IDT IDT74ALVCH16260

IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
3.3V CMOS 12-BIT TO 24-BIT
MULTIPLEXED D-TYPE LATCH
WITH 3-STATE OUTPUTS
AND BUS-HOLD
FEATURES:
IDT74ALVCH16260
DESCRIPTION:
• 0.5 MICRON CMOS Technology
• Typical tSK(o) (Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• VCC = 3.3V ± 0.3V, Normal Range
• VCC = 2.7V to 3.6V, Extended Range
• VCC = 2.5V ± 0.2V
µ W typ. static)
• CMOS power levels (0.4µ
• Rail-to-Rail output swing for increased noise margin
• Available in SSOP and TSSOP packages
This 12-bit to 24-bit multiplexed D-type latch is built using advanced dual
metal CMOS technology. The ALVCH16260 is used in applications in which
two separate data paths must be multiplexed onto, or demultiplexed from, a
single data path. Typical applications include multiplexing and/or demultiplexing
address and data information in microprocessor or bus-interface applications.
This device also is useful in memory interleaving applications.
Three 12-bit I/O ports (A1-A12, 1B1-1B12, and 2B1-2B12) are available
for address and/or data transfer. The output-enable (OE1B, OE2B, and OEA)
inputs control the bus transceiver functions. The OE1B and OE2B control
signals also allow bank control in the A-to-B direction. Address and/or data
information can be stored using the internal storage latches. The latch-enable
(LE1B, LE2B, LEA1B, and LEA2B) inputs are used to control data storage.
When the latch-enable input is high, the latch is transparent. When the latchenable input goes low, the data present at the inputs is latched and remains
latched until the latch-enable input is returned high.
The ALVCH16260 has been designed with a ±24mA output driver. This
driver is capable of driving a moderate to heavy load while maintaining speed
performance.
The ALVCH16260 has “bus-hold” which retains the inputs’ last state
whenever the input goes to a high impedance. This prevents floating inputs
and eliminates the need for pull-up/down resistors.
DRIVE FEATURES:
• High Output Drivers: ±24mA
• Suitable for heavy loads
APPLICATIONS:
• 3.3V high speed systems
• 3.3V and lower voltage computing systems
FUNCTIONAL BLOCK DIAGRAM
OE1B
LEA1B
LE1B
29
30
A-1B
LATCH
2
1B-A
LATCH
12
SEL
1 B 1:12
12
12
12
28
1
OEA
A 1:12
12
M
U
X
1
0
12
27
2B-A
LATCH
55
A-2B
LATCH
12
LE2B
LEA2B
12
2 B 1:12
12
56
O E2B
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
JANUARY 2004
1
© 2004 Integrated Device Technology, Inc.
DSC-4737/2
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATION
Symbol
Description
VTERM(2)
Max
Unit
Terminal Voltage with Respect to GND
–0.5 to +4.6
V
OEA
1
56
OE2B
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
LE1B
2
55
LEA2B
TSTG
Storage Temperature
–65 to +150
°C
2B3
3
54
2B4
–50 to +50
mA
GND
4
53
GND
±50
mA
2B2
5
52
2B1
6
VCC
A1
A2
IOUT
DC Output Current
IIK
Continuous Clamp Current,
VI < 0 or VI > VCC
2B5
IOK
Continuous Clamp Current, VO < 0
–50
mA
51
2B6
mA
50
VCC
Continuous Current through each
VCC or GND
±100
7
ICC
ISS
8
49
2B7
9
48
2B8
A3
10
47
2B9
GND
11
46
GND
A4
12
45
2B10
A5
13
44
2B11
A6
14
43
2B12
A7
15
42
1B12
Symbol
Conditions
Typ.
Max.
Unit
A8
16
41
1B11
CIN
Input Capacitance
VIN = 0V
5
7
pF
A9
17
40
1B10
COUT
Output Capacitance
VOUT = 0V
7
9
pF
GND
18
39
GND
CI/O
I/O Port Capacitance
VIN = 0V
7
9
pF
A10
19
38
1B9
A11
20
37
1B8
A12
21
36
1B7
VCC
22
35
VCC
1B1
23
34
1B6
1B2
24
33
1B5
GND
25
32
GND
1B3
26
31
1B4
LE2B
27
30
LEA1B
SEL
28
29
OE1B
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. VCC terminals.
3. All terminals except VCC.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
NOTE:
1. As applicable to the device type.
FUNCTION TABLES(1)
B-TO-A (OEB = H)
Inputs
SSOP/ TSSOP
TOP VIEW
2
Output
1Bx
2Bx
SEL
LE1B
LE2B
OEA
Ax
H
X
H
H
X
L
H
L
X
H
H
X
L
L
X
X
H
L
X
L
A0
X
H
L
X
H
L
H
X
L
L
X
H
L
L
X
X
L
X
L
L
A0
X
X
X
X
X
H
Z
(2)
(2)
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
FUNCTION TABLES (CONTINUED)(1)
A-TO-B (OEA = H)
Inputs
Outputs
Ax
LEA1B
LEA2B
OE1B
OE2B
1Bx
2Bx
H
H
H
L
L
H
H
L
H
H
L
L
L
L
H
H
L
L
L
H
2B0
L
H
L
L
L
L
2B0
H
L
H
L
L
1B0
L
L
H
L
L
1B0
(2)
(2)
(2)
H
(2)
L
(2)
(2)
X
L
L
L
L
1B0
2B0
X
X
X
H
H
Z
Z
X
X
X
L
H
Active
Z
X
X
X
H
L
Z
Active
X
X
X
L
L
Active
Active
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High Impedance
2. Output level before the indicated steady-state input conditions were established.
PIN DESCRIPTION
Pin Names
I/O
Description
Ax(1:12)
I/O
Bidirectional Data Port A. Usually connected to the CPU's address/data bus.
1Bx(1:12)
I/O
Bidirectional Data Port 1B. Usually connected to the even path or even bank of memory.
2Bx(1:12)
I/O
Bidirectional Data Port 2B. Usually connected to the odd path or odd bank of memory.
LEA1B
I
Latch Enable Input for A-1B Latch. The latch is open when LEA1B is HIGH. Data from the A-port is latched on the HIGH to LOW
transition of LEA1B.
LEA2B
I
Latch Enable Input for A-2B Latch. The latch is open when LEA2B is HIGH. Data from the A-port is latched on the HIGH to LOW
transition of LEA2B.
LE1B
I
Latch Enable Input for 1B-A Latch. The latch is open when LE1B is HIGH. Data from the A-port is latched on the HIGH to LOW
transition of LE1B.
LE2B
I
Latch Enable Input for 2B-A Latch. The latch is open when LE2B is HIGH. Data from the A-port is latched on the HIGH to LOW
transition of LE2B.
SEL
I
1B or 2B Port Selection. When HIGH, SEL enables data transfer from 1B Port to A Port. When LOW, SEL enables data transfer from
2B Port to A Port.
OEA
I
Output Enable for A Port (Active LOW)
OE1B
I
Output Enable for 1B Port (Active LOW)
OE2B
I
Output Enable for 2B Port (Active LOW)
(1)
(1)
(1)
NOTE:
1. These pins have "Bus-Hold". All other pins are standard inputs, outputs, or I/Os.
3
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Operating Condition: TA = –40°C to +85°C
Symbol
VIH
VIL
Min.
Typ.(1)
Max.
Unit
VCC = 2.3V to 2.7V
1.7
—
—
V
VCC = 2.7V to 3.6V
2
—
—
VCC = 2.3V to 2.7V
—
—
0.7
VCC = 2.7V to 3.6V
—
—
0.8
Parameter
Input HIGH Voltage Level
Input LOW Voltage Level
Test Conditions
V
IIH
Input HIGH Current
VCC = 3.6V
VI = VCC
—
—
±5
µA
IIL
Input LOW Current
VCC = 3.6V
VI = GND
—
—
±5
µA
IOZH
High Impedance Output Current
VCC = 3.6V
VO = VCC
—
—
±10
µA
IOZL
(3-State Output pins)
VO = GND
—
—
±10
VIK
Clamp Diode Voltage
VCC = 2.3V, IIN = –18mA
—
–0.7
–1.2
V
VH
ICCL
ICCH
ICCZ
∆ICC
Input Hysteresis
Quiescent Power Supply Current
VCC = 3.3V
VCC = 3.6V
VIN = GND or VCC
—
—
100
0.1
—
40
mV
µA
Quiescent Power Supply Current
Variation
One input at VCC - 0.6V, other inputs at VCC or GND
—
—
750
µA
Min.
Typ.(2)
Max.
Unit
– 75
—
—
µA
VI = 0.8V
75
—
—
VI = 1.7V
– 45
—
—
45
—
—
—
±500
NOTE:
1. Typical values are at VCC = 3.3V, +25°C ambient.
BUS-HOLD CHARACTERISTICS
Symbol
IBHH
Parameter(1)
Test Conditions
Bus-Hold Input Sustain Current
VCC = 3V
Bus-Hold Input Sustain Current
VCC = 2.3V
Bus-Hold Input Overdrive Current
VCC = 3.6V
VI = 2V
IBHL
IBHH
IBHL
IBHHO
VI = 0.7V
VI = 0 to 3.6V
IBHLO
NOTES:
1. Pins with Bus-Hold are identified in the pin description.
2. Typical values are at VCC = 3.3V, +25°C ambient.
4
—
µA
µA
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
OUTPUT DRIVE CHARACTERISTICS
Symbol
VOH
VOL
Test Conditions(1)
Parameter
Output HIGH Voltage
Output LOW Voltage
Min.
Max.
Unit
V
VCC = 2.3V to 3.6V
IOH = – 0.1mA
VCC – 0.2
—
VCC = 2.3V
IOH = – 6mA
2
—
VCC = 2.3V
IOH = – 12mA
1.7
—
VCC = 2.7V
2.2
—
VCC = 3V
2.4
—
VCC = 3V
IOH = – 24mA
2
—
VCC = 2.3V to 3.6V
IOL = 0.1mA
—
0.2
VCC = 2.3V
IOL = 6mA
—
0.4
IOL = 12mA
—
0.7
VCC = 2.7V
IOL = 12mA
—
0.4
VCC = 3V
IOL = 24mA
—
0.55
V
NOTE:
1. VIH and VIL must be within the min. or max. range shown in the DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE table for the appropriate VCC range.
TA = – 40°C to + 85°C.
OPERATING CHARACTERISTICS, TA = 25°C
Symbol
Parameter
CPD
Power Dissipation Capacitance Outputs enabled
CPD
Power Dissipation Capacitance Outputs disabled
VCC = 2.5V ± 0.2V
VCC = 3.3V ± 0.3V
Test Conditions
Typical
Typical
Unit
CL = 0pF, f = 10Mhz
37
41
pF
4
7
SWITCHING CHARACTERISTICS(1)
VCC = 2.5V ± 0.2V
Symbol
Parameter
VCC = 2.7V
VCC = 3.3V ± 0.3V
Min.
Max.
Min.
Max.
Min.
Max.
Unit
1
5.4
—
5.1
1.2
4.3
ns
1
5.4
—
5.1
1.2
4.3
ns
1
5.6
—
5.2
1
4.4
ns
1
5.6
—
5.2
1
4.4
ns
1
6.9
—
6.6
1.1
5.6
ns
1
6.7
—
6.4
1
5.4
ns
1
5.7
—
5
1.3
4.6
ns
tPLH
Propagation Delay
tPHL
Ax to 1Bx or Ax to 2Bx
tPLH
Propagation Delay
tPHL
1Bx to Ax or 2Bx to Ax
tPLH
Propagation Delay
tPHL
LEXB to Ax
tPLH
Propagation Delay
tPHL
LE1B to 1BX or LEA2B to 2Bx
tPLH
Propagation Delay
tPHL
SEL to Ax
tPZH
Output Enable Time
tPZL
OEA to Ax, OE1B to 1Bx, or OE2B to 2Bx
tPHZ
Output Disable Time
tPLZ
OEA to Ax, OE1B to 1Bx, or OE2B to 2Bx
tSU
Set-up Time, data before LE1B, LE2B, LEA1B, LEA2B
1.4
—
1.1
—
1.1
—
ns
tH
Hold Time, data after LE1B, LE2B, LEA1B, LEA2B
1.6
—
1.9
—
1.5
—
ns
tW
Pulse Width, LE1B, LE2B, LEA1B, or LEA2B HIGH
3.3
—
3.3
—
3.3
—
ns
Output Skew(2)
—
—
—
—
—
500
ps
tSK(O)
NOTES:
1. See TEST CIRCUITS AND WAVEFORMS. TA = – 40°C to + 85°C.
2. Skew between any two outputs of the same package and switching in the same direction.
5
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
TEST CONDITIONS
VCC(1)= 3.3V±0.3V VCC(1)= 2.7V
Symbol
VCC(2)= 2.5V±0.2V
Unit
VLOAD
6
6
2 x Vcc
V
VIH
2.7
2.7
Vcc
V
VT
1.5
1.5
Vcc / 2
V
VLZ
300
300
150
mV
VHZ
300
300
150
mV
CL
50
50
30
pF
(1, 2)
VIN
tPHL
VIH
VT
0V
ALVC Link
DISABLE
ENABLE
CONTROL
INPUT
GND
tPZL
D.U.T.
OUTPUT
SWITCH
NORMALLY
CLOSED
LOW
tPZH
OUTPUT
SWITCH
NORMALLY
OPEN
HIGH
500Ω
CL
ALVC Link
Test Circuit for All Outputs
tPLH
Propagation Delay
VOUT
RT
tPHL
OPPOSITE PHASE
INPUT TRANSITION
Open
500Ω
tPLH
OUTPUT
VLOAD
VCC
Pulse
Generator
VIH
VT
0V
VOH
VT
VOL
SAME PHASE
INPUT TRANSITION
tPLZ
VLOAD/2
VT
VIH
VT
0V
VLOAD/2
VLZ
VOL
tPHZ
VOH
VHZ
0V
VT
0V
ALVC Link
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Enable and Disable Times
NOTE:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
NOTES:
1. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2ns; tR ≤ 2ns.
DATA
INPUT
SWITCH POSITION
Test
GND
All Other Tests
Open
INPUT
OUTPUT 1
tPLH1
SYNCHRONOUS
CONTROL
VIH
VT
0V
VOH
VT
VOL
tSK (x)
OUTPUT 2
LOW-HIGH-LOW
PULSE
VT
tW
HIGH-LOW-HIGH
PULSE
VT
ALVC Link
tPHL2
Pulse Width
tSK(x) = tPLH2 - tPLH1 or tPHL2 - tPHL1
Output Skew - tSK(X)
tH
Set-up, Hold, and Release Times
VOH
VT
VOL
tPLH2
tSU
ALVC Link
tPHL1
tSK (x)
tREM
ASYNCHRONOUS
CONTROL
VLOAD
Disable High
Enable High
tH
TIMING
INPUT
Switch
Open Drain
Disable Low
Enable Low
tSU
VIH
VT
0V
VIH
VT
0V
VIH
VT
0V
VIH
VT
0V
ALVC Link
NOTES:
1. For tSK(o) OUTPUT1 and OUTPUT2 are any two outputs.
2. For tSK(b) OUTPUT1 and OUTPUT2 are in the same bank.
6
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
ALVC X
XX
Bus-Hold
Temp. Range
XX
Family
XX
XXX
Device Type Package
CORPORATE HEADQUARTERS
2975 Stender Way
Santa Clara, CA 95054
PV
PA
Shrink Small Outline Package
Thin Shrink Small Outline Package
260
12-Bit to 24-Bit Multiplexed D-Type Latch with 3-State
Outputs
16
Double-Density, ±24mA
H
Bus-Hold
74
–40°C to +85°C
for SALES:
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
7
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