DS1342 - Maxim

12/15/2010
PRODUCT RELIABILITY REPORT
FOR
DS1342, Rev A2
Maxim Integrated Products
4401 South Beltwood Parkway
Dallas, TX 75244-3292
Prepared by:
Don Lipps
Manager, Reliability Engineering
Maxim Integrated Products
4401 South Beltwood Pkwy.
Dallas, TX 75244-3292
Email: [email protected]
ph: 972-371-3739
Rev B, 1/3/08
Conclusion:
The following qualification successfully meets the quality and reliability standards required of all
Maxim products:
DS1342, Rev A2
In addition, Maxim's continuous reliability monitor program ensures that all outgoing product will
continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor
program can be viewed at http://www.maxim-ic.com/TechSupport /dsreliability.html.
Device Description:
A description of this device can be found in the product data sheet. You can find the product data
sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm.
Reliability Derating:
The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that
are temperature accelerated.
AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts
AfT = Acceleration factor due to Temperature
tu = Time at use temperature (e.g. 55°C)
ts = Time at stress temperature (e.g. 125°C)
k = Boltzmann‚Äôs Constant (8.617 x 10-5 eV/°K)
Tu = Temperature at Use (°K)
Ts = Temperature at Stress (°K)
Ea = Activation Energy (e.g. 0.7 ev)
The activation energy of the failure mechanism is derived from either internal studies or industry
accepted standards, or activation energy of 0.7ev will be used whenever actual failure
mechanisms or their activation energies are unknown. All deratings will be done from the stress
ambient temperature to the use ambient temperature.
An exponential model will be used to determine the acceleration factor for failure mechanisms,
which are voltage accelerated.
AfV = exp(B*(Vs - Vu))
AfV = Acceleration factor due to Voltage
Vs = Stress Voltage (e.g. 7.0 volts)
Vu = Maximum Operating Voltage (e.g. 5.5 volts)
B = Constant related to failure mechanism type (e.g. 1.0, 2.4, 2.7, etc.)
The Constant, B, related to the failure mechanism is derived from either internal studies or industry
accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are
unknown. All deratings will be done from the stress voltage to the maximum operating voltage.
Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the
60% or 90% confidence level (Cf).
The failure rate, Fr, is related to the acceleration during life test by:
Fr = X/(ts * AfV * AfT * N * 2)
X = Chi-Sq statistical upper limit
N = Life test sample size
Rev B, 1/3/08
Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT
rate is related to MTTF by:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
The calculated failure rate for this device/process is:
FAILURE RATE:
MTTF (YRS):
13537
FITS:
8.4
DEVICE HOURS:
108660397
FAILS:
0
Only data from Operating Life or similar stresses are used for this calculation.
The parameters used to calculate this failure rate are as follows:
Cf: 60%
Ea: 0.7
B: 0
Tu: 25
°C
Vu: 5.5
Volts
The reliability data follows. At the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available
and may contain some generic data. Bold Product Number denotes specific product data.
Device Information:
Process:
Passivation:
Die Size:
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
SA E6H, 2P2M,HPVt,PF-Ring,TCZ,ALOCOS:GOI
TEOS Oxide-Nitride Passivation
61.811024 x 75.19685
12187
Aluminum / 0.5% Copper
150 Å
ESD HBM
DESCRIPTION
DATE CODE/PRODUCT/LOT
CONDITION
ESD SENSITIVITY
0937
DS1341
WJ048116AB JESD22-A114 HBM 500
VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0937
DS1341
WJ048116AB JESD22-A114 HBM 1000
VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0937
DS1341
WJ048116AB JESD22-A114 HBM 2000
VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0937
DS1341
WJ048116AB JESD22-A114 HBM 4000
VOLTS
1
PUL'S
3
0
ESD SENSITIVITY
0937
DS1341
WJ048116AB JESD22-A114 HBM 8000
VOLTS
1
PUL'S
3
1
READPOIN
QTY FAILS
FA#
No FA
1
Total:
LATCH-UP
DESCRIPTION
DATE CODE/PRODUCT/LOT
CONDITION
LATCH-UP I
0937
DS1341
WJ048116AB JESD78A, I-TEST 125C
6
0
LATCH-UP V
0937
DS1341
WJ048116AB JESD78A, V-SUPPLY
TEST 125C
6
0
READPOIN
Total:
QTY FAILS
FA#
0
OPERATING LIFE
DESCRIPTION
Rev B, 1/3/08
DATE CODE/PRODUCT/LOT
CONDITION
READPOIN
QTY FAILS
FA#
HIGH TEMP OP LIFE
0925
DS21Q50
WK945230A 125C, 3.5 VOLTS
1000 HRS
77
0
HIGH TEMP OP LIFE
0947
DS1341
WD048116A 125C, 5.5 VOLTS
192
HRS
77
0
HIGH TEMP OP LIFE
1022
MAX34405
QD056611A 125C, 3.6 VOLTS
192
HRS
45
0
HIGH TEMP OP LIFE
1037
DS1340
WD157959A 125C, 5.5 VOLTS
192
HRS
77
0
Total:
FAILURE RATE:
Rev B, 1/3/08
MTTF (YRS):
13537
FITS:
8.4
DEVICE HOURS:
108660397
FAILS:
0
0