PACE1753 SOS - Pyramid Semiconductor

PACE1753/SOS
SINGLE CHIP, MIL-STD-1750A
MEMORY MANAGEMENT UNIT (MMU)
CMOS/SOS SPACE PROCESSOR MICROPERIPHERAL
FEATURES
Implements the MIL-STD-1750A Instruction Set
Architecture for Memory Management and
Protection of up to 1 Megaword. All mapping
memory (10,240 bits) for both the MMU and
BPU functions are included on the chip.
Designed to interface memory to the
PACE1750A/AE.
Provides the following additional functions:
— EDAC, Error Detection and Correction—or
parity generation and detection
— Correct data register—for diagnostics
— First memory failing address register
— Illegal address error detection—
programmable
— Multi-Master arbitration
8-bit extended address laches and drivers on
chip.
20, 25 and 30 MHz operation over the Military
Temperature Range
Single 5V ± 10% Power Supply
Available with Class S manufacturing,
screening, and testing.
SOS Insulated substrate latch-up immunity and
excellent SEU tolerance.
SOS devices are fully interchangeable with
application-proven SMD CMOS P1753 devices.
Available in:
— 68-Lead Quad Pack (Leaded Chip Carrier)
with optional Gull Wing.
MEMORY MANAGEMENT UNIT AND
BLOCK PROTECT UNIT “COMBO”
(PACE1753)—FUNCTIONAL DESCRIPTION
The PACE1753 (COMBO) is a support chip for the
PACE1750A/AE microprocessor family. It provides the
following supporting functions to the system:
1. Memory management and access protection for up
to 1M words.
2 Physical memory write protection for up to 1M words
memory in pages of 1K words each. Separate
protection is provided for the CPU and for DMA in
systems which include DMA.
3. Detection of illegal l/O accesses (as defined by MILSTD-1750A) or access to an unimplemented block
of memory. In each case an error flag is generated
to the processor.
4 Detection of double errors on the data bus and
correction of single errors. An error signal is generated
to the processor when a multiple error is detected.
5. RDYA generation. Up to three wait states can be
inserted in the address phase of the bus by generating
a not-ready, RDYA low signal. The number of wait
states required can be programmed in an internal
register in the COMBO.
6. Bus arbitration for up to 4 masters. Arbitration is
done on a fixed priority basis (i.e. by interconnection
of hardware). (In 68 pin package only).
Document # MICRO-8 REV B
Revised August 2005
PACE1753/SOS
ABSOLUTE MAXIMUM RATINGS1
RECOMMENDED OPERATING
CONDITIONS
Supply Voltage Range
0.5V to +7.0V
Input Voltage Range
0.5V to VCC + 0.5V
Supply Voltage Range
4.5V to +5.5V
Storage Temperature Range
–65°C to +150°C
–55°C to +125°C
Input Current Range
–30mA to +5mA
Case Operating
Temperature Range
Current applied to any
output3
150mA
Maximum Power Dissipation2
1.5W
Lead Temperature Range
(soldering 10 seconds)
300°C
Thermal resistance (θJC):
QL and QG packages
8°C/W
Operating Maximum Power
Dissipation (Outputs Open)
Device Type 20MHz
Device Type 30MHz
Device Type 40MHz
0.5W
0.6W
0.7W
Notes
1. Stresses above the absolute maximum rating may cause permanent
damage to the device. Extended operation at the maximum levels
may degrade performance and affect reliability.
2. Must withstand the added power dissipation due to short circuit test
e.g., IOS.
3. Duration 1 second or less.
Document # MICRO-8 REV B
Page 2 of 17
PACE1753/SOS
DC ELECTRICAL SPECIFICATIONS (Over recommended operating conditions)
Symbol
Parameter
Min
Max
Unit
Conditions1
VIH
Input HIGH Voltage
2.0
VCC + 0.5
V
VIL
Input LOW
Voltage2
–0.5
0.8
V
VCD
Input Clamp Diode Voltage
–1.2
V
VCC = 4.5V, IIN = –18mA
VOH
Output HIGH Voltage
2.4
V
VCC = 4.5V,
IOH = –8.0mA
VCC – 0.2
V
VIN = 0.8V, 2.0V
IOH = –300µA
0.65
V
VCC = 4.5V,
IOL = 8.0mA
0.2
V
VIN = 0.8V, 2.0V
IOL = 300µA
0.65
V
VCC = 4.5V,
IOL = 20.0mA
0.2
V
VIN = 0.8V, 2.0V
IOL = 300µA
300
µA
VIN = VCC,
VCC = 5.5V
100
µA
–50
µA
VOL
VOL
IIH
IIH
IIL
Output LOW
Voltage,4
except EXT ADR0 – EXT ADR7
Output LOW
Voltage,4
EXT ADR0 – EXT ADR7
Input HIGH Current,
except IB0 – IB15,
EDC0 – EDC5,
EXT ADR0 – EXT ADR7
Input HIGH Current,
IB0 – IB15, EDC0 – EDC5,
EXT ADR0 – EXT ADR7
Input LOW Current,
except IB0 – IB15,
EDC0 – EDC5,
EXT ADR0 – EXT ADR7
VIN = VCC,
VCC = 5.5V
VIN = GND,
VCC = 5.5V
IIL
Input LOW Current,
IB0 – IB15, EDC0 – EDC5,
EXT ADR0 – EXT ADR7
–50
µA
VIN = GND,
VCC = 5.5V
IOZH
Output Three-State Current
50
µA
VOUT = 2.4V, VCC = 5.5V
IOZL
Output Three-State Current
–50
µA
VOUT = 0.5V, VCC = 5.5V
ICCQC
Quiescent Power Supply
Current (CMOS Input
Levels, Active)
60
mA
VIN < 0.2V or < VCC – 0.2V
f = 0MHz, Outputs Open,
VCC = 5.5V
ICCQT
Quiescent Power Supply
Current (TTL Input
Levels, Active)
110
mA
VIN = 3.4V, f = 0MHz,
All Inputs, Outputs Open,
VCC = 5.5V
Dynamic Power Supply
90
mA
Current
100
mA
125
mA
VCC = 0V to VCC,
tr = tf = 2.5 ns,
Outputs Open,
VCC = 5.5V
mA
VOUT = GND, VCC = 5.5V
ICCD
Current3
–25
F = 20MHz
F = 30MHz
F = 40MHz
IOS
Output Short Circuit
CIN
Input Capacitance
10
pF
Inputs Only
COUT
Output/Bi-directional
Capacitance
15
pF
Outputs Only
(Including I/O Buffers)
Notes
1. 4.5V ≤ VCC ≤ 5.5V, –55°C ≤ TC ≤ +125°C. Unless otherwise specified, testing shall be conducted at worst-case conditions.
2. VIL = –3.0V for pulse widths less than or equal to 20ns.
3. Duration of the short should not exceed one second; only one output may be shorted at a time.
4. Test may be performed by setting/forcing the parameter limit (voltage) and measuring the appropriate current parameter.
Document # MICRO-8 REV B
Page 3 of 17
PACE1753/SOS
AC ELECTRICAL CHARACTERISTICS
(VCC = 4.5V)
20 MHz
Symbol
TD/I (EXT ADR)V
Parameter
MMU Cache Hit
Min
Max
25MHz
Min
Max
30 MHz
Min
Max
Unit
27
23
21
ns
TSTRBD (EXT ADR ERR)L External Address Error
37
33
30
ns
TC (IBD CORR)
Error Correction Read Cycle
32
28
26
ns
IBDV (SING ERR)H
Error Correction Read Cycle
37
33
31
ns
TC (SING ERR)L
Error Correction Read Cycle
27
23
21
ns
TIBDV (EDC GEN)V
EDAC or Parity Write Cycle
32
28
26
ns
TSTRBD (EX RDY)L
MMU Cache Miss
27
23
21
ns
TC (EX RDY)H
MMU Cache Miss
27
23
21
ns
TC (WR PROT)L
MMU Cache Miss
36
32
30
ns
TSTRBDH (WR PROT)H
MMU Cache Miss
27
23
21
ns
TC (GNT1)H
Arbiter LOW to HIGH Priority
34
30
28
ns
TC (GNT0)L
Arbiter LOW to HIGH Priority
34
30
28
ns
TC (GNT0)H
Arbiter HIGH to LOW Priority
34
30
28
ns
TC (GNT1)L
Arbiter HIGH to LOW Priority
34
30
28
ns
TC (RDYA)
Address Ready
32
28
26
ns
TFC (IB OUT)V
Clock to IB Out Valid (I/O Read)
40
38
36
ns
TIBDIN (MEM PAR ERR)
Parity Mode
36
32
30
ns
TC (MEM PRT ERR)
Memory Protect Error
64
60
58
ns
TSTRBD (WR PROT)
Write Protect Cache Hit
27
23
21
ns
TC (WR PROT)L
Write Protect Cache Miss
37
33
31
ns
TSTRBDH (WR PROT)H
Write Protect Cache Miss
27
23
21
ns
TD/I (PROT FLAG)
Cache Hit (BPU Protection Error)
52
48
46
ns
TD/I (PROT FLAG)
Cache Hit (MMU Key-Lock Error)
42
38
36
ns
TC (PROT FLAG)
Cache Miss (BPU Protection Error)
67
63
61
ns
TC (PROT FLAG)
Cache Hit (MMU Key-Lock Error)
52
48
46
ns
TC (EXT ADR)
Clock to EXT ADR Valid (Miss)
38
34
32
ns
Notes:
1. 4.5V ≤ VCC ≤ 5.5V, –55°C ≤ TC ≤ +125°C. Unless otherwise specified, testing shall be conducted at worst-case conditions.
2. VIL = –3.0V for pulse widths less than or equal to 20ns.
3. Duration of the short should not exceed one second; only one output may be shorted at a time.
4. Pulse width of WR PROT/PROT FLAG shall be ≥ 80% of STRBD pulse width.
5. Functional tests shall consist of the same functional tests used when testing the equivalent bulk CMOS, MIL-STD-883 compliant, Class B SMD
5962-89505 device.
Document # MICRO-8 REV B
Page 4 of 17
PACE1753/SOS
TERMINAL CONNECTIONS - PACKAGES QL AND QG
Case Outlines
Terminal
Number
U and Y
Terminal
Symbol
Terminal
Number
Terminal
Symbol
Terminal
Number
Terminal
Symbol
1
GND
24
IB12
47
AS1
2
EDC0
25
IB13
48
AS0
3
EDC1
26
IB14
49
BUS REQ
4
EDC2
27
IB15
50
AK3
5
RESET
28
MEM PRT ERR
51
AK2
6
EDC3
29
MEM PAR ERR
52
BUS GNT 1
7
EDC4
30
EXT ADR ERR
53
AK1
8
EDC5
31
RAM DIS
54
AK0
9
BUS GNT2
32
SING ERR
55
CLK
10
IB0
33
DMA ACK
56
STRBA
11
IB1
34
GND
57
STRBD
12
IB2
35
VCC
58
BUS REQ 0
13
IB3
36
EXT ADR0
59
EX RDY
14
IB4
37
EXT ADR1
60
WR PROT/PROT FLAG
15
IB5
38
EXT ADR2
61
R/W
16
lB6
39
EXT ADR3
62
D/I
17
IB7
40
EXT ADR4
63
M/IO
18
BUS REQ 3
41
EXT ADR5
64
RDYA
19
IB8
42
EXT ADR6
65
BUS GNT 0
20
IB9
43
EXT ADR7
66
BUS LOCK
21
BUS GNT 3
44
GND
67
BUS REQ 1
22
IB10
45
AS3
68
VCC
23
IB11
46
AS2
Document # MICRO-8 REV B
2
Page 5 of 17
PACE1753/SOS
MMU Cache Hit
External Address Error
Note:
All time measurements on active signals relate to 1.5V levels.
Document # MICRO-8 REV B
Page 6 of 17
PACE1753/SOS
Error Correction (Write Cycle)
Memory Protect Error
Error Correction (Read Cycle)
Ready Address
Memory Parity Error
Note:
All time measurements on active signals relate to 1.5V levels.
Document # MICRO-8 REV B
Page 7 of 17
PACE1753/SOS
MMU Cache Miss Cycle (WA = 0)
MMU Cache Miss Cycle (WA > 0)
* The WR PROT/PROT FLAG signal is programmed as WR PROT or PROT FLAG. (See BPU Description), T = 1 Clock Period.
Note:
All time measurements on active signals relate to 1.5V levels.
Document # MICRO-8 REV B
Page 8 of 17
PACE1753/SOS
Low Priority to High Priority Transition
Bus Arbitrator High Priority to Low Priority Transition
Note:
All time measurements on active signals relate to 1.5V levels.
Document # MICRO-8 REV B
Page 9 of 17
PACE1753/SOS
SWITCHING WAVEFORMS AND TEST CIRCUIT (Continued)
IB Bus Output (0:15)
Standard Output (Non Three-State)
Three-State
Note:
All time measurements on active signals relate to 1.5V levels.
Document # MICRO-8 REV B
Parameter
VO
VMEA
TPLZ
≥ 3V
0.5V
TPHZ
0V
VCC – 0.5V
TPXL
VCC/2
1.5V
TPXH
VCC/2
1.5V
Page 10 of 17
PACE1753/SOS
PIN FUNCTIONS
Symbol
Name
Description
BUS REQ0 BUS REQ3
Bus Request1
Active LOW inputs that indicate a requirement for the bus from 4
masters on the bus. The master assigned to pin BUS-REQ0 has
highest priority; the master assigned to pin BUS-REQ3 has lowest
priority.
BUS LOCK
Bus Lock1
An active LOW input that indicates that the one master assigned
the bus is using the bus. A new master will receive a bus grant only
after this signal becomes inactive.
BUS GNT0 BUS GNT3
Bus Grant1
Active LOW outputs indicating which master was granted the
bus. It remains active during BUS LOCK unless a higher master
request occurs, which resets it. However, the higher master will be
granted the bus only after the present master’s BUS LOCK releases
the bus.
M/IO
Memory or I/O
An input signal that indicates whether the current bus cycle is a
memory (HIGH) or l/O (LOW) cycle.
D/I
Data or Instruction
An input signal that indicates whether the current bus cycle access
is for data (HIGH) or instruction (LOW).
R/W
Read or Write
An input signal that indicates the direction of data flow on the bus.
A HIGH indicates a memory read or input operation into the master
and a LOW indicates a memory write or output operation from the
master.
STRBA
Address Strobe
An active HIGH input used to latch the address at the HIGH-toLOW transition of the strobe.
STRBD
Data Strobe
An active LOW input used to strobe data in memory and I/O cycles.
CPU-CLK
CPU Clock
A single-phase input clock signal (0-40MHz, 40% to 60% duty
cycle.)
RESET
Reset
An active LOW input that initializes the device.
AK0 - AK3
Access Key
Active HIGH inputs used to match the access lock in the MMU page
for memory accesses. A mismatch will cause the MEM PRT ERR
signal to become active.
AS0 - AS3
Address State
Active HIGH inputs that select the page register group in the MMU.
In the DMA physical demultiplexed mode, AS(0:1) will receive the
9th and 10th most significant bits of the physical address for use in
the BPU function.
EXT ADR0 EXT ADR7
Extended Addresses Bus A bi-directional active HIGH bus. In CPU cycles, it is an output
bus which is used to select one of 256 pages, 4K words each,
expanding the direct addressing space to 1M word. In DMA cycles,
indicated by DMA-ACK being active, it is also an output bus except
when programmed for the physical demultiplexed DMA mode. In
this case it becomes an input to receive the 8 most significant bits
of the DMA physical address for use in the BPU function.
IB0 - IB15
Information Bus
An active HIGH bi-directional time multiplexed address/data bus.
IB0 is the most significant bit.
EDC0 - EDC5
Detection/Correction
Bus
An active HIGH bi-directional bus used for detection of errors on
the data bus (IB0 - IB15) and correction of single errors. When
working in parity mode EDC0 is the parity bit. EDC0 - EDC5 are
undefined in this case.
Document # MICRO-8 REV B
Page 11 of 17
PACE1753/SOS
PIN FUNCTIONS (Continued)
Symbol
Name
Description
MEM PRT ERR
Memory Protect Error
An active LOW output generated by the MMU or BPU blocks to
signal to the CPU a protected memory violation. The error is
generated in one of the following conditions: a mismatch in the
access keys in the MMU page, an access to an execution protected
page during instruction cycles, an access to a write-protected page
during data cycles, or an access to a page write-protected by the
BPU.
MEM PAR ERR
Memory Parity Error
An active LOW output which signals to the CPU an error on the
data bus during a memory cycle. Two detection modes can be
selected by programming the control register: EDAC mode (6
Hamming code parity bits) or single bit parity mode (even or odd
parity). The signal is inactive when none of the above modes are
selected (default after Reset).
EXT ADR ERR
External Address Error
An active LOW output which signals to the CPU an unimplemented
memory or illegal I/O access.
SING ERR
Single Error
An active HIGH output to signal detection of a single error on the
data bus in memory cycles. It is high impedance when the EDAC
function is disabled by the program (default state after Reset).
RAM DIS
RAM-Disable
An active HIGH input from the P1754 device which enables the
corrected data on the data bus when the EDAC function is enabled.
An internal one clock delay is generated before the data is output
on the bus to allow external memory to disconnect itself from the
bus.
EX RDY
Data Ready
An active HIGH output that indicates that no wait states are
requested. It becomes inactive for one clock (inserting one wait
state) whenever a memory page different than the current one is
accessed (causing a miss).
RDYA
Address Ready
An active HIGH output that indicates that no wait states are
requested when STRBA is active. Wait states are inserted when
this signal becomes inactive during STRBA. Up to three wait states
can be inserted by programming an internal register. Three wait
states are inserted after Reset (default).
WR PROT/
PROT FLAG
Write Protected/
Protection Flag
Either an active LOW output (following STRBD timing) during legal
memory write cycles, when no protection error occurs, or an active
HIGH level indicating a protection error in a write cycle. Each mode
can be selected by programming the control register. Default mode
after Reset is write-protected.
DMA ACK
DMA Acknowledge
An active HIGH input from the DMA controller which indicates a
DMA cycle. Used to select the DMA table in the BPU memory for
protection. For example, this could allow the DMA channel to
update the program which could be write-protected from the
processor. In the physical DMA mode, it will cause the Extended
Address Lines (EXT ADR0-7) to become inputs, providing BPU
protection of the DMA transfers.
Note:
1. Used for Bus Arbitration; only available on 68-lead devices.
Document # MICRO-8 REV B
Page 12 of 17
PACE1753/SOS
Standardized Military
Drawing Part Number
Pyramid Semiconductor
CAGE Number
Pyramid Semiconductor
Part Number
5962-8950501UX
3DTT2
P1753-20QLMB
5962-8950501YX
3DTT2
P1753-20QGMB
5962-8950501ZX
3DTT2
P1753-20PGMB
5962-8950502UX
3DTT2
P1753-30QLMB
5962-8950502YX
3DTT2
P1753-30QGMB
5962-8950502ZX
3DTT2
P1753-30PGMB
5962-8950503UX
3DTT2
P1753-40QLMB
5962-8950503YX
3DTT2
P1753-40QGMB
5962-8950503ZX
3DTT2
P1753-40PGMB
5962-8950504TX
3DTT2
P1753-20GMB
5962-8950504XX
3DTT2
P1753-20CMB
5962-8950505TX
3DTT2
P1753-30GMB
5962-8950505XX
3DTT2
P1753-30CMB
5962-8950506TX
3DTT2
P1753-40GMB
5962-8950506XX
3DTT2
P1753-40CMB
ORDERING INFORMATION
Document # MICRO-8 REV B
Page 13 of 17
PACE1753/SOS
CASE OUTLINE 1:
68 Lead Quad Pack with Straight Leads (Ordering Code QL)
Inches
.002
.003
.006
.010
.015
.018
.050
.060
.080
.095
.225
.570
.800
.955
mm
0.05
0.08
0.15
0.25
0.38
0.45
1.27
1.52
2.03
2.41
5.72
14.48
20.32
24.25
NOTES:
1) Dimensions are in inches.
2) Metric equivalents are given for general information only.
3) Unless otherwise specified, tolerances are .02 (0.5 mm) for two place decimals and .005 (0.13 mm) for three place decimals.
4) Pin 1 indicator can be either rectangle, dot, or triangle at specified location or referenced to the uniquely beveled corner.
5) Corners indicated as notched may be either notched or square.
Document # MICRO-8 REV B
Page 14 of 17
PACE1753/SOS
CASE OUTLINE 2:
68 Lead Quad Pack with Gullwing Leads (Ordering Code QG)
Inches
.003
.010
.015
.018
.020
.050
.570
.800
.955
1.230
mm
0.08
0.25
0.38
0.45
0.51
1.27
14.48
20.32
24.25
31.26
NOTES:
1) Dimensions are in inches.
2) Metric equivalents are given for general information only.
3) Unless otherwise specified, tolerances are .02 (0.5 mm) for two place decimals and .005 (0.13 mm) for three place decimals.
4) Pin 1 indicator can either be rectangle, dot, or triangle at specified location or referenced to the uniquely beveled corner.
5) Corners indicated as notched my be either notched or square (with radius).
6) Case 2 is derived from Case 1 by forming the leads to the shown gullwing configuration.
Document # MICRO-8 REV B
Page 15 of 17
PACE1753/SOS
LEAD FORM DETAIL
Symbol
INCHES
Min
Max
A
0.048
A1
0.011
0.031
B
0.016
0.021
C
0.004
0.008
e1
0.090
0.050 BSC
D
1.210
1.250
D1
0.945
0.965
D2
0.800 BSC
E
1.210
1.250
E1
0.945
0.965
E2
L*
0.800 BSC
0.270 Nominal
L0
0.120
0.210
L3
0.040
0.050
L4
0.086
0.109
R1
0.018
0.020
R2
Φ1
0.018
0.020
4°
8°
Φ2
A0**
-1°
7°
0.141
* Lead length in the straight lead configuration, prior to leadforming (used for all test and in-process WIP operations).
** Measured from the highest of the top of the leads or the top of the lid.
Document # MICRO-8 REV B
Page 16 of 17
PACE1753/SOS
REVISIONS
DOCUMENT NUMBER:
DOCUMENT TITLE:
MICRO-8
PACE1753/SOS CMOS MMU/COMBO
REV.
ISSUE
DATE
ORIG. OF
CHANGE
ORIG
May-89
RKK
New Data Sheet
A
Jul-04
JDB
Added Pyramid logo
B
Aug-05
JDB
Re-created electronic version
Document # MICRO-8 REV B
DESCRIPTION OF CHANGE
Page 17 of 17