp
Case
D case (7343)
+25°C
+55°C
+85°C
+125°C
0.150
0.135
0.120
0.060
5
5
5
2
Max. Temp Rise [°C]
(7) Impedance frequency characteristics
1000.000
(8) ESR frequency characteristics
10.0000
C1A107
C1A107
D1C107
D1C107
100.000
ESR (Ω)
ESR (Ω)
1.000
10.000
1.000
0.100
0.100
0.01
0.001
0.01
0.1
1
10
100
0.010
0.001 0.01
1000 10000 100000
0.1
1
10
100 1000 10000 100000
FREQUENCY (KHz)
FREQUENCY (KHz)
Fig.7
Fig.8
(9) Temperature characteristics
Cap 120Hz
10.0
DF 120Hz
20.0
16V-100μF D case(7343)
4V-220μF C case(6032)
16V-100μF D case(7343)
4V-220μF C case(6032)
8.0
15.0
4.0
2.0
DF (%)
CAP CHANGE (%)
6.0
0.0
−2.0
10.0
−4.0
5.0
−6.0
−8.0
−10.0
−55
25
85
25
85
TEMPERATURE ( C)
TEMPERATURE ( C)
Fig.9
Fig.10
LC 1WV
10000
IMPEDANCE (Ω)
LC (nA)
100
−55 C
16V-100μF D case(7343)
4V-220μF C case(6032)
2.0
1.0
0.0
25 C
85 C
125 C
125
IMPEDANCE 100kHz
3.0
16V-100μF D case(7343)
4V-220μF C case(6032)
1000
10
0.0
−55
125
−55 C
25 C
85 C
TEMPERATURE ( C)
TEMPERATURE ( C)
Fig.11
Fig.12
125 C
Rev.D
10/12
TCFG series D Case
Tantalum capacitors
Inrush current
Beware of inrush current.
Inrush currents are inversely proportional ESR. Large inrush currents can cause components failure.
100
tantalum capacitor
33μF
aluminum electrolysis
33μF
INRUSH CURRENT (A)
100μF
10
15μF
4.7μF
4.7μF
47μF
22μF
1
Vpp=10V llimit=20A
Pulse Width=500μsec.
Power OP Amp Slew Rate=10V/6μs
0.1
0.1
1
ESRΩ (100kHz)
10
100
Fig. 13 Maximum inrush current and ESR
Inrush current can be limited by means of a protective resistor.
100
SAMPLE 16V−3.3μF
Pulse width = 500μsec
Slew rate = 10V−6μc
Current limit = 20A
R =0Ω
V
I = 0.476
10
0.25
0.5
R
1.0
I
(A)
2.0
5.0
1
V
I = 0.476+R
0.1
0.1
1
V (V)
10
100
Fig. 14 Imax change due to protective resistor R
(10) Ultrasonic cleaning
Carry out cleaning under as mild conditions as possible. The internal element of a tantalum capacitor are larger than
those of a transistor or diode, so it is not as resistant as ultrasonic waves.
Example : water
Propagation speed
Solvent density
1500m / s
1g / cm3
Frequency and wavelength
Frequency Wavelength
20kHz
7.5cm
28kHz
5.3cm
50kHz
3.0cm
Rev.D
11/12
TCFG series D Case
Tantalum capacitors
z Precautions
1) Do not allow solvent to come to a boil (kinetic energy increases).
Қ Ultrasonic output
0.5W / cm2 or less
Қ Use a solvent with a high boiling point.
Қ Lower solvent temperature.
2) Ultrasonic cleaning frequency
28 kHz or less
3) Keep cleaning time as short as possible.
4) Move item being cleaned.
Standing waves caused by the ultrasonic waves can cause stress to build up in part of the item being cleaned.
Reference
Kinetic energy = 2 × π × frequency ×
2 × Ultrasonic output
propagation × speed × solvent density
Rev.D
12/12
Appendix
Notes
No technical content pages of this document may be reproduced in any form or transmitted by any
means without prior permission of ROHM CO.,LTD.
The contents described herein are subject to change without notice. The specifications for the
product described in this document are for reference only. Upon actual use, therefore, please request
that specifications to be separately delivered.
Application circuit diagrams and circuit constants contained herein are shown as examples of standard
use and operation. Please pay careful attention to the peripheral conditions when designing circuits
and deciding upon circuit constants in the set.
Any data, including, but not limited to application circuit diagrams information, described herein
are intended only as illustrations of such devices and not as the specifications for such devices. ROHM
CO.,LTD. disclaims any warranty that any use of such devices shall be free from infringement of any
third party's intellectual property rights or other proprietary rights, and further, assumes no liability of
whatsoever nature in the event of any such infringement, or arising from or connected with or related
to the use of such devices.
Upon the sale of any such devices, other than for buyer's right to use such devices itself, resell or
otherwise dispose of the same, no express or implied right or license to practice or commercially
exploit any intellectual property rights or other proprietary rights owned or controlled by
ROHM CO., LTD. is granted to any such buyer.
Products listed in this document are no antiradiation design.
The products listed in this document are designed to be used with ordinary electronic equipment or devices
(such as audio visual equipment, office-automation equipment, communications devices, electrical
appliances and electronic toys).
Should you intend to use these products with equipment or devices which require an extremely high level
of reliability and the malfunction of which would directly endanger human life (such as medical
instruments, transportation equipment, aerospace machinery, nuclear-reactor controllers, fuel controllers
and other safety devices), please be sure to consult with our sales representative in advance.
It is our top priority to supply products with the utmost quality and reliability. However, there is always a chance
of failure due to unexpected factors. Therefore, please take into account the derating characteristics and allow
for sufficient safety features, such as extra margin, anti-flammability, and fail-safe measures when designing in
order to prevent possible accidents that may result in bodily harm or fire caused by component failure. ROHM
cannot be held responsible for any damages arising from the use of the products under conditions out of the
range of the specifications or due to non-compliance with the NOTES specified in this catalog.
Thank you for your accessing to ROHM product informations.
More detail product informations and catalogs are available, please contact your nearest sales office.
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Appendix1-Rev2.0