DIODES ZXM66P03N8TC

ZXM66P03N8
30V P-CHANNEL ENHANCEMENT MODE MOSFET
SUMMARY
V(BR)DSS=-30V; RDS(ON)=0.025 ; ID=-7.9A
DESCRIPTION
This new generation of high density MOSFETs from Zetex utilises a unique
structure that combines the benefits of low on-resistance with fast switching
speed. This makes them ideal for high efficiency, low voltage, power
management applications.
SO8
FEATURES
• Low on-resistance
• Fast switching speed
• Low threshold
• Low gate drive
• Low profile SOIC package
APPLICATIONS
• DC - DC converters
• Power management functions
• Disconnect switches
• Motor control
TAPE WIDTH
QUANTITY
PER REEL
ZXM66P03N8TA
7”
12mm
500 units
S
8
ZXM66P03N8TC
13”
12mm
2500 units
S
2 1
D
7
D
S
6
D
4
DEVICE
5
REEL SIZE
3
ORDERING INFORMATION
DEVICE MARKING
• ZXM
Top View
66P03
ISSUE 1 - JANUARY 2006
1
SEMICONDUCTORS
ZXM66P03N8
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
LIMIT
UNIT
Drain-Source Voltage
V DSS
-30
V
Gate- Source Voltage
V GS
±20
V
ID
-7.9
-6.3
-6.25
A
I DM
-28
A
IS
I SM
-4.1
A
-28
A
Power Dissipation at T A =25°C (a)
Linear Derating Factor
PD
1.56
12.5
W
mW/°C
Power Dissipation at T A =25°C (b)
Linear Derating Factor
PD
2.5
20
W
mW/°C
T j :T stg
-55 to +150
°C
Continuous Drain Current V GS =-10V; T A =25°C(b)
V GS =-10V; T A =70°C(b)
V GS =-10V; T A =25°C(a)
Pulsed Drain Current (c)
Continuous Source Current (Body Diode)(b)
Pulsed Source Current (Body Diode)(c)
Operating and Storage Temperature Range
THERMAL RESISTANCE
PARAMETER
SYMBOL
VALUE
UNIT
Junction to Ambient (a)
R θJA
80
°C/W
Junction to Ambient (b)
R θJA
50
°C/W
NOTES
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions
(b) For a device surface mounted on FR4 PCB measured at t⭐10 secs.
(c) Repetitive rating 25mm x 25mm FR4 PCB, D = 0.05, pulse width 10␮s - pulse width limited by maximum junction temperature.
ISSUE 1 - JANUARY 2006
SEMICONDUCTORS
2
ZXM66P03N8
ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated).
PARAMETER
SYMBOL
MIN.
TYP.
MAX. UNIT CONDITIONS
Drain-Source Breakdown Voltage
V (BR)DSS
-30
Zero Gate Voltage Drain Current
I DSS
Gate-Body Leakage
I GSS
Gate-Source Threshold Voltage
V GS(th)
Static Drain-Source On-State
Resistance (1)
R DS(on)
Forward Transconductance (1)(3)
g fs
14.4
S
Input Capacitance
C iss
1979
pF
Output Capacitance
C oss
743
pF
Reverse Transfer Capacitance
C rss
279
pF
Turn-On Delay Time
t d(on)
7.6
ns
Rise Time
tr
16.3
ns
Turn-Off Delay Time
t d(off)
94.6
ns
Fall Time
tf
39.6
ns
Gate Charge
Qg
36
nC
Total Gate Charge
Qg
62.5
nC
Gate-Source Charge
Q gs
4.9
nC
Gate Drain Charge
Q gd
19.6
nC
STATIC
V
I D =-250µA, V GS =0V
-1
µA
V DS =-24V, V GS =0V
-100
nA
-1.0
V
0.025 Ω
0.035 Ω
V GS =±20V, V DS =0V
I =-250µA, V DS =
D
V GS
V GS =-10V, I D =-5.6A
V GS =-4.5V, I D =-2.8A
V DS =-15V,I D =-5.6A
DYNAMIC (3)
V DS =-25 V, V GS =0V,
f=1MHz
SWITCHING(2) (3)
V DD =-15V, I D =-5.6A
R G =6.2Ω, V GS =-10V
V DS =-15V,V GS =-5V
I D =-5.6A
V DS =-15V,V GS =-10V
I D =-5.6A
SOURCE-DRAIN DIODE
Diode Forward Voltage (1)
V SD
-0.95 V
Reverse Recovery Time (3)
t rr
35
ns
Reverse Recovery Charge(3)
Q rr
39.9
nC
T j =25°C, I S =-5.6A,
V GS =0V
T j =25°C, I F =-5.6A,
di/dt= 100A/µs
(1) Measured under pulsed conditions. Width=300µs. Duty cycle ≤2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 1 - JANUARY 2006
3
SEMICONDUCTORS
ZXM66P03N8
PACKAGE DIMENSIONS
DIM
Millimetres
Inches
Min
Max
Min
Max
A
4.80
4.98
0.189
0.196
B
1.27 BSC
0.05 BSC
C
0.53 REF
0.02 REF
D
0.36
0.46
0.014
0.018
E
3.81
3.99
0.15
0.157
F
1.35
1.75
0.05
0.07
G
0.10
0.25
0.004
0.010
J
5.80
6.20
0.23
0.24
K
0°
8°
0°
8°
L
0.41
1.27
0.016
0.050
© Zetex Semiconductors plc 2006
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[email protected]
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Fax: (1) 631 360 8222
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[email protected]
Telephone (44) 161 622 4444
Fax: (44) 161 622 4446
[email protected]
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ISSUE 1 - JANUARY 2006
SEMICONDUCTORS
4