TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Products contained in this shipment may be subject to ITAR regulations. Warning: The export of these commodity(ies), technology, or software are subject either to the U.S. Commerce Department Export Administration Regulations (E.A.R.), or to the U.S. State Department International Traffic In Arms Regulations (I.T.A.R.). Diversion, the shipment to unauthorized locations or entities, or the disclosure of related technical data or software to unauthorized foreign nationals is contrary to U.S. law and is prohibited. If export is authorized to a specific country or end-users, compliance with the U.S. export laws is required prior to transfer, transshipment on a non-continuous voyage, or disposal in any other country, or to any other end-user of these commodities, either in their original form or after being incorporated into other end-items. An ISO 9001:2008 and DLA Certified Company 1 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1499MW Quad Rail-toRail Input and Output Precision C-Load Op Amp for Linear Technology Customer: Linear Technology, PO# 71604L RAD Job Number: 15-0020 Part Type Tested: RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp, RH1499M Datasheet ID No. 66-10-1499 Revision F Traceability Information: Fab Lot Number: W1046927.1, Assembly Lot Number: 737077.1, Wafer Number: 16, Date Code: 1347A. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 units for control. Serial numbers 543, 544, 545, 546 and 547 were biased during irradiation, serial numbers 548, 549, 550, 560 and 561 were unbiased during irradiation and serial numbers 562 and 563 were used as control. See Appendix B for the radiation bias connection table. Radiation and Electrical Test Increments: 50rad(Si)/s ionizing radiation with electrical test increments: pre-irradiation, 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si). Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. Radiation Test Standard: MIL-STD-750 TM1019 and/or MIL-STD-883 TM1019 Condition A and Linear Technology RH1499M Datasheet ID No. 66-10-1499 Revision F. Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 4/30/2014, Calibration Due: 4/30/2015. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture, Entity ID TF03. BGSS-061114 RH1499 DUT Board. Test Program: RH1499Z.SRC Facility and Radiation Source: Aeroflex RAD's, Colorado Springs, CO. Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization Chamber (AIC) traceable to NIST. Aeroflex RAD's dosimetry has been audited by DLA and Aeroflex RAD has been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MIL-STD-750. RLAT Test Result: PASSED the total ionizing dose test to the 200krad(Si) dose level PASSED following 24-hour room temperature anneal PASSED following 168-hour 100°C anneal An ISO 9001:2008 and DLA Certified Company 2 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883H TM1019 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883H TM1019 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Aeroflex RAD Longmire Laboratories using air ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at Aeroflex RAD's Longmire Laboratory facility. Aeroflex RAD is currently certified by the Defense Supply Center Columbus (DLA) for Laboratory Suitability under MIL STD 750 and MIL-STD-883H. Additional details regarding Aeroflex RAD dosimetry for TM1019 Condition A testing are available in Aeroflex RAD's report to DLA entitled: "Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices". An ISO 9001:2008 and DLA Certified Company 3 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Aeroflex RAD's high dose rate Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 300rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DLA Certified Company 4 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp described in this final report were irradiated using a single-sided supply potential of 5V and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the requirements of MIL-STD-883H TM1019 Section 3.9.3 Bias and Loading Conditions which states "The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias." The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted." The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total dose irradiations. The final dose rate for this work was 54.9rad(Si)/s with a precision of ±5%. An ISO 9001:2008 and DLA Certified Company 5 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the total ionizing dose characterization testing the following electrical parameters were measured pre- and post-irradiation: 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 12. 13. 14. 15. 16. 17. 18. 19. 20. 21. 22. 23. 24. 25. 26. 27. 28. 29. 30. 31. 32. 33. 34. 35. 36. 37. 38. 39. 40. 41. +Supply Current 15V (A) @ VS=+/-15V -Supply Current 15V (A) @ VS=+/-15V Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_3 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_4 15V (V) @ VS=+/-15V, VCM=0V Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_3 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_4 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_3 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_4 15V (V) @ VS=+/-15V, VCM=15V Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_3 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_4 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_3 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_4 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V Input Offset Current3_3 15V (A) @ VS=+/-15V, VCM=-15V An ISO 9001:2008 and DLA Certified Company 6 TID Report 15-0020 03/10/15 R1.1 42. 43. 44. 45. 46. 47. 48. 49. 50. 51. 52. 53. 54. 55. 56. 57. 58. 59. 60. 61. 62. 63. 64. 65. 66. 67. 68. 69. 70. 71. 72. 73. 74. 75. 76. 77. 78. 79. 80. 81. 82. 83. 84. 85. 86. 87. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current3_4 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V Output Voltage Swing High1_1 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_2 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_3 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_4 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High2_1 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_2 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_3 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_4 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High3_1 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_2 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_3 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_4 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_3 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_4 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_3 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_4 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_3 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_4 15V (V) @ VS=+/-15V IL=10mA Large Signal Voltage Gain1_1 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_2 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_3 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_4 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain2_1 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_2 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_3 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_4 15V (V/mV) @ VO=+/-10V, RL=2kΩ Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_3 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_4 15V (dB) @ VS=+/-15V, VCM=+/-15V CMRR Match1 1 to 4 15V (dB) @ VS=+/-15V, VCM=+/-15V An ISO 9001:2008 and DLA Certified Company 7 TID Report 15-0020 03/10/15 R1.1 88. 89. 90. 91. 92. 93. 94. 95. 96. 97. 98. 99. 100. 101. 102. 103. 104. 105. 106. 107. 108. 109. 110. 111. 112. 113. 114. 115. 116. 117. 118. 119. 120. 121. 122. 123. 124. 125. 126. 127. 128. 129. 130. 131. 132. 133. CMRR Match1 2 to 3 15V (dB) @ VS=+/-15V, VCM=+/-15V Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection_Ratio1_3 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection Ratio1_4 (dB) @ VS=+/-2V to +/-16V PSRR Match1 1 to 4 (dB) @ VS=+/-2V to +/-16V PSRR Match1 2 to 3 (dB) @ VS=+/-2V to +/-16V +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V Gain-Bandwidth Product_1 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_2 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_3 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_4 15V (MHz) @ VS=+/-15V, f=100kHz +Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Supply Current 5V (A) @ VS=+5V -Supply Current 5V (A) @ VS=+5V Input Offset Voltage4_1 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_2 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_3 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_4 5V (V) @ VS=+5V, VCM=0V Input Offset Current4_1 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_2 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_3 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_4 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V Input Offset Voltage5_1 5V (V) @ VS=+5V, VCM=5V An ISO 9001:2008 and DLA Certified Company 8 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 TID Report 15-0020 03/10/15 R1.1 134. 135. 136. 137. 138. 139. 140. 141. 142. 143. 144. 145. 146. 147. 148. 149. 150. 151. 152. 153. 154. 155. 156. 157. 158. 159. 160. 161. 162. 163. 164. 165. 166. 167. 168. 169. 170. 171. 172. 173. 174. 175. 176. 177. 178. 179. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage5_2 5V (V) @ VS=+5V, VCM=5V Input Offset Voltage5_3 5V (V) @ VS=+5V, VCM=5V Input Offset Voltage5_4 5V (V) @ VS=+5V, VCM=5V Input Offset Current5_1 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_2 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_3 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_4 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V Output Voltage Swing High4_1 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_2 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_3 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_4 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High5_1 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_2 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_3 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_4 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High6_1 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_2 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_3 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_4 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low4_1 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_2 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_3 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_4 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low5_1 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low5_2 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low5_3 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low5_4 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low6_1 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_2 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_3 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_4 5V (V) @ VS=+5V IL=2.5mA Large Signal Voltage Gain3_1 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_2 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_3 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_4 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Common Mode Rejection Ratio2_1 5V (dB) @ VS=+5V, VCM=0 to +5V Common Mode Rejection Ratio2_2 5V (dB) @ VS=+5V, VCM=0 to +5V Common Mode Rejection Ratio2_3 5V (dB) @ VS=+5V, VCM=0 to +5V An ISO 9001:2008 and DLA Certified Company 9 TID Report 15-0020 03/10/15 R1.1 180. 181. 182. 183. 184. 185. 186. 187. 188. 189. 190. 191. 192. 193. 194. 195. 196. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio2_4 5V (dB) @ VS=+5V, VCM=0 to +5V CMRR Match2 1 to 4 5V (dB) @ VS=+5V, VCM=0 to +5V CMRR Match2 2 to 3 5V (dB) @ VS=+5V, VCM=0 to +5V Power Supply Rejection Ratio2_1 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_2 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_3 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_4 (dB) @ VS=+4.5V to +12V PSRR Match2 1 to 4 (dB) @ VS=+4.5V to +12V PSRR Match2 2 to 3 (dB) @ VS=+4.5V to +12V +Short-Circuit Current2_1 5V (A) @ VS=+5V +Short-Circuit Current2_2 5V (A) @ VS=+5V +Short-Circuit Current2_3 5V (A) @ VS=+5V +Short-Circuit Current2_4 5V (A) @ VS=+5V -Short-Circuit Current2_1 5V (A) @ VS=+5V -Short-Circuit Current2_2 5V (A) @ VS=+5V -Short-Circuit Current2_3 5V (A) @ VS=+5V -Short-Circuit Current2_4 5V (A) @ VS=+5V Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet specification limits, then the lot could be logged as a failure. An ISO 9001:2008 and DLA Certified Company 10 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results Based on this criterion the RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp (from the lot traceability information provided on the first page of this test report) the units-under-test: PASSED the total ionizing dose test to the 200krad(Si) dose level PASSED following 24-hour room temperature anneal PASSED following 168-hour 100°C anneal Figures 5.1 through 5.196 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 - 5.196 show the corresponding raw data for each of these parameters. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained in control throughout the duration of the tests and the observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section to facilitate the location of a particular parameter. An ISO 9001:2008 and DLA Certified Company 11 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.1. Plot of +Supply Current 15V (A) @ VS=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 12 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.1. Raw data for +Supply Current 15V (A) @ VS=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Supply Current 15V (A) @ VS=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 7.90E-03 7.81E-03 7.83E-03 7.80E-03 7.71E-03 7.79E-03 7.65E-03 7.90E-03 7.84E-03 7.61E-03 7.81E-03 7.82E-03 Biased Statistics Average Biased 7.81E-03 Std Dev Biased 6.88E-05 Ps90%/90% (+KTL) Biased 8.00E-03 Ps90%/90% (-KTL) Biased 7.62E-03 Un-Biased Statistics Average Un-Biased 7.76E-03 Std Dev Un-Biased 1.21E-04 Ps90%/90% (+KTL) Un-Biased 8.09E-03 Ps90%/90% (-KTL) Un-Biased 7.42E-03 Specification MAX 1.00E-02 Status PASS 200 7.58E-03 7.48E-03 7.50E-03 7.47E-03 7.36E-03 7.51E-03 7.38E-03 7.63E-03 7.59E-03 7.35E-03 7.78E-03 7.79E-03 24-hr Anneal 225 7.64E-03 7.53E-03 7.55E-03 7.51E-03 7.40E-03 7.56E-03 7.43E-03 7.67E-03 7.62E-03 7.37E-03 7.78E-03 7.80E-03 168-hr Anneal 250 7.70E-03 7.62E-03 7.64E-03 7.61E-03 7.51E-03 7.66E-03 7.52E-03 7.77E-03 7.70E-03 7.47E-03 7.78E-03 7.79E-03 7.60E-03 1.29E-04 7.95E-03 7.25E-03 7.48E-03 7.64E-05 7.69E-03 7.27E-03 7.53E-03 8.68E-05 7.76E-03 7.29E-03 7.61E-03 7.18E-05 7.81E-03 7.42E-03 7.59E-03 1.23E-04 7.93E-03 7.26E-03 1.00E-02 PASS 7.49E-03 1.24E-04 7.83E-03 7.15E-03 1.00E-02 PASS 7.53E-03 1.25E-04 7.87E-03 7.19E-03 1.00E-02 PASS 7.62E-03 1.25E-04 7.96E-03 7.28E-03 1.00E-02 PASS Total 20 7.78E-03 7.68E-03 7.70E-03 7.66E-03 7.57E-03 7.72E-03 7.57E-03 7.83E-03 7.76E-03 7.54E-03 7.79E-03 7.80E-03 Dose (krad(Si)) 50 100 7.76E-03 7.66E-03 7.60E-03 7.78E-03 7.63E-03 7.59E-03 7.61E-03 7.55E-03 7.50E-03 7.44E-03 7.66E-03 7.62E-03 7.53E-03 7.49E-03 7.78E-03 7.72E-03 7.72E-03 7.70E-03 7.49E-03 7.45E-03 7.80E-03 7.80E-03 7.80E-03 7.82E-03 7.68E-03 7.58E-05 7.89E-03 7.47E-03 7.62E-03 9.14E-05 7.87E-03 7.37E-03 7.69E-03 1.23E-04 8.02E-03 7.35E-03 1.00E-02 PASS 7.63E-03 1.22E-04 7.97E-03 7.30E-03 1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 13 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.2. Plot of -Supply Current 15V (A) @ VS=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 14 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.2. Raw data for -Supply Current 15V (A) @ VS=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Supply Current 15V (A) @ VS=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 -7.92E-03 -7.83E-03 -7.84E-03 -7.82E-03 -7.73E-03 -7.81E-03 -7.68E-03 -7.92E-03 -7.86E-03 -7.63E-03 -7.83E-03 -7.84E-03 Biased Statistics Average Biased -7.83E-03 Std Dev Biased 6.83E-05 Ps90%/90% (+KTL) Biased -7.64E-03 Ps90%/90% (-KTL) Biased -8.02E-03 Un-Biased Statistics Average Un-Biased -7.78E-03 Std Dev Un-Biased 1.22E-04 Ps90%/90% (+KTL) Un-Biased -7.44E-03 Ps90%/90% (-KTL) Un-Biased -8.11E-03 Specification MIN -1.00E-02 Status PASS 200 -7.60E-03 -7.50E-03 -7.51E-03 -7.49E-03 -7.38E-03 -7.53E-03 -7.40E-03 -7.65E-03 -7.61E-03 -7.37E-03 -7.80E-03 -7.82E-03 24-hr Anneal 225 -7.66E-03 -7.55E-03 -7.57E-03 -7.53E-03 -7.42E-03 -7.58E-03 -7.45E-03 -7.69E-03 -7.64E-03 -7.39E-03 -7.81E-03 -7.82E-03 168-hr Anneal 250 -7.72E-03 -7.64E-03 -7.66E-03 -7.62E-03 -7.52E-03 -7.68E-03 -7.54E-03 -7.79E-03 -7.72E-03 -7.49E-03 -7.80E-03 -7.81E-03 -7.62E-03 1.28E-04 -7.27E-03 -7.97E-03 -7.50E-03 7.67E-05 -7.29E-03 -7.71E-03 -7.54E-03 8.69E-05 -7.31E-03 -7.78E-03 -7.63E-03 7.11E-05 -7.44E-03 -7.83E-03 -7.61E-03 1.24E-04 -7.27E-03 -7.96E-03 -1.00E-02 PASS -7.51E-03 1.25E-04 -7.17E-03 -7.85E-03 -1.00E-02 PASS -7.55E-03 1.25E-04 -7.21E-03 -7.89E-03 -1.00E-02 PASS -7.64E-03 1.24E-04 -7.30E-03 -7.98E-03 -1.00E-02 PASS Total 20 -7.80E-03 -7.70E-03 -7.72E-03 -7.68E-03 -7.59E-03 -7.74E-03 -7.60E-03 -7.85E-03 -7.78E-03 -7.56E-03 -7.81E-03 -7.82E-03 Dose (krad(Si)) 50 100 -7.78E-03 -7.68E-03 -7.62E-03 -7.80E-03 -7.65E-03 -7.61E-03 -7.63E-03 -7.57E-03 -7.52E-03 -7.45E-03 -7.68E-03 -7.64E-03 -7.55E-03 -7.51E-03 -7.80E-03 -7.74E-03 -7.74E-03 -7.72E-03 -7.51E-03 -7.46E-03 -7.82E-03 -7.82E-03 -7.81E-03 -7.84E-03 -7.70E-03 7.60E-05 -7.49E-03 -7.90E-03 -7.64E-03 9.22E-05 -7.39E-03 -7.89E-03 -7.71E-03 1.23E-04 -7.37E-03 -8.04E-03 -1.00E-02 PASS -7.66E-03 1.21E-04 -7.32E-03 -7.99E-03 -1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 15 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.3. Plot of Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 16 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.3. Raw data for Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.58E-04 -7.64E-05 -1.17E-04 3.13E-06 1.26E-04 1.08E-04 -1.65E-04 -5.80E-05 -1.69E-04 3.86E-05 -9.79E-05 -2.47E-04 24-hr Anneal 225 3.53E-04 -8.64E-05 -1.04E-04 -6.88E-06 1.14E-04 1.13E-04 -1.75E-04 -7.15E-05 -1.74E-04 3.92E-05 -9.61E-05 -2.44E-04 168-hr Anneal 250 3.25E-04 -9.56E-05 -1.23E-04 -3.39E-05 6.98E-05 1.23E-04 -2.12E-04 -4.14E-05 -1.71E-04 3.85E-05 -9.77E-05 -2.47E-04 5.69E-05 1.82E-04 5.56E-04 -4.42E-04 5.88E-05 1.91E-04 5.84E-04 -4.66E-04 5.38E-05 1.88E-04 5.69E-04 -4.61E-04 2.83E-05 1.82E-04 5.26E-04 -4.70E-04 -4.14E-05 1.30E-04 3.16E-04 -3.98E-04 -9.50E-04 PASS 9.50E-04 PASS -4.92E-05 1.23E-04 2.88E-04 -3.86E-04 -9.50E-04 PASS 9.50E-04 PASS -5.39E-05 1.28E-04 2.98E-04 -4.06E-04 -9.50E-04 PASS 9.50E-04 PASS -5.27E-05 1.40E-04 3.32E-04 -4.37E-04 -9.50E-04 PASS 9.50E-04 PASS 0 3.42E-04 -8.40E-05 -8.48E-05 -1.30E-05 1.10E-04 1.88E-04 -1.26E-04 -2.02E-05 -1.39E-04 8.89E-05 -9.61E-05 -2.44E-04 Total 20 3.36E-04 -8.78E-05 -9.71E-05 -1.81E-05 1.07E-04 1.61E-04 -1.46E-04 -3.83E-05 -1.56E-04 6.79E-05 -9.61E-05 -2.47E-04 Dose (krad(Si)) 50 100 3.45E-04 3.46E-04 -8.39E-05 -7.04E-05 -1.01E-04 -1.03E-04 -1.12E-05 -4.80E-06 1.02E-04 1.17E-04 1.43E-04 1.30E-04 -1.58E-04 -1.70E-04 -4.84E-05 -4.91E-05 -1.60E-04 -1.62E-04 5.69E-05 4.36E-05 -9.52E-05 -9.55E-05 -2.47E-04 -2.44E-04 5.40E-05 1.79E-04 5.46E-04 -4.38E-04 4.81E-05 1.81E-04 5.43E-04 -4.47E-04 5.03E-05 1.83E-04 5.53E-04 -4.52E-04 -1.79E-06 1.40E-04 3.83E-04 -3.87E-04 -8.00E-04 PASS 8.00E-04 PASS -2.23E-05 1.37E-04 3.53E-04 -3.98E-04 -9.50E-04 PASS 9.50E-04 PASS -3.33E-05 1.33E-04 3.32E-04 -3.98E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 17 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.4. Plot of Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 18 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.4. Raw data for Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.68E-04 -2.02E-05 -8.78E-06 2.24E-04 -1.68E-04 6.62E-05 -2.43E-04 1.40E-05 -3.50E-04 -3.00E-04 -1.51E-04 4.63E-05 24-hr Anneal 225 1.63E-04 -2.20E-05 -5.73E-06 2.30E-04 -1.69E-04 6.01E-05 -2.48E-04 1.48E-05 -3.51E-04 -3.11E-04 -1.52E-04 4.54E-05 168-hr Anneal 250 1.20E-04 -4.18E-05 -1.75E-05 2.21E-04 -1.48E-04 9.75E-05 -2.51E-04 8.47E-06 -3.34E-04 -3.05E-04 -1.52E-04 4.41E-05 8.45E-06 1.39E-04 3.89E-04 -3.72E-04 3.91E-05 1.58E-04 4.72E-04 -3.94E-04 3.93E-05 1.59E-04 4.75E-04 -3.96E-04 2.69E-05 1.45E-04 4.24E-04 -3.70E-04 -1.55E-04 1.92E-04 3.73E-04 -6.82E-04 -9.50E-04 PASS 9.50E-04 PASS -1.62E-04 1.90E-04 3.57E-04 -6.82E-04 -9.50E-04 PASS 9.50E-04 PASS -1.67E-04 1.91E-04 3.57E-04 -6.91E-04 -9.50E-04 PASS 9.50E-04 PASS -1.57E-04 1.96E-04 3.82E-04 -6.95E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.43E-04 -3.22E-06 8.80E-06 2.25E-04 -1.30E-04 1.09E-04 -2.06E-04 7.61E-05 -2.96E-04 -2.67E-04 -1.51E-04 4.63E-05 Total 20 1.46E-04 -1.52E-05 -4.69E-06 2.15E-04 -1.50E-04 9.38E-05 -2.23E-04 5.16E-05 -3.17E-04 -2.87E-04 -1.51E-04 4.59E-05 Dose (krad(Si)) 50 100 1.56E-04 -3.74E-07 -1.81E-05 -1.32E-05 -5.85E-06 -7.14E-06 2.18E-04 2.26E-04 -1.58E-04 -1.63E-04 8.54E-05 7.56E-05 -2.35E-04 -2.39E-04 3.54E-05 2.69E-05 -3.29E-04 -3.41E-04 -2.93E-04 -2.97E-04 -1.51E-04 -1.50E-04 4.60E-05 4.57E-05 4.89E-05 1.38E-04 4.27E-04 -3.29E-04 3.85E-05 1.44E-04 4.34E-04 -3.57E-04 3.86E-05 1.50E-04 4.50E-04 -3.72E-04 -1.17E-04 1.94E-04 4.16E-04 -6.49E-04 -8.00E-04 PASS 8.00E-04 PASS -1.36E-04 1.94E-04 3.97E-04 -6.69E-04 -9.50E-04 PASS 9.50E-04 PASS -1.47E-04 1.93E-04 3.83E-04 -6.77E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 19 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.5. Plot of Input Offset Voltage1_3 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 20 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.5. Raw data for Input Offset Voltage1_3 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage1_3 15V (V) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -3.70E-04 -1.32E-04 -2.23E-04 -6.57E-05 -1.65E-04 1.50E-04 1.15E-04 -3.01E-04 -8.09E-05 -5.75E-05 8.68E-05 -6.99E-05 24-hr Anneal 225 -3.70E-04 -1.39E-04 -2.25E-04 -7.29E-05 -1.69E-04 1.49E-04 1.08E-04 -3.07E-04 -8.47E-05 -6.20E-05 8.55E-05 -6.93E-05 168-hr Anneal 250 -3.87E-04 -1.61E-04 -2.39E-04 -1.27E-04 -1.71E-04 1.64E-04 1.17E-04 -2.96E-04 -1.01E-04 -4.11E-05 8.42E-05 -7.10E-05 -1.94E-04 1.15E-04 1.21E-04 -5.09E-04 -1.91E-04 1.15E-04 1.24E-04 -5.07E-04 -1.95E-04 1.12E-04 1.12E-04 -5.02E-04 -2.17E-04 1.03E-04 6.58E-05 -5.00E-04 -2.52E-05 1.82E-04 4.74E-04 -5.24E-04 -9.50E-04 PASS 9.50E-04 PASS -3.49E-05 1.81E-04 4.60E-04 -5.30E-04 -9.50E-04 PASS 9.50E-04 PASS -3.93E-05 1.81E-04 4.58E-04 -5.36E-04 -9.50E-04 PASS 9.50E-04 PASS -3.14E-05 1.84E-04 4.72E-04 -5.35E-04 -9.50E-04 PASS 9.50E-04 PASS 0 -3.53E-04 -1.35E-04 -2.23E-04 -4.87E-05 -1.62E-04 2.16E-04 1.74E-04 -2.64E-04 -3.96E-05 3.55E-06 8.86E-05 -6.83E-05 Total 20 -3.68E-04 -1.43E-04 -2.33E-04 -6.39E-05 -1.77E-04 1.87E-04 1.45E-04 -2.79E-04 -6.09E-05 -1.71E-05 8.67E-05 -6.92E-05 Dose (krad(Si)) 50 100 -3.67E-04 -3.72E-04 -1.39E-04 -1.33E-04 -2.29E-04 -2.28E-04 -6.66E-05 -6.92E-05 -1.72E-04 -1.68E-04 1.71E-04 1.59E-04 1.30E-04 1.24E-04 -2.91E-04 -2.97E-04 -7.07E-05 -7.45E-05 -3.09E-05 -3.71E-05 8.72E-05 8.82E-05 -6.93E-05 -6.94E-05 -1.84E-04 1.13E-04 1.26E-04 -4.95E-04 -1.97E-04 1.14E-04 1.15E-04 -5.09E-04 -1.95E-04 1.13E-04 1.14E-04 -5.03E-04 1.80E-05 1.92E-04 5.43E-04 -5.07E-04 -8.00E-04 PASS 8.00E-04 PASS -5.01E-06 1.86E-04 5.04E-04 -5.14E-04 -9.50E-04 PASS 9.50E-04 PASS -1.84E-05 1.84E-04 4.85E-04 -5.22E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 21 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.6. Plot of Input Offset Voltage1_4 15V (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 22 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.6. Raw data for Input Offset Voltage1_4 15V (V) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage1_4 15V (V) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.33E-04 7.41E-05 -2.36E-04 -2.08E-05 -1.77E-04 1.56E-04 3.58E-06 -1.70E-04 1.16E-04 4.19E-06 -2.11E-04 -1.74E-04 24-hr Anneal 225 1.33E-04 7.21E-05 -2.34E-04 -1.89E-05 -1.83E-04 1.45E-04 -5.70E-07 -1.74E-04 1.09E-04 -4.08E-06 -2.11E-04 -1.74E-04 168-hr Anneal 250 1.28E-04 2.94E-05 -2.45E-04 -3.24E-05 -2.04E-04 1.14E-04 -1.74E-05 -1.61E-04 7.21E-05 7.60E-07 -2.12E-04 -1.74E-04 -3.97E-05 1.58E-04 3.93E-04 -4.72E-04 -4.52E-05 1.58E-04 3.89E-04 -4.79E-04 -4.60E-05 1.59E-04 3.89E-04 -4.81E-04 -6.48E-05 1.57E-04 3.66E-04 -4.95E-04 3.21E-05 1.25E-04 3.75E-04 -3.11E-04 -9.50E-04 PASS 9.50E-04 PASS 2.19E-05 1.27E-04 3.70E-04 -3.26E-04 -9.50E-04 PASS 9.50E-04 PASS 1.51E-05 1.24E-04 3.56E-04 -3.26E-04 -9.50E-04 PASS 9.50E-04 PASS 1.72E-06 1.06E-04 2.91E-04 -2.88E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.39E-04 8.84E-05 -1.99E-04 2.02E-06 -1.60E-04 1.85E-04 6.82E-05 -9.79E-05 1.60E-04 5.82E-05 -2.10E-04 -1.74E-04 Total 20 1.25E-04 7.53E-05 -2.21E-04 -9.84E-06 -1.73E-04 1.62E-04 4.14E-05 -1.25E-04 1.38E-04 3.32E-05 -2.11E-04 -1.74E-04 Dose (krad(Si)) 50 100 1.33E-04 1.28E-04 7.23E-05 9.11E-05 -2.22E-04 -2.26E-04 -2.12E-05 -1.47E-05 -1.74E-04 -1.78E-04 1.62E-04 1.63E-04 2.59E-05 1.91E-05 -1.45E-04 -1.60E-04 1.23E-04 1.22E-04 2.08E-05 1.70E-05 -2.10E-04 -2.10E-04 -1.74E-04 -1.73E-04 -2.59E-05 1.49E-04 3.83E-04 -4.35E-04 -4.07E-05 1.52E-04 3.75E-04 -4.56E-04 -4.25E-05 1.53E-04 3.78E-04 -4.63E-04 7.46E-05 1.11E-04 3.79E-04 -2.30E-04 -8.00E-04 PASS 8.00E-04 PASS 4.99E-05 1.13E-04 3.61E-04 -2.61E-04 -9.50E-04 PASS 9.50E-04 PASS 3.72E-05 1.19E-04 3.63E-04 -2.88E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 23 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.7. Plot of Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 24 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.7. Raw data for Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 5.35E-09 3.02E-09 6.00E-11 4.17E-09 4.68E-09 3.18E-09 -3.22E-09 1.79E-09 1.46E-09 6.80E-09 -2.70E-09 -9.43E-09 24-hr Anneal 225 2.37E-09 6.40E-10 -1.66E-09 1.20E-09 2.08E-09 -4.00E-11 -5.33E-09 7.70E-10 -9.10E-10 4.22E-09 -2.76E-09 -9.48E-09 168-hr Anneal 250 2.27E-09 6.10E-10 1.12E-09 1.53E-09 3.22E-09 1.96E-09 -4.46E-09 2.23E-09 9.60E-10 4.05E-09 -2.91E-09 -9.56E-09 1.48E-09 2.26E-09 7.69E-09 -4.73E-09 3.46E-09 2.08E-09 9.16E-09 -2.25E-09 9.26E-10 1.60E-09 5.32E-09 -3.47E-09 1.75E-09 1.02E-09 4.55E-09 -1.05E-09 1.62E-09 4.23E-09 1.32E-08 -9.99E-09 -1.00E-07 PASS 1.00E-07 PASS 2.00E-09 3.61E-09 1.19E-08 -7.89E-09 -1.00E-07 PASS 1.00E-07 PASS -2.58E-10 3.44E-09 9.17E-09 -9.69E-09 -1.00E-07 PASS 1.00E-07 PASS 9.48E-10 3.22E-09 9.78E-09 -7.89E-09 -1.00E-07 PASS 1.00E-07 PASS 0 1.79E-09 6.10E-10 1.27E-09 1.20E-09 3.00E-09 1.82E-09 -4.40E-09 2.43E-09 1.98E-09 4.16E-09 -2.16E-09 -9.26E-09 Total 20 2.23E-09 8.60E-10 8.50E-10 1.74E-09 2.99E-09 1.77E-09 -4.12E-09 1.85E-09 1.37E-09 4.73E-09 -2.29E-09 -9.28E-09 Dose (krad(Si)) 50 100 2.37E-09 -7.00E-10 1.59E-09 -4.00E-10 3.60E-10 7.60E-10 2.51E-09 3.49E-09 2.59E-09 4.25E-09 3.15E-09 3.01E-09 -3.98E-09 -5.44E-09 2.29E-09 2.87E-09 8.80E-10 1.74E-09 5.62E-09 5.90E-09 -2.42E-09 -2.53E-09 -9.34E-09 -9.29E-09 1.57E-09 9.00E-10 4.04E-09 -8.94E-10 1.73E-09 9.18E-10 4.25E-09 -7.82E-10 1.88E-09 9.40E-10 4.46E-09 -6.94E-10 1.20E-09 3.26E-09 1.01E-08 -7.75E-09 -7.00E-08 PASS 7.00E-08 PASS 1.12E-09 3.22E-09 9.95E-09 -7.71E-09 -1.00E-07 PASS 1.00E-07 PASS 1.59E-09 3.56E-09 1.14E-08 -8.17E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 25 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.8. Plot of Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 26 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.8. Raw data for Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 7.00E-09 9.70E-10 -6.60E-10 8.33E-09 -3.06E-09 1.53E-09 -3.80E-10 4.93E-09 -4.05E-09 -3.03E-09 2.90E-10 -2.89E-09 24-hr Anneal 225 5.78E-09 -4.60E-10 -2.27E-09 6.53E-09 -2.95E-09 -5.80E-10 -3.26E-09 2.34E-09 -6.51E-09 -6.68E-09 1.50E-10 -2.83E-09 168-hr Anneal 250 6.01E-09 2.27E-09 5.80E-10 6.85E-09 7.00E-11 2.61E-09 -3.00E-10 3.29E-09 -3.07E-09 -5.26E-09 0.00E+00 -2.87E-09 1.08E-09 4.22E-09 1.27E-08 -1.05E-08 2.52E-09 4.94E-09 1.61E-08 -1.10E-08 1.33E-09 4.51E-09 1.37E-08 -1.10E-08 3.16E-09 3.11E-09 1.17E-08 -5.38E-09 -2.64E-10 3.07E-09 8.16E-09 -8.69E-09 -1.00E-07 PASS 1.00E-07 PASS -2.00E-10 3.61E-09 9.70E-09 -1.01E-08 -1.00E-07 PASS 1.00E-07 PASS -2.94E-09 3.88E-09 7.71E-09 -1.36E-08 -1.00E-07 PASS 1.00E-07 PASS -5.46E-10 3.65E-09 9.47E-09 -1.06E-08 -1.00E-07 PASS 1.00E-07 PASS 0 6.00E-09 3.60E-09 2.19E-09 6.50E-09 1.32E-09 3.24E-09 -8.00E-11 4.08E-09 -7.60E-10 -3.50E-09 1.04E-09 -2.40E-09 Total 20 5.72E-09 2.59E-09 1.06E-09 6.37E-09 -3.00E-10 3.72E-09 -4.00E-10 3.51E-09 -2.05E-09 -4.15E-09 5.70E-10 -2.85E-09 Dose (krad(Si)) 50 100 5.47E-09 1.58E-09 2.08E-09 -2.67E-09 -1.60E-10 2.20E-10 6.44E-09 8.02E-09 -2.40E-10 -1.75E-09 3.81E-09 1.58E-09 -2.70E-10 5.70E-10 3.61E-09 3.41E-09 -2.83E-09 -3.36E-09 -4.88E-09 -3.52E-09 5.10E-10 3.70E-10 -2.79E-09 -2.89E-09 3.92E-09 2.28E-09 1.02E-08 -2.34E-09 3.09E-09 2.90E-09 1.10E-08 -4.85E-09 2.72E-09 3.12E-09 1.13E-08 -5.83E-09 5.96E-10 3.09E-09 9.07E-09 -7.88E-09 -7.00E-08 PASS 7.00E-08 PASS 1.26E-10 3.45E-09 9.59E-09 -9.34E-09 -1.00E-07 PASS 1.00E-07 PASS -1.12E-10 3.85E-09 1.05E-08 -1.07E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 27 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.9. Plot of Input Offset Current1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 28 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.9. Raw data for Input Offset Current1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current1_3 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -7.39E-09 -4.22E-09 -6.20E-10 -4.98E-09 -6.80E-10 7.06E-09 3.32E-09 6.80E-10 1.90E-10 -1.83E-09 -3.00E-11 -3.51E-09 24-hr Anneal 225 -8.72E-09 -4.34E-09 -2.62E-09 -6.18E-09 -1.32E-09 3.67E-09 -4.00E-11 -1.14E-09 -2.41E-09 -4.58E-09 -7.00E-11 -3.60E-09 168-hr Anneal 250 -6.64E-09 -3.08E-09 -2.70E-10 -4.84E-09 3.30E-10 2.20E-09 1.10E-09 1.75E-09 -2.68E-09 -1.78E-09 -1.30E-10 -3.63E-09 -4.72E-09 4.65E-09 8.03E-09 -1.75E-08 -3.58E-09 2.92E-09 4.42E-09 -1.16E-08 -4.64E-09 2.92E-09 3.38E-09 -1.27E-08 -2.90E-09 2.96E-09 5.23E-09 -1.10E-08 1.92E-09 2.96E-09 1.00E-08 -6.19E-09 -1.00E-07 PASS 1.00E-07 PASS 1.88E-09 3.43E-09 1.13E-08 -7.51E-09 -1.00E-07 PASS 1.00E-07 PASS -9.00E-10 3.06E-09 7.50E-09 -9.30E-09 -1.00E-07 PASS 1.00E-07 PASS 1.18E-10 2.20E-09 6.16E-09 -5.92E-09 -1.00E-07 PASS 1.00E-07 PASS 0 -6.19E-09 -2.85E-09 1.20E-10 -3.51E-09 5.90E-10 3.58E-09 1.63E-09 3.14E-09 -1.20E-09 -6.60E-10 8.10E-10 -2.57E-09 Total 20 -7.22E-09 -2.17E-09 -4.30E-10 -4.33E-09 1.70E-10 3.36E-09 1.68E-09 1.89E-09 -1.46E-09 -1.28E-09 3.90E-10 -3.18E-09 Dose (krad(Si)) 50 100 -7.47E-09 -1.18E-08 -1.03E-09 -5.95E-09 -5.20E-10 -1.30E-09 -5.36E-09 -4.64E-09 4.00E-11 9.00E-11 3.75E-09 6.21E-09 2.72E-09 3.35E-09 2.19E-09 1.29E-09 -1.52E-09 1.40E-10 -1.30E-09 -1.39E-09 3.60E-10 1.60E-10 -3.19E-09 -3.35E-09 -2.37E-09 2.79E-09 5.28E-09 -1.00E-08 -2.80E-09 3.03E-09 5.51E-09 -1.11E-08 -2.87E-09 3.34E-09 6.30E-09 -1.20E-08 1.30E-09 2.17E-09 7.24E-09 -4.64E-09 -7.00E-08 PASS 7.00E-08 PASS 8.38E-10 2.12E-09 6.65E-09 -4.97E-09 -1.00E-07 PASS 1.00E-07 PASS 1.17E-09 2.42E-09 7.81E-09 -5.47E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 29 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.10. Plot of Input Offset Current1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 30 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.10. Raw data for Input Offset Current1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current1_4 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 9.60E-10 -2.00E-10 -2.89E-09 3.77E-09 -2.19E-09 2.44E-09 2.16E-09 -5.10E-10 1.72E-09 3.14E-09 -4.20E-10 -4.22E-09 24-hr Anneal 225 7.00E-11 -1.90E-09 -3.80E-09 5.20E-10 -4.22E-09 -3.50E-10 4.90E-10 -2.97E-09 3.50E-10 1.31E-09 -4.60E-10 -4.32E-09 168-hr Anneal 250 2.90E-10 -5.00E-10 -2.40E-09 2.60E-09 -6.00E-10 5.80E-10 3.67E-09 1.80E-09 1.10E-10 1.74E-09 -5.40E-10 -4.41E-09 -1.54E-09 2.62E-09 5.65E-09 -8.74E-09 -1.10E-10 2.66E-09 7.18E-09 -7.40E-09 -1.87E-09 2.16E-09 4.07E-09 -7.80E-09 -1.22E-10 1.81E-09 4.85E-09 -5.09E-09 2.30E-09 1.25E-09 5.73E-09 -1.14E-09 -1.00E-07 PASS 1.00E-07 PASS 1.79E-09 1.39E-09 5.59E-09 -2.01E-09 -1.00E-07 PASS 1.00E-07 PASS -2.34E-10 1.64E-09 4.26E-09 -4.73E-09 -1.00E-07 PASS 1.00E-07 PASS 1.58E-09 1.38E-09 5.36E-09 -2.20E-09 -1.00E-07 PASS 1.00E-07 PASS 0 7.60E-10 9.50E-10 -1.09E-09 2.73E-09 -2.60E-10 1.33E-09 4.24E-09 3.24E-09 5.50E-10 2.51E-09 3.40E-10 -3.23E-09 Total 20 5.80E-10 1.10E-09 -2.16E-09 2.01E-09 1.50E-10 1.45E-09 4.10E-09 2.59E-09 1.10E-10 2.15E-09 -1.00E-10 -3.96E-09 Dose (krad(Si)) 50 100 1.14E-09 -2.56E-09 -4.00E-11 -3.95E-09 -3.54E-09 -3.23E-09 5.70E-10 2.56E-09 -4.60E-10 -5.40E-10 2.80E-09 3.01E-09 3.36E-09 3.73E-09 2.14E-09 5.60E-10 5.00E-11 1.54E-09 1.75E-09 2.64E-09 -1.50E-10 -3.10E-10 -4.04E-09 -4.08E-09 6.18E-10 1.44E-09 4.56E-09 -3.33E-09 3.36E-10 1.56E-09 4.61E-09 -3.94E-09 -4.66E-10 1.82E-09 4.53E-09 -5.46E-09 2.37E-09 1.47E-09 6.41E-09 -1.66E-09 -7.00E-08 PASS 7.00E-08 PASS 2.08E-09 1.47E-09 6.11E-09 -1.95E-09 -1.00E-07 PASS 1.00E-07 PASS 2.02E-09 1.26E-09 5.48E-09 -1.44E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 31 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.11. Plot of +Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 32 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.11. Raw data for +Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.01E-07 -3.95E-07 -4.00E-07 -3.97E-07 -3.96E-07 -4.47E-07 -4.29E-07 -3.69E-07 -3.84E-07 -3.97E-07 -2.94E-07 -3.15E-07 24-hr Anneal 225 -3.70E-07 -3.64E-07 -3.73E-07 -3.68E-07 -3.67E-07 -4.27E-07 -4.12E-07 -3.55E-07 -3.70E-07 -3.86E-07 -2.94E-07 -3.15E-07 168-hr Anneal 250 -3.36E-07 -3.29E-07 -3.33E-07 -3.28E-07 -3.31E-07 -3.68E-07 -3.64E-07 -3.04E-07 -3.19E-07 -3.32E-07 -2.94E-07 -3.15E-07 -3.68E-07 6.23E-09 -3.51E-07 -3.85E-07 -3.98E-07 2.64E-09 -3.90E-07 -4.05E-07 -3.68E-07 3.37E-09 -3.59E-07 -3.78E-07 -3.31E-07 3.37E-09 -3.22E-07 -3.41E-07 -3.65E-07 3.16E-08 -2.78E-07 -4.51E-07 -9.15E-07 PASS 9.15E-07 PASS -4.05E-07 3.20E-08 -3.17E-07 -4.93E-07 -9.65E-07 PASS 9.65E-07 PASS -3.90E-07 2.96E-08 -3.09E-07 -4.71E-07 -9.65E-07 PASS 9.65E-07 PASS -3.37E-07 2.82E-08 -2.60E-07 -4.15E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.14E-07 -3.12E-07 -3.14E-07 -3.07E-07 -3.10E-07 -3.28E-07 -3.25E-07 -2.71E-07 -2.84E-07 -2.99E-07 -2.92E-07 -3.14E-07 Total 20 -3.34E-07 -3.29E-07 -3.34E-07 -3.27E-07 -3.29E-07 -3.53E-07 -3.49E-07 -2.88E-07 -3.02E-07 -3.15E-07 -2.93E-07 -3.15E-07 Dose (krad(Si)) 50 100 -3.51E-07 -3.74E-07 -3.49E-07 -3.59E-07 -3.57E-07 -3.73E-07 -3.49E-07 -3.65E-07 -3.50E-07 -3.70E-07 -3.73E-07 -4.01E-07 -3.66E-07 -3.93E-07 -3.06E-07 -3.30E-07 -3.21E-07 -3.40E-07 -3.32E-07 -3.59E-07 -2.93E-07 -2.93E-07 -3.15E-07 -3.13E-07 -3.11E-07 2.94E-09 -3.03E-07 -3.19E-07 -3.30E-07 3.23E-09 -3.22E-07 -3.39E-07 -3.51E-07 3.21E-09 -3.42E-07 -3.60E-07 -3.02E-07 2.52E-08 -2.32E-07 -3.71E-07 -7.15E-07 PASS 7.15E-07 PASS -3.21E-07 2.87E-08 -2.43E-07 -4.00E-07 -8.15E-07 PASS 8.15E-07 PASS -3.40E-07 2.90E-08 -2.60E-07 -4.19E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 33 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.12. Plot of +Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 34 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.12. Raw data for +Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -3.94E-07 -3.97E-07 -3.97E-07 -3.64E-07 -3.97E-07 -4.00E-07 -4.07E-07 -3.80E-07 -4.00E-07 -4.15E-07 -2.84E-07 -3.00E-07 24-hr Anneal 225 -3.62E-07 -3.70E-07 -3.68E-07 -3.35E-07 -3.68E-07 -3.88E-07 -3.92E-07 -3.66E-07 -3.85E-07 -4.01E-07 -2.84E-07 -2.99E-07 168-hr Anneal 250 -3.26E-07 -3.28E-07 -3.28E-07 -3.03E-07 -3.27E-07 -3.32E-07 -3.39E-07 -3.12E-07 -3.30E-07 -3.51E-07 -2.84E-07 -3.00E-07 -3.60E-07 1.55E-08 -3.17E-07 -4.02E-07 -3.90E-07 1.45E-08 -3.50E-07 -4.30E-07 -3.60E-07 1.48E-08 -3.20E-07 -4.01E-07 -3.22E-07 1.09E-08 -2.93E-07 -3.52E-07 -3.62E-07 1.44E-08 -3.22E-07 -4.01E-07 -9.15E-07 PASS 9.15E-07 PASS -4.01E-07 1.30E-08 -3.65E-07 -4.36E-07 -9.65E-07 PASS 9.65E-07 PASS -3.86E-07 1.28E-08 -3.51E-07 -4.22E-07 -9.65E-07 PASS 9.65E-07 PASS -3.33E-07 1.45E-08 -2.93E-07 -3.73E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.03E-07 -3.09E-07 -3.09E-07 -2.84E-07 -3.06E-07 -2.99E-07 -3.06E-07 -2.77E-07 -2.96E-07 -3.12E-07 -2.82E-07 -2.98E-07 Total 20 -3.24E-07 -3.28E-07 -3.29E-07 -3.02E-07 -3.27E-07 -3.15E-07 -3.24E-07 -2.95E-07 -3.14E-07 -3.29E-07 -2.83E-07 -2.99E-07 Dose (krad(Si)) 50 100 -3.40E-07 -3.67E-07 -3.50E-07 -3.62E-07 -3.51E-07 -3.70E-07 -3.16E-07 -3.33E-07 -3.48E-07 -3.68E-07 -3.34E-07 -3.64E-07 -3.47E-07 -3.72E-07 -3.14E-07 -3.39E-07 -3.33E-07 -3.59E-07 -3.53E-07 -3.75E-07 -2.83E-07 -2.83E-07 -3.00E-07 -2.99E-07 -3.02E-07 1.03E-08 -2.74E-07 -3.31E-07 -3.22E-07 1.15E-08 -2.90E-07 -3.54E-07 -3.41E-07 1.46E-08 -3.01E-07 -3.81E-07 -2.98E-07 1.35E-08 -2.61E-07 -3.35E-07 -7.15E-07 PASS 7.15E-07 PASS -3.15E-07 1.30E-08 -2.80E-07 -3.51E-07 -8.15E-07 PASS 8.15E-07 PASS -3.36E-07 1.50E-08 -2.95E-07 -3.78E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 35 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.13. Plot of +Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 36 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.13. Raw data for +Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -3.94E-07 -3.97E-07 -3.95E-07 -3.88E-07 -3.88E-07 -4.04E-07 -4.03E-07 -3.79E-07 -3.99E-07 -4.21E-07 -2.81E-07 -3.00E-07 24-hr Anneal 225 -3.65E-07 -3.69E-07 -3.68E-07 -3.58E-07 -3.60E-07 -3.88E-07 -3.91E-07 -3.65E-07 -3.85E-07 -4.07E-07 -2.81E-07 -3.00E-07 168-hr Anneal 250 -3.30E-07 -3.32E-07 -3.30E-07 -3.17E-07 -3.24E-07 -3.33E-07 -3.37E-07 -3.13E-07 -3.33E-07 -3.56E-07 -2.82E-07 -3.01E-07 -3.64E-07 5.53E-09 -3.49E-07 -3.79E-07 -3.93E-07 4.31E-09 -3.81E-07 -4.04E-07 -3.64E-07 4.85E-09 -3.51E-07 -3.77E-07 -3.27E-07 6.23E-09 -3.09E-07 -3.44E-07 -3.63E-07 1.55E-08 -3.20E-07 -4.05E-07 -9.15E-07 PASS 9.15E-07 PASS -4.01E-07 1.50E-08 -3.60E-07 -4.42E-07 -9.65E-07 PASS 9.65E-07 PASS -3.87E-07 1.51E-08 -3.45E-07 -4.29E-07 -9.65E-07 PASS 9.65E-07 PASS -3.35E-07 1.53E-08 -2.93E-07 -3.76E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.09E-07 -3.13E-07 -3.11E-07 -2.95E-07 -3.04E-07 -2.99E-07 -3.05E-07 -2.80E-07 -3.00E-07 -3.18E-07 -2.79E-07 -2.99E-07 Total 20 -3.28E-07 -3.30E-07 -3.30E-07 -3.16E-07 -3.23E-07 -3.16E-07 -3.22E-07 -2.97E-07 -3.16E-07 -3.34E-07 -2.81E-07 -3.00E-07 Dose (krad(Si)) 50 100 -3.45E-07 -3.69E-07 -3.52E-07 -3.61E-07 -3.53E-07 -3.70E-07 -3.34E-07 -3.56E-07 -3.39E-07 -3.63E-07 -3.36E-07 -3.66E-07 -3.41E-07 -3.68E-07 -3.15E-07 -3.39E-07 -3.34E-07 -3.59E-07 -3.59E-07 -3.81E-07 -2.81E-07 -2.81E-07 -3.00E-07 -2.99E-07 -3.06E-07 7.10E-09 -2.87E-07 -3.26E-07 -3.25E-07 6.17E-09 -3.08E-07 -3.42E-07 -3.44E-07 8.14E-09 -3.22E-07 -3.67E-07 -3.00E-07 1.37E-08 -2.63E-07 -3.38E-07 -7.15E-07 PASS 7.15E-07 PASS -3.17E-07 1.34E-08 -2.80E-07 -3.54E-07 -8.15E-07 PASS 8.15E-07 PASS -3.37E-07 1.55E-08 -2.94E-07 -3.80E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 37 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.14. Plot of +Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 38 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.14. Raw data for +Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.15E-07 -3.97E-07 -4.04E-07 -3.94E-07 -3.97E-07 -4.30E-07 -4.32E-07 -3.76E-07 -3.85E-07 -4.02E-07 -2.93E-07 -3.08E-07 24-hr Anneal 225 -3.81E-07 -3.68E-07 -3.74E-07 -3.62E-07 -3.67E-07 -4.14E-07 -4.15E-07 -3.63E-07 -3.73E-07 -3.90E-07 -2.93E-07 -3.08E-07 168-hr Anneal 250 -3.46E-07 -3.28E-07 -3.34E-07 -3.25E-07 -3.29E-07 -3.59E-07 -3.63E-07 -3.07E-07 -3.23E-07 -3.37E-07 -2.93E-07 -3.09E-07 -3.71E-07 1.01E-08 -3.43E-07 -3.98E-07 -4.01E-07 8.58E-09 -3.78E-07 -4.25E-07 -3.70E-07 7.37E-09 -3.50E-07 -3.90E-07 -3.32E-07 8.43E-09 -3.09E-07 -3.55E-07 -3.66E-07 2.52E-08 -2.96E-07 -4.35E-07 -9.15E-07 PASS 9.15E-07 PASS -4.05E-07 2.54E-08 -3.36E-07 -4.75E-07 -9.65E-07 PASS 9.65E-07 PASS -3.91E-07 2.37E-08 -3.26E-07 -4.56E-07 -9.65E-07 PASS 9.65E-07 PASS -3.38E-07 2.38E-08 -2.73E-07 -4.03E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.19E-07 -3.10E-07 -3.12E-07 -3.06E-07 -3.06E-07 -3.22E-07 -3.24E-07 -2.73E-07 -2.89E-07 -3.04E-07 -2.91E-07 -3.07E-07 Total 20 -3.41E-07 -3.27E-07 -3.34E-07 -3.25E-07 -3.26E-07 -3.39E-07 -3.46E-07 -2.90E-07 -3.05E-07 -3.20E-07 -2.93E-07 -3.08E-07 Dose (krad(Si)) 50 100 -3.59E-07 -3.86E-07 -3.50E-07 -3.63E-07 -3.58E-07 -3.75E-07 -3.48E-07 -3.61E-07 -3.49E-07 -3.69E-07 -3.65E-07 -3.89E-07 -3.65E-07 -3.92E-07 -3.10E-07 -3.35E-07 -3.23E-07 -3.48E-07 -3.37E-07 -3.64E-07 -2.92E-07 -2.92E-07 -3.08E-07 -3.07E-07 -3.10E-07 5.23E-09 -2.96E-07 -3.25E-07 -3.31E-07 6.62E-09 -3.12E-07 -3.49E-07 -3.53E-07 5.31E-09 -3.38E-07 -3.67E-07 -3.02E-07 2.18E-08 -2.42E-07 -3.62E-07 -7.15E-07 PASS 7.15E-07 PASS -3.20E-07 2.31E-08 -2.57E-07 -3.84E-07 -8.15E-07 PASS 8.15E-07 PASS -3.40E-07 2.49E-08 -2.72E-07 -4.08E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 39 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.15. Plot of -Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 40 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.15. Raw data for -Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 3.56E-07 3.80E-07 3.52E-07 3.64E-07 3.59E-07 3.77E-07 3.53E-07 3.72E-07 3.55E-07 3.74E-07 3.77E-07 4.04E-07 3.65E-07 3.89E-07 3.08E-07 3.32E-07 3.20E-07 3.40E-07 3.37E-07 3.65E-07 2.90E-07 2.90E-07 3.05E-07 3.04E-07 200 4.08E-07 3.98E-07 4.03E-07 4.03E-07 4.01E-07 4.50E-07 4.29E-07 3.73E-07 3.89E-07 4.04E-07 2.90E-07 3.05E-07 24-hr Anneal 225 3.75E-07 3.69E-07 3.73E-07 3.71E-07 3.71E-07 4.30E-07 4.09E-07 3.59E-07 3.74E-07 3.91E-07 2.90E-07 3.05E-07 168-hr Anneal 250 3.38E-07 3.28E-07 3.34E-07 3.29E-07 3.34E-07 3.73E-07 3.61E-07 3.06E-07 3.19E-07 3.35E-07 2.90E-07 3.05E-07 0 3.15E-07 3.11E-07 3.15E-07 3.08E-07 3.13E-07 3.30E-07 3.20E-07 2.73E-07 2.85E-07 3.03E-07 2.89E-07 3.04E-07 Total 20 3.35E-07 3.29E-07 3.34E-07 3.28E-07 3.32E-07 3.55E-07 3.39E-07 2.90E-07 3.02E-07 3.19E-07 2.90E-07 3.05E-07 3.12E-07 3.02E-09 3.21E-07 3.04E-07 3.32E-07 3.17E-09 3.40E-07 3.23E-07 3.55E-07 2.70E-09 3.62E-07 3.47E-07 3.73E-07 5.91E-09 3.90E-07 3.57E-07 4.03E-07 3.48E-09 4.12E-07 3.93E-07 3.72E-07 2.38E-09 3.78E-07 3.65E-07 3.32E-07 4.00E-09 3.43E-07 3.21E-07 3.02E-07 2.36E-08 3.67E-07 2.38E-07 -7.15E-07 PASS 7.15E-07 PASS 3.21E-07 2.65E-08 3.93E-07 2.48E-07 -8.15E-07 PASS 8.15E-07 PASS 3.41E-07 2.92E-08 4.22E-07 2.61E-07 -8.65E-07 PASS 8.65E-07 PASS 3.66E-07 3.09E-08 4.51E-07 2.81E-07 -9.15E-07 PASS 9.15E-07 PASS 4.09E-07 3.09E-08 4.94E-07 3.24E-07 -9.65E-07 PASS 9.65E-07 PASS 3.93E-07 2.81E-08 4.70E-07 3.16E-07 -9.65E-07 PASS 9.65E-07 PASS 3.39E-07 2.80E-08 4.16E-07 2.62E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 41 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.16. Plot of -Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 42 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.16. Raw data for -Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 3.51E-07 3.74E-07 3.55E-07 3.62E-07 3.54E-07 3.72E-07 3.22E-07 3.40E-07 3.49E-07 3.68E-07 3.37E-07 3.68E-07 3.49E-07 3.73E-07 3.17E-07 3.50E-07 3.29E-07 3.56E-07 3.50E-07 3.73E-07 2.83E-07 2.83E-07 2.96E-07 2.95E-07 200 4.02E-07 4.00E-07 3.99E-07 3.74E-07 3.97E-07 4.05E-07 4.09E-07 3.87E-07 3.97E-07 4.11E-07 2.83E-07 2.96E-07 24-hr Anneal 225 3.69E-07 3.69E-07 3.67E-07 3.41E-07 3.66E-07 3.90E-07 3.90E-07 3.70E-07 3.82E-07 3.97E-07 2.83E-07 2.96E-07 168-hr Anneal 250 3.31E-07 3.30E-07 3.28E-07 3.10E-07 3.26E-07 3.34E-07 3.38E-07 3.14E-07 3.27E-07 3.40E-07 2.83E-07 2.97E-07 0 3.09E-07 3.12E-07 3.10E-07 2.90E-07 3.07E-07 3.01E-07 3.06E-07 2.80E-07 2.95E-07 3.08E-07 2.82E-07 2.95E-07 Total 20 3.29E-07 3.30E-07 3.30E-07 3.08E-07 3.26E-07 3.18E-07 3.23E-07 2.98E-07 3.11E-07 3.24E-07 2.83E-07 2.96E-07 3.06E-07 8.91E-09 3.30E-07 2.81E-07 3.25E-07 9.59E-09 3.51E-07 2.98E-07 3.46E-07 1.37E-08 3.84E-07 3.09E-07 3.63E-07 1.39E-08 4.01E-07 3.25E-07 3.95E-07 1.14E-08 4.26E-07 3.63E-07 3.63E-07 1.24E-08 3.96E-07 3.29E-07 3.25E-07 8.88E-09 3.49E-07 3.01E-07 2.98E-07 1.12E-08 3.29E-07 2.67E-07 -7.15E-07 PASS 7.15E-07 PASS 3.15E-07 1.08E-08 3.44E-07 2.86E-07 -8.15E-07 PASS 8.15E-07 PASS 3.36E-07 1.40E-08 3.75E-07 2.98E-07 -8.65E-07 PASS 8.65E-07 PASS 3.64E-07 1.03E-08 3.92E-07 3.36E-07 -9.15E-07 PASS 9.15E-07 PASS 4.02E-07 9.84E-09 4.29E-07 3.75E-07 -9.65E-07 PASS 9.65E-07 PASS 3.86E-07 1.05E-08 4.15E-07 3.57E-07 -9.65E-07 PASS 9.65E-07 PASS 3.31E-07 1.04E-08 3.59E-07 3.02E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 43 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.17. Plot of -Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 44 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.17. Raw data for -Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 3.35E-07 3.63E-07 3.52E-07 3.59E-07 3.53E-07 3.70E-07 3.28E-07 3.53E-07 3.38E-07 3.64E-07 3.39E-07 3.72E-07 3.48E-07 3.73E-07 3.17E-07 3.39E-07 3.32E-07 3.60E-07 3.58E-07 3.80E-07 2.80E-07 2.80E-07 2.96E-07 2.95E-07 200 3.89E-07 3.95E-07 3.97E-07 3.84E-07 3.90E-07 4.11E-07 4.10E-07 3.80E-07 4.00E-07 4.19E-07 2.81E-07 2.96E-07 24-hr Anneal 225 3.58E-07 3.67E-07 3.67E-07 3.53E-07 3.62E-07 3.94E-07 3.91E-07 3.66E-07 3.84E-07 4.05E-07 2.81E-07 2.96E-07 168-hr Anneal 250 3.23E-07 3.28E-07 3.29E-07 3.11E-07 3.23E-07 3.35E-07 3.38E-07 3.15E-07 3.30E-07 3.56E-07 2.81E-07 2.97E-07 0 3.02E-07 3.10E-07 3.10E-07 2.91E-07 3.04E-07 3.01E-07 3.06E-07 2.82E-07 2.98E-07 3.16E-07 2.80E-07 2.95E-07 Total 20 3.20E-07 3.27E-07 3.30E-07 3.11E-07 3.23E-07 3.18E-07 3.22E-07 2.99E-07 3.14E-07 3.32E-07 2.81E-07 2.96E-07 3.03E-07 7.83E-09 3.25E-07 2.82E-07 3.22E-07 7.30E-09 3.42E-07 3.02E-07 3.41E-07 1.11E-08 3.72E-07 3.11E-07 3.62E-07 6.17E-09 3.79E-07 3.45E-07 3.91E-07 5.20E-09 4.05E-07 3.77E-07 3.61E-07 6.14E-09 3.78E-07 3.45E-07 3.23E-07 7.03E-09 3.42E-07 3.04E-07 3.01E-07 1.24E-08 3.35E-07 2.67E-07 -7.15E-07 PASS 7.15E-07 PASS 3.17E-07 1.23E-08 3.51E-07 2.84E-07 -8.15E-07 PASS 8.15E-07 PASS 3.39E-07 1.57E-08 3.82E-07 2.96E-07 -8.65E-07 PASS 8.65E-07 PASS 3.65E-07 1.61E-08 4.09E-07 3.21E-07 -9.15E-07 PASS 9.15E-07 PASS 4.04E-07 1.51E-08 4.46E-07 3.63E-07 -9.65E-07 PASS 9.65E-07 PASS 3.88E-07 1.44E-08 4.27E-07 3.48E-07 -9.65E-07 PASS 9.65E-07 PASS 3.35E-07 1.50E-08 3.76E-07 2.94E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 45 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.18. Plot of -Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 46 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.18. Raw data for -Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 3.63E-07 3.89E-07 3.52E-07 3.61E-07 3.56E-07 3.74E-07 3.50E-07 3.70E-07 3.52E-07 3.71E-07 3.67E-07 3.92E-07 3.71E-07 3.99E-07 3.11E-07 3.35E-07 3.22E-07 3.49E-07 3.39E-07 3.68E-07 2.92E-07 2.92E-07 3.04E-07 3.03E-07 200 4.18E-07 3.97E-07 4.04E-07 3.96E-07 3.96E-07 4.33E-07 4.36E-07 3.78E-07 3.89E-07 4.08E-07 2.92E-07 3.04E-07 24-hr Anneal 225 3.84E-07 3.68E-07 3.74E-07 3.65E-07 3.68E-07 4.14E-07 4.17E-07 3.63E-07 3.75E-07 3.93E-07 2.92E-07 3.04E-07 168-hr Anneal 250 3.50E-07 3.27E-07 3.31E-07 3.27E-07 3.28E-07 3.64E-07 3.69E-07 3.09E-07 3.22E-07 3.38E-07 2.92E-07 3.04E-07 0 3.19E-07 3.10E-07 3.10E-07 3.08E-07 3.06E-07 3.22E-07 3.27E-07 2.75E-07 2.88E-07 3.06E-07 2.91E-07 3.03E-07 Total 20 3.41E-07 3.28E-07 3.31E-07 3.26E-07 3.26E-07 3.40E-07 3.54E-07 2.92E-07 3.04E-07 3.21E-07 2.92E-07 3.04E-07 3.10E-07 4.96E-09 3.24E-07 2.97E-07 3.30E-07 6.23E-09 3.47E-07 3.13E-07 3.55E-07 5.48E-09 3.70E-07 3.39E-07 3.73E-07 1.02E-08 4.01E-07 3.45E-07 4.02E-07 9.51E-09 4.28E-07 3.76E-07 3.72E-07 7.71E-09 3.93E-07 3.50E-07 3.33E-07 9.92E-09 3.60E-07 3.06E-07 3.04E-07 2.21E-08 3.64E-07 2.43E-07 -7.15E-07 PASS 7.15E-07 PASS 3.22E-07 2.50E-08 3.91E-07 2.54E-07 -8.15E-07 PASS 8.15E-07 PASS 3.42E-07 2.64E-08 4.14E-07 2.69E-07 -8.65E-07 PASS 8.65E-07 PASS 3.69E-07 2.77E-08 4.45E-07 2.93E-07 -9.15E-07 PASS 9.15E-07 PASS 4.09E-07 2.59E-08 4.80E-07 3.38E-07 -9.65E-07 PASS 9.65E-07 PASS 3.93E-07 2.39E-08 4.58E-07 3.27E-07 -9.65E-07 PASS 9.65E-07 PASS 3.40E-07 2.59E-08 4.11E-07 2.69E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 47 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.19. Plot of Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 48 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.19. Raw data for Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 5.22E-04 7.67E-05 5.86E-05 2.42E-04 1.97E-04 9.83E-05 -1.50E-05 2.75E-04 9.85E-05 2.38E-04 2.12E-04 7.08E-05 24-hr Anneal 225 5.13E-04 6.82E-05 6.96E-05 2.36E-04 1.90E-04 1.04E-04 -2.18E-05 2.71E-04 1.02E-04 2.42E-04 2.13E-04 6.97E-05 168-hr Anneal 250 4.65E-04 5.41E-05 4.96E-05 1.95E-04 1.59E-04 1.14E-04 -5.39E-05 2.83E-04 8.34E-05 2.27E-04 2.14E-04 7.01E-05 2.15E-04 1.78E-04 7.04E-04 -2.74E-04 2.19E-04 1.86E-04 7.30E-04 -2.92E-04 2.15E-04 1.82E-04 7.14E-04 -2.84E-04 1.84E-04 1.69E-04 6.48E-04 -2.80E-04 1.44E-04 1.20E-04 4.74E-04 -1.86E-04 -9.50E-04 PASS 9.50E-04 PASS 1.39E-04 1.18E-04 4.61E-04 -1.83E-04 -9.50E-04 PASS 9.50E-04 PASS 1.39E-04 1.19E-04 4.65E-04 -1.87E-04 -9.50E-04 PASS 9.50E-04 PASS 1.30E-04 1.31E-04 4.90E-04 -2.29E-04 -9.50E-04 PASS 9.50E-04 PASS 0 4.95E-04 6.37E-05 8.65E-05 2.29E-04 1.81E-04 1.55E-04 2.58E-06 3.00E-04 1.19E-04 2.72E-04 2.12E-04 7.20E-05 Total 20 4.88E-04 6.16E-05 7.31E-05 2.20E-04 1.74E-04 1.33E-04 -1.16E-05 2.83E-04 1.05E-04 2.57E-04 2.11E-04 7.04E-05 Dose (krad(Si)) 50 100 4.99E-04 5.09E-04 6.68E-05 8.50E-05 6.52E-05 6.43E-05 2.26E-04 2.31E-04 1.74E-04 1.85E-04 1.21E-04 1.12E-04 -1.76E-05 -2.03E-05 2.79E-04 2.80E-04 1.01E-04 1.04E-04 2.51E-04 2.43E-04 2.12E-04 2.13E-04 7.13E-05 7.30E-05 2.11E-04 1.72E-04 6.84E-04 -2.62E-04 2.03E-04 1.73E-04 6.77E-04 -2.70E-04 2.06E-04 1.78E-04 6.94E-04 -2.82E-04 1.70E-04 1.20E-04 5.00E-04 -1.61E-04 -8.00E-04 PASS 8.00E-04 PASS 1.53E-04 1.20E-04 4.82E-04 -1.76E-04 -9.50E-04 PASS 9.50E-04 PASS 1.47E-04 1.21E-04 4.78E-04 -1.84E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 49 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.20. Plot of Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 50 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.20. Raw data for Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.68E-04 1.41E-04 2.47E-04 2.20E-04 7.30E-05 1.36E-04 -2.18E-05 3.06E-04 2.97E-05 -1.57E-04 1.16E-04 1.91E-04 24-hr Anneal 225 3.62E-04 1.37E-04 2.48E-04 2.23E-04 7.31E-05 1.34E-04 -2.01E-05 3.07E-04 2.84E-05 -1.61E-04 1.17E-04 1.93E-04 168-hr Anneal 250 3.23E-04 1.20E-04 2.34E-04 2.07E-04 9.42E-05 1.32E-04 -3.72E-05 2.88E-04 1.85E-05 -1.66E-04 1.17E-04 1.92E-04 2.07E-04 1.06E-04 4.97E-04 -8.29E-05 2.10E-04 1.12E-04 5.16E-04 -9.67E-05 2.08E-04 1.11E-04 5.12E-04 -9.47E-05 1.96E-04 9.20E-05 4.48E-04 -5.68E-05 6.17E-05 1.74E-04 5.38E-04 -4.15E-04 -9.50E-04 PASS 9.50E-04 PASS 5.85E-05 1.74E-04 5.35E-04 -4.18E-04 -9.50E-04 PASS 9.50E-04 PASS 5.79E-05 1.75E-04 5.38E-04 -4.23E-04 -9.50E-04 PASS 9.50E-04 PASS 4.70E-05 1.72E-04 5.19E-04 -4.25E-04 -9.50E-04 PASS 9.50E-04 PASS 0 3.35E-04 1.35E-04 2.56E-04 2.14E-04 9.65E-05 1.58E-04 7.60E-06 3.50E-04 5.37E-05 -1.33E-04 1.14E-04 1.93E-04 Total 20 3.38E-04 1.30E-04 2.43E-04 2.04E-04 8.00E-05 1.43E-04 -7.67E-06 3.29E-04 3.80E-05 -1.49E-04 1.14E-04 1.91E-04 Dose (krad(Si)) 50 100 3.49E-04 3.54E-04 1.31E-04 1.45E-04 2.44E-04 2.44E-04 2.12E-04 2.19E-04 7.60E-05 7.37E-05 1.41E-04 1.39E-04 -1.52E-05 -1.39E-05 3.19E-04 3.10E-04 3.56E-05 2.69E-05 -1.52E-04 -1.53E-04 1.14E-04 1.15E-04 1.91E-04 1.91E-04 2.07E-04 9.53E-05 4.69E-04 -5.38E-05 1.99E-04 1.00E-04 4.74E-04 -7.58E-05 2.02E-04 1.05E-04 4.91E-04 -8.62E-05 8.73E-05 1.80E-04 5.82E-04 -4.08E-04 -8.00E-04 PASS 8.00E-04 PASS 7.06E-05 1.78E-04 5.60E-04 -4.18E-04 -9.50E-04 PASS 9.50E-04 PASS 6.57E-05 1.77E-04 5.50E-04 -4.18E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 51 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.21. Plot of Input Offset Voltage2_3 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 52 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.21. Raw data for Input Offset Voltage2_3 15V (V) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage2_3 15V (V) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -1.43E-04 -4.68E-05 6.34E-05 1.11E-04 2.30E-04 1.93E-04 3.13E-04 -3.80E-05 1.63E-04 3.59E-04 8.19E-05 1.97E-04 24-hr Anneal 225 -1.40E-04 -5.26E-05 5.89E-05 1.04E-04 2.26E-04 1.96E-04 3.14E-04 -3.68E-05 1.60E-04 3.56E-04 8.32E-05 1.99E-04 168-hr Anneal 250 -1.46E-04 -9.57E-05 2.17E-05 6.19E-05 1.98E-04 1.80E-04 3.08E-04 -2.77E-05 1.15E-04 3.49E-04 8.12E-05 1.95E-04 3.59E-05 1.41E-04 4.21E-04 -3.50E-04 4.28E-05 1.44E-04 4.38E-04 -3.52E-04 3.94E-05 1.42E-04 4.27E-04 -3.49E-04 7.98E-06 1.36E-04 3.80E-04 -3.64E-04 2.02E-04 1.55E-04 6.29E-04 -2.24E-04 -9.50E-04 PASS 9.50E-04 PASS 1.98E-04 1.55E-04 6.23E-04 -2.27E-04 -9.50E-04 PASS 9.50E-04 PASS 1.98E-04 1.54E-04 6.21E-04 -2.25E-04 -9.50E-04 PASS 9.50E-04 PASS 1.85E-04 1.52E-04 6.01E-04 -2.32E-04 -9.50E-04 PASS 9.50E-04 PASS 0 -1.40E-04 -5.68E-05 6.52E-05 1.06E-04 2.23E-04 2.39E-04 3.47E-04 -1.30E-06 1.80E-04 3.84E-04 7.82E-05 1.93E-04 Total 20 -1.53E-04 -6.62E-05 5.09E-05 9.48E-05 2.07E-04 2.19E-04 3.28E-04 -1.56E-05 1.65E-04 3.69E-04 7.84E-05 1.93E-04 Dose (krad(Si)) 50 100 -1.47E-04 -1.47E-04 -6.09E-05 -4.95E-05 5.50E-05 5.79E-05 9.67E-05 9.77E-05 2.14E-04 2.20E-04 2.09E-04 1.97E-04 3.18E-04 3.18E-04 -2.39E-05 -3.15E-05 1.63E-04 1.62E-04 3.62E-04 3.67E-04 7.88E-05 8.14E-05 1.94E-04 1.93E-04 3.96E-05 1.42E-04 4.28E-04 -3.49E-04 2.68E-05 1.40E-04 4.11E-04 -3.58E-04 3.16E-05 1.40E-04 4.16E-04 -3.53E-04 2.30E-04 1.53E-04 6.48E-04 -1.89E-04 -8.00E-04 PASS 8.00E-04 PASS 2.13E-04 1.52E-04 6.29E-04 -2.03E-04 -9.50E-04 PASS 9.50E-04 PASS 2.06E-04 1.51E-04 6.21E-04 -2.10E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 53 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.22. Plot of Input Offset Voltage2_4 15V (V) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 54 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.22. Raw data for Input Offset Voltage2_4 15V (V) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage2_4 15V (V) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 2.11E-04 3.19E-04 7.39E-06 1.53E-04 3.76E-05 3.08E-04 1.16E-04 -1.60E-07 9.50E-05 -2.41E-05 -4.69E-05 1.58E-04 24-hr Anneal 225 2.07E-04 3.12E-04 1.09E-05 1.55E-04 3.44E-05 3.02E-04 1.15E-04 2.49E-06 9.05E-05 -2.44E-05 -4.52E-05 1.59E-04 168-hr Anneal 250 1.85E-04 2.58E-04 -8.73E-06 1.15E-04 2.80E-05 2.52E-04 1.05E-04 -2.91E-05 5.60E-05 -2.35E-05 -4.59E-05 1.60E-04 1.46E-04 1.30E-04 5.02E-04 -2.11E-04 1.46E-04 1.28E-04 4.96E-04 -2.05E-04 1.44E-04 1.25E-04 4.85E-04 -1.98E-04 1.16E-04 1.10E-04 4.17E-04 -1.86E-04 1.02E-04 1.27E-04 4.51E-04 -2.47E-04 -9.50E-04 PASS 9.50E-04 PASS 9.90E-05 1.31E-04 4.59E-04 -2.61E-04 -9.50E-04 PASS 9.50E-04 PASS 9.72E-05 1.29E-04 4.50E-04 -2.55E-04 -9.50E-04 PASS 9.50E-04 PASS 7.22E-05 1.15E-04 3.89E-04 -2.44E-04 -9.50E-04 PASS 9.50E-04 PASS 0 2.02E-04 3.05E-04 3.35E-05 1.61E-04 4.78E-05 3.08E-04 1.60E-04 4.86E-05 1.13E-04 2.40E-05 -4.86E-05 1.56E-04 Total 20 1.92E-04 2.96E-04 1.12E-05 1.48E-04 3.13E-05 2.95E-04 1.37E-04 2.58E-05 9.75E-05 2.16E-06 -4.85E-05 1.57E-04 Dose (krad(Si)) 50 100 1.99E-04 2.01E-04 2.99E-04 3.29E-04 1.33E-05 9.66E-06 1.47E-04 1.54E-04 3.42E-05 3.47E-05 2.99E-04 3.05E-04 1.32E-04 1.24E-04 1.72E-05 3.92E-06 9.03E-05 8.99E-05 -6.84E-06 -1.35E-05 -4.71E-05 -4.73E-05 1.58E-04 1.58E-04 1.50E-04 1.13E-04 4.59E-04 -1.59E-04 1.36E-04 1.18E-04 4.59E-04 -1.87E-04 1.38E-04 1.18E-04 4.63E-04 -1.86E-04 1.31E-04 1.12E-04 4.39E-04 -1.78E-04 -8.00E-04 PASS 8.00E-04 PASS 1.11E-04 1.16E-04 4.29E-04 -2.06E-04 -9.50E-04 PASS 9.50E-04 PASS 1.06E-04 1.21E-04 4.39E-04 -2.27E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 55 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.23. Plot of Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 56 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.23. Raw data for Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -7.96E-09 3.14E-09 -1.14E-09 3.65E-09 3.54E-09 1.69E-09 -6.46E-09 6.02E-09 -1.88E-09 1.56E-08 4.13E-09 3.34E-08 24-hr Anneal 225 -4.05E-09 3.45E-09 6.90E-10 6.80E-09 9.36E-09 4.32E-09 -2.78E-09 9.86E-09 6.70E-10 1.71E-08 5.55E-09 3.33E-08 168-hr Anneal 250 -1.00E-08 -1.30E-10 -4.95E-09 1.48E-09 5.60E-09 -3.96E-09 -1.36E-08 3.61E-09 -5.59E-09 9.88E-09 6.10E-09 3.29E-08 7.00E-11 6.56E-09 1.81E-08 -1.79E-08 2.46E-10 5.00E-09 1.40E-08 -1.35E-08 3.25E-09 5.24E-09 1.76E-08 -1.11E-08 -1.60E-09 6.03E-09 1.49E-08 -1.81E-08 2.17E-09 9.13E-09 2.72E-08 -2.29E-08 -1.00E-07 PASS 1.00E-07 PASS 2.99E-09 8.40E-09 2.60E-08 -2.00E-08 -1.00E-07 PASS 1.00E-07 PASS 5.84E-09 7.85E-09 2.74E-08 -1.57E-08 -1.00E-07 PASS 1.00E-07 PASS -1.93E-09 9.00E-09 2.27E-08 -2.66E-08 -1.00E-07 PASS 1.00E-07 PASS 0 -9.10E-09 -5.80E-10 -3.31E-09 2.35E-09 4.86E-09 -5.63E-09 -1.35E-08 4.25E-09 -5.80E-09 7.26E-09 0.00E+00 3.36E-08 Total 20 -8.33E-09 3.60E-10 -2.95E-09 2.55E-09 4.46E-09 -3.70E-09 -1.06E-08 4.67E-09 -5.10E-09 9.12E-09 1.97E-09 3.33E-08 Dose (krad(Si)) 50 100 -9.45E-09 -8.98E-09 3.20E-10 6.09E-09 -3.97E-09 -4.72E-09 5.11E-09 3.49E-09 5.01E-09 4.47E-09 -9.00E-10 -7.30E-10 -1.03E-08 -9.01E-09 6.03E-09 7.93E-09 -4.08E-09 -1.79E-09 1.10E-08 1.45E-08 2.24E-09 3.30E-09 3.33E-08 3.34E-08 -1.16E-09 5.40E-09 1.36E-08 -1.60E-08 -7.82E-10 5.04E-09 1.30E-08 -1.46E-08 -5.96E-10 6.22E-09 1.65E-08 -1.76E-08 -2.68E-09 8.39E-09 2.03E-08 -2.57E-08 -7.00E-08 PASS 7.00E-08 PASS -1.13E-09 7.92E-09 2.06E-08 -2.29E-08 -1.00E-07 PASS 1.00E-07 PASS 3.64E-10 8.37E-09 2.33E-08 -2.26E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 57 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.24. Plot of Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 58 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.24. Raw data for Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 2.04E-09 1.85E-08 2.38E-09 1.22E-08 8.37E-09 -6.40E-10 7.61E-09 1.41E-08 1.50E-08 2.96E-09 8.84E-09 4.48E-09 24-hr Anneal 225 5.02E-09 2.10E-08 5.59E-09 1.32E-08 1.10E-08 4.78E-09 1.28E-08 1.71E-08 1.65E-08 5.12E-09 9.87E-09 5.32E-09 168-hr Anneal 250 -4.10E-10 1.63E-08 1.22E-09 4.14E-09 5.80E-09 -4.00E-09 3.93E-09 1.01E-08 1.05E-08 -1.59E-09 1.04E-08 5.36E-09 7.97E-09 8.42E-09 3.11E-08 -1.51E-08 8.69E-09 6.94E-09 2.77E-08 -1.03E-08 1.12E-08 6.51E-09 2.90E-08 -6.70E-09 5.40E-09 6.54E-09 2.33E-08 -1.25E-08 7.55E-09 5.31E-09 2.21E-08 -7.02E-09 -1.00E-07 PASS 1.00E-07 PASS 7.79E-09 6.80E-09 2.64E-08 -1.09E-08 -1.00E-07 PASS 1.00E-07 PASS 1.13E-08 5.99E-09 2.77E-08 -5.17E-09 -1.00E-07 PASS 1.00E-07 PASS 3.77E-09 6.58E-09 2.18E-08 -1.43E-08 -1.00E-07 PASS 1.00E-07 PASS 0 -7.00E-11 1.53E-08 1.77E-09 2.86E-09 5.83E-09 -3.09E-09 5.53E-09 9.18E-09 1.11E-08 -1.60E-10 4.99E-09 3.91E-09 Total 20 2.00E-10 1.60E-08 2.70E-09 4.34E-09 6.81E-09 -4.99E-09 4.65E-09 1.03E-08 1.04E-08 -5.10E-10 5.84E-09 4.15E-09 Dose (krad(Si)) 50 100 2.00E-10 -7.20E-10 1.65E-08 2.13E-08 3.05E-09 3.07E-09 8.59E-09 9.72E-09 8.79E-09 6.42E-09 -1.76E-09 -1.40E-10 7.80E-09 9.94E-09 1.22E-08 1.19E-08 1.18E-08 1.18E-08 1.09E-09 4.23E-09 6.30E-09 7.83E-09 4.41E-09 4.88E-09 5.14E-09 6.07E-09 2.18E-08 -1.15E-08 6.00E-09 6.07E-09 2.26E-08 -1.06E-08 7.42E-09 6.25E-09 2.46E-08 -9.72E-09 4.50E-09 6.03E-09 2.10E-08 -1.20E-08 -7.00E-08 PASS 7.00E-08 PASS 3.98E-09 6.76E-09 2.25E-08 -1.46E-08 -1.00E-07 PASS 1.00E-07 PASS 6.23E-09 6.32E-09 2.36E-08 -1.11E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 59 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.25. Plot of Input Offset Current2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 60 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.25. Raw data for Input Offset Current2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current2_3 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.20E-09 -5.28E-09 -1.71E-08 1.90E-09 5.32E-09 7.76E-09 8.78E-09 -1.74E-08 1.50E-08 2.11E-08 -5.90E-10 9.10E-10 24-hr Anneal 225 5.36E-09 -1.44E-09 -1.66E-08 4.01E-09 9.44E-09 9.37E-09 1.38E-08 -1.24E-08 1.85E-08 2.37E-08 2.40E-10 1.63E-09 168-hr Anneal 250 5.30E-10 -5.29E-09 -2.03E-08 1.04E-09 4.15E-09 2.01E-09 9.59E-09 -1.69E-08 7.20E-09 1.41E-08 7.30E-10 -3.00E-10 -3.58E-09 8.06E-09 1.85E-08 -2.57E-08 -2.38E-09 9.12E-09 2.26E-08 -2.74E-08 1.54E-10 1.01E-08 2.80E-08 -2.77E-08 -3.98E-09 9.75E-09 2.28E-08 -3.07E-08 6.94E-09 1.31E-08 4.29E-08 -2.91E-08 -1.00E-07 PASS 1.00E-07 PASS 7.05E-09 1.47E-08 4.73E-08 -3.32E-08 -1.00E-07 PASS 1.00E-07 PASS 1.06E-08 1.39E-08 4.87E-08 -2.76E-08 -1.00E-07 PASS 1.00E-07 PASS 3.19E-09 1.21E-08 3.63E-08 -2.99E-08 -1.00E-07 PASS 1.00E-07 PASS 0 -2.25E-09 -6.27E-09 -2.19E-08 -5.90E-10 2.62E-09 6.90E-10 5.92E-09 -1.63E-08 5.01E-09 1.09E-08 -8.30E-09 -7.26E-09 Total 20 4.80E-10 -5.16E-09 -1.82E-08 1.11E-09 3.11E-09 4.20E-09 9.02E-09 -1.47E-08 8.30E-09 1.46E-08 -3.51E-09 -2.95E-09 Dose (krad(Si)) 50 100 1.09E-09 -9.70E-10 -4.71E-09 1.57E-09 -1.75E-08 -1.78E-08 -8.60E-10 -1.56E-09 3.16E-09 8.50E-10 6.49E-09 5.94E-09 9.93E-09 9.60E-09 -1.50E-08 -1.47E-08 1.03E-08 1.40E-08 1.65E-08 1.98E-08 -2.72E-09 -1.65E-09 -2.43E-09 -1.82E-09 -5.68E-09 9.61E-09 2.07E-08 -3.20E-08 -3.73E-09 8.66E-09 2.00E-08 -2.75E-08 -3.75E-09 8.19E-09 1.87E-08 -2.62E-08 1.24E-09 1.05E-08 2.99E-08 -2.75E-08 -7.00E-08 PASS 7.00E-08 PASS 4.28E-09 1.13E-08 3.51E-08 -2.66E-08 -1.00E-07 PASS 1.00E-07 PASS 5.65E-09 1.21E-08 3.88E-08 -2.75E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 61 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.26. Plot of Input Offset Current2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 62 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.26. Raw data for Input Offset Current2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current2_4 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.16E-09 -2.00E-10 -9.94E-09 5.68E-09 2.52E-09 1.51E-08 1.93E-08 8.03E-09 2.12E-08 -1.36E-08 1.24E-08 3.03E-08 24-hr Anneal 225 -1.89E-09 5.20E-10 -5.59E-09 7.96E-09 7.23E-09 1.67E-08 2.03E-08 1.13E-08 2.28E-08 -1.04E-08 1.34E-08 3.12E-08 168-hr Anneal 250 -6.86E-09 -5.16E-09 -6.84E-09 3.66E-09 3.30E-09 8.50E-09 1.27E-08 4.38E-09 1.67E-08 -1.38E-08 1.41E-08 3.15E-08 -9.14E-10 6.85E-09 1.79E-08 -1.97E-08 -1.22E-09 6.07E-09 1.54E-08 -1.79E-08 1.65E-09 5.86E-09 1.77E-08 -1.44E-08 -2.38E-09 5.40E-09 1.24E-08 -1.72E-08 9.32E-09 1.25E-08 4.35E-08 -2.49E-08 -1.00E-07 PASS 1.00E-07 PASS 1.00E-08 1.41E-08 4.88E-08 -2.88E-08 -1.00E-07 PASS 1.00E-07 PASS 1.21E-08 1.33E-08 4.87E-08 -2.44E-08 -1.00E-07 PASS 1.00E-07 PASS 5.71E-09 1.18E-08 3.81E-08 -2.67E-08 -1.00E-07 PASS 1.00E-07 PASS 0 -4.76E-09 -5.25E-09 -6.46E-09 3.01E-09 3.74E-09 6.45E-09 1.25E-08 4.56E-09 1.73E-08 -1.32E-08 8.81E-09 2.87E-08 Total 20 -4.84E-09 -3.45E-09 -8.19E-09 4.80E-09 3.57E-09 6.64E-09 1.40E-08 4.11E-09 1.73E-08 -1.28E-08 9.53E-09 2.92E-08 Dose (krad(Si)) 50 100 -5.15E-09 -7.65E-09 -3.51E-09 4.18E-09 -8.44E-09 -9.07E-09 4.15E-09 4.89E-09 6.34E-09 3.08E-09 1.04E-08 1.43E-08 1.63E-08 1.63E-08 6.71E-09 8.50E-09 1.95E-08 1.94E-08 -1.27E-08 -1.18E-08 1.04E-08 1.13E-08 2.97E-08 2.99E-08 -1.94E-09 4.90E-09 1.15E-08 -1.54E-08 -1.62E-09 5.59E-09 1.37E-08 -1.70E-08 -1.32E-09 6.30E-09 1.60E-08 -1.86E-08 5.54E-09 1.16E-08 3.74E-08 -2.63E-08 -7.00E-08 PASS 7.00E-08 PASS 5.87E-09 1.17E-08 3.80E-08 -2.63E-08 -1.00E-07 PASS 1.00E-07 PASS 8.04E-09 1.26E-08 4.26E-08 -2.66E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 63 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.27. Plot of +Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 64 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.27. Raw data for +Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.88E-07 5.65E-07 4.56E-07 5.22E-07 4.85E-07 5.52E-07 4.74E-07 5.40E-07 4.67E-07 5.38E-07 4.89E-07 5.71E-07 4.55E-07 5.25E-07 4.55E-07 5.20E-07 4.65E-07 5.27E-07 4.45E-07 5.16E-07 3.61E-07 3.60E-07 3.67E-07 3.68E-07 200 6.52E-07 6.10E-07 6.39E-07 6.26E-07 6.22E-07 6.68E-07 6.15E-07 6.01E-07 6.14E-07 6.03E-07 3.61E-07 3.69E-07 24-hr Anneal 225 5.76E-07 5.41E-07 5.66E-07 5.62E-07 5.53E-07 6.32E-07 5.81E-07 5.75E-07 5.89E-07 5.73E-07 3.61E-07 3.68E-07 168-hr Anneal 250 4.30E-07 4.10E-07 4.30E-07 4.24E-07 4.19E-07 4.61E-07 4.31E-07 4.33E-07 4.51E-07 4.31E-07 3.64E-07 3.68E-07 0 3.45E-07 3.39E-07 3.50E-07 3.44E-07 3.39E-07 3.52E-07 3.36E-07 3.35E-07 3.44E-07 3.36E-07 3.58E-07 3.69E-07 Total 20 4.16E-07 3.96E-07 4.19E-07 4.13E-07 4.04E-07 4.12E-07 3.86E-07 3.91E-07 4.02E-07 3.84E-07 3.58E-07 3.68E-07 3.43E-07 4.68E-09 3.56E-07 3.30E-07 4.10E-07 9.41E-09 4.35E-07 3.84E-07 4.74E-07 1.33E-08 5.10E-07 4.38E-07 5.43E-07 1.62E-08 5.88E-07 4.99E-07 6.30E-07 1.61E-08 6.74E-07 5.86E-07 5.60E-07 1.34E-08 5.96E-07 5.23E-07 4.23E-07 8.36E-09 4.45E-07 4.00E-07 3.41E-07 7.47E-09 3.61E-07 3.20E-07 -7.15E-07 PASS 7.15E-07 PASS 3.95E-07 1.19E-08 4.28E-07 3.63E-07 -8.15E-07 PASS 8.15E-07 PASS 4.62E-07 1.65E-08 5.07E-07 4.16E-07 -8.65E-07 PASS 8.65E-07 PASS 5.32E-07 2.21E-08 5.92E-07 4.71E-07 -9.15E-07 PASS 9.15E-07 PASS 6.20E-07 2.73E-08 6.95E-07 5.45E-07 -9.65E-07 PASS 9.65E-07 PASS 5.90E-07 2.43E-08 6.57E-07 5.24E-07 -9.65E-07 PASS 9.65E-07 PASS 4.41E-07 1.35E-08 4.78E-07 4.04E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 65 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.28. Plot of +Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 66 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.28. Raw data for +Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.90E-07 5.65E-07 4.78E-07 5.36E-07 4.63E-07 5.30E-07 4.57E-07 5.20E-07 4.71E-07 5.44E-07 4.65E-07 5.39E-07 4.51E-07 5.22E-07 4.69E-07 5.41E-07 4.67E-07 5.31E-07 4.52E-07 5.25E-07 3.32E-07 3.33E-07 3.41E-07 3.42E-07 200 6.51E-07 6.28E-07 6.16E-07 6.04E-07 6.30E-07 6.26E-07 6.03E-07 6.27E-07 6.24E-07 6.16E-07 3.35E-07 3.42E-07 24-hr Anneal 225 5.80E-07 5.58E-07 5.44E-07 5.43E-07 5.56E-07 6.01E-07 5.73E-07 5.99E-07 5.96E-07 5.84E-07 3.36E-07 3.43E-07 168-hr Anneal 250 4.34E-07 4.28E-07 4.07E-07 4.09E-07 4.18E-07 4.49E-07 4.30E-07 4.51E-07 4.52E-07 4.31E-07 3.37E-07 3.43E-07 0 3.51E-07 3.50E-07 3.36E-07 3.38E-07 3.40E-07 3.44E-07 3.36E-07 3.41E-07 3.47E-07 3.37E-07 3.30E-07 3.40E-07 Total 20 4.19E-07 4.13E-07 3.98E-07 3.98E-07 4.07E-07 4.00E-07 3.85E-07 4.04E-07 4.03E-07 3.87E-07 3.32E-07 3.41E-07 3.43E-07 6.97E-09 3.62E-07 3.24E-07 4.07E-07 9.13E-09 4.32E-07 3.82E-07 4.72E-07 1.29E-08 5.07E-07 4.36E-07 5.39E-07 1.70E-08 5.86E-07 4.93E-07 6.26E-07 1.78E-08 6.75E-07 5.77E-07 5.56E-07 1.49E-08 5.97E-07 5.15E-07 4.19E-07 1.19E-08 4.52E-07 3.87E-07 3.41E-07 4.73E-09 3.54E-07 3.28E-07 -7.15E-07 PASS 7.15E-07 PASS 3.96E-07 8.96E-09 4.20E-07 3.71E-07 -8.15E-07 PASS 8.15E-07 PASS 4.61E-07 8.37E-09 4.84E-07 4.38E-07 -8.65E-07 PASS 8.65E-07 PASS 5.31E-07 8.41E-09 5.55E-07 5.08E-07 -9.15E-07 PASS 9.15E-07 PASS 6.19E-07 1.00E-08 6.47E-07 5.92E-07 -9.65E-07 PASS 9.65E-07 PASS 5.90E-07 1.16E-08 6.22E-07 5.59E-07 -9.65E-07 PASS 9.65E-07 PASS 4.43E-07 1.10E-08 4.73E-07 4.13E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 67 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.29. Plot of +Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 68 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.29. Raw data for +Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.71E-07 5.44E-07 4.63E-07 5.24E-07 4.63E-07 5.30E-07 4.48E-07 5.14E-07 4.43E-07 5.12E-07 4.74E-07 5.46E-07 4.49E-07 5.18E-07 4.70E-07 5.38E-07 4.50E-07 5.18E-07 4.59E-07 5.31E-07 3.30E-07 3.30E-07 3.54E-07 3.55E-07 200 6.28E-07 6.10E-07 6.14E-07 5.98E-07 5.99E-07 6.34E-07 6.03E-07 6.15E-07 6.07E-07 6.21E-07 3.32E-07 3.56E-07 24-hr Anneal 225 5.59E-07 5.45E-07 5.42E-07 5.35E-07 5.28E-07 6.05E-07 5.72E-07 5.93E-07 5.80E-07 5.89E-07 3.33E-07 3.56E-07 168-hr Anneal 250 4.16E-07 4.14E-07 4.09E-07 4.02E-07 3.93E-07 4.52E-07 4.28E-07 4.48E-07 4.34E-07 4.37E-07 3.34E-07 3.56E-07 0 3.40E-07 3.41E-07 3.41E-07 3.33E-07 3.26E-07 3.46E-07 3.30E-07 3.40E-07 3.37E-07 3.39E-07 3.28E-07 3.54E-07 Total 20 4.01E-07 3.99E-07 3.98E-07 3.90E-07 3.80E-07 4.05E-07 3.81E-07 4.03E-07 3.86E-07 3.93E-07 3.29E-07 3.53E-07 3.36E-07 6.66E-09 3.54E-07 3.18E-07 3.94E-07 8.69E-09 4.17E-07 3.70E-07 4.58E-07 1.18E-08 4.90E-07 4.25E-07 5.25E-07 1.30E-08 5.61E-07 4.89E-07 6.10E-07 1.25E-08 6.44E-07 5.76E-07 5.42E-07 1.18E-08 5.74E-07 5.10E-07 4.07E-07 9.38E-09 4.32E-07 3.81E-07 3.38E-07 5.77E-09 3.54E-07 3.23E-07 -7.15E-07 PASS 7.15E-07 PASS 3.94E-07 1.03E-08 4.22E-07 3.66E-07 -8.15E-07 PASS 8.15E-07 PASS 4.60E-07 1.13E-08 4.91E-07 4.29E-07 -8.65E-07 PASS 8.65E-07 PASS 5.30E-07 1.21E-08 5.63E-07 4.97E-07 -9.15E-07 PASS 9.15E-07 PASS 6.16E-07 1.21E-08 6.49E-07 5.83E-07 -9.65E-07 PASS 9.65E-07 PASS 5.88E-07 1.27E-08 6.23E-07 5.53E-07 -9.65E-07 PASS 9.65E-07 PASS 4.40E-07 1.00E-08 4.67E-07 4.13E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 69 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.30. Plot of +Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 70 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.30. Raw data for +Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.97E-07 5.72E-07 4.57E-07 5.18E-07 4.93E-07 5.60E-07 4.64E-07 5.30E-07 4.74E-07 5.44E-07 4.81E-07 5.58E-07 4.89E-07 5.63E-07 4.72E-07 5.39E-07 4.83E-07 5.44E-07 4.46E-07 5.15E-07 3.48E-07 3.46E-07 3.63E-07 3.62E-07 200 6.63E-07 6.07E-07 6.47E-07 6.17E-07 6.28E-07 6.57E-07 6.55E-07 6.20E-07 6.35E-07 6.02E-07 3.48E-07 3.62E-07 24-hr Anneal 225 5.86E-07 5.38E-07 5.76E-07 5.53E-07 5.59E-07 6.22E-07 6.21E-07 5.94E-07 6.07E-07 5.74E-07 3.48E-07 3.63E-07 168-hr Anneal 250 4.34E-07 4.10E-07 4.36E-07 4.19E-07 4.25E-07 4.57E-07 4.71E-07 4.51E-07 4.70E-07 4.31E-07 3.49E-07 3.63E-07 0 3.51E-07 3.40E-07 3.58E-07 3.41E-07 3.46E-07 3.52E-07 3.61E-07 3.44E-07 3.61E-07 3.35E-07 3.44E-07 3.60E-07 Total 20 4.21E-07 3.94E-07 4.25E-07 4.09E-07 4.08E-07 4.09E-07 4.18E-07 4.06E-07 4.20E-07 3.85E-07 3.45E-07 3.61E-07 3.47E-07 7.57E-09 3.68E-07 3.27E-07 4.11E-07 1.22E-08 4.45E-07 3.78E-07 4.77E-07 1.73E-08 5.25E-07 4.30E-07 5.45E-07 2.18E-08 6.05E-07 4.85E-07 6.32E-07 2.24E-08 6.94E-07 5.71E-07 5.62E-07 1.89E-08 6.14E-07 5.11E-07 4.25E-07 1.09E-08 4.55E-07 3.95E-07 3.51E-07 1.14E-08 3.82E-07 3.19E-07 -7.15E-07 PASS 7.15E-07 PASS 4.08E-07 1.42E-08 4.46E-07 3.69E-07 -8.15E-07 PASS 8.15E-07 PASS 4.74E-07 1.67E-08 5.20E-07 4.29E-07 -8.65E-07 PASS 8.65E-07 PASS 5.44E-07 1.90E-08 5.96E-07 4.91E-07 -9.15E-07 PASS 9.15E-07 PASS 6.34E-07 2.32E-08 6.97E-07 5.70E-07 -9.65E-07 PASS 9.65E-07 PASS 6.04E-07 2.04E-08 6.59E-07 5.48E-07 -9.65E-07 PASS 9.65E-07 PASS 4.56E-07 1.63E-08 5.01E-07 4.11E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 71 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.31. Plot of -Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 72 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.31. Raw data for -Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.58E-07 -6.03E-07 -6.37E-07 -6.20E-07 -6.15E-07 -6.62E-07 -6.15E-07 -5.93E-07 -6.12E-07 -5.82E-07 -3.52E-07 -3.39E-07 24-hr Anneal 225 -5.78E-07 -5.34E-07 -5.62E-07 -5.52E-07 -5.42E-07 -6.26E-07 -5.80E-07 -5.61E-07 -5.85E-07 -5.53E-07 -3.53E-07 -3.39E-07 168-hr Anneal 250 -4.37E-07 -4.07E-07 -4.29E-07 -4.18E-07 -4.08E-07 -4.62E-07 -4.42E-07 -4.26E-07 -4.54E-07 -4.19E-07 -3.53E-07 -3.40E-07 -5.39E-07 2.26E-08 -4.76E-07 -6.01E-07 -6.27E-07 2.13E-08 -5.68E-07 -6.85E-07 -5.53E-07 1.72E-08 -5.06E-07 -6.00E-07 -4.20E-07 1.31E-08 -3.84E-07 -4.56E-07 -5.25E-07 2.70E-08 -4.51E-07 -5.99E-07 -9.15E-07 PASS 9.15E-07 PASS -6.13E-07 3.08E-08 -5.29E-07 -6.97E-07 -9.65E-07 PASS 9.65E-07 PASS -5.81E-07 2.87E-08 -5.02E-07 -6.60E-07 -9.65E-07 PASS 9.65E-07 PASS -4.40E-07 1.81E-08 -3.91E-07 -4.90E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.50E-07 -3.38E-07 -3.50E-07 -3.39E-07 -3.38E-07 -3.55E-07 -3.39E-07 -3.30E-07 -3.46E-07 -3.27E-07 -3.52E-07 -3.39E-07 Total 20 -4.20E-07 -3.89E-07 -4.18E-07 -4.04E-07 -3.93E-07 -4.13E-07 -3.92E-07 -3.82E-07 -4.03E-07 -3.71E-07 -3.52E-07 -3.39E-07 Dose (krad(Si)) 50 100 -4.93E-07 -5.69E-07 -4.53E-07 -5.11E-07 -4.84E-07 -5.53E-07 -4.65E-07 -5.33E-07 -4.59E-07 -5.27E-07 -4.84E-07 -5.67E-07 -4.60E-07 -5.28E-07 -4.44E-07 -5.07E-07 -4.64E-07 -5.24E-07 -4.29E-07 -4.97E-07 -3.55E-07 -3.52E-07 -3.40E-07 -3.39E-07 -3.43E-07 6.31E-09 -3.26E-07 -3.60E-07 -4.05E-07 1.39E-08 -3.67E-07 -4.43E-07 -4.71E-07 1.70E-08 -4.24E-07 -5.17E-07 -3.39E-07 1.15E-08 -3.08E-07 -3.71E-07 -7.15E-07 PASS 7.15E-07 PASS -3.92E-07 1.63E-08 -3.47E-07 -4.37E-07 -8.15E-07 PASS 8.15E-07 PASS -4.56E-07 2.09E-08 -3.99E-07 -5.13E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 73 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.32. Plot of -Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 74 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.32. Raw data for -Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.43E-07 -6.04E-07 -6.06E-07 -5.87E-07 -6.17E-07 -6.21E-07 -5.90E-07 -6.10E-07 -6.02E-07 -6.07E-07 -3.25E-07 -3.33E-07 24-hr Anneal 225 -5.69E-07 -5.33E-07 -5.35E-07 -5.24E-07 -5.39E-07 -5.90E-07 -5.54E-07 -5.77E-07 -5.73E-07 -5.74E-07 -3.25E-07 -3.33E-07 168-hr Anneal 250 -4.29E-07 -4.08E-07 -4.01E-07 -4.00E-07 -4.05E-07 -4.48E-07 -4.22E-07 -4.35E-07 -4.37E-07 -4.28E-07 -3.25E-07 -3.33E-07 -5.26E-07 2.20E-08 -4.66E-07 -5.86E-07 -6.11E-07 2.08E-08 -5.54E-07 -6.69E-07 -5.40E-07 1.72E-08 -4.93E-07 -5.87E-07 -4.09E-07 1.17E-08 -3.77E-07 -4.41E-07 -5.18E-07 1.07E-08 -4.89E-07 -5.47E-07 -9.15E-07 PASS 9.15E-07 PASS -6.06E-07 1.10E-08 -5.76E-07 -6.36E-07 -9.65E-07 PASS 9.65E-07 PASS -5.74E-07 1.29E-08 -5.38E-07 -6.09E-07 -9.65E-07 PASS 9.65E-07 PASS -4.34E-07 9.94E-09 -4.07E-07 -4.61E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.45E-07 -3.40E-07 -3.34E-07 -3.34E-07 -3.39E-07 -3.42E-07 -3.30E-07 -3.36E-07 -3.40E-07 -3.36E-07 -3.25E-07 -3.37E-07 Total 20 -4.13E-07 -3.91E-07 -3.90E-07 -3.87E-07 -3.95E-07 -3.97E-07 -3.76E-07 -3.89E-07 -3.86E-07 -3.81E-07 -3.25E-07 -3.41E-07 Dose (krad(Si)) 50 100 -4.85E-07 -5.61E-07 -4.55E-07 -5.11E-07 -4.54E-07 -5.23E-07 -4.44E-07 -5.05E-07 -4.58E-07 -5.31E-07 -4.62E-07 -5.34E-07 -4.39E-07 -5.06E-07 -4.53E-07 -5.23E-07 -4.46E-07 -5.12E-07 -4.46E-07 -5.15E-07 -3.25E-07 -3.24E-07 -3.33E-07 -3.40E-07 -3.39E-07 4.57E-09 -3.26E-07 -3.51E-07 -3.95E-07 1.05E-08 -3.66E-07 -4.24E-07 -4.59E-07 1.53E-08 -4.17E-07 -5.01E-07 -3.37E-07 4.69E-09 -3.24E-07 -3.50E-07 -7.15E-07 PASS 7.15E-07 PASS -3.86E-07 8.10E-09 -3.63E-07 -4.08E-07 -8.15E-07 PASS 8.15E-07 PASS -4.49E-07 8.54E-09 -4.26E-07 -4.73E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 75 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.33. Plot of -Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 76 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.33. Raw data for -Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.22E-07 -6.12E-07 -6.27E-07 -5.95E-07 -5.92E-07 -6.23E-07 -5.92E-07 -6.33E-07 -5.91E-07 -5.97E-07 -3.32E-07 -3.51E-07 24-hr Anneal 225 -5.50E-07 -5.43E-07 -5.55E-07 -5.28E-07 -5.16E-07 -5.92E-07 -5.56E-07 -6.02E-07 -5.59E-07 -5.65E-07 -3.32E-07 -3.50E-07 168-hr Anneal 250 -4.15E-07 -4.16E-07 -4.24E-07 -4.00E-07 -3.87E-07 -4.49E-07 -4.16E-07 -4.61E-07 -4.24E-07 -4.22E-07 -3.32E-07 -3.53E-07 -5.24E-07 1.72E-08 -4.77E-07 -5.71E-07 -6.10E-07 1.59E-08 -5.66E-07 -6.53E-07 -5.38E-07 1.60E-08 -4.94E-07 -5.82E-07 -4.08E-07 1.50E-08 -3.67E-07 -4.49E-07 -5.19E-07 2.12E-08 -4.61E-07 -5.77E-07 -9.15E-07 PASS 9.15E-07 PASS -6.07E-07 1.97E-08 -5.53E-07 -6.61E-07 -9.65E-07 PASS 9.65E-07 PASS -5.75E-07 2.09E-08 -5.17E-07 -6.32E-07 -9.65E-07 PASS 9.65E-07 PASS -4.34E-07 1.94E-08 -3.81E-07 -4.87E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.39E-07 -3.42E-07 -3.50E-07 -3.31E-07 -3.21E-07 -3.41E-07 -3.21E-07 -3.52E-07 -3.29E-07 -3.30E-07 -3.31E-07 -3.53E-07 Total 20 -3.96E-07 -4.00E-07 -4.12E-07 -3.86E-07 -3.74E-07 -3.97E-07 -3.70E-07 -4.13E-07 -3.75E-07 -3.74E-07 -3.31E-07 -3.53E-07 Dose (krad(Si)) 50 100 -4.66E-07 -5.40E-07 -4.64E-07 -5.19E-07 -4.77E-07 -5.44E-07 -4.46E-07 -5.11E-07 -4.37E-07 -5.06E-07 -4.63E-07 -5.35E-07 -4.38E-07 -5.06E-07 -4.78E-07 -5.47E-07 -4.37E-07 -4.99E-07 -4.38E-07 -5.06E-07 -3.32E-07 -3.31E-07 -3.53E-07 -3.53E-07 -3.37E-07 1.14E-08 -3.06E-07 -3.68E-07 -3.93E-07 1.41E-08 -3.55E-07 -4.32E-07 -4.58E-07 1.60E-08 -4.14E-07 -5.02E-07 -3.35E-07 1.18E-08 -3.02E-07 -3.67E-07 -7.15E-07 PASS 7.15E-07 PASS -3.86E-07 1.86E-08 -3.35E-07 -4.37E-07 -8.15E-07 PASS 8.15E-07 PASS -4.51E-07 1.90E-08 -3.99E-07 -5.03E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 77 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.34. Plot of -Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 78 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.34. Raw data for -Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.61E-07 -6.03E-07 -6.52E-07 -6.07E-07 -6.22E-07 -6.35E-07 -6.31E-07 -6.06E-07 -6.08E-07 -6.10E-07 -3.39E-07 -3.37E-07 24-hr Anneal 225 -5.84E-07 -5.34E-07 -5.76E-07 -5.39E-07 -5.47E-07 -6.02E-07 -5.95E-07 -5.78E-07 -5.81E-07 -5.80E-07 -3.39E-07 -3.37E-07 168-hr Anneal 250 -4.37E-07 -4.11E-07 -4.37E-07 -4.12E-07 -4.18E-07 -4.43E-07 -4.51E-07 -4.41E-07 -4.50E-07 -4.40E-07 -3.39E-07 -3.37E-07 -5.41E-07 2.65E-08 -4.68E-07 -6.14E-07 -6.29E-07 2.61E-08 -5.58E-07 -7.01E-07 -5.56E-07 2.24E-08 -4.95E-07 -6.17E-07 -4.23E-07 1.30E-08 -3.87E-07 -4.59E-07 -5.30E-07 1.06E-08 -5.01E-07 -5.59E-07 -9.15E-07 PASS 9.15E-07 PASS -6.18E-07 1.37E-08 -5.81E-07 -6.56E-07 -9.65E-07 PASS 9.65E-07 PASS -5.87E-07 1.06E-08 -5.58E-07 -6.16E-07 -9.65E-07 PASS 9.65E-07 PASS -4.45E-07 5.18E-09 -4.31E-07 -4.59E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.49E-07 -3.37E-07 -3.60E-07 -3.34E-07 -3.38E-07 -3.40E-07 -3.44E-07 -3.35E-07 -3.41E-07 -3.40E-07 -3.38E-07 -3.37E-07 Total 20 -4.20E-07 -3.93E-07 -4.28E-07 -3.95E-07 -3.98E-07 -3.97E-07 -4.00E-07 -3.96E-07 -3.99E-07 -3.91E-07 -3.39E-07 -3.37E-07 Dose (krad(Si)) 50 100 -4.96E-07 -5.75E-07 -4.54E-07 -5.11E-07 -4.93E-07 -5.61E-07 -4.55E-07 -5.22E-07 -4.63E-07 -5.35E-07 -4.64E-07 -5.40E-07 -4.68E-07 -5.42E-07 -4.58E-07 -5.26E-07 -4.58E-07 -5.20E-07 -4.55E-07 -5.20E-07 -3.39E-07 -3.39E-07 -3.37E-07 -3.36E-07 -3.43E-07 1.08E-08 -3.14E-07 -3.73E-07 -4.07E-07 1.61E-08 -3.63E-07 -4.51E-07 -4.72E-07 2.05E-08 -4.16E-07 -5.28E-07 -3.40E-07 3.16E-09 -3.31E-07 -3.49E-07 -7.15E-07 PASS 7.15E-07 PASS -3.97E-07 3.33E-09 -3.87E-07 -4.06E-07 -8.15E-07 PASS 8.15E-07 PASS -4.61E-07 5.24E-09 -4.46E-07 -4.75E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 79 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.35. Plot of Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 80 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.35. Raw data for Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.74E-04 -9.77E-05 -1.50E-04 -5.62E-05 1.16E-04 1.16E-04 -1.66E-04 -7.60E-05 -1.54E-04 5.71E-06 -6.39E-05 -1.89E-04 24-hr Anneal 225 3.66E-04 -1.05E-04 -1.38E-04 -6.33E-05 1.05E-04 1.16E-04 -1.77E-04 -8.63E-05 -1.53E-04 7.86E-06 -6.71E-05 -1.90E-04 168-hr Anneal 250 3.43E-04 -1.16E-04 -1.65E-04 -8.92E-05 6.38E-05 1.33E-04 -2.09E-04 -5.84E-05 -1.48E-04 1.37E-05 -6.53E-05 -1.90E-04 3.71E-05 2.06E-04 6.02E-04 -5.28E-04 3.71E-05 2.13E-04 6.21E-04 -5.47E-04 3.29E-05 2.09E-04 6.05E-04 -5.39E-04 7.46E-06 2.06E-04 5.72E-04 -5.57E-04 -4.64E-05 1.24E-04 2.94E-04 -3.86E-04 -9.50E-04 PASS 9.50E-04 PASS -5.49E-05 1.18E-04 2.69E-04 -3.78E-04 -9.50E-04 PASS 9.50E-04 PASS -5.86E-05 1.21E-04 2.74E-04 -3.91E-04 -9.50E-04 PASS 9.50E-04 PASS -5.38E-05 1.35E-04 3.16E-04 -4.23E-04 -9.50E-04 PASS 9.50E-04 PASS 0 3.60E-04 -1.04E-04 -1.16E-04 -7.33E-05 1.02E-04 1.97E-04 -1.26E-04 -4.20E-05 -1.18E-04 5.55E-05 -6.38E-05 -1.89E-04 Total 20 3.51E-04 -1.06E-04 -1.27E-04 -7.45E-05 1.01E-04 1.70E-04 -1.46E-04 -6.01E-05 -1.34E-04 3.81E-05 -6.33E-05 -1.86E-04 Dose (krad(Si)) 50 100 3.61E-04 3.68E-04 -9.90E-05 -8.94E-05 -1.33E-04 -1.36E-04 -6.81E-05 -6.33E-05 9.63E-05 1.07E-04 1.52E-04 1.35E-04 -1.57E-04 -1.68E-04 -6.53E-05 -6.86E-05 -1.42E-04 -1.44E-04 2.49E-05 1.36E-05 -6.37E-05 -6.31E-05 -1.86E-04 -1.84E-04 3.37E-05 2.03E-04 5.89E-04 -5.22E-04 2.90E-05 2.01E-04 5.81E-04 -5.23E-04 3.15E-05 2.04E-04 5.91E-04 -5.28E-04 -6.60E-06 1.35E-04 3.65E-04 -3.78E-04 -8.00E-04 PASS 8.00E-04 PASS -2.64E-05 1.32E-04 3.36E-04 -3.89E-04 -9.50E-04 PASS 9.50E-04 PASS -3.75E-05 1.28E-04 3.13E-04 -3.89E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 81 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.36. Plot of Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 82 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.36. Raw data for Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.31E-04 -1.23E-05 -6.21E-05 1.53E-04 -2.08E-04 6.06E-05 -2.88E-04 9.76E-06 -3.08E-04 -2.70E-04 -1.51E-04 8.29E-05 24-hr Anneal 225 1.28E-04 -1.33E-05 -6.04E-05 1.59E-04 -2.08E-04 5.19E-05 -2.91E-04 5.97E-06 -3.11E-04 -2.78E-04 -1.50E-04 8.55E-05 168-hr Anneal 250 8.41E-05 -3.21E-05 -7.09E-05 1.55E-04 -1.87E-04 9.03E-05 -2.89E-04 1.80E-06 -2.92E-04 -2.69E-04 -1.49E-04 8.45E-05 3.45E-06 1.45E-04 4.00E-04 -3.93E-04 2.40E-07 1.48E-04 4.07E-04 -4.06E-04 9.36E-07 1.49E-04 4.10E-04 -4.08E-04 -1.02E-05 1.34E-04 3.57E-04 -3.77E-04 -1.50E-04 1.78E-04 3.37E-04 -6.37E-04 -9.50E-04 PASS 9.50E-04 PASS -1.59E-04 1.79E-04 3.31E-04 -6.49E-04 -9.50E-04 PASS 9.50E-04 PASS -1.64E-04 1.78E-04 3.23E-04 -6.51E-04 -9.50E-04 PASS 9.50E-04 PASS -1.52E-04 1.83E-04 3.51E-04 -6.54E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.09E-04 8.21E-06 -4.30E-05 1.55E-04 -1.66E-04 1.03E-04 -2.41E-04 7.33E-05 -2.49E-04 -2.30E-04 -1.49E-04 8.29E-05 Total 20 1.12E-04 8.40E-07 -5.58E-05 1.47E-04 -1.86E-04 8.62E-05 -2.58E-04 4.79E-05 -2.74E-04 -2.51E-04 -1.48E-04 8.46E-05 Dose (krad(Si)) 50 100 1.21E-04 1.24E-04 -5.80E-06 -5.28E-06 -5.81E-05 -6.10E-05 1.49E-04 1.58E-04 -1.92E-04 -1.99E-04 7.46E-05 6.68E-05 -2.75E-04 -2.74E-04 3.06E-05 1.99E-05 -2.87E-04 -2.99E-04 -2.57E-04 -2.63E-04 -1.49E-04 -1.49E-04 8.39E-05 8.27E-05 1.27E-05 1.27E-04 3.62E-04 -3.36E-04 3.53E-06 1.34E-04 3.71E-04 -3.64E-04 2.87E-06 1.39E-04 3.84E-04 -3.78E-04 -1.09E-04 1.80E-04 3.85E-04 -6.02E-04 -8.00E-04 PASS 8.00E-04 PASS -1.30E-04 1.80E-04 3.65E-04 -6.25E-04 -9.50E-04 PASS 9.50E-04 PASS -1.43E-04 1.79E-04 3.49E-04 -6.34E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 83 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.37. Plot of Input Offset Voltage3_3 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 84 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.37. Raw data for Input Offset Voltage3_3 15V (V) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage3_3 15V (V) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -3.33E-04 -1.19E-04 -2.43E-04 -1.76E-05 -1.42E-04 1.01E-04 1.56E-04 -3.52E-04 -7.91E-05 -4.53E-06 1.32E-04 -3.02E-06 24-hr Anneal 225 -3.29E-04 -1.24E-04 -2.46E-04 -2.34E-05 -1.43E-04 9.82E-05 1.52E-04 -3.51E-04 -8.77E-05 -1.64E-05 1.35E-04 -1.63E-06 168-hr Anneal 250 -3.48E-04 -1.50E-04 -2.56E-04 -7.43E-05 -1.45E-04 1.11E-04 1.60E-04 -3.41E-04 -9.88E-05 6.42E-06 1.30E-04 -3.52E-06 -1.70E-04 1.20E-04 1.59E-04 -4.99E-04 -1.71E-04 1.21E-04 1.62E-04 -5.03E-04 -1.73E-04 1.18E-04 1.50E-04 -4.95E-04 -1.95E-04 1.07E-04 9.97E-05 -4.89E-04 -2.60E-05 2.00E-04 5.22E-04 -5.74E-04 -9.50E-04 PASS 9.50E-04 PASS -3.55E-05 1.99E-04 5.10E-04 -5.81E-04 -9.50E-04 PASS 9.50E-04 PASS -4.11E-05 1.97E-04 4.99E-04 -5.81E-04 -9.50E-04 PASS 9.50E-04 PASS -3.27E-05 1.99E-04 5.14E-04 -5.79E-04 -9.50E-04 PASS 9.50E-04 PASS 0 -3.12E-04 -1.15E-04 -2.41E-04 4.65E-06 -1.34E-04 1.66E-04 2.17E-04 -3.08E-04 -3.86E-05 5.36E-05 1.32E-04 -4.19E-06 Total 20 -3.30E-04 -1.25E-04 -2.53E-04 -1.32E-05 -1.50E-04 1.41E-04 1.90E-04 -3.24E-04 -5.73E-05 3.29E-05 1.31E-04 -4.55E-06 Dose (krad(Si)) 50 100 -3.25E-04 -3.29E-04 -1.21E-04 -1.17E-04 -2.47E-04 -2.46E-04 -1.34E-05 -1.85E-05 -1.46E-04 -1.41E-04 1.22E-04 1.08E-04 1.77E-04 1.68E-04 -3.34E-04 -3.43E-04 -7.00E-05 -7.32E-05 1.41E-05 1.08E-05 1.31E-04 1.33E-04 -2.69E-06 -5.13E-06 -1.60E-04 1.22E-04 1.75E-04 -4.94E-04 -1.74E-04 1.22E-04 1.59E-04 -5.08E-04 -1.70E-04 1.20E-04 1.58E-04 -4.99E-04 1.81E-05 2.08E-04 5.87E-04 -5.51E-04 -8.00E-04 PASS 8.00E-04 PASS -3.33E-06 2.03E-04 5.54E-04 -5.60E-04 -9.50E-04 PASS 9.50E-04 PASS -1.82E-05 2.01E-04 5.32E-04 -5.68E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 85 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.38. Plot of Input Offset Voltage3_4 15V (V) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 86 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.38. Raw data for Input Offset Voltage3_4 15V (V) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage3_4 15V (V) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.59E-04 1.49E-04 -2.22E-04 -4.39E-05 -1.93E-04 1.97E-04 -4.10E-05 -1.57E-04 1.67E-04 -1.46E-05 -1.46E-04 -1.41E-04 24-hr Anneal 225 1.58E-04 1.49E-04 -2.21E-04 -3.74E-05 -1.96E-04 1.82E-04 -4.54E-05 -1.60E-04 1.61E-04 -2.04E-05 -1.45E-04 -1.41E-04 168-hr Anneal 250 1.56E-04 1.03E-04 -2.34E-04 -5.46E-05 -2.21E-04 1.51E-04 -6.30E-05 -1.51E-04 1.22E-04 -1.58E-05 -1.48E-04 -1.41E-04 -2.38E-05 1.81E-04 4.73E-04 -5.20E-04 -3.03E-05 1.82E-04 4.67E-04 -5.28E-04 -2.97E-05 1.81E-04 4.68E-04 -5.27E-04 -5.02E-05 1.79E-04 4.42E-04 -5.42E-04 3.75E-05 1.45E-04 4.36E-04 -3.61E-04 -9.50E-04 PASS 9.50E-04 PASS 3.02E-05 1.49E-04 4.38E-04 -3.77E-04 -9.50E-04 PASS 9.50E-04 PASS 2.35E-05 1.45E-04 4.22E-04 -3.75E-04 -9.50E-04 PASS 9.50E-04 PASS 8.85E-06 1.27E-04 3.57E-04 -3.39E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.66E-04 1.67E-04 -1.86E-04 -1.89E-05 -1.73E-04 2.24E-04 2.42E-05 -8.20E-05 2.10E-04 4.08E-05 -1.46E-04 -1.42E-04 Total 20 1.54E-04 1.50E-04 -2.07E-04 -3.64E-05 -1.86E-04 2.04E-04 -5.25E-06 -1.11E-04 1.89E-04 1.80E-05 -1.45E-04 -1.41E-04 Dose (krad(Si)) 50 100 1.58E-04 1.58E-04 1.47E-04 1.61E-04 -2.07E-04 -2.16E-04 -4.30E-05 -3.48E-05 -1.87E-04 -1.88E-04 2.03E-04 1.98E-04 -1.58E-05 -2.74E-05 -1.28E-04 -1.49E-04 1.74E-04 1.71E-04 4.87E-06 -4.69E-06 -1.44E-04 -1.46E-04 -1.40E-04 -1.41E-04 -9.02E-06 1.73E-04 4.66E-04 -4.84E-04 -2.52E-05 1.75E-04 4.53E-04 -5.04E-04 -2.63E-05 1.76E-04 4.55E-04 -5.07E-04 8.34E-05 1.31E-04 4.42E-04 -2.75E-04 -8.00E-04 PASS 8.00E-04 PASS 5.89E-05 1.35E-04 4.28E-04 -3.10E-04 -9.50E-04 PASS 9.50E-04 PASS 4.75E-05 1.39E-04 4.27E-04 -3.32E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 87 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.39. Plot of Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 88 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.39. Raw data for Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 4.88E-09 2.02E-09 -1.35E-09 2.86E-09 4.18E-09 4.26E-09 -3.34E-09 1.43E-09 1.26E-09 6.49E-09 -2.76E-09 -1.01E-08 24-hr Anneal 225 2.86E-09 7.00E-10 -2.12E-09 6.70E-10 2.17E-09 5.40E-10 -5.48E-09 2.50E-10 -3.00E-10 3.82E-09 -2.87E-09 -1.02E-08 168-hr Anneal 250 2.58E-09 5.10E-10 9.90E-10 9.40E-10 3.49E-09 2.48E-09 -4.79E-09 2.14E-09 1.11E-09 4.23E-09 -3.03E-09 -1.03E-08 1.84E-09 2.05E-09 7.45E-09 -3.78E-09 2.52E-09 2.43E-09 9.19E-09 -4.15E-09 8.56E-10 1.91E-09 6.11E-09 -4.39E-09 1.70E-09 1.27E-09 5.19E-09 -1.79E-09 1.54E-09 4.41E-09 1.36E-08 -1.05E-08 -1.00E-07 PASS 1.00E-07 PASS 2.02E-09 3.70E-09 1.22E-08 -8.12E-09 -1.00E-07 PASS 1.00E-07 PASS -2.34E-10 3.35E-09 8.94E-09 -9.41E-09 -1.00E-07 PASS 1.00E-07 PASS 1.03E-09 3.44E-09 1.05E-08 -8.41E-09 -1.00E-07 PASS 1.00E-07 PASS 0 2.04E-09 5.40E-10 9.10E-10 7.10E-10 3.20E-09 2.13E-09 -4.83E-09 2.49E-09 2.42E-09 4.29E-09 -2.18E-09 -9.94E-09 Total 20 2.21E-09 7.50E-10 3.70E-10 1.33E-09 3.26E-09 2.45E-09 -4.64E-09 1.32E-09 2.13E-09 5.58E-09 -2.30E-09 -9.88E-09 Dose (krad(Si)) 50 100 2.58E-09 3.18E-09 1.71E-09 -3.70E-10 -2.20E-10 -3.30E-10 2.20E-09 2.70E-09 2.63E-09 4.00E-09 2.92E-09 3.01E-09 -4.15E-09 -5.53E-09 1.75E-09 2.60E-09 1.21E-09 1.15E-09 5.58E-09 6.46E-09 -2.51E-09 -2.59E-09 -9.93E-09 -9.99E-09 1.48E-09 1.13E-09 4.57E-09 -1.61E-09 1.58E-09 1.17E-09 4.78E-09 -1.61E-09 1.78E-09 1.18E-09 5.01E-09 -1.45E-09 1.30E-09 3.53E-09 1.10E-08 -8.38E-09 -7.00E-08 PASS 7.00E-08 PASS 1.37E-09 3.73E-09 1.16E-08 -8.85E-09 -1.00E-07 PASS 1.00E-07 PASS 1.46E-09 3.56E-09 1.12E-08 -8.30E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 89 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.40. Plot of Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 90 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.40. Raw data for Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 6.89E-09 5.30E-10 -2.19E-09 8.20E-09 -4.88E-09 2.08E-09 -8.70E-10 4.74E-09 -3.84E-09 -3.40E-09 3.30E-10 -2.50E-09 24-hr Anneal 225 6.09E-09 -4.20E-10 -2.89E-09 6.34E-09 -3.94E-09 -7.70E-10 -4.29E-09 2.54E-09 -6.81E-09 -6.59E-09 1.20E-10 -2.47E-09 168-hr Anneal 250 6.37E-09 2.82E-09 2.80E-10 6.90E-09 -3.90E-10 2.91E-09 -7.30E-10 3.87E-09 -2.99E-09 -5.07E-09 0.00E+00 -2.53E-09 1.32E-09 4.74E-09 1.43E-08 -1.17E-08 1.71E-09 5.68E-09 1.73E-08 -1.39E-08 1.04E-09 4.90E-09 1.45E-08 -1.24E-08 3.20E-09 3.37E-09 1.24E-08 -6.03E-09 -9.00E-11 3.10E-09 8.41E-09 -8.59E-09 -1.00E-07 PASS 1.00E-07 PASS -2.58E-10 3.66E-09 9.77E-09 -1.03E-08 -1.00E-07 PASS 1.00E-07 PASS -3.18E-09 4.02E-09 7.83E-09 -1.42E-08 -1.00E-07 PASS 1.00E-07 PASS -4.02E-10 3.80E-09 1.00E-08 -1.08E-08 -1.00E-07 PASS 1.00E-07 PASS 0 6.41E-09 4.05E-09 2.06E-09 6.50E-09 9.50E-10 3.58E-09 -4.10E-10 4.51E-09 -3.20E-10 -3.34E-09 1.21E-09 -1.92E-09 Total 20 6.19E-09 2.85E-09 6.40E-10 6.40E-09 -7.10E-10 3.86E-09 -6.10E-10 4.32E-09 -1.68E-09 -4.17E-09 6.50E-10 -2.39E-09 Dose (krad(Si)) 50 100 5.50E-09 5.12E-09 2.36E-09 -2.76E-09 -6.90E-10 -3.60E-10 6.21E-09 7.49E-09 -1.14E-09 -2.90E-09 4.05E-09 2.22E-09 -8.70E-10 2.20E-10 4.03E-09 3.56E-09 -3.29E-09 -3.27E-09 -4.84E-09 -3.18E-09 5.70E-10 4.20E-10 -2.37E-09 -2.52E-09 3.99E-09 2.51E-09 1.09E-08 -2.88E-09 3.07E-09 3.20E-09 1.19E-08 -5.71E-09 2.45E-09 3.40E-09 1.18E-08 -6.87E-09 8.04E-10 3.22E-09 9.62E-09 -8.01E-09 -7.00E-08 PASS 7.00E-08 PASS 3.44E-10 3.66E-09 1.04E-08 -9.69E-09 -1.00E-07 PASS 1.00E-07 PASS -1.84E-10 4.11E-09 1.11E-08 -1.14E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 91 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.41. Plot of Input Offset Current3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 92 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.41. Raw data for Input Offset Current3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current3_3 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -8.16E-09 -5.18E-09 -1.61E-09 -5.42E-09 -9.70E-10 7.27E-09 4.22E-09 -5.10E-10 1.28E-09 -1.22E-09 4.40E-10 -3.45E-09 24-hr Anneal 225 -9.05E-09 -4.37E-09 -3.15E-09 -6.19E-09 -9.10E-10 3.20E-09 6.50E-10 -2.07E-09 -1.97E-09 -3.89E-09 4.40E-10 -3.49E-09 168-hr Anneal 250 -6.73E-09 -3.14E-09 -5.20E-10 -4.91E-09 7.60E-10 2.12E-09 1.87E-09 1.61E-09 -2.85E-09 -1.18E-09 3.00E-10 -3.57E-09 -4.14E-09 3.28E-09 4.86E-09 -1.31E-08 -4.27E-09 2.97E-09 3.87E-09 -1.24E-08 -4.73E-09 3.08E-09 3.72E-09 -1.32E-08 -2.91E-09 3.08E-09 5.52E-09 -1.13E-08 1.76E-09 3.05E-09 1.01E-08 -6.60E-09 -1.00E-07 PASS 1.00E-07 PASS 2.21E-09 3.52E-09 1.19E-08 -7.45E-09 -1.00E-07 PASS 1.00E-07 PASS -8.16E-10 2.77E-09 6.77E-09 -8.40E-09 -1.00E-07 PASS 1.00E-07 PASS 3.14E-10 2.21E-09 6.38E-09 -5.76E-09 -1.00E-07 PASS 1.00E-07 PASS 0 -6.55E-09 -3.33E-09 -4.00E-10 -3.69E-09 9.50E-10 3.14E-09 2.09E-09 2.94E-09 -1.43E-09 -3.60E-10 1.03E-09 -3.08E-09 Total 20 -7.69E-09 -2.52E-09 -6.40E-10 -4.54E-09 7.30E-10 3.33E-09 2.45E-09 2.03E-09 -1.45E-09 -9.70E-10 9.60E-10 -3.01E-09 Dose (krad(Si)) 50 100 -7.39E-09 -8.12E-09 -9.50E-10 -5.97E-09 -9.40E-10 -1.89E-09 -5.60E-09 -4.88E-09 2.70E-10 1.40E-10 3.72E-09 6.13E-09 3.82E-09 3.58E-09 2.22E-09 3.20E-10 -1.64E-09 2.00E-10 -1.18E-09 -1.44E-09 9.20E-10 7.00E-10 -3.10E-09 -3.23E-09 -2.60E-09 2.95E-09 5.48E-09 -1.07E-08 -2.93E-09 3.32E-09 6.17E-09 -1.20E-08 -2.92E-09 3.36E-09 6.29E-09 -1.21E-08 1.28E-09 2.06E-09 6.91E-09 -4.36E-09 -7.00E-08 PASS 7.00E-08 PASS 1.08E-09 2.15E-09 6.97E-09 -4.81E-09 -1.00E-07 PASS 1.00E-07 PASS 1.39E-09 2.64E-09 8.62E-09 -5.84E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 93 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.42. Plot of Input Offset Current3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 94 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.42. Raw data for Input Offset Current3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current3_4 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 9.60E-10 4.30E-10 -3.69E-09 3.26E-09 -3.05E-09 3.70E-09 8.40E-10 -5.80E-10 3.29E-09 2.95E-09 1.10E-10 -4.52E-09 24-hr Anneal 225 3.40E-10 -9.60E-10 -4.01E-09 6.10E-10 -4.53E-09 -3.00E-11 -2.00E-11 -2.79E-09 1.21E-09 1.42E-09 0.00E+00 -4.61E-09 168-hr Anneal 250 6.80E-10 3.40E-10 -2.50E-09 2.61E-09 -7.30E-10 1.25E-09 3.34E-09 2.13E-09 4.80E-10 1.66E-09 -9.00E-11 -4.74E-09 -7.66E-10 2.69E-09 6.62E-09 -8.15E-09 -4.18E-10 2.91E-09 7.55E-09 -8.39E-09 -1.71E-09 2.42E-09 4.92E-09 -8.34E-09 8.00E-11 1.88E-09 5.24E-09 -5.08E-09 2.63E-09 1.18E-09 5.86E-09 -5.97E-10 -1.00E-07 PASS 1.00E-07 PASS 2.04E-09 1.83E-09 7.07E-09 -2.99E-09 -1.00E-07 PASS 1.00E-07 PASS -4.20E-11 1.68E-09 4.56E-09 -4.64E-09 -1.00E-07 PASS 1.00E-07 PASS 1.77E-09 1.07E-09 4.69E-09 -1.15E-09 -1.00E-07 PASS 1.00E-07 PASS 0 1.13E-09 1.96E-09 -1.08E-09 2.73E-09 -2.90E-10 1.97E-09 4.12E-09 3.87E-09 1.41E-09 2.62E-09 9.80E-10 -3.37E-09 Total 20 1.18E-09 1.99E-09 -2.02E-09 2.11E-09 -2.50E-10 1.76E-09 4.31E-09 2.93E-09 9.80E-10 2.62E-09 4.90E-10 -4.29E-09 Dose (krad(Si)) 50 100 1.36E-09 1.46E-09 8.00E-10 -3.14E-09 -3.72E-09 -3.61E-09 5.20E-10 2.44E-09 -6.00E-10 -9.80E-10 3.99E-09 3.58E-09 3.24E-09 3.80E-09 2.44E-09 8.60E-10 1.02E-09 2.65E-09 1.70E-09 2.26E-09 3.20E-10 1.90E-10 -4.37E-09 -4.36E-09 8.90E-10 1.57E-09 5.20E-09 -3.42E-09 6.02E-10 1.74E-09 5.38E-09 -4.17E-09 -3.28E-10 2.03E-09 5.23E-09 -5.88E-09 2.80E-09 1.18E-09 6.03E-09 -4.29E-10 -7.00E-08 PASS 7.00E-08 PASS 2.52E-09 1.26E-09 5.97E-09 -9.30E-10 -1.00E-07 PASS 1.00E-07 PASS 2.48E-09 1.18E-09 5.72E-09 -7.66E-10 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 95 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.43. Plot of +Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 96 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.43. Raw data for +Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.69E-07 -4.57E-07 -4.67E-07 -4.63E-07 -4.58E-07 -5.14E-07 -4.88E-07 -4.36E-07 -4.55E-07 -4.56E-07 -3.54E-07 -3.74E-07 24-hr Anneal 225 -4.35E-07 -4.23E-07 -4.33E-07 -4.28E-07 -4.27E-07 -4.97E-07 -4.72E-07 -4.22E-07 -4.40E-07 -4.45E-07 -3.54E-07 -3.72E-07 168-hr Anneal 250 -3.98E-07 -3.87E-07 -3.94E-07 -3.88E-07 -3.88E-07 -4.31E-07 -4.17E-07 -3.67E-07 -3.85E-07 -3.90E-07 -3.55E-07 -3.75E-07 -4.30E-07 5.52E-09 -4.15E-07 -4.45E-07 -4.63E-07 5.24E-09 -4.49E-07 -4.77E-07 -4.29E-07 4.77E-09 -4.16E-07 -4.42E-07 -3.91E-07 4.75E-09 -3.78E-07 -4.04E-07 -4.26E-07 2.90E-08 -3.46E-07 -5.05E-07 -9.15E-07 PASS 9.15E-07 PASS -4.70E-07 3.09E-08 -3.85E-07 -5.54E-07 -9.65E-07 PASS 9.65E-07 PASS -4.55E-07 2.96E-08 -3.74E-07 -5.37E-07 -9.65E-07 PASS 9.65E-07 PASS -3.98E-07 2.56E-08 -3.28E-07 -4.69E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.72E-07 -3.66E-07 -3.72E-07 -3.63E-07 -3.67E-07 -3.90E-07 -3.79E-07 -3.23E-07 -3.39E-07 -3.53E-07 -3.53E-07 -3.74E-07 Total 20 -3.96E-07 -3.89E-07 -3.94E-07 -3.85E-07 -3.85E-07 -4.09E-07 -3.99E-07 -3.47E-07 -3.64E-07 -3.70E-07 -3.54E-07 -3.74E-07 Dose (krad(Si)) 50 100 -4.11E-07 -4.38E-07 -4.07E-07 -4.26E-07 -4.15E-07 -4.34E-07 -4.03E-07 -4.26E-07 -4.04E-07 -4.27E-07 -4.34E-07 -4.64E-07 -4.18E-07 -4.47E-07 -3.68E-07 -3.93E-07 -3.86E-07 -4.09E-07 -3.88E-07 -4.15E-07 -3.52E-07 -3.55E-07 -3.74E-07 -3.71E-07 -3.68E-07 3.88E-09 -3.57E-07 -3.79E-07 -3.90E-07 4.82E-09 -3.76E-07 -4.03E-07 -4.08E-07 5.06E-09 -3.94E-07 -4.22E-07 -3.57E-07 2.76E-08 -2.81E-07 -4.33E-07 -7.15E-07 PASS 7.15E-07 PASS -3.78E-07 2.56E-08 -3.08E-07 -4.48E-07 -8.15E-07 PASS 8.17E-07 PASS -3.99E-07 2.68E-08 -3.25E-07 -4.72E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 97 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.44. Plot of +Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 98 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.44. Raw data for +Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.57E-07 -4.60E-07 -4.58E-07 -4.26E-07 -4.59E-07 -4.62E-07 -4.64E-07 -4.43E-07 -4.58E-07 -4.70E-07 -3.35E-07 -3.58E-07 24-hr Anneal 225 -4.21E-07 -4.26E-07 -4.25E-07 -3.94E-07 -4.21E-07 -4.47E-07 -4.50E-07 -4.29E-07 -4.44E-07 -4.56E-07 -3.36E-07 -3.59E-07 168-hr Anneal 250 -3.85E-07 -3.83E-07 -3.85E-07 -3.59E-07 -3.81E-07 -3.90E-07 -3.95E-07 -3.73E-07 -3.86E-07 -4.01E-07 -3.36E-07 -3.59E-07 -4.18E-07 1.35E-08 -3.81E-07 -4.55E-07 -4.52E-07 1.47E-08 -4.12E-07 -4.92E-07 -4.17E-07 1.32E-08 -3.81E-07 -4.54E-07 -3.79E-07 1.10E-08 -3.48E-07 -4.09E-07 -4.16E-07 9.43E-09 -3.91E-07 -4.42E-07 -9.15E-07 PASS 9.15E-07 PASS -4.59E-07 1.01E-08 -4.32E-07 -4.87E-07 -9.65E-07 PASS 9.65E-07 PASS -4.45E-07 9.93E-09 -4.18E-07 -4.72E-07 -9.65E-07 PASS 9.65E-07 PASS -3.89E-07 1.05E-08 -3.60E-07 -4.18E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.57E-07 -3.60E-07 -3.62E-07 -3.34E-07 -3.58E-07 -3.53E-07 -3.57E-07 -3.29E-07 -3.48E-07 -3.63E-07 -3.35E-07 -3.58E-07 Total 20 -3.81E-07 -3.82E-07 -3.85E-07 -3.55E-07 -3.79E-07 -3.69E-07 -3.76E-07 -3.54E-07 -3.65E-07 -3.81E-07 -3.35E-07 -3.59E-07 Dose (krad(Si)) 50 100 -3.99E-07 -4.25E-07 -4.02E-07 -4.22E-07 -4.04E-07 -4.26E-07 -3.75E-07 -3.94E-07 -3.99E-07 -4.22E-07 -3.92E-07 -4.18E-07 -3.97E-07 -4.24E-07 -3.78E-07 -4.02E-07 -3.87E-07 -4.12E-07 -4.01E-07 -4.26E-07 -3.35E-07 -3.35E-07 -3.58E-07 -3.58E-07 -3.54E-07 1.16E-08 -3.22E-07 -3.86E-07 -3.77E-07 1.20E-08 -3.44E-07 -4.10E-07 -3.96E-07 1.17E-08 -3.64E-07 -4.28E-07 -3.50E-07 1.32E-08 -3.14E-07 -3.86E-07 -7.15E-07 PASS 7.15E-07 PASS -3.69E-07 1.04E-08 -3.40E-07 -3.97E-07 -8.15E-07 PASS 8.17E-07 PASS -3.91E-07 8.98E-09 -3.67E-07 -4.16E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 99 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.45. Plot of +Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 100 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.45. Raw data for +Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.60E-07 -4.60E-07 -4.57E-07 -4.51E-07 -4.49E-07 -4.67E-07 -4.63E-07 -4.42E-07 -4.58E-07 -4.78E-07 -3.33E-07 -3.62E-07 24-hr Anneal 225 -4.26E-07 -4.28E-07 -4.25E-07 -4.17E-07 -4.15E-07 -4.52E-07 -4.48E-07 -4.30E-07 -4.46E-07 -4.66E-07 -3.33E-07 -3.61E-07 168-hr Anneal 250 -3.86E-07 -3.90E-07 -3.87E-07 -3.74E-07 -3.80E-07 -3.95E-07 -3.95E-07 -3.77E-07 -3.93E-07 -4.08E-07 -3.34E-07 -3.62E-07 -4.22E-07 5.20E-09 -4.08E-07 -4.37E-07 -4.56E-07 4.92E-09 -4.42E-07 -4.69E-07 -4.22E-07 5.76E-09 -4.07E-07 -4.38E-07 -3.83E-07 6.33E-09 -3.66E-07 -4.01E-07 -4.19E-07 1.20E-08 -3.86E-07 -4.52E-07 -9.15E-07 PASS 9.15E-07 PASS -4.62E-07 1.30E-08 -4.26E-07 -4.97E-07 -9.65E-07 PASS 9.65E-07 PASS -4.48E-07 1.28E-08 -4.13E-07 -4.84E-07 -9.65E-07 PASS 9.65E-07 PASS -3.94E-07 1.09E-08 -3.64E-07 -4.24E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.64E-07 -3.68E-07 -3.65E-07 -3.50E-07 -3.57E-07 -3.54E-07 -3.59E-07 -3.32E-07 -3.54E-07 -3.70E-07 -3.32E-07 -3.60E-07 Total 20 -3.86E-07 -3.88E-07 -3.87E-07 -3.73E-07 -3.77E-07 -3.73E-07 -3.76E-07 -3.55E-07 -3.73E-07 -3.87E-07 -3.33E-07 -3.61E-07 Dose (krad(Si)) 50 100 -4.04E-07 -4.29E-07 -4.07E-07 -4.25E-07 -4.06E-07 -4.25E-07 -3.95E-07 -4.18E-07 -3.96E-07 -4.16E-07 -3.94E-07 -4.22E-07 -3.94E-07 -4.22E-07 -3.76E-07 -4.02E-07 -3.90E-07 -4.13E-07 -4.06E-07 -4.34E-07 -3.33E-07 -3.32E-07 -3.60E-07 -3.59E-07 -3.61E-07 7.17E-09 -3.41E-07 -3.81E-07 -3.82E-07 7.04E-09 -3.63E-07 -4.01E-07 -4.01E-07 5.65E-09 -3.86E-07 -4.17E-07 -3.54E-07 1.37E-08 -3.16E-07 -3.91E-07 -7.15E-07 PASS 7.15E-07 PASS -3.73E-07 1.16E-08 -3.41E-07 -4.04E-07 -8.15E-07 PASS 8.17E-07 PASS -3.92E-07 1.07E-08 -3.63E-07 -4.21E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 101 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.46. Plot of +Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 102 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.46. Raw data for +Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.85E-07 -4.60E-07 -4.71E-07 -4.55E-07 -4.61E-07 -4.91E-07 -4.95E-07 -4.41E-07 -4.52E-07 -4.61E-07 -3.53E-07 -3.67E-07 24-hr Anneal 225 -4.47E-07 -4.26E-07 -4.34E-07 -4.18E-07 -4.27E-07 -4.78E-07 -4.77E-07 -4.27E-07 -4.39E-07 -4.49E-07 -3.53E-07 -3.66E-07 168-hr Anneal 250 -4.05E-07 -3.84E-07 -3.93E-07 -3.81E-07 -3.86E-07 -4.18E-07 -4.19E-07 -3.70E-07 -3.87E-07 -3.93E-07 -3.52E-07 -3.67E-07 -4.32E-07 1.19E-08 -3.99E-07 -4.64E-07 -4.66E-07 1.17E-08 -4.34E-07 -4.98E-07 -4.30E-07 1.08E-08 -4.01E-07 -4.60E-07 -3.90E-07 9.52E-09 -3.64E-07 -4.16E-07 -4.25E-07 2.30E-08 -3.62E-07 -4.88E-07 -9.15E-07 PASS 9.15E-07 PASS -4.68E-07 2.39E-08 -4.03E-07 -5.34E-07 -9.65E-07 PASS 9.65E-07 PASS -4.54E-07 2.29E-08 -3.91E-07 -5.17E-07 -9.65E-07 PASS 9.65E-07 PASS -3.98E-07 2.11E-08 -3.40E-07 -4.55E-07 -9.65E-07 PASS 9.65E-07 PASS 0 -3.76E-07 -3.64E-07 -3.66E-07 -3.62E-07 -3.60E-07 -3.78E-07 -3.79E-07 -3.25E-07 -3.47E-07 -3.53E-07 -3.49E-07 -3.64E-07 Total 20 -4.02E-07 -3.84E-07 -3.93E-07 -3.79E-07 -3.82E-07 -3.97E-07 -3.99E-07 -3.49E-07 -3.65E-07 -3.71E-07 -3.51E-07 -3.65E-07 Dose (krad(Si)) 50 100 -4.22E-07 -4.49E-07 -4.04E-07 -4.25E-07 -4.13E-07 -4.38E-07 -3.99E-07 -4.19E-07 -4.03E-07 -4.27E-07 -4.19E-07 -4.47E-07 -4.21E-07 -4.52E-07 -3.70E-07 -4.00E-07 -3.86E-07 -4.09E-07 -3.93E-07 -4.17E-07 -3.50E-07 -3.51E-07 -3.65E-07 -3.65E-07 -3.65E-07 6.11E-09 -3.49E-07 -3.82E-07 -3.88E-07 9.24E-09 -3.63E-07 -4.13E-07 -4.08E-07 9.45E-09 -3.82E-07 -4.34E-07 -3.57E-07 2.26E-08 -2.95E-07 -4.18E-07 -7.15E-07 PASS 7.15E-07 PASS -3.76E-07 2.13E-08 -3.18E-07 -4.35E-07 -8.15E-07 PASS 8.17E-07 PASS -3.98E-07 2.19E-08 -3.38E-07 -4.58E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 103 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.47. Plot of -Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 104 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.47. Raw data for -Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.16E-07 4.43E-07 4.10E-07 4.25E-07 4.16E-07 4.37E-07 4.08E-07 4.31E-07 4.08E-07 4.32E-07 4.38E-07 4.68E-07 4.15E-07 4.43E-07 3.71E-07 3.99E-07 3.87E-07 4.11E-07 3.96E-07 4.21E-07 3.51E-07 3.53E-07 3.66E-07 3.64E-07 200 4.76E-07 4.62E-07 4.68E-07 4.65E-07 4.65E-07 5.19E-07 4.87E-07 4.37E-07 4.57E-07 4.65E-07 3.53E-07 3.66E-07 24-hr Anneal 225 4.40E-07 4.27E-07 4.34E-07 4.30E-07 4.29E-07 4.98E-07 4.68E-07 4.24E-07 4.43E-07 4.49E-07 3.53E-07 3.66E-07 168-hr Anneal 250 4.01E-07 3.87E-07 3.97E-07 3.90E-07 3.93E-07 4.34E-07 4.14E-07 3.70E-07 3.89E-07 3.95E-07 3.54E-07 3.69E-07 0 3.75E-07 3.70E-07 3.74E-07 3.64E-07 3.71E-07 3.94E-07 3.77E-07 3.26E-07 3.49E-07 3.59E-07 3.52E-07 3.65E-07 Total 20 3.98E-07 3.90E-07 3.95E-07 3.86E-07 3.91E-07 4.13E-07 3.96E-07 3.51E-07 3.67E-07 3.75E-07 3.53E-07 3.65E-07 3.71E-07 4.34E-09 3.83E-07 3.59E-07 3.92E-07 4.79E-09 4.05E-07 3.79E-07 4.12E-07 4.01E-09 4.23E-07 4.01E-07 4.34E-07 6.61E-09 4.52E-07 4.15E-07 4.67E-07 5.24E-09 4.82E-07 4.53E-07 4.32E-07 4.83E-09 4.45E-07 4.19E-07 3.94E-07 5.65E-09 4.09E-07 3.78E-07 3.61E-07 2.62E-08 4.33E-07 2.89E-07 -7.15E-07 PASS 7.15E-07 PASS 3.80E-07 2.45E-08 4.47E-07 3.13E-07 -8.15E-07 PASS 8.17E-07 PASS 4.01E-07 2.59E-08 4.73E-07 3.30E-07 -8.65E-07 PASS 8.65E-07 PASS 4.28E-07 2.76E-08 5.04E-07 3.53E-07 -9.15E-07 PASS 9.15E-07 PASS 4.73E-07 3.13E-08 5.59E-07 3.87E-07 -9.65E-07 PASS 9.65E-07 PASS 4.56E-07 2.82E-08 5.34E-07 3.79E-07 -9.65E-07 PASS 9.65E-07 PASS 4.00E-07 2.43E-08 4.67E-07 3.34E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 105 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.48. Plot of -Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 106 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.48. Raw data for -Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.09E-07 4.36E-07 4.10E-07 4.24E-07 4.09E-07 4.29E-07 3.86E-07 4.06E-07 4.01E-07 4.23E-07 4.00E-07 4.24E-07 3.98E-07 4.25E-07 3.82E-07 4.13E-07 3.88E-07 4.13E-07 4.02E-07 4.27E-07 3.36E-07 3.35E-07 3.60E-07 3.59E-07 200 4.70E-07 4.65E-07 4.60E-07 4.38E-07 4.55E-07 4.66E-07 4.65E-07 4.51E-07 4.58E-07 4.69E-07 3.36E-07 3.60E-07 24-hr Anneal 225 4.32E-07 4.29E-07 4.26E-07 4.05E-07 4.21E-07 4.50E-07 4.49E-07 4.36E-07 4.43E-07 4.55E-07 3.36E-07 3.60E-07 168-hr Anneal 250 3.93E-07 3.90E-07 3.88E-07 3.71E-07 3.85E-07 3.97E-07 4.00E-07 3.83E-07 3.88E-07 3.99E-07 3.36E-07 3.60E-07 0 3.66E-07 3.70E-07 3.68E-07 3.39E-07 3.62E-07 3.60E-07 3.61E-07 3.32E-07 3.51E-07 3.61E-07 3.35E-07 3.59E-07 Total 20 3.91E-07 3.90E-07 3.89E-07 3.66E-07 3.83E-07 3.77E-07 3.80E-07 3.60E-07 3.69E-07 3.81E-07 3.35E-07 3.60E-07 3.61E-07 1.24E-08 3.95E-07 3.27E-07 3.84E-07 1.05E-08 4.13E-07 3.55E-07 4.03E-07 1.02E-08 4.31E-07 3.75E-07 4.24E-07 1.10E-08 4.54E-07 3.93E-07 4.58E-07 1.22E-08 4.91E-07 4.24E-07 4.23E-07 1.04E-08 4.51E-07 3.94E-07 3.86E-07 8.77E-09 4.10E-07 3.62E-07 3.53E-07 1.25E-08 3.87E-07 3.19E-07 -7.15E-07 PASS 7.15E-07 PASS 3.73E-07 8.78E-09 3.97E-07 3.49E-07 -8.15E-07 PASS 8.17E-07 PASS 3.94E-07 8.44E-09 4.17E-07 3.71E-07 -8.65E-07 PASS 8.65E-07 PASS 4.20E-07 6.84E-09 4.39E-07 4.01E-07 -9.15E-07 PASS 9.15E-07 PASS 4.62E-07 7.40E-09 4.82E-07 4.42E-07 -9.65E-07 PASS 9.65E-07 PASS 4.47E-07 7.28E-09 4.67E-07 4.27E-07 -9.65E-07 PASS 9.65E-07 PASS 3.94E-07 7.68E-09 4.15E-07 3.73E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 107 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.49. Plot of -Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 108 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.49. Raw data for -Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 3.98E-07 4.23E-07 4.06E-07 4.20E-07 4.06E-07 4.26E-07 3.91E-07 4.14E-07 3.97E-07 4.20E-07 4.00E-07 4.29E-07 3.98E-07 4.26E-07 3.79E-07 4.05E-07 3.91E-07 4.16E-07 4.09E-07 4.33E-07 3.33E-07 3.33E-07 3.59E-07 3.59E-07 200 4.53E-07 4.57E-07 4.59E-07 4.48E-07 4.49E-07 4.73E-07 4.67E-07 4.43E-07 4.60E-07 4.78E-07 3.33E-07 3.60E-07 24-hr Anneal 225 4.19E-07 4.25E-07 4.24E-07 4.13E-07 4.17E-07 4.56E-07 4.50E-07 4.29E-07 4.44E-07 4.62E-07 3.33E-07 3.59E-07 168-hr Anneal 250 3.83E-07 3.87E-07 3.86E-07 3.71E-07 3.81E-07 3.99E-07 3.97E-07 3.79E-07 3.89E-07 4.07E-07 3.34E-07 3.60E-07 0 3.59E-07 3.66E-07 3.65E-07 3.41E-07 3.57E-07 3.58E-07 3.61E-07 3.34E-07 3.54E-07 3.68E-07 3.33E-07 3.58E-07 Total 20 3.80E-07 3.88E-07 3.88E-07 3.69E-07 3.79E-07 3.77E-07 3.80E-07 3.59E-07 3.72E-07 3.88E-07 3.33E-07 3.59E-07 3.58E-07 1.04E-08 3.86E-07 3.29E-07 3.81E-07 7.65E-09 4.02E-07 3.60E-07 4.00E-07 6.50E-09 4.17E-07 3.82E-07 4.21E-07 4.69E-09 4.33E-07 4.08E-07 4.53E-07 4.65E-09 4.66E-07 4.40E-07 4.20E-07 5.10E-09 4.34E-07 4.06E-07 3.81E-07 6.36E-09 3.99E-07 3.64E-07 3.55E-07 1.28E-08 3.90E-07 3.20E-07 -7.15E-07 PASS 7.15E-07 PASS 3.75E-07 1.10E-08 4.05E-07 3.45E-07 -8.15E-07 PASS 8.17E-07 PASS 3.95E-07 1.09E-08 4.25E-07 3.65E-07 -8.65E-07 PASS 8.65E-07 PASS 4.22E-07 1.14E-08 4.53E-07 3.90E-07 -9.15E-07 PASS 9.15E-07 PASS 4.64E-07 1.36E-08 5.02E-07 4.27E-07 -9.65E-07 PASS 9.65E-07 PASS 4.48E-07 1.27E-08 4.83E-07 4.13E-07 -9.65E-07 PASS 9.65E-07 PASS 3.94E-07 1.08E-08 4.24E-07 3.65E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 109 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.50. Plot of -Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 110 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.50. Raw data for -Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.26E-07 4.56E-07 4.10E-07 4.26E-07 4.16E-07 4.38E-07 4.06E-07 4.29E-07 4.06E-07 4.29E-07 4.26E-07 4.55E-07 4.28E-07 4.57E-07 3.75E-07 4.03E-07 3.92E-07 4.15E-07 3.97E-07 4.24E-07 3.56E-07 3.56E-07 3.67E-07 3.65E-07 200 4.92E-07 4.64E-07 4.73E-07 4.63E-07 4.62E-07 4.99E-07 5.00E-07 4.44E-07 4.58E-07 4.66E-07 3.56E-07 3.66E-07 24-hr Anneal 225 4.50E-07 4.29E-07 4.36E-07 4.26E-07 4.26E-07 4.83E-07 4.83E-07 4.28E-07 4.45E-07 4.53E-07 3.55E-07 3.66E-07 168-hr Anneal 250 4.08E-07 3.89E-07 3.95E-07 3.88E-07 3.89E-07 4.24E-07 4.28E-07 3.76E-07 3.92E-07 4.00E-07 3.56E-07 3.66E-07 0 3.81E-07 3.70E-07 3.71E-07 3.66E-07 3.63E-07 3.85E-07 3.88E-07 3.29E-07 3.54E-07 3.60E-07 3.55E-07 3.65E-07 Total 20 4.07E-07 3.90E-07 3.95E-07 3.85E-07 3.87E-07 4.03E-07 4.07E-07 3.56E-07 3.71E-07 3.78E-07 3.56E-07 3.66E-07 3.70E-07 6.85E-09 3.89E-07 3.51E-07 3.93E-07 8.64E-09 4.17E-07 3.69E-07 4.13E-07 8.69E-09 4.36E-07 3.89E-07 4.35E-07 1.22E-08 4.69E-07 4.02E-07 4.71E-07 1.28E-08 5.06E-07 4.36E-07 4.33E-07 9.82E-09 4.60E-07 4.06E-07 3.94E-07 8.49E-09 4.17E-07 3.71E-07 3.63E-07 2.44E-08 4.30E-07 2.96E-07 -7.15E-07 PASS 7.15E-07 PASS 3.83E-07 2.17E-08 4.43E-07 3.24E-07 -8.15E-07 PASS 8.17E-07 PASS 4.04E-07 2.29E-08 4.66E-07 3.41E-07 -8.65E-07 PASS 8.65E-07 PASS 4.31E-07 2.43E-08 4.98E-07 3.64E-07 -9.15E-07 PASS 9.15E-07 PASS 4.74E-07 2.51E-08 5.42E-07 4.05E-07 -9.65E-07 PASS 9.65E-07 PASS 4.58E-07 2.41E-08 5.24E-07 3.92E-07 -9.65E-07 PASS 9.65E-07 PASS 4.04E-07 2.18E-08 4.63E-07 3.44E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DLA Certified Company 111 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.51. Plot of Output Voltage Swing High1_1 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 112 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.51. Raw data for Output Voltage Swing High1_1 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High1_1 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 5.97E-03 5.95E-03 5.98E-03 6.00E-03 6.13E-03 6.44E-03 6.64E-03 6.26E-03 6.16E-03 6.48E-03 5.18E-03 5.27E-03 24-hr Anneal 225 5.60E-03 5.88E-03 5.83E-03 5.75E-03 5.93E-03 6.23E-03 6.37E-03 6.03E-03 5.90E-03 6.34E-03 5.20E-03 5.13E-03 168-hr Anneal 250 5.38E-03 5.50E-03 5.41E-03 5.46E-03 5.62E-03 5.43E-03 5.98E-03 5.55E-03 5.42E-03 5.84E-03 5.24E-03 5.35E-03 5.77E-03 1.02E-04 6.05E-03 5.49E-03 6.01E-03 7.16E-05 6.20E-03 5.81E-03 5.80E-03 1.29E-04 6.15E-03 5.44E-03 5.47E-03 9.37E-05 5.73E-03 5.22E-03 5.90E-03 1.68E-04 6.36E-03 5.44E-03 2.00E-02 PASS 6.40E-03 1.89E-04 6.91E-03 5.88E-03 2.00E-02 PASS 6.17E-03 2.03E-04 6.73E-03 5.62E-03 2.00E-02 PASS 5.64E-03 2.53E-04 6.34E-03 4.95E-03 2.00E-02 PASS 0 5.36E-03 5.42E-03 5.28E-03 5.43E-03 5.42E-03 5.29E-03 5.53E-03 5.18E-03 5.17E-03 5.44E-03 5.20E-03 5.26E-03 Total 20 5.15E-03 5.42E-03 5.42E-03 5.43E-03 5.58E-03 5.44E-03 5.60E-03 5.36E-03 5.31E-03 5.48E-03 5.14E-03 5.26E-03 Dose (krad(Si)) 50 100 5.53E-03 5.70E-03 5.69E-03 5.91E-03 5.42E-03 5.65E-03 5.71E-03 5.77E-03 5.67E-03 5.82E-03 5.54E-03 5.93E-03 5.88E-03 6.14E-03 5.47E-03 5.76E-03 5.51E-03 5.72E-03 5.61E-03 5.95E-03 5.17E-03 5.17E-03 5.26E-03 5.21E-03 5.38E-03 6.34E-05 5.56E-03 5.21E-03 5.40E-03 1.55E-04 5.83E-03 4.97E-03 5.60E-03 1.25E-04 5.95E-03 5.26E-03 5.32E-03 1.59E-04 5.76E-03 4.89E-03 1.00E-02 PASS 5.44E-03 1.12E-04 5.75E-03 5.13E-03 2.00E-02 PASS 5.60E-03 1.64E-04 6.05E-03 5.15E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 113 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.52. Plot of Output Voltage Swing High1_2 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 114 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.52. Raw data for Output Voltage Swing High1_2 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High1_2 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 6.23E-03 6.27E-03 6.21E-03 6.01E-03 6.24E-03 6.56E-03 6.74E-03 6.29E-03 6.69E-03 6.82E-03 5.25E-03 5.23E-03 24-hr Anneal 225 6.04E-03 5.97E-03 6.00E-03 5.77E-03 5.99E-03 6.42E-03 6.59E-03 6.09E-03 6.35E-03 6.59E-03 5.40E-03 5.11E-03 168-hr Anneal 250 5.62E-03 5.79E-03 5.62E-03 5.50E-03 5.58E-03 5.85E-03 5.95E-03 5.67E-03 5.75E-03 6.03E-03 5.30E-03 5.39E-03 5.94E-03 1.40E-04 6.32E-03 5.55E-03 6.19E-03 1.04E-04 6.48E-03 5.91E-03 5.95E-03 1.06E-04 6.24E-03 5.66E-03 5.62E-03 1.06E-04 5.91E-03 5.33E-03 6.08E-03 1.99E-04 6.63E-03 5.54E-03 2.00E-02 PASS 6.62E-03 2.07E-04 7.19E-03 6.05E-03 2.00E-02 PASS 6.41E-03 2.07E-04 6.97E-03 5.84E-03 2.00E-02 PASS 5.85E-03 1.46E-04 6.25E-03 5.45E-03 2.00E-02 PASS 0 5.41E-03 5.44E-03 5.44E-03 5.41E-03 5.36E-03 5.52E-03 5.60E-03 5.33E-03 5.46E-03 5.48E-03 5.27E-03 5.26E-03 Total 20 5.52E-03 5.74E-03 5.53E-03 5.50E-03 5.59E-03 5.65E-03 5.77E-03 5.46E-03 5.71E-03 5.58E-03 5.22E-03 5.11E-03 Dose (krad(Si)) 50 100 5.75E-03 5.92E-03 5.76E-03 6.11E-03 5.80E-03 6.04E-03 5.70E-03 5.84E-03 5.83E-03 5.77E-03 5.83E-03 6.09E-03 5.99E-03 6.19E-03 5.57E-03 5.75E-03 5.85E-03 6.12E-03 5.90E-03 6.27E-03 5.39E-03 5.40E-03 5.20E-03 5.31E-03 5.41E-03 3.27E-05 5.50E-03 5.32E-03 5.58E-03 9.76E-05 5.84E-03 5.31E-03 5.77E-03 4.97E-05 5.90E-03 5.63E-03 5.48E-03 9.86E-05 5.75E-03 5.21E-03 1.00E-02 PASS 5.63E-03 1.20E-04 5.96E-03 5.30E-03 2.00E-02 PASS 5.83E-03 1.57E-04 6.26E-03 5.40E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 115 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.53. Plot of Output Voltage Swing High1_3 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 116 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.53. Raw data for Output Voltage Swing High1_3 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High1_3 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 6.14E-03 6.18E-03 6.40E-03 5.96E-03 6.27E-03 6.62E-03 6.78E-03 6.07E-03 6.62E-03 6.73E-03 5.33E-03 5.28E-03 24-hr Anneal 225 5.91E-03 5.95E-03 6.11E-03 5.92E-03 6.14E-03 6.31E-03 6.46E-03 6.11E-03 6.42E-03 6.61E-03 5.28E-03 5.32E-03 168-hr Anneal 250 5.56E-03 5.58E-03 5.56E-03 5.47E-03 5.66E-03 5.78E-03 5.86E-03 5.50E-03 5.71E-03 6.05E-03 5.30E-03 5.37E-03 5.99E-03 1.42E-04 6.38E-03 5.60E-03 6.19E-03 1.63E-04 6.64E-03 5.74E-03 6.01E-03 1.10E-04 6.31E-03 5.70E-03 5.57E-03 6.77E-05 5.75E-03 5.38E-03 6.10E-03 2.04E-04 6.66E-03 5.54E-03 2.00E-02 PASS 6.56E-03 2.85E-04 7.35E-03 5.78E-03 2.00E-02 PASS 6.38E-03 1.86E-04 6.89E-03 5.87E-03 2.00E-02 PASS 5.78E-03 2.02E-04 6.33E-03 5.23E-03 2.00E-02 PASS 0 5.38E-03 5.61E-03 5.59E-03 5.42E-03 5.48E-03 5.56E-03 5.60E-03 5.29E-03 5.62E-03 5.59E-03 5.34E-03 5.35E-03 Total 20 5.46E-03 5.66E-03 5.79E-03 5.52E-03 5.58E-03 5.66E-03 5.80E-03 5.39E-03 5.66E-03 5.64E-03 5.31E-03 5.32E-03 Dose (krad(Si)) 50 100 5.85E-03 5.98E-03 5.70E-03 6.08E-03 5.90E-03 6.09E-03 5.76E-03 5.75E-03 5.72E-03 6.06E-03 5.90E-03 6.20E-03 6.00E-03 6.15E-03 5.53E-03 5.80E-03 5.79E-03 6.02E-03 5.95E-03 6.34E-03 5.28E-03 5.38E-03 5.27E-03 5.34E-03 5.50E-03 1.02E-04 5.77E-03 5.22E-03 5.60E-03 1.29E-04 5.95E-03 5.25E-03 5.79E-03 8.59E-05 6.02E-03 5.55E-03 5.53E-03 1.37E-04 5.91E-03 5.16E-03 1.00E-02 PASS 5.63E-03 1.49E-04 6.04E-03 5.22E-03 2.00E-02 PASS 5.83E-03 1.87E-04 6.35E-03 5.32E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 117 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.54. Plot of Output Voltage Swing High1_4 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 118 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.54. Raw data for Output Voltage Swing High1_4 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High1_4 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 6.14E-03 6.14E-03 6.08E-03 6.07E-03 6.12E-03 6.55E-03 6.75E-03 6.31E-03 6.13E-03 6.74E-03 5.38E-03 5.45E-03 24-hr Anneal 225 5.80E-03 6.02E-03 5.92E-03 5.84E-03 6.04E-03 6.42E-03 6.52E-03 6.04E-03 6.10E-03 6.40E-03 5.29E-03 5.33E-03 168-hr Anneal 250 5.32E-03 5.51E-03 5.46E-03 5.51E-03 5.57E-03 5.62E-03 5.93E-03 5.56E-03 5.50E-03 5.83E-03 5.30E-03 5.46E-03 5.84E-03 7.60E-05 6.05E-03 5.63E-03 6.11E-03 3.32E-05 6.20E-03 6.02E-03 5.92E-03 1.06E-04 6.22E-03 5.63E-03 5.47E-03 9.45E-05 5.73E-03 5.21E-03 6.01E-03 1.95E-04 6.54E-03 5.47E-03 2.00E-02 PASS 6.50E-03 2.72E-04 7.24E-03 5.75E-03 2.00E-02 PASS 6.30E-03 2.12E-04 6.88E-03 5.71E-03 2.00E-02 PASS 5.69E-03 1.84E-04 6.19E-03 5.18E-03 2.00E-02 PASS 0 5.24E-03 5.45E-03 5.44E-03 5.46E-03 5.52E-03 5.53E-03 5.65E-03 5.34E-03 5.40E-03 5.38E-03 5.34E-03 5.36E-03 Total 20 5.33E-03 5.58E-03 5.54E-03 5.53E-03 5.55E-03 5.59E-03 5.69E-03 5.41E-03 5.42E-03 5.68E-03 5.21E-03 5.34E-03 Dose (krad(Si)) 50 100 5.63E-03 5.77E-03 5.56E-03 5.93E-03 5.66E-03 5.88E-03 5.81E-03 5.75E-03 5.69E-03 5.86E-03 5.73E-03 6.13E-03 5.83E-03 6.14E-03 5.66E-03 5.87E-03 5.53E-03 5.73E-03 5.76E-03 6.16E-03 5.34E-03 5.28E-03 5.23E-03 5.39E-03 5.42E-03 1.06E-04 5.71E-03 5.13E-03 5.51E-03 1.00E-04 5.78E-03 5.23E-03 5.67E-03 9.19E-05 5.92E-03 5.42E-03 5.46E-03 1.28E-04 5.81E-03 5.11E-03 1.00E-02 PASS 5.56E-03 1.36E-04 5.93E-03 5.18E-03 2.00E-02 PASS 5.70E-03 1.14E-04 6.01E-03 5.39E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 119 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.55. Plot of Output Voltage Swing High2_1 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 120 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.55. Raw data for Output Voltage Swing High2_1 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High2_1 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.59E-02 7.91E-02 7.67E-02 7.88E-02 7.90E-02 7.58E-02 8.00E-02 7.63E-02 7.52E-02 7.98E-02 7.12E-02 7.26E-02 24-hr Anneal 225 7.57E-02 7.88E-02 7.63E-02 7.84E-02 7.85E-02 7.54E-02 7.97E-02 7.60E-02 7.46E-02 7.94E-02 7.12E-02 7.25E-02 168-hr Anneal 250 7.37E-02 7.70E-02 7.46E-02 7.68E-02 7.71E-02 7.40E-02 7.81E-02 7.48E-02 7.35E-02 7.81E-02 7.10E-02 7.27E-02 7.75E-02 1.79E-03 8.24E-02 7.26E-02 7.79E-02 1.49E-03 8.20E-02 7.38E-02 7.75E-02 1.47E-03 8.16E-02 7.35E-02 7.58E-02 1.56E-03 8.01E-02 7.15E-02 7.65E-02 2.34E-03 8.29E-02 7.00E-02 1.50E-01 PASS 7.74E-02 2.31E-03 8.37E-02 7.11E-02 1.50E-01 PASS 7.70E-02 2.37E-03 8.35E-02 7.05E-02 1.50E-01 PASS 7.57E-02 2.24E-03 8.18E-02 6.95E-02 1.50E-01 PASS 0 7.19E-02 7.52E-02 7.29E-02 7.49E-02 7.51E-02 7.28E-02 7.67E-02 7.34E-02 7.25E-02 7.64E-02 7.12E-02 7.26E-02 Total 20 7.35E-02 7.68E-02 7.45E-02 7.65E-02 7.65E-02 7.33E-02 7.74E-02 7.41E-02 7.30E-02 7.71E-02 7.11E-02 7.26E-02 Dose (krad(Si)) 50 100 7.46E-02 7.51E-02 7.75E-02 7.96E-02 7.51E-02 7.62E-02 7.75E-02 7.82E-02 7.76E-02 7.83E-02 7.39E-02 7.48E-02 7.81E-02 7.91E-02 7.49E-02 7.54E-02 7.35E-02 7.42E-02 7.79E-02 7.88E-02 7.11E-02 7.14E-02 7.25E-02 7.27E-02 7.40E-02 1.48E-03 7.81E-02 6.99E-02 7.56E-02 1.47E-03 7.96E-02 7.15E-02 7.65E-02 1.47E-03 8.05E-02 7.24E-02 7.44E-02 2.03E-03 7.99E-02 6.88E-02 1.50E-01 PASS 7.50E-02 2.12E-03 8.08E-02 6.92E-02 1.50E-01 PASS 7.57E-02 2.18E-03 8.16E-02 6.97E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 121 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.56. Plot of Output Voltage Swing High2_2 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 122 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.56. Raw data for Output Voltage Swing High2_2 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High2_2 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.82E-02 7.90E-02 7.94E-02 7.85E-02 7.99E-02 7.92E-02 8.12E-02 7.66E-02 8.00E-02 8.10E-02 7.26E-02 7.07E-02 24-hr Anneal 225 7.74E-02 7.89E-02 7.91E-02 7.82E-02 7.95E-02 7.89E-02 8.08E-02 7.61E-02 7.96E-02 8.07E-02 7.29E-02 7.07E-02 168-hr Anneal 250 7.59E-02 7.73E-02 7.74E-02 7.66E-02 7.77E-02 7.73E-02 7.93E-02 7.48E-02 7.80E-02 7.91E-02 7.27E-02 7.06E-02 7.86E-02 9.79E-04 8.13E-02 7.59E-02 7.90E-02 6.87E-04 8.09E-02 7.71E-02 7.86E-02 8.37E-04 8.09E-02 7.63E-02 7.70E-02 7.07E-04 7.89E-02 7.50E-02 7.85E-02 1.91E-03 8.37E-02 7.33E-02 1.50E-01 PASS 7.96E-02 1.88E-03 8.48E-02 7.44E-02 1.50E-01 PASS 7.92E-02 1.91E-03 8.45E-02 7.40E-02 1.50E-01 PASS 7.77E-02 1.82E-03 8.27E-02 7.27E-02 1.50E-01 PASS 0 7.41E-02 7.53E-02 7.55E-02 7.49E-02 7.57E-02 7.60E-02 7.77E-02 7.34E-02 7.67E-02 7.76E-02 7.26E-02 7.08E-02 Total 20 7.54E-02 7.69E-02 7.71E-02 7.63E-02 7.72E-02 7.67E-02 7.83E-02 7.40E-02 7.74E-02 7.82E-02 7.27E-02 7.06E-02 Dose (krad(Si)) 50 100 7.67E-02 7.73E-02 7.78E-02 7.96E-02 7.79E-02 7.90E-02 7.74E-02 7.79E-02 7.82E-02 7.91E-02 7.72E-02 7.83E-02 7.93E-02 8.01E-02 7.48E-02 7.54E-02 7.80E-02 7.90E-02 7.88E-02 7.98E-02 7.28E-02 7.28E-02 7.07E-02 7.09E-02 7.51E-02 6.50E-04 7.69E-02 7.33E-02 7.66E-02 7.40E-04 7.86E-02 7.46E-02 7.76E-02 5.78E-04 7.92E-02 7.60E-02 7.63E-02 1.75E-03 8.11E-02 7.15E-02 1.50E-01 PASS 7.69E-02 1.74E-03 8.17E-02 7.21E-02 1.50E-01 PASS 7.76E-02 1.75E-03 8.24E-02 7.28E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 123 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.57. Plot of Output Voltage Swing High2_3 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 124 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.57. Raw data for Output Voltage Swing High2_3 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High2_3 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.80E-02 7.84E-02 8.02E-02 7.82E-02 8.00E-02 7.91E-02 8.07E-02 7.56E-02 7.98E-02 8.16E-02 7.25E-02 7.11E-02 24-hr Anneal 225 7.74E-02 7.81E-02 7.96E-02 7.79E-02 7.96E-02 7.89E-02 8.02E-02 7.52E-02 7.92E-02 8.13E-02 7.27E-02 7.10E-02 168-hr Anneal 250 7.53E-02 7.63E-02 7.76E-02 7.61E-02 7.77E-02 7.73E-02 7.88E-02 7.37E-02 7.78E-02 7.95E-02 7.25E-02 7.11E-02 7.84E-02 9.90E-04 8.12E-02 7.57E-02 7.90E-02 1.06E-03 8.19E-02 7.60E-02 7.85E-02 1.03E-03 8.13E-02 7.57E-02 7.66E-02 1.01E-03 7.94E-02 7.38E-02 7.83E-02 2.22E-03 8.44E-02 7.22E-02 1.50E-01 PASS 7.94E-02 2.27E-03 8.56E-02 7.31E-02 1.50E-01 PASS 7.90E-02 2.29E-03 8.52E-02 7.27E-02 1.50E-01 PASS 7.74E-02 2.24E-03 8.36E-02 7.13E-02 1.50E-01 PASS 0 7.37E-02 7.45E-02 7.60E-02 7.44E-02 7.59E-02 7.60E-02 7.72E-02 7.25E-02 7.63E-02 7.80E-02 7.26E-02 7.11E-02 Total 20 7.52E-02 7.62E-02 7.76E-02 7.60E-02 7.74E-02 7.67E-02 7.82E-02 7.32E-02 7.74E-02 7.85E-02 7.26E-02 7.11E-02 Dose (krad(Si)) 50 100 7.64E-02 7.70E-02 7.71E-02 7.89E-02 7.85E-02 7.93E-02 7.70E-02 7.78E-02 7.84E-02 7.92E-02 7.73E-02 7.81E-02 7.86E-02 7.97E-02 7.40E-02 7.46E-02 7.76E-02 7.86E-02 7.95E-02 8.03E-02 7.25E-02 7.26E-02 7.11E-02 7.12E-02 7.49E-02 9.93E-04 7.76E-02 7.22E-02 7.65E-02 1.01E-03 7.92E-02 7.37E-02 7.75E-02 9.13E-04 8.00E-02 7.50E-02 7.60E-02 2.09E-03 8.17E-02 7.03E-02 1.50E-01 PASS 7.68E-02 2.12E-03 8.26E-02 7.10E-02 1.50E-01 PASS 7.74E-02 2.08E-03 8.31E-02 7.17E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 125 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.58. Plot of Output Voltage Swing High2_4 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 126 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.58. Raw data for Output Voltage Swing High2_4 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High2_4 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.60E-02 7.84E-02 7.65E-02 7.83E-02 7.81E-02 7.66E-02 7.94E-02 7.59E-02 7.47E-02 7.97E-02 7.10E-02 7.25E-02 24-hr Anneal 225 7.54E-02 7.82E-02 7.63E-02 7.81E-02 7.77E-02 7.62E-02 7.89E-02 7.56E-02 7.43E-02 7.93E-02 7.10E-02 7.24E-02 168-hr Anneal 250 7.40E-02 7.65E-02 7.45E-02 7.65E-02 7.61E-02 7.47E-02 7.74E-02 7.44E-02 7.33E-02 7.79E-02 7.10E-02 7.26E-02 7.70E-02 1.48E-03 8.11E-02 7.30E-02 7.74E-02 1.15E-03 8.06E-02 7.43E-02 7.71E-02 1.24E-03 8.05E-02 7.37E-02 7.55E-02 1.18E-03 7.88E-02 7.23E-02 7.63E-02 2.09E-03 8.20E-02 7.05E-02 1.50E-01 PASS 7.73E-02 2.23E-03 8.34E-02 7.11E-02 1.50E-01 PASS 7.69E-02 2.16E-03 8.28E-02 7.09E-02 1.50E-01 PASS 7.55E-02 2.01E-03 8.11E-02 7.00E-02 1.50E-01 PASS 0 7.20E-02 7.46E-02 7.30E-02 7.45E-02 7.44E-02 7.33E-02 7.62E-02 7.32E-02 7.20E-02 7.64E-02 7.11E-02 7.26E-02 Total 20 7.34E-02 7.64E-02 7.43E-02 7.61E-02 7.58E-02 7.40E-02 7.67E-02 7.38E-02 7.25E-02 7.72E-02 7.10E-02 7.24E-02 Dose (krad(Si)) 50 100 7.47E-02 7.51E-02 7.71E-02 7.89E-02 7.51E-02 7.61E-02 7.71E-02 7.77E-02 7.67E-02 7.74E-02 7.47E-02 7.55E-02 7.73E-02 7.83E-02 7.44E-02 7.50E-02 7.31E-02 7.38E-02 7.79E-02 7.86E-02 7.09E-02 7.11E-02 7.25E-02 7.27E-02 7.37E-02 1.14E-03 7.68E-02 7.05E-02 7.52E-02 1.29E-03 7.88E-02 7.17E-02 7.61E-02 1.17E-03 7.93E-02 7.29E-02 7.42E-02 1.97E-03 7.96E-02 6.88E-02 1.50E-01 PASS 7.48E-02 2.00E-03 8.03E-02 6.93E-02 1.50E-01 PASS 7.55E-02 2.02E-03 8.10E-02 6.99E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 127 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.59. Plot of Output Voltage Swing High3_1 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 128 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.59. Raw data for Output Voltage Swing High3_1 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High3_1 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.77E-01 3.93E-01 3.81E-01 3.92E-01 3.92E-01 3.76E-01 3.98E-01 3.85E-01 3.78E-01 3.99E-01 3.58E-01 3.63E-01 24-hr Anneal 225 3.74E-01 3.91E-01 3.79E-01 3.88E-01 3.89E-01 3.75E-01 3.96E-01 3.83E-01 3.77E-01 3.97E-01 3.58E-01 3.64E-01 168-hr Anneal 250 3.67E-01 3.82E-01 3.71E-01 3.81E-01 3.81E-01 3.68E-01 3.87E-01 3.76E-01 3.70E-01 3.88E-01 3.57E-01 3.63E-01 3.83E-01 8.56E-03 4.07E-01 3.60E-01 3.87E-01 7.48E-03 4.08E-01 3.67E-01 3.84E-01 7.48E-03 4.05E-01 3.64E-01 3.76E-01 6.88E-03 3.95E-01 3.58E-01 3.81E-01 9.80E-03 4.08E-01 3.54E-01 8.00E-01 PASS 3.87E-01 1.07E-02 4.17E-01 3.58E-01 8.00E-01 PASS 3.85E-01 1.05E-02 4.14E-01 3.57E-01 8.00E-01 PASS 3.78E-01 9.30E-03 4.03E-01 3.52E-01 8.00E-01 PASS 0 3.61E-01 3.75E-01 3.66E-01 3.75E-01 3.74E-01 3.62E-01 3.80E-01 3.70E-01 3.66E-01 3.81E-01 3.57E-01 3.64E-01 Total 20 3.65E-01 3.79E-01 3.70E-01 3.78E-01 3.78E-01 3.64E-01 3.82E-01 3.73E-01 3.67E-01 3.84E-01 3.57E-01 3.63E-01 Dose (krad(Si)) 50 100 3.69E-01 3.72E-01 3.83E-01 3.93E-01 3.73E-01 3.77E-01 3.83E-01 3.87E-01 3.82E-01 3.87E-01 3.67E-01 3.71E-01 3.86E-01 3.91E-01 3.76E-01 3.79E-01 3.69E-01 3.73E-01 3.87E-01 3.92E-01 3.57E-01 3.58E-01 3.63E-01 3.64E-01 3.70E-01 6.29E-03 3.88E-01 3.53E-01 3.74E-01 6.56E-03 3.92E-01 3.56E-01 3.78E-01 6.90E-03 3.97E-01 3.59E-01 3.72E-01 8.47E-03 3.95E-01 3.48E-01 8.00E-01 PASS 3.74E-01 8.84E-03 3.98E-01 3.50E-01 8.00E-01 PASS 3.77E-01 9.28E-03 4.02E-01 3.52E-01 8.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 129 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.60. Plot of Output Voltage Swing High3_2 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 130 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.60. Raw data for Output Voltage Swing High3_2 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High3_2 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.89E-01 3.94E-01 3.94E-01 3.90E-01 3.96E-01 3.97E-01 4.07E-01 3.85E-01 4.02E-01 4.04E-01 3.64E-01 3.55E-01 24-hr Anneal 225 3.85E-01 3.91E-01 3.91E-01 3.86E-01 3.92E-01 3.95E-01 4.04E-01 3.83E-01 3.99E-01 4.02E-01 3.64E-01 3.55E-01 168-hr Anneal 250 3.77E-01 3.82E-01 3.83E-01 3.79E-01 3.83E-01 3.86E-01 3.95E-01 3.75E-01 3.90E-01 3.92E-01 3.63E-01 3.55E-01 3.88E-01 4.28E-03 4.00E-01 3.76E-01 3.93E-01 2.90E-03 4.01E-01 3.85E-01 3.89E-01 3.16E-03 3.98E-01 3.80E-01 3.81E-01 2.54E-03 3.88E-01 3.74E-01 3.92E-01 7.71E-03 4.13E-01 3.70E-01 8.00E-01 PASS 3.99E-01 8.62E-03 4.23E-01 3.75E-01 8.00E-01 PASS 3.97E-01 8.39E-03 4.20E-01 3.74E-01 8.00E-01 PASS 3.88E-01 7.50E-03 4.08E-01 3.67E-01 8.00E-01 PASS 0 3.70E-01 3.76E-01 3.76E-01 3.73E-01 3.77E-01 3.80E-01 3.87E-01 3.70E-01 3.83E-01 3.84E-01 3.64E-01 3.55E-01 Total 20 3.74E-01 3.80E-01 3.80E-01 3.76E-01 3.80E-01 3.82E-01 3.89E-01 3.72E-01 3.85E-01 3.87E-01 3.64E-01 3.55E-01 Dose (krad(Si)) 50 100 3.79E-01 3.83E-01 3.83E-01 3.94E-01 3.84E-01 3.89E-01 3.81E-01 3.85E-01 3.85E-01 3.89E-01 3.85E-01 3.91E-01 3.93E-01 3.99E-01 3.75E-01 3.79E-01 3.88E-01 3.94E-01 3.91E-01 3.96E-01 3.64E-01 3.65E-01 3.55E-01 3.56E-01 3.74E-01 2.69E-03 3.82E-01 3.67E-01 3.78E-01 2.74E-03 3.86E-01 3.71E-01 3.82E-01 2.49E-03 3.89E-01 3.75E-01 3.81E-01 6.82E-03 3.99E-01 3.62E-01 8.00E-01 PASS 3.83E-01 6.65E-03 4.01E-01 3.65E-01 8.00E-01 PASS 3.86E-01 6.98E-03 4.06E-01 3.67E-01 8.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 131 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.61. Plot of Output Voltage Swing High3_3 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 132 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.61. Raw data for Output Voltage Swing High3_3 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High3_3 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.88E-01 3.90E-01 3.97E-01 3.88E-01 3.97E-01 3.97E-01 4.04E-01 3.81E-01 3.99E-01 4.07E-01 3.63E-01 3.57E-01 24-hr Anneal 225 3.84E-01 3.88E-01 3.94E-01 3.86E-01 3.93E-01 3.95E-01 4.02E-01 3.79E-01 3.97E-01 4.05E-01 3.64E-01 3.57E-01 168-hr Anneal 250 3.76E-01 3.79E-01 3.85E-01 3.78E-01 3.84E-01 3.86E-01 3.92E-01 3.71E-01 3.87E-01 3.94E-01 3.63E-01 3.57E-01 3.88E-01 4.51E-03 4.00E-01 3.75E-01 3.92E-01 4.52E-03 4.04E-01 3.80E-01 3.89E-01 4.36E-03 4.01E-01 3.77E-01 3.80E-01 3.85E-03 3.91E-01 3.70E-01 3.90E-01 9.28E-03 4.16E-01 3.65E-01 8.00E-01 PASS 3.97E-01 1.02E-02 4.25E-01 3.69E-01 8.00E-01 PASS 3.95E-01 1.01E-02 4.23E-01 3.68E-01 8.00E-01 PASS 3.86E-01 9.04E-03 4.11E-01 3.61E-01 8.00E-01 PASS 0 3.70E-01 3.73E-01 3.78E-01 3.72E-01 3.76E-01 3.79E-01 3.84E-01 3.65E-01 3.81E-01 3.86E-01 3.63E-01 3.57E-01 Total 20 3.74E-01 3.77E-01 3.83E-01 3.75E-01 3.81E-01 3.82E-01 3.87E-01 3.69E-01 3.84E-01 3.90E-01 3.63E-01 3.56E-01 Dose (krad(Si)) 50 100 3.78E-01 3.82E-01 3.81E-01 3.90E-01 3.87E-01 3.92E-01 3.80E-01 3.84E-01 3.85E-01 3.90E-01 3.85E-01 3.90E-01 3.91E-01 3.96E-01 3.71E-01 3.75E-01 3.87E-01 3.92E-01 3.93E-01 3.98E-01 3.63E-01 3.64E-01 3.56E-01 3.57E-01 3.74E-01 3.39E-03 3.83E-01 3.65E-01 3.78E-01 3.87E-03 3.89E-01 3.67E-01 3.82E-01 3.77E-03 3.92E-01 3.72E-01 3.79E-01 8.16E-03 4.01E-01 3.57E-01 8.00E-01 PASS 3.82E-01 8.06E-03 4.04E-01 3.60E-01 8.00E-01 PASS 3.85E-01 8.48E-03 4.09E-01 3.62E-01 8.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 133 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.62. Plot of Output Voltage Swing High3_4 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 134 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.62. Raw data for Output Voltage Swing High3_4 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High3_4 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.77E-01 3.91E-01 3.80E-01 3.91E-01 3.88E-01 3.80E-01 3.94E-01 3.82E-01 3.76E-01 3.99E-01 3.57E-01 3.63E-01 24-hr Anneal 225 3.74E-01 3.88E-01 3.78E-01 3.87E-01 3.85E-01 3.78E-01 3.93E-01 3.81E-01 3.75E-01 3.97E-01 3.57E-01 3.64E-01 168-hr Anneal 250 3.67E-01 3.79E-01 3.71E-01 3.80E-01 3.78E-01 3.71E-01 3.84E-01 3.74E-01 3.69E-01 3.88E-01 3.56E-01 3.63E-01 3.82E-01 7.27E-03 4.02E-01 3.62E-01 3.85E-01 6.31E-03 4.03E-01 3.68E-01 3.83E-01 6.24E-03 4.00E-01 3.66E-01 3.75E-01 5.85E-03 3.91E-01 3.59E-01 3.81E-01 8.81E-03 4.05E-01 3.57E-01 8.00E-01 PASS 3.86E-01 9.91E-03 4.14E-01 3.59E-01 8.00E-01 PASS 3.85E-01 9.46E-03 4.11E-01 3.59E-01 8.00E-01 PASS 3.77E-01 8.56E-03 4.01E-01 3.54E-01 8.00E-01 PASS 0 3.62E-01 3.73E-01 3.65E-01 3.74E-01 3.72E-01 3.66E-01 3.78E-01 3.68E-01 3.65E-01 3.81E-01 3.57E-01 3.64E-01 Total 20 3.65E-01 3.77E-01 3.69E-01 3.77E-01 3.75E-01 3.67E-01 3.80E-01 3.71E-01 3.66E-01 3.84E-01 3.57E-01 3.63E-01 Dose (krad(Si)) 50 100 3.69E-01 3.72E-01 3.81E-01 3.90E-01 3.72E-01 3.76E-01 3.82E-01 3.86E-01 3.79E-01 3.83E-01 3.70E-01 3.74E-01 3.83E-01 3.88E-01 3.73E-01 3.77E-01 3.68E-01 3.72E-01 3.87E-01 3.92E-01 3.56E-01 3.57E-01 3.63E-01 3.64E-01 3.69E-01 5.40E-03 3.84E-01 3.54E-01 3.73E-01 5.55E-03 3.88E-01 3.57E-01 3.76E-01 5.79E-03 3.92E-01 3.61E-01 3.72E-01 7.51E-03 3.92E-01 3.51E-01 8.00E-01 PASS 3.74E-01 7.89E-03 3.95E-01 3.52E-01 8.00E-01 PASS 3.76E-01 8.31E-03 3.99E-01 3.54E-01 8.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 135 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.63. Plot of Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 136 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.63. Raw data for Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.97E-02 1.96E-02 1.98E-02 1.95E-02 1.98E-02 1.94E-02 1.94E-02 2.11E-02 2.02E-02 2.00E-02 1.90E-02 1.85E-02 24-hr Anneal 225 1.94E-02 1.96E-02 1.98E-02 1.94E-02 1.98E-02 1.90E-02 1.93E-02 2.10E-02 2.01E-02 1.99E-02 1.91E-02 1.85E-02 168-hr Anneal 250 1.88E-02 1.87E-02 1.89E-02 1.89E-02 1.89E-02 1.82E-02 1.85E-02 2.02E-02 1.95E-02 1.90E-02 1.88E-02 1.86E-02 1.94E-02 2.41E-04 2.00E-02 1.87E-02 1.97E-02 1.41E-04 2.01E-02 1.93E-02 1.96E-02 2.11E-04 2.02E-02 1.90E-02 1.88E-02 7.70E-05 1.90E-02 1.86E-02 1.95E-02 7.40E-04 2.15E-02 1.74E-02 6.00E-02 PASS 2.00E-02 6.91E-04 2.19E-02 1.81E-02 6.00E-02 PASS 1.98E-02 7.82E-04 2.20E-02 1.77E-02 6.00E-02 PASS 1.91E-02 7.93E-04 2.13E-02 1.69E-02 6.00E-02 PASS 0 1.83E-02 1.82E-02 1.84E-02 1.81E-02 1.86E-02 1.79E-02 1.78E-02 1.95E-02 1.90E-02 1.85E-02 1.89E-02 1.84E-02 Total 20 1.86E-02 1.85E-02 1.88E-02 1.85E-02 1.89E-02 1.80E-02 1.81E-02 1.99E-02 1.92E-02 1.87E-02 1.89E-02 1.84E-02 Dose (krad(Si)) 50 100 1.87E-02 1.91E-02 1.89E-02 1.96E-02 1.90E-02 1.95E-02 1.89E-02 1.91E-02 1.92E-02 1.96E-02 1.83E-02 1.87E-02 1.84E-02 1.89E-02 2.00E-02 2.05E-02 1.93E-02 1.99E-02 1.89E-02 1.95E-02 1.91E-02 1.90E-02 1.83E-02 1.84E-02 1.83E-02 1.91E-04 1.88E-02 1.78E-02 1.86E-02 1.66E-04 1.91E-02 1.82E-02 1.89E-02 1.50E-04 1.93E-02 1.85E-02 1.85E-02 7.16E-04 2.05E-02 1.66E-02 3.00E-02 PASS 1.88E-02 7.91E-04 2.10E-02 1.66E-02 6.00E-02 PASS 1.90E-02 7.04E-04 2.09E-02 1.70E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 137 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.64. Plot of Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 138 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.64. Raw data for Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 2.01E-02 1.99E-02 2.02E-02 2.03E-02 1.99E-02 2.05E-02 2.04E-02 2.12E-02 2.01E-02 2.02E-02 1.97E-02 1.91E-02 24-hr Anneal 225 1.99E-02 1.98E-02 2.02E-02 2.03E-02 1.98E-02 2.02E-02 2.03E-02 2.13E-02 2.00E-02 1.99E-02 1.97E-02 1.89E-02 168-hr Anneal 250 1.92E-02 1.90E-02 1.92E-02 1.97E-02 1.90E-02 1.96E-02 1.96E-02 2.05E-02 1.93E-02 1.91E-02 1.95E-02 1.90E-02 1.98E-02 1.40E-04 2.02E-02 1.94E-02 2.01E-02 1.73E-04 2.06E-02 1.96E-02 2.00E-02 2.24E-04 2.06E-02 1.94E-02 1.92E-02 2.69E-04 1.99E-02 1.85E-02 2.00E-02 4.82E-04 2.13E-02 1.87E-02 6.00E-02 PASS 2.05E-02 4.59E-04 2.17E-02 1.92E-02 6.00E-02 PASS 2.03E-02 5.38E-04 2.18E-02 1.89E-02 6.00E-02 PASS 1.96E-02 5.27E-04 2.11E-02 1.82E-02 6.00E-02 PASS 0 1.89E-02 1.88E-02 1.89E-02 1.92E-02 1.87E-02 1.91E-02 1.91E-02 2.00E-02 1.89E-02 1.87E-02 1.97E-02 1.89E-02 Total 20 1.90E-02 1.89E-02 1.91E-02 1.94E-02 1.87E-02 1.92E-02 1.92E-02 2.02E-02 1.89E-02 1.88E-02 1.96E-02 1.89E-02 Dose (krad(Si)) 50 100 1.94E-02 1.97E-02 1.91E-02 1.99E-02 1.93E-02 1.98E-02 1.97E-02 2.00E-02 1.90E-02 1.97E-02 1.95E-02 1.99E-02 1.94E-02 1.99E-02 2.04E-02 2.08E-02 1.93E-02 1.98E-02 1.91E-02 1.95E-02 1.97E-02 1.97E-02 1.89E-02 1.90E-02 1.89E-02 1.93E-04 1.94E-02 1.84E-02 1.90E-02 2.36E-04 1.97E-02 1.84E-02 1.93E-02 2.59E-04 2.00E-02 1.86E-02 1.92E-02 4.94E-04 2.05E-02 1.78E-02 3.00E-02 PASS 1.93E-02 5.40E-04 2.07E-02 1.78E-02 6.00E-02 PASS 1.96E-02 5.14E-04 2.10E-02 1.82E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 139 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.65. Plot of Output Voltage Swing Low1_3 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 140 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.65. Raw data for Output Voltage Swing Low1_3 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low1_3 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.97E-02 1.95E-02 1.98E-02 1.98E-02 1.97E-02 2.04E-02 1.98E-02 2.07E-02 2.00E-02 1.98E-02 1.95E-02 1.85E-02 24-hr Anneal 225 1.95E-02 1.93E-02 1.98E-02 1.98E-02 1.98E-02 2.01E-02 1.97E-02 2.05E-02 1.97E-02 1.94E-02 1.97E-02 1.86E-02 168-hr Anneal 250 1.87E-02 1.85E-02 1.91E-02 1.91E-02 1.90E-02 1.94E-02 1.90E-02 1.96E-02 1.89E-02 1.88E-02 1.94E-02 1.86E-02 1.94E-02 1.01E-04 1.97E-02 1.91E-02 1.97E-02 1.34E-04 2.00E-02 1.93E-02 1.97E-02 2.32E-04 2.03E-02 1.90E-02 1.89E-02 2.43E-04 1.95E-02 1.82E-02 1.95E-02 3.95E-04 2.06E-02 1.85E-02 6.00E-02 PASS 2.01E-02 3.86E-04 2.12E-02 1.91E-02 6.00E-02 PASS 1.99E-02 4.32E-04 2.11E-02 1.87E-02 6.00E-02 PASS 1.91E-02 3.47E-04 2.01E-02 1.81E-02 6.00E-02 PASS 0 1.85E-02 1.82E-02 1.87E-02 1.87E-02 1.86E-02 1.90E-02 1.85E-02 1.92E-02 1.86E-02 1.82E-02 1.95E-02 1.86E-02 Total 20 1.86E-02 1.84E-02 1.88E-02 1.90E-02 1.88E-02 1.90E-02 1.86E-02 1.94E-02 1.87E-02 1.83E-02 1.94E-02 1.85E-02 Dose (krad(Si)) 50 100 1.89E-02 1.93E-02 1.86E-02 1.93E-02 1.89E-02 1.94E-02 1.94E-02 1.94E-02 1.90E-02 1.95E-02 1.93E-02 1.97E-02 1.89E-02 1.94E-02 1.96E-02 2.01E-02 1.89E-02 1.95E-02 1.86E-02 1.90E-02 1.96E-02 1.94E-02 1.86E-02 1.86E-02 1.85E-02 2.07E-04 1.91E-02 1.80E-02 1.87E-02 2.23E-04 1.93E-02 1.81E-02 1.90E-02 2.82E-04 1.97E-02 1.82E-02 1.87E-02 3.66E-04 1.97E-02 1.77E-02 3.00E-02 PASS 1.88E-02 4.12E-04 1.99E-02 1.76E-02 6.00E-02 PASS 1.91E-02 4.02E-04 2.02E-02 1.80E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 141 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.66. Plot of Output Voltage Swing Low1_4 15V (V) @ VS=+/-15V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 142 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.66. Raw data for Output Voltage Swing Low1_4 15V (V) @ VS=+/-15V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low1_4 15V (V) @ VS=+/-15V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.99E-02 1.98E-02 2.00E-02 2.02E-02 2.01E-02 1.98E-02 1.96E-02 2.10E-02 2.01E-02 2.08E-02 1.91E-02 1.88E-02 24-hr Anneal 225 1.97E-02 1.98E-02 1.98E-02 2.03E-02 2.01E-02 1.98E-02 1.96E-02 2.08E-02 2.01E-02 2.03E-02 1.93E-02 1.88E-02 168-hr Anneal 250 1.90E-02 1.89E-02 1.90E-02 1.94E-02 1.93E-02 1.90E-02 1.86E-02 1.99E-02 1.95E-02 1.96E-02 1.91E-02 1.89E-02 1.97E-02 2.21E-04 2.03E-02 1.91E-02 2.00E-02 1.85E-04 2.05E-02 1.95E-02 1.99E-02 2.47E-04 2.06E-02 1.93E-02 1.91E-02 2.42E-04 1.98E-02 1.85E-02 1.98E-02 4.69E-04 2.11E-02 1.85E-02 6.00E-02 PASS 2.03E-02 5.94E-04 2.19E-02 1.86E-02 6.00E-02 PASS 2.01E-02 4.69E-04 2.14E-02 1.88E-02 6.00E-02 PASS 1.93E-02 5.21E-04 2.08E-02 1.79E-02 6.00E-02 PASS 0 1.85E-02 1.83E-02 1.84E-02 1.89E-02 1.89E-02 1.85E-02 1.83E-02 1.95E-02 1.89E-02 1.91E-02 1.91E-02 1.89E-02 Total 20 1.89E-02 1.85E-02 1.89E-02 1.92E-02 1.92E-02 1.86E-02 1.84E-02 1.97E-02 1.92E-02 1.94E-02 1.92E-02 1.87E-02 Dose (krad(Si)) 50 100 1.91E-02 1.95E-02 1.91E-02 1.99E-02 1.90E-02 1.95E-02 1.95E-02 1.99E-02 1.94E-02 1.99E-02 1.90E-02 1.94E-02 1.88E-02 1.93E-02 2.01E-02 2.04E-02 1.94E-02 1.98E-02 1.96E-02 2.00E-02 1.92E-02 1.92E-02 1.87E-02 1.89E-02 1.86E-02 2.64E-04 1.93E-02 1.79E-02 1.89E-02 2.80E-04 1.97E-02 1.81E-02 1.92E-02 2.29E-04 1.98E-02 1.86E-02 1.88E-02 4.86E-04 2.02E-02 1.75E-02 3.00E-02 PASS 1.90E-02 5.17E-04 2.05E-02 1.76E-02 6.00E-02 PASS 1.94E-02 5.17E-04 2.08E-02 1.80E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 143 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.67. Plot of Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 144 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.67. Raw data for Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 5.36E-02 5.40E-02 5.36E-02 5.38E-02 5.39E-02 5.28E-02 5.36E-02 5.50E-02 5.36E-02 5.46E-02 5.28E-02 5.24E-02 24-hr Anneal 225 5.35E-02 5.42E-02 5.37E-02 5.39E-02 5.40E-02 5.25E-02 5.35E-02 5.49E-02 5.36E-02 5.43E-02 5.30E-02 5.26E-02 168-hr Anneal 250 5.27E-02 5.31E-02 5.27E-02 5.31E-02 5.30E-02 5.19E-02 5.27E-02 5.43E-02 5.30E-02 5.35E-02 5.26E-02 5.25E-02 5.36E-02 5.06E-04 5.50E-02 5.22E-02 5.38E-02 1.76E-04 5.43E-02 5.33E-02 5.39E-02 2.89E-04 5.47E-02 5.31E-02 5.29E-02 2.24E-04 5.35E-02 5.23E-02 5.34E-02 8.53E-04 5.57E-02 5.11E-02 1.00E-01 PASS 5.39E-02 8.56E-04 5.63E-02 5.16E-02 1.00E-01 PASS 5.37E-02 9.12E-04 5.62E-02 5.12E-02 1.00E-01 PASS 5.31E-02 9.11E-04 5.56E-02 5.06E-02 1.00E-01 PASS 0 5.23E-02 5.28E-02 5.26E-02 5.26E-02 5.29E-02 5.17E-02 5.25E-02 5.39E-02 5.28E-02 5.32E-02 5.28E-02 5.24E-02 Total 20 5.25E-02 5.28E-02 5.25E-02 5.27E-02 5.31E-02 5.16E-02 5.23E-02 5.40E-02 5.27E-02 5.33E-02 5.27E-02 5.23E-02 Dose (krad(Si)) 50 100 5.28E-02 5.32E-02 5.32E-02 5.44E-02 5.28E-02 5.33E-02 5.31E-02 5.34E-02 5.33E-02 5.39E-02 5.20E-02 5.22E-02 5.28E-02 5.31E-02 5.43E-02 5.45E-02 5.29E-02 5.34E-02 5.36E-02 5.38E-02 5.29E-02 5.28E-02 5.25E-02 5.25E-02 5.26E-02 2.20E-04 5.32E-02 5.20E-02 5.27E-02 2.42E-04 5.34E-02 5.21E-02 5.30E-02 2.24E-04 5.37E-02 5.24E-02 5.28E-02 8.10E-04 5.50E-02 5.06E-02 1.00E-01 PASS 5.28E-02 9.18E-04 5.53E-02 5.02E-02 1.00E-01 PASS 5.31E-02 8.79E-04 5.55E-02 5.07E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 145 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.68. Plot of Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 146 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.68. Raw data for Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 5.48E-02 5.47E-02 5.49E-02 5.47E-02 5.50E-02 5.53E-02 5.53E-02 5.56E-02 5.49E-02 5.52E-02 5.38E-02 5.28E-02 24-hr Anneal 225 5.46E-02 5.48E-02 5.49E-02 5.48E-02 5.51E-02 5.50E-02 5.53E-02 5.55E-02 5.48E-02 5.47E-02 5.40E-02 5.28E-02 168-hr Anneal 250 5.37E-02 5.39E-02 5.39E-02 5.41E-02 5.40E-02 5.44E-02 5.45E-02 5.47E-02 5.40E-02 5.40E-02 5.35E-02 5.27E-02 5.47E-02 3.61E-04 5.57E-02 5.37E-02 5.48E-02 1.45E-04 5.52E-02 5.44E-02 5.48E-02 1.78E-04 5.53E-02 5.44E-02 5.39E-02 1.81E-04 5.44E-02 5.34E-02 5.47E-02 2.39E-04 5.53E-02 5.40E-02 1.00E-01 PASS 5.53E-02 2.34E-04 5.59E-02 5.46E-02 1.00E-01 PASS 5.51E-02 3.33E-04 5.60E-02 5.42E-02 1.00E-01 PASS 5.43E-02 3.22E-04 5.52E-02 5.34E-02 1.00E-01 PASS 0 5.32E-02 5.32E-02 5.35E-02 5.35E-02 5.36E-02 5.40E-02 5.40E-02 5.42E-02 5.35E-02 5.34E-02 5.38E-02 5.27E-02 Total 20 5.36E-02 5.36E-02 5.38E-02 5.37E-02 5.39E-02 5.41E-02 5.40E-02 5.45E-02 5.37E-02 5.38E-02 5.37E-02 5.27E-02 Dose (krad(Si)) 50 100 5.38E-02 5.43E-02 5.38E-02 5.53E-02 5.40E-02 5.47E-02 5.42E-02 5.45E-02 5.43E-02 5.46E-02 5.42E-02 5.46E-02 5.45E-02 5.49E-02 5.48E-02 5.50E-02 5.40E-02 5.46E-02 5.41E-02 5.44E-02 5.39E-02 5.40E-02 5.27E-02 5.28E-02 5.34E-02 1.92E-04 5.39E-02 5.28E-02 5.37E-02 1.35E-04 5.41E-02 5.33E-02 5.40E-02 2.29E-04 5.47E-02 5.34E-02 5.38E-02 3.50E-04 5.48E-02 5.29E-02 1.00E-01 PASS 5.40E-02 3.24E-04 5.49E-02 5.31E-02 1.00E-01 PASS 5.43E-02 3.33E-04 5.52E-02 5.34E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 147 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.69. Plot of Output Voltage Swing Low2_3 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 148 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.69. Raw data for Output Voltage Swing Low2_3 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low2_3 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 5.41E-02 5.39E-02 5.44E-02 5.41E-02 5.47E-02 5.45E-02 5.46E-02 5.45E-02 5.43E-02 5.45E-02 5.36E-02 5.22E-02 24-hr Anneal 225 5.40E-02 5.40E-02 5.45E-02 5.42E-02 5.48E-02 5.42E-02 5.46E-02 5.46E-02 5.40E-02 5.42E-02 5.38E-02 5.22E-02 168-hr Anneal 250 5.31E-02 5.30E-02 5.36E-02 5.34E-02 5.38E-02 5.36E-02 5.38E-02 5.38E-02 5.34E-02 5.33E-02 5.36E-02 5.23E-02 5.40E-02 3.46E-04 5.50E-02 5.31E-02 5.43E-02 2.80E-04 5.50E-02 5.35E-02 5.43E-02 3.52E-04 5.53E-02 5.33E-02 5.34E-02 3.31E-04 5.43E-02 5.25E-02 5.40E-02 1.43E-04 5.44E-02 5.36E-02 1.00E-01 PASS 5.45E-02 1.08E-04 5.48E-02 5.42E-02 1.00E-01 PASS 5.43E-02 2.69E-04 5.50E-02 5.36E-02 1.00E-01 PASS 5.36E-02 2.33E-04 5.42E-02 5.30E-02 1.00E-01 PASS 0 5.24E-02 5.24E-02 5.30E-02 5.27E-02 5.31E-02 5.29E-02 5.32E-02 5.33E-02 5.28E-02 5.30E-02 5.36E-02 5.21E-02 Total 20 5.28E-02 5.26E-02 5.33E-02 5.30E-02 5.35E-02 5.34E-02 5.34E-02 5.36E-02 5.31E-02 5.32E-02 5.37E-02 5.20E-02 Dose (krad(Si)) 50 100 5.32E-02 5.37E-02 5.32E-02 5.42E-02 5.36E-02 5.42E-02 5.35E-02 5.37E-02 5.40E-02 5.45E-02 5.36E-02 5.40E-02 5.36E-02 5.41E-02 5.38E-02 5.41E-02 5.33E-02 5.39E-02 5.34E-02 5.38E-02 5.36E-02 5.38E-02 5.22E-02 5.20E-02 5.27E-02 3.45E-04 5.37E-02 5.18E-02 5.30E-02 3.46E-04 5.40E-02 5.21E-02 5.35E-02 3.23E-04 5.44E-02 5.26E-02 5.30E-02 2.33E-04 5.37E-02 5.24E-02 1.00E-01 PASS 5.33E-02 1.76E-04 5.38E-02 5.28E-02 1.00E-01 PASS 5.35E-02 2.10E-04 5.41E-02 5.30E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 149 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.70. Plot of Output Voltage Swing Low2_4 15V (V) @ VS=+/-15V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 150 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.70. Raw data for Output Voltage Swing Low2_4 15V (V) @ VS=+/-15V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low2_4 15V (V) @ VS=+/-15V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 5.41E-02 5.43E-02 5.41E-02 5.50E-02 5.45E-02 5.37E-02 5.42E-02 5.53E-02 5.40E-02 5.52E-02 5.30E-02 5.29E-02 24-hr Anneal 225 5.39E-02 5.45E-02 5.44E-02 5.49E-02 5.47E-02 5.34E-02 5.39E-02 5.51E-02 5.37E-02 5.51E-02 5.32E-02 5.30E-02 168-hr Anneal 250 5.32E-02 5.34E-02 5.35E-02 5.43E-02 5.37E-02 5.27E-02 5.32E-02 5.44E-02 5.32E-02 5.43E-02 5.30E-02 5.31E-02 5.42E-02 4.62E-04 5.55E-02 5.30E-02 5.44E-02 3.74E-04 5.54E-02 5.34E-02 5.45E-02 3.57E-04 5.54E-02 5.35E-02 5.36E-02 4.06E-04 5.47E-02 5.25E-02 5.40E-02 7.10E-04 5.59E-02 5.20E-02 1.00E-01 PASS 5.45E-02 7.33E-04 5.65E-02 5.25E-02 1.00E-01 PASS 5.43E-02 8.12E-04 5.65E-02 5.20E-02 1.00E-01 PASS 5.36E-02 7.58E-04 5.56E-02 5.15E-02 1.00E-01 PASS 0 5.29E-02 5.30E-02 5.32E-02 5.38E-02 5.36E-02 5.26E-02 5.30E-02 5.40E-02 5.30E-02 5.41E-02 5.30E-02 5.30E-02 Total 20 5.27E-02 5.33E-02 5.32E-02 5.38E-02 5.35E-02 5.24E-02 5.28E-02 5.41E-02 5.30E-02 5.42E-02 5.30E-02 5.29E-02 Dose (krad(Si)) 50 100 5.32E-02 5.36E-02 5.35E-02 5.47E-02 5.34E-02 5.39E-02 5.43E-02 5.45E-02 5.40E-02 5.44E-02 5.29E-02 5.31E-02 5.33E-02 5.37E-02 5.43E-02 5.47E-02 5.32E-02 5.37E-02 5.43E-02 5.47E-02 5.30E-02 5.31E-02 5.30E-02 5.31E-02 5.33E-02 3.82E-04 5.43E-02 5.23E-02 5.33E-02 3.98E-04 5.44E-02 5.22E-02 5.37E-02 4.36E-04 5.49E-02 5.25E-02 5.33E-02 6.91E-04 5.52E-02 5.14E-02 1.00E-01 PASS 5.33E-02 7.91E-04 5.55E-02 5.11E-02 1.00E-01 PASS 5.36E-02 6.72E-04 5.54E-02 5.17E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 151 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.71. Plot of Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 152 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.71. Raw data for Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 2.22E-01 2.24E-01 2.22E-01 2.24E-01 2.23E-01 2.19E-01 2.23E-01 2.24E-01 2.21E-01 2.25E-01 2.20E-01 2.20E-01 24-hr Anneal 225 2.21E-01 2.24E-01 2.22E-01 2.24E-01 2.24E-01 2.18E-01 2.23E-01 2.24E-01 2.21E-01 2.24E-01 2.20E-01 2.20E-01 168-hr Anneal 250 2.20E-01 2.22E-01 2.21E-01 2.23E-01 2.22E-01 2.17E-01 2.22E-01 2.23E-01 2.20E-01 2.23E-01 2.19E-01 2.20E-01 2.23E-01 1.99E-03 2.29E-01 2.18E-01 2.23E-01 1.11E-03 2.26E-01 2.20E-01 2.23E-01 1.33E-03 2.27E-01 2.20E-01 2.21E-01 1.29E-03 2.25E-01 2.18E-01 2.22E-01 2.45E-03 2.29E-01 2.15E-01 5.00E-01 PASS 2.22E-01 2.43E-03 2.29E-01 2.16E-01 5.00E-01 PASS 2.22E-01 2.45E-03 2.29E-01 2.15E-01 5.00E-01 PASS 2.21E-01 2.47E-03 2.28E-01 2.14E-01 5.00E-01 PASS 0 2.20E-01 2.21E-01 2.21E-01 2.23E-01 2.22E-01 2.18E-01 2.21E-01 2.23E-01 2.20E-01 2.23E-01 2.20E-01 2.20E-01 Total 20 2.20E-01 2.22E-01 2.20E-01 2.22E-01 2.22E-01 2.17E-01 2.21E-01 2.23E-01 2.20E-01 2.24E-01 2.20E-01 2.20E-01 Dose (krad(Si)) 50 100 2.21E-01 2.21E-01 2.22E-01 2.26E-01 2.21E-01 2.22E-01 2.24E-01 2.24E-01 2.23E-01 2.23E-01 2.18E-01 2.18E-01 2.22E-01 2.22E-01 2.23E-01 2.24E-01 2.20E-01 2.22E-01 2.24E-01 2.24E-01 2.20E-01 2.20E-01 2.20E-01 2.20E-01 2.21E-01 1.14E-03 2.24E-01 2.18E-01 2.21E-01 1.11E-03 2.24E-01 2.18E-01 2.22E-01 1.17E-03 2.25E-01 2.19E-01 2.21E-01 2.18E-03 2.27E-01 2.15E-01 5.00E-01 PASS 2.21E-01 2.61E-03 2.28E-01 2.14E-01 5.00E-01 PASS 2.21E-01 2.47E-03 2.28E-01 2.15E-01 5.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 153 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.72. Plot of Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 154 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.72. Raw data for Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 2.27E-01 2.27E-01 2.27E-01 2.25E-01 2.26E-01 2.27E-01 2.28E-01 2.28E-01 2.28E-01 2.27E-01 2.23E-01 2.20E-01 24-hr Anneal 225 2.26E-01 2.27E-01 2.27E-01 2.25E-01 2.26E-01 2.27E-01 2.28E-01 2.27E-01 2.27E-01 2.26E-01 2.23E-01 2.20E-01 168-hr Anneal 250 2.25E-01 2.25E-01 2.25E-01 2.24E-01 2.24E-01 2.26E-01 2.27E-01 2.27E-01 2.26E-01 2.25E-01 2.23E-01 2.20E-01 2.27E-01 2.06E-03 2.32E-01 2.21E-01 2.26E-01 6.38E-04 2.28E-01 2.24E-01 2.26E-01 8.99E-04 2.29E-01 2.24E-01 2.25E-01 5.84E-04 2.27E-01 2.23E-01 2.27E-01 4.50E-04 2.28E-01 2.26E-01 5.00E-01 PASS 2.28E-01 3.31E-04 2.28E-01 2.27E-01 5.00E-01 PASS 2.27E-01 6.56E-04 2.29E-01 2.25E-01 5.00E-01 PASS 2.26E-01 6.92E-04 2.28E-01 2.24E-01 5.00E-01 PASS 0 2.24E-01 2.25E-01 2.25E-01 2.23E-01 2.25E-01 2.26E-01 2.26E-01 2.26E-01 2.26E-01 2.25E-01 2.24E-01 2.20E-01 Total 20 2.25E-01 2.26E-01 2.25E-01 2.23E-01 2.24E-01 2.26E-01 2.26E-01 2.26E-01 2.26E-01 2.25E-01 2.23E-01 2.19E-01 Dose (krad(Si)) 50 100 2.25E-01 2.26E-01 2.25E-01 2.30E-01 2.25E-01 2.27E-01 2.24E-01 2.25E-01 2.25E-01 2.26E-01 2.26E-01 2.27E-01 2.26E-01 2.27E-01 2.27E-01 2.27E-01 2.26E-01 2.27E-01 2.25E-01 2.26E-01 2.24E-01 2.24E-01 2.20E-01 2.20E-01 2.24E-01 8.59E-04 2.27E-01 2.22E-01 2.25E-01 9.46E-04 2.27E-01 2.22E-01 2.25E-01 6.08E-04 2.27E-01 2.23E-01 2.26E-01 7.61E-04 2.28E-01 2.24E-01 5.00E-01 PASS 2.26E-01 5.74E-04 2.27E-01 2.24E-01 5.00E-01 PASS 2.26E-01 6.41E-04 2.28E-01 2.24E-01 5.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 155 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.73. Plot of Output Voltage Swing Low3_3 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 156 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.73. Raw data for Output Voltage Swing Low3_3 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low3_3 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 2.24E-01 2.24E-01 2.24E-01 2.21E-01 2.24E-01 2.24E-01 2.25E-01 2.25E-01 2.24E-01 2.24E-01 2.22E-01 2.17E-01 24-hr Anneal 225 2.24E-01 2.24E-01 2.24E-01 2.22E-01 2.24E-01 2.24E-01 2.25E-01 2.24E-01 2.24E-01 2.24E-01 2.22E-01 2.17E-01 168-hr Anneal 250 2.22E-01 2.22E-01 2.22E-01 2.20E-01 2.22E-01 2.23E-01 2.24E-01 2.23E-01 2.23E-01 2.22E-01 2.21E-01 2.17E-01 2.24E-01 1.83E-03 2.29E-01 2.19E-01 2.23E-01 1.14E-03 2.27E-01 2.20E-01 2.24E-01 1.01E-03 2.27E-01 2.21E-01 2.22E-01 8.69E-04 2.24E-01 2.19E-01 2.24E-01 5.75E-04 2.25E-01 2.22E-01 5.00E-01 PASS 2.25E-01 4.20E-04 2.26E-01 2.23E-01 5.00E-01 PASS 2.24E-01 7.46E-04 2.26E-01 2.22E-01 5.00E-01 PASS 2.23E-01 6.31E-04 2.25E-01 2.21E-01 5.00E-01 PASS 0 2.23E-01 2.22E-01 2.23E-01 2.20E-01 2.22E-01 2.23E-01 2.24E-01 2.23E-01 2.23E-01 2.22E-01 2.21E-01 2.17E-01 Total 20 2.22E-01 2.22E-01 2.23E-01 2.20E-01 2.22E-01 2.23E-01 2.23E-01 2.24E-01 2.23E-01 2.23E-01 2.21E-01 2.17E-01 Dose (krad(Si)) 50 100 2.23E-01 2.24E-01 2.23E-01 2.27E-01 2.23E-01 2.24E-01 2.21E-01 2.21E-01 2.23E-01 2.24E-01 2.23E-01 2.23E-01 2.24E-01 2.25E-01 2.24E-01 2.24E-01 2.23E-01 2.24E-01 2.23E-01 2.23E-01 2.22E-01 2.22E-01 2.17E-01 2.17E-01 2.22E-01 1.06E-03 2.25E-01 2.19E-01 2.22E-01 1.18E-03 2.25E-01 2.19E-01 2.23E-01 8.03E-04 2.25E-01 2.20E-01 2.23E-01 8.34E-04 2.25E-01 2.21E-01 5.00E-01 PASS 2.23E-01 2.93E-04 2.24E-01 2.22E-01 5.00E-01 PASS 2.23E-01 6.80E-04 2.25E-01 2.22E-01 5.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 157 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.74. Plot of Output Voltage Swing Low3_4 15V (V) @ VS=+/-15V IL=10mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 158 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.74. Raw data for Output Voltage Swing Low3_4 15V (V) @ VS=+/-15V IL=10mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low3_4 15V (V) @ VS=+/-15V IL=10mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 2.24E-01 2.26E-01 2.25E-01 2.28E-01 2.26E-01 2.22E-01 2.25E-01 2.26E-01 2.24E-01 2.28E-01 2.22E-01 2.23E-01 24-hr Anneal 225 2.24E-01 2.26E-01 2.26E-01 2.28E-01 2.26E-01 2.22E-01 2.25E-01 2.26E-01 2.23E-01 2.27E-01 2.23E-01 2.23E-01 168-hr Anneal 250 2.22E-01 2.24E-01 2.24E-01 2.26E-01 2.25E-01 2.21E-01 2.24E-01 2.25E-01 2.22E-01 2.26E-01 2.22E-01 2.23E-01 2.26E-01 2.02E-03 2.32E-01 2.20E-01 2.26E-01 1.26E-03 2.29E-01 2.22E-01 2.26E-01 1.38E-03 2.30E-01 2.22E-01 2.24E-01 1.46E-03 2.28E-01 2.20E-01 2.24E-01 2.21E-03 2.30E-01 2.18E-01 5.00E-01 PASS 2.25E-01 2.30E-03 2.31E-01 2.19E-01 5.00E-01 PASS 2.25E-01 2.23E-03 2.31E-01 2.19E-01 5.00E-01 PASS 2.24E-01 2.32E-03 2.30E-01 2.17E-01 5.00E-01 PASS 0 2.22E-01 2.24E-01 2.24E-01 2.26E-01 2.25E-01 2.21E-01 2.24E-01 2.25E-01 2.23E-01 2.26E-01 2.22E-01 2.22E-01 Total 20 2.22E-01 2.24E-01 2.24E-01 2.26E-01 2.25E-01 2.21E-01 2.23E-01 2.25E-01 2.22E-01 2.27E-01 2.23E-01 2.22E-01 Dose (krad(Si)) 50 100 2.23E-01 2.23E-01 2.24E-01 2.29E-01 2.24E-01 2.25E-01 2.27E-01 2.27E-01 2.25E-01 2.26E-01 2.21E-01 2.21E-01 2.24E-01 2.25E-01 2.25E-01 2.26E-01 2.22E-01 2.23E-01 2.27E-01 2.27E-01 2.22E-01 2.22E-01 2.23E-01 2.23E-01 2.24E-01 1.39E-03 2.28E-01 2.20E-01 2.24E-01 1.32E-03 2.28E-01 2.21E-01 2.25E-01 1.51E-03 2.29E-01 2.21E-01 2.23E-01 1.96E-03 2.29E-01 2.18E-01 5.00E-01 PASS 2.24E-01 2.21E-03 2.30E-01 2.18E-01 5.00E-01 PASS 2.24E-01 2.36E-03 2.30E-01 2.17E-01 5.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 159 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.75. Plot of Large Signal Voltage Gain1_1 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 160 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.75. Raw data for Large Signal Voltage Gain1_1 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain1_1 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 3.30E+03 3.91E+03 3.23E+03 2.97E+03 3.36E+03 4.07E+03 3.07E+03 4.58E+03 5.11E+03 3.24E+03 3.96E+03 7.59E+03 24-hr Anneal 225 3.33E+03 3.37E+03 3.32E+03 3.21E+03 3.48E+03 4.32E+03 3.18E+03 3.61E+03 5.91E+03 3.33E+03 3.88E+03 7.46E+03 168-hr Anneal 250 3.39E+03 3.51E+03 3.59E+03 3.33E+03 3.52E+03 4.88E+03 3.60E+03 4.09E+03 6.15E+03 3.61E+03 3.90E+03 7.58E+03 3.25E+03 1.21E+02 3.58E+03 2.92E+03 3.35E+03 3.47E+02 4.30E+03 2.40E+03 3.34E+03 9.66E+01 3.60E+03 3.07E+03 3.47E+03 1.06E+02 3.76E+03 3.18E+03 4.10E+03 7.33E+02 6.11E+03 2.09E+03 5.00E+02 PASS 4.01E+03 8.69E+02 6.40E+03 1.63E+03 5.00E+02 PASS 4.07E+03 1.12E+03 7.13E+03 1.01E+03 5.00E+02 PASS 4.46E+03 1.08E+03 7.41E+03 1.51E+03 5.00E+02 PASS 0 4.01E+03 4.15E+03 3.83E+03 3.30E+03 3.89E+03 5.40E+03 3.78E+03 3.94E+03 6.83E+03 3.82E+03 3.93E+03 7.78E+03 Total 20 4.01E+03 3.70E+03 3.51E+03 3.22E+03 3.58E+03 5.04E+03 3.64E+03 3.96E+03 6.75E+03 3.93E+03 3.90E+03 7.57E+03 Dose (krad(Si)) 50 100 3.25E+03 3.24E+03 4.06E+03 3.10E+03 3.44E+03 3.33E+03 3.29E+03 3.19E+03 3.54E+03 3.41E+03 4.89E+03 4.36E+03 3.49E+03 3.43E+03 3.73E+03 4.03E+03 6.26E+03 5.22E+03 3.50E+03 3.48E+03 3.93E+03 3.99E+03 7.62E+03 7.85E+03 3.83E+03 3.24E+02 4.72E+03 2.95E+03 3.60E+03 2.90E+02 4.40E+03 2.81E+03 3.52E+03 3.25E+02 4.41E+03 2.63E+03 4.75E+03 1.34E+03 8.44E+03 1.07E+03 1.00E+03 PASS 4.66E+03 1.28E+03 8.17E+03 1.15E+03 5.00E+02 PASS 4.37E+03 1.20E+03 7.67E+03 1.08E+03 5.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 161 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.76. Plot of Large Signal Voltage Gain1_2 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 162 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.76. Raw data for Large Signal Voltage Gain1_2 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain1_2 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 2.97E+03 4.96E+03 2.89E+03 3.00E+03 5.32E+03 2.83E+03 4.67E+03 4.00E+03 3.84E+03 4.73E+03 3.51E+03 3.44E+03 24-hr Anneal 225 3.00E+03 5.29E+03 2.83E+03 3.16E+03 5.27E+03 2.91E+03 5.01E+03 2.75E+03 3.63E+03 5.29E+03 3.59E+03 3.45E+03 168-hr Anneal 250 3.20E+03 5.60E+03 3.18E+03 3.39E+03 6.62E+03 3.37E+03 6.27E+03 3.03E+03 4.00E+03 5.92E+03 3.57E+03 3.60E+03 4.08E+03 1.26E+03 7.53E+03 6.28E+02 3.83E+03 1.21E+03 7.13E+03 5.22E+02 3.91E+03 1.26E+03 7.36E+03 4.66E+02 4.40E+03 1.61E+03 8.80E+03 ######## 4.44E+03 1.57E+03 8.75E+03 1.24E+02 5.00E+02 PASS 4.01E+03 7.68E+02 6.12E+03 1.91E+03 5.00E+02 PASS 3.92E+03 1.17E+03 7.14E+03 6.96E+02 5.00E+02 PASS 4.52E+03 1.49E+03 8.59E+03 4.42E+02 5.00E+02 PASS 0 3.42E+03 6.48E+03 3.40E+03 3.55E+03 6.11E+03 3.57E+03 6.78E+03 3.52E+03 4.43E+03 6.48E+03 3.58E+03 3.48E+03 Total 20 3.34E+03 5.62E+03 3.19E+03 3.41E+03 5.68E+03 3.38E+03 6.48E+03 3.48E+03 4.19E+03 7.11E+03 3.55E+03 3.54E+03 Dose (krad(Si)) 50 100 3.27E+03 3.31E+03 5.62E+03 5.39E+03 3.01E+03 3.04E+03 3.26E+03 3.13E+03 5.34E+03 5.51E+03 3.12E+03 3.30E+03 6.07E+03 5.03E+03 3.57E+03 2.98E+03 4.27E+03 4.01E+03 6.05E+03 6.87E+03 3.55E+03 3.55E+03 3.39E+03 3.41E+03 4.59E+03 1.56E+03 8.87E+03 3.16E+02 4.25E+03 1.28E+03 7.76E+03 7.38E+02 4.10E+03 1.27E+03 7.58E+03 6.23E+02 4.96E+03 1.57E+03 9.27E+03 6.41E+02 1.00E+03 PASS 4.93E+03 1.75E+03 9.72E+03 1.30E+02 5.00E+02 PASS 4.62E+03 1.38E+03 8.41E+03 8.24E+02 5.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 163 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.77. Plot of Large Signal Voltage Gain1_3 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 164 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.77. Raw data for Large Signal Voltage Gain1_3 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain1_3 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 4.66E+03 4.88E+03 2.82E+03 4.86E+03 4.19E+03 3.06E+03 3.13E+03 2.82E+03 4.73E+03 5.06E+03 3.27E+03 3.41E+03 24-hr Anneal 225 4.99E+03 5.24E+03 2.92E+03 5.13E+03 5.21E+03 3.05E+03 3.15E+03 2.96E+03 4.81E+03 4.85E+03 3.37E+03 3.40E+03 168-hr Anneal 250 5.54E+03 5.19E+03 3.13E+03 5.63E+03 5.08E+03 3.07E+03 3.37E+03 3.05E+03 5.22E+03 6.03E+03 3.59E+03 3.41E+03 4.56E+03 8.98E+02 7.02E+03 2.10E+03 4.28E+03 8.65E+02 6.65E+03 1.91E+03 4.70E+03 1.00E+03 7.44E+03 1.96E+03 4.91E+03 1.02E+03 7.72E+03 2.11E+03 4.02E+03 1.12E+03 7.09E+03 9.55E+02 5.00E+02 PASS 3.76E+03 1.05E+03 6.63E+03 8.87E+02 5.00E+02 PASS 3.77E+03 9.73E+02 6.43E+03 1.10E+03 5.00E+02 PASS 4.15E+03 1.38E+03 7.95E+03 3.50E+02 5.00E+02 PASS 0 6.13E+03 6.16E+03 3.31E+03 6.11E+03 6.04E+03 3.48E+03 3.60E+03 3.25E+03 6.22E+03 7.16E+03 3.60E+03 3.43E+03 Total 20 5.42E+03 4.79E+03 3.21E+03 5.76E+03 5.64E+03 3.24E+03 3.29E+03 3.22E+03 5.56E+03 5.97E+03 3.43E+03 3.44E+03 Dose (krad(Si)) 50 100 5.69E+03 4.83E+03 5.04E+03 5.07E+03 3.10E+03 2.97E+03 5.43E+03 5.08E+03 4.92E+03 4.86E+03 3.26E+03 2.99E+03 3.55E+03 3.44E+03 3.42E+03 3.22E+03 5.38E+03 5.34E+03 5.96E+03 5.13E+03 3.40E+03 3.46E+03 3.37E+03 3.39E+03 5.55E+03 1.25E+03 8.98E+03 2.12E+03 4.96E+03 1.05E+03 7.85E+03 2.08E+03 4.83E+03 1.02E+03 7.62E+03 2.05E+03 4.74E+03 1.81E+03 9.71E+03 -2.33E+02 1.00E+03 PASS 4.26E+03 1.39E+03 8.06E+03 4.56E+02 5.00E+02 PASS 4.31E+03 1.26E+03 7.76E+03 8.63E+02 5.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 165 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.78. Plot of Large Signal Voltage Gain1_4 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 166 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.78. Raw data for Large Signal Voltage Gain1_4 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain1_4 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 2.94E+03 2.82E+03 2.95E+03 3.98E+03 4.94E+03 4.59E+03 3.05E+03 3.01E+03 4.77E+03 4.25E+03 3.67E+03 6.28E+03 24-hr Anneal 225 3.07E+03 2.92E+03 3.15E+03 3.07E+03 4.88E+03 4.33E+03 3.18E+03 3.02E+03 4.68E+03 4.26E+03 3.68E+03 6.50E+03 168-hr Anneal 250 3.27E+03 2.99E+03 3.09E+03 4.04E+03 5.38E+03 5.45E+03 3.40E+03 3.25E+03 5.23E+03 4.43E+03 3.69E+03 6.36E+03 3.67E+03 9.38E+02 6.24E+03 1.10E+03 3.53E+03 9.18E+02 6.04E+03 1.01E+03 3.42E+03 8.23E+02 5.68E+03 1.16E+03 3.75E+03 9.99E+02 6.49E+03 1.01E+03 4.11E+03 9.15E+02 6.62E+03 1.60E+03 5.00E+02 PASS 3.93E+03 8.45E+02 6.25E+03 1.62E+03 5.00E+02 PASS 3.89E+03 7.45E+02 5.93E+03 1.85E+03 5.00E+02 PASS 4.35E+03 1.01E+03 7.12E+03 1.58E+03 5.00E+02 PASS 0 3.41E+03 3.26E+03 3.37E+03 3.84E+03 6.05E+03 6.10E+03 3.59E+03 3.61E+03 6.04E+03 4.75E+03 3.66E+03 6.43E+03 Total 20 3.31E+03 3.08E+03 3.43E+03 2.92E+03 5.56E+03 5.66E+03 3.57E+03 3.36E+03 5.65E+03 5.03E+03 3.64E+03 6.34E+03 Dose (krad(Si)) 50 100 3.17E+03 3.07E+03 3.11E+03 3.05E+03 3.09E+03 2.96E+03 3.22E+03 4.16E+03 5.02E+03 5.09E+03 6.16E+03 5.15E+03 3.30E+03 3.23E+03 3.32E+03 3.19E+03 5.46E+03 4.92E+03 4.37E+03 4.06E+03 3.67E+03 3.76E+03 6.27E+03 6.28E+03 3.98E+03 1.17E+03 7.20E+03 7.65E+02 3.66E+03 1.08E+03 6.63E+03 6.97E+02 3.52E+03 8.38E+02 5.82E+03 1.22E+03 4.82E+03 1.24E+03 8.21E+03 1.42E+03 1.00E+03 PASS 4.65E+03 1.12E+03 7.72E+03 1.59E+03 5.00E+02 PASS 4.52E+03 1.28E+03 8.02E+03 1.02E+03 5.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 167 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.79. Plot of Large Signal Voltage Gain2_1 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 168 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.79. Raw data for Large Signal Voltage Gain2_1 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain2_1 15V (V/mV) @ VO=+/-10V, RL=2kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 7.77E+02 7.43E+02 7.88E+02 7.39E+02 7.70E+02 1.12E+03 7.41E+02 9.08E+02 1.66E+03 7.47E+02 8.98E+02 2.34E+03 24-hr Anneal 225 8.22E+02 7.22E+02 8.11E+02 7.67E+02 7.89E+02 1.14E+03 7.65E+02 8.16E+02 1.67E+03 7.73E+02 8.99E+02 2.31E+03 168-hr Anneal 250 8.48E+02 7.44E+02 8.48E+02 7.82E+02 8.24E+02 1.22E+03 8.11E+02 8.62E+02 1.87E+03 8.15E+02 9.02E+02 2.36E+03 7.73E+02 5.53E+01 9.25E+02 6.22E+02 7.63E+02 2.15E+01 8.22E+02 7.05E+02 7.82E+02 3.97E+01 8.91E+02 6.73E+02 8.09E+02 4.53E+01 9.34E+02 6.85E+02 1.08E+03 4.20E+02 2.23E+03 -7.34E+01 2.50E+02 PASS 1.03E+03 3.81E+02 2.08E+03 -9.27E+00 2.50E+02 PASS 1.03E+03 3.89E+02 2.10E+03 -3.44E+01 2.50E+02 PASS 1.12E+03 4.55E+02 2.36E+03 -1.31E+02 2.50E+02 PASS 0 8.87E+02 8.72E+02 9.00E+02 8.45E+02 8.66E+02 1.33E+03 8.54E+02 9.04E+02 2.04E+03 8.53E+02 9.04E+02 2.34E+03 Total 20 8.64E+02 7.45E+02 8.69E+02 7.64E+02 8.47E+02 1.25E+03 8.41E+02 8.85E+02 2.08E+03 9.56E+02 8.98E+02 2.36E+03 Dose (krad(Si)) 50 100 8.18E+02 8.13E+02 7.34E+02 6.84E+02 8.57E+02 8.25E+02 7.58E+02 7.74E+02 8.27E+02 7.71E+02 1.26E+03 1.20E+03 8.23E+02 7.94E+02 8.57E+02 8.44E+02 1.81E+03 1.77E+03 8.27E+02 7.89E+02 9.05E+02 8.98E+02 2.23E+03 2.46E+03 8.74E+02 2.09E+01 9.31E+02 8.17E+02 8.18E+02 5.87E+01 9.79E+02 6.57E+02 7.99E+02 5.10E+01 9.39E+02 6.59E+02 1.19E+03 5.11E+02 2.60E+03 -2.06E+02 5.00E+02 PASS 1.20E+03 5.15E+02 2.61E+03 -2.10E+02 2.50E+02 PASS 1.12E+03 4.29E+02 2.29E+03 -5.96E+01 2.50E+02 PASS An ISO 9001:2008 and DLA Certified Company 169 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.80. Plot of Large Signal Voltage Gain2_2 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 170 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.80. Raw data for Large Signal Voltage Gain2_2 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain2_2 15V (V/mV) @ VO=+/-10V, RL=2kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 9.22E+02 2.26E+03 8.31E+02 8.92E+02 2.29E+03 8.66E+02 2.23E+03 8.88E+02 1.24E+03 2.41E+03 8.75E+02 8.86E+02 Total 20 8.22E+02 2.04E+03 7.99E+02 8.41E+02 2.07E+03 8.39E+02 2.19E+03 8.75E+02 1.48E+03 2.35E+03 8.76E+02 8.77E+02 Dose (krad(Si)) 50 100 8.22E+02 7.84E+02 1.92E+03 1.85E+03 7.77E+02 7.64E+02 8.35E+02 7.98E+02 1.99E+03 1.87E+03 8.33E+02 8.03E+02 2.19E+03 1.94E+03 8.55E+02 8.57E+02 1.16E+03 1.11E+03 2.17E+03 1.92E+03 8.78E+02 8.81E+02 8.81E+02 8.87E+02 200 7.67E+02 1.65E+03 7.25E+02 7.91E+02 1.74E+03 7.80E+02 1.70E+03 7.75E+02 1.07E+03 1.92E+03 8.74E+02 8.81E+02 24-hr Anneal 225 7.87E+02 1.78E+03 7.51E+02 8.10E+02 1.95E+03 7.92E+02 1.76E+03 7.84E+02 1.07E+03 1.93E+03 8.80E+02 8.75E+02 168-hr Anneal 250 8.12E+02 1.94E+03 7.89E+02 8.49E+02 2.13E+03 8.39E+02 2.18E+03 8.62E+02 1.17E+03 2.13E+03 8.78E+02 8.85E+02 1.44E+03 7.63E+02 3.53E+03 -6.54E+02 1.31E+03 6.76E+02 3.17E+03 -5.39E+02 1.27E+03 6.26E+02 2.98E+03 -4.48E+02 1.21E+03 5.89E+02 2.83E+03 -4.04E+02 1.13E+03 5.12E+02 2.54E+03 -2.69E+02 1.22E+03 5.97E+02 2.85E+03 -4.22E+02 1.30E+03 6.71E+02 3.14E+03 -5.36E+02 1.52E+03 7.39E+02 3.55E+03 -5.03E+02 5.00E+02 PASS 1.55E+03 7.11E+02 3.50E+03 -4.02E+02 2.50E+02 PASS 1.44E+03 6.86E+02 3.32E+03 -4.39E+02 2.50E+02 PASS 1.33E+03 5.62E+02 2.87E+03 -2.16E+02 2.50E+02 PASS 1.25E+03 5.32E+02 2.71E+03 -2.09E+02 2.50E+02 PASS 1.27E+03 5.42E+02 2.75E+03 -2.21E+02 2.50E+02 PASS 1.44E+03 6.70E+02 3.27E+03 -4.01E+02 2.50E+02 PASS An ISO 9001:2008 and DLA Certified Company 171 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.81. Plot of Large Signal Voltage Gain2_3 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 172 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.81. Raw data for Large Signal Voltage Gain2_3 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain2_3 15V (V/mV) @ VO=+/-10V, RL=2kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.67E+03 1.72E+03 7.28E+02 1.78E+03 1.64E+03 7.51E+02 8.09E+02 7.81E+02 1.79E+03 1.83E+03 8.91E+02 8.84E+02 24-hr Anneal 225 1.79E+03 1.79E+03 7.53E+02 1.83E+03 1.77E+03 7.74E+02 8.22E+02 7.70E+02 1.90E+03 1.91E+03 8.73E+02 8.88E+02 168-hr Anneal 250 1.97E+03 1.89E+03 7.88E+02 2.09E+03 1.97E+03 8.17E+02 8.68E+02 8.04E+02 2.04E+03 2.24E+03 8.87E+02 8.84E+02 1.60E+03 4.80E+02 2.92E+03 2.87E+02 1.51E+03 4.39E+02 2.71E+03 3.04E+02 1.59E+03 4.66E+02 2.86E+03 3.08E+02 1.74E+03 5.36E+02 3.21E+03 2.68E+02 1.28E+03 6.53E+02 3.07E+03 -5.07E+02 2.50E+02 PASS 1.19E+03 5.64E+02 2.74E+03 -3.55E+02 2.50E+02 PASS 1.24E+03 6.12E+02 2.91E+03 -4.43E+02 2.50E+02 PASS 1.35E+03 7.23E+02 3.34E+03 -6.27E+02 2.50E+02 PASS 0 2.29E+03 2.28E+03 8.36E+02 2.36E+03 2.15E+03 8.59E+02 9.11E+02 8.31E+02 2.22E+03 2.44E+03 8.82E+02 8.81E+02 Total 20 2.01E+03 2.02E+03 8.05E+02 2.09E+03 1.98E+03 8.38E+02 8.73E+02 8.29E+02 2.09E+03 2.22E+03 8.77E+02 8.85E+02 Dose (krad(Si)) 50 100 1.92E+03 1.84E+03 1.94E+03 1.79E+03 7.99E+02 7.48E+02 1.98E+03 1.87E+03 1.81E+03 1.77E+03 8.25E+02 7.93E+02 8.36E+02 8.42E+02 8.07E+02 7.90E+02 1.96E+03 1.92E+03 2.28E+03 2.07E+03 8.67E+02 8.83E+02 8.72E+02 8.86E+02 1.98E+03 6.46E+02 3.75E+03 2.12E+02 1.78E+03 5.48E+02 3.28E+03 2.80E+02 1.69E+03 5.02E+02 3.07E+03 3.14E+02 1.45E+03 8.04E+02 3.66E+03 -7.54E+02 5.00E+02 PASS 1.37E+03 7.20E+02 3.34E+03 -6.02E+02 2.50E+02 PASS 1.34E+03 7.19E+02 3.31E+03 -6.30E+02 2.50E+02 PASS An ISO 9001:2008 and DLA Certified Company 173 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.82. Plot of Large Signal Voltage Gain2_4 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 174 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.82. Raw data for Large Signal Voltage Gain2_4 15V (V/mV) @ VO=+/-10V, RL=2kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain2_4 15V (V/mV) @ VO=+/-10V, RL=2kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.66E+02 8.07E+02 8.59E+02 9.41E+02 2.12E+03 2.16E+03 9.69E+02 8.87E+02 2.13E+03 1.31E+03 9.00E+02 2.25E+03 Total 20 8.45E+02 7.90E+02 8.28E+02 8.46E+02 1.94E+03 2.06E+03 8.65E+02 8.41E+02 2.08E+03 1.24E+03 9.09E+02 2.23E+03 Dose (krad(Si)) 50 100 8.09E+02 7.81E+02 7.57E+02 7.24E+02 7.91E+02 7.88E+02 8.86E+02 7.68E+02 1.85E+03 1.68E+03 2.01E+03 2.78E+03 8.56E+02 8.45E+02 8.48E+02 8.35E+02 2.05E+03 1.87E+03 1.23E+03 1.17E+03 9.03E+02 9.05E+02 2.23E+03 2.24E+03 200 7.63E+02 7.02E+02 7.67E+02 7.75E+02 1.59E+03 1.66E+03 8.07E+02 8.09E+02 1.79E+03 1.18E+03 9.04E+02 2.26E+03 24-hr Anneal 225 7.85E+02 7.47E+02 7.69E+02 8.12E+02 1.69E+03 1.72E+03 8.04E+02 8.06E+02 1.67E+03 1.17E+03 9.08E+02 2.25E+03 168-hr Anneal 250 8.18E+02 7.71E+02 8.23E+02 7.63E+02 2.11E+03 1.94E+03 8.47E+02 8.26E+02 1.97E+03 1.23E+03 9.11E+02 2.25E+03 1.12E+03 5.63E+02 2.66E+03 -4.24E+02 1.05E+03 4.98E+02 2.41E+03 -3.15E+02 1.02E+03 4.69E+02 2.31E+03 -2.66E+02 9.48E+02 4.09E+02 2.07E+03 -1.73E+02 9.20E+02 3.77E+02 1.95E+03 -1.14E+02 9.60E+02 4.08E+02 2.08E+03 -1.58E+02 1.06E+03 5.89E+02 2.67E+03 -5.58E+02 1.49E+03 6.19E+02 3.19E+03 -2.04E+02 5.00E+02 PASS 1.42E+03 6.15E+02 3.10E+03 -2.70E+02 2.50E+02 PASS 1.40E+03 5.97E+02 3.03E+03 -2.39E+02 2.50E+02 PASS 1.50E+03 8.32E+02 3.78E+03 -7.81E+02 2.50E+02 PASS 1.25E+03 4.62E+02 2.51E+03 -1.88E+01 2.50E+02 PASS 1.23E+03 4.46E+02 2.46E+03 9.18E+00 2.50E+02 PASS 1.36E+03 5.64E+02 2.91E+03 -1.84E+02 2.50E+02 PASS An ISO 9001:2008 and DLA Certified Company 175 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.83. Plot of Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 176 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.83. Raw data for Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.05E+02 1.04E+02 1.03E+02 9.99E+01 1.10E+02 1.28E+02 1.06E+02 9.82E+01 1.01E+02 1.02E+02 1.01E+02 1.01E+02 24-hr Anneal 225 1.06E+02 1.05E+02 1.03E+02 1.00E+02 1.11E+02 1.26E+02 1.06E+02 9.83E+01 1.01E+02 1.02E+02 1.00E+02 1.01E+02 168-hr Anneal 250 1.08E+02 1.05E+02 1.03E+02 1.01E+02 1.10E+02 1.23E+02 1.06E+02 9.86E+01 1.02E+02 1.03E+02 1.00E+02 1.01E+02 1.05E+02 4.00E+00 1.16E+02 9.40E+01 1.04E+02 3.77E+00 1.15E+02 9.41E+01 1.05E+02 4.01E+00 1.16E+02 9.41E+01 1.05E+02 3.65E+00 1.15E+02 9.52E+01 1.07E+02 1.04E+01 1.35E+02 7.81E+01 8.60E+01 PASS 1.07E+02 1.20E+01 1.40E+02 7.41E+01 8.60E+01 PASS 1.07E+02 1.10E+01 1.37E+02 7.65E+01 8.60E+01 PASS 1.07E+02 9.56E+00 1.33E+02 8.03E+01 8.60E+01 PASS 0 1.07E+02 1.05E+02 1.03E+02 1.00E+02 1.12E+02 1.17E+02 1.07E+02 9.87E+01 1.02E+02 1.03E+02 1.01E+02 1.01E+02 Total 20 1.07E+02 1.05E+02 1.03E+02 1.00E+02 1.12E+02 1.18E+02 1.07E+02 9.86E+01 1.02E+02 1.03E+02 1.01E+02 1.01E+02 Dose (krad(Si)) 50 100 1.06E+02 1.06E+02 1.05E+02 1.05E+02 1.03E+02 1.03E+02 1.00E+02 1.00E+02 1.11E+02 1.11E+02 1.21E+02 1.24E+02 1.07E+02 1.06E+02 9.84E+01 9.84E+01 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.01E+02 1.01E+02 1.01E+02 1.01E+02 1.05E+02 4.37E+00 1.17E+02 9.35E+01 1.05E+02 4.26E+00 1.17E+02 9.38E+01 1.05E+02 4.02E+00 1.16E+02 9.41E+01 1.06E+02 6.92E+00 1.25E+02 8.66E+01 9.00E+01 PASS 1.06E+02 7.70E+00 1.27E+02 8.46E+01 8.60E+01 PASS 1.06E+02 9.00E+00 1.31E+02 8.15E+01 8.60E+01 PASS An ISO 9001:2008 and DLA Certified Company 177 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.84. Plot of Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 178 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.84. Raw data for Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.02E+02 1.06E+02 9.95E+01 1.12E+02 1.00E+02 1.11E+02 1.01E+02 9.97E+01 9.89E+01 1.08E+02 1.01E+02 1.09E+02 24-hr Anneal 225 1.02E+02 1.06E+02 9.99E+01 1.13E+02 1.01E+02 1.11E+02 1.01E+02 9.98E+01 9.90E+01 1.09E+02 1.01E+02 1.09E+02 168-hr Anneal 250 1.02E+02 1.06E+02 9.99E+01 1.15E+02 1.01E+02 1.17E+02 1.02E+02 1.00E+02 9.98E+01 1.10E+02 1.01E+02 1.09E+02 1.04E+02 5.48E+00 1.19E+02 8.93E+01 1.04E+02 5.15E+00 1.18E+02 8.97E+01 1.04E+02 5.59E+00 1.20E+02 8.91E+01 1.05E+02 6.20E+00 1.22E+02 8.77E+01 1.04E+02 5.82E+00 1.20E+02 8.83E+01 8.60E+01 PASS 1.04E+02 5.54E+00 1.19E+02 8.87E+01 8.60E+01 PASS 1.04E+02 5.61E+00 1.19E+02 8.86E+01 8.60E+01 PASS 1.06E+02 7.54E+00 1.26E+02 8.51E+01 8.60E+01 PASS 0 1.02E+02 1.08E+02 1.00E+02 1.14E+02 1.01E+02 1.15E+02 1.02E+02 1.01E+02 9.99E+01 1.11E+02 1.01E+02 1.09E+02 Total 20 1.02E+02 1.07E+02 1.00E+02 1.14E+02 1.01E+02 1.14E+02 1.02E+02 1.00E+02 9.97E+01 1.10E+02 1.01E+02 1.09E+02 Dose (krad(Si)) 50 100 1.02E+02 1.02E+02 1.07E+02 1.06E+02 9.99E+01 9.98E+01 1.13E+02 1.13E+02 1.01E+02 1.01E+02 1.13E+02 1.12E+02 1.01E+02 1.01E+02 1.00E+02 1.00E+02 9.94E+01 9.92E+01 1.09E+02 1.09E+02 1.01E+02 1.01E+02 1.09E+02 1.09E+02 1.05E+02 5.86E+00 1.21E+02 8.90E+01 1.05E+02 5.78E+00 1.21E+02 8.91E+01 1.05E+02 5.49E+00 1.20E+02 8.95E+01 1.06E+02 6.73E+00 1.24E+02 8.70E+01 9.00E+01 PASS 1.05E+02 6.58E+00 1.23E+02 8.72E+01 8.60E+01 PASS 1.05E+02 6.25E+00 1.22E+02 8.76E+01 8.60E+01 PASS An ISO 9001:2008 and DLA Certified Company 179 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.85. Plot of Common Mode Rejection Ratio1_3 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 180 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.85. Raw data for Common Mode Rejection Ratio1_3 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio1_3 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.04E+02 1.12E+02 9.95E+01 1.07E+02 9.79E+01 1.09E+02 1.05E+02 9.95E+01 1.02E+02 9.80E+01 1.16E+02 1.03E+02 24-hr Anneal 225 1.04E+02 1.14E+02 9.98E+01 1.07E+02 9.82E+01 1.10E+02 1.05E+02 9.95E+01 1.02E+02 9.81E+01 1.16E+02 1.03E+02 168-hr Anneal 250 1.04E+02 1.16E+02 1.01E+02 1.07E+02 9.89E+01 1.13E+02 1.06E+02 9.96E+01 1.03E+02 9.88E+01 1.17E+02 1.03E+02 1.05E+02 6.19E+00 1.22E+02 8.76E+01 1.04E+02 5.80E+00 1.20E+02 8.81E+01 1.05E+02 6.19E+00 1.22E+02 8.77E+01 1.05E+02 6.79E+00 1.24E+02 8.66E+01 1.03E+02 4.80E+00 1.16E+02 8.99E+01 8.60E+01 PASS 1.03E+02 4.59E+00 1.15E+02 9.01E+01 8.60E+01 PASS 1.03E+02 4.68E+00 1.16E+02 9.00E+01 8.60E+01 PASS 1.04E+02 5.72E+00 1.20E+02 8.84E+01 8.60E+01 PASS 0 1.05E+02 1.15E+02 9.97E+01 1.09E+02 9.85E+01 1.12E+02 1.07E+02 9.97E+01 1.03E+02 9.91E+01 1.16E+02 1.03E+02 Total 20 1.05E+02 1.15E+02 9.98E+01 1.09E+02 9.85E+01 1.11E+02 1.07E+02 9.97E+01 1.03E+02 9.89E+01 1.16E+02 1.03E+02 Dose (krad(Si)) 50 100 1.04E+02 1.04E+02 1.14E+02 1.13E+02 9.97E+01 9.96E+01 1.08E+02 1.08E+02 9.83E+01 9.82E+01 1.10E+02 1.10E+02 1.06E+02 1.06E+02 9.96E+01 9.95E+01 1.02E+02 1.02E+02 9.86E+01 9.83E+01 1.16E+02 1.16E+02 1.03E+02 1.03E+02 1.06E+02 6.95E+00 1.25E+02 8.65E+01 1.05E+02 6.83E+00 1.24E+02 8.67E+01 1.05E+02 6.54E+00 1.23E+02 8.71E+01 1.04E+02 5.49E+00 1.19E+02 8.92E+01 9.00E+01 PASS 1.04E+02 5.20E+00 1.18E+02 8.96E+01 8.60E+01 PASS 1.03E+02 4.90E+00 1.17E+02 9.00E+01 8.60E+01 PASS An ISO 9001:2008 and DLA Certified Company 181 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.86. Plot of Common Mode Rejection Ratio1_4 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 182 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.86. Raw data for Common Mode Rejection Ratio1_4 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio1_4 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.12E+02 1.04E+02 1.02E+02 1.03E+02 1.02E+02 1.08E+02 1.05E+02 1.05E+02 1.13E+02 1.38E+02 1.09E+02 1.00E+02 24-hr Anneal 225 1.14E+02 1.05E+02 1.02E+02 1.04E+02 1.02E+02 1.08E+02 1.05E+02 1.05E+02 1.12E+02 1.35E+02 1.09E+02 1.00E+02 168-hr Anneal 250 1.18E+02 1.05E+02 1.02E+02 1.05E+02 1.02E+02 1.10E+02 1.05E+02 1.08E+02 1.13E+02 1.29E+02 1.09E+02 1.00E+02 1.05E+02 5.11E+00 1.19E+02 9.14E+01 1.05E+02 4.43E+00 1.17E+02 9.25E+01 1.05E+02 5.14E+00 1.20E+02 9.13E+01 1.06E+02 6.76E+00 1.25E+02 8.79E+01 1.13E+02 1.10E+01 1.43E+02 8.23E+01 8.60E+01 PASS 1.14E+02 1.40E+01 1.52E+02 7.53E+01 8.60E+01 PASS 1.13E+02 1.24E+01 1.47E+02 7.91E+01 8.60E+01 PASS 1.13E+02 9.59E+00 1.39E+02 8.66E+01 8.60E+01 PASS 0 1.17E+02 1.06E+02 1.03E+02 1.04E+02 1.03E+02 1.11E+02 1.07E+02 1.07E+02 1.10E+02 1.24E+02 1.09E+02 1.00E+02 Total 20 1.16E+02 1.06E+02 1.02E+02 1.04E+02 1.03E+02 1.10E+02 1.06E+02 1.07E+02 1.10E+02 1.26E+02 1.09E+02 1.00E+02 Dose (krad(Si)) 50 100 1.15E+02 1.14E+02 1.05E+02 1.05E+02 1.02E+02 1.02E+02 1.04E+02 1.04E+02 1.03E+02 1.02E+02 1.09E+02 1.09E+02 1.06E+02 1.05E+02 1.06E+02 1.05E+02 1.11E+02 1.12E+02 1.28E+02 1.32E+02 1.09E+02 1.09E+02 1.00E+02 1.00E+02 1.07E+02 6.08E+00 1.23E+02 8.98E+01 1.06E+02 5.63E+00 1.22E+02 9.07E+01 1.06E+02 5.43E+00 1.21E+02 9.09E+01 1.12E+02 7.11E+00 1.31E+02 9.22E+01 9.00E+01 PASS 1.12E+02 8.18E+00 1.34E+02 8.95E+01 8.60E+01 PASS 1.12E+02 9.03E+00 1.37E+02 8.72E+01 8.60E+01 PASS An ISO 9001:2008 and DLA Certified Company 183 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.87. Plot of CMRR Match1 1 to 4 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 184 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.87. Raw data for CMRR Match1 1 to 4 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR Match1 1 to 4 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.11E+02 1.31E+02 1.21E+02 1.10E+02 1.06E+02 1.07E+02 1.28E+02 1.04E+02 9.94E+01 1.02E+02 1.04E+02 1.17E+02 24-hr Anneal 225 1.10E+02 1.37E+02 1.19E+02 1.10E+02 1.06E+02 1.07E+02 1.27E+02 1.03E+02 9.93E+01 1.02E+02 1.05E+02 1.16E+02 168-hr Anneal 250 1.11E+02 1.34E+02 1.24E+02 1.09E+02 1.06E+02 1.08E+02 1.24E+02 1.02E+02 1.00E+02 1.02E+02 1.05E+02 1.17E+02 1.17E+02 1.35E+01 1.54E+02 8.01E+01 1.16E+02 1.02E+01 1.44E+02 8.79E+01 1.17E+02 1.22E+01 1.50E+02 8.30E+01 1.17E+02 1.20E+01 1.50E+02 8.40E+01 1.08E+02 1.16E+01 1.40E+02 7.62E+01 8.30E+01 PASS 1.08E+02 1.17E+01 1.40E+02 7.59E+01 8.30E+01 PASS 1.08E+02 1.10E+01 1.38E+02 7.76E+01 8.30E+01 PASS 1.07E+02 9.66E+00 1.34E+02 8.08E+01 8.30E+01 PASS 0 1.10E+02 1.26E+02 1.24E+02 1.09E+02 1.07E+02 1.07E+02 1.28E+02 1.03E+02 9.91E+01 1.02E+02 1.05E+02 1.17E+02 Total 20 1.10E+02 1.30E+02 1.22E+02 1.09E+02 1.07E+02 1.07E+02 1.28E+02 1.03E+02 9.91E+01 1.02E+02 1.05E+02 1.17E+02 Dose (krad(Si)) 50 100 1.10E+02 1.10E+02 1.40E+02 1.39E+02 1.21E+02 1.21E+02 1.10E+02 1.09E+02 1.07E+02 1.07E+02 1.08E+02 1.07E+02 1.26E+02 1.28E+02 1.03E+02 1.03E+02 9.92E+01 9.93E+01 1.02E+02 1.02E+02 1.05E+02 1.05E+02 1.17E+02 1.17E+02 1.15E+02 9.16E+00 1.40E+02 9.00E+01 1.15E+02 9.74E+00 1.42E+02 8.88E+01 1.17E+02 1.36E+01 1.55E+02 8.00E+01 1.08E+02 1.16E+01 1.40E+02 7.61E+01 8.40E+01 PASS 1.08E+02 1.16E+01 1.40E+02 7.62E+01 8.30E+01 PASS 1.08E+02 1.09E+01 1.37E+02 7.79E+01 8.30E+01 PASS An ISO 9001:2008 and DLA Certified Company 185 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.88. Plot of CMRR Match1 2 to 3 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 186 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.88. Raw data for CMRR Match1 2 to 3 15V (dB) @ VS=+/-15V, VCM=+/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR Match1 2 to 3 15V (dB) @ VS=+/-15V, VCM=+/-15V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.15E+02 1.11E+02 1.43E+02 1.13E+02 1.10E+02 1.25E+02 1.10E+02 1.30E+02 1.10E+02 1.01E+02 9.96E+01 1.09E+02 24-hr Anneal 225 1.15E+02 1.11E+02 1.43E+02 1.13E+02 1.11E+02 1.26E+02 1.10E+02 1.27E+02 1.10E+02 1.01E+02 9.96E+01 1.10E+02 168-hr Anneal 250 1.17E+02 1.10E+02 1.23E+02 1.11E+02 1.14E+02 1.21E+02 1.10E+02 1.21E+02 1.10E+02 1.02E+02 9.96E+01 1.10E+02 1.17E+02 9.18E+00 1.42E+02 9.14E+01 1.19E+02 1.39E+01 1.57E+02 8.04E+01 1.19E+02 1.37E+01 1.56E+02 8.12E+01 1.15E+02 5.27E+00 1.29E+02 1.00E+02 1.14E+02 1.02E+01 1.42E+02 8.60E+01 8.30E+01 PASS 1.15E+02 1.20E+01 1.48E+02 8.23E+01 8.30E+01 PASS 1.15E+02 1.12E+01 1.45E+02 8.38E+01 8.30E+01 PASS 1.13E+02 8.48E+00 1.36E+02 8.95E+01 8.30E+01 PASS 0 1.14E+02 1.12E+02 1.30E+02 1.17E+02 1.10E+02 1.25E+02 1.08E+02 1.21E+02 1.11E+02 1.02E+02 9.96E+01 1.10E+02 Total 20 1.14E+02 1.12E+02 1.32E+02 1.16E+02 1.10E+02 1.22E+02 1.09E+02 1.23E+02 1.11E+02 1.02E+02 9.96E+01 1.10E+02 Dose (krad(Si)) 50 100 1.15E+02 1.14E+02 1.11E+02 1.11E+02 1.37E+02 1.33E+02 1.16E+02 1.14E+02 1.11E+02 1.11E+02 1.22E+02 1.24E+02 1.09E+02 1.09E+02 1.24E+02 1.25E+02 1.10E+02 1.10E+02 1.02E+02 1.01E+02 9.96E+01 9.96E+01 1.10E+02 1.10E+02 1.16E+02 7.84E+00 1.38E+02 9.50E+01 1.17E+02 8.85E+00 1.41E+02 9.25E+01 1.18E+02 1.08E+01 1.48E+02 8.82E+01 1.13E+02 9.59E+00 1.40E+02 8.72E+01 8.40E+01 PASS 1.13E+02 9.15E+00 1.38E+02 8.82E+01 8.30E+01 PASS 1.13E+02 9.48E+00 1.39E+02 8.74E+01 8.30E+01 PASS An ISO 9001:2008 and DLA Certified Company 187 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.89. Plot of Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 188 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.89. Raw data for Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.11E+02 1.11E+02 1.17E+02 1.13E+02 1.18E+02 1.12E+02 1.31E+02 1.14E+02 1.18E+02 1.27E+02 1.07E+02 1.12E+02 24-hr Anneal 225 1.11E+02 1.11E+02 1.17E+02 1.13E+02 1.18E+02 1.12E+02 1.30E+02 1.14E+02 1.18E+02 1.27E+02 1.07E+02 1.12E+02 168-hr Anneal 250 1.11E+02 1.11E+02 1.16E+02 1.13E+02 1.18E+02 1.11E+02 1.30E+02 1.14E+02 1.18E+02 1.27E+02 1.07E+02 1.12E+02 1.14E+02 3.12E+00 1.22E+02 1.05E+02 1.14E+02 3.22E+00 1.23E+02 1.05E+02 1.14E+02 3.17E+00 1.23E+02 1.05E+02 1.14E+02 2.93E+00 1.22E+02 1.06E+02 1.20E+02 8.21E+00 1.43E+02 9.77E+01 9.00E+01 PASS 1.20E+02 8.50E+00 1.44E+02 9.71E+01 9.00E+01 PASS 1.20E+02 7.96E+00 1.42E+02 9.83E+01 9.00E+01 PASS 1.20E+02 8.20E+00 1.43E+02 9.76E+01 9.00E+01 PASS 0 1.11E+02 1.11E+02 1.16E+02 1.14E+02 1.18E+02 1.11E+02 1.30E+02 1.15E+02 1.18E+02 1.27E+02 1.07E+02 1.12E+02 Total 20 1.11E+02 1.11E+02 1.16E+02 1.13E+02 1.18E+02 1.11E+02 1.30E+02 1.15E+02 1.18E+02 1.27E+02 1.07E+02 1.12E+02 Dose (krad(Si)) 50 100 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.16E+02 1.17E+02 1.13E+02 1.13E+02 1.18E+02 1.18E+02 1.11E+02 1.11E+02 1.30E+02 1.30E+02 1.14E+02 1.14E+02 1.18E+02 1.18E+02 1.27E+02 1.27E+02 1.07E+02 1.07E+02 1.12E+02 1.12E+02 1.14E+02 2.96E+00 1.22E+02 1.06E+02 1.14E+02 3.05E+00 1.22E+02 1.06E+02 1.14E+02 2.99E+00 1.22E+02 1.06E+02 1.20E+02 7.97E+00 1.42E+02 9.82E+01 9.00E+01 PASS 1.20E+02 7.93E+00 1.42E+02 9.83E+01 9.00E+01 PASS 1.20E+02 8.10E+00 1.42E+02 9.79E+01 9.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 189 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.90. Plot of Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 190 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.90. Raw data for Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.61E+02 1.15E+02 1.17E+02 1.19E+02 1.38E+02 1.18E+02 1.63E+02 1.19E+02 1.29E+02 1.09E+02 1.10E+02 1.16E+02 24-hr Anneal 225 1.82E+02 1.15E+02 1.17E+02 1.19E+02 1.35E+02 1.18E+02 1.52E+02 1.18E+02 1.29E+02 1.09E+02 1.10E+02 1.16E+02 168-hr Anneal 250 1.72E+02 1.14E+02 1.17E+02 1.20E+02 1.34E+02 1.18E+02 1.48E+02 1.18E+02 1.30E+02 1.09E+02 1.10E+02 1.16E+02 1.27E+02 1.44E+01 1.66E+02 8.74E+01 1.30E+02 1.96E+01 1.83E+02 7.62E+01 1.33E+02 2.80E+01 2.10E+02 5.66E+01 1.31E+02 2.38E+01 1.97E+02 6.59E+01 1.27E+02 2.01E+01 1.82E+02 7.20E+01 9.00E+01 PASS 1.27E+02 2.10E+01 1.85E+02 6.97E+01 9.00E+01 PASS 1.25E+02 1.67E+01 1.71E+02 7.94E+01 9.00E+01 PASS 1.25E+02 1.51E+01 1.66E+02 8.30E+01 9.00E+01 PASS 0 1.42E+02 1.14E+02 1.17E+02 1.20E+02 1.32E+02 1.17E+02 1.43E+02 1.19E+02 1.31E+02 1.09E+02 1.10E+02 1.16E+02 Total 20 1.42E+02 1.14E+02 1.17E+02 1.20E+02 1.33E+02 1.18E+02 1.43E+02 1.18E+02 1.31E+02 1.09E+02 1.10E+02 1.16E+02 Dose (krad(Si)) 50 100 1.48E+02 1.48E+02 1.15E+02 1.14E+02 1.17E+02 1.17E+02 1.20E+02 1.19E+02 1.34E+02 1.35E+02 1.17E+02 1.18E+02 1.41E+02 1.60E+02 1.18E+02 1.18E+02 1.30E+02 1.30E+02 1.09E+02 1.09E+02 1.10E+02 1.10E+02 1.16E+02 1.16E+02 1.25E+02 1.14E+01 1.56E+02 9.36E+01 1.25E+02 1.18E+01 1.58E+02 9.28E+01 1.27E+02 1.41E+01 1.65E+02 8.79E+01 1.24E+02 1.33E+01 1.60E+02 8.74E+01 9.00E+01 PASS 1.24E+02 1.36E+01 1.61E+02 8.65E+01 9.00E+01 PASS 1.23E+02 1.27E+01 1.58E+02 8.84E+01 9.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 191 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.91. Plot of Power Supply Rejection_Ratio1_3 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 192 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.91. Raw data for Power Supply Rejection_Ratio1_3 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection_Ratio1_3 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.12E+02 1.31E+02 1.24E+02 1.09E+02 1.40E+02 1.28E+02 1.13E+02 1.10E+02 1.16E+02 1.11E+02 1.12E+02 1.11E+02 24-hr Anneal 225 1.12E+02 1.29E+02 1.24E+02 1.09E+02 1.39E+02 1.27E+02 1.12E+02 1.10E+02 1.16E+02 1.11E+02 1.12E+02 1.11E+02 168-hr Anneal 250 1.12E+02 1.30E+02 1.24E+02 1.09E+02 1.39E+02 1.28E+02 1.12E+02 1.10E+02 1.16E+02 1.11E+02 1.12E+02 1.11E+02 1.23E+02 1.25E+01 1.57E+02 8.87E+01 1.23E+02 1.29E+01 1.59E+02 8.79E+01 1.23E+02 1.22E+01 1.56E+02 8.91E+01 1.23E+02 1.23E+01 1.57E+02 8.90E+01 1.16E+02 7.56E+00 1.36E+02 9.49E+01 9.00E+01 PASS 1.16E+02 7.34E+00 1.36E+02 9.54E+01 9.00E+01 PASS 1.15E+02 7.00E+00 1.35E+02 9.63E+01 9.00E+01 PASS 1.16E+02 7.32E+00 1.36E+02 9.54E+01 9.00E+01 PASS 0 1.12E+02 1.31E+02 1.24E+02 1.09E+02 1.37E+02 1.28E+02 1.12E+02 1.10E+02 1.16E+02 1.11E+02 1.12E+02 1.11E+02 Total 20 1.13E+02 1.30E+02 1.24E+02 1.09E+02 1.39E+02 1.28E+02 1.12E+02 1.10E+02 1.16E+02 1.11E+02 1.12E+02 1.11E+02 Dose (krad(Si)) 50 100 1.12E+02 1.12E+02 1.30E+02 1.31E+02 1.24E+02 1.24E+02 1.09E+02 1.09E+02 1.39E+02 1.39E+02 1.28E+02 1.29E+02 1.12E+02 1.12E+02 1.10E+02 1.10E+02 1.16E+02 1.16E+02 1.11E+02 1.11E+02 1.12E+02 1.12E+02 1.11E+02 1.11E+02 1.23E+02 1.20E+01 1.55E+02 8.98E+01 1.23E+02 1.24E+01 1.57E+02 8.88E+01 1.23E+02 1.23E+01 1.57E+02 8.89E+01 1.16E+02 7.56E+00 1.36E+02 9.48E+01 9.00E+01 PASS 1.15E+02 7.29E+00 1.35E+02 9.55E+01 9.00E+01 PASS 1.16E+02 7.52E+00 1.36E+02 9.50E+01 9.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 193 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.92. Plot of Power Supply Rejection Ratio1_4 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 194 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.92. Raw data for Power Supply Rejection Ratio1_4 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio1_4 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.33E+02 1.11E+02 1.19E+02 1.10E+02 1.19E+02 1.13E+02 1.16E+02 1.08E+02 1.10E+02 1.07E+02 1.03E+02 1.10E+02 24-hr Anneal 225 1.34E+02 1.11E+02 1.19E+02 1.10E+02 1.19E+02 1.13E+02 1.16E+02 1.08E+02 1.10E+02 1.07E+02 1.03E+02 1.10E+02 168-hr Anneal 250 1.38E+02 1.11E+02 1.18E+02 1.10E+02 1.20E+02 1.13E+02 1.16E+02 1.08E+02 1.10E+02 1.07E+02 1.03E+02 1.10E+02 1.19E+02 1.01E+01 1.46E+02 9.10E+01 1.19E+02 9.26E+00 1.44E+02 9.31E+01 1.19E+02 9.64E+00 1.45E+02 9.22E+01 1.19E+02 1.14E+01 1.51E+02 8.81E+01 1.11E+02 3.78E+00 1.21E+02 1.00E+02 9.00E+01 PASS 1.11E+02 3.84E+00 1.21E+02 1.00E+02 9.00E+01 PASS 1.11E+02 3.80E+00 1.21E+02 1.01E+02 9.00E+01 PASS 1.11E+02 3.79E+00 1.21E+02 1.00E+02 9.00E+01 PASS 0 1.43E+02 1.11E+02 1.18E+02 1.10E+02 1.20E+02 1.13E+02 1.16E+02 1.08E+02 1.10E+02 1.07E+02 1.03E+02 1.10E+02 Total 20 1.39E+02 1.11E+02 1.18E+02 1.10E+02 1.20E+02 1.13E+02 1.16E+02 1.08E+02 1.10E+02 1.07E+02 1.03E+02 1.10E+02 Dose (krad(Si)) 50 100 1.38E+02 1.35E+02 1.11E+02 1.11E+02 1.18E+02 1.18E+02 1.10E+02 1.10E+02 1.20E+02 1.19E+02 1.13E+02 1.13E+02 1.16E+02 1.16E+02 1.08E+02 1.08E+02 1.10E+02 1.10E+02 1.07E+02 1.07E+02 1.03E+02 1.03E+02 1.10E+02 1.10E+02 1.20E+02 1.32E+01 1.56E+02 8.39E+01 1.19E+02 1.18E+01 1.52E+02 8.71E+01 1.19E+02 1.11E+01 1.50E+02 8.87E+01 1.11E+02 3.73E+00 1.21E+02 1.01E+02 9.00E+01 PASS 1.11E+02 3.75E+00 1.21E+02 1.01E+02 9.00E+01 PASS 1.11E+02 3.79E+00 1.21E+02 1.00E+02 9.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 195 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.93. Plot of PSRR Match1 1 to 4 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 196 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.93. Raw data for PSRR Match1 1 to 4 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR Match1 1 to 4 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 1.11E+02 1.36E+02 1.29E+02 1.05E+02 1.31E+02 1.25E+02 1.14E+02 1.13E+02 1.07E+02 1.06E+02 1.11E+02 1.27E+02 Biased Statistics Average Biased 1.23E+02 Std Dev Biased 1.37E+01 Ps90%/90% (+KTL) Biased 1.60E+02 Ps90%/90% (-KTL) Biased 8.51E+01 Un-Biased Statistics Average Un-Biased 1.13E+02 Std Dev Un-Biased 7.52E+00 Ps90%/90% (+KTL) Un-Biased 1.34E+02 Ps90%/90% (-KTL) Un-Biased 9.25E+01 Specification MIN 8.30E+01 Status PASS 200 1.11E+02 1.41E+02 1.33E+02 1.05E+02 1.32E+02 1.29E+02 1.15E+02 1.14E+02 1.07E+02 1.06E+02 1.11E+02 1.27E+02 24-hr Anneal 225 1.11E+02 1.42E+02 1.32E+02 1.05E+02 1.32E+02 1.29E+02 1.15E+02 1.14E+02 1.07E+02 1.06E+02 1.11E+02 1.26E+02 168-hr Anneal 250 1.11E+02 1.38E+02 1.30E+02 1.06E+02 1.33E+02 1.26E+02 1.15E+02 1.13E+02 1.07E+02 1.06E+02 1.11E+02 1.26E+02 1.26E+02 1.78E+01 1.75E+02 7.74E+01 1.24E+02 1.55E+01 1.67E+02 8.19E+01 1.24E+02 1.57E+01 1.67E+02 8.15E+01 1.23E+02 1.42E+01 1.62E+02 8.45E+01 1.14E+02 8.32E+00 1.37E+02 9.09E+01 8.30E+01 PASS 1.14E+02 9.02E+00 1.39E+02 8.95E+01 8.30E+01 PASS 1.14E+02 8.97E+00 1.39E+02 8.95E+01 8.30E+01 PASS 1.13E+02 7.76E+00 1.35E+02 9.21E+01 8.30E+01 PASS Total 20 1.11E+02 1.35E+02 1.31E+02 1.06E+02 1.34E+02 1.25E+02 1.14E+02 1.13E+02 1.07E+02 1.06E+02 1.11E+02 1.26E+02 Dose (krad(Si)) 50 100 1.11E+02 1.11E+02 1.42E+02 1.48E+02 1.32E+02 1.32E+02 1.05E+02 1.05E+02 1.31E+02 1.33E+02 1.26E+02 1.27E+02 1.15E+02 1.15E+02 1.13E+02 1.13E+02 1.07E+02 1.07E+02 1.06E+02 1.06E+02 1.11E+02 1.11E+02 1.25E+02 1.26E+02 1.23E+02 1.39E+01 1.61E+02 8.51E+01 1.24E+02 1.53E+01 1.66E+02 8.22E+01 1.13E+02 7.70E+00 1.34E+02 9.21E+01 8.30E+01 PASS 1.13E+02 8.08E+00 1.36E+02 9.13E+01 8.30E+01 PASS An ISO 9001:2008 and DLA Certified Company 197 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.94. Plot of PSRR Match1 2 to 3 (dB) @ VS=+/-2V to +/-16V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 198 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.94. Raw data for PSRR Match1 2 to 3 (dB) @ VS=+/-2V to +/-16V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR Match1 2 to 3 (dB) @ VS=+/-2V to +/-16V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 1.12E+02 1.13E+02 1.23E+02 1.07E+02 1.28E+02 1.15E+02 1.12E+02 1.07E+02 1.15E+02 1.22E+02 1.24E+02 1.18E+02 Biased Statistics Average Biased 1.16E+02 Std Dev Biased 8.59E+00 Ps90%/90% (+KTL) Biased 1.40E+02 Ps90%/90% (-KTL) Biased 9.29E+01 Un-Biased Statistics Average Un-Biased 1.14E+02 Std Dev Un-Biased 5.30E+00 Ps90%/90% (+KTL) Un-Biased 1.29E+02 Ps90%/90% (-KTL) Un-Biased 9.97E+01 Specification MIN 8.30E+01 Status PASS 200 1.12E+02 1.13E+02 1.21E+02 1.07E+02 1.33E+02 1.15E+02 1.12E+02 1.07E+02 1.14E+02 1.21E+02 1.24E+02 1.18E+02 24-hr Anneal 225 1.12E+02 1.13E+02 1.22E+02 1.07E+02 1.30E+02 1.15E+02 1.13E+02 1.07E+02 1.14E+02 1.20E+02 1.24E+02 1.18E+02 168-hr Anneal 250 1.12E+02 1.13E+02 1.22E+02 1.07E+02 1.30E+02 1.15E+02 1.12E+02 1.07E+02 1.14E+02 1.21E+02 1.24E+02 1.18E+02 1.17E+02 9.60E+00 1.43E+02 9.08E+01 1.17E+02 1.01E+01 1.45E+02 8.96E+01 1.17E+02 9.31E+00 1.42E+02 9.14E+01 1.17E+02 9.13E+00 1.42E+02 9.18E+01 1.14E+02 4.93E+00 1.28E+02 1.01E+02 8.30E+01 PASS 1.14E+02 4.83E+00 1.27E+02 1.01E+02 8.30E+01 PASS 1.14E+02 4.73E+00 1.27E+02 1.01E+02 8.30E+01 PASS 1.14E+02 5.13E+00 1.28E+02 1.00E+02 8.30E+01 PASS Total 20 1.12E+02 1.13E+02 1.23E+02 1.07E+02 1.29E+02 1.15E+02 1.12E+02 1.07E+02 1.15E+02 1.22E+02 1.24E+02 1.18E+02 Dose (krad(Si)) 50 100 1.12E+02 1.12E+02 1.13E+02 1.13E+02 1.22E+02 1.22E+02 1.07E+02 1.07E+02 1.30E+02 1.31E+02 1.15E+02 1.16E+02 1.12E+02 1.12E+02 1.07E+02 1.07E+02 1.14E+02 1.14E+02 1.22E+02 1.21E+02 1.24E+02 1.24E+02 1.18E+02 1.18E+02 1.17E+02 9.03E+00 1.42E+02 9.20E+01 1.17E+02 9.18E+00 1.42E+02 9.16E+01 1.14E+02 5.35E+00 1.29E+02 9.95E+01 8.30E+01 PASS 1.14E+02 5.42E+00 1.29E+02 9.93E+01 8.30E+01 PASS An ISO 9001:2008 and DLA Certified Company 199 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.95. Plot of +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 200 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.95. Raw data for +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -3.35E-02 -3.23E-02 -3.35E-02 -3.31E-02 -3.18E-02 -3.34E-02 -3.19E-02 -3.39E-02 -3.62E-02 -3.19E-02 -3.91E-02 -3.77E-02 24-hr Anneal 225 -3.42E-02 -3.30E-02 -3.44E-02 -3.37E-02 -3.25E-02 -3.36E-02 -3.22E-02 -3.42E-02 -3.64E-02 -3.21E-02 -3.91E-02 -3.77E-02 168-hr Anneal 250 -3.60E-02 -3.48E-02 -3.60E-02 -3.55E-02 -3.42E-02 -3.54E-02 -3.39E-02 -3.58E-02 -3.79E-02 -3.38E-02 -3.88E-02 -3.75E-02 -3.42E-02 7.84E-04 -3.21E-02 -3.64E-02 -3.28E-02 7.58E-04 -3.07E-02 -3.49E-02 -3.36E-02 7.80E-04 -3.14E-02 -3.57E-02 -3.53E-02 8.08E-04 -3.31E-02 -3.75E-02 -3.49E-02 1.78E-03 -3.00E-02 -3.98E-02 -1.00E-02 PASS -3.34E-02 1.78E-03 -2.86E-02 -3.83E-02 -1.00E-02 PASS -3.37E-02 1.76E-03 -2.89E-02 -3.86E-02 -1.00E-02 PASS -3.54E-02 1.67E-03 -3.08E-02 -3.99E-02 -1.00E-02 PASS 0 -3.85E-02 -3.71E-02 -3.83E-02 -3.78E-02 -3.65E-02 -3.77E-02 -3.59E-02 -3.80E-02 -4.01E-02 -3.57E-02 -3.90E-02 -3.77E-02 Total 20 -3.71E-02 -3.56E-02 -3.68E-02 -3.62E-02 -3.50E-02 -3.69E-02 -3.51E-02 -3.72E-02 -3.93E-02 -3.51E-02 -3.91E-02 -3.77E-02 Dose (krad(Si)) 50 100 -3.59E-02 -3.48E-02 -3.45E-02 -3.38E-02 -3.58E-02 -3.49E-02 -3.54E-02 -3.44E-02 -3.41E-02 -3.31E-02 -3.61E-02 -3.50E-02 -3.43E-02 -3.33E-02 -3.63E-02 -3.54E-02 -3.85E-02 -3.76E-02 -3.43E-02 -3.33E-02 -3.90E-02 -3.91E-02 -3.77E-02 -3.77E-02 -3.77E-02 8.38E-04 -3.54E-02 -4.00E-02 -3.62E-02 8.44E-04 -3.38E-02 -3.85E-02 -3.51E-02 8.06E-04 -3.29E-02 -3.73E-02 -3.75E-02 1.78E-03 -3.26E-02 -4.24E-02 -1.50E-02 PASS -3.67E-02 1.72E-03 -3.20E-02 -4.14E-02 -1.00E-02 PASS -3.59E-02 1.72E-03 -3.12E-02 -4.06E-02 -1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 201 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.96. Plot of +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 202 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.96. Raw data for +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -3.30E-02 -3.28E-02 -3.18E-02 -3.24E-02 -3.08E-02 -3.18E-02 -3.08E-02 -3.40E-02 -3.19E-02 -3.08E-02 -3.70E-02 -3.89E-02 24-hr Anneal 225 -3.38E-02 -3.36E-02 -3.26E-02 -3.31E-02 -3.16E-02 -3.21E-02 -3.11E-02 -3.43E-02 -3.22E-02 -3.11E-02 -3.69E-02 -3.89E-02 168-hr Anneal 250 -3.56E-02 -3.53E-02 -3.43E-02 -3.48E-02 -3.33E-02 -3.39E-02 -3.27E-02 -3.61E-02 -3.39E-02 -3.28E-02 -3.67E-02 -3.87E-02 -3.36E-02 9.47E-04 -3.10E-02 -3.62E-02 -3.22E-02 9.15E-04 -2.97E-02 -3.47E-02 -3.29E-02 8.95E-04 -3.05E-02 -3.54E-02 -3.47E-02 9.15E-04 -3.21E-02 -3.72E-02 -3.34E-02 1.33E-03 -2.97E-02 -3.70E-02 -1.00E-02 PASS -3.19E-02 1.31E-03 -2.83E-02 -3.55E-02 -1.00E-02 PASS -3.22E-02 1.31E-03 -2.86E-02 -3.58E-02 -1.00E-02 PASS -3.39E-02 1.35E-03 -3.02E-02 -3.76E-02 -1.00E-02 PASS 0 -3.82E-02 -3.76E-02 -3.65E-02 -3.70E-02 -3.57E-02 -3.61E-02 -3.48E-02 -3.83E-02 -3.60E-02 -3.47E-02 -3.69E-02 -3.89E-02 Total 20 -3.67E-02 -3.61E-02 -3.51E-02 -3.55E-02 -3.42E-02 -3.53E-02 -3.40E-02 -3.74E-02 -3.52E-02 -3.41E-02 -3.69E-02 -3.89E-02 Dose (krad(Si)) 50 100 -3.55E-02 -3.44E-02 -3.50E-02 -3.43E-02 -3.41E-02 -3.32E-02 -3.46E-02 -3.37E-02 -3.32E-02 -3.21E-02 -3.44E-02 -3.33E-02 -3.32E-02 -3.22E-02 -3.66E-02 -3.55E-02 -3.44E-02 -3.35E-02 -3.33E-02 -3.23E-02 -3.69E-02 -3.70E-02 -3.89E-02 -3.89E-02 -3.70E-02 9.42E-04 -3.44E-02 -3.96E-02 -3.55E-02 9.61E-04 -3.29E-02 -3.81E-02 -3.45E-02 8.97E-04 -3.20E-02 -3.70E-02 -3.60E-02 1.47E-03 -3.20E-02 -4.00E-02 -1.50E-02 PASS -3.52E-02 1.38E-03 -3.14E-02 -3.90E-02 -1.00E-02 PASS -3.44E-02 1.36E-03 -3.06E-02 -3.81E-02 -1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 203 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.97. Plot of +Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 204 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.97. Raw data for +Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -3.39E-02 -3.41E-02 -3.16E-02 -3.30E-02 -3.09E-02 -3.23E-02 -3.16E-02 -3.56E-02 -3.28E-02 -3.07E-02 -3.78E-02 -3.88E-02 24-hr Anneal 225 -3.47E-02 -3.49E-02 -3.24E-02 -3.36E-02 -3.17E-02 -3.25E-02 -3.19E-02 -3.60E-02 -3.31E-02 -3.10E-02 -3.78E-02 -3.88E-02 168-hr Anneal 250 -3.67E-02 -3.67E-02 -3.41E-02 -3.54E-02 -3.34E-02 -3.44E-02 -3.36E-02 -3.78E-02 -3.48E-02 -3.27E-02 -3.76E-02 -3.86E-02 -3.41E-02 1.48E-03 -3.01E-02 -3.82E-02 -3.27E-02 1.42E-03 -2.88E-02 -3.66E-02 -3.35E-02 1.40E-03 -2.96E-02 -3.73E-02 -3.52E-02 1.47E-03 -3.12E-02 -3.93E-02 -3.41E-02 1.91E-03 -2.89E-02 -3.94E-02 -1.00E-02 PASS -3.26E-02 1.87E-03 -2.75E-02 -3.77E-02 -1.00E-02 PASS -3.29E-02 1.89E-03 -2.77E-02 -3.81E-02 -1.00E-02 PASS -3.46E-02 1.94E-03 -2.93E-02 -4.00E-02 -1.00E-02 PASS 0 -3.93E-02 -3.90E-02 -3.63E-02 -3.77E-02 -3.59E-02 -3.66E-02 -3.57E-02 -4.02E-02 -3.69E-02 -3.46E-02 -3.77E-02 -3.88E-02 Total 20 -3.77E-02 -3.75E-02 -3.49E-02 -3.61E-02 -3.44E-02 -3.58E-02 -3.49E-02 -3.92E-02 -3.61E-02 -3.40E-02 -3.78E-02 -3.88E-02 Dose (krad(Si)) 50 100 -3.65E-02 -3.54E-02 -3.64E-02 -3.56E-02 -3.39E-02 -3.30E-02 -3.53E-02 -3.43E-02 -3.33E-02 -3.23E-02 -3.49E-02 -3.38E-02 -3.41E-02 -3.31E-02 -3.83E-02 -3.72E-02 -3.53E-02 -3.44E-02 -3.32E-02 -3.22E-02 -3.77E-02 -3.78E-02 -3.88E-02 -3.88E-02 -3.76E-02 1.52E-03 -3.35E-02 -4.18E-02 -3.61E-02 1.51E-03 -3.20E-02 -4.03E-02 -3.51E-02 1.44E-03 -3.11E-02 -3.90E-02 -3.68E-02 2.08E-03 -3.11E-02 -4.25E-02 -1.50E-02 PASS -3.60E-02 1.99E-03 -3.06E-02 -4.15E-02 -1.00E-02 PASS -3.51E-02 1.95E-03 -2.98E-02 -4.05E-02 -1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 205 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.98. Plot of +Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 206 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.98. Raw data for +Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -3.43E-02 -3.36E-02 -3.45E-02 -3.41E-02 -3.34E-02 -3.32E-02 -3.34E-02 -3.52E-02 -3.72E-02 -3.25E-02 -4.00E-02 -3.86E-02 24-hr Anneal 225 -3.51E-02 -3.43E-02 -3.54E-02 -3.48E-02 -3.42E-02 -3.35E-02 -3.38E-02 -3.55E-02 -3.74E-02 -3.28E-02 -4.00E-02 -3.85E-02 168-hr Anneal 250 -3.70E-02 -3.62E-02 -3.72E-02 -3.67E-02 -3.59E-02 -3.53E-02 -3.55E-02 -3.71E-02 -3.89E-02 -3.45E-02 -3.97E-02 -3.83E-02 -3.54E-02 5.08E-04 -3.40E-02 -3.68E-02 -3.40E-02 4.95E-04 -3.26E-02 -3.53E-02 -3.48E-02 5.21E-04 -3.33E-02 -3.62E-02 -3.66E-02 5.33E-04 -3.51E-02 -3.80E-02 -3.58E-02 1.86E-03 -3.07E-02 -4.09E-02 -1.00E-02 PASS -3.43E-02 1.88E-03 -2.91E-02 -3.94E-02 -1.00E-02 PASS -3.46E-02 1.88E-03 -2.94E-02 -3.97E-02 -1.00E-02 PASS -3.63E-02 1.76E-03 -3.15E-02 -4.11E-02 -1.00E-02 PASS 0 -3.96E-02 -3.86E-02 -3.96E-02 -3.91E-02 -3.83E-02 -3.75E-02 -3.77E-02 -3.94E-02 -4.11E-02 -3.66E-02 -3.99E-02 -3.85E-02 Total 20 -3.80E-02 -3.71E-02 -3.80E-02 -3.75E-02 -3.68E-02 -3.67E-02 -3.68E-02 -3.85E-02 -4.03E-02 -3.58E-02 -4.00E-02 -3.85E-02 Dose (krad(Si)) 50 100 -3.68E-02 -3.57E-02 -3.59E-02 -3.51E-02 -3.69E-02 -3.60E-02 -3.65E-02 -3.55E-02 -3.58E-02 -3.48E-02 -3.59E-02 -3.48E-02 -3.60E-02 -3.50E-02 -3.77E-02 -3.67E-02 -3.95E-02 -3.87E-02 -3.50E-02 -3.40E-02 -3.99E-02 -4.00E-02 -3.86E-02 -3.86E-02 -3.91E-02 5.78E-04 -3.75E-02 -4.07E-02 -3.75E-02 5.59E-04 -3.59E-02 -3.90E-02 -3.64E-02 5.31E-04 -3.50E-02 -3.79E-02 -3.85E-02 1.81E-03 -3.35E-02 -4.34E-02 -1.50E-02 PASS -3.76E-02 1.78E-03 -3.28E-02 -4.25E-02 -1.00E-02 PASS -3.68E-02 1.79E-03 -3.19E-02 -4.17E-02 -1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 207 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.99. Plot of -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 208 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.99. Raw data for -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 5.60E-02 5.59E-02 5.59E-02 5.54E-02 5.57E-02 5.69E-02 5.58E-02 5.56E-02 5.64E-02 5.53E-02 5.68E-02 5.72E-02 24-hr Anneal 225 5.64E-02 5.60E-02 5.61E-02 5.57E-02 5.59E-02 5.72E-02 5.60E-02 5.58E-02 5.66E-02 5.56E-02 5.69E-02 5.73E-02 168-hr Anneal 250 5.69E-02 5.68E-02 5.68E-02 5.62E-02 5.65E-02 5.79E-02 5.67E-02 5.64E-02 5.72E-02 5.62E-02 5.72E-02 5.75E-02 5.59E-02 2.59E-04 5.66E-02 5.52E-02 5.58E-02 2.52E-04 5.65E-02 5.51E-02 5.60E-02 2.61E-04 5.67E-02 5.53E-02 5.66E-02 2.68E-04 5.74E-02 5.59E-02 5.63E-02 6.45E-04 5.81E-02 5.46E-02 1.00E-02 PASS 5.60E-02 6.46E-04 5.78E-02 5.43E-02 1.00E-02 PASS 5.62E-02 6.82E-04 5.81E-02 5.44E-02 1.00E-02 PASS 5.69E-02 6.60E-04 5.87E-02 5.51E-02 1.00E-02 PASS 0 5.72E-02 5.71E-02 5.70E-02 5.65E-02 5.67E-02 5.80E-02 5.69E-02 5.65E-02 5.72E-02 5.65E-02 5.70E-02 5.73E-02 Total 20 5.68E-02 5.66E-02 5.67E-02 5.63E-02 5.65E-02 5.78E-02 5.67E-02 5.63E-02 5.71E-02 5.61E-02 5.68E-02 5.72E-02 Dose (krad(Si)) 50 100 5.66E-02 5.63E-02 5.65E-02 5.58E-02 5.65E-02 5.60E-02 5.59E-02 5.56E-02 5.62E-02 5.59E-02 5.76E-02 5.73E-02 5.65E-02 5.62E-02 5.61E-02 5.59E-02 5.69E-02 5.66E-02 5.60E-02 5.57E-02 5.69E-02 5.68E-02 5.72E-02 5.72E-02 5.69E-02 3.08E-04 5.77E-02 5.61E-02 5.66E-02 2.02E-04 5.71E-02 5.60E-02 5.63E-02 3.06E-04 5.72E-02 5.55E-02 5.70E-02 6.25E-04 5.87E-02 5.53E-02 1.50E-02 PASS 5.68E-02 6.81E-04 5.87E-02 5.49E-02 1.00E-02 PASS 5.66E-02 6.56E-04 5.84E-02 5.48E-02 1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 209 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.100. Plot of -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 210 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.100. Raw data for -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 5.42E-02 5.41E-02 5.41E-02 5.46E-02 5.42E-02 5.38E-02 5.37E-02 5.39E-02 5.40E-02 5.43E-02 5.48E-02 5.62E-02 24-hr Anneal 225 5.46E-02 5.42E-02 5.42E-02 5.49E-02 5.44E-02 5.41E-02 5.39E-02 5.41E-02 5.42E-02 5.46E-02 5.49E-02 5.63E-02 168-hr Anneal 250 5.51E-02 5.49E-02 5.49E-02 5.55E-02 5.51E-02 5.47E-02 5.46E-02 5.47E-02 5.49E-02 5.53E-02 5.52E-02 5.65E-02 5.44E-02 3.49E-04 5.53E-02 5.34E-02 5.42E-02 2.42E-04 5.49E-02 5.36E-02 5.45E-02 3.02E-04 5.53E-02 5.36E-02 5.51E-02 2.25E-04 5.57E-02 5.45E-02 5.43E-02 2.60E-04 5.50E-02 5.36E-02 1.00E-02 PASS 5.40E-02 2.19E-04 5.46E-02 5.34E-02 1.00E-02 PASS 5.42E-02 2.48E-04 5.48E-02 5.35E-02 1.00E-02 PASS 5.48E-02 2.59E-04 5.56E-02 5.41E-02 1.00E-02 PASS 0 5.54E-02 5.52E-02 5.52E-02 5.57E-02 5.53E-02 5.48E-02 5.48E-02 5.48E-02 5.51E-02 5.56E-02 5.49E-02 5.63E-02 Total 20 5.50E-02 5.48E-02 5.48E-02 5.55E-02 5.50E-02 5.46E-02 5.46E-02 5.46E-02 5.49E-02 5.51E-02 5.48E-02 5.62E-02 Dose (krad(Si)) 50 100 5.49E-02 5.45E-02 5.46E-02 5.40E-02 5.46E-02 5.42E-02 5.51E-02 5.49E-02 5.47E-02 5.44E-02 5.44E-02 5.41E-02 5.44E-02 5.40E-02 5.44E-02 5.41E-02 5.47E-02 5.43E-02 5.50E-02 5.47E-02 5.49E-02 5.48E-02 5.63E-02 5.62E-02 5.53E-02 2.03E-04 5.59E-02 5.48E-02 5.50E-02 2.77E-04 5.58E-02 5.43E-02 5.48E-02 2.10E-04 5.54E-02 5.42E-02 5.50E-02 3.35E-04 5.59E-02 5.41E-02 1.50E-02 PASS 5.48E-02 2.29E-04 5.54E-02 5.41E-02 1.00E-02 PASS 5.46E-02 2.67E-04 5.53E-02 5.38E-02 1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 211 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.101. Plot of -Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 212 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.101. Raw data for -Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 5.43E-02 5.44E-02 5.42E-02 5.48E-02 5.43E-02 5.41E-02 5.41E-02 5.40E-02 5.43E-02 5.46E-02 5.52E-02 5.66E-02 24-hr Anneal 225 5.47E-02 5.46E-02 5.43E-02 5.51E-02 5.46E-02 5.44E-02 5.43E-02 5.41E-02 5.45E-02 5.48E-02 5.52E-02 5.66E-02 168-hr Anneal 250 5.53E-02 5.53E-02 5.50E-02 5.57E-02 5.52E-02 5.51E-02 5.49E-02 5.48E-02 5.52E-02 5.55E-02 5.55E-02 5.69E-02 5.46E-02 2.94E-04 5.54E-02 5.38E-02 5.44E-02 2.47E-04 5.51E-02 5.37E-02 5.47E-02 2.79E-04 5.54E-02 5.39E-02 5.53E-02 2.31E-04 5.59E-02 5.47E-02 5.45E-02 2.60E-04 5.53E-02 5.38E-02 1.00E-02 PASS 5.42E-02 2.36E-04 5.49E-02 5.36E-02 1.00E-02 PASS 5.44E-02 2.53E-04 5.51E-02 5.37E-02 1.00E-02 PASS 5.51E-02 2.53E-04 5.58E-02 5.44E-02 1.00E-02 PASS 0 5.54E-02 5.54E-02 5.52E-02 5.58E-02 5.55E-02 5.52E-02 5.51E-02 5.50E-02 5.53E-02 5.57E-02 5.53E-02 5.66E-02 Total 20 5.52E-02 5.52E-02 5.49E-02 5.57E-02 5.53E-02 5.50E-02 5.50E-02 5.47E-02 5.51E-02 5.54E-02 5.52E-02 5.66E-02 Dose (krad(Si)) 50 100 5.50E-02 5.46E-02 5.50E-02 5.44E-02 5.47E-02 5.43E-02 5.53E-02 5.50E-02 5.49E-02 5.46E-02 5.48E-02 5.45E-02 5.48E-02 5.44E-02 5.46E-02 5.43E-02 5.50E-02 5.46E-02 5.52E-02 5.50E-02 5.53E-02 5.51E-02 5.66E-02 5.65E-02 5.55E-02 2.18E-04 5.61E-02 5.49E-02 5.53E-02 2.64E-04 5.60E-02 5.45E-02 5.50E-02 2.15E-04 5.56E-02 5.44E-02 5.53E-02 2.73E-04 5.60E-02 5.45E-02 1.50E-02 PASS 5.50E-02 2.58E-04 5.58E-02 5.43E-02 1.00E-02 PASS 5.49E-02 2.37E-04 5.55E-02 5.42E-02 1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 213 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.102. Plot of -Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 214 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.102. Raw data for -Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 5.39E-02 5.38E-02 5.35E-02 5.28E-02 5.34E-02 5.43E-02 5.39E-02 5.34E-02 5.40E-02 5.30E-02 5.45E-02 5.48E-02 24-hr Anneal 225 5.43E-02 5.39E-02 5.37E-02 5.31E-02 5.36E-02 5.46E-02 5.41E-02 5.35E-02 5.42E-02 5.33E-02 5.45E-02 5.49E-02 168-hr Anneal 250 5.47E-02 5.47E-02 5.43E-02 5.36E-02 5.42E-02 5.52E-02 5.48E-02 5.42E-02 5.48E-02 5.39E-02 5.48E-02 5.51E-02 5.36E-02 3.93E-04 5.47E-02 5.25E-02 5.35E-02 4.25E-04 5.47E-02 5.23E-02 5.37E-02 4.55E-04 5.50E-02 5.25E-02 5.43E-02 4.50E-04 5.56E-02 5.31E-02 5.40E-02 4.88E-04 5.53E-02 5.27E-02 1.00E-02 PASS 5.37E-02 5.11E-04 5.51E-02 5.23E-02 1.00E-02 PASS 5.39E-02 5.22E-04 5.54E-02 5.25E-02 1.00E-02 PASS 5.46E-02 5.21E-04 5.60E-02 5.31E-02 1.00E-02 PASS 0 5.51E-02 5.50E-02 5.46E-02 5.39E-02 5.44E-02 5.53E-02 5.50E-02 5.42E-02 5.48E-02 5.42E-02 5.46E-02 5.48E-02 Total 20 5.47E-02 5.46E-02 5.43E-02 5.37E-02 5.42E-02 5.51E-02 5.48E-02 5.40E-02 5.47E-02 5.38E-02 5.45E-02 5.48E-02 Dose (krad(Si)) 50 100 5.45E-02 5.41E-02 5.44E-02 5.37E-02 5.41E-02 5.36E-02 5.33E-02 5.30E-02 5.38E-02 5.36E-02 5.49E-02 5.46E-02 5.46E-02 5.42E-02 5.38E-02 5.36E-02 5.45E-02 5.42E-02 5.36E-02 5.34E-02 5.46E-02 5.45E-02 5.48E-02 5.48E-02 5.46E-02 4.83E-04 5.59E-02 5.33E-02 5.43E-02 3.96E-04 5.54E-02 5.32E-02 5.40E-02 4.92E-04 5.54E-02 5.27E-02 5.47E-02 4.90E-04 5.60E-02 5.34E-02 1.50E-02 PASS 5.45E-02 5.62E-04 5.60E-02 5.30E-02 1.00E-02 PASS 5.43E-02 5.40E-04 5.58E-02 5.28E-02 1.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 215 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.103. Plot of Gain-Bandwidth Product_1 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 216 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.103. Raw data for Gain-Bandwidth Product_1 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Gain-Bandwidth Product_1 15V (MHz) @ VS=+/-15V, f=100kHz Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.45E+01 1.43E+01 1.45E+01 1.43E+01 1.43E+01 1.49E+01 1.44E+01 1.38E+01 1.44E+01 1.42E+01 1.49E+01 1.48E+01 24-hr Anneal 225 1.46E+01 1.43E+01 1.46E+01 1.43E+01 1.44E+01 1.49E+01 1.45E+01 1.38E+01 1.45E+01 1.42E+01 1.49E+01 1.48E+01 168-hr Anneal 250 1.48E+01 1.45E+01 1.48E+01 1.46E+01 1.46E+01 1.51E+01 1.47E+01 1.40E+01 1.45E+01 1.44E+01 1.48E+01 1.48E+01 1.45E+01 1.27E-01 1.49E+01 1.42E+01 1.44E+01 1.26E-01 1.47E+01 1.40E+01 1.44E+01 1.48E-01 1.48E+01 1.40E+01 1.47E+01 1.26E-01 1.50E+01 1.43E+01 1.45E+01 4.19E-01 1.56E+01 1.33E+01 4.50E+00 PASS 1.43E+01 4.17E-01 1.55E+01 1.32E+01 4.50E+00 PASS 1.44E+01 4.06E-01 1.55E+01 1.33E+01 4.50E+00 PASS 1.45E+01 4.12E-01 1.57E+01 1.34E+01 4.50E+00 PASS 0 1.51E+01 1.49E+01 1.51E+01 1.49E+01 1.49E+01 1.53E+01 1.49E+01 1.42E+01 1.47E+01 1.46E+01 1.49E+01 1.48E+01 Total 20 1.50E+01 1.47E+01 1.49E+01 1.47E+01 1.47E+01 1.53E+01 1.48E+01 1.41E+01 1.47E+01 1.45E+01 1.48E+01 1.48E+01 Dose (krad(Si)) 50 100 1.48E+01 1.47E+01 1.46E+01 1.44E+01 1.48E+01 1.47E+01 1.46E+01 1.44E+01 1.46E+01 1.45E+01 1.52E+01 1.51E+01 1.47E+01 1.46E+01 1.40E+01 1.39E+01 1.46E+01 1.45E+01 1.44E+01 1.43E+01 1.49E+01 1.49E+01 1.48E+01 1.48E+01 1.50E+01 1.18E-01 1.53E+01 1.46E+01 1.48E+01 1.21E-01 1.51E+01 1.45E+01 1.47E+01 1.27E-01 1.50E+01 1.43E+01 1.47E+01 4.21E-01 1.59E+01 1.36E+01 6.80E+00 PASS 1.47E+01 4.30E-01 1.58E+01 1.35E+01 4.50E+00 PASS 1.46E+01 4.29E-01 1.58E+01 1.34E+01 4.50E+00 PASS An ISO 9001:2008 and DLA Certified Company 217 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.104. Plot of Gain-Bandwidth Product_2 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 218 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.104. Raw data for Gain-Bandwidth Product_2 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Gain-Bandwidth Product_2 15V (MHz) @ VS=+/-15V, f=100kHz Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.43E+01 1.42E+01 1.41E+01 1.39E+01 1.38E+01 1.41E+01 1.40E+01 1.41E+01 1.40E+01 1.41E+01 1.44E+01 1.47E+01 24-hr Anneal 225 1.44E+01 1.43E+01 1.42E+01 1.39E+01 1.39E+01 1.42E+01 1.41E+01 1.42E+01 1.41E+01 1.41E+01 1.44E+01 1.48E+01 168-hr Anneal 250 1.46E+01 1.45E+01 1.44E+01 1.41E+01 1.41E+01 1.43E+01 1.42E+01 1.43E+01 1.42E+01 1.43E+01 1.44E+01 1.48E+01 1.42E+01 2.12E-01 1.48E+01 1.36E+01 1.41E+01 2.05E-01 1.46E+01 1.35E+01 1.41E+01 2.18E-01 1.47E+01 1.35E+01 1.44E+01 2.30E-01 1.50E+01 1.37E+01 1.42E+01 3.83E-02 1.43E+01 1.41E+01 4.50E+00 PASS 1.41E+01 5.59E-02 1.42E+01 1.39E+01 4.50E+00 PASS 1.41E+01 4.30E-02 1.42E+01 1.40E+01 4.50E+00 PASS 1.43E+01 4.77E-02 1.44E+01 1.42E+01 4.50E+00 PASS 0 1.50E+01 1.48E+01 1.48E+01 1.44E+01 1.45E+01 1.46E+01 1.45E+01 1.46E+01 1.45E+01 1.45E+01 1.44E+01 1.47E+01 Total 20 1.48E+01 1.47E+01 1.46E+01 1.43E+01 1.43E+01 1.45E+01 1.44E+01 1.45E+01 1.44E+01 1.44E+01 1.44E+01 1.47E+01 Dose (krad(Si)) 50 100 1.47E+01 1.45E+01 1.45E+01 1.44E+01 1.44E+01 1.43E+01 1.42E+01 1.40E+01 1.41E+01 1.40E+01 1.44E+01 1.43E+01 1.43E+01 1.42E+01 1.44E+01 1.43E+01 1.43E+01 1.42E+01 1.44E+01 1.42E+01 1.44E+01 1.44E+01 1.47E+01 1.47E+01 1.47E+01 2.36E-01 1.53E+01 1.40E+01 1.45E+01 2.32E-01 1.52E+01 1.39E+01 1.44E+01 2.32E-01 1.50E+01 1.37E+01 1.45E+01 4.32E-02 1.46E+01 1.44E+01 6.80E+00 PASS 1.44E+01 4.09E-02 1.45E+01 1.43E+01 4.50E+00 PASS 1.44E+01 4.12E-02 1.45E+01 1.42E+01 4.50E+00 PASS An ISO 9001:2008 and DLA Certified Company 219 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.105. Plot of Gain-Bandwidth Product_3 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 220 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.105. Raw data for Gain-Bandwidth Product_3 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Gain-Bandwidth Product_3 15V (MHz) @ VS=+/-15V, f=100kHz Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.42E+01 1.44E+01 1.41E+01 1.38E+01 1.38E+01 1.42E+01 1.40E+01 1.40E+01 1.41E+01 1.40E+01 1.44E+01 1.47E+01 24-hr Anneal 225 1.43E+01 1.44E+01 1.41E+01 1.39E+01 1.38E+01 1.43E+01 1.41E+01 1.41E+01 1.42E+01 1.41E+01 1.44E+01 1.47E+01 168-hr Anneal 250 1.45E+01 1.46E+01 1.44E+01 1.41E+01 1.41E+01 1.45E+01 1.43E+01 1.43E+01 1.43E+01 1.42E+01 1.44E+01 1.48E+01 1.42E+01 2.40E-01 1.49E+01 1.36E+01 1.40E+01 2.56E-01 1.47E+01 1.33E+01 1.41E+01 2.45E-01 1.48E+01 1.34E+01 1.43E+01 2.45E-01 1.50E+01 1.37E+01 1.43E+01 8.53E-02 1.45E+01 1.40E+01 4.50E+00 PASS 1.41E+01 8.44E-02 1.43E+01 1.39E+01 4.50E+00 PASS 1.41E+01 8.62E-02 1.44E+01 1.39E+01 4.50E+00 PASS 1.43E+01 9.12E-02 1.46E+01 1.41E+01 4.50E+00 PASS 0 1.49E+01 1.50E+01 1.47E+01 1.44E+01 1.44E+01 1.47E+01 1.45E+01 1.45E+01 1.46E+01 1.45E+01 1.44E+01 1.47E+01 Total 20 1.47E+01 1.48E+01 1.45E+01 1.42E+01 1.43E+01 1.46E+01 1.44E+01 1.44E+01 1.45E+01 1.44E+01 1.44E+01 1.48E+01 Dose (krad(Si)) 50 100 1.46E+01 1.44E+01 1.47E+01 1.45E+01 1.44E+01 1.42E+01 1.41E+01 1.40E+01 1.41E+01 1.40E+01 1.45E+01 1.44E+01 1.43E+01 1.42E+01 1.43E+01 1.42E+01 1.44E+01 1.43E+01 1.43E+01 1.42E+01 1.44E+01 1.44E+01 1.47E+01 1.48E+01 1.47E+01 2.64E-01 1.54E+01 1.39E+01 1.45E+01 2.54E-01 1.52E+01 1.38E+01 1.44E+01 2.64E-01 1.51E+01 1.36E+01 1.45E+01 9.26E-02 1.48E+01 1.43E+01 6.80E+00 PASS 1.44E+01 9.44E-02 1.47E+01 1.42E+01 4.50E+00 PASS 1.44E+01 8.29E-02 1.46E+01 1.41E+01 4.50E+00 PASS An ISO 9001:2008 and DLA Certified Company 221 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.106. Plot of Gain-Bandwidth Product_4 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 222 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.106. Raw data for Gain-Bandwidth Product_4 15V (MHz) @ VS=+/-15V, f=100kHz versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Gain-Bandwidth Product_4 15V (MHz) @ VS=+/-15V, f=100kHz Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.45E+01 1.42E+01 1.45E+01 1.42E+01 1.43E+01 1.46E+01 1.46E+01 1.39E+01 1.43E+01 1.41E+01 1.47E+01 1.48E+01 24-hr Anneal 225 1.46E+01 1.43E+01 1.46E+01 1.42E+01 1.43E+01 1.47E+01 1.47E+01 1.39E+01 1.44E+01 1.42E+01 1.48E+01 1.48E+01 168-hr Anneal 250 1.48E+01 1.46E+01 1.48E+01 1.45E+01 1.45E+01 1.48E+01 1.49E+01 1.40E+01 1.45E+01 1.43E+01 1.47E+01 1.48E+01 1.45E+01 1.86E-01 1.50E+01 1.40E+01 1.43E+01 1.83E-01 1.48E+01 1.38E+01 1.44E+01 1.84E-01 1.49E+01 1.39E+01 1.46E+01 1.67E-01 1.51E+01 1.42E+01 1.45E+01 3.43E-01 1.54E+01 1.35E+01 4.50E+00 PASS 1.43E+01 3.28E-01 1.52E+01 1.34E+01 4.50E+00 PASS 1.44E+01 3.38E-01 1.53E+01 1.34E+01 4.50E+00 PASS 1.45E+01 3.39E-01 1.54E+01 1.36E+01 4.50E+00 PASS 0 1.52E+01 1.49E+01 1.51E+01 1.48E+01 1.49E+01 1.50E+01 1.51E+01 1.43E+01 1.47E+01 1.46E+01 1.48E+01 1.48E+01 Total 20 1.50E+01 1.47E+01 1.49E+01 1.46E+01 1.47E+01 1.50E+01 1.50E+01 1.42E+01 1.46E+01 1.45E+01 1.47E+01 1.48E+01 Dose (krad(Si)) 50 100 1.49E+01 1.47E+01 1.45E+01 1.44E+01 1.49E+01 1.47E+01 1.45E+01 1.43E+01 1.46E+01 1.44E+01 1.49E+01 1.48E+01 1.49E+01 1.48E+01 1.41E+01 1.40E+01 1.45E+01 1.45E+01 1.44E+01 1.43E+01 1.47E+01 1.48E+01 1.48E+01 1.48E+01 1.50E+01 1.66E-01 1.54E+01 1.45E+01 1.48E+01 1.64E-01 1.52E+01 1.44E+01 1.47E+01 1.87E-01 1.52E+01 1.42E+01 1.47E+01 3.48E-01 1.57E+01 1.38E+01 6.80E+00 PASS 1.47E+01 3.57E-01 1.56E+01 1.37E+01 4.50E+00 PASS 1.46E+01 3.49E-01 1.55E+01 1.36E+01 4.50E+00 PASS An ISO 9001:2008 and DLA Certified Company 223 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.107. Plot of +Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 224 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.107. Raw data for +Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 6.69E+00 6.35E+00 6.66E+00 6.44E+00 6.55E+00 6.99E+00 6.63E+00 6.29E+00 6.75E+00 6.46E+00 6.68E+00 6.77E+00 24-hr Anneal 225 6.70E+00 6.53E+00 6.68E+00 6.60E+00 6.42E+00 6.93E+00 6.62E+00 6.34E+00 6.72E+00 6.47E+00 6.77E+00 6.95E+00 168-hr Anneal 250 6.76E+00 6.71E+00 6.75E+00 6.60E+00 6.64E+00 7.08E+00 6.74E+00 6.46E+00 6.76E+00 6.49E+00 6.74E+00 6.70E+00 6.69E+00 4.56E-02 6.82E+00 6.57E+00 6.54E+00 1.44E-01 6.93E+00 6.14E+00 6.59E+00 1.15E-01 6.90E+00 6.27E+00 6.69E+00 6.98E-02 6.88E+00 6.50E+00 6.65E+00 3.21E-01 7.53E+00 5.77E+00 3.00E+00 PASS 6.62E+00 2.68E-01 7.36E+00 5.89E+00 3.00E+00 PASS 6.62E+00 2.27E-01 7.24E+00 5.99E+00 3.00E+00 PASS 6.71E+00 2.51E-01 7.39E+00 6.02E+00 3.00E+00 PASS 0 7.14E+00 7.05E+00 7.03E+00 6.95E+00 6.85E+00 7.19E+00 7.07E+00 6.55E+00 7.00E+00 6.68E+00 6.67E+00 6.83E+00 Total 20 6.96E+00 6.86E+00 7.06E+00 6.84E+00 6.72E+00 7.12E+00 6.79E+00 6.43E+00 6.99E+00 6.73E+00 6.73E+00 6.94E+00 Dose (krad(Si)) 50 100 6.89E+00 6.74E+00 6.65E+00 6.72E+00 6.81E+00 6.72E+00 6.75E+00 6.64E+00 6.65E+00 6.65E+00 7.06E+00 7.05E+00 6.72E+00 6.67E+00 6.36E+00 6.25E+00 6.93E+00 6.85E+00 6.60E+00 6.42E+00 6.74E+00 6.78E+00 6.90E+00 6.88E+00 7.00E+00 1.09E-01 7.30E+00 6.70E+00 6.89E+00 1.29E-01 7.24E+00 6.54E+00 6.75E+00 1.04E-01 7.03E+00 6.47E+00 6.90E+00 2.71E-01 7.64E+00 6.15E+00 3.50E+00 PASS 6.81E+00 2.64E-01 7.54E+00 6.09E+00 3.00E+00 PASS 6.73E+00 2.75E-01 7.49E+00 5.98E+00 3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 225 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.108. Plot of +Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 226 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.108. Raw data for +Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 6.59E+00 6.66E+00 6.62E+00 6.33E+00 6.26E+00 6.52E+00 6.46E+00 6.54E+00 6.45E+00 6.52E+00 6.79E+00 6.96E+00 24-hr Anneal 225 6.74E+00 6.67E+00 6.61E+00 6.42E+00 6.41E+00 6.62E+00 6.53E+00 6.57E+00 6.59E+00 6.49E+00 6.74E+00 7.00E+00 168-hr Anneal 250 6.81E+00 6.78E+00 6.71E+00 6.54E+00 6.52E+00 6.67E+00 6.69E+00 6.67E+00 6.63E+00 6.61E+00 6.75E+00 7.00E+00 6.60E+00 2.02E-01 7.16E+00 6.05E+00 6.49E+00 1.83E-01 6.99E+00 5.99E+00 6.57E+00 1.49E-01 6.98E+00 6.16E+00 6.67E+00 1.35E-01 7.04E+00 6.30E+00 6.67E+00 3.58E-02 6.77E+00 6.58E+00 3.00E+00 PASS 6.50E+00 4.02E-02 6.61E+00 6.39E+00 3.00E+00 PASS 6.56E+00 5.10E-02 6.70E+00 6.42E+00 3.00E+00 PASS 6.65E+00 3.29E-02 6.74E+00 6.56E+00 3.00E+00 PASS 0 7.07E+00 6.95E+00 6.98E+00 6.71E+00 6.67E+00 6.83E+00 6.64E+00 6.71E+00 6.66E+00 6.71E+00 6.74E+00 6.92E+00 Total 20 7.02E+00 6.95E+00 6.85E+00 6.63E+00 6.65E+00 6.76E+00 6.62E+00 6.68E+00 6.71E+00 6.74E+00 6.77E+00 6.89E+00 Dose (krad(Si)) 50 100 6.92E+00 6.85E+00 6.82E+00 6.74E+00 6.69E+00 6.63E+00 6.64E+00 6.41E+00 6.51E+00 6.39E+00 6.78E+00 6.68E+00 6.70E+00 6.71E+00 6.68E+00 6.62E+00 6.62E+00 6.70E+00 6.69E+00 6.66E+00 6.60E+00 6.77E+00 6.89E+00 6.83E+00 6.88E+00 1.76E-01 7.36E+00 6.39E+00 6.82E+00 1.75E-01 7.30E+00 6.34E+00 6.72E+00 1.59E-01 7.15E+00 6.28E+00 6.71E+00 7.38E-02 6.91E+00 6.51E+00 3.50E+00 PASS 6.70E+00 5.50E-02 6.85E+00 6.55E+00 3.00E+00 PASS 6.69E+00 5.73E-02 6.85E+00 6.54E+00 3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 227 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.109. Plot of +Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 228 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.109. Raw data for +Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 6.44E+00 6.67E+00 6.43E+00 6.32E+00 6.18E+00 6.41E+00 6.43E+00 6.48E+00 6.56E+00 6.35E+00 6.60E+00 6.80E+00 24-hr Anneal 225 6.57E+00 6.64E+00 6.46E+00 6.21E+00 6.17E+00 6.59E+00 6.33E+00 6.55E+00 6.34E+00 6.50E+00 6.47E+00 6.81E+00 168-hr Anneal 250 6.60E+00 6.75E+00 6.45E+00 6.33E+00 6.41E+00 6.62E+00 6.54E+00 6.57E+00 6.43E+00 6.47E+00 6.50E+00 6.69E+00 6.53E+00 2.07E-01 7.10E+00 5.96E+00 6.41E+00 1.80E-01 6.90E+00 5.91E+00 6.41E+00 2.11E-01 6.99E+00 5.83E+00 6.51E+00 1.67E-01 6.97E+00 6.05E+00 6.59E+00 1.45E-01 6.98E+00 6.19E+00 3.00E+00 PASS 6.45E+00 7.89E-02 6.66E+00 6.23E+00 3.00E+00 PASS 6.46E+00 1.20E-01 6.79E+00 6.13E+00 3.00E+00 PASS 6.53E+00 7.64E-02 6.74E+00 6.32E+00 3.00E+00 PASS 0 7.06E+00 7.04E+00 6.74E+00 6.59E+00 6.65E+00 6.78E+00 6.63E+00 6.70E+00 6.71E+00 6.60E+00 6.58E+00 6.81E+00 Total 20 6.76E+00 7.04E+00 6.66E+00 6.48E+00 6.53E+00 6.73E+00 6.63E+00 6.66E+00 6.78E+00 6.50E+00 6.53E+00 6.80E+00 Dose (krad(Si)) 50 100 6.76E+00 6.70E+00 6.73E+00 6.77E+00 6.60E+00 6.52E+00 6.48E+00 6.38E+00 6.32E+00 6.28E+00 6.76E+00 6.80E+00 6.53E+00 6.54E+00 6.66E+00 6.62E+00 6.69E+00 6.57E+00 6.50E+00 6.40E+00 6.53E+00 6.42E+00 6.87E+00 6.87E+00 6.82E+00 2.20E-01 7.42E+00 6.21E+00 6.69E+00 2.22E-01 7.30E+00 6.08E+00 6.58E+00 1.82E-01 7.08E+00 6.08E+00 6.68E+00 7.09E-02 6.88E+00 6.49E+00 3.50E+00 PASS 6.66E+00 1.07E-01 6.95E+00 6.37E+00 3.00E+00 PASS 6.63E+00 1.10E-01 6.93E+00 6.33E+00 3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 229 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.110. Plot of +Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 230 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.110. Raw data for +Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 6.64E+00 6.71E+00 6.79E+00 6.68E+00 6.74E+00 6.88E+00 6.93E+00 6.41E+00 6.73E+00 6.50E+00 7.07E+00 7.02E+00 24-hr Anneal 225 6.70E+00 6.64E+00 6.82E+00 6.64E+00 6.75E+00 6.81E+00 7.02E+00 6.50E+00 6.75E+00 6.57E+00 6.95E+00 6.92E+00 168-hr Anneal 250 7.01E+00 6.64E+00 6.96E+00 6.73E+00 6.69E+00 6.88E+00 7.04E+00 6.47E+00 6.77E+00 6.70E+00 6.98E+00 7.07E+00 6.85E+00 1.53E-01 7.27E+00 6.43E+00 6.71E+00 5.72E-02 6.87E+00 6.56E+00 6.71E+00 7.68E-02 6.92E+00 6.50E+00 6.81E+00 1.67E-01 7.27E+00 6.35E+00 6.83E+00 2.49E-01 7.52E+00 6.15E+00 3.00E+00 PASS 6.69E+00 2.29E-01 7.32E+00 6.06E+00 3.00E+00 PASS 6.73E+00 2.06E-01 7.29E+00 6.17E+00 3.00E+00 PASS 6.77E+00 2.12E-01 7.35E+00 6.19E+00 3.00E+00 PASS 0 7.41E+00 7.09E+00 7.36E+00 6.98E+00 7.21E+00 7.03E+00 7.37E+00 6.63E+00 7.16E+00 6.76E+00 6.99E+00 6.95E+00 Total 20 7.18E+00 6.84E+00 7.10E+00 6.81E+00 7.06E+00 7.08E+00 7.37E+00 6.66E+00 6.96E+00 6.74E+00 7.04E+00 7.13E+00 Dose (krad(Si)) 50 100 7.05E+00 6.95E+00 6.79E+00 6.81E+00 7.09E+00 7.07E+00 6.85E+00 6.72E+00 7.02E+00 6.72E+00 6.98E+00 7.03E+00 7.26E+00 7.13E+00 6.72E+00 6.51E+00 7.13E+00 6.79E+00 6.74E+00 6.71E+00 6.97E+00 7.03E+00 6.89E+00 7.09E+00 7.21E+00 1.80E-01 7.70E+00 6.72E+00 7.00E+00 1.64E-01 7.45E+00 6.55E+00 6.96E+00 1.32E-01 7.32E+00 6.60E+00 6.99E+00 2.99E-01 7.81E+00 6.17E+00 3.50E+00 PASS 6.96E+00 2.83E-01 7.74E+00 6.19E+00 3.00E+00 PASS 6.97E+00 2.37E-01 7.62E+00 6.32E+00 3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 231 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.111. Plot of -Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 232 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.111. Raw data for -Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -6.66E+00 -6.56E+00 -6.57E+00 -6.59E+00 -6.55E+00 -6.79E+00 -6.59E+00 -6.00E+00 -6.52E+00 -6.21E+00 -6.53E+00 -6.52E+00 Total Dose (krad(Si)) 20 50 100 -6.56E+00 -6.59E+00 -6.38E+00 -6.47E+00 -6.35E+00 -6.13E+00 -6.56E+00 -6.37E+00 -6.40E+00 -6.43E+00 -6.30E+00 -6.13E+00 -6.39E+00 -6.27E+00 -6.14E+00 -6.96E+00 -6.62E+00 -6.57E+00 -6.41E+00 -6.42E+00 -6.33E+00 -6.06E+00 -5.98E+00 -5.97E+00 -6.55E+00 -6.43E+00 -6.41E+00 -6.40E+00 -6.26E+00 -6.16E+00 -6.55E+00 -6.55E+00 -6.66E+00 -6.51E+00 -6.55E+00 -6.58E+00 200 -6.32E+00 -6.05E+00 -6.31E+00 -6.07E+00 -6.12E+00 -6.46E+00 -6.25E+00 -5.76E+00 -6.26E+00 -6.07E+00 -6.51E+00 -6.60E+00 24-hr Anneal 225 -6.31E+00 -5.99E+00 -6.26E+00 -6.00E+00 -6.02E+00 -6.47E+00 -6.27E+00 -5.85E+00 -6.25E+00 -6.00E+00 -6.52E+00 -6.54E+00 168-hr Anneal 250 -6.56E+00 -6.30E+00 -6.44E+00 -6.27E+00 -6.27E+00 -6.63E+00 -6.33E+00 -5.87E+00 -6.39E+00 -6.24E+00 -6.41E+00 -6.55E+00 -6.59E+00 -6.48E+00 -6.38E+00 -6.24E+00 -6.17E+00 -6.12E+00 -6.37E+00 4.39E-02 7.66E-02 1.26E-01 1.41E-01 1.31E-01 1.56E-01 1.28E-01 -6.47E+00 -6.27E+00 -6.03E+00 -5.85E+00 -5.81E+00 -5.69E+00 -6.02E+00 -6.71E+00 -6.69E+00 -6.72E+00 -6.62E+00 -6.53E+00 -6.54E+00 -6.72E+00 -6.42E+00 3.15E-01 -5.56E+00 -7.29E+00 -3.50E+00 PASS -6.48E+00 3.25E-01 -5.58E+00 -7.37E+00 -3.00E+00 PASS -6.34E+00 2.39E-01 -5.69E+00 -7.00E+00 -3.00E+00 PASS -6.29E+00 2.31E-01 -5.65E+00 -6.92E+00 -3.00E+00 PASS -6.16E+00 2.63E-01 -5.44E+00 -6.88E+00 -3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 233 -6.17E+00 2.44E-01 -5.50E+00 -6.84E+00 -3.00E+00 PASS -6.29E+00 2.77E-01 -5.53E+00 -7.05E+00 -3.00E+00 PASS TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.112. Plot of -Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 234 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.112. Raw data for -Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -6.71E+00 -6.61E+00 -6.54E+00 -6.33E+00 -6.30E+00 -6.42E+00 -6.33E+00 -6.45E+00 -6.30E+00 -6.30E+00 -6.37E+00 -6.59E+00 Total Dose (krad(Si)) 20 50 100 -6.55E+00 -6.57E+00 -6.45E+00 -6.37E+00 -6.30E+00 -6.22E+00 -6.47E+00 -6.38E+00 -6.32E+00 -6.31E+00 -6.12E+00 -6.09E+00 -6.08E+00 -6.15E+00 -5.92E+00 -6.37E+00 -6.48E+00 -6.18E+00 -6.08E+00 -6.14E+00 -6.05E+00 -6.36E+00 -6.28E+00 -6.21E+00 -6.28E+00 -6.29E+00 -6.32E+00 -6.23E+00 -6.31E+00 -6.05E+00 -6.45E+00 -6.32E+00 -6.40E+00 -6.62E+00 -6.62E+00 -6.61E+00 200 -6.39E+00 -6.04E+00 -6.15E+00 -5.89E+00 -5.83E+00 -6.16E+00 -6.01E+00 -6.07E+00 -6.14E+00 -5.99E+00 -6.27E+00 -6.63E+00 24-hr Anneal 225 -6.20E+00 -6.24E+00 -6.18E+00 -6.07E+00 -5.85E+00 -6.11E+00 -5.98E+00 -6.06E+00 -6.21E+00 -6.09E+00 -6.38E+00 -6.50E+00 168-hr Anneal 250 -6.46E+00 -6.36E+00 -6.27E+00 -6.07E+00 -6.08E+00 -6.22E+00 -6.02E+00 -6.26E+00 -6.21E+00 -6.13E+00 -6.39E+00 -6.61E+00 -6.50E+00 -6.36E+00 -6.30E+00 -6.20E+00 -6.06E+00 -6.11E+00 -6.25E+00 1.78E-01 1.80E-01 1.83E-01 2.05E-01 2.23E-01 1.57E-01 1.72E-01 -6.01E+00 -5.86E+00 -5.80E+00 -5.64E+00 -5.45E+00 -5.68E+00 -5.78E+00 -6.99E+00 -6.85E+00 -6.81E+00 -6.76E+00 -6.67E+00 -6.54E+00 -6.72E+00 -6.36E+00 7.04E-02 -6.17E+00 -6.55E+00 -3.50E+00 PASS -6.26E+00 1.18E-01 -5.94E+00 -6.59E+00 -3.00E+00 PASS -6.30E+00 1.21E-01 -5.97E+00 -6.63E+00 -3.00E+00 PASS -6.16E+00 1.15E-01 -5.85E+00 -6.48E+00 -3.00E+00 PASS -6.07E+00 7.57E-02 -5.87E+00 -6.28E+00 -3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 235 -6.09E+00 8.34E-02 -5.86E+00 -6.32E+00 -3.00E+00 PASS -6.17E+00 9.52E-02 -5.91E+00 -6.43E+00 -3.00E+00 PASS TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.113. Plot of -Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 236 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.113. Raw data for -Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -6.62E+00 -6.68E+00 -6.36E+00 -6.23E+00 -6.15E+00 -6.37E+00 -6.29E+00 -6.39E+00 -6.41E+00 -6.26E+00 -6.21E+00 -6.69E+00 Total Dose (krad(Si)) 20 50 100 -6.41E+00 -6.28E+00 -6.07E+00 -6.58E+00 -6.42E+00 -6.44E+00 -6.34E+00 -6.22E+00 -6.23E+00 -5.97E+00 -5.91E+00 -5.97E+00 -6.08E+00 -5.99E+00 -5.86E+00 -6.34E+00 -6.39E+00 -6.18E+00 -6.22E+00 -6.18E+00 -5.98E+00 -6.19E+00 -6.10E+00 -6.01E+00 -6.29E+00 -6.10E+00 -6.26E+00 -6.05E+00 -6.04E+00 -6.11E+00 -6.17E+00 -6.23E+00 -6.16E+00 -6.50E+00 -6.59E+00 -6.50E+00 200 -6.11E+00 -6.15E+00 -5.83E+00 -5.86E+00 -5.67E+00 -6.07E+00 -6.01E+00 -6.03E+00 -6.02E+00 -5.90E+00 -6.20E+00 -6.57E+00 24-hr Anneal 225 -6.19E+00 -6.11E+00 -5.90E+00 -5.76E+00 -5.67E+00 -6.11E+00 -6.02E+00 -6.09E+00 -6.01E+00 -5.88E+00 -6.19E+00 -6.60E+00 168-hr Anneal 250 -6.19E+00 -6.30E+00 -6.09E+00 -5.91E+00 -5.87E+00 -6.10E+00 -6.16E+00 -6.13E+00 -6.27E+00 -6.15E+00 -6.18E+00 -6.51E+00 -6.41E+00 -6.28E+00 -6.16E+00 -6.11E+00 -5.92E+00 -5.93E+00 -6.07E+00 2.34E-01 2.48E-01 2.10E-01 2.27E-01 2.02E-01 2.22E-01 1.83E-01 -5.77E+00 -5.60E+00 -5.59E+00 -5.49E+00 -5.37E+00 -5.32E+00 -5.57E+00 -7.05E+00 -6.96E+00 -6.74E+00 -6.74E+00 -6.48E+00 -6.54E+00 -6.57E+00 -6.34E+00 6.54E-02 -6.16E+00 -6.52E+00 -3.50E+00 PASS -6.22E+00 1.11E-01 -5.91E+00 -6.52E+00 -3.00E+00 PASS -6.16E+00 1.37E-01 -5.79E+00 -6.54E+00 -3.00E+00 PASS -6.11E+00 1.16E-01 -5.79E+00 -6.43E+00 -3.00E+00 PASS -6.01E+00 6.35E-02 -5.83E+00 -6.18E+00 -3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 237 -6.02E+00 9.04E-02 -5.77E+00 -6.27E+00 -3.00E+00 PASS -6.16E+00 6.46E-02 -5.98E+00 -6.34E+00 -3.00E+00 PASS TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.114. Plot of -Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 238 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.114. Raw data for -Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -6.76E+00 -6.59E+00 -6.69E+00 -6.75E+00 -6.73E+00 -6.67E+00 -6.83E+00 -6.37E+00 -6.73E+00 -6.47E+00 -6.64E+00 -6.59E+00 Total Dose (krad(Si)) 20 50 100 -6.76E+00 -6.74E+00 -6.63E+00 -6.61E+00 -6.58E+00 -6.44E+00 -6.47E+00 -6.59E+00 -6.66E+00 -6.59E+00 -6.32E+00 -6.33E+00 -6.67E+00 -6.48E+00 -6.43E+00 -6.64E+00 -6.54E+00 -6.51E+00 -6.83E+00 -6.80E+00 -6.56E+00 -6.31E+00 -6.12E+00 -6.09E+00 -6.59E+00 -6.61E+00 -6.56E+00 -6.49E+00 -6.30E+00 -6.29E+00 -6.68E+00 -6.60E+00 -6.67E+00 -6.63E+00 -6.63E+00 -6.67E+00 200 -6.51E+00 -6.29E+00 -6.38E+00 -6.30E+00 -6.24E+00 -6.39E+00 -6.63E+00 -6.02E+00 -6.46E+00 -6.10E+00 -6.67E+00 -6.62E+00 24-hr Anneal 225 -6.41E+00 -6.30E+00 -6.44E+00 -6.14E+00 -6.42E+00 -6.58E+00 -6.38E+00 -6.09E+00 -6.41E+00 -6.16E+00 -6.75E+00 -6.51E+00 168-hr Anneal 250 -6.61E+00 -6.51E+00 -6.56E+00 -6.41E+00 -6.40E+00 -6.63E+00 -6.75E+00 -6.23E+00 -6.42E+00 -6.36E+00 -6.58E+00 -6.67E+00 -6.70E+00 -6.62E+00 -6.54E+00 -6.50E+00 -6.34E+00 -6.34E+00 -6.50E+00 6.91E-02 1.07E-01 1.55E-01 1.41E-01 1.05E-01 1.25E-01 9.20E-02 -6.51E+00 -6.33E+00 -6.12E+00 -6.11E+00 -6.05E+00 -6.00E+00 -6.25E+00 -6.89E+00 -6.91E+00 -6.97E+00 -6.89E+00 -6.63E+00 -6.69E+00 -6.75E+00 -6.61E+00 1.89E-01 -6.09E+00 -7.13E+00 -3.50E+00 PASS -6.57E+00 1.92E-01 -6.05E+00 -7.10E+00 -3.00E+00 PASS -6.47E+00 2.67E-01 -5.74E+00 -7.21E+00 -3.00E+00 PASS -6.40E+00 2.07E-01 -5.83E+00 -6.97E+00 -3.00E+00 PASS -6.32E+00 2.54E-01 -5.62E+00 -7.02E+00 -3.00E+00 PASS An ISO 9001:2008 and DLA Certified Company 239 -6.32E+00 1.99E-01 -5.78E+00 -6.87E+00 -3.00E+00 PASS -6.48E+00 2.10E-01 -5.90E+00 -7.05E+00 -3.00E+00 PASS TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.115. Plot of +Supply Current 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 240 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.115. Raw data for +Supply Current 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Supply Current 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 7.99E-03 7.91E-03 7.89E-03 7.89E-03 7.75E-03 7.88E-03 7.76E-03 8.03E-03 7.90E-03 7.68E-03 7.85E-03 7.86E-03 Biased Statistics Average Biased 7.88E-03 Std Dev Biased 8.69E-05 Ps90%/90% (+KTL) Biased 8.12E-03 Ps90%/90% (-KTL) Biased 7.65E-03 Un-Biased Statistics Average Un-Biased 7.85E-03 Std Dev Un-Biased 1.34E-04 Ps90%/90% (+KTL) Un-Biased 8.21E-03 Ps90%/90% (-KTL) Un-Biased 7.48E-03 Specification MAX 8.80E-03 Status PASS 200 7.60E-03 7.51E-03 7.50E-03 7.52E-03 7.36E-03 7.59E-03 7.47E-03 7.75E-03 7.64E-03 7.41E-03 7.85E-03 7.86E-03 24-hr Anneal 225 7.66E-03 7.56E-03 7.56E-03 7.56E-03 7.41E-03 7.62E-03 7.52E-03 7.78E-03 7.67E-03 7.43E-03 7.85E-03 7.86E-03 168-hr Anneal 250 7.78E-03 7.70E-03 7.69E-03 7.70E-03 7.55E-03 7.73E-03 7.63E-03 7.88E-03 7.75E-03 7.54E-03 7.84E-03 7.85E-03 7.63E-03 9.83E-05 7.90E-03 7.36E-03 7.50E-03 8.61E-05 7.73E-03 7.26E-03 7.55E-03 8.69E-05 7.79E-03 7.31E-03 7.68E-03 8.38E-05 7.91E-03 7.45E-03 7.68E-03 1.34E-04 8.05E-03 7.32E-03 8.80E-03 PASS 7.57E-03 1.37E-04 7.95E-03 7.20E-03 8.80E-03 PASS 7.60E-03 1.34E-04 7.97E-03 7.24E-03 8.80E-03 PASS 7.71E-03 1.32E-04 8.07E-03 7.34E-03 8.80E-03 PASS Total 20 7.87E-03 7.78E-03 7.76E-03 7.76E-03 7.63E-03 7.82E-03 7.70E-03 7.97E-03 7.84E-03 7.63E-03 7.86E-03 7.86E-03 Dose (krad(Si)) 50 100 7.80E-03 7.71E-03 7.69E-03 7.72E-03 7.69E-03 7.62E-03 7.70E-03 7.63E-03 7.56E-03 7.47E-03 7.76E-03 7.70E-03 7.65E-03 7.59E-03 7.92E-03 7.85E-03 7.79E-03 7.75E-03 7.58E-03 7.51E-03 7.85E-03 7.86E-03 7.86E-03 7.87E-03 7.76E-03 8.46E-05 7.99E-03 7.53E-03 7.69E-03 8.50E-05 7.92E-03 7.46E-03 7.79E-03 1.34E-04 8.16E-03 7.42E-03 8.80E-03 PASS 7.74E-03 1.33E-04 8.10E-03 7.38E-03 8.80E-03 PASS An ISO 9001:2008 and DLA Certified Company 241 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.116. Plot of -Supply Current 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 242 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.116. Raw data for -Supply Current 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Supply Current 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 -7.98E-03 -7.90E-03 -7.88E-03 -7.88E-03 -7.75E-03 -7.87E-03 -7.75E-03 -8.02E-03 -7.89E-03 -7.67E-03 -7.85E-03 -7.86E-03 Biased Statistics Average Biased -7.88E-03 Std Dev Biased 8.51E-05 Ps90%/90% (+KTL) Biased -7.64E-03 Ps90%/90% (-KTL) Biased -8.11E-03 Un-Biased Statistics Average Un-Biased -7.84E-03 Std Dev Un-Biased 1.33E-04 Ps90%/90% (+KTL) Un-Biased -7.47E-03 Ps90%/90% (-KTL) Un-Biased -8.20E-03 Specification MIN -8.80E-03 Status PASS 200 -7.59E-03 -7.51E-03 -7.50E-03 -7.51E-03 -7.35E-03 -7.58E-03 -7.47E-03 -7.75E-03 -7.64E-03 -7.40E-03 -7.85E-03 -7.86E-03 24-hr Anneal 225 -7.65E-03 -7.56E-03 -7.56E-03 -7.55E-03 -7.41E-03 -7.61E-03 -7.51E-03 -7.78E-03 -7.66E-03 -7.43E-03 -7.85E-03 -7.86E-03 168-hr Anneal 250 -7.77E-03 -7.69E-03 -7.68E-03 -7.69E-03 -7.54E-03 -7.72E-03 -7.62E-03 -7.88E-03 -7.74E-03 -7.53E-03 -7.83E-03 -7.84E-03 -7.62E-03 9.60E-05 -7.36E-03 -7.89E-03 -7.49E-03 8.68E-05 -7.25E-03 -7.73E-03 -7.54E-03 8.65E-05 -7.31E-03 -7.78E-03 -7.68E-03 8.36E-05 -7.45E-03 -7.90E-03 -7.67E-03 1.34E-04 -7.31E-03 -8.04E-03 -8.80E-03 PASS -7.57E-03 1.37E-04 -7.19E-03 -7.94E-03 -8.80E-03 PASS -7.60E-03 1.35E-04 -7.23E-03 -7.97E-03 -8.80E-03 PASS -7.70E-03 1.32E-04 -7.34E-03 -8.06E-03 -8.80E-03 PASS Total 20 -7.86E-03 -7.77E-03 -7.76E-03 -7.75E-03 -7.63E-03 -7.82E-03 -7.69E-03 -7.97E-03 -7.84E-03 -7.62E-03 -7.85E-03 -7.86E-03 Dose (krad(Si)) 50 100 -7.79E-03 -7.70E-03 -7.69E-03 -7.71E-03 -7.68E-03 -7.62E-03 -7.70E-03 -7.62E-03 -7.56E-03 -7.47E-03 -7.76E-03 -7.69E-03 -7.64E-03 -7.59E-03 -7.91E-03 -7.85E-03 -7.78E-03 -7.75E-03 -7.57E-03 -7.51E-03 -7.85E-03 -7.85E-03 -7.86E-03 -7.86E-03 -7.75E-03 8.42E-05 -7.52E-03 -7.98E-03 -7.68E-03 8.47E-05 -7.45E-03 -7.91E-03 -7.79E-03 1.35E-04 -7.42E-03 -8.16E-03 -8.80E-03 PASS -7.73E-03 1.33E-04 -7.37E-03 -8.10E-03 -8.80E-03 PASS An ISO 9001:2008 and DLA Certified Company 243 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.117. Plot of Input Offset Voltage4_1 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 244 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.117. Raw data for Input Offset Voltage4_1 5V (V) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage4_1 5V (V) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 4.54E-04 -4.32E-06 -5.92E-05 -5.96E-05 1.79E-04 1.98E-04 -1.62E-04 8.64E-06 -1.67E-04 3.73E-05 4.84E-05 -1.48E-04 24-hr Anneal 225 4.44E-04 -1.20E-05 -4.80E-05 -6.77E-05 1.65E-04 1.97E-04 -1.74E-04 -1.42E-06 -1.71E-04 3.55E-05 4.35E-05 -1.48E-04 168-hr Anneal 250 4.21E-04 -2.32E-05 -7.23E-05 -9.47E-05 1.26E-04 2.19E-04 -2.03E-04 2.50E-05 -1.64E-04 4.52E-05 4.64E-05 -1.47E-04 1.00E-04 2.14E-04 6.87E-04 -4.86E-04 1.02E-04 2.20E-04 7.05E-04 -5.01E-04 9.64E-05 2.15E-04 6.87E-04 -4.94E-04 7.14E-05 2.14E-04 6.57E-04 -5.14E-04 -1.03E-05 1.59E-04 4.26E-04 -4.47E-04 -9.50E-04 PASS 9.50E-04 PASS -1.69E-05 1.53E-04 4.02E-04 -4.35E-04 -9.50E-04 PASS 9.50E-04 PASS -2.28E-05 1.56E-04 4.04E-04 -4.50E-04 -9.50E-04 PASS 9.50E-04 PASS -1.58E-05 1.71E-04 4.54E-04 -4.86E-04 -9.50E-04 PASS 9.50E-04 PASS 0 4.40E-04 -8.09E-06 -2.10E-05 -7.51E-05 1.63E-04 2.85E-04 -1.23E-04 4.04E-05 -1.36E-04 8.95E-05 4.76E-05 -1.47E-04 Total 20 4.28E-04 -1.49E-05 -3.08E-05 -7.95E-05 1.60E-04 2.56E-04 -1.43E-04 2.63E-05 -1.52E-04 6.90E-05 4.92E-05 -1.44E-04 Dose (krad(Si)) 50 100 4.38E-04 4.46E-04 -6.06E-06 5.30E-07 -3.84E-05 -4.33E-05 -7.60E-05 -6.88E-05 1.58E-04 1.68E-04 2.37E-04 2.18E-04 -1.53E-04 -1.64E-04 1.73E-05 1.41E-05 -1.60E-04 -1.60E-04 5.71E-05 4.02E-05 4.77E-05 4.86E-05 -1.46E-04 -1.45E-04 9.98E-05 2.10E-04 6.76E-04 -4.77E-04 9.26E-05 2.08E-04 6.64E-04 -4.79E-04 9.50E-05 2.11E-04 6.74E-04 -4.84E-04 3.12E-05 1.73E-04 5.05E-04 -4.42E-04 -8.00E-04 PASS 8.00E-04 PASS 1.14E-05 1.69E-04 4.74E-04 -4.51E-04 -9.50E-04 PASS 9.50E-04 PASS -3.20E-07 1.65E-04 4.52E-04 -4.52E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 245 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.118. Plot of Input Offset Voltage4_2 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 246 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.118. Raw data for Input Offset Voltage4_2 5V (V) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage4_2 5V (V) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.73E-04 4.03E-05 -5.11E-05 2.09E-04 -1.52E-04 1.25E-04 -2.48E-04 7.03E-05 -3.37E-04 -1.96E-04 -6.02E-05 1.06E-04 24-hr Anneal 225 1.69E-04 3.96E-05 -5.04E-05 2.15E-04 -1.53E-04 1.17E-04 -2.50E-04 6.60E-05 -3.40E-04 -2.05E-04 -5.82E-05 1.10E-04 168-hr Anneal 250 1.23E-04 2.09E-05 -5.99E-05 2.12E-04 -1.31E-04 1.55E-04 -2.51E-04 6.45E-05 -3.18E-04 -1.97E-04 -5.79E-05 1.09E-04 4.68E-05 1.48E-04 4.52E-04 -3.58E-04 4.40E-05 1.51E-04 4.58E-04 -3.70E-04 4.39E-05 1.52E-04 4.61E-04 -3.73E-04 3.31E-05 1.38E-04 4.11E-04 -3.45E-04 -1.08E-04 2.03E-04 4.48E-04 -6.64E-04 -9.50E-04 PASS 9.50E-04 PASS -1.17E-04 2.03E-04 4.40E-04 -6.74E-04 -9.50E-04 PASS 9.50E-04 PASS -1.22E-04 2.02E-04 4.32E-04 -6.77E-04 -9.50E-04 PASS 9.50E-04 PASS -1.09E-04 2.07E-04 4.58E-04 -6.77E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.48E-04 6.33E-05 -3.12E-05 2.13E-04 -1.07E-04 1.68E-04 -2.04E-04 1.36E-04 -2.73E-04 -1.55E-04 -5.74E-05 1.06E-04 Total 20 1.51E-04 5.57E-05 -4.44E-05 2.04E-04 -1.28E-04 1.51E-04 -2.21E-04 1.07E-04 -3.00E-04 -1.76E-04 -5.58E-05 1.09E-04 Dose (krad(Si)) 50 100 1.61E-04 1.65E-04 4.78E-05 4.64E-05 -4.79E-05 -4.96E-05 2.06E-04 2.15E-04 -1.35E-04 -1.42E-04 1.38E-04 1.32E-04 -2.35E-04 -2.39E-04 9.34E-05 8.23E-05 -3.12E-04 -3.26E-04 -1.85E-04 -1.88E-04 -5.78E-05 -5.85E-05 1.08E-04 1.06E-04 5.71E-05 1.30E-04 4.12E-04 -2.98E-04 4.74E-05 1.36E-04 4.21E-04 -3.27E-04 4.63E-05 1.42E-04 4.35E-04 -3.43E-04 -6.57E-05 2.03E-04 4.92E-04 -6.23E-04 -8.00E-04 PASS 8.00E-04 PASS -8.77E-05 2.03E-04 4.69E-04 -6.45E-04 -9.50E-04 PASS 9.50E-04 PASS -1.00E-04 2.03E-04 4.56E-04 -6.56E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 247 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.119. Plot of Input Offset Voltage4_3 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 248 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.119. Raw data for Input Offset Voltage4_3 5V (V) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage4_3 5V (V) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -3.11E-04 -1.23E-04 -2.36E-04 5.02E-05 -1.56E-04 1.49E-04 2.00E-04 -3.82E-04 -3.50E-05 3.77E-05 1.86E-04 3.74E-05 24-hr Anneal 225 -3.06E-04 -1.30E-04 -2.41E-04 4.19E-05 -1.59E-04 1.41E-04 1.95E-04 -3.86E-04 -4.74E-05 3.02E-05 1.89E-04 3.92E-05 168-hr Anneal 250 -3.27E-04 -1.57E-04 -2.52E-04 -7.75E-06 -1.62E-04 1.54E-04 2.05E-04 -3.75E-04 -5.88E-05 5.36E-05 1.83E-04 3.71E-05 -1.56E-04 1.35E-04 2.15E-04 -5.26E-04 -1.55E-04 1.36E-04 2.18E-04 -5.28E-04 -1.59E-04 1.32E-04 2.03E-04 -5.20E-04 -1.81E-04 1.20E-04 1.47E-04 -5.09E-04 2.10E-06 2.30E-04 6.34E-04 -6.30E-04 -9.50E-04 PASS 9.50E-04 PASS -6.05E-06 2.29E-04 6.23E-04 -6.35E-04 -9.50E-04 PASS 9.50E-04 PASS -1.34E-05 2.29E-04 6.14E-04 -6.41E-04 -9.50E-04 PASS 9.50E-04 PASS -4.23E-06 2.30E-04 6.28E-04 -6.36E-04 -9.50E-04 PASS 9.50E-04 PASS 0 -2.89E-04 -1.17E-04 -2.36E-04 7.29E-05 -1.48E-04 2.10E-04 2.64E-04 -3.42E-04 4.62E-06 1.03E-04 1.89E-04 3.84E-05 Total 20 -3.09E-04 -1.30E-04 -2.50E-04 5.42E-05 -1.66E-04 1.83E-04 2.35E-04 -3.59E-04 -1.77E-05 8.14E-05 1.84E-04 3.55E-05 Dose (krad(Si)) 50 100 -3.03E-04 -3.07E-04 -1.25E-04 -1.25E-04 -2.43E-04 -2.40E-04 5.29E-05 4.93E-05 -1.62E-04 -1.55E-04 1.66E-04 1.53E-04 2.20E-04 2.10E-04 -3.68E-04 -3.75E-04 -2.77E-05 -3.18E-05 6.49E-05 5.43E-05 1.84E-04 1.87E-04 3.76E-05 3.49E-05 -1.43E-04 1.39E-04 2.37E-04 -5.24E-04 -1.60E-04 1.39E-04 2.20E-04 -5.41E-04 -1.56E-04 1.36E-04 2.16E-04 -5.29E-04 4.78E-05 2.40E-04 7.05E-04 -6.09E-04 -8.00E-04 PASS 8.00E-04 PASS 2.45E-05 2.35E-04 6.69E-04 -6.20E-04 -9.50E-04 PASS 9.50E-04 PASS 1.12E-05 2.32E-04 6.48E-04 -6.25E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 249 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.120. Plot of Input Offset Voltage4_4 5V (V) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 250 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.120. Raw data for Input Offset Voltage4_4 5V (V) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage4_4 5V (V) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.61E-04 1.85E-04 -1.83E-04 6.28E-05 -1.42E-04 2.39E-04 6.06E-05 -4.83E-05 2.17E-04 1.20E-04 8.51E-06 -6.96E-05 24-hr Anneal 225 1.59E-04 1.84E-04 -1.81E-04 6.51E-05 -1.46E-04 2.26E-04 5.08E-05 -5.36E-05 2.12E-04 1.17E-04 9.39E-06 -6.96E-05 168-hr Anneal 250 1.59E-04 1.42E-04 -1.94E-04 4.66E-05 -1.72E-04 1.93E-04 3.16E-05 -4.50E-05 1.75E-04 1.22E-04 5.75E-06 -6.97E-05 2.21E-05 1.70E-04 4.88E-04 -4.43E-04 1.67E-05 1.71E-04 4.84E-04 -4.51E-04 1.64E-05 1.70E-04 4.84E-04 -4.51E-04 -3.60E-06 1.70E-04 4.61E-04 -4.69E-04 1.25E-04 1.15E-04 4.41E-04 -1.92E-04 -9.50E-04 PASS 9.50E-04 PASS 1.17E-04 1.18E-04 4.40E-04 -2.05E-04 -9.50E-04 PASS 9.50E-04 PASS 1.10E-04 1.16E-04 4.30E-04 -2.09E-04 -9.50E-04 PASS 9.50E-04 PASS 9.52E-05 1.00E-04 3.70E-04 -1.80E-04 -9.50E-04 PASS 9.50E-04 PASS 0 1.71E-04 2.09E-04 -1.43E-04 8.29E-05 -1.25E-04 2.66E-04 1.22E-04 2.53E-05 2.61E-04 1.79E-04 8.26E-06 -7.15E-05 Total 20 1.60E-04 1.89E-04 -1.64E-04 6.34E-05 -1.36E-04 2.46E-04 9.39E-05 -3.68E-06 2.41E-04 1.56E-04 1.00E-05 -7.06E-05 Dose (krad(Si)) 50 100 1.61E-04 1.61E-04 1.87E-04 1.94E-04 -1.66E-04 -1.75E-04 6.19E-05 6.79E-05 -1.37E-04 -1.37E-04 2.45E-04 2.40E-04 7.90E-05 6.94E-05 -2.07E-05 -4.03E-05 2.26E-04 2.23E-04 1.43E-04 1.31E-04 9.76E-06 8.40E-06 -6.84E-05 -6.99E-05 3.90E-05 1.64E-04 4.90E-04 -4.12E-04 2.24E-05 1.65E-04 4.74E-04 -4.29E-04 2.13E-05 1.65E-04 4.74E-04 -4.31E-04 1.71E-04 1.01E-04 4.48E-04 -1.07E-04 -8.00E-04 PASS 8.00E-04 PASS 1.47E-04 1.05E-04 4.35E-04 -1.42E-04 -9.50E-04 PASS 9.50E-04 PASS 1.35E-04 1.09E-04 4.34E-04 -1.65E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 251 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.121. Plot of Input Offset Current4_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 252 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.121. Raw data for Input Offset Current4_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current4_1 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 6.58E-09 3.78E-09 2.90E-10 3.74E-09 5.43E-09 4.75E-09 -3.31E-09 2.10E-09 2.65E-09 7.39E-09 -2.03E-09 -1.00E-08 24-hr Anneal 225 3.83E-09 1.73E-09 -1.20E-09 1.00E-09 2.75E-09 1.03E-09 -5.28E-09 9.90E-10 -3.10E-10 4.51E-09 -2.15E-09 -1.00E-08 168-hr Anneal 250 3.22E-09 1.34E-09 1.70E-09 8.60E-10 3.98E-09 3.23E-09 -5.04E-09 2.97E-09 1.01E-09 4.60E-09 -2.38E-09 -1.01E-08 2.77E-09 1.89E-09 7.95E-09 -2.41E-09 3.96E-09 2.38E-09 1.05E-08 -2.55E-09 1.62E-09 1.90E-09 6.84E-09 -3.60E-09 2.22E-09 1.32E-09 5.85E-09 -1.41E-09 2.19E-09 4.50E-09 1.45E-08 -1.01E-08 -6.50E-08 PASS 6.50E-08 PASS 2.72E-09 3.96E-09 1.36E-08 -8.14E-09 -6.50E-08 PASS 6.50E-08 PASS 1.88E-10 3.54E-09 9.90E-09 -9.52E-09 -6.50E-08 PASS 6.50E-08 PASS 1.35E-09 3.80E-09 1.18E-08 -9.06E-09 -6.50E-08 PASS 6.50E-08 PASS 0 2.67E-09 1.22E-09 1.54E-09 6.80E-10 3.67E-09 2.79E-09 -4.97E-09 3.21E-09 2.26E-09 4.52E-09 -1.47E-09 -9.79E-09 Total 20 3.00E-09 1.65E-09 1.48E-09 1.32E-09 3.66E-09 3.21E-09 -4.58E-09 2.30E-09 1.74E-09 5.33E-09 -1.60E-09 -9.64E-09 Dose (krad(Si)) 50 100 3.26E-09 4.38E-09 2.59E-09 7.20E-10 1.06E-09 8.60E-10 2.18E-09 3.22E-09 3.54E-09 4.67E-09 3.47E-09 4.28E-09 -4.56E-09 -5.25E-09 2.69E-09 3.76E-09 9.60E-10 1.68E-09 5.87E-09 6.50E-09 -1.80E-09 -1.85E-09 -9.86E-09 -9.85E-09 1.96E-09 1.20E-09 5.26E-09 -1.34E-09 2.22E-09 1.04E-09 5.09E-09 -6.42E-10 2.53E-09 9.80E-10 5.21E-09 -1.61E-10 1.56E-09 3.75E-09 1.18E-08 -8.71E-09 -6.50E-08 PASS 6.50E-08 PASS 1.60E-09 3.72E-09 1.18E-08 -8.59E-09 -6.50E-08 PASS 6.50E-08 PASS 1.69E-09 3.91E-09 1.24E-08 -9.04E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 253 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.122. Plot of Input Offset Current4_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 254 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.122. Raw data for Input Offset Current4_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current4_2 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 7.70E-09 1.74E-09 -1.24E-09 8.97E-09 -3.39E-09 2.62E-09 3.60E-10 4.86E-09 -4.42E-09 -2.32E-09 9.80E-10 -2.42E-09 24-hr Anneal 225 6.76E-09 3.60E-10 -2.58E-09 6.97E-09 -3.22E-09 1.80E-10 -3.63E-09 3.03E-09 -6.59E-09 -5.80E-09 8.40E-10 -2.37E-09 168-hr Anneal 250 6.75E-09 3.27E-09 4.20E-10 7.39E-09 -4.00E-11 3.46E-09 -4.80E-10 4.24E-09 -3.23E-09 -4.58E-09 6.60E-10 -2.43E-09 2.08E-09 4.87E-09 1.54E-08 -1.13E-08 2.76E-09 5.43E-09 1.76E-08 -1.21E-08 1.66E-09 4.94E-09 1.52E-08 -1.19E-08 3.56E-09 3.46E-09 1.30E-08 -5.92E-09 7.64E-10 3.69E-09 1.09E-08 -9.36E-09 -6.50E-08 PASS 6.50E-08 PASS 2.20E-10 3.72E-09 1.04E-08 -9.97E-09 -6.50E-08 PASS 6.50E-08 PASS -2.56E-09 4.08E-09 8.63E-09 -1.38E-08 -6.50E-08 PASS 6.50E-08 PASS -1.18E-10 3.92E-09 1.06E-08 -1.09E-08 -6.50E-08 PASS 6.50E-08 PASS 0 6.67E-09 4.31E-09 1.88E-09 6.71E-09 1.09E-09 4.02E-09 -3.00E-10 4.67E-09 -1.00E-09 -3.25E-09 1.37E-09 -2.22E-09 Total 20 6.65E-09 3.29E-09 6.80E-10 6.85E-09 -4.30E-10 4.17E-09 -3.60E-10 4.77E-09 -2.00E-09 -3.56E-09 1.31E-09 -2.27E-09 Dose (krad(Si)) 50 100 5.87E-09 6.08E-09 2.96E-09 -2.19E-09 -4.20E-10 4.00E-11 6.85E-09 8.41E-09 -7.40E-10 -1.95E-09 4.30E-09 4.08E-09 -4.20E-10 6.10E-10 4.25E-09 4.84E-09 -3.17E-09 -3.44E-09 -4.47E-09 -2.27E-09 1.25E-09 1.07E-09 -2.29E-09 -2.39E-09 4.13E-09 2.62E-09 1.13E-08 -3.05E-09 3.41E-09 3.34E-09 1.26E-08 -5.74E-09 2.90E-09 3.49E-09 1.25E-08 -6.66E-09 8.28E-10 3.40E-09 1.01E-08 -8.49E-09 -6.50E-08 PASS 6.50E-08 PASS 6.04E-10 3.71E-09 1.08E-08 -9.57E-09 -6.50E-08 PASS 6.50E-08 PASS 9.80E-11 4.08E-09 1.13E-08 -1.11E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 255 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.123. Plot of Input Offset Current4_3 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 256 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.123. Raw data for Input Offset Current4_3 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current4_3 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -7.26E-09 -4.66E-09 -6.40E-10 -4.35E-09 -2.30E-10 8.55E-09 5.22E-09 -7.20E-10 1.88E-09 -2.70E-10 8.30E-10 -3.10E-09 24-hr Anneal 225 -8.67E-09 -4.47E-09 -2.84E-09 -5.67E-09 -7.60E-10 4.01E-09 1.15E-09 -2.48E-09 -1.77E-09 -3.58E-09 7.80E-10 -3.22E-09 168-hr Anneal 250 -6.76E-09 -3.27E-09 -4.60E-10 -4.51E-09 6.20E-10 2.71E-09 2.25E-09 1.37E-09 -2.43E-09 -7.40E-10 6.60E-10 -3.31E-09 -3.81E-09 3.43E-09 5.60E-09 -1.32E-08 -3.43E-09 2.96E-09 4.69E-09 -1.15E-08 -4.48E-09 2.98E-09 3.69E-09 -1.27E-08 -2.88E-09 3.00E-09 5.35E-09 -1.11E-08 2.56E-09 3.53E-09 1.22E-08 -7.11E-09 -6.50E-08 PASS 6.50E-08 PASS 2.93E-09 3.92E-09 1.37E-08 -7.82E-09 -6.50E-08 PASS 6.50E-08 PASS -5.34E-10 3.09E-09 7.93E-09 -8.99E-09 -6.50E-08 PASS 6.50E-08 PASS 6.32E-10 2.16E-09 6.57E-09 -5.30E-09 -6.50E-08 PASS 6.50E-08 PASS 0 -6.58E-09 -3.53E-09 -3.50E-10 -3.49E-09 8.90E-10 3.59E-09 2.40E-09 2.73E-09 -1.22E-09 -4.00E-11 1.34E-09 -2.84E-09 Total 20 -7.56E-09 -2.55E-09 -4.30E-10 -4.13E-09 6.30E-10 3.43E-09 3.03E-09 1.95E-09 -1.24E-09 -2.40E-10 1.28E-09 -2.76E-09 Dose (krad(Si)) 50 100 -7.26E-09 -7.81E-09 -8.80E-10 -6.13E-09 -9.50E-10 -1.54E-09 -5.17E-09 -4.26E-09 7.30E-10 7.00E-10 4.41E-09 7.39E-09 3.48E-09 5.14E-09 1.73E-09 6.00E-10 -1.45E-09 6.20E-10 -9.00E-10 -9.30E-10 1.22E-09 1.05E-09 -2.79E-09 -3.00E-09 -2.61E-09 2.95E-09 5.47E-09 -1.07E-08 -2.81E-09 3.24E-09 6.06E-09 -1.17E-08 -2.71E-09 3.36E-09 6.49E-09 -1.19E-08 1.49E-09 2.03E-09 7.05E-09 -4.07E-09 -6.50E-08 PASS 6.50E-08 PASS 1.39E-09 2.05E-09 7.00E-09 -4.22E-09 -6.50E-08 PASS 6.50E-08 PASS 1.45E-09 2.59E-09 8.56E-09 -5.66E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 257 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.124. Plot of Input Offset Current4_4 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 258 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.124. Raw data for Input Offset Current4_4 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current4_4 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 1.36E-09 9.50E-10 -2.91E-09 4.82E-09 -2.17E-09 4.38E-09 3.03E-09 5.50E-10 4.33E-09 4.48E-09 1.27E-09 -4.04E-09 24-hr Anneal 225 4.40E-10 -5.80E-10 -3.49E-09 1.51E-09 -3.87E-09 4.90E-10 1.23E-09 -1.45E-09 1.91E-09 3.03E-09 1.15E-09 -4.10E-09 168-hr Anneal 250 6.70E-10 5.70E-10 -2.31E-09 3.48E-09 -3.80E-10 1.62E-09 4.09E-09 3.17E-09 8.60E-10 3.00E-09 1.07E-09 -4.24E-09 -1.94E-10 2.90E-09 7.76E-09 -8.15E-09 4.10E-10 3.10E-09 8.90E-09 -8.08E-09 -1.20E-09 2.39E-09 5.35E-09 -7.74E-09 4.06E-10 2.09E-09 6.15E-09 -5.34E-09 3.32E-09 9.55E-10 5.94E-09 7.02E-10 -6.50E-08 PASS 6.50E-08 PASS 3.35E-09 1.68E-09 7.95E-09 -1.24E-09 -6.50E-08 PASS 6.50E-08 PASS 1.04E-09 1.68E-09 5.64E-09 -3.56E-09 -6.50E-08 PASS 6.50E-08 PASS 2.55E-09 1.29E-09 6.09E-09 -9.95E-10 -6.50E-08 PASS 6.50E-08 PASS 0 8.90E-10 2.07E-09 -1.09E-09 3.39E-09 -1.90E-10 2.09E-09 4.64E-09 4.61E-09 1.44E-09 3.48E-09 1.74E-09 -3.74E-09 Total 20 9.20E-10 2.39E-09 -1.80E-09 2.91E-09 5.50E-10 2.49E-09 4.86E-09 4.04E-09 1.10E-09 3.70E-09 1.62E-09 -3.81E-09 Dose (krad(Si)) 50 100 1.67E-09 1.70E-09 1.17E-09 -2.53E-09 -3.31E-09 -3.30E-09 1.54E-09 3.66E-09 -1.10E-10 -5.00E-10 4.09E-09 3.82E-09 4.34E-09 4.31E-09 3.04E-09 2.02E-09 1.88E-09 2.63E-09 3.11E-09 3.82E-09 1.50E-09 1.37E-09 -3.91E-09 -3.92E-09 1.01E-09 1.78E-09 5.89E-09 -3.86E-09 9.94E-10 1.85E-09 6.06E-09 -4.07E-09 1.92E-10 2.08E-09 5.90E-09 -5.51E-09 3.25E-09 1.45E-09 7.24E-09 -7.35E-10 -6.50E-08 PASS 6.50E-08 PASS 3.24E-09 1.47E-09 7.26E-09 -7.87E-10 -6.50E-08 PASS 6.50E-08 PASS 3.29E-09 9.78E-10 5.97E-09 6.10E-10 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 259 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.125. Plot of +Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 260 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.125. Raw data for +Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.72E-07 -4.55E-07 -4.65E-07 -4.64E-07 -4.58E-07 -5.06E-07 -4.85E-07 -4.50E-07 -4.48E-07 -4.55E-07 -3.60E-07 -3.77E-07 24-hr Anneal 225 -4.42E-07 -4.26E-07 -4.35E-07 -4.31E-07 -4.27E-07 -4.96E-07 -4.74E-07 -4.39E-07 -4.43E-07 -4.48E-07 -3.60E-07 -3.84E-07 168-hr Anneal 250 -4.03E-07 -3.90E-07 -3.97E-07 -3.93E-07 -3.91E-07 -4.32E-07 -4.22E-07 -3.86E-07 -3.89E-07 -3.96E-07 -3.60E-07 -3.82E-07 -4.32E-07 7.37E-09 -4.12E-07 -4.52E-07 -4.63E-07 6.60E-09 -4.45E-07 -4.81E-07 -4.32E-07 6.65E-09 -4.14E-07 -4.50E-07 -3.95E-07 5.22E-09 -3.81E-07 -4.09E-07 -4.30E-07 2.45E-08 -3.63E-07 -4.97E-07 -8.50E-07 PASS 8.50E-07 PASS -4.69E-07 2.57E-08 -3.99E-07 -5.39E-07 -9.00E-07 PASS 9.00E-07 PASS -4.60E-07 2.42E-08 -3.93E-07 -5.26E-07 -9.00E-07 PASS 9.00E-07 PASS -4.05E-07 2.09E-08 -3.48E-07 -4.62E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.82E-07 -3.74E-07 -3.77E-07 -3.68E-07 -3.70E-07 -3.94E-07 -3.86E-07 -3.47E-07 -3.50E-07 -3.57E-07 -3.59E-07 -3.80E-07 Total 20 -4.03E-07 -3.92E-07 -3.97E-07 -3.88E-07 -3.90E-07 -4.10E-07 -4.01E-07 -3.64E-07 -3.68E-07 -3.75E-07 -3.60E-07 -3.82E-07 Dose (krad(Si)) 50 100 -4.19E-07 -4.43E-07 -4.06E-07 -4.27E-07 -4.16E-07 -4.37E-07 -4.09E-07 -4.28E-07 -4.06E-07 -4.27E-07 -4.33E-07 -4.63E-07 -4.22E-07 -4.49E-07 -3.84E-07 -4.11E-07 -3.89E-07 -4.09E-07 -3.93E-07 -4.18E-07 -3.58E-07 -3.61E-07 -3.77E-07 -3.79E-07 -3.74E-07 5.40E-09 -3.59E-07 -3.89E-07 -3.94E-07 6.18E-09 -3.77E-07 -4.11E-07 -4.11E-07 5.86E-09 -3.95E-07 -4.27E-07 -3.67E-07 2.18E-08 -3.07E-07 -4.27E-07 -6.50E-07 PASS 6.50E-07 PASS -3.84E-07 2.07E-08 -3.27E-07 -4.41E-07 -7.50E-07 PASS 7.50E-07 PASS -4.04E-07 2.18E-08 -3.44E-07 -4.64E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 261 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.126. Plot of +Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 262 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.126. Raw data for +Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.61E-07 -4.62E-07 -4.59E-07 -4.33E-07 -4.59E-07 -4.62E-07 -4.63E-07 -4.48E-07 -4.60E-07 -4.69E-07 -3.49E-07 -3.65E-07 24-hr Anneal 225 -4.26E-07 -4.30E-07 -4.28E-07 -4.05E-07 -4.26E-07 -4.53E-07 -4.53E-07 -4.33E-07 -4.49E-07 -4.60E-07 -3.49E-07 -3.65E-07 168-hr Anneal 250 -3.89E-07 -3.92E-07 -3.90E-07 -3.71E-07 -3.87E-07 -4.00E-07 -4.04E-07 -3.84E-07 -3.96E-07 -4.08E-07 -3.50E-07 -3.65E-07 -4.24E-07 1.06E-08 -3.95E-07 -4.53E-07 -4.55E-07 1.23E-08 -4.21E-07 -4.89E-07 -4.23E-07 1.01E-08 -3.95E-07 -4.51E-07 -3.86E-07 8.42E-09 -3.63E-07 -4.09E-07 -4.21E-07 9.73E-09 -3.94E-07 -4.47E-07 -8.50E-07 PASS 8.50E-07 PASS -4.60E-07 7.87E-09 -4.39E-07 -4.82E-07 -9.00E-07 PASS 9.00E-07 PASS -4.50E-07 9.96E-09 -4.22E-07 -4.77E-07 -9.00E-07 PASS 9.00E-07 PASS -3.98E-07 9.35E-09 -3.73E-07 -4.24E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.65E-07 -3.70E-07 -3.69E-07 -3.51E-07 -3.67E-07 -3.63E-07 -3.67E-07 -3.37E-07 -3.57E-07 -3.71E-07 -3.49E-07 -3.65E-07 Total 20 -3.87E-07 -3.91E-07 -3.91E-07 -3.68E-07 -3.87E-07 -3.79E-07 -3.85E-07 -3.61E-07 -3.73E-07 -3.87E-07 -3.48E-07 -3.65E-07 Dose (krad(Si)) 50 100 -4.06E-07 -4.29E-07 -4.11E-07 -4.30E-07 -4.10E-07 -4.30E-07 -3.87E-07 -4.05E-07 -4.06E-07 -4.27E-07 -3.98E-07 -4.23E-07 -4.01E-07 -4.28E-07 -3.81E-07 -4.06E-07 -3.93E-07 -4.15E-07 -4.07E-07 -4.30E-07 -3.48E-07 -3.48E-07 -3.64E-07 -3.64E-07 -3.64E-07 7.78E-09 -3.43E-07 -3.86E-07 -3.85E-07 9.40E-09 -3.59E-07 -4.10E-07 -4.04E-07 9.87E-09 -3.77E-07 -4.31E-07 -3.59E-07 1.35E-08 -3.22E-07 -3.96E-07 -6.50E-07 PASS 6.50E-07 PASS -3.77E-07 1.03E-08 -3.49E-07 -4.05E-07 -7.50E-07 PASS 7.50E-07 PASS -3.96E-07 9.74E-09 -3.69E-07 -4.23E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 263 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.127. Plot of +Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 264 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.127. Raw data for +Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.61E-07 -4.60E-07 -4.58E-07 -4.60E-07 -4.50E-07 -4.64E-07 -4.63E-07 -4.43E-07 -4.56E-07 -4.76E-07 -3.48E-07 -3.67E-07 24-hr Anneal 225 -4.30E-07 -4.33E-07 -4.30E-07 -4.27E-07 -4.18E-07 -4.55E-07 -4.53E-07 -4.35E-07 -4.48E-07 -4.67E-07 -3.48E-07 -3.67E-07 168-hr Anneal 250 -3.94E-07 -3.97E-07 -3.90E-07 -3.86E-07 -3.85E-07 -4.02E-07 -4.02E-07 -3.84E-07 -3.98E-07 -4.13E-07 -3.48E-07 -3.68E-07 -4.29E-07 5.62E-09 -4.13E-07 -4.44E-07 -4.58E-07 4.46E-09 -4.46E-07 -4.70E-07 -4.27E-07 5.39E-09 -4.13E-07 -4.42E-07 -3.90E-07 5.25E-09 -3.76E-07 -4.05E-07 -4.24E-07 1.04E-08 -3.95E-07 -4.52E-07 -8.50E-07 PASS 8.50E-07 PASS -4.61E-07 1.20E-08 -4.28E-07 -4.94E-07 -9.00E-07 PASS 9.00E-07 PASS -4.51E-07 1.13E-08 -4.21E-07 -4.82E-07 -9.00E-07 PASS 9.00E-07 PASS -4.00E-07 1.03E-08 -3.71E-07 -4.28E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.72E-07 -3.76E-07 -3.73E-07 -3.63E-07 -3.64E-07 -3.62E-07 -3.67E-07 -3.46E-07 -3.62E-07 -3.77E-07 -3.41E-07 -3.63E-07 Total 20 -3.93E-07 -3.95E-07 -3.93E-07 -3.84E-07 -3.82E-07 -3.80E-07 -3.81E-07 -3.63E-07 -3.77E-07 -3.92E-07 -3.41E-07 -3.67E-07 Dose (krad(Si)) 50 100 -4.09E-07 -4.33E-07 -4.11E-07 -4.33E-07 -4.11E-07 -4.30E-07 -4.05E-07 -4.27E-07 -4.00E-07 -4.20E-07 -4.00E-07 -4.26E-07 -4.01E-07 -4.27E-07 -3.82E-07 -4.09E-07 -3.96E-07 -4.19E-07 -4.13E-07 -4.37E-07 -3.45E-07 -3.41E-07 -3.65E-07 -3.66E-07 -3.69E-07 5.43E-09 -3.55E-07 -3.84E-07 -3.89E-07 6.00E-09 -3.73E-07 -4.06E-07 -4.07E-07 4.56E-09 -3.95E-07 -4.20E-07 -3.63E-07 1.12E-08 -3.32E-07 -3.94E-07 -6.50E-07 PASS 6.50E-07 PASS -3.79E-07 1.06E-08 -3.50E-07 -4.08E-07 -7.50E-07 PASS 7.50E-07 PASS -3.98E-07 1.15E-08 -3.67E-07 -4.30E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 265 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.128. Plot of +Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 266 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.128. Raw data for +Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -4.91E-07 -4.60E-07 -4.72E-07 -4.52E-07 -4.61E-07 -4.88E-07 -4.93E-07 -4.58E-07 -4.53E-07 -4.61E-07 -3.61E-07 -3.74E-07 24-hr Anneal 225 -4.55E-07 -4.28E-07 -4.38E-07 -4.27E-07 -4.29E-07 -4.80E-07 -4.80E-07 -4.48E-07 -4.43E-07 -4.54E-07 -3.61E-07 -3.74E-07 168-hr Anneal 250 -4.15E-07 -3.92E-07 -4.00E-07 -3.90E-07 -3.92E-07 -4.23E-07 -4.26E-07 -3.91E-07 -3.95E-07 -4.01E-07 -3.62E-07 -3.74E-07 -4.36E-07 1.32E-08 -4.00E-07 -4.73E-07 -4.67E-07 1.49E-08 -4.26E-07 -5.08E-07 -4.36E-07 1.18E-08 -4.03E-07 -4.68E-07 -3.98E-07 1.02E-08 -3.70E-07 -4.26E-07 -4.31E-07 1.86E-08 -3.80E-07 -4.82E-07 -8.50E-07 PASS 8.50E-07 PASS -4.71E-07 1.85E-08 -4.20E-07 -5.21E-07 -9.00E-07 PASS 9.00E-07 PASS -4.61E-07 1.80E-08 -4.12E-07 -5.10E-07 -9.00E-07 PASS 9.00E-07 PASS -4.07E-07 1.63E-08 -3.63E-07 -4.52E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.88E-07 -3.72E-07 -3.76E-07 -3.70E-07 -3.69E-07 -3.88E-07 -3.87E-07 -3.50E-07 -3.57E-07 -3.65E-07 -3.60E-07 -3.72E-07 Total 20 -4.11E-07 -3.91E-07 -3.99E-07 -3.89E-07 -3.87E-07 -4.02E-07 -4.04E-07 -3.68E-07 -3.73E-07 -3.81E-07 -3.60E-07 -3.73E-07 Dose (krad(Si)) 50 100 -4.30E-07 -4.58E-07 -4.10E-07 -4.30E-07 -4.19E-07 -4.40E-07 -4.05E-07 -4.25E-07 -4.06E-07 -4.29E-07 -4.22E-07 -4.49E-07 -4.24E-07 -4.53E-07 -3.89E-07 -4.19E-07 -3.90E-07 -4.12E-07 -3.99E-07 -4.23E-07 -3.59E-07 -3.60E-07 -3.74E-07 -3.73E-07 -3.75E-07 7.72E-09 -3.54E-07 -3.96E-07 -3.96E-07 9.61E-09 -3.69E-07 -4.22E-07 -4.14E-07 1.07E-08 -3.85E-07 -4.44E-07 -3.69E-07 1.73E-08 -3.22E-07 -4.17E-07 -6.50E-07 PASS 6.50E-07 PASS -3.86E-07 1.65E-08 -3.41E-07 -4.31E-07 -7.50E-07 PASS 7.50E-07 PASS -4.05E-07 1.69E-08 -3.59E-07 -4.51E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 267 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.129. Plot of -Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 268 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.129. Raw data for -Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.26E-07 4.50E-07 4.13E-07 4.28E-07 4.20E-07 4.40E-07 4.15E-07 4.35E-07 4.14E-07 4.35E-07 4.39E-07 4.68E-07 4.20E-07 4.47E-07 3.90E-07 4.17E-07 3.91E-07 4.15E-07 4.02E-07 4.26E-07 3.59E-07 3.60E-07 3.73E-07 3.73E-07 200 4.82E-07 4.64E-07 4.68E-07 4.71E-07 4.66E-07 5.14E-07 4.86E-07 4.56E-07 4.56E-07 4.64E-07 3.60E-07 3.74E-07 24-hr Anneal 225 4.47E-07 4.32E-07 4.37E-07 4.35E-07 4.31E-07 4.98E-07 4.72E-07 4.44E-07 4.43E-07 4.53E-07 3.61E-07 3.76E-07 168-hr Anneal 250 4.11E-07 3.94E-07 4.02E-07 3.95E-07 3.98E-07 4.39E-07 4.21E-07 3.92E-07 3.94E-07 4.02E-07 3.62E-07 3.74E-07 0 3.89E-07 3.75E-07 3.81E-07 3.74E-07 3.77E-07 3.99E-07 3.84E-07 3.53E-07 3.55E-07 3.67E-07 3.61E-07 3.75E-07 Total 20 4.09E-07 3.99E-07 4.02E-07 3.94E-07 3.95E-07 4.18E-07 4.01E-07 3.68E-07 3.71E-07 3.82E-07 3.60E-07 3.78E-07 3.79E-07 5.84E-09 3.95E-07 3.63E-07 4.00E-07 5.92E-09 4.16E-07 3.84E-07 4.18E-07 5.44E-09 4.33E-07 4.03E-07 4.38E-07 8.31E-09 4.60E-07 4.15E-07 4.70E-07 7.27E-09 4.90E-07 4.50E-07 4.37E-07 6.48E-09 4.54E-07 4.19E-07 4.00E-07 6.91E-09 4.19E-07 3.81E-07 3.72E-07 1.98E-08 4.26E-07 3.17E-07 -6.50E-07 PASS 6.50E-07 PASS 3.88E-07 2.11E-08 4.46E-07 3.30E-07 -7.50E-07 PASS 7.50E-07 PASS 4.09E-07 2.09E-08 4.66E-07 3.51E-07 -8.00E-07 PASS 8.00E-07 PASS 4.34E-07 2.27E-08 4.97E-07 3.72E-07 -8.50E-07 PASS 8.50E-07 PASS 4.75E-07 2.48E-08 5.43E-07 4.07E-07 -9.00E-07 PASS 9.00E-07 PASS 4.62E-07 2.33E-08 5.26E-07 3.98E-07 -9.00E-07 PASS 9.00E-07 PASS 4.10E-07 1.97E-08 4.64E-07 3.55E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 269 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.130. Plot of -Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 270 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.130. Raw data for -Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.16E-07 4.39E-07 4.16E-07 4.32E-07 4.13E-07 4.33E-07 3.94E-07 4.15E-07 4.08E-07 4.27E-07 4.06E-07 4.30E-07 4.07E-07 4.30E-07 3.89E-07 4.14E-07 3.93E-07 4.15E-07 4.05E-07 4.31E-07 3.51E-07 3.52E-07 3.65E-07 3.65E-07 200 4.71E-07 4.68E-07 4.62E-07 4.46E-07 4.59E-07 4.68E-07 4.67E-07 4.52E-07 4.58E-07 4.70E-07 3.53E-07 3.65E-07 24-hr Anneal 225 4.37E-07 4.33E-07 4.29E-07 4.15E-07 4.26E-07 4.56E-07 4.55E-07 4.40E-07 4.45E-07 4.59E-07 3.53E-07 3.66E-07 168-hr Anneal 250 3.98E-07 3.98E-07 3.94E-07 3.82E-07 3.91E-07 4.05E-07 4.05E-07 3.91E-07 3.95E-07 4.07E-07 3.54E-07 3.67E-07 0 3.75E-07 3.78E-07 3.74E-07 3.60E-07 3.69E-07 3.69E-07 3.69E-07 3.50E-07 3.59E-07 3.69E-07 3.52E-07 3.65E-07 Total 20 3.98E-07 3.97E-07 3.95E-07 3.78E-07 3.89E-07 3.86E-07 3.88E-07 3.69E-07 3.75E-07 3.86E-07 3.52E-07 3.66E-07 3.71E-07 7.11E-09 3.91E-07 3.52E-07 3.91E-07 8.03E-09 4.13E-07 3.69E-07 4.10E-07 9.05E-09 4.34E-07 3.85E-07 4.30E-07 8.91E-09 4.54E-07 4.05E-07 4.61E-07 1.00E-08 4.88E-07 4.34E-07 4.28E-07 8.33E-09 4.51E-07 4.05E-07 3.92E-07 6.70E-09 4.11E-07 3.74E-07 3.63E-07 8.55E-09 3.87E-07 3.40E-07 -6.50E-07 PASS 6.50E-07 PASS 3.81E-07 8.70E-09 4.05E-07 3.57E-07 -7.50E-07 PASS 7.50E-07 PASS 4.00E-07 8.04E-09 4.22E-07 3.78E-07 -8.00E-07 PASS 8.00E-07 PASS 4.24E-07 8.80E-09 4.48E-07 4.00E-07 -8.50E-07 PASS 8.50E-07 PASS 4.63E-07 7.72E-09 4.84E-07 4.42E-07 -9.00E-07 PASS 9.00E-07 PASS 4.51E-07 7.86E-09 4.73E-07 4.30E-07 -9.00E-07 PASS 9.00E-07 PASS 4.01E-07 7.26E-09 4.20E-07 3.81E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 271 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.131. Plot of -Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 272 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.131. Raw data for -Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.06E-07 4.29E-07 4.14E-07 4.28E-07 4.12E-07 4.31E-07 4.03E-07 4.26E-07 4.05E-07 4.25E-07 4.08E-07 4.34E-07 4.05E-07 4.33E-07 3.88E-07 4.13E-07 3.96E-07 4.22E-07 4.15E-07 4.38E-07 3.50E-07 3.51E-07 3.66E-07 3.66E-07 200 4.56E-07 4.60E-07 4.62E-07 4.58E-07 4.53E-07 4.75E-07 4.70E-07 4.46E-07 4.61E-07 4.78E-07 3.52E-07 3.66E-07 24-hr Anneal 225 4.25E-07 4.33E-07 4.29E-07 4.24E-07 4.21E-07 4.61E-07 4.57E-07 4.37E-07 4.50E-07 4.67E-07 3.51E-07 3.66E-07 168-hr Anneal 250 3.90E-07 3.95E-07 3.95E-07 3.84E-07 3.87E-07 4.08E-07 4.07E-07 3.89E-07 3.99E-07 4.15E-07 3.52E-07 3.68E-07 0 3.68E-07 3.78E-07 3.74E-07 3.62E-07 3.69E-07 3.71E-07 3.72E-07 3.52E-07 3.63E-07 3.79E-07 3.50E-07 3.66E-07 Total 20 3.87E-07 3.95E-07 3.95E-07 3.82E-07 3.88E-07 3.87E-07 3.88E-07 3.69E-07 3.79E-07 3.95E-07 3.50E-07 3.66E-07 3.70E-07 6.01E-09 3.87E-07 3.54E-07 3.89E-07 5.73E-09 4.05E-07 3.74E-07 4.08E-07 4.96E-09 4.21E-07 3.94E-07 4.28E-07 2.34E-09 4.34E-07 4.21E-07 4.58E-07 3.36E-09 4.67E-07 4.48E-07 4.26E-07 4.62E-09 4.39E-07 4.14E-07 3.90E-07 4.71E-09 4.03E-07 3.77E-07 3.68E-07 1.02E-08 3.96E-07 3.40E-07 -6.50E-07 PASS 6.50E-07 PASS 3.83E-07 9.84E-09 4.10E-07 3.56E-07 -7.50E-07 PASS 7.50E-07 PASS 4.02E-07 1.07E-08 4.32E-07 3.73E-07 -8.00E-07 PASS 8.00E-07 PASS 4.28E-07 1.04E-08 4.56E-07 3.99E-07 -8.50E-07 PASS 8.50E-07 PASS 4.66E-07 1.27E-08 5.01E-07 4.31E-07 -9.00E-07 PASS 9.00E-07 PASS 4.54E-07 1.15E-08 4.86E-07 4.23E-07 -9.00E-07 PASS 9.00E-07 PASS 4.04E-07 9.76E-09 4.30E-07 3.77E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 273 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.132. Plot of -Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 274 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.132. Raw data for -Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.36E-07 4.62E-07 4.14E-07 4.31E-07 4.18E-07 4.40E-07 4.12E-07 4.34E-07 4.10E-07 4.32E-07 4.29E-07 4.55E-07 4.30E-07 4.59E-07 3.95E-07 4.22E-07 3.95E-07 4.17E-07 4.05E-07 4.29E-07 3.64E-07 3.65E-07 3.74E-07 3.73E-07 200 4.95E-07 4.65E-07 4.72E-07 4.63E-07 4.62E-07 4.95E-07 4.98E-07 4.60E-07 4.59E-07 4.68E-07 3.65E-07 3.74E-07 24-hr Anneal 225 4.57E-07 4.31E-07 4.38E-07 4.31E-07 4.28E-07 4.83E-07 4.86E-07 4.49E-07 4.47E-07 4.57E-07 3.64E-07 3.73E-07 168-hr Anneal 250 4.17E-07 3.94E-07 4.00E-07 3.97E-07 3.93E-07 4.28E-07 4.32E-07 3.97E-07 3.99E-07 4.07E-07 3.66E-07 3.73E-07 0 3.91E-07 3.76E-07 3.77E-07 3.78E-07 3.71E-07 3.92E-07 3.95E-07 3.58E-07 3.60E-07 3.71E-07 3.65E-07 3.73E-07 Total 20 4.15E-07 3.95E-07 4.01E-07 3.96E-07 3.91E-07 4.08E-07 4.12E-07 3.76E-07 3.75E-07 3.87E-07 3.65E-07 3.73E-07 3.79E-07 7.61E-09 4.00E-07 3.58E-07 3.99E-07 9.35E-09 4.25E-07 3.74E-07 4.18E-07 1.04E-08 4.47E-07 3.90E-07 4.40E-07 1.30E-08 4.75E-07 4.04E-07 4.72E-07 1.39E-08 5.10E-07 4.33E-07 4.37E-07 1.17E-08 4.69E-07 4.05E-07 4.00E-07 9.87E-09 4.27E-07 3.73E-07 3.75E-07 1.75E-08 4.23E-07 3.27E-07 -6.50E-07 PASS 6.50E-07 PASS 3.91E-07 1.74E-08 4.39E-07 3.44E-07 -7.50E-07 PASS 7.50E-07 PASS 4.11E-07 1.76E-08 4.59E-07 3.62E-07 -8.00E-07 PASS 8.00E-07 PASS 4.37E-07 1.94E-08 4.90E-07 3.83E-07 -8.50E-07 PASS 8.50E-07 PASS 4.76E-07 1.89E-08 5.28E-07 4.24E-07 -9.00E-07 PASS 9.00E-07 PASS 4.64E-07 1.85E-08 5.15E-07 4.14E-07 -9.00E-07 PASS 9.00E-07 PASS 4.13E-07 1.65E-08 4.58E-07 3.67E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 275 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.133. Plot of Input Offset Voltage5_1 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 276 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.133. Raw data for Input Offset Voltage5_1 5V (V) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage5_1 5V (V) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 5.69E-04 1.45E-04 1.23E-04 2.08E-04 2.32E-04 1.57E-04 -4.46E-05 3.90E-04 4.56E-05 2.45E-04 2.97E-04 9.42E-05 24-hr Anneal 225 5.58E-04 1.34E-04 1.32E-04 2.01E-04 2.21E-04 1.59E-04 -4.87E-05 3.84E-04 4.70E-05 2.44E-04 2.94E-04 9.28E-05 168-hr Anneal 250 5.14E-04 1.21E-04 1.17E-04 1.63E-04 1.94E-04 1.73E-04 -7.88E-05 3.99E-04 3.37E-05 2.30E-04 2.97E-04 9.39E-05 2.50E-04 1.74E-04 7.29E-04 -2.28E-04 2.55E-04 1.81E-04 7.51E-04 -2.40E-04 2.49E-04 1.77E-04 7.35E-04 -2.36E-04 2.22E-04 1.66E-04 6.77E-04 -2.34E-04 1.63E-04 1.71E-04 6.30E-04 -3.05E-04 -9.50E-04 PASS 9.50E-04 PASS 1.59E-04 1.70E-04 6.24E-04 -3.07E-04 -9.50E-04 PASS 9.50E-04 PASS 1.57E-04 1.69E-04 6.19E-04 -3.05E-04 -9.50E-04 PASS 9.50E-04 PASS 1.51E-04 1.84E-04 6.55E-04 -3.52E-04 -9.50E-04 PASS 9.50E-04 PASS 0 5.43E-04 1.29E-04 1.57E-04 1.95E-04 2.12E-04 2.14E-04 -2.80E-05 4.11E-04 6.51E-05 2.73E-04 2.89E-04 9.59E-05 Total 20 5.35E-04 1.27E-04 1.43E-04 1.88E-04 2.07E-04 1.94E-04 -3.85E-05 3.95E-04 5.25E-05 2.60E-04 2.96E-04 9.48E-05 Dose (krad(Si)) 50 100 5.46E-04 5.56E-04 1.36E-04 1.47E-04 1.37E-04 1.33E-04 1.91E-04 1.98E-04 2.09E-04 2.19E-04 1.84E-04 1.71E-04 -4.41E-05 -4.74E-05 3.94E-04 3.92E-04 4.88E-05 5.08E-05 2.54E-04 2.47E-04 2.95E-04 2.96E-04 9.54E-05 9.52E-05 2.47E-04 1.68E-04 7.09E-04 -2.15E-04 2.40E-04 1.68E-04 7.01E-04 -2.21E-04 2.44E-04 1.72E-04 7.15E-04 -2.27E-04 1.87E-04 1.73E-04 6.61E-04 -2.87E-04 -8.00E-04 PASS 8.00E-04 PASS 1.73E-04 1.71E-04 6.41E-04 -2.95E-04 -9.50E-04 PASS 9.50E-04 PASS 1.67E-04 1.72E-04 6.38E-04 -3.04E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 277 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.134. Plot of Input Offset Voltage5_2 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 278 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.134. Raw data for Input Offset Voltage5_2 5V (V) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage5_2 5V (V) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.74E-04 1.59E-04 2.27E-04 2.50E-04 1.01E-04 1.69E-04 -1.74E-05 3.41E-04 -3.70E-05 -1.20E-04 1.81E-04 1.81E-04 24-hr Anneal 225 3.68E-04 1.53E-04 2.28E-04 2.55E-04 1.00E-04 1.70E-04 -1.23E-05 3.40E-04 -3.83E-05 -1.21E-04 1.83E-04 1.84E-04 168-hr Anneal 250 3.28E-04 1.35E-04 2.18E-04 2.42E-04 1.21E-04 1.66E-04 -3.24E-05 3.23E-04 -4.71E-05 -1.28E-04 1.84E-04 1.84E-04 2.21E-04 9.80E-05 4.89E-04 -4.80E-05 2.22E-04 1.03E-04 5.06E-04 -6.15E-05 2.21E-04 1.03E-04 5.02E-04 -6.06E-05 2.09E-04 8.44E-05 4.40E-04 -2.24E-05 7.23E-05 1.87E-04 5.84E-04 -4.40E-04 -9.50E-04 PASS 9.50E-04 PASS 6.72E-05 1.86E-04 5.77E-04 -4.42E-04 -9.50E-04 PASS 9.50E-04 PASS 6.76E-05 1.86E-04 5.77E-04 -4.42E-04 -9.50E-04 PASS 9.50E-04 PASS 5.64E-05 1.84E-04 5.61E-04 -4.48E-04 -9.50E-04 PASS 9.50E-04 PASS 0 3.40E-04 1.53E-04 2.43E-04 2.47E-04 1.25E-04 1.91E-04 1.26E-05 3.85E-04 -1.31E-05 -9.38E-05 1.80E-04 1.82E-04 Total 20 3.42E-04 1.50E-04 2.30E-04 2.39E-04 1.09E-04 1.77E-04 -2.76E-06 3.62E-04 -2.98E-05 -1.12E-04 1.82E-04 1.82E-04 Dose (krad(Si)) 50 100 3.53E-04 3.62E-04 1.49E-04 1.61E-04 2.29E-04 2.27E-04 2.44E-04 2.52E-04 1.06E-04 1.02E-04 1.73E-04 1.72E-04 -7.26E-06 -8.70E-06 3.56E-04 3.49E-04 -3.30E-05 -3.90E-05 -1.16E-04 -1.12E-04 1.81E-04 1.81E-04 1.81E-04 1.81E-04 2.21E-04 8.54E-05 4.55E-04 -1.28E-05 2.14E-04 9.00E-05 4.61E-04 -3.30E-05 2.16E-04 9.53E-05 4.77E-04 -4.51E-05 9.65E-05 1.92E-04 6.23E-04 -4.30E-04 -8.00E-04 PASS 8.00E-04 PASS 7.88E-05 1.90E-04 6.01E-04 -4.43E-04 -9.50E-04 PASS 9.50E-04 PASS 7.48E-05 1.89E-04 5.94E-04 -4.45E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 279 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.135. Plot of Input Offset Voltage5_3 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 280 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.135. Raw data for Input Offset Voltage5_3 5V (V) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage5_3 5V (V) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -1.57E-04 -9.26E-05 3.91E-05 1.40E-04 1.81E-04 2.12E-04 3.28E-04 -9.67E-05 1.69E-04 3.72E-04 1.02E-04 2.03E-04 24-hr Anneal 225 -1.54E-04 -9.83E-05 3.42E-05 1.33E-04 1.75E-04 2.12E-04 3.26E-04 -9.33E-05 1.62E-04 3.65E-04 1.05E-04 2.05E-04 168-hr Anneal 250 -1.62E-04 -1.40E-04 -5.60E-07 9.04E-05 1.47E-04 1.96E-04 3.21E-04 -8.42E-05 1.19E-04 3.59E-04 1.02E-04 2.01E-04 1.55E-05 1.42E-04 4.05E-04 -3.74E-04 2.20E-05 1.45E-04 4.21E-04 -3.77E-04 1.79E-05 1.42E-04 4.08E-04 -3.72E-04 -1.31E-05 1.37E-04 3.62E-04 -3.88E-04 1.99E-04 1.81E-04 6.96E-04 -2.98E-04 -9.50E-04 PASS 9.50E-04 PASS 1.97E-04 1.84E-04 7.01E-04 -3.07E-04 -9.50E-04 PASS 9.50E-04 PASS 1.95E-04 1.81E-04 6.90E-04 -3.01E-04 -9.50E-04 PASS 9.50E-04 PASS 1.82E-04 1.77E-04 6.68E-04 -3.04E-04 -9.50E-04 PASS 9.50E-04 PASS 0 -1.56E-04 -1.01E-04 4.00E-05 1.32E-04 1.71E-04 2.53E-04 3.58E-04 -5.86E-05 1.83E-04 3.93E-04 9.92E-05 1.99E-04 Total 20 -1.70E-04 -1.11E-04 2.60E-05 1.22E-04 1.57E-04 2.34E-04 3.39E-04 -7.25E-05 1.68E-04 3.80E-04 9.69E-05 1.98E-04 Dose (krad(Si)) 50 100 -1.60E-04 -1.61E-04 -1.04E-04 -9.57E-05 3.13E-05 3.55E-05 1.24E-04 1.28E-04 1.62E-04 1.71E-04 2.25E-04 2.16E-04 3.33E-04 3.29E-04 -7.95E-05 -8.81E-05 1.65E-04 1.66E-04 3.74E-04 3.74E-04 9.82E-05 1.01E-04 2.00E-04 1.99E-04 1.72E-05 1.42E-04 4.08E-04 -3.73E-04 4.80E-06 1.43E-04 3.96E-04 -3.86E-04 1.07E-05 1.40E-04 3.95E-04 -3.73E-04 2.26E-04 1.79E-04 7.18E-04 -2.66E-04 -8.00E-04 PASS 8.00E-04 PASS 2.10E-04 1.79E-04 7.00E-04 -2.80E-04 -9.50E-04 PASS 9.50E-04 PASS 2.03E-04 1.79E-04 6.93E-04 -2.87E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 281 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.136. Plot of Input Offset Voltage5_4 5V (V) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 282 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.136. Raw data for Input Offset Voltage5_4 5V (V) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Voltage5_4 5V (V) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 1.72E-04 1.75E-04 3.06E-04 3.25E-04 3.04E-05 2.53E-05 2.67E-04 2.75E-04 5.21E-05 5.42E-05 3.04E-04 3.07E-04 2.05E-04 1.97E-04 1.00E-04 9.07E-05 1.04E-04 1.04E-04 1.07E-04 9.81E-05 8.06E-05 8.07E-05 1.95E-04 1.95E-04 200 1.85E-04 3.22E-04 2.25E-05 2.75E-04 5.71E-05 3.14E-04 1.93E-04 8.62E-05 1.07E-04 8.70E-05 8.18E-05 1.95E-04 24-hr Anneal 225 1.79E-04 3.17E-04 2.52E-05 2.78E-04 5.30E-05 3.06E-04 1.90E-04 8.54E-05 1.03E-04 8.88E-05 8.34E-05 1.96E-04 168-hr Anneal 250 1.61E-04 2.65E-04 7.11E-06 2.36E-04 4.27E-05 2.54E-04 1.77E-04 5.15E-05 6.89E-05 8.86E-05 8.17E-05 1.96E-04 0 1.77E-04 3.12E-04 4.86E-05 2.78E-04 6.22E-05 3.08E-04 2.32E-04 1.28E-04 1.23E-04 1.35E-04 7.89E-05 1.92E-04 Total 20 1.69E-04 3.02E-04 2.87E-05 2.66E-04 4.89E-05 2.96E-04 2.13E-04 1.08E-04 1.09E-04 1.15E-04 8.00E-05 1.93E-04 1.76E-04 1.21E-04 5.06E-04 -1.55E-04 1.63E-04 1.23E-04 5.01E-04 -1.76E-04 1.66E-04 1.24E-04 5.05E-04 -1.74E-04 1.71E-04 1.32E-04 5.32E-04 -1.91E-04 1.72E-04 1.31E-04 5.32E-04 -1.87E-04 1.70E-04 1.30E-04 5.28E-04 -1.87E-04 1.42E-04 1.15E-04 4.57E-04 -1.72E-04 1.85E-04 8.22E-05 4.11E-04 -4.02E-05 -8.00E-04 PASS 8.00E-04 PASS 1.68E-04 8.43E-05 3.99E-04 -6.30E-05 -9.50E-04 PASS 9.50E-04 PASS 1.64E-04 8.97E-05 4.10E-04 -8.19E-05 -9.50E-04 PASS 9.50E-04 PASS 1.59E-04 9.32E-05 4.15E-04 -9.63E-05 -9.50E-04 PASS 9.50E-04 PASS 1.58E-04 9.79E-05 4.26E-04 -1.11E-04 -9.50E-04 PASS 9.50E-04 PASS 1.55E-04 9.47E-05 4.14E-04 -1.05E-04 -9.50E-04 PASS 9.50E-04 PASS 1.28E-04 8.56E-05 3.63E-04 -1.07E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DLA Certified Company 283 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.137. Plot of Input Offset Current5_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 284 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.137. Raw data for Input Offset Current5_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current5_1 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.52E-09 5.13E-09 2.40E-10 5.15E-09 5.44E-09 2.28E-09 -6.81E-09 9.15E-09 -2.50E-09 1.63E-08 5.15E-09 3.49E-08 24-hr Anneal 225 -4.36E-09 4.54E-09 1.59E-09 6.17E-09 9.93E-09 5.85E-09 -3.44E-09 1.10E-08 -4.60E-10 1.78E-08 6.46E-09 3.50E-08 168-hr Anneal 250 -9.52E-09 7.90E-10 -4.02E-09 1.54E-09 5.94E-09 -2.80E-09 -1.40E-08 4.96E-09 -6.32E-09 1.01E-08 7.19E-09 3.47E-08 1.44E-09 6.49E-09 1.92E-08 -1.64E-08 1.89E-09 5.18E-09 1.61E-08 -1.23E-08 3.57E-09 5.36E-09 1.83E-08 -1.11E-08 -1.05E-09 5.91E-09 1.51E-08 -1.72E-08 2.45E-09 1.01E-08 3.00E-08 -2.52E-08 -6.50E-08 PASS 6.50E-08 PASS 3.67E-09 9.19E-09 2.89E-08 -2.15E-08 -6.50E-08 PASS 6.50E-08 PASS 6.13E-09 8.57E-09 2.96E-08 -1.74E-08 -6.50E-08 PASS 6.50E-08 PASS -1.61E-09 9.42E-09 2.42E-08 -2.75E-08 -6.50E-08 PASS 6.50E-08 PASS 0 -8.32E-09 3.00E-10 -2.15E-09 2.83E-09 5.96E-09 -4.55E-09 -1.30E-08 5.82E-09 -5.32E-09 8.29E-09 1.92E-09 3.49E-08 Total 20 -7.60E-09 2.34E-09 -2.22E-09 3.69E-09 6.29E-09 -2.14E-09 -1.09E-08 6.56E-09 -5.97E-09 9.69E-09 2.98E-09 3.49E-08 Dose (krad(Si)) 50 100 -7.53E-09 -7.54E-09 2.28E-09 7.27E-09 -3.05E-09 -3.08E-09 4.17E-09 3.85E-09 6.44E-09 6.68E-09 3.20E-10 -8.00E-11 -9.84E-09 -9.70E-09 7.79E-09 9.28E-09 -3.88E-09 -2.96E-09 1.15E-08 1.57E-08 3.27E-09 4.20E-09 3.50E-08 3.49E-08 -2.76E-10 5.41E-09 1.46E-08 -1.51E-08 5.00E-10 5.48E-09 1.55E-08 -1.45E-08 4.62E-10 5.68E-09 1.60E-08 -1.51E-08 -1.75E-09 8.73E-09 2.22E-08 -2.57E-08 -6.50E-08 PASS 6.50E-08 PASS -5.56E-10 8.59E-09 2.30E-08 -2.41E-08 -6.50E-08 PASS 6.50E-08 PASS 1.18E-09 8.63E-09 2.49E-08 -2.25E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 285 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.138. Plot of Input Offset Current5_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 286 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.138. Raw data for Input Offset Current5_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current5_2 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 2.54E-09 2.05E-08 3.07E-09 1.44E-08 1.07E-08 8.20E-10 8.70E-09 1.58E-08 1.49E-08 4.74E-09 9.54E-09 4.75E-09 24-hr Anneal 225 4.29E-09 2.04E-08 5.13E-09 1.36E-08 1.23E-08 5.89E-09 1.46E-08 1.78E-08 1.59E-08 6.23E-09 1.07E-08 5.32E-09 168-hr Anneal 250 2.40E-10 1.70E-08 1.25E-09 5.15E-09 6.80E-09 -3.50E-09 4.45E-09 1.08E-08 1.01E-08 -9.90E-10 1.15E-08 5.42E-09 9.50E-09 8.10E-09 3.17E-08 -1.27E-08 1.02E-08 7.62E-09 3.11E-08 -1.07E-08 1.12E-08 6.64E-09 2.94E-08 -7.05E-09 6.09E-09 6.67E-09 2.44E-08 -1.22E-08 8.59E-09 4.94E-09 2.21E-08 -4.96E-09 -6.50E-08 PASS 6.50E-08 PASS 9.00E-09 6.46E-09 2.67E-08 -8.70E-09 -6.50E-08 PASS 6.50E-08 PASS 1.21E-08 5.62E-09 2.75E-08 -3.32E-09 -6.50E-08 PASS 6.50E-08 PASS 4.18E-09 6.42E-09 2.18E-08 -1.34E-08 -6.50E-08 PASS 6.50E-08 PASS 0 1.20E-10 1.59E-08 1.77E-09 3.29E-09 6.83E-09 -2.99E-09 5.74E-09 1.00E-08 1.10E-08 3.20E-10 5.77E-09 3.98E-09 Total 20 1.22E-09 1.77E-08 3.14E-09 6.22E-09 8.27E-09 -2.84E-09 5.53E-09 1.19E-08 1.08E-08 6.40E-10 6.65E-09 4.34E-09 Dose (krad(Si)) 50 100 8.00E-10 1.47E-09 1.84E-08 2.22E-08 3.87E-09 3.84E-09 8.86E-09 1.16E-08 1.06E-08 8.46E-09 -1.00E-09 1.46E-09 8.19E-09 1.08E-08 1.36E-08 1.38E-08 1.22E-08 1.11E-08 1.92E-09 5.74E-09 7.15E-09 8.55E-09 4.53E-09 4.95E-09 5.59E-09 6.29E-09 2.28E-08 -1.17E-08 7.30E-09 6.39E-09 2.48E-08 -1.02E-08 8.51E-09 6.77E-09 2.71E-08 -1.01E-08 4.82E-09 6.08E-09 2.15E-08 -1.18E-08 -6.50E-08 PASS 6.50E-08 PASS 5.20E-09 6.36E-09 2.26E-08 -1.22E-08 -6.50E-08 PASS 6.50E-08 PASS 6.98E-09 6.35E-09 2.44E-08 -1.04E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 287 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.139. Plot of Input Offset Current5_3 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 288 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.139. Raw data for Input Offset Current5_3 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current5_3 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 3.23E-09 -4.77E-09 -1.58E-08 3.11E-09 5.98E-09 8.93E-09 1.17E-08 -1.67E-08 1.61E-08 2.25E-08 -5.30E-10 1.09E-09 24-hr Anneal 225 6.04E-09 -2.35E-09 -1.65E-08 5.01E-09 9.23E-09 1.07E-08 1.44E-08 -1.37E-08 1.86E-08 2.43E-08 3.40E-10 1.72E-09 168-hr Anneal 250 7.80E-10 -5.46E-09 -2.04E-08 1.68E-09 3.92E-09 2.55E-09 1.00E-08 -1.77E-08 7.48E-09 1.50E-08 9.30E-10 -1.90E-10 -2.05E-09 7.65E-09 1.89E-08 -2.30E-08 -1.64E-09 8.85E-09 2.26E-08 -2.59E-08 2.96E-10 1.03E-08 2.85E-08 -2.79E-08 -3.90E-09 9.87E-09 2.32E-08 -3.10E-08 7.38E-09 1.36E-08 4.47E-08 -2.99E-08 -6.50E-08 PASS 6.50E-08 PASS 8.51E-09 1.50E-08 4.96E-08 -3.26E-08 -6.50E-08 PASS 6.50E-08 PASS 1.09E-08 1.46E-08 5.09E-08 -2.92E-08 -6.50E-08 PASS 6.50E-08 PASS 3.47E-09 1.27E-08 3.82E-08 -3.12E-08 -6.50E-08 PASS 6.50E-08 PASS 0 -2.15E-09 -6.49E-09 -2.17E-08 -2.30E-10 2.50E-09 1.20E-09 6.33E-09 -1.77E-08 5.22E-09 1.14E-08 -8.41E-09 -7.57E-09 Total 20 9.80E-10 -5.52E-09 -1.80E-08 1.89E-09 4.25E-09 4.86E-09 9.06E-09 -1.53E-08 8.76E-09 1.55E-08 -3.32E-09 -2.96E-09 Dose (krad(Si)) 50 100 2.64E-09 6.90E-10 -2.73E-09 7.50E-10 -1.67E-08 -1.57E-08 8.10E-10 1.09E-09 3.45E-09 2.85E-09 7.34E-09 8.58E-09 1.02E-08 1.02E-08 -1.50E-08 -1.57E-08 1.15E-08 1.42E-08 1.75E-08 1.97E-08 -2.57E-09 -1.32E-09 -2.23E-09 -1.66E-09 -5.61E-09 9.57E-09 2.06E-08 -3.18E-08 -3.27E-09 8.97E-09 2.13E-08 -2.79E-08 -2.50E-09 8.28E-09 2.02E-08 -2.52E-08 1.28E-09 1.12E-08 3.21E-08 -2.95E-08 -6.50E-08 PASS 6.50E-08 PASS 4.58E-09 1.17E-08 3.68E-08 -2.76E-08 -6.50E-08 PASS 6.50E-08 PASS 6.30E-09 1.25E-08 4.05E-08 -2.79E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 289 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.140. Plot of Input Offset Current5_4 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 290 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.140. Raw data for Input Offset Current5_4 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Input Offset Current5_4 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -2.79E-09 -6.90E-10 -9.80E-09 8.37E-09 3.96E-09 1.64E-08 1.97E-08 1.17E-08 2.21E-08 -1.10E-08 1.40E-08 3.16E-08 24-hr Anneal 225 -2.21E-09 8.60E-10 -5.69E-09 1.05E-08 7.58E-09 1.76E-08 2.35E-08 1.25E-08 2.27E-08 -8.37E-09 1.49E-08 3.26E-08 168-hr Anneal 250 -7.17E-09 -4.95E-09 -6.61E-09 5.09E-09 3.89E-09 8.84E-09 1.44E-08 6.07E-09 1.75E-08 -1.31E-08 1.58E-08 3.28E-08 2.38E-10 6.86E-09 1.91E-08 -1.86E-08 -1.90E-10 6.89E-09 1.87E-08 -1.91E-08 2.20E-09 6.72E-09 2.06E-08 -1.62E-08 -1.95E-09 5.95E-09 1.44E-08 -1.83E-08 1.08E-08 1.19E-08 4.35E-08 -2.19E-08 -6.50E-08 PASS 6.50E-08 PASS 1.18E-08 1.33E-08 4.83E-08 -2.48E-08 -6.50E-08 PASS 6.50E-08 PASS 1.36E-08 1.30E-08 4.94E-08 -2.22E-08 -6.50E-08 PASS 6.50E-08 PASS 6.75E-09 1.20E-08 3.95E-08 -2.60E-08 -6.50E-08 PASS 6.50E-08 PASS 0 -5.62E-09 -5.27E-09 -6.31E-09 4.17E-09 4.39E-09 6.79E-09 1.35E-08 5.55E-09 1.80E-08 -1.28E-08 1.02E-08 3.02E-08 Total 20 -4.61E-09 -3.47E-09 -7.97E-09 6.53E-09 5.70E-09 7.70E-09 1.54E-08 5.59E-09 1.78E-08 -1.13E-08 1.10E-08 3.05E-08 Dose (krad(Si)) 50 100 -5.07E-09 -6.41E-09 -2.92E-09 3.58E-09 -8.08E-09 -7.90E-09 7.23E-09 6.74E-09 6.40E-09 5.18E-09 1.14E-08 1.49E-08 1.81E-08 1.74E-08 9.07E-09 1.08E-08 2.02E-08 2.04E-08 -1.13E-08 -9.62E-09 1.16E-08 1.28E-08 3.09E-08 3.14E-08 -1.73E-09 5.50E-09 1.33E-08 -1.68E-08 -7.64E-10 6.50E-09 1.71E-08 -1.86E-08 -4.88E-10 6.92E-09 1.85E-08 -1.95E-08 6.20E-09 1.17E-08 3.84E-08 -2.60E-08 -6.50E-08 PASS 6.50E-08 PASS 7.04E-09 1.15E-08 3.85E-08 -2.44E-08 -6.50E-08 PASS 6.50E-08 PASS 9.49E-09 1.25E-08 4.38E-08 -2.48E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DLA Certified Company 291 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.141. Plot of +Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 292 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.141. Raw data for +Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.99E-07 5.75E-07 4.72E-07 5.34E-07 4.93E-07 5.58E-07 4.86E-07 5.50E-07 4.74E-07 5.42E-07 4.93E-07 5.72E-07 4.63E-07 5.32E-07 4.82E-07 5.48E-07 4.74E-07 5.35E-07 4.56E-07 5.24E-07 3.73E-07 3.73E-07 3.80E-07 3.80E-07 200 6.61E-07 6.17E-07 6.42E-07 6.36E-07 6.25E-07 6.68E-07 6.18E-07 6.30E-07 6.20E-07 6.10E-07 3.74E-07 3.79E-07 24-hr Anneal 225 5.88E-07 5.49E-07 5.75E-07 5.71E-07 5.60E-07 6.37E-07 5.90E-07 6.08E-07 5.98E-07 5.84E-07 3.75E-07 3.79E-07 168-hr Anneal 250 4.45E-07 4.20E-07 4.40E-07 4.35E-07 4.27E-07 4.69E-07 4.42E-07 4.64E-07 4.63E-07 4.44E-07 3.77E-07 3.79E-07 0 3.60E-07 3.44E-07 3.60E-07 3.58E-07 3.49E-07 3.61E-07 3.40E-07 3.56E-07 3.56E-07 3.46E-07 3.71E-07 3.81E-07 Total 20 4.29E-07 4.04E-07 4.28E-07 4.24E-07 4.10E-07 4.20E-07 3.96E-07 4.17E-07 4.12E-07 3.95E-07 3.72E-07 3.80E-07 3.54E-07 7.38E-09 3.74E-07 3.34E-07 4.19E-07 1.13E-08 4.50E-07 3.88E-07 4.85E-07 1.17E-08 5.17E-07 4.53E-07 5.52E-07 1.57E-08 5.95E-07 5.09E-07 6.36E-07 1.68E-08 6.82E-07 5.90E-07 5.69E-07 1.48E-08 6.09E-07 5.28E-07 4.33E-07 1.01E-08 4.61E-07 4.06E-07 3.52E-07 8.58E-09 3.76E-07 3.29E-07 -6.50E-07 PASS 6.50E-07 PASS 4.08E-07 1.19E-08 4.40E-07 3.75E-07 -7.50E-07 PASS 7.50E-07 PASS 4.73E-07 1.47E-08 5.14E-07 4.33E-07 -8.00E-07 PASS 8.00E-07 PASS 5.42E-07 1.89E-08 5.94E-07 4.91E-07 -8.50E-07 PASS 8.50E-07 PASS 6.29E-07 2.30E-08 6.92E-07 5.66E-07 -9.00E-07 PASS 9.00E-07 PASS 6.04E-07 2.09E-08 6.61E-07 5.46E-07 -9.00E-07 PASS 9.00E-07 PASS 4.56E-07 1.23E-08 4.90E-07 4.23E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 293 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.142. Plot of +Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 294 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.142. Raw data for +Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 5.00E-07 5.74E-07 4.88E-07 5.51E-07 4.71E-07 5.38E-07 4.73E-07 5.36E-07 4.82E-07 5.51E-07 4.76E-07 5.50E-07 4.61E-07 5.28E-07 4.85E-07 5.54E-07 4.76E-07 5.40E-07 4.61E-07 5.32E-07 3.42E-07 3.42E-07 3.51E-07 3.52E-07 200 6.55E-07 6.35E-07 6.19E-07 6.18E-07 6.35E-07 6.35E-07 6.10E-07 6.32E-07 6.30E-07 6.18E-07 3.43E-07 3.53E-07 24-hr Anneal 225 5.88E-07 5.70E-07 5.53E-07 5.59E-07 5.65E-07 6.12E-07 5.85E-07 6.13E-07 6.06E-07 5.92E-07 3.44E-07 3.53E-07 168-hr Anneal 250 4.44E-07 4.40E-07 4.17E-07 4.26E-07 4.28E-07 4.65E-07 4.45E-07 4.68E-07 4.64E-07 4.44E-07 3.45E-07 3.54E-07 0 3.57E-07 3.59E-07 3.39E-07 3.47E-07 3.49E-07 3.54E-07 3.42E-07 3.55E-07 3.56E-07 3.41E-07 3.40E-07 3.49E-07 Total 20 4.28E-07 4.24E-07 4.05E-07 4.12E-07 4.16E-07 4.11E-07 3.94E-07 4.19E-07 4.12E-07 3.96E-07 3.40E-07 3.51E-07 3.50E-07 8.27E-09 3.73E-07 3.28E-07 4.17E-07 9.13E-09 4.42E-07 3.92E-07 4.83E-07 1.19E-08 5.16E-07 4.50E-07 5.50E-07 1.53E-08 5.92E-07 5.08E-07 6.32E-07 1.49E-08 6.73E-07 5.91E-07 5.67E-07 1.36E-08 6.04E-07 5.30E-07 4.31E-07 1.10E-08 4.61E-07 4.01E-07 3.49E-07 7.40E-09 3.70E-07 3.29E-07 -6.50E-07 PASS 6.50E-07 PASS 4.06E-07 1.10E-08 4.37E-07 3.76E-07 -7.50E-07 PASS 7.50E-07 PASS 4.72E-07 1.04E-08 5.00E-07 4.43E-07 -8.00E-07 PASS 8.00E-07 PASS 5.41E-07 1.10E-08 5.71E-07 5.11E-07 -8.50E-07 PASS 8.50E-07 PASS 6.25E-07 1.03E-08 6.53E-07 5.97E-07 -9.00E-07 PASS 9.00E-07 PASS 6.02E-07 1.24E-08 6.36E-07 5.68E-07 -9.00E-07 PASS 9.00E-07 PASS 4.57E-07 1.17E-08 4.89E-07 4.25E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 295 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.143. Plot of +Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 296 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.143. Raw data for +Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 4.82E-07 5.54E-07 4.74E-07 5.36E-07 4.71E-07 5.38E-07 4.66E-07 5.29E-07 4.54E-07 5.21E-07 4.85E-07 5.57E-07 4.61E-07 5.28E-07 4.83E-07 5.49E-07 4.62E-07 5.28E-07 4.67E-07 5.38E-07 3.40E-07 3.40E-07 3.66E-07 3.66E-07 200 6.32E-07 6.18E-07 6.19E-07 6.13E-07 6.04E-07 6.42E-07 6.12E-07 6.29E-07 6.17E-07 6.28E-07 3.41E-07 3.66E-07 24-hr Anneal 225 5.68E-07 5.58E-07 5.52E-07 5.51E-07 5.37E-07 6.18E-07 5.84E-07 6.08E-07 5.91E-07 6.00E-07 3.41E-07 3.67E-07 168-hr Anneal 250 4.30E-07 4.28E-07 4.21E-07 4.21E-07 4.05E-07 4.68E-07 4.42E-07 4.65E-07 4.48E-07 4.51E-07 3.43E-07 3.67E-07 0 3.46E-07 3.52E-07 3.45E-07 3.44E-07 3.37E-07 3.60E-07 3.37E-07 3.55E-07 3.43E-07 3.49E-07 3.41E-07 3.64E-07 Total 20 4.11E-07 4.10E-07 4.07E-07 4.06E-07 3.90E-07 4.18E-07 3.94E-07 4.17E-07 3.98E-07 4.04E-07 3.38E-07 3.65E-07 3.45E-07 5.26E-09 3.59E-07 3.30E-07 4.05E-07 8.72E-09 4.29E-07 3.81E-07 4.69E-07 1.03E-08 4.98E-07 4.41E-07 5.36E-07 1.21E-08 5.69E-07 5.03E-07 6.17E-07 9.95E-09 6.45E-07 5.90E-07 5.53E-07 1.12E-08 5.84E-07 5.22E-07 4.21E-07 9.76E-09 4.48E-07 3.94E-07 3.48E-07 9.13E-09 3.74E-07 3.23E-07 -6.50E-07 PASS 6.50E-07 PASS 4.06E-07 1.11E-08 4.37E-07 3.76E-07 -7.50E-07 PASS 7.50E-07 PASS 4.71E-07 1.17E-08 5.04E-07 4.39E-07 -8.00E-07 PASS 8.00E-07 PASS 5.40E-07 1.28E-08 5.75E-07 5.05E-07 -8.50E-07 PASS 8.50E-07 PASS 6.26E-07 1.17E-08 6.58E-07 5.93E-07 -9.00E-07 PASS 9.00E-07 PASS 6.00E-07 1.34E-08 6.37E-07 5.64E-07 -9.00E-07 PASS 9.00E-07 PASS 4.55E-07 1.10E-08 4.85E-07 4.25E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 297 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.144. Plot of +Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 298 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.144. Raw data for +Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Dose (krad(Si)) 50 100 5.08E-07 5.83E-07 4.66E-07 5.29E-07 4.99E-07 5.67E-07 4.76E-07 5.42E-07 4.81E-07 5.49E-07 4.85E-07 5.64E-07 4.97E-07 5.71E-07 4.99E-07 5.69E-07 4.94E-07 5.54E-07 4.57E-07 5.25E-07 3.60E-07 3.59E-07 3.75E-07 3.75E-07 200 6.71E-07 6.11E-07 6.49E-07 6.25E-07 6.31E-07 6.57E-07 6.55E-07 6.51E-07 6.39E-07 6.10E-07 3.60E-07 3.75E-07 24-hr Anneal 225 5.98E-07 5.47E-07 5.83E-07 5.65E-07 5.66E-07 6.27E-07 6.31E-07 6.26E-07 6.19E-07 5.86E-07 3.63E-07 3.76E-07 168-hr Anneal 250 4.50E-07 4.21E-07 4.46E-07 4.32E-07 4.33E-07 4.66E-07 4.80E-07 4.82E-07 4.83E-07 4.45E-07 3.63E-07 3.77E-07 0 3.64E-07 3.47E-07 3.68E-07 3.57E-07 3.57E-07 3.62E-07 3.71E-07 3.71E-07 3.75E-07 3.45E-07 3.58E-07 3.75E-07 Total 20 4.33E-07 4.04E-07 4.34E-07 4.17E-07 4.17E-07 4.17E-07 4.29E-07 4.33E-07 4.32E-07 3.95E-07 3.57E-07 3.75E-07 3.59E-07 8.13E-09 3.81E-07 3.36E-07 4.21E-07 1.26E-08 4.56E-07 3.86E-07 4.86E-07 1.73E-08 5.33E-07 4.39E-07 5.54E-07 2.10E-08 6.12E-07 4.96E-07 6.37E-07 2.34E-08 7.01E-07 5.73E-07 5.72E-07 1.92E-08 6.24E-07 5.19E-07 4.36E-07 1.17E-08 4.68E-07 4.04E-07 3.65E-07 1.21E-08 3.98E-07 3.31E-07 -6.50E-07 PASS 6.50E-07 PASS 4.21E-07 1.59E-08 4.65E-07 3.78E-07 -7.50E-07 PASS 7.50E-07 PASS 4.86E-07 1.73E-08 5.34E-07 4.39E-07 -8.00E-07 PASS 8.00E-07 PASS 5.56E-07 1.88E-08 6.08E-07 5.05E-07 -8.50E-07 PASS 8.50E-07 PASS 6.43E-07 1.95E-08 6.96E-07 5.89E-07 -9.00E-07 PASS 9.00E-07 PASS 6.18E-07 1.82E-08 6.68E-07 5.68E-07 -9.00E-07 PASS 9.00E-07 PASS 4.71E-07 1.61E-08 5.15E-07 4.27E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 299 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.145. Plot of -Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 300 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.145. Raw data for -Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.64E-07 -6.05E-07 -6.39E-07 -6.27E-07 -6.18E-07 -6.61E-07 -6.22E-07 -6.21E-07 -6.21E-07 -5.91E-07 -3.67E-07 -3.44E-07 24-hr Anneal 225 -5.93E-07 -5.43E-07 -5.71E-07 -5.64E-07 -5.50E-07 -6.32E-07 -5.92E-07 -5.95E-07 -5.97E-07 -5.64E-07 -3.68E-07 -3.44E-07 168-hr Anneal 250 -4.52E-07 -4.18E-07 -4.43E-07 -4.32E-07 -4.20E-07 -4.72E-07 -4.57E-07 -4.58E-07 -4.67E-07 -4.33E-07 -3.69E-07 -3.44E-07 -5.48E-07 2.33E-08 -4.84E-07 -6.12E-07 -6.31E-07 2.24E-08 -5.69E-07 -6.92E-07 -5.64E-07 1.95E-08 -5.11E-07 -6.18E-07 -4.33E-07 1.47E-08 -3.93E-07 -4.73E-07 -5.38E-07 2.22E-08 -4.77E-07 -5.99E-07 -8.50E-07 PASS 8.50E-07 PASS -6.23E-07 2.50E-08 -5.55E-07 -6.92E-07 -9.00E-07 PASS 9.00E-07 PASS -5.96E-07 2.40E-08 -5.30E-07 -6.62E-07 -9.00E-07 PASS 9.00E-07 PASS -4.58E-07 1.50E-08 -4.16E-07 -4.99E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.67E-07 -3.42E-07 -3.62E-07 -3.54E-07 -3.42E-07 -3.65E-07 -3.53E-07 -3.48E-07 -3.61E-07 -3.40E-07 -3.69E-07 -3.43E-07 Total 20 -4.35E-07 -4.00E-07 -4.28E-07 -4.17E-07 -4.02E-07 -4.22E-07 -4.04E-07 -4.10E-07 -4.16E-07 -3.83E-07 -3.67E-07 -3.45E-07 Dose (krad(Si)) 50 100 -5.06E-07 -5.80E-07 -4.60E-07 -5.20E-07 -4.94E-07 -5.60E-07 -4.78E-07 -5.47E-07 -4.66E-07 -5.34E-07 -4.91E-07 -5.69E-07 -4.69E-07 -5.38E-07 -4.73E-07 -5.40E-07 -4.75E-07 -5.35E-07 -4.46E-07 -5.07E-07 -3.69E-07 -3.67E-07 -3.46E-07 -3.44E-07 -3.53E-07 1.16E-08 -3.21E-07 -3.85E-07 -4.16E-07 1.57E-08 -3.74E-07 -4.59E-07 -4.81E-07 1.94E-08 -4.28E-07 -5.34E-07 -3.54E-07 9.87E-09 -3.26E-07 -3.81E-07 -6.50E-07 PASS 6.50E-07 PASS -4.07E-07 1.50E-08 -3.66E-07 -4.48E-07 -7.50E-07 PASS 7.50E-07 PASS -4.71E-07 1.64E-08 -4.26E-07 -5.16E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 301 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.146. Plot of -Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 302 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.146. Raw data for -Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.50E-07 -6.14E-07 -6.14E-07 -6.03E-07 -6.22E-07 -6.33E-07 -6.00E-07 -6.15E-07 -6.13E-07 -6.12E-07 -3.40E-07 -3.47E-07 24-hr Anneal 225 -5.82E-07 -5.48E-07 -5.46E-07 -5.44E-07 -5.52E-07 -6.06E-07 -5.70E-07 -5.94E-07 -5.89E-07 -5.86E-07 -3.40E-07 -3.47E-07 168-hr Anneal 250 -4.45E-07 -4.22E-07 -4.15E-07 -4.21E-07 -4.21E-07 -4.66E-07 -4.39E-07 -4.55E-07 -4.52E-07 -4.43E-07 -3.40E-07 -3.47E-07 -5.39E-07 1.88E-08 -4.87E-07 -5.91E-07 -6.20E-07 1.78E-08 -5.72E-07 -6.69E-07 -5.54E-07 1.60E-08 -5.10E-07 -5.98E-07 -4.25E-07 1.17E-08 -3.93E-07 -4.57E-07 -5.31E-07 1.14E-08 -4.99E-07 -5.62E-07 -8.50E-07 PASS 8.50E-07 PASS -6.15E-07 1.21E-08 -5.81E-07 -6.48E-07 -9.00E-07 PASS 9.00E-07 PASS -5.89E-07 1.30E-08 -5.53E-07 -6.25E-07 -9.00E-07 PASS 9.00E-07 PASS -4.51E-07 1.05E-08 -4.22E-07 -4.80E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.59E-07 -3.45E-07 -3.38E-07 -3.44E-07 -3.44E-07 -3.57E-07 -3.34E-07 -3.45E-07 -3.46E-07 -3.41E-07 -3.39E-07 -3.46E-07 Total 20 -4.26E-07 -4.03E-07 -4.01E-07 -4.06E-07 -4.06E-07 -4.13E-07 -3.89E-07 -4.07E-07 -4.00E-07 -3.93E-07 -3.40E-07 -3.46E-07 Dose (krad(Si)) 50 100 -4.97E-07 -5.70E-07 -4.67E-07 -5.27E-07 -4.66E-07 -5.32E-07 -4.62E-07 -5.24E-07 -4.69E-07 -5.42E-07 -4.76E-07 -5.46E-07 -4.52E-07 -5.18E-07 -4.70E-07 -5.38E-07 -4.60E-07 -5.27E-07 -4.57E-07 -5.24E-07 -3.40E-07 -3.40E-07 -3.46E-07 -3.46E-07 -3.46E-07 7.70E-09 -3.25E-07 -3.67E-07 -4.08E-07 9.98E-09 -3.81E-07 -4.36E-07 -4.72E-07 1.43E-08 -4.33E-07 -5.11E-07 -3.44E-07 8.18E-09 -3.22E-07 -3.67E-07 -6.50E-07 PASS 6.50E-07 PASS -4.01E-07 9.90E-09 -3.73E-07 -4.28E-07 -7.50E-07 PASS 7.50E-07 PASS -4.63E-07 9.78E-09 -4.36E-07 -4.90E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 303 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.147. Plot of -Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 304 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.147. Raw data for -Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.27E-07 -6.20E-07 -6.32E-07 -6.08E-07 -5.95E-07 -6.34E-07 -5.98E-07 -6.46E-07 -5.98E-07 -6.02E-07 -3.40E-07 -3.65E-07 24-hr Anneal 225 -5.60E-07 -5.57E-07 -5.67E-07 -5.46E-07 -5.27E-07 -6.06E-07 -5.69E-07 -6.20E-07 -5.73E-07 -5.75E-07 -3.39E-07 -3.67E-07 168-hr Anneal 250 -4.26E-07 -4.33E-07 -4.40E-07 -4.19E-07 -4.00E-07 -4.65E-07 -4.32E-07 -4.81E-07 -4.38E-07 -4.35E-07 -3.40E-07 -3.68E-07 -5.36E-07 1.49E-08 -4.95E-07 -5.77E-07 -6.16E-07 1.48E-08 -5.76E-07 -6.57E-07 -5.51E-07 1.56E-08 -5.09E-07 -5.94E-07 -4.23E-07 1.53E-08 -3.81E-07 -4.65E-07 -5.31E-07 2.28E-08 -4.69E-07 -5.93E-07 -8.50E-07 PASS 8.50E-07 PASS -6.16E-07 2.26E-08 -5.54E-07 -6.78E-07 -9.00E-07 PASS 9.00E-07 PASS -5.89E-07 2.29E-08 -5.26E-07 -6.51E-07 -9.00E-07 PASS 9.00E-07 PASS -4.50E-07 2.15E-08 -3.91E-07 -5.09E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.46E-07 -3.56E-07 -3.65E-07 -3.42E-07 -3.34E-07 -3.57E-07 -3.35E-07 -3.71E-07 -3.35E-07 -3.35E-07 -3.40E-07 -3.68E-07 Total 20 -4.08E-07 -4.13E-07 -4.26E-07 -4.02E-07 -3.84E-07 -4.14E-07 -3.83E-07 -4.32E-07 -3.88E-07 -3.85E-07 -3.40E-07 -3.68E-07 Dose (krad(Si)) 50 100 -4.77E-07 -5.50E-07 -4.76E-07 -5.33E-07 -4.87E-07 -5.51E-07 -4.63E-07 -5.28E-07 -4.48E-07 -5.16E-07 -4.76E-07 -5.47E-07 -4.49E-07 -5.18E-07 -4.98E-07 -5.63E-07 -4.48E-07 -5.11E-07 -4.50E-07 -5.16E-07 -3.42E-07 -3.40E-07 -3.68E-07 -3.66E-07 -3.49E-07 1.21E-08 -3.16E-07 -3.82E-07 -4.06E-07 1.54E-08 -3.64E-07 -4.49E-07 -4.70E-07 1.50E-08 -4.29E-07 -5.11E-07 -3.47E-07 1.67E-08 -3.01E-07 -3.92E-07 -6.50E-07 PASS 6.50E-07 PASS -4.01E-07 2.16E-08 -3.41E-07 -4.60E-07 -7.50E-07 PASS 7.50E-07 PASS -4.64E-07 2.23E-08 -4.03E-07 -5.25E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 305 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.148. Plot of -Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 306 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.148. Raw data for -Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 200 -6.71E-07 -6.10E-07 -6.56E-07 -6.13E-07 -6.25E-07 -6.39E-07 -6.35E-07 -6.40E-07 -6.17E-07 -6.20E-07 -3.46E-07 -3.42E-07 24-hr Anneal 225 -5.99E-07 -5.46E-07 -5.87E-07 -5.55E-07 -5.58E-07 -6.08E-07 -6.04E-07 -6.12E-07 -5.94E-07 -5.93E-07 -3.45E-07 -3.42E-07 168-hr Anneal 250 -4.56E-07 -4.25E-07 -4.52E-07 -4.26E-07 -4.29E-07 -4.57E-07 -4.65E-07 -4.74E-07 -4.64E-07 -4.56E-07 -3.45E-07 -3.44E-07 -5.52E-07 2.71E-08 -4.78E-07 -6.27E-07 -6.35E-07 2.72E-08 -5.60E-07 -7.10E-07 -5.69E-07 2.30E-08 -5.06E-07 -6.32E-07 -4.38E-07 1.48E-08 -3.97E-07 -4.78E-07 -5.44E-07 1.08E-08 -5.14E-07 -5.73E-07 -8.50E-07 PASS 8.50E-07 PASS -6.30E-07 1.06E-08 -6.01E-07 -6.59E-07 -9.00E-07 PASS 9.00E-07 PASS -6.02E-07 8.26E-09 -5.80E-07 -6.25E-07 -9.00E-07 PASS 9.00E-07 PASS -4.63E-07 7.13E-09 -4.44E-07 -4.83E-07 -9.00E-07 PASS 9.00E-07 PASS 0 -3.67E-07 -3.50E-07 -3.73E-07 -3.50E-07 -3.52E-07 -3.53E-07 -3.55E-07 -3.64E-07 -3.55E-07 -3.57E-07 -3.46E-07 -3.42E-07 Total 20 -4.36E-07 -4.06E-07 -4.40E-07 -4.08E-07 -4.10E-07 -4.07E-07 -4.11E-07 -4.26E-07 -4.11E-07 -4.06E-07 -3.46E-07 -3.43E-07 Dose (krad(Si)) 50 100 -5.11E-07 -5.88E-07 -4.66E-07 -5.24E-07 -5.06E-07 -5.72E-07 -4.70E-07 -5.34E-07 -4.74E-07 -5.43E-07 -4.72E-07 -5.47E-07 -4.78E-07 -5.51E-07 -4.89E-07 -5.55E-07 -4.70E-07 -5.31E-07 -4.67E-07 -5.34E-07 -3.47E-07 -3.45E-07 -3.45E-07 -3.41E-07 -3.59E-07 1.09E-08 -3.29E-07 -3.88E-07 -4.20E-07 1.65E-08 -3.75E-07 -4.66E-07 -4.85E-07 2.12E-08 -4.27E-07 -5.43E-07 -3.57E-07 4.10E-09 -3.46E-07 -3.68E-07 -6.50E-07 PASS 6.50E-07 PASS -4.12E-07 7.90E-09 -3.90E-07 -4.34E-07 -7.50E-07 PASS 7.50E-07 PASS -4.75E-07 8.70E-09 -4.52E-07 -4.99E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2008 and DLA Certified Company 307 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.149. Plot of Output Voltage Swing High4_1 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 308 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.149. Raw data for Output Voltage Swing High4_1 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High4_1 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 4.52E-03 4.56E-03 4.53E-03 4.51E-03 4.60E-03 5.03E-03 5.20E-03 4.70E-03 4.75E-03 4.98E-03 4.08E-03 3.97E-03 24-hr Anneal 225 4.28E-03 4.30E-03 4.34E-03 4.40E-03 4.51E-03 4.86E-03 5.07E-03 4.61E-03 4.55E-03 4.77E-03 4.03E-03 3.98E-03 168-hr Anneal 250 3.98E-03 4.05E-03 3.89E-03 4.03E-03 4.08E-03 4.13E-03 4.30E-03 4.19E-03 4.13E-03 4.30E-03 3.86E-03 4.13E-03 4.24E-03 8.17E-05 4.46E-03 4.01E-03 4.54E-03 3.65E-05 4.64E-03 4.44E-03 4.37E-03 9.26E-05 4.62E-03 4.11E-03 4.01E-03 7.44E-05 4.21E-03 3.80E-03 4.49E-03 1.21E-04 4.82E-03 4.16E-03 2.00E-02 PASS 4.93E-03 2.07E-04 5.50E-03 4.37E-03 2.00E-02 PASS 4.77E-03 2.07E-04 5.34E-03 4.20E-03 2.00E-02 PASS 4.21E-03 8.57E-05 4.45E-03 3.97E-03 2.00E-02 PASS 0 4.11E-03 4.03E-03 4.01E-03 4.04E-03 4.02E-03 4.06E-03 4.12E-03 3.97E-03 4.01E-03 4.02E-03 3.97E-03 3.95E-03 Total 20 3.93E-03 4.08E-03 4.06E-03 4.13E-03 4.15E-03 4.17E-03 4.31E-03 4.08E-03 4.06E-03 4.15E-03 3.93E-03 3.88E-03 Dose (krad(Si)) 50 100 4.19E-03 4.12E-03 4.17E-03 4.33E-03 4.14E-03 4.25E-03 4.18E-03 4.20E-03 4.19E-03 4.29E-03 4.29E-03 4.52E-03 4.26E-03 4.67E-03 4.20E-03 4.36E-03 4.01E-03 4.40E-03 4.32E-03 4.51E-03 3.90E-03 3.99E-03 3.98E-03 3.92E-03 4.04E-03 3.96E-05 4.15E-03 3.93E-03 4.07E-03 8.63E-05 4.31E-03 3.83E-03 4.17E-03 2.07E-05 4.23E-03 4.12E-03 4.04E-03 5.68E-05 4.19E-03 3.88E-03 1.00E-02 PASS 4.15E-03 9.86E-05 4.42E-03 3.88E-03 2.00E-02 PASS 4.22E-03 1.23E-04 4.55E-03 3.88E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 309 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.150. Plot of Output Voltage Swing High4_2 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 310 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.150. Raw data for Output Voltage Swing High4_2 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High4_2 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 4.64E-03 4.72E-03 4.66E-03 4.41E-03 4.57E-03 4.88E-03 5.18E-03 4.74E-03 5.14E-03 5.11E-03 3.85E-03 3.88E-03 24-hr Anneal 225 4.39E-03 4.47E-03 4.49E-03 4.32E-03 4.44E-03 4.87E-03 4.87E-03 4.62E-03 4.88E-03 5.08E-03 3.91E-03 3.86E-03 168-hr Anneal 250 4.02E-03 4.24E-03 4.12E-03 3.91E-03 3.95E-03 4.32E-03 4.37E-03 4.08E-03 4.24E-03 4.27E-03 3.91E-03 4.01E-03 4.35E-03 1.10E-04 4.66E-03 4.05E-03 4.60E-03 1.19E-04 4.93E-03 4.27E-03 4.42E-03 6.83E-05 4.61E-03 4.23E-03 4.05E-03 1.34E-04 4.41E-03 3.68E-03 4.57E-03 9.71E-05 4.84E-03 4.31E-03 2.00E-02 PASS 5.01E-03 1.91E-04 5.53E-03 4.49E-03 2.00E-02 PASS 4.86E-03 1.63E-04 5.31E-03 4.42E-03 2.00E-02 PASS 4.26E-03 1.10E-04 4.56E-03 3.95E-03 2.00E-02 PASS 0 3.96E-03 4.17E-03 3.99E-03 3.91E-03 3.90E-03 4.09E-03 4.16E-03 4.00E-03 4.04E-03 4.06E-03 3.96E-03 3.88E-03 Total 20 4.04E-03 4.19E-03 4.16E-03 4.03E-03 4.06E-03 4.22E-03 4.29E-03 4.10E-03 4.15E-03 4.27E-03 3.80E-03 3.90E-03 Dose (krad(Si)) 50 100 4.24E-03 4.46E-03 4.33E-03 4.46E-03 4.20E-03 4.36E-03 4.10E-03 4.21E-03 4.13E-03 4.28E-03 4.45E-03 4.66E-03 4.37E-03 4.53E-03 4.23E-03 4.43E-03 4.15E-03 4.59E-03 4.33E-03 4.66E-03 4.03E-03 3.90E-03 3.86E-03 3.80E-03 3.99E-03 1.09E-04 4.29E-03 3.69E-03 4.10E-03 7.37E-05 4.30E-03 3.89E-03 4.20E-03 9.14E-05 4.45E-03 3.95E-03 4.07E-03 6.00E-05 4.23E-03 3.91E-03 1.00E-02 PASS 4.21E-03 8.02E-05 4.43E-03 3.99E-03 2.00E-02 PASS 4.31E-03 1.18E-04 4.63E-03 3.98E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 311 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.151. Plot of Output Voltage Swing High4_3 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 312 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.151. Raw data for Output Voltage Swing High4_3 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High4_3 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 4.60E-03 4.62E-03 4.71E-03 4.45E-03 4.55E-03 4.90E-03 5.14E-03 4.80E-03 4.98E-03 5.23E-03 3.88E-03 3.94E-03 24-hr Anneal 225 4.53E-03 4.45E-03 4.43E-03 4.20E-03 4.43E-03 4.89E-03 4.87E-03 4.60E-03 4.82E-03 5.09E-03 3.95E-03 3.91E-03 168-hr Anneal 250 4.07E-03 4.14E-03 4.11E-03 4.04E-03 4.11E-03 4.35E-03 4.40E-03 4.13E-03 4.22E-03 4.38E-03 3.90E-03 4.05E-03 4.38E-03 1.18E-04 4.70E-03 4.05E-03 4.59E-03 9.56E-05 4.85E-03 4.32E-03 4.41E-03 1.23E-04 4.75E-03 4.07E-03 4.09E-03 3.91E-05 4.20E-03 3.99E-03 4.58E-03 1.43E-04 4.97E-03 4.19E-03 2.00E-02 PASS 5.01E-03 1.75E-04 5.49E-03 4.53E-03 2.00E-02 PASS 4.85E-03 1.75E-04 5.33E-03 4.37E-03 2.00E-02 PASS 4.30E-03 1.16E-04 4.61E-03 3.98E-03 2.00E-02 PASS 0 3.97E-03 4.02E-03 4.10E-03 4.05E-03 3.99E-03 3.99E-03 4.19E-03 3.95E-03 4.00E-03 4.11E-03 3.91E-03 3.88E-03 Total 20 4.03E-03 4.25E-03 4.21E-03 3.93E-03 4.09E-03 4.10E-03 4.27E-03 3.98E-03 4.14E-03 4.15E-03 3.71E-03 3.77E-03 Dose (krad(Si)) 50 100 4.34E-03 4.34E-03 4.34E-03 4.48E-03 4.24E-03 4.50E-03 4.16E-03 4.21E-03 4.11E-03 4.35E-03 4.30E-03 4.62E-03 4.40E-03 4.68E-03 4.26E-03 4.34E-03 4.17E-03 4.57E-03 4.27E-03 4.69E-03 3.87E-03 3.87E-03 3.98E-03 3.88E-03 4.03E-03 5.13E-05 4.17E-03 3.89E-03 4.10E-03 1.31E-04 4.46E-03 3.74E-03 4.24E-03 1.04E-04 4.52E-03 3.95E-03 4.05E-03 9.91E-05 4.32E-03 3.78E-03 1.00E-02 PASS 4.13E-03 1.04E-04 4.41E-03 3.84E-03 2.00E-02 PASS 4.28E-03 8.28E-05 4.51E-03 4.05E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 313 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.152. Plot of Output Voltage Swing High4_4 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 314 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.152. Raw data for Output Voltage Swing High4_4 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High4_4 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 4.50E-03 4.56E-03 4.50E-03 4.45E-03 4.55E-03 5.08E-03 5.29E-03 4.77E-03 4.72E-03 4.96E-03 4.00E-03 4.04E-03 24-hr Anneal 225 4.31E-03 4.36E-03 4.39E-03 4.35E-03 4.45E-03 5.01E-03 5.00E-03 4.65E-03 4.73E-03 4.87E-03 4.07E-03 3.92E-03 168-hr Anneal 250 4.05E-03 4.09E-03 3.97E-03 3.94E-03 3.97E-03 4.44E-03 4.41E-03 4.11E-03 4.20E-03 4.36E-03 3.95E-03 4.17E-03 4.30E-03 5.77E-05 4.45E-03 4.14E-03 4.51E-03 4.44E-05 4.63E-03 4.39E-03 4.37E-03 5.22E-05 4.52E-03 4.23E-03 4.00E-03 6.31E-05 4.18E-03 3.83E-03 4.54E-03 1.56E-04 4.97E-03 4.12E-03 2.00E-02 PASS 4.96E-03 2.33E-04 5.60E-03 4.33E-03 2.00E-02 PASS 4.85E-03 1.60E-04 5.29E-03 4.41E-03 2.00E-02 PASS 4.30E-03 1.43E-04 4.69E-03 3.91E-03 2.00E-02 PASS 0 3.95E-03 3.94E-03 4.03E-03 3.94E-03 4.04E-03 3.96E-03 4.13E-03 4.03E-03 3.89E-03 4.03E-03 3.94E-03 4.01E-03 Total 20 3.99E-03 4.06E-03 4.07E-03 4.09E-03 3.96E-03 4.16E-03 4.27E-03 4.05E-03 4.14E-03 4.21E-03 3.89E-03 3.95E-03 Dose (krad(Si)) 50 100 4.28E-03 4.32E-03 4.20E-03 4.36E-03 4.16E-03 4.32E-03 4.19E-03 4.27E-03 4.11E-03 4.21E-03 4.28E-03 4.69E-03 4.33E-03 4.64E-03 4.20E-03 4.37E-03 4.19E-03 4.38E-03 4.23E-03 4.64E-03 3.95E-03 4.01E-03 3.98E-03 3.94E-03 3.98E-03 5.05E-05 4.12E-03 3.84E-03 4.03E-03 5.59E-05 4.19E-03 3.88E-03 4.19E-03 6.22E-05 4.36E-03 4.02E-03 4.01E-03 8.96E-05 4.25E-03 3.76E-03 1.00E-02 PASS 4.17E-03 8.20E-05 4.39E-03 3.94E-03 2.00E-02 PASS 4.25E-03 5.86E-05 4.41E-03 4.09E-03 2.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 315 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.153. Plot of Output Voltage Swing High5_1 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 316 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.153. Raw data for Output Voltage Swing High5_1 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High5_1 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.38E-02 7.75E-02 7.49E-02 7.66E-02 7.73E-02 7.41E-02 7.79E-02 7.32E-02 7.30E-02 7.77E-02 6.88E-02 7.05E-02 24-hr Anneal 225 7.32E-02 7.71E-02 7.46E-02 7.62E-02 7.67E-02 7.36E-02 7.76E-02 7.29E-02 7.26E-02 7.74E-02 6.90E-02 7.05E-02 168-hr Anneal 250 7.15E-02 7.50E-02 7.26E-02 7.46E-02 7.50E-02 7.21E-02 7.60E-02 7.17E-02 7.13E-02 7.58E-02 6.88E-02 7.05E-02 7.53E-02 1.71E-03 8.00E-02 7.07E-02 7.60E-02 1.61E-03 8.04E-02 7.16E-02 7.55E-02 1.64E-03 8.00E-02 7.11E-02 7.37E-02 1.62E-03 7.82E-02 6.93E-02 7.41E-02 2.34E-03 8.06E-02 6.77E-02 1.50E-01 PASS 7.52E-02 2.45E-03 8.19E-02 6.85E-02 1.50E-01 PASS 7.48E-02 2.46E-03 8.16E-02 6.81E-02 1.50E-01 PASS 7.34E-02 2.30E-03 7.97E-02 6.71E-02 1.50E-01 PASS 0 6.96E-02 7.29E-02 7.08E-02 7.26E-02 7.29E-02 7.08E-02 7.46E-02 7.03E-02 7.02E-02 7.40E-02 6.88E-02 7.05E-02 Total 20 7.11E-02 7.46E-02 7.25E-02 7.41E-02 7.47E-02 7.14E-02 7.54E-02 7.11E-02 7.08E-02 7.50E-02 6.86E-02 7.07E-02 Dose (krad(Si)) 50 100 7.22E-02 7.30E-02 7.57E-02 7.73E-02 7.32E-02 7.43E-02 7.51E-02 7.59E-02 7.56E-02 7.63E-02 7.21E-02 7.28E-02 7.60E-02 7.69E-02 7.17E-02 7.25E-02 7.13E-02 7.20E-02 7.55E-02 7.65E-02 6.86E-02 6.89E-02 7.04E-02 7.05E-02 7.18E-02 1.47E-03 7.58E-02 6.77E-02 7.34E-02 1.57E-03 7.77E-02 6.91E-02 7.44E-02 1.58E-03 7.87E-02 7.00E-02 7.20E-02 2.13E-03 7.78E-02 6.61E-02 1.50E-01 PASS 7.27E-02 2.25E-03 7.89E-02 6.66E-02 1.50E-01 PASS 7.33E-02 2.25E-03 7.95E-02 6.71E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 317 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.154. Plot of Output Voltage Swing High5_2 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 318 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.154. Raw data for Output Voltage Swing High5_2 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High5_2 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.64E-02 7.72E-02 7.76E-02 7.64E-02 7.80E-02 7.68E-02 7.89E-02 7.41E-02 7.80E-02 7.88E-02 7.05E-02 6.85E-02 24-hr Anneal 225 7.55E-02 7.67E-02 7.70E-02 7.57E-02 7.74E-02 7.66E-02 7.84E-02 7.39E-02 7.73E-02 7.84E-02 7.04E-02 6.85E-02 168-hr Anneal 250 7.38E-02 7.47E-02 7.51E-02 7.40E-02 7.55E-02 7.51E-02 7.70E-02 7.23E-02 7.56E-02 7.67E-02 7.02E-02 6.86E-02 7.63E-02 9.33E-04 7.89E-02 7.38E-02 7.71E-02 7.34E-04 7.91E-02 7.51E-02 7.65E-02 8.38E-04 7.88E-02 7.42E-02 7.46E-02 7.16E-04 7.66E-02 7.26E-02 7.61E-02 1.90E-03 8.13E-02 7.09E-02 1.50E-01 PASS 7.73E-02 1.99E-03 8.28E-02 7.19E-02 1.50E-01 PASS 7.69E-02 1.88E-03 8.20E-02 7.18E-02 1.50E-01 PASS 7.53E-02 1.90E-03 8.05E-02 7.01E-02 1.50E-01 PASS 0 7.15E-02 7.27E-02 7.31E-02 7.20E-02 7.33E-02 7.33E-02 7.53E-02 7.10E-02 7.42E-02 7.52E-02 7.04E-02 6.86E-02 Total 20 7.34E-02 7.45E-02 7.48E-02 7.37E-02 7.50E-02 7.40E-02 7.60E-02 7.16E-02 7.50E-02 7.59E-02 7.05E-02 6.84E-02 Dose (krad(Si)) 50 100 7.44E-02 7.51E-02 7.56E-02 7.71E-02 7.57E-02 7.69E-02 7.46E-02 7.55E-02 7.60E-02 7.70E-02 7.50E-02 7.59E-02 7.66E-02 7.76E-02 7.24E-02 7.30E-02 7.57E-02 7.67E-02 7.68E-02 7.75E-02 7.03E-02 7.05E-02 6.84E-02 6.85E-02 7.25E-02 7.72E-04 7.46E-02 7.04E-02 7.43E-02 7.06E-04 7.62E-02 7.23E-02 7.52E-02 7.12E-04 7.72E-02 7.33E-02 7.38E-02 1.76E-03 7.86E-02 6.90E-02 1.50E-01 PASS 7.45E-02 1.80E-03 7.94E-02 6.96E-02 1.50E-01 PASS 7.53E-02 1.75E-03 8.01E-02 7.05E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 319 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.155. Plot of Output Voltage Swing High5_3 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 320 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.155. Raw data for Output Voltage Swing High5_3 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High5_3 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.60E-02 7.65E-02 7.80E-02 7.60E-02 7.79E-02 7.70E-02 7.83E-02 7.32E-02 7.74E-02 7.93E-02 7.02E-02 6.88E-02 24-hr Anneal 225 7.52E-02 7.60E-02 7.74E-02 7.55E-02 7.76E-02 7.65E-02 7.81E-02 7.29E-02 7.70E-02 7.89E-02 7.03E-02 6.88E-02 168-hr Anneal 250 7.32E-02 7.40E-02 7.53E-02 7.38E-02 7.56E-02 7.47E-02 7.65E-02 7.15E-02 7.54E-02 7.72E-02 7.00E-02 6.88E-02 7.61E-02 1.10E-03 7.91E-02 7.31E-02 7.69E-02 1.01E-03 7.97E-02 7.41E-02 7.63E-02 1.11E-03 7.94E-02 7.33E-02 7.44E-02 1.03E-03 7.72E-02 7.15E-02 7.59E-02 2.32E-03 8.23E-02 6.96E-02 1.50E-01 PASS 7.70E-02 2.32E-03 8.34E-02 7.07E-02 1.50E-01 PASS 7.67E-02 2.31E-03 8.30E-02 7.03E-02 1.50E-01 PASS 7.51E-02 2.21E-03 8.11E-02 6.90E-02 1.50E-01 PASS 0 7.14E-02 7.23E-02 7.35E-02 7.19E-02 7.33E-02 7.32E-02 7.49E-02 7.01E-02 7.39E-02 7.56E-02 7.00E-02 6.88E-02 Total 20 7.29E-02 7.40E-02 7.54E-02 7.35E-02 7.50E-02 7.41E-02 7.55E-02 7.10E-02 7.48E-02 7.64E-02 7.01E-02 6.86E-02 Dose (krad(Si)) 50 100 7.41E-02 7.49E-02 7.47E-02 7.62E-02 7.63E-02 7.73E-02 7.47E-02 7.51E-02 7.61E-02 7.71E-02 7.50E-02 7.56E-02 7.63E-02 7.73E-02 7.16E-02 7.21E-02 7.54E-02 7.64E-02 7.70E-02 7.81E-02 7.01E-02 7.02E-02 6.87E-02 6.87E-02 7.25E-02 9.18E-04 7.50E-02 6.99E-02 7.41E-02 1.02E-03 7.69E-02 7.13E-02 7.52E-02 9.67E-04 7.78E-02 7.25E-02 7.35E-02 2.15E-03 7.94E-02 6.77E-02 1.50E-01 PASS 7.43E-02 2.06E-03 8.00E-02 6.87E-02 1.50E-01 PASS 7.51E-02 2.10E-03 8.08E-02 6.93E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 321 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.156. Plot of Output Voltage Swing High5_4 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 322 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.156. Raw data for Output Voltage Swing High5_4 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High5_4 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.39E-02 7.68E-02 7.48E-02 7.65E-02 7.62E-02 7.46E-02 7.75E-02 7.28E-02 7.26E-02 7.75E-02 6.87E-02 7.02E-02 24-hr Anneal 225 7.30E-02 7.63E-02 7.42E-02 7.59E-02 7.57E-02 7.42E-02 7.72E-02 7.24E-02 7.22E-02 7.72E-02 6.87E-02 7.04E-02 168-hr Anneal 250 7.15E-02 7.45E-02 7.24E-02 7.38E-02 7.40E-02 7.26E-02 7.54E-02 7.12E-02 7.10E-02 7.57E-02 6.85E-02 7.03E-02 7.48E-02 1.41E-03 7.87E-02 7.09E-02 7.56E-02 1.23E-03 7.90E-02 7.23E-02 7.50E-02 1.39E-03 7.88E-02 7.12E-02 7.32E-02 1.26E-03 7.67E-02 6.98E-02 7.38E-02 2.28E-03 8.01E-02 6.76E-02 1.50E-01 PASS 7.50E-02 2.40E-03 8.16E-02 6.84E-02 1.50E-01 PASS 7.47E-02 2.47E-03 8.14E-02 6.79E-02 1.50E-01 PASS 7.32E-02 2.28E-03 7.94E-02 6.69E-02 1.50E-01 PASS 0 6.95E-02 7.24E-02 7.07E-02 7.23E-02 7.20E-02 7.12E-02 7.38E-02 6.98E-02 6.97E-02 7.41E-02 6.88E-02 7.02E-02 Total 20 7.12E-02 7.41E-02 7.23E-02 7.37E-02 7.37E-02 7.19E-02 7.46E-02 7.05E-02 7.05E-02 7.49E-02 6.87E-02 7.03E-02 Dose (krad(Si)) 50 100 7.21E-02 7.29E-02 7.52E-02 7.64E-02 7.30E-02 7.38E-02 7.49E-02 7.56E-02 7.46E-02 7.54E-02 7.27E-02 7.34E-02 7.55E-02 7.62E-02 7.12E-02 7.18E-02 7.10E-02 7.16E-02 7.56E-02 7.62E-02 6.86E-02 6.87E-02 7.04E-02 7.03E-02 7.14E-02 1.26E-03 7.49E-02 6.79E-02 7.30E-02 1.20E-03 7.63E-02 6.97E-02 7.40E-02 1.35E-03 7.77E-02 7.03E-02 7.17E-02 2.11E-03 7.75E-02 6.59E-02 1.50E-01 PASS 7.25E-02 2.16E-03 7.84E-02 6.65E-02 1.50E-01 PASS 7.32E-02 2.23E-03 7.93E-02 6.71E-02 1.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 323 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.157. Plot of Output Voltage Swing High6_1 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 324 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.157. Raw data for Output Voltage Swing High6_1 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High6_1 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.31E-01 1.36E-01 1.32E-01 1.35E-01 1.35E-01 1.31E-01 1.37E-01 1.31E-01 1.30E-01 1.36E-01 1.24E-01 1.27E-01 24-hr Anneal 225 1.30E-01 1.35E-01 1.32E-01 1.34E-01 1.35E-01 1.30E-01 1.36E-01 1.30E-01 1.30E-01 1.36E-01 1.25E-01 1.27E-01 168-hr Anneal 250 1.28E-01 1.32E-01 1.29E-01 1.32E-01 1.32E-01 1.28E-01 1.34E-01 1.29E-01 1.28E-01 1.34E-01 1.24E-01 1.27E-01 1.33E-01 2.46E-03 1.40E-01 1.26E-01 1.34E-01 2.26E-03 1.40E-01 1.28E-01 1.33E-01 2.26E-03 1.39E-01 1.27E-01 1.31E-01 2.06E-03 1.36E-01 1.25E-01 1.32E-01 2.98E-03 1.40E-01 1.23E-01 2.50E-01 PASS 1.33E-01 3.16E-03 1.42E-01 1.24E-01 2.50E-01 PASS 1.32E-01 3.12E-03 1.41E-01 1.24E-01 2.50E-01 PASS 1.31E-01 2.97E-03 1.39E-01 1.22E-01 2.50E-01 PASS 0 1.26E-01 1.31E-01 1.28E-01 1.30E-01 1.30E-01 1.27E-01 1.32E-01 1.27E-01 1.27E-01 1.32E-01 1.25E-01 1.27E-01 Total 20 1.27E-01 1.32E-01 1.29E-01 1.32E-01 1.32E-01 1.27E-01 1.33E-01 1.28E-01 1.28E-01 1.33E-01 1.25E-01 1.26E-01 Dose (krad(Si)) 50 100 1.29E-01 1.30E-01 1.33E-01 1.36E-01 1.30E-01 1.31E-01 1.33E-01 1.34E-01 1.33E-01 1.34E-01 1.28E-01 1.30E-01 1.34E-01 1.35E-01 1.29E-01 1.30E-01 1.28E-01 1.29E-01 1.34E-01 1.35E-01 1.24E-01 1.25E-01 1.27E-01 1.27E-01 1.29E-01 2.08E-03 1.34E-01 1.23E-01 1.30E-01 2.15E-03 1.36E-01 1.25E-01 1.32E-01 2.14E-03 1.38E-01 1.26E-01 1.29E-01 2.90E-03 1.37E-01 1.21E-01 2.50E-01 PASS 1.30E-01 2.87E-03 1.38E-01 1.22E-01 2.50E-01 PASS 1.31E-01 2.92E-03 1.39E-01 1.23E-01 2.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 325 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.158. Plot of Output Voltage Swing High6_2 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 326 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.158. Raw data for Output Voltage Swing High6_2 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High6_2 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.34E-01 1.36E-01 1.36E-01 1.34E-01 1.36E-01 1.35E-01 1.38E-01 1.32E-01 1.37E-01 1.38E-01 1.26E-01 1.24E-01 24-hr Anneal 225 1.33E-01 1.35E-01 1.35E-01 1.33E-01 1.35E-01 1.35E-01 1.37E-01 1.31E-01 1.36E-01 1.37E-01 1.26E-01 1.24E-01 168-hr Anneal 250 1.31E-01 1.32E-01 1.32E-01 1.31E-01 1.33E-01 1.33E-01 1.35E-01 1.29E-01 1.34E-01 1.35E-01 1.26E-01 1.24E-01 1.34E-01 1.28E-03 1.38E-01 1.31E-01 1.35E-01 9.20E-04 1.38E-01 1.32E-01 1.34E-01 1.17E-03 1.37E-01 1.31E-01 1.32E-01 8.88E-04 1.34E-01 1.30E-01 1.34E-01 2.43E-03 1.41E-01 1.28E-01 2.50E-01 PASS 1.36E-01 2.50E-03 1.43E-01 1.29E-01 2.50E-01 PASS 1.35E-01 2.51E-03 1.42E-01 1.28E-01 2.50E-01 PASS 1.33E-01 2.34E-03 1.40E-01 1.27E-01 2.50E-01 PASS 0 1.28E-01 1.30E-01 1.31E-01 1.29E-01 1.31E-01 1.31E-01 1.33E-01 1.28E-01 1.32E-01 1.33E-01 1.26E-01 1.24E-01 Total 20 1.30E-01 1.32E-01 1.32E-01 1.31E-01 1.32E-01 1.32E-01 1.34E-01 1.29E-01 1.33E-01 1.34E-01 1.26E-01 1.24E-01 Dose (krad(Si)) 50 100 1.32E-01 1.33E-01 1.33E-01 1.36E-01 1.33E-01 1.35E-01 1.32E-01 1.33E-01 1.34E-01 1.35E-01 1.33E-01 1.34E-01 1.35E-01 1.36E-01 1.30E-01 1.30E-01 1.34E-01 1.35E-01 1.35E-01 1.36E-01 1.26E-01 1.27E-01 1.24E-01 1.24E-01 1.30E-01 1.06E-03 1.33E-01 1.27E-01 1.32E-01 9.84E-04 1.34E-01 1.29E-01 1.33E-01 8.52E-04 1.35E-01 1.30E-01 1.31E-01 2.25E-03 1.38E-01 1.25E-01 2.50E-01 PASS 1.32E-01 2.26E-03 1.39E-01 1.26E-01 2.50E-01 PASS 1.33E-01 2.26E-03 1.39E-01 1.27E-01 2.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 327 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.159. Plot of Output Voltage Swing High6_3 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 328 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.159. Raw data for Output Voltage Swing High6_3 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High6_3 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.34E-01 1.35E-01 1.36E-01 1.34E-01 1.36E-01 1.35E-01 1.37E-01 1.31E-01 1.36E-01 1.38E-01 1.26E-01 1.24E-01 24-hr Anneal 225 1.33E-01 1.34E-01 1.36E-01 1.33E-01 1.35E-01 1.35E-01 1.37E-01 1.30E-01 1.36E-01 1.38E-01 1.26E-01 1.24E-01 168-hr Anneal 250 1.31E-01 1.32E-01 1.33E-01 1.31E-01 1.33E-01 1.33E-01 1.35E-01 1.28E-01 1.33E-01 1.36E-01 1.26E-01 1.24E-01 1.34E-01 1.42E-03 1.38E-01 1.30E-01 1.35E-01 1.33E-03 1.39E-01 1.31E-01 1.34E-01 1.40E-03 1.38E-01 1.30E-01 1.32E-01 1.20E-03 1.35E-01 1.29E-01 1.34E-01 2.85E-03 1.42E-01 1.26E-01 2.50E-01 PASS 1.35E-01 2.86E-03 1.43E-01 1.28E-01 2.50E-01 PASS 1.35E-01 2.95E-03 1.43E-01 1.27E-01 2.50E-01 PASS 1.33E-01 2.87E-03 1.41E-01 1.25E-01 2.50E-01 PASS 0 1.28E-01 1.30E-01 1.31E-01 1.29E-01 1.31E-01 1.31E-01 1.33E-01 1.26E-01 1.32E-01 1.34E-01 1.26E-01 1.24E-01 Total 20 1.30E-01 1.31E-01 1.33E-01 1.30E-01 1.32E-01 1.32E-01 1.34E-01 1.27E-01 1.33E-01 1.35E-01 1.26E-01 1.24E-01 Dose (krad(Si)) 50 100 1.31E-01 1.32E-01 1.32E-01 1.35E-01 1.34E-01 1.35E-01 1.32E-01 1.33E-01 1.34E-01 1.35E-01 1.33E-01 1.34E-01 1.34E-01 1.36E-01 1.28E-01 1.29E-01 1.33E-01 1.35E-01 1.35E-01 1.37E-01 1.26E-01 1.26E-01 1.24E-01 1.24E-01 1.30E-01 1.29E-03 1.33E-01 1.26E-01 1.31E-01 1.25E-03 1.35E-01 1.28E-01 1.33E-01 1.26E-03 1.36E-01 1.29E-01 1.31E-01 2.80E-03 1.39E-01 1.23E-01 2.50E-01 PASS 1.32E-01 2.77E-03 1.40E-01 1.24E-01 2.50E-01 PASS 1.33E-01 2.73E-03 1.40E-01 1.25E-01 2.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 329 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.160. Plot of Output Voltage Swing High6_4 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 330 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.160. Raw data for Output Voltage Swing High6_4 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing High6_4 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.31E-01 1.35E-01 1.32E-01 1.35E-01 1.34E-01 1.32E-01 1.36E-01 1.30E-01 1.30E-01 1.36E-01 1.24E-01 1.26E-01 24-hr Anneal 225 1.30E-01 1.34E-01 1.31E-01 1.34E-01 1.34E-01 1.31E-01 1.35E-01 1.30E-01 1.29E-01 1.36E-01 1.24E-01 1.26E-01 168-hr Anneal 250 1.28E-01 1.32E-01 1.29E-01 1.32E-01 1.31E-01 1.29E-01 1.33E-01 1.28E-01 1.28E-01 1.34E-01 1.24E-01 1.26E-01 1.32E-01 2.16E-03 1.38E-01 1.26E-01 1.33E-01 1.86E-03 1.38E-01 1.28E-01 1.33E-01 1.98E-03 1.38E-01 1.27E-01 1.30E-01 1.95E-03 1.36E-01 1.25E-01 1.31E-01 2.99E-03 1.40E-01 1.23E-01 2.50E-01 PASS 1.33E-01 3.04E-03 1.41E-01 1.24E-01 2.50E-01 PASS 1.32E-01 3.03E-03 1.40E-01 1.24E-01 2.50E-01 PASS 1.30E-01 2.88E-03 1.38E-01 1.22E-01 2.50E-01 PASS 0 1.26E-01 1.29E-01 1.27E-01 1.29E-01 1.29E-01 1.27E-01 1.32E-01 1.26E-01 1.26E-01 1.32E-01 1.24E-01 1.27E-01 Total 20 1.27E-01 1.31E-01 1.29E-01 1.31E-01 1.31E-01 1.28E-01 1.32E-01 1.27E-01 1.27E-01 1.33E-01 1.24E-01 1.26E-01 Dose (krad(Si)) 50 100 1.28E-01 1.29E-01 1.33E-01 1.35E-01 1.30E-01 1.31E-01 1.32E-01 1.33E-01 1.32E-01 1.33E-01 1.29E-01 1.30E-01 1.33E-01 1.34E-01 1.28E-01 1.29E-01 1.28E-01 1.29E-01 1.34E-01 1.35E-01 1.24E-01 1.25E-01 1.26E-01 1.27E-01 1.28E-01 1.73E-03 1.33E-01 1.23E-01 1.30E-01 1.69E-03 1.35E-01 1.25E-01 1.31E-01 1.85E-03 1.36E-01 1.26E-01 1.29E-01 2.79E-03 1.36E-01 1.21E-01 2.50E-01 PASS 1.29E-01 2.82E-03 1.37E-01 1.22E-01 2.50E-01 PASS 1.30E-01 2.87E-03 1.38E-01 1.22E-01 2.50E-01 PASS An ISO 9001:2008 and DLA Certified Company 331 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.161. Plot of Output Voltage Swing Low4_1 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 332 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.161. Raw data for Output Voltage Swing Low4_1 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low4_1 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.63E-02 1.63E-02 1.65E-02 1.63E-02 1.65E-02 1.65E-02 1.66E-02 1.69E-02 1.67E-02 1.69E-02 1.54E-02 1.51E-02 24-hr Anneal 225 1.62E-02 1.64E-02 1.65E-02 1.63E-02 1.66E-02 1.63E-02 1.65E-02 1.69E-02 1.67E-02 1.68E-02 1.57E-02 1.53E-02 168-hr Anneal 250 1.54E-02 1.57E-02 1.57E-02 1.57E-02 1.57E-02 1.56E-02 1.59E-02 1.62E-02 1.59E-02 1.60E-02 1.55E-02 1.54E-02 1.61E-02 1.86E-04 1.66E-02 1.56E-02 1.64E-02 1.35E-04 1.67E-02 1.60E-02 1.64E-02 1.59E-04 1.68E-02 1.59E-02 1.56E-02 1.25E-04 1.60E-02 1.53E-02 1.62E-02 2.50E-04 1.69E-02 1.55E-02 6.00E-02 PASS 1.67E-02 1.94E-04 1.73E-02 1.62E-02 6.00E-02 PASS 1.66E-02 2.45E-04 1.73E-02 1.60E-02 6.00E-02 PASS 1.59E-02 2.22E-04 1.65E-02 1.53E-02 6.00E-02 PASS 0 1.50E-02 1.53E-02 1.52E-02 1.51E-02 1.55E-02 1.50E-02 1.51E-02 1.56E-02 1.54E-02 1.55E-02 1.55E-02 1.52E-02 Total 20 1.52E-02 1.55E-02 1.56E-02 1.54E-02 1.56E-02 1.51E-02 1.53E-02 1.59E-02 1.56E-02 1.57E-02 1.54E-02 1.52E-02 Dose (krad(Si)) 50 100 1.55E-02 1.59E-02 1.58E-02 1.63E-02 1.58E-02 1.60E-02 1.57E-02 1.60E-02 1.58E-02 1.62E-02 1.54E-02 1.58E-02 1.57E-02 1.62E-02 1.61E-02 1.65E-02 1.59E-02 1.63E-02 1.59E-02 1.63E-02 1.57E-02 1.55E-02 1.52E-02 1.52E-02 1.52E-02 1.66E-04 1.57E-02 1.48E-02 1.54E-02 1.55E-04 1.59E-02 1.50E-02 1.57E-02 1.33E-04 1.61E-02 1.53E-02 1.53E-02 2.60E-04 1.60E-02 1.46E-02 3.00E-02 PASS 1.55E-02 3.36E-04 1.64E-02 1.46E-02 6.00E-02 PASS 1.58E-02 2.54E-04 1.65E-02 1.51E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 333 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.162. Plot of Output Voltage Swing Low4_2 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 334 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.162. Raw data for Output Voltage Swing Low4_2 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low4_2 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.67E-02 1.67E-02 1.68E-02 1.67E-02 1.65E-02 1.72E-02 1.72E-02 1.76E-02 1.70E-02 1.72E-02 1.57E-02 1.55E-02 24-hr Anneal 225 1.67E-02 1.67E-02 1.69E-02 1.67E-02 1.66E-02 1.71E-02 1.72E-02 1.75E-02 1.69E-02 1.70E-02 1.60E-02 1.55E-02 168-hr Anneal 250 1.59E-02 1.58E-02 1.61E-02 1.59E-02 1.59E-02 1.64E-02 1.63E-02 1.67E-02 1.61E-02 1.62E-02 1.59E-02 1.55E-02 1.64E-02 8.93E-05 1.66E-02 1.61E-02 1.67E-02 1.06E-04 1.70E-02 1.64E-02 1.67E-02 1.11E-04 1.70E-02 1.64E-02 1.59E-02 8.64E-05 1.62E-02 1.57E-02 1.67E-02 2.03E-04 1.72E-02 1.61E-02 6.00E-02 PASS 1.72E-02 2.21E-04 1.78E-02 1.66E-02 6.00E-02 PASS 1.71E-02 2.18E-04 1.77E-02 1.65E-02 6.00E-02 PASS 1.63E-02 2.27E-04 1.69E-02 1.57E-02 6.00E-02 PASS 0 1.58E-02 1.55E-02 1.59E-02 1.57E-02 1.56E-02 1.58E-02 1.58E-02 1.63E-02 1.57E-02 1.56E-02 1.60E-02 1.54E-02 Total 20 1.58E-02 1.57E-02 1.59E-02 1.58E-02 1.56E-02 1.60E-02 1.60E-02 1.63E-02 1.58E-02 1.58E-02 1.57E-02 1.54E-02 Dose (krad(Si)) 50 100 1.60E-02 1.64E-02 1.59E-02 1.65E-02 1.62E-02 1.65E-02 1.61E-02 1.63E-02 1.59E-02 1.63E-02 1.63E-02 1.66E-02 1.64E-02 1.67E-02 1.68E-02 1.70E-02 1.61E-02 1.66E-02 1.61E-02 1.65E-02 1.59E-02 1.58E-02 1.54E-02 1.56E-02 1.57E-02 1.47E-04 1.61E-02 1.53E-02 1.58E-02 1.20E-04 1.61E-02 1.54E-02 1.60E-02 1.22E-04 1.63E-02 1.57E-02 1.58E-02 2.61E-04 1.66E-02 1.51E-02 3.00E-02 PASS 1.60E-02 1.92E-04 1.65E-02 1.54E-02 6.00E-02 PASS 1.63E-02 2.90E-04 1.71E-02 1.55E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 335 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.163. Plot of Output Voltage Swing Low4_3 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 336 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.163. Raw data for Output Voltage Swing Low4_3 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low4_3 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.63E-02 1.63E-02 1.66E-02 1.62E-02 1.64E-02 1.70E-02 1.67E-02 1.70E-02 1.68E-02 1.67E-02 1.56E-02 1.50E-02 24-hr Anneal 225 1.62E-02 1.62E-02 1.67E-02 1.63E-02 1.65E-02 1.70E-02 1.67E-02 1.71E-02 1.65E-02 1.67E-02 1.58E-02 1.51E-02 168-hr Anneal 250 1.57E-02 1.56E-02 1.56E-02 1.58E-02 1.56E-02 1.61E-02 1.59E-02 1.63E-02 1.58E-02 1.58E-02 1.56E-02 1.51E-02 1.60E-02 1.10E-04 1.63E-02 1.57E-02 1.63E-02 1.41E-04 1.67E-02 1.60E-02 1.64E-02 2.31E-04 1.70E-02 1.57E-02 1.57E-02 9.15E-05 1.59E-02 1.54E-02 1.63E-02 1.48E-04 1.67E-02 1.59E-02 6.00E-02 PASS 1.69E-02 1.43E-04 1.72E-02 1.65E-02 6.00E-02 PASS 1.68E-02 2.28E-04 1.74E-02 1.62E-02 6.00E-02 PASS 1.60E-02 1.92E-04 1.65E-02 1.54E-02 6.00E-02 PASS 0 1.54E-02 1.52E-02 1.55E-02 1.54E-02 1.54E-02 1.56E-02 1.55E-02 1.56E-02 1.54E-02 1.52E-02 1.56E-02 1.50E-02 Total 20 1.54E-02 1.54E-02 1.56E-02 1.55E-02 1.55E-02 1.56E-02 1.54E-02 1.58E-02 1.54E-02 1.54E-02 1.56E-02 1.51E-02 Dose (krad(Si)) 50 100 1.56E-02 1.60E-02 1.56E-02 1.60E-02 1.59E-02 1.61E-02 1.58E-02 1.59E-02 1.58E-02 1.62E-02 1.59E-02 1.63E-02 1.58E-02 1.62E-02 1.61E-02 1.65E-02 1.56E-02 1.63E-02 1.56E-02 1.61E-02 1.57E-02 1.56E-02 1.51E-02 1.51E-02 1.54E-02 1.04E-04 1.56E-02 1.51E-02 1.55E-02 1.04E-04 1.57E-02 1.52E-02 1.57E-02 1.14E-04 1.60E-02 1.54E-02 1.55E-02 1.55E-04 1.59E-02 1.50E-02 3.00E-02 PASS 1.55E-02 2.06E-04 1.61E-02 1.49E-02 6.00E-02 PASS 1.58E-02 2.09E-04 1.64E-02 1.52E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 337 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.164. Plot of Output Voltage Swing Low4_4 5V (V) @ VS=+5V IL=0mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 338 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.164. Raw data for Output Voltage Swing Low4_4 5V (V) @ VS=+5V IL=0mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low4_4 5V (V) @ VS=+5V IL=0mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 1.65E-02 1.66E-02 1.66E-02 1.68E-02 1.68E-02 1.70E-02 1.69E-02 1.70E-02 1.67E-02 1.73E-02 1.56E-02 1.55E-02 24-hr Anneal 225 1.62E-02 1.66E-02 1.67E-02 1.68E-02 1.68E-02 1.68E-02 1.68E-02 1.71E-02 1.67E-02 1.72E-02 1.58E-02 1.56E-02 168-hr Anneal 250 1.59E-02 1.59E-02 1.59E-02 1.62E-02 1.60E-02 1.61E-02 1.60E-02 1.63E-02 1.61E-02 1.64E-02 1.55E-02 1.56E-02 1.63E-02 2.27E-04 1.69E-02 1.57E-02 1.66E-02 1.34E-04 1.70E-02 1.63E-02 1.66E-02 2.57E-04 1.73E-02 1.59E-02 1.60E-02 1.56E-04 1.64E-02 1.55E-02 1.64E-02 2.13E-04 1.70E-02 1.59E-02 6.00E-02 PASS 1.70E-02 2.18E-04 1.76E-02 1.64E-02 6.00E-02 PASS 1.69E-02 2.14E-04 1.75E-02 1.64E-02 6.00E-02 PASS 1.62E-02 1.30E-04 1.66E-02 1.58E-02 6.00E-02 PASS 0 1.53E-02 1.53E-02 1.54E-02 1.57E-02 1.57E-02 1.54E-02 1.54E-02 1.57E-02 1.55E-02 1.57E-02 1.56E-02 1.55E-02 Total 20 1.55E-02 1.56E-02 1.57E-02 1.59E-02 1.60E-02 1.55E-02 1.55E-02 1.59E-02 1.58E-02 1.61E-02 1.56E-02 1.56E-02 Dose (krad(Si)) 50 100 1.57E-02 1.60E-02 1.59E-02 1.64E-02 1.59E-02 1.62E-02 1.63E-02 1.64E-02 1.63E-02 1.66E-02 1.59E-02 1.62E-02 1.60E-02 1.64E-02 1.62E-02 1.64E-02 1.59E-02 1.64E-02 1.64E-02 1.68E-02 1.57E-02 1.56E-02 1.55E-02 1.56E-02 1.55E-02 2.00E-04 1.60E-02 1.49E-02 1.57E-02 1.97E-04 1.63E-02 1.52E-02 1.60E-02 2.56E-04 1.67E-02 1.53E-02 1.56E-02 1.52E-04 1.60E-02 1.51E-02 3.00E-02 PASS 1.58E-02 2.57E-04 1.65E-02 1.51E-02 6.00E-02 PASS 1.61E-02 2.18E-04 1.67E-02 1.55E-02 6.00E-02 PASS An ISO 9001:2008 and DLA Certified Company 339 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.165. Plot of Output Voltage Swing Low5_1 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 340 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.165. Raw data for Output Voltage Swing Low5_1 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low5_1 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.51E-02 3.57E-02 3.52E-02 3.53E-02 3.56E-02 3.51E-02 3.55E-02 3.57E-02 3.52E-02 3.60E-02 3.41E-02 3.39E-02 24-hr Anneal 225 3.50E-02 3.56E-02 3.53E-02 3.53E-02 3.56E-02 3.49E-02 3.54E-02 3.57E-02 3.52E-02 3.58E-02 3.42E-02 3.40E-02 168-hr Anneal 250 3.42E-02 3.47E-02 3.44E-02 3.46E-02 3.46E-02 3.42E-02 3.47E-02 3.50E-02 3.45E-02 3.51E-02 3.40E-02 3.41E-02 3.50E-02 3.35E-04 3.59E-02 3.41E-02 3.54E-02 2.50E-04 3.60E-02 3.47E-02 3.53E-02 2.67E-04 3.61E-02 3.46E-02 3.45E-02 2.00E-04 3.50E-02 3.39E-02 3.50E-02 4.44E-04 3.62E-02 3.38E-02 1.00E-01 PASS 3.55E-02 3.73E-04 3.65E-02 3.45E-02 1.00E-01 PASS 3.54E-02 3.84E-04 3.64E-02 3.43E-02 1.00E-01 PASS 3.47E-02 3.70E-04 3.57E-02 3.37E-02 1.00E-01 PASS 0 3.35E-02 3.40E-02 3.37E-02 3.39E-02 3.42E-02 3.34E-02 3.40E-02 3.43E-02 3.39E-02 3.43E-02 3.41E-02 3.41E-02 Total 20 3.40E-02 3.45E-02 3.43E-02 3.43E-02 3.45E-02 3.38E-02 3.42E-02 3.45E-02 3.42E-02 3.48E-02 3.41E-02 3.39E-02 Dose (krad(Si)) 50 100 3.43E-02 3.46E-02 3.48E-02 3.55E-02 3.45E-02 3.48E-02 3.46E-02 3.50E-02 3.49E-02 3.53E-02 3.41E-02 3.43E-02 3.46E-02 3.50E-02 3.48E-02 3.52E-02 3.45E-02 3.49E-02 3.50E-02 3.55E-02 3.43E-02 3.42E-02 3.41E-02 3.41E-02 3.39E-02 2.70E-04 3.46E-02 3.31E-02 3.43E-02 1.87E-04 3.48E-02 3.38E-02 3.46E-02 2.46E-04 3.53E-02 3.39E-02 3.40E-02 3.68E-04 3.50E-02 3.30E-02 1.00E-01 PASS 3.43E-02 3.76E-04 3.53E-02 3.33E-02 1.00E-01 PASS 3.46E-02 3.69E-04 3.56E-02 3.36E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 341 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.166. Plot of Output Voltage Swing Low5_2 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 342 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.166. Raw data for Output Voltage Swing Low5_2 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low5_2 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.60E-02 3.61E-02 3.63E-02 3.59E-02 3.62E-02 3.64E-02 3.65E-02 3.66E-02 3.61E-02 3.64E-02 3.47E-02 3.41E-02 24-hr Anneal 225 3.58E-02 3.60E-02 3.62E-02 3.58E-02 3.62E-02 3.62E-02 3.64E-02 3.65E-02 3.60E-02 3.62E-02 3.49E-02 3.41E-02 168-hr Anneal 250 3.50E-02 3.51E-02 3.54E-02 3.52E-02 3.53E-02 3.55E-02 3.57E-02 3.56E-02 3.53E-02 3.54E-02 3.47E-02 3.42E-02 3.57E-02 2.42E-04 3.63E-02 3.50E-02 3.61E-02 1.68E-04 3.65E-02 3.56E-02 3.60E-02 2.00E-04 3.65E-02 3.54E-02 3.52E-02 1.65E-04 3.56E-02 3.47E-02 3.59E-02 1.55E-04 3.63E-02 3.55E-02 1.00E-01 PASS 3.64E-02 1.91E-04 3.69E-02 3.59E-02 1.00E-01 PASS 3.63E-02 1.82E-04 3.68E-02 3.58E-02 1.00E-01 PASS 3.55E-02 1.77E-04 3.60E-02 3.50E-02 1.00E-01 PASS 0 3.46E-02 3.47E-02 3.49E-02 3.46E-02 3.48E-02 3.49E-02 3.52E-02 3.52E-02 3.49E-02 3.50E-02 3.47E-02 3.42E-02 Total 20 3.47E-02 3.49E-02 3.50E-02 3.48E-02 3.49E-02 3.51E-02 3.52E-02 3.53E-02 3.49E-02 3.50E-02 3.46E-02 3.41E-02 Dose (krad(Si)) 50 100 3.51E-02 3.54E-02 3.50E-02 3.59E-02 3.53E-02 3.58E-02 3.51E-02 3.54E-02 3.54E-02 3.59E-02 3.53E-02 3.58E-02 3.56E-02 3.61E-02 3.57E-02 3.60E-02 3.52E-02 3.58E-02 3.54E-02 3.59E-02 3.49E-02 3.48E-02 3.41E-02 3.42E-02 3.47E-02 1.55E-04 3.52E-02 3.43E-02 3.49E-02 1.03E-04 3.51E-02 3.46E-02 3.52E-02 1.78E-04 3.57E-02 3.47E-02 3.50E-02 1.40E-04 3.54E-02 3.47E-02 1.00E-01 PASS 3.51E-02 1.71E-04 3.56E-02 3.46E-02 1.00E-01 PASS 3.54E-02 1.96E-04 3.60E-02 3.49E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 343 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.167. Plot of Output Voltage Swing Low5_3 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 344 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.167. Raw data for Output Voltage Swing Low5_3 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low5_3 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.56E-02 3.54E-02 3.58E-02 3.53E-02 3.59E-02 3.59E-02 3.59E-02 3.59E-02 3.58E-02 3.61E-02 3.47E-02 3.38E-02 24-hr Anneal 225 3.53E-02 3.55E-02 3.58E-02 3.53E-02 3.60E-02 3.58E-02 3.59E-02 3.57E-02 3.56E-02 3.58E-02 3.48E-02 3.37E-02 168-hr Anneal 250 3.45E-02 3.46E-02 3.49E-02 3.48E-02 3.51E-02 3.51E-02 3.52E-02 3.50E-02 3.48E-02 3.50E-02 3.44E-02 3.37E-02 3.53E-02 3.13E-04 3.61E-02 3.44E-02 3.56E-02 2.76E-04 3.64E-02 3.48E-02 3.56E-02 3.23E-04 3.65E-02 3.47E-02 3.48E-02 2.30E-04 3.54E-02 3.41E-02 3.53E-02 1.15E-04 3.56E-02 3.50E-02 1.00E-01 PASS 3.59E-02 1.18E-04 3.63E-02 3.56E-02 1.00E-01 PASS 3.58E-02 1.21E-04 3.61E-02 3.54E-02 1.00E-01 PASS 3.50E-02 1.45E-04 3.54E-02 3.46E-02 1.00E-01 PASS 0 3.42E-02 3.42E-02 3.44E-02 3.42E-02 3.46E-02 3.44E-02 3.48E-02 3.45E-02 3.43E-02 3.45E-02 3.46E-02 3.37E-02 Total 20 3.43E-02 3.43E-02 3.47E-02 3.43E-02 3.49E-02 3.45E-02 3.47E-02 3.47E-02 3.44E-02 3.45E-02 3.45E-02 3.37E-02 Dose (krad(Si)) 50 100 3.45E-02 3.50E-02 3.45E-02 3.53E-02 3.50E-02 3.53E-02 3.47E-02 3.50E-02 3.51E-02 3.58E-02 3.47E-02 3.52E-02 3.50E-02 3.55E-02 3.50E-02 3.52E-02 3.48E-02 3.53E-02 3.49E-02 3.53E-02 3.46E-02 3.47E-02 3.37E-02 3.38E-02 3.43E-02 1.81E-04 3.48E-02 3.38E-02 3.45E-02 2.82E-04 3.53E-02 3.37E-02 3.48E-02 2.89E-04 3.56E-02 3.40E-02 3.45E-02 1.63E-04 3.49E-02 3.41E-02 1.00E-01 PASS 3.46E-02 1.16E-04 3.49E-02 3.43E-02 1.00E-01 PASS 3.49E-02 1.37E-04 3.53E-02 3.45E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 345 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.168. Plot of Output Voltage Swing Low5_4 5V (V) @ VS=+5V IL=1mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 346 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.168. Raw data for Output Voltage Swing Low5_4 5V (V) @ VS=+5V IL=1mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low5_4 5V (V) @ VS=+5V IL=1mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 3.54E-02 3.58E-02 3.57E-02 3.62E-02 3.60E-02 3.57E-02 3.58E-02 3.57E-02 3.54E-02 3.66E-02 3.43E-02 3.43E-02 24-hr Anneal 225 3.52E-02 3.58E-02 3.56E-02 3.61E-02 3.60E-02 3.54E-02 3.58E-02 3.58E-02 3.53E-02 3.65E-02 3.45E-02 3.45E-02 168-hr Anneal 250 3.44E-02 3.49E-02 3.48E-02 3.55E-02 3.53E-02 3.47E-02 3.49E-02 3.50E-02 3.47E-02 3.56E-02 3.43E-02 3.44E-02 3.55E-02 3.30E-04 3.64E-02 3.46E-02 3.58E-02 2.89E-04 3.66E-02 3.50E-02 3.57E-02 3.49E-04 3.67E-02 3.48E-02 3.50E-02 4.21E-04 3.61E-02 3.38E-02 3.53E-02 3.91E-04 3.64E-02 3.42E-02 1.00E-01 PASS 3.58E-02 4.60E-04 3.71E-02 3.46E-02 1.00E-01 PASS 3.57E-02 4.63E-04 3.70E-02 3.45E-02 1.00E-01 PASS 3.50E-02 3.84E-04 3.60E-02 3.39E-02 1.00E-01 PASS 0 3.41E-02 3.45E-02 3.44E-02 3.49E-02 3.48E-02 3.42E-02 3.45E-02 3.45E-02 3.43E-02 3.51E-02 3.43E-02 3.43E-02 Total 20 3.43E-02 3.46E-02 3.45E-02 3.50E-02 3.50E-02 3.43E-02 3.45E-02 3.47E-02 3.42E-02 3.53E-02 3.42E-02 3.43E-02 Dose (krad(Si)) 50 100 3.45E-02 3.50E-02 3.49E-02 3.57E-02 3.48E-02 3.52E-02 3.54E-02 3.57E-02 3.52E-02 3.58E-02 3.46E-02 3.49E-02 3.48E-02 3.54E-02 3.49E-02 3.53E-02 3.46E-02 3.50E-02 3.55E-02 3.59E-02 3.44E-02 3.44E-02 3.44E-02 3.44E-02 3.45E-02 3.29E-04 3.54E-02 3.36E-02 3.47E-02 3.00E-04 3.55E-02 3.38E-02 3.49E-02 3.34E-04 3.59E-02 3.40E-02 3.45E-02 3.55E-04 3.55E-02 3.35E-02 1.00E-01 PASS 3.46E-02 4.51E-04 3.58E-02 3.34E-02 1.00E-01 PASS 3.49E-02 3.72E-04 3.59E-02 3.38E-02 1.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 347 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.169. Plot of Output Voltage Swing Low6_1 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 348 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.169. Raw data for Output Voltage Swing Low6_1 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low6_1 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.52E-02 7.62E-02 7.54E-02 7.60E-02 7.61E-02 7.46E-02 7.57E-02 7.58E-02 7.51E-02 7.67E-02 7.40E-02 7.39E-02 24-hr Anneal 225 7.49E-02 7.64E-02 7.55E-02 7.58E-02 7.60E-02 7.44E-02 7.57E-02 7.57E-02 7.50E-02 7.62E-02 7.41E-02 7.39E-02 168-hr Anneal 250 7.40E-02 7.50E-02 7.42E-02 7.49E-02 7.48E-02 7.36E-02 7.47E-02 7.49E-02 7.41E-02 7.54E-02 7.38E-02 7.38E-02 7.54E-02 6.91E-04 7.73E-02 7.35E-02 7.58E-02 4.49E-04 7.70E-02 7.45E-02 7.57E-02 5.59E-04 7.73E-02 7.42E-02 7.46E-02 4.71E-04 7.59E-02 7.33E-02 7.50E-02 7.62E-04 7.71E-02 7.29E-02 2.00E-01 PASS 7.56E-02 7.89E-04 7.77E-02 7.34E-02 2.00E-01 PASS 7.54E-02 7.16E-04 7.74E-02 7.34E-02 2.00E-01 PASS 7.45E-02 7.17E-04 7.65E-02 7.26E-02 2.00E-01 PASS 0 7.34E-02 7.45E-02 7.38E-02 7.41E-02 7.44E-02 7.29E-02 7.41E-02 7.43E-02 7.36E-02 7.49E-02 7.39E-02 7.39E-02 Total 20 7.37E-02 7.48E-02 7.41E-02 7.45E-02 7.47E-02 7.32E-02 7.44E-02 7.46E-02 7.40E-02 7.52E-02 7.39E-02 7.39E-02 Dose (krad(Si)) 50 100 7.40E-02 7.46E-02 7.51E-02 7.64E-02 7.44E-02 7.50E-02 7.52E-02 7.54E-02 7.51E-02 7.57E-02 7.35E-02 7.38E-02 7.47E-02 7.53E-02 7.49E-02 7.52E-02 7.41E-02 7.48E-02 7.55E-02 7.58E-02 7.40E-02 7.41E-02 7.39E-02 7.40E-02 7.40E-02 4.57E-04 7.53E-02 7.28E-02 7.44E-02 4.67E-04 7.56E-02 7.31E-02 7.47E-02 5.49E-04 7.63E-02 7.32E-02 7.40E-02 7.52E-04 7.60E-02 7.19E-02 2.00E-01 PASS 7.43E-02 7.65E-04 7.64E-02 7.22E-02 2.00E-01 PASS 7.46E-02 7.55E-04 7.66E-02 7.25E-02 2.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 349 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.170. Plot of Output Voltage Swing Low6_2 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 350 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.170. Raw data for Output Voltage Swing Low6_2 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low6_2 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.68E-02 7.70E-02 7.70E-02 7.65E-02 7.72E-02 7.73E-02 7.76E-02 7.73E-02 7.72E-02 7.73E-02 7.51E-02 7.39E-02 24-hr Anneal 225 7.64E-02 7.69E-02 7.72E-02 7.63E-02 7.73E-02 7.69E-02 7.75E-02 7.71E-02 7.70E-02 7.70E-02 7.52E-02 7.41E-02 168-hr Anneal 250 7.55E-02 7.59E-02 7.61E-02 7.55E-02 7.60E-02 7.61E-02 7.66E-02 7.62E-02 7.60E-02 7.61E-02 7.48E-02 7.39E-02 7.66E-02 5.09E-04 7.80E-02 7.52E-02 7.69E-02 2.45E-04 7.76E-02 7.62E-02 7.68E-02 4.57E-04 7.81E-02 7.56E-02 7.58E-02 2.61E-04 7.65E-02 7.51E-02 7.67E-02 1.78E-04 7.72E-02 7.62E-02 2.00E-01 PASS 7.73E-02 1.39E-04 7.77E-02 7.69E-02 2.00E-01 PASS 7.71E-02 2.42E-04 7.78E-02 7.64E-02 2.00E-01 PASS 7.62E-02 2.22E-04 7.68E-02 7.56E-02 2.00E-01 PASS 0 7.47E-02 7.51E-02 7.53E-02 7.47E-02 7.53E-02 7.55E-02 7.59E-02 7.55E-02 7.54E-02 7.55E-02 7.50E-02 7.41E-02 Total 20 7.53E-02 7.56E-02 7.58E-02 7.51E-02 7.57E-02 7.57E-02 7.62E-02 7.60E-02 7.56E-02 7.58E-02 7.51E-02 7.38E-02 Dose (krad(Si)) 50 100 7.55E-02 7.61E-02 7.59E-02 7.71E-02 7.61E-02 7.68E-02 7.55E-02 7.60E-02 7.63E-02 7.70E-02 7.61E-02 7.65E-02 7.65E-02 7.70E-02 7.63E-02 7.65E-02 7.60E-02 7.67E-02 7.62E-02 7.66E-02 7.52E-02 7.52E-02 7.41E-02 7.41E-02 7.50E-02 3.14E-04 7.59E-02 7.41E-02 7.55E-02 3.06E-04 7.63E-02 7.46E-02 7.59E-02 3.53E-04 7.68E-02 7.49E-02 7.55E-02 1.77E-04 7.60E-02 7.51E-02 2.00E-01 PASS 7.58E-02 2.43E-04 7.65E-02 7.52E-02 2.00E-01 PASS 7.62E-02 2.00E-04 7.68E-02 7.57E-02 2.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 351 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.171. Plot of Output Voltage Swing Low6_3 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 352 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.171. Raw data for Output Voltage Swing Low6_3 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low6_3 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.59E-02 7.59E-02 7.63E-02 7.55E-02 7.66E-02 7.63E-02 7.67E-02 7.62E-02 7.62E-02 7.66E-02 7.49E-02 7.33E-02 24-hr Anneal 225 7.57E-02 7.60E-02 7.64E-02 7.56E-02 7.68E-02 7.59E-02 7.66E-02 7.61E-02 7.60E-02 7.63E-02 7.50E-02 7.33E-02 168-hr Anneal 250 7.48E-02 7.49E-02 7.51E-02 7.45E-02 7.55E-02 7.50E-02 7.56E-02 7.51E-02 7.51E-02 7.53E-02 7.46E-02 7.32E-02 7.58E-02 4.85E-04 7.71E-02 7.44E-02 7.60E-02 4.35E-04 7.72E-02 7.48E-02 7.61E-02 5.11E-04 7.75E-02 7.47E-02 7.50E-02 3.74E-04 7.60E-02 7.40E-02 7.57E-02 2.06E-04 7.63E-02 7.52E-02 2.00E-01 PASS 7.64E-02 2.19E-04 7.70E-02 7.58E-02 2.00E-01 PASS 7.62E-02 2.98E-04 7.70E-02 7.53E-02 2.00E-01 PASS 7.52E-02 2.44E-04 7.59E-02 7.46E-02 2.00E-01 PASS 0 7.43E-02 7.43E-02 7.46E-02 7.39E-02 7.48E-02 7.46E-02 7.51E-02 7.47E-02 7.45E-02 7.47E-02 7.48E-02 7.33E-02 Total 20 7.45E-02 7.47E-02 7.50E-02 7.41E-02 7.52E-02 7.48E-02 7.53E-02 7.49E-02 7.48E-02 7.51E-02 7.48E-02 7.32E-02 Dose (krad(Si)) 50 100 7.49E-02 7.55E-02 7.50E-02 7.61E-02 7.53E-02 7.60E-02 7.46E-02 7.51E-02 7.58E-02 7.63E-02 7.51E-02 7.55E-02 7.57E-02 7.61E-02 7.53E-02 7.56E-02 7.50E-02 7.57E-02 7.55E-02 7.58E-02 7.48E-02 7.49E-02 7.31E-02 7.34E-02 7.44E-02 3.25E-04 7.52E-02 7.35E-02 7.47E-02 4.28E-04 7.59E-02 7.35E-02 7.51E-02 4.52E-04 7.63E-02 7.39E-02 7.47E-02 2.29E-04 7.53E-02 7.41E-02 2.00E-01 PASS 7.50E-02 2.35E-04 7.56E-02 7.44E-02 2.00E-01 PASS 7.53E-02 2.67E-04 7.60E-02 7.46E-02 2.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 353 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.172. Plot of Output Voltage Swing Low6_4 5V (V) @ VS=+5V IL=2.5mA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 354 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.172. Raw data for Output Voltage Swing Low6_4 5V (V) @ VS=+5V IL=2.5mA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Swing Low6_4 5V (V) @ VS=+5V IL=2.5mA Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 7.58E-02 7.67E-02 7.62E-02 7.70E-02 7.66E-02 7.57E-02 7.63E-02 7.62E-02 7.56E-02 7.75E-02 7.43E-02 7.45E-02 24-hr Anneal 225 7.54E-02 7.68E-02 7.64E-02 7.71E-02 7.68E-02 7.54E-02 7.63E-02 7.61E-02 7.52E-02 7.72E-02 7.45E-02 7.47E-02 168-hr Anneal 250 7.47E-02 7.55E-02 7.53E-02 7.61E-02 7.56E-02 7.46E-02 7.54E-02 7.52E-02 7.46E-02 7.64E-02 7.40E-02 7.46E-02 7.61E-02 6.40E-04 7.79E-02 7.44E-02 7.65E-02 4.77E-04 7.78E-02 7.52E-02 7.65E-02 6.60E-04 7.83E-02 7.47E-02 7.54E-02 5.25E-04 7.69E-02 7.40E-02 7.56E-02 7.59E-04 7.77E-02 7.36E-02 2.00E-01 PASS 7.62E-02 7.58E-04 7.83E-02 7.42E-02 2.00E-01 PASS 7.61E-02 7.76E-04 7.82E-02 7.39E-02 2.00E-01 PASS 7.52E-02 7.41E-04 7.72E-02 7.32E-02 2.00E-01 PASS 0 7.40E-02 7.48E-02 7.47E-02 7.54E-02 7.51E-02 7.38E-02 7.48E-02 7.46E-02 7.41E-02 7.58E-02 7.43E-02 7.44E-02 Total 20 7.44E-02 7.52E-02 7.50E-02 7.56E-02 7.54E-02 7.41E-02 7.49E-02 7.49E-02 7.43E-02 7.61E-02 7.43E-02 7.45E-02 Dose (krad(Si)) 50 100 7.47E-02 7.52E-02 7.55E-02 7.68E-02 7.52E-02 7.58E-02 7.62E-02 7.65E-02 7.58E-02 7.64E-02 7.45E-02 7.48E-02 7.53E-02 7.58E-02 7.53E-02 7.56E-02 7.45E-02 7.52E-02 7.63E-02 7.68E-02 7.43E-02 7.43E-02 7.45E-02 7.47E-02 7.48E-02 5.29E-04 7.62E-02 7.34E-02 7.51E-02 4.67E-04 7.64E-02 7.38E-02 7.55E-02 5.81E-04 7.71E-02 7.39E-02 7.46E-02 7.62E-04 7.67E-02 7.25E-02 2.00E-01 PASS 7.49E-02 7.89E-04 7.70E-02 7.27E-02 2.00E-01 PASS 7.52E-02 7.39E-04 7.72E-02 7.31E-02 2.00E-01 PASS An ISO 9001:2008 and DLA Certified Company 355 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.173. Plot of Large Signal Voltage Gain3_1 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 356 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.173. Raw data for Large Signal Voltage Gain3_1 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain3_1 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 5.91E+03 3.08E+03 3.18E+03 4.37E+04 5.29E+03 2.30E+04 1.37E+05 2.27E+03 1.24E+04 1.60E+04 4.06E+03 2.10E+04 Total 20 4.23E+03 1.22E+04 2.60E+03 1.17E+04 8.32E+03 6.89E+03 7.50E+04 2.44E+03 7.90E+03 1.68E+04 4.01E+03 7.50E+04 Dose (krad(Si)) 50 100 2.64E+03 1.78E+04 6.23E+03 4.45E+03 3.47E+03 2.66E+03 7.01E+03 1.40E+04 6.68E+03 4.06E+03 1.06E+04 5.78E+03 7.03E+03 2.67E+04 7.54E+03 1.39E+03 1.85E+04 6.56E+03 1.60E+04 6.89E+03 4.03E+03 4.36E+03 6.14E+04 1.95E+03 200 4.75E+03 6.42E+03 1.60E+03 1.28E+04 2.46E+03 5.78E+03 8.39E+03 2.67E+03 6.95E+03 1.64E+04 4.21E+03 4.80E+03 24-hr Anneal 225 4.98E+03 4.10E+03 3.71E+03 6.13E+03 3.42E+03 2.86E+04 1.53E+04 1.86E+03 1.63E+04 4.54E+04 3.74E+03 2.78E+03 168-hr Anneal 250 3.45E+03 3.54E+03 2.56E+03 1.04E+04 2.94E+03 5.29E+03 1.76E+04 2.46E+03 9.04E+03 1.21E+04 4.35E+03 3.24E+03 1.22E+04 1.76E+04 6.06E+04 -3.61E+04 7.82E+03 4.33E+03 1.97E+04 -4.05E+03 5.21E+03 2.00E+03 1.07E+04 -2.89E+02 8.58E+03 6.81E+03 2.73E+04 -1.01E+04 5.60E+03 4.44E+03 1.78E+04 -6.58E+03 4.47E+03 1.10E+03 7.48E+03 1.46E+03 4.58E+03 3.27E+03 1.36E+04 -4.40E+03 3.82E+04 5.60E+04 1.92E+05 -1.15E+05 6.00E+02 PASS 2.18E+04 3.02E+04 1.05E+05 -6.09E+04 3.00E+02 PASS 1.19E+04 5.10E+03 2.59E+04 -2.07E+03 3.00E+02 PASS 9.46E+03 9.88E+03 3.66E+04 -1.76E+04 3.00E+02 PASS 8.04E+03 5.13E+03 2.21E+04 -6.02E+03 3.00E+02 PASS 2.15E+04 1.64E+04 6.64E+04 -2.34E+04 3.00E+02 PASS 9.29E+03 5.90E+03 2.55E+04 -6.87E+03 3.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 357 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.174. Plot of Large Signal Voltage Gain3_2 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 358 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.174. Raw data for Large Signal Voltage Gain3_2 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain3_2 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 2.30E+03 2.74E+03 2.34E+03 1.61E+03 1.93E+03 1.55E+03 2.87E+03 1.76E+03 2.03E+03 1.03E+04 2.14E+03 2.34E+03 24-hr Anneal 225 1.94E+03 3.84E+03 2.06E+03 1.44E+03 2.34E+03 1.64E+03 5.30E+03 2.32E+03 3.11E+03 4.52E+03 2.08E+03 2.27E+03 168-hr Anneal 250 2.23E+03 4.51E+03 2.74E+03 1.46E+03 3.45E+03 1.70E+03 2.94E+03 1.29E+03 2.78E+03 6.82E+03 2.03E+03 2.59E+03 2.24E+03 7.82E+02 4.38E+03 9.16E+01 2.18E+03 4.31E+02 3.36E+03 1.00E+03 2.32E+03 9.10E+02 4.82E+03 -1.71E+02 2.88E+03 1.17E+03 6.08E+03 -3.18E+02 4.53E+03 3.71E+03 1.47E+04 -5.63E+03 3.00E+02 PASS 3.70E+03 3.71E+03 1.39E+04 -6.49E+03 3.00E+02 PASS 3.38E+03 1.51E+03 7.53E+03 -7.76E+02 3.00E+02 PASS 3.10E+03 2.19E+03 9.11E+03 -2.90E+03 3.00E+02 PASS 0 1.20E+04 3.76E+03 2.49E+03 1.60E+03 2.33E+03 1.65E+03 3.17E+03 2.05E+03 2.67E+03 3.64E+03 2.26E+03 2.23E+03 Total 20 2.01E+03 2.82E+03 2.80E+03 1.49E+03 2.98E+03 1.71E+03 5.01E+03 1.51E+03 2.86E+03 3.56E+03 2.08E+03 2.08E+03 Dose (krad(Si)) 50 100 2.00E+03 1.87E+03 3.52E+03 2.48E+03 2.84E+03 2.08E+03 1.82E+03 1.33E+03 2.67E+03 3.42E+03 1.96E+03 1.50E+03 7.29E+03 5.81E+03 2.37E+03 1.72E+03 3.12E+03 3.21E+03 5.17E+03 1.04E+04 2.01E+03 2.20E+03 2.11E+03 2.53E+03 4.43E+03 4.30E+03 1.62E+04 ######## 2.42E+03 6.43E+02 4.18E+03 6.59E+02 2.57E+03 6.84E+02 4.45E+03 6.93E+02 2.63E+03 8.06E+02 4.84E+03 4.25E+02 6.00E+02 PASS 2.93E+03 1.44E+03 6.87E+03 -1.01E+03 3.00E+02 PASS 3.98E+03 2.22E+03 1.01E+04 -2.12E+03 3.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 359 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.175. Plot of Large Signal Voltage Gain3_3 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 360 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.175. Raw data for Large Signal Voltage Gain3_3 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain3_3 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 6.41E+03 3.57E+03 2.80E+03 2.85E+03 4.09E+03 2.21E+03 2.09E+03 8.15E+02 4.30E+03 3.10E+03 1.77E+03 2.17E+03 Total 20 5.93E+03 2.92E+03 2.15E+03 2.89E+03 6.51E+03 2.01E+03 1.90E+03 2.13E+03 6.51E+03 2.75E+03 1.76E+03 2.30E+03 Dose (krad(Si)) 50 100 5.14E+03 6.83E+03 2.86E+03 2.42E+03 2.24E+03 2.37E+03 2.05E+03 2.66E+03 3.97E+03 4.93E+03 1.70E+03 2.18E+03 2.06E+03 1.62E+03 2.59E+03 2.52E+03 4.01E+03 4.58E+03 3.05E+03 3.37E+03 1.68E+03 1.85E+03 2.08E+03 2.37E+03 200 5.63E+03 2.60E+03 2.09E+03 2.87E+03 5.60E+03 2.19E+03 1.82E+03 1.86E+03 2.98E+03 1.76E+03 1.72E+03 2.19E+03 24-hr Anneal 225 3.35E+03 3.30E+03 2.51E+03 3.20E+03 2.87E+03 2.38E+03 1.53E+03 2.21E+03 3.02E+03 3.83E+03 1.66E+03 1.95E+03 168-hr Anneal 250 7.05E+03 2.64E+03 2.47E+03 2.79E+03 4.27E+03 2.16E+03 2.27E+03 2.12E+03 3.99E+03 5.82E+03 1.78E+03 1.98E+03 3.95E+03 1.48E+03 7.99E+03 -1.04E+02 4.08E+03 1.99E+03 9.53E+03 -1.37E+03 3.25E+03 1.30E+03 6.81E+03 -3.03E+02 3.84E+03 1.98E+03 9.27E+03 -1.59E+03 3.76E+03 1.72E+03 8.46E+03 -9.48E+02 3.05E+03 3.53E+02 4.02E+03 2.08E+03 3.84E+03 1.93E+03 9.13E+03 -1.44E+03 2.50E+03 1.29E+03 6.05E+03 -1.04E+03 6.00E+02 PASS 3.06E+03 1.96E+03 8.42E+03 -2.30E+03 3.00E+02 PASS 2.68E+03 8.99E+02 5.15E+03 2.15E+02 3.00E+02 PASS 2.86E+03 1.16E+03 6.02E+03 -3.15E+02 3.00E+02 PASS 2.12E+03 5.09E+02 3.52E+03 7.29E+02 3.00E+02 PASS 2.59E+03 8.73E+02 4.99E+03 1.98E+02 3.00E+02 PASS 3.27E+03 1.63E+03 7.74E+03 -1.19E+03 3.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 361 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.176. Plot of Large Signal Voltage Gain3_4 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 362 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.176. Raw data for Large Signal Voltage Gain3_4 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Large Signal Voltage Gain3_4 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.44E+03 1.73E+03 1.45E+03 1.37E+03 2.53E+03 1.81E+03 1.65E+03 1.76E+03 2.42E+03 2.36E+03 1.83E+03 3.54E+03 24-hr Anneal 225 1.51E+03 1.72E+03 1.95E+03 2.04E+03 2.66E+03 3.49E+03 1.39E+03 1.67E+03 2.42E+03 2.83E+03 1.78E+03 2.57E+03 168-hr Anneal 250 1.66E+03 1.54E+03 2.25E+03 5.27E+03 3.70E+03 2.79E+03 2.04E+03 2.39E+03 3.11E+03 2.56E+03 1.70E+03 2.86E+03 2.07E+03 6.14E+02 3.75E+03 3.84E+02 1.71E+03 4.82E+02 3.03E+03 3.85E+02 1.97E+03 4.32E+02 3.16E+03 7.89E+02 2.88E+03 1.58E+03 7.23E+03 -1.46E+03 2.41E+03 5.92E+02 4.04E+03 7.91E+02 3.00E+02 PASS 2.00E+03 3.63E+02 3.00E+03 1.01E+03 3.00E+02 PASS 2.36E+03 8.58E+02 4.71E+03 9.29E+00 3.00E+02 PASS 2.58E+03 4.02E+02 3.68E+03 1.48E+03 3.00E+02 PASS 0 1.65E+03 1.81E+03 2.55E+03 1.36E+03 3.83E+03 3.63E+03 1.73E+03 2.07E+03 3.89E+03 2.77E+03 2.05E+03 3.28E+03 Total 20 1.72E+03 1.56E+03 1.94E+03 1.36E+03 2.99E+03 2.92E+03 1.64E+03 1.85E+03 3.00E+03 2.29E+03 1.78E+03 2.84E+03 Dose (krad(Si)) 50 100 1.72E+03 1.45E+03 1.65E+03 1.67E+03 1.34E+03 2.56E+03 9.18E+02 1.80E+03 4.82E+03 2.87E+03 2.82E+03 3.45E+03 1.66E+03 2.00E+03 2.20E+03 2.13E+03 4.64E+03 2.32E+03 2.49E+03 2.17E+03 1.93E+03 2.02E+03 3.13E+03 2.97E+03 2.24E+03 9.91E+02 4.96E+03 -4.77E+02 1.91E+03 6.35E+02 3.66E+03 1.73E+02 2.09E+03 1.56E+03 6.36E+03 -2.18E+03 2.82E+03 9.42E+02 5.40E+03 2.33E+02 6.00E+02 PASS 2.34E+03 6.13E+02 4.02E+03 6.58E+02 3.00E+02 PASS 2.76E+03 1.13E+03 5.87E+03 -3.48E+02 3.00E+02 PASS An ISO 9001:2008 and DLA Certified Company 363 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.177. Plot of Common Mode Rejection Ratio2_1 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 364 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.177. Raw data for Common Mode Rejection Ratio2_1 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio2_1 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 9.10E+01 8.96E+01 8.76E+01 8.48E+01 9.65E+01 1.06E+02 9.14E+01 8.19E+01 8.66E+01 8.69E+01 8.56E+01 8.60E+01 24-hr Anneal 225 9.19E+01 9.01E+01 8.82E+01 8.51E+01 9.75E+01 1.05E+02 9.17E+01 8.19E+01 8.67E+01 8.72E+01 8.56E+01 8.61E+01 168-hr Anneal 250 9.36E+01 9.03E+01 8.77E+01 8.55E+01 9.60E+01 1.03E+02 9.16E+01 8.22E+01 8.76E+01 8.80E+01 8.56E+01 8.60E+01 9.04E+01 4.60E+00 1.03E+02 7.78E+01 8.99E+01 4.36E+00 1.02E+02 7.79E+01 9.06E+01 4.61E+00 1.03E+02 7.79E+01 9.06E+01 4.24E+00 1.02E+02 7.90E+01 9.04E+01 8.35E+00 1.13E+02 6.75E+01 7.00E+01 PASS 9.06E+01 9.27E+00 1.16E+02 6.51E+01 7.00E+01 PASS 9.05E+01 8.81E+00 1.15E+02 6.63E+01 7.00E+01 PASS 9.05E+01 7.80E+00 1.12E+02 6.91E+01 7.00E+01 PASS 0 9.26E+01 9.05E+01 8.84E+01 8.50E+01 9.86E+01 9.86E+01 9.35E+01 8.23E+01 8.75E+01 8.81E+01 8.57E+01 8.60E+01 Total 20 9.24E+01 9.05E+01 8.84E+01 8.51E+01 9.87E+01 1.00E+02 9.30E+01 8.22E+01 8.72E+01 8.79E+01 8.57E+01 8.60E+01 Dose (krad(Si)) 50 100 9.19E+01 9.16E+01 9.04E+01 8.99E+01 8.83E+01 8.80E+01 8.50E+01 8.50E+01 9.76E+01 9.73E+01 1.02E+02 1.04E+02 9.24E+01 9.19E+01 8.21E+01 8.20E+01 8.70E+01 8.69E+01 8.76E+01 8.72E+01 8.57E+01 8.56E+01 8.60E+01 8.60E+01 9.10E+01 5.06E+00 1.05E+02 7.71E+01 9.10E+01 5.06E+00 1.05E+02 7.71E+01 9.06E+01 4.66E+00 1.03E+02 7.78E+01 9.00E+01 6.23E+00 1.07E+02 7.29E+01 7.60E+01 PASS 9.00E+01 6.73E+00 1.09E+02 7.16E+01 7.00E+01 PASS 9.02E+01 7.47E+00 1.11E+02 6.97E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 365 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.178. Plot of Common Mode Rejection Ratio2_2 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 366 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.178. Raw data for Common Mode Rejection Ratio2_2 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio2_2 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 8.72E+01 9.14E+01 8.47E+01 9.86E+01 8.53E+01 9.82E+01 8.63E+01 8.48E+01 8.41E+01 9.51E+01 8.61E+01 9.60E+01 24-hr Anneal 225 8.77E+01 9.25E+01 8.50E+01 1.00E+02 8.57E+01 9.86E+01 8.63E+01 8.49E+01 8.43E+01 9.54E+01 8.61E+01 9.61E+01 168-hr Anneal 250 8.75E+01 9.25E+01 8.50E+01 1.02E+02 8.57E+01 1.09E+02 8.71E+01 8.54E+01 8.52E+01 9.69E+01 8.61E+01 9.60E+01 9.00E+01 6.19E+00 1.07E+02 7.31E+01 8.94E+01 5.76E+00 1.05E+02 7.36E+01 9.02E+01 6.36E+00 1.08E+02 7.28E+01 9.06E+01 7.15E+00 1.10E+02 7.10E+01 9.03E+01 6.93E+00 1.09E+02 7.13E+01 7.00E+01 PASS 8.97E+01 6.48E+00 1.07E+02 7.19E+01 7.00E+01 PASS 8.99E+01 6.62E+00 1.08E+02 7.17E+01 7.00E+01 PASS 9.27E+01 1.03E+01 1.21E+02 6.45E+01 7.00E+01 PASS 0 8.79E+01 9.45E+01 8.51E+01 1.01E+02 8.64E+01 1.04E+02 8.71E+01 8.57E+01 8.55E+01 9.81E+01 8.63E+01 9.63E+01 Total 20 8.79E+01 9.38E+01 8.51E+01 1.01E+02 8.62E+01 1.03E+02 8.69E+01 8.55E+01 8.52E+01 9.73E+01 8.62E+01 9.63E+01 Dose (krad(Si)) 50 100 8.78E+01 8.74E+01 9.31E+01 9.25E+01 8.50E+01 8.48E+01 9.99E+01 9.98E+01 8.59E+01 8.56E+01 1.02E+02 9.96E+01 8.66E+01 8.65E+01 8.52E+01 8.49E+01 8.49E+01 8.46E+01 9.64E+01 9.57E+01 8.62E+01 8.62E+01 9.62E+01 9.62E+01 9.10E+01 6.74E+00 1.10E+02 7.26E+01 9.08E+01 6.57E+00 1.09E+02 7.27E+01 9.03E+01 6.22E+00 1.07E+02 7.33E+01 9.22E+01 8.63E+00 1.16E+02 6.85E+01 7.60E+01 PASS 9.17E+01 8.26E+00 1.14E+02 6.90E+01 7.00E+01 PASS 9.09E+01 7.63E+00 1.12E+02 7.00E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 367 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.179. Plot of Common Mode Rejection Ratio2_3 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 368 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.179. Raw data for Common Mode Rejection Ratio2_3 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio2_3 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 8.97E+01 1.01E+02 8.47E+01 9.33E+01 8.31E+01 9.63E+01 9.12E+01 8.45E+01 8.73E+01 8.33E+01 9.60E+01 8.92E+01 24-hr Anneal 225 9.02E+01 1.04E+02 8.51E+01 9.44E+01 8.34E+01 9.65E+01 9.13E+01 8.46E+01 8.74E+01 8.33E+01 9.62E+01 8.93E+01 168-hr Anneal 250 8.97E+01 1.09E+02 8.58E+01 9.37E+01 8.41E+01 1.01E+02 9.23E+01 8.46E+01 8.89E+01 8.42E+01 9.64E+01 8.93E+01 9.13E+01 8.10E+00 1.14E+02 6.91E+01 9.04E+01 7.25E+00 1.10E+02 7.05E+01 9.13E+01 8.07E+00 1.13E+02 6.92E+01 9.26E+01 1.01E+01 1.20E+02 6.47E+01 8.90E+01 5.61E+00 1.04E+02 7.36E+01 7.00E+01 PASS 8.85E+01 5.29E+00 1.03E+02 7.40E+01 7.00E+01 PASS 8.86E+01 5.36E+00 1.03E+02 7.39E+01 7.00E+01 PASS 9.02E+01 6.93E+00 1.09E+02 7.12E+01 7.00E+01 PASS 0 9.14E+01 1.08E+02 8.49E+01 9.76E+01 8.38E+01 1.00E+02 9.40E+01 8.48E+01 8.87E+01 8.46E+01 9.57E+01 8.95E+01 Total 20 9.10E+01 1.07E+02 8.50E+01 9.65E+01 8.36E+01 9.89E+01 9.31E+01 8.47E+01 8.84E+01 8.43E+01 9.58E+01 8.94E+01 Dose (krad(Si)) 50 100 9.06E+01 9.02E+01 1.05E+02 1.03E+02 8.49E+01 8.48E+01 9.60E+01 9.48E+01 8.36E+01 8.34E+01 9.78E+01 9.71E+01 9.25E+01 9.20E+01 8.46E+01 8.45E+01 8.81E+01 8.77E+01 8.40E+01 8.36E+01 9.59E+01 9.60E+01 8.95E+01 8.94E+01 9.30E+01 9.83E+00 1.20E+02 6.61E+01 9.26E+01 9.48E+00 1.19E+02 6.66E+01 9.21E+01 8.93E+00 1.17E+02 6.76E+01 9.05E+01 6.73E+00 1.09E+02 7.20E+01 7.60E+01 PASS 8.99E+01 6.19E+00 1.07E+02 7.29E+01 7.00E+01 PASS 8.94E+01 5.81E+00 1.05E+02 7.35E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 369 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.180. Plot of Common Mode Rejection Ratio2_4 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 370 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.180. Raw data for Common Mode Rejection Ratio2_4 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio2_4 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.01E+02 9.01E+01 8.70E+01 8.68E+01 8.74E+01 9.52E+01 9.04E+01 9.05E+01 9.38E+01 1.07E+02 9.60E+01 8.53E+01 24-hr Anneal 225 1.05E+02 9.10E+01 8.74E+01 8.72E+01 8.78E+01 9.56E+01 9.06E+01 9.08E+01 9.35E+01 1.07E+02 9.57E+01 8.53E+01 168-hr Anneal 250 1.14E+02 9.17E+01 8.76E+01 8.85E+01 8.72E+01 9.78E+01 9.03E+01 9.40E+01 9.37E+01 1.05E+02 9.56E+01 8.54E+01 9.16E+01 7.49E+00 1.12E+02 7.11E+01 9.04E+01 5.99E+00 1.07E+02 7.40E+01 9.16E+01 7.40E+00 1.12E+02 7.13E+01 9.38E+01 1.14E+01 1.25E+02 6.25E+01 9.54E+01 6.21E+00 1.12E+02 7.84E+01 7.00E+01 PASS 9.55E+01 6.98E+00 1.15E+02 7.63E+01 7.00E+01 PASS 9.54E+01 6.59E+00 1.13E+02 7.74E+01 7.00E+01 PASS 9.61E+01 5.61E+00 1.12E+02 8.07E+01 7.00E+01 PASS 0 1.11E+02 9.29E+01 8.81E+01 8.78E+01 8.85E+01 1.00E+02 9.24E+01 9.31E+01 9.13E+01 1.02E+02 9.62E+01 8.54E+01 Total 20 1.08E+02 9.23E+01 8.79E+01 8.76E+01 8.83E+01 9.93E+01 9.19E+01 9.26E+01 9.17E+01 1.03E+02 9.61E+01 8.54E+01 Dose (krad(Si)) 50 100 1.06E+02 1.05E+02 9.17E+01 9.10E+01 8.77E+01 8.74E+01 8.74E+01 8.71E+01 8.81E+01 8.79E+01 9.78E+01 9.63E+01 9.13E+01 9.09E+01 9.17E+01 9.11E+01 9.25E+01 9.29E+01 1.04E+02 1.06E+02 9.61E+01 9.60E+01 8.54E+01 8.54E+01 9.37E+01 1.00E+01 1.21E+02 6.63E+01 9.29E+01 8.79E+00 1.17E+02 6.88E+01 9.22E+01 8.07E+00 1.14E+02 7.01E+01 9.59E+01 5.05E+00 1.10E+02 8.21E+01 7.60E+01 PASS 9.57E+01 5.18E+00 1.10E+02 8.15E+01 7.00E+01 PASS 9.55E+01 5.62E+00 1.11E+02 8.01E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 371 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.181. Plot of CMRR Match2 1 to 4 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 372 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.181. Raw data for CMRR Match2 1 to 4 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR Match2 1 to 4 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 9.44E+01 1.15E+02 1.10E+02 9.87E+01 9.12E+01 9.30E+01 1.10E+02 8.59E+01 8.35E+01 8.61E+01 8.88E+01 1.08E+02 24-hr Anneal 225 9.42E+01 1.10E+02 1.08E+02 9.87E+01 9.12E+01 9.30E+01 1.09E+02 8.58E+01 8.34E+01 8.63E+01 8.88E+01 1.07E+02 168-hr Anneal 250 9.44E+01 1.07E+02 1.25E+02 9.63E+01 9.11E+01 9.40E+01 1.07E+02 8.48E+01 8.41E+01 8.69E+01 8.88E+01 1.08E+02 1.00E+02 8.41E+00 1.23E+02 7.73E+01 1.02E+02 1.01E+01 1.30E+02 7.41E+01 1.01E+02 8.40E+00 1.24E+02 7.75E+01 1.03E+02 1.37E+01 1.40E+02 6.53E+01 9.18E+01 1.09E+01 1.22E+02 6.18E+01 7.00E+01 PASS 9.17E+01 1.09E+01 1.21E+02 6.20E+01 7.00E+01 PASS 9.15E+01 1.04E+01 1.20E+02 6.29E+01 7.00E+01 PASS 9.14E+01 9.72E+00 1.18E+02 6.48E+01 7.00E+01 PASS 0 9.37E+01 1.02E+02 1.22E+02 9.62E+01 9.17E+01 9.35E+01 1.11E+02 8.53E+01 8.32E+01 8.65E+01 8.88E+01 1.08E+02 Total 20 9.39E+01 1.05E+02 1.13E+02 9.71E+01 9.15E+01 9.36E+01 1.11E+02 8.53E+01 8.32E+01 8.65E+01 8.88E+01 1.08E+02 Dose (krad(Si)) 50 100 9.37E+01 9.37E+01 1.07E+02 1.08E+02 1.11E+02 1.10E+02 9.75E+01 9.82E+01 9.17E+01 9.15E+01 9.35E+01 9.33E+01 1.10E+02 1.10E+02 8.56E+01 8.57E+01 8.33E+01 8.34E+01 8.64E+01 8.63E+01 8.88E+01 8.88E+01 1.08E+02 1.08E+02 1.01E+02 1.22E+01 1.34E+02 6.77E+01 1.00E+02 8.68E+00 1.24E+02 7.62E+01 1.00E+02 8.46E+00 1.23E+02 7.70E+01 9.19E+01 1.14E+01 1.23E+02 6.07E+01 7.50E+01 PASS 9.18E+01 1.12E+01 1.23E+02 6.11E+01 7.00E+01 PASS 9.17E+01 1.07E+01 1.21E+02 6.23E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 373 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.182. Plot of CMRR Match2 2 to 3 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 374 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.182. Raw data for CMRR Match2 2 to 3 5V (dB) @ VS=+5V, VCM=0 to +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR Match2 2 to 3 5V (dB) @ VS=+5V, VCM=0 to +5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 9.93E+01 9.49E+01 1.36E+02 1.00E+02 9.62E+01 1.10E+02 9.37E+01 1.15E+02 9.46E+01 8.58E+01 8.37E+01 9.46E+01 24-hr Anneal 225 9.97E+01 9.54E+01 1.24E+02 1.00E+02 9.64E+01 1.10E+02 9.35E+01 1.13E+02 9.46E+01 8.58E+01 8.38E+01 9.46E+01 168-hr Anneal 250 1.00E+02 9.38E+01 1.06E+02 9.77E+01 9.95E+01 1.06E+02 9.39E+01 1.06E+02 9.44E+01 8.64E+01 8.38E+01 9.47E+01 1.04E+02 1.32E+01 1.40E+02 6.78E+01 1.05E+02 1.73E+01 1.53E+02 5.78E+01 1.03E+02 1.19E+01 1.36E+02 7.05E+01 9.95E+01 4.35E+00 1.11E+02 8.75E+01 9.89E+01 1.08E+01 1.29E+02 6.92E+01 7.00E+01 PASS 9.99E+01 1.23E+01 1.33E+02 6.63E+01 7.00E+01 PASS 9.93E+01 1.15E+01 1.31E+02 6.78E+01 7.00E+01 PASS 9.73E+01 8.37E+00 1.20E+02 7.43E+01 7.00E+01 PASS 0 9.77E+01 9.66E+01 1.20E+02 1.07E+02 9.52E+01 1.09E+02 9.24E+01 1.05E+02 9.54E+01 8.66E+01 8.37E+01 9.47E+01 Total 20 9.84E+01 9.60E+01 1.24E+02 1.05E+02 9.56E+01 1.07E+02 9.28E+01 1.06E+02 9.53E+01 8.65E+01 8.37E+01 9.47E+01 Dose (krad(Si)) 50 100 9.89E+01 9.86E+01 9.55E+01 9.55E+01 1.41E+02 1.27E+02 1.05E+02 1.02E+02 9.61E+01 9.62E+01 1.07E+02 1.09E+02 9.29E+01 9.31E+01 1.08E+02 1.11E+02 9.51E+01 9.50E+01 8.63E+01 8.61E+01 8.37E+01 8.37E+01 9.48E+01 9.47E+01 1.03E+02 1.04E+01 1.32E+02 7.48E+01 1.04E+02 1.18E+01 1.36E+02 7.14E+01 1.07E+02 1.93E+01 1.60E+02 5.43E+01 9.77E+01 9.31E+00 1.23E+02 7.22E+01 7.50E+01 PASS 9.75E+01 8.77E+00 1.22E+02 7.34E+01 7.00E+01 PASS 9.78E+01 9.31E+00 1.23E+02 7.23E+01 7.00E+01 PASS An ISO 9001:2008 and DLA Certified Company 375 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.183. Plot of Power Supply Rejection Ratio2_1 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 376 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.183. Raw data for Power Supply Rejection Ratio2_1 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio2_1 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.10E+02 1.08E+02 1.09E+02 1.28E+02 1.12E+02 1.09E+02 1.47E+02 1.16E+02 1.20E+02 1.19E+02 1.06E+02 1.30E+02 24-hr Anneal 225 1.10E+02 1.07E+02 1.09E+02 1.30E+02 1.12E+02 1.09E+02 1.46E+02 1.16E+02 1.21E+02 1.19E+02 1.06E+02 1.31E+02 168-hr Anneal 250 1.10E+02 1.07E+02 1.09E+02 1.34E+02 1.12E+02 1.09E+02 1.43E+02 1.16E+02 1.20E+02 1.19E+02 1.06E+02 1.29E+02 1.14E+02 1.07E+01 1.43E+02 8.44E+01 1.13E+02 8.25E+00 1.36E+02 9.04E+01 1.14E+02 9.33E+00 1.39E+02 8.79E+01 1.14E+02 1.11E+01 1.45E+02 8.39E+01 1.21E+02 1.28E+01 1.56E+02 8.60E+01 8.80E+01 PASS 1.22E+02 1.42E+01 1.61E+02 8.33E+01 8.80E+01 PASS 1.22E+02 1.42E+01 1.61E+02 8.33E+01 8.80E+01 PASS 1.21E+02 1.28E+01 1.57E+02 8.62E+01 8.80E+01 PASS 0 1.10E+02 1.07E+02 1.08E+02 1.35E+02 1.12E+02 1.09E+02 1.48E+02 1.16E+02 1.20E+02 1.19E+02 1.07E+02 1.30E+02 Total 20 1.10E+02 1.07E+02 1.08E+02 1.33E+02 1.12E+02 1.09E+02 1.49E+02 1.16E+02 1.20E+02 1.19E+02 1.06E+02 1.30E+02 Dose (krad(Si)) 50 100 1.10E+02 1.09E+02 1.07E+02 1.07E+02 1.08E+02 1.08E+02 1.31E+02 1.33E+02 1.12E+02 1.11E+02 1.09E+02 1.09E+02 1.61E+02 1.43E+02 1.16E+02 1.16E+02 1.20E+02 1.20E+02 1.19E+02 1.19E+02 1.07E+02 1.06E+02 1.31E+02 1.31E+02 1.14E+02 1.17E+01 1.46E+02 8.22E+01 1.14E+02 1.10E+01 1.44E+02 8.38E+01 1.14E+02 9.82E+00 1.40E+02 8.67E+01 1.22E+02 1.52E+01 1.64E+02 8.08E+01 8.80E+01 PASS 1.22E+02 1.54E+01 1.65E+02 8.03E+01 8.80E+01 PASS 1.25E+02 2.05E+01 1.81E+02 6.87E+01 8.80E+01 PASS An ISO 9001:2008 and DLA Certified Company 377 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.184. Plot of Power Supply Rejection Ratio2_2 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 378 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.184. Raw data for Power Supply Rejection Ratio2_2 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio2_2 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.14E+02 1.14E+02 1.28E+02 1.13E+02 1.13E+02 1.12E+02 1.16E+02 1.12E+02 1.17E+02 1.10E+02 1.08E+02 1.18E+02 24-hr Anneal 225 1.15E+02 1.13E+02 1.28E+02 1.13E+02 1.13E+02 1.11E+02 1.16E+02 1.12E+02 1.17E+02 1.10E+02 1.08E+02 1.19E+02 168-hr Anneal 250 1.15E+02 1.13E+02 1.27E+02 1.13E+02 1.13E+02 1.12E+02 1.17E+02 1.12E+02 1.17E+02 1.10E+02 1.08E+02 1.19E+02 1.16E+02 5.97E+00 1.32E+02 9.98E+01 1.16E+02 6.64E+00 1.35E+02 9.83E+01 1.16E+02 6.27E+00 1.34E+02 9.92E+01 1.16E+02 6.11E+00 1.33E+02 9.96E+01 1.13E+02 3.05E+00 1.22E+02 1.05E+02 8.80E+01 PASS 1.13E+02 2.83E+00 1.21E+02 1.06E+02 8.80E+01 PASS 1.14E+02 3.13E+00 1.22E+02 1.05E+02 8.80E+01 PASS 1.14E+02 3.28E+00 1.23E+02 1.05E+02 8.80E+01 PASS 0 1.15E+02 1.13E+02 1.25E+02 1.13E+02 1.13E+02 1.11E+02 1.16E+02 1.12E+02 1.18E+02 1.10E+02 1.08E+02 1.19E+02 Total 20 1.15E+02 1.13E+02 1.25E+02 1.13E+02 1.13E+02 1.11E+02 1.17E+02 1.12E+02 1.17E+02 1.10E+02 1.08E+02 1.19E+02 Dose (krad(Si)) 50 100 1.15E+02 1.14E+02 1.13E+02 1.13E+02 1.25E+02 1.27E+02 1.13E+02 1.13E+02 1.13E+02 1.14E+02 1.12E+02 1.11E+02 1.17E+02 1.16E+02 1.11E+02 1.13E+02 1.17E+02 1.17E+02 1.10E+02 1.10E+02 1.08E+02 1.08E+02 1.19E+02 1.19E+02 1.16E+02 5.41E+00 1.31E+02 1.01E+02 1.16E+02 5.36E+00 1.31E+02 1.01E+02 1.16E+02 5.29E+00 1.30E+02 1.01E+02 1.13E+02 3.32E+00 1.22E+02 1.04E+02 8.80E+01 PASS 1.14E+02 3.47E+00 1.23E+02 1.04E+02 8.80E+01 PASS 1.13E+02 3.48E+00 1.23E+02 1.04E+02 8.80E+01 PASS An ISO 9001:2008 and DLA Certified Company 379 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.185. Plot of Power Supply Rejection Ratio2_3 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 380 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.185. Raw data for Power Supply Rejection Ratio2_3 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio2_3 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.21E+02 1.28E+02 1.30E+02 1.11E+02 1.21E+02 1.15E+02 1.15E+02 1.17E+02 1.15E+02 1.15E+02 1.13E+02 1.14E+02 24-hr Anneal 225 1.22E+02 1.30E+02 1.31E+02 1.11E+02 1.22E+02 1.15E+02 1.15E+02 1.17E+02 1.15E+02 1.14E+02 1.12E+02 1.15E+02 168-hr Anneal 250 1.21E+02 1.29E+02 1.31E+02 1.11E+02 1.21E+02 1.14E+02 1.14E+02 1.17E+02 1.15E+02 1.14E+02 1.13E+02 1.14E+02 1.23E+02 7.68E+00 1.44E+02 1.02E+02 1.22E+02 7.42E+00 1.42E+02 1.02E+02 1.23E+02 8.20E+00 1.46E+02 1.01E+02 1.23E+02 7.90E+00 1.44E+02 1.01E+02 1.15E+02 1.15E+00 1.18E+02 1.12E+02 8.80E+01 PASS 1.15E+02 8.90E-01 1.18E+02 1.13E+02 8.80E+01 PASS 1.15E+02 8.59E-01 1.17E+02 1.13E+02 8.80E+01 PASS 1.15E+02 1.37E+00 1.18E+02 1.11E+02 8.80E+01 PASS 0 1.20E+02 1.28E+02 1.30E+02 1.11E+02 1.21E+02 1.14E+02 1.14E+02 1.17E+02 1.16E+02 1.14E+02 1.13E+02 1.14E+02 Total 20 1.21E+02 1.29E+02 1.31E+02 1.11E+02 1.22E+02 1.14E+02 1.14E+02 1.17E+02 1.15E+02 1.14E+02 1.12E+02 1.14E+02 Dose (krad(Si)) 50 100 1.20E+02 1.21E+02 1.30E+02 1.31E+02 1.32E+02 1.28E+02 1.11E+02 1.11E+02 1.22E+02 1.22E+02 1.14E+02 1.14E+02 1.14E+02 1.14E+02 1.17E+02 1.17E+02 1.15E+02 1.15E+02 1.14E+02 1.15E+02 1.12E+02 1.12E+02 1.14E+02 1.14E+02 1.22E+02 7.72E+00 1.43E+02 1.01E+02 1.23E+02 7.82E+00 1.44E+02 1.01E+02 1.23E+02 8.44E+00 1.46E+02 9.99E+01 1.15E+02 1.51E+00 1.19E+02 1.11E+02 8.80E+01 PASS 1.15E+02 1.17E+00 1.18E+02 1.12E+02 8.80E+01 PASS 1.15E+02 1.33E+00 1.19E+02 1.11E+02 8.80E+01 PASS An ISO 9001:2008 and DLA Certified Company 381 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.186. Plot of Power Supply Rejection Ratio2_4 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 382 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.186. Raw data for Power Supply Rejection Ratio2_4 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio2_4 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 1.69E+02 1.19E+02 1.16E+02 1.11E+02 1.13E+02 1.16E+02 1.07E+02 1.07E+02 1.14E+02 1.05E+02 1.03E+02 1.10E+02 24-hr Anneal 225 1.41E+02 1.16E+02 1.15E+02 1.12E+02 1.14E+02 1.16E+02 1.07E+02 1.07E+02 1.14E+02 1.05E+02 1.03E+02 1.10E+02 168-hr Anneal 250 1.36E+02 1.16E+02 1.15E+02 1.11E+02 1.14E+02 1.16E+02 1.07E+02 1.07E+02 1.14E+02 1.04E+02 1.03E+02 1.10E+02 1.19E+02 1.01E+01 1.47E+02 9.13E+01 1.26E+02 2.47E+01 1.93E+02 5.78E+01 1.20E+02 1.20E+01 1.52E+02 8.68E+01 1.19E+02 1.00E+01 1.46E+02 9.10E+01 1.10E+02 5.00E+00 1.23E+02 9.60E+01 8.80E+01 PASS 1.10E+02 4.88E+00 1.23E+02 9.65E+01 8.80E+01 PASS 1.10E+02 4.91E+00 1.23E+02 9.63E+01 8.80E+01 PASS 1.10E+02 4.93E+00 1.23E+02 9.62E+01 8.80E+01 PASS 0 1.34E+02 1.15E+02 1.15E+02 1.11E+02 1.14E+02 1.16E+02 1.07E+02 1.07E+02 1.14E+02 1.04E+02 1.03E+02 1.10E+02 Total 20 1.35E+02 1.16E+02 1.15E+02 1.11E+02 1.14E+02 1.16E+02 1.07E+02 1.07E+02 1.14E+02 1.04E+02 1.03E+02 1.10E+02 Dose (krad(Si)) 50 100 1.37E+02 1.37E+02 1.16E+02 1.16E+02 1.15E+02 1.15E+02 1.12E+02 1.12E+02 1.14E+02 1.14E+02 1.15E+02 1.16E+02 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.14E+02 1.14E+02 1.04E+02 1.04E+02 1.03E+02 1.03E+02 1.10E+02 1.10E+02 1.18E+02 9.35E+00 1.43E+02 9.22E+01 1.18E+02 9.39E+00 1.44E+02 9.25E+01 1.19E+02 1.06E+01 1.48E+02 8.98E+01 1.10E+02 4.87E+00 1.23E+02 9.63E+01 8.80E+01 PASS 1.10E+02 4.94E+00 1.23E+02 9.62E+01 8.80E+01 PASS 1.10E+02 4.83E+00 1.23E+02 9.64E+01 8.80E+01 PASS An ISO 9001:2008 and DLA Certified Company 383 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.187. Plot of PSRR Match2 1 to 4 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 384 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.187. Raw data for PSRR Match2 1 to 4 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR Match2 1 to 4 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 1.13E+02 1.15E+02 1.16E+02 1.13E+02 1.30E+02 1.16E+02 1.09E+02 1.13E+02 1.13E+02 1.08E+02 1.16E+02 1.13E+02 Biased Statistics Average Biased 1.17E+02 Std Dev Biased 7.20E+00 Ps90%/90% (+KTL) Biased 1.37E+02 Ps90%/90% (-KTL) Biased 9.76E+01 Un-Biased Statistics Average Un-Biased 1.12E+02 Std Dev Un-Biased 3.03E+00 Ps90%/90% (+KTL) Un-Biased 1.20E+02 Ps90%/90% (-KTL) Un-Biased 1.04E+02 Specification MIN 8.20E+01 Status PASS 200 1.12E+02 1.13E+02 1.16E+02 1.12E+02 1.29E+02 1.17E+02 1.09E+02 1.13E+02 1.13E+02 1.09E+02 1.16E+02 1.13E+02 24-hr Anneal 225 1.12E+02 1.14E+02 1.16E+02 1.13E+02 1.27E+02 1.17E+02 1.09E+02 1.13E+02 1.13E+02 1.09E+02 1.16E+02 1.13E+02 168-hr Anneal 250 1.13E+02 1.13E+02 1.16E+02 1.13E+02 1.31E+02 1.16E+02 1.09E+02 1.13E+02 1.13E+02 1.09E+02 1.16E+02 1.14E+02 1.16E+02 4.93E+00 1.29E+02 1.02E+02 1.16E+02 7.18E+00 1.36E+02 9.67E+01 1.17E+02 6.20E+00 1.34E+02 9.96E+01 1.17E+02 7.64E+00 1.38E+02 9.62E+01 1.12E+02 3.23E+00 1.21E+02 1.03E+02 8.20E+01 PASS 1.12E+02 3.35E+00 1.22E+02 1.03E+02 8.20E+01 PASS 1.12E+02 3.34E+00 1.21E+02 1.03E+02 8.20E+01 PASS 1.12E+02 3.20E+00 1.21E+02 1.03E+02 8.20E+01 PASS Total 20 1.13E+02 1.13E+02 1.16E+02 1.13E+02 1.28E+02 1.16E+02 1.09E+02 1.13E+02 1.13E+02 1.09E+02 1.16E+02 1.13E+02 Dose (krad(Si)) 50 100 1.12E+02 1.12E+02 1.14E+02 1.13E+02 1.16E+02 1.16E+02 1.13E+02 1.14E+02 1.27E+02 1.24E+02 1.17E+02 1.17E+02 1.10E+02 1.09E+02 1.13E+02 1.13E+02 1.13E+02 1.13E+02 1.08E+02 1.08E+02 1.16E+02 1.16E+02 1.13E+02 1.13E+02 1.16E+02 6.54E+00 1.34E+02 9.85E+01 1.16E+02 6.06E+00 1.33E+02 9.98E+01 1.12E+02 2.95E+00 1.20E+02 1.04E+02 8.20E+01 PASS 1.12E+02 3.36E+00 1.21E+02 1.03E+02 8.20E+01 PASS An ISO 9001:2008 and DLA Certified Company 385 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.188. Plot of PSRR Match2 2 to 3 (dB) @ VS=+4.5V to +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 386 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.188. Raw data for PSRR Match2 2 to 3 (dB) @ VS=+4.5V to +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR Match2 2 to 3 (dB) @ VS=+4.5V to +12V Device 543 544 545 546 547 548 549 559 560 561 562 563 0 1.24E+02 1.14E+02 1.34E+02 1.27E+02 1.12E+02 1.26E+02 1.31E+02 1.10E+02 1.13E+02 1.21E+02 1.17E+02 1.25E+02 Biased Statistics Average Biased 1.22E+02 Std Dev Biased 9.14E+00 Ps90%/90% (+KTL) Biased 1.47E+02 Ps90%/90% (-KTL) Biased 9.72E+01 Un-Biased Statistics Average Un-Biased 1.20E+02 Std Dev Un-Biased 8.81E+00 Ps90%/90% (+KTL) Un-Biased 1.44E+02 Ps90%/90% (-KTL) Un-Biased 9.60E+01 Specification MIN 8.20E+01 Status PASS 200 1.22E+02 1.14E+02 1.49E+02 1.27E+02 1.13E+02 1.25E+02 1.33E+02 1.10E+02 1.12E+02 1.21E+02 1.17E+02 1.26E+02 24-hr Anneal 225 1.23E+02 1.15E+02 1.40E+02 1.27E+02 1.13E+02 1.24E+02 1.32E+02 1.10E+02 1.12E+02 1.21E+02 1.17E+02 1.25E+02 168-hr Anneal 250 1.23E+02 1.14E+02 1.39E+02 1.26E+02 1.13E+02 1.26E+02 1.26E+02 1.10E+02 1.12E+02 1.22E+02 1.17E+02 1.25E+02 1.24E+02 1.27E+01 1.59E+02 8.93E+01 1.25E+02 1.44E+01 1.65E+02 8.54E+01 1.23E+02 1.07E+01 1.53E+02 9.38E+01 1.23E+02 1.05E+01 1.52E+02 9.41E+01 1.20E+02 8.88E+00 1.44E+02 9.58E+01 8.20E+01 PASS 1.20E+02 9.24E+00 1.46E+02 9.50E+01 8.20E+01 PASS 1.20E+02 8.90E+00 1.44E+02 9.56E+01 8.20E+01 PASS 1.19E+02 7.63E+00 1.40E+02 9.85E+01 8.20E+01 PASS Total 20 1.23E+02 1.14E+02 1.34E+02 1.27E+02 1.13E+02 1.25E+02 1.27E+02 1.10E+02 1.13E+02 1.21E+02 1.17E+02 1.25E+02 Dose (krad(Si)) 50 100 1.23E+02 1.22E+02 1.14E+02 1.14E+02 1.33E+02 1.44E+02 1.27E+02 1.27E+02 1.13E+02 1.13E+02 1.25E+02 1.25E+02 1.27E+02 1.32E+02 1.10E+02 1.11E+02 1.12E+02 1.12E+02 1.20E+02 1.20E+02 1.18E+02 1.17E+02 1.25E+02 1.25E+02 1.22E+02 9.01E+00 1.47E+02 9.74E+01 1.22E+02 8.54E+00 1.45E+02 9.86E+01 1.19E+02 7.64E+00 1.40E+02 9.84E+01 8.20E+01 PASS 1.19E+02 7.63E+00 1.40E+02 9.82E+01 8.20E+01 PASS An ISO 9001:2008 and DLA Certified Company 387 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.189. Plot of +Short-Circuit Current2_1 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 388 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.189. Raw data for +Short-Circuit Current2_1 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current2_1 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -2.40E-02 -2.23E-02 -2.34E-02 -2.25E-02 -2.24E-02 -2.40E-02 -2.21E-02 -2.39E-02 -2.42E-02 -2.22E-02 -2.65E-02 -2.58E-02 24-hr Anneal 225 -2.44E-02 -2.27E-02 -2.38E-02 -2.29E-02 -2.28E-02 -2.41E-02 -2.23E-02 -2.41E-02 -2.43E-02 -2.23E-02 -2.65E-02 -2.57E-02 168-hr Anneal 250 -2.52E-02 -2.35E-02 -2.45E-02 -2.36E-02 -2.35E-02 -2.49E-02 -2.30E-02 -2.47E-02 -2.49E-02 -2.30E-02 -2.65E-02 -2.57E-02 -2.35E-02 7.51E-04 -2.15E-02 -2.56E-02 -2.29E-02 7.34E-04 -2.09E-02 -2.50E-02 -2.33E-02 7.57E-04 -2.12E-02 -2.54E-02 -2.41E-02 7.74E-04 -2.19E-02 -2.62E-02 -2.39E-02 1.05E-03 -2.10E-02 -2.67E-02 -8.00E-03 PASS -2.33E-02 1.05E-03 -2.04E-02 -2.62E-02 -8.00E-03 PASS -2.34E-02 1.04E-03 -2.06E-02 -2.63E-02 -8.00E-03 PASS -2.41E-02 1.04E-03 -2.13E-02 -2.69E-02 -8.00E-03 PASS 0 -2.61E-02 -2.43E-02 -2.53E-02 -2.44E-02 -2.43E-02 -2.57E-02 -2.37E-02 -2.54E-02 -2.57E-02 -2.37E-02 -2.65E-02 -2.57E-02 Total 20 -2.55E-02 -2.37E-02 -2.48E-02 -2.39E-02 -2.38E-02 -2.55E-02 -2.34E-02 -2.52E-02 -2.54E-02 -2.34E-02 -2.65E-02 -2.57E-02 Dose (krad(Si)) 50 100 -2.51E-02 -2.46E-02 -2.33E-02 -2.29E-02 -2.44E-02 -2.40E-02 -2.35E-02 -2.31E-02 -2.34E-02 -2.30E-02 -2.51E-02 -2.46E-02 -2.31E-02 -2.27E-02 -2.49E-02 -2.45E-02 -2.51E-02 -2.48E-02 -2.31E-02 -2.27E-02 -2.65E-02 -2.65E-02 -2.58E-02 -2.58E-02 -2.49E-02 8.02E-04 -2.27E-02 -2.71E-02 -2.44E-02 7.92E-04 -2.22E-02 -2.65E-02 -2.40E-02 7.73E-04 -2.18E-02 -2.61E-02 -2.48E-02 1.06E-03 -2.19E-02 -2.77E-02 -1.25E-02 PASS -2.46E-02 1.05E-03 -2.17E-02 -2.75E-02 -8.00E-03 PASS -2.43E-02 1.05E-03 -2.14E-02 -2.71E-02 -8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 389 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.190. Plot of +Short-Circuit Current2_2 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 390 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.190. Raw data for +Short-Circuit Current2_2 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current2_2 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -2.29E-02 -2.24E-02 -2.22E-02 -2.28E-02 -2.21E-02 -2.23E-02 -2.16E-02 -2.34E-02 -2.20E-02 -2.16E-02 -2.56E-02 -2.67E-02 24-hr Anneal 225 -2.32E-02 -2.28E-02 -2.26E-02 -2.31E-02 -2.25E-02 -2.25E-02 -2.17E-02 -2.36E-02 -2.22E-02 -2.17E-02 -2.56E-02 -2.67E-02 168-hr Anneal 250 -2.40E-02 -2.35E-02 -2.33E-02 -2.39E-02 -2.33E-02 -2.32E-02 -2.24E-02 -2.43E-02 -2.29E-02 -2.25E-02 -2.55E-02 -2.67E-02 -2.30E-02 3.45E-04 -2.21E-02 -2.40E-02 -2.25E-02 3.47E-04 -2.15E-02 -2.34E-02 -2.28E-02 3.37E-04 -2.19E-02 -2.38E-02 -2.36E-02 3.26E-04 -2.27E-02 -2.45E-02 -2.28E-02 7.67E-04 -2.07E-02 -2.49E-02 -8.00E-03 PASS -2.22E-02 7.66E-04 -2.01E-02 -2.43E-02 -8.00E-03 PASS -2.23E-02 7.65E-04 -2.02E-02 -2.44E-02 -8.00E-03 PASS -2.31E-02 7.74E-04 -2.09E-02 -2.52E-02 -8.00E-03 PASS 0 -2.49E-02 -2.43E-02 -2.42E-02 -2.47E-02 -2.42E-02 -2.40E-02 -2.32E-02 -2.51E-02 -2.37E-02 -2.32E-02 -2.55E-02 -2.67E-02 Total 20 -2.44E-02 -2.38E-02 -2.36E-02 -2.41E-02 -2.36E-02 -2.37E-02 -2.29E-02 -2.48E-02 -2.34E-02 -2.29E-02 -2.56E-02 -2.67E-02 Dose (krad(Si)) 50 100 -2.39E-02 -2.35E-02 -2.34E-02 -2.29E-02 -2.32E-02 -2.28E-02 -2.38E-02 -2.34E-02 -2.32E-02 -2.27E-02 -2.34E-02 -2.30E-02 -2.26E-02 -2.22E-02 -2.45E-02 -2.41E-02 -2.30E-02 -2.27E-02 -2.26E-02 -2.22E-02 -2.55E-02 -2.55E-02 -2.67E-02 -2.67E-02 -2.44E-02 3.39E-04 -2.35E-02 -2.54E-02 -2.39E-02 3.38E-04 -2.30E-02 -2.48E-02 -2.35E-02 3.41E-04 -2.26E-02 -2.44E-02 -2.38E-02 8.05E-04 -2.16E-02 -2.60E-02 -1.25E-02 PASS -2.35E-02 7.78E-04 -2.14E-02 -2.57E-02 -8.00E-03 PASS -2.32E-02 7.74E-04 -2.11E-02 -2.53E-02 -8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 391 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.191. Plot of +Short-Circuit Current2_3 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 392 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.191. Raw data for +Short-Circuit Current2_3 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current2_3 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -2.30E-02 -2.27E-02 -2.20E-02 -2.29E-02 -2.20E-02 -2.23E-02 -2.17E-02 -2.39E-02 -2.22E-02 -2.14E-02 -2.57E-02 -2.65E-02 24-hr Anneal 225 -2.34E-02 -2.31E-02 -2.24E-02 -2.32E-02 -2.24E-02 -2.25E-02 -2.19E-02 -2.40E-02 -2.24E-02 -2.15E-02 -2.57E-02 -2.65E-02 168-hr Anneal 250 -2.42E-02 -2.38E-02 -2.31E-02 -2.39E-02 -2.32E-02 -2.33E-02 -2.26E-02 -2.48E-02 -2.30E-02 -2.22E-02 -2.57E-02 -2.65E-02 -2.31E-02 4.92E-04 -2.17E-02 -2.44E-02 -2.25E-02 5.01E-04 -2.11E-02 -2.39E-02 -2.29E-02 4.86E-04 -2.15E-02 -2.42E-02 -2.36E-02 4.82E-04 -2.23E-02 -2.50E-02 -2.29E-02 9.52E-04 -2.03E-02 -2.55E-02 -8.00E-03 PASS -2.23E-02 9.57E-04 -1.97E-02 -2.49E-02 -8.00E-03 PASS -2.24E-02 9.56E-04 -1.98E-02 -2.51E-02 -8.00E-03 PASS -2.32E-02 9.69E-04 -2.05E-02 -2.58E-02 -8.00E-03 PASS 0 -2.51E-02 -2.46E-02 -2.39E-02 -2.48E-02 -2.41E-02 -2.40E-02 -2.33E-02 -2.56E-02 -2.38E-02 -2.30E-02 -2.57E-02 -2.65E-02 Total 20 -2.45E-02 -2.41E-02 -2.34E-02 -2.42E-02 -2.35E-02 -2.37E-02 -2.30E-02 -2.52E-02 -2.35E-02 -2.27E-02 -2.57E-02 -2.65E-02 Dose (krad(Si)) 50 100 -2.41E-02 -2.36E-02 -2.37E-02 -2.33E-02 -2.30E-02 -2.25E-02 -2.38E-02 -2.34E-02 -2.31E-02 -2.26E-02 -2.34E-02 -2.30E-02 -2.27E-02 -2.23E-02 -2.49E-02 -2.45E-02 -2.32E-02 -2.28E-02 -2.24E-02 -2.20E-02 -2.57E-02 -2.57E-02 -2.65E-02 -2.65E-02 -2.45E-02 4.76E-04 -2.32E-02 -2.58E-02 -2.40E-02 4.80E-04 -2.26E-02 -2.53E-02 -2.35E-02 4.86E-04 -2.22E-02 -2.49E-02 -2.39E-02 9.90E-04 -2.12E-02 -2.67E-02 -1.25E-02 PASS -2.36E-02 9.68E-04 -2.10E-02 -2.63E-02 -8.00E-03 PASS -2.33E-02 9.56E-04 -2.07E-02 -2.59E-02 -8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 393 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.192. Plot of +Short-Circuit Current2_4 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 394 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.192. Raw data for +Short-Circuit Current2_4 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +Short-Circuit Current2_4 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 200 -2.39E-02 -2.25E-02 -2.35E-02 -2.27E-02 -2.27E-02 -2.34E-02 -2.24E-02 -2.41E-02 -2.43E-02 -2.21E-02 -2.65E-02 -2.57E-02 24-hr Anneal 225 -2.43E-02 -2.28E-02 -2.39E-02 -2.30E-02 -2.31E-02 -2.36E-02 -2.25E-02 -2.42E-02 -2.44E-02 -2.22E-02 -2.65E-02 -2.57E-02 168-hr Anneal 250 -2.51E-02 -2.36E-02 -2.46E-02 -2.37E-02 -2.38E-02 -2.44E-02 -2.32E-02 -2.49E-02 -2.50E-02 -2.29E-02 -2.65E-02 -2.57E-02 -2.36E-02 6.46E-04 -2.19E-02 -2.54E-02 -2.31E-02 6.27E-04 -2.13E-02 -2.48E-02 -2.34E-02 6.56E-04 -2.16E-02 -2.52E-02 -2.42E-02 6.64E-04 -2.24E-02 -2.60E-02 -2.39E-02 1.00E-03 -2.11E-02 -2.66E-02 -8.00E-03 PASS -2.33E-02 1.01E-03 -2.05E-02 -2.60E-02 -8.00E-03 PASS -2.34E-02 1.01E-03 -2.06E-02 -2.62E-02 -8.00E-03 PASS -2.41E-02 9.83E-04 -2.14E-02 -2.68E-02 -8.00E-03 PASS 0 -2.61E-02 -2.45E-02 -2.54E-02 -2.46E-02 -2.47E-02 -2.52E-02 -2.40E-02 -2.56E-02 -2.58E-02 -2.36E-02 -2.65E-02 -2.57E-02 Total 20 -2.55E-02 -2.39E-02 -2.49E-02 -2.40E-02 -2.41E-02 -2.49E-02 -2.37E-02 -2.53E-02 -2.55E-02 -2.33E-02 -2.65E-02 -2.57E-02 Dose (krad(Si)) 50 100 -2.51E-02 -2.46E-02 -2.35E-02 -2.31E-02 -2.45E-02 -2.41E-02 -2.36E-02 -2.32E-02 -2.37E-02 -2.33E-02 -2.46E-02 -2.41E-02 -2.34E-02 -2.30E-02 -2.50E-02 -2.47E-02 -2.52E-02 -2.49E-02 -2.30E-02 -2.27E-02 -2.65E-02 -2.65E-02 -2.57E-02 -2.57E-02 -2.50E-02 7.00E-04 -2.31E-02 -2.70E-02 -2.45E-02 6.85E-04 -2.26E-02 -2.64E-02 -2.41E-02 6.75E-04 -2.22E-02 -2.59E-02 -2.49E-02 9.95E-04 -2.21E-02 -2.76E-02 -1.25E-02 PASS -2.46E-02 9.86E-04 -2.19E-02 -2.73E-02 -8.00E-03 PASS -2.42E-02 9.84E-04 -2.15E-02 -2.69E-02 -8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 395 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.193. Plot of -Short-Circuit Current2_1 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 396 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.193. Raw data for -Short-Circuit Current2_1 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current2_1 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 4.83E-02 4.66E-02 4.77E-02 4.65E-02 4.69E-02 4.88E-02 4.63E-02 4.77E-02 4.80E-02 4.61E-02 4.94E-02 4.93E-02 24-hr Anneal 225 4.86E-02 4.67E-02 4.78E-02 4.67E-02 4.70E-02 4.90E-02 4.65E-02 4.78E-02 4.81E-02 4.63E-02 4.95E-02 4.93E-02 168-hr Anneal 250 4.90E-02 4.73E-02 4.84E-02 4.72E-02 4.76E-02 4.95E-02 4.71E-02 4.83E-02 4.86E-02 4.68E-02 4.97E-02 4.94E-02 4.73E-02 8.03E-04 4.96E-02 4.51E-02 4.72E-02 7.58E-04 4.93E-02 4.51E-02 4.74E-02 8.22E-04 4.96E-02 4.51E-02 4.79E-02 7.74E-04 5.00E-02 4.58E-02 4.76E-02 1.11E-03 5.07E-02 4.46E-02 8.00E-03 PASS 4.74E-02 1.13E-03 5.05E-02 4.43E-02 8.00E-03 PASS 4.75E-02 1.13E-03 5.06E-02 4.44E-02 8.00E-03 PASS 4.81E-02 1.11E-03 5.11E-02 4.50E-02 8.00E-03 PASS 0 4.93E-02 4.75E-02 4.86E-02 4.74E-02 4.78E-02 4.97E-02 4.73E-02 4.85E-02 4.88E-02 4.70E-02 4.95E-02 4.93E-02 Total 20 4.90E-02 4.73E-02 4.83E-02 4.72E-02 4.76E-02 4.95E-02 4.71E-02 4.83E-02 4.85E-02 4.68E-02 4.94E-02 4.92E-02 Dose (krad(Si)) 50 100 4.89E-02 4.85E-02 4.71E-02 4.66E-02 4.82E-02 4.78E-02 4.69E-02 4.67E-02 4.73E-02 4.71E-02 4.93E-02 4.91E-02 4.69E-02 4.66E-02 4.80E-02 4.79E-02 4.84E-02 4.82E-02 4.66E-02 4.64E-02 4.95E-02 4.94E-02 4.93E-02 4.93E-02 4.81E-02 7.81E-04 5.03E-02 4.60E-02 4.79E-02 7.64E-04 5.00E-02 4.58E-02 4.77E-02 8.22E-04 4.99E-02 4.54E-02 4.83E-02 1.14E-03 5.14E-02 4.52E-02 1.25E-02 PASS 4.80E-02 1.10E-03 5.11E-02 4.50E-02 8.00E-03 PASS 4.79E-02 1.12E-03 5.09E-02 4.48E-02 8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 397 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.194. Plot of -Short-Circuit Current2_2 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 398 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.194. Raw data for -Short-Circuit Current2_2 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current2_2 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 4.65E-02 4.58E-02 4.62E-02 4.70E-02 4.66E-02 4.60E-02 4.53E-02 4.66E-02 4.56E-02 4.57E-02 4.83E-02 4.96E-02 24-hr Anneal 225 4.68E-02 4.59E-02 4.63E-02 4.73E-02 4.67E-02 4.62E-02 4.55E-02 4.68E-02 4.57E-02 4.59E-02 4.84E-02 4.97E-02 168-hr Anneal 250 4.72E-02 4.64E-02 4.68E-02 4.77E-02 4.72E-02 4.67E-02 4.60E-02 4.73E-02 4.63E-02 4.65E-02 4.86E-02 4.98E-02 4.66E-02 5.71E-04 4.81E-02 4.50E-02 4.64E-02 4.67E-04 4.77E-02 4.51E-02 4.66E-02 5.26E-04 4.80E-02 4.52E-02 4.71E-02 4.74E-04 4.84E-02 4.58E-02 4.61E-02 4.90E-04 4.75E-02 4.48E-02 8.00E-03 PASS 4.58E-02 4.91E-04 4.72E-02 4.45E-02 8.00E-03 PASS 4.60E-02 4.94E-04 4.74E-02 4.47E-02 8.00E-03 PASS 4.66E-02 5.01E-04 4.79E-02 4.52E-02 8.00E-03 PASS 0 4.75E-02 4.66E-02 4.70E-02 4.79E-02 4.75E-02 4.68E-02 4.62E-02 4.76E-02 4.65E-02 4.67E-02 4.84E-02 4.96E-02 Total 20 4.72E-02 4.64E-02 4.68E-02 4.77E-02 4.72E-02 4.66E-02 4.60E-02 4.73E-02 4.62E-02 4.64E-02 4.83E-02 4.97E-02 Dose (krad(Si)) 50 100 4.71E-02 4.68E-02 4.62E-02 4.57E-02 4.66E-02 4.63E-02 4.74E-02 4.72E-02 4.70E-02 4.68E-02 4.65E-02 4.62E-02 4.59E-02 4.56E-02 4.71E-02 4.69E-02 4.61E-02 4.58E-02 4.63E-02 4.61E-02 4.84E-02 4.83E-02 4.96E-02 4.96E-02 4.73E-02 5.01E-04 4.87E-02 4.59E-02 4.71E-02 5.01E-04 4.84E-02 4.57E-02 4.69E-02 4.57E-04 4.81E-02 4.56E-02 4.68E-02 5.07E-04 4.81E-02 4.54E-02 1.25E-02 PASS 4.65E-02 4.64E-04 4.78E-02 4.52E-02 8.00E-03 PASS 4.64E-02 4.60E-04 4.76E-02 4.51E-02 8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 399 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.195. Plot of -Short-Circuit Current2_3 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 400 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.195. Raw data for -Short-Circuit Current2_3 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current2_3 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 4.72E-02 4.66E-02 4.68E-02 4.78E-02 4.73E-02 4.67E-02 4.61E-02 4.73E-02 4.63E-02 4.64E-02 4.91E-02 5.05E-02 24-hr Anneal 225 4.75E-02 4.67E-02 4.70E-02 4.80E-02 4.75E-02 4.70E-02 4.63E-02 4.74E-02 4.64E-02 4.66E-02 4.91E-02 5.06E-02 168-hr Anneal 250 4.79E-02 4.72E-02 4.75E-02 4.84E-02 4.80E-02 4.75E-02 4.68E-02 4.80E-02 4.70E-02 4.71E-02 4.95E-02 5.07E-02 4.73E-02 5.35E-04 4.87E-02 4.58E-02 4.71E-02 4.66E-04 4.84E-02 4.59E-02 4.73E-02 5.16E-04 4.87E-02 4.59E-02 4.78E-02 4.47E-04 4.90E-02 4.66E-02 4.69E-02 4.50E-04 4.81E-02 4.56E-02 8.00E-03 PASS 4.66E-02 4.48E-04 4.78E-02 4.54E-02 8.00E-03 PASS 4.67E-02 4.57E-04 4.80E-02 4.55E-02 8.00E-03 PASS 4.73E-02 4.73E-04 4.86E-02 4.60E-02 8.00E-03 PASS 0 4.81E-02 4.74E-02 4.77E-02 4.85E-02 4.83E-02 4.76E-02 4.70E-02 4.81E-02 4.72E-02 4.73E-02 4.93E-02 5.06E-02 Total 20 4.79E-02 4.72E-02 4.75E-02 4.85E-02 4.80E-02 4.75E-02 4.69E-02 4.79E-02 4.70E-02 4.71E-02 4.91E-02 5.05E-02 Dose (krad(Si)) 50 100 4.78E-02 4.75E-02 4.71E-02 4.65E-02 4.73E-02 4.69E-02 4.82E-02 4.79E-02 4.78E-02 4.75E-02 4.73E-02 4.71E-02 4.67E-02 4.64E-02 4.77E-02 4.75E-02 4.68E-02 4.66E-02 4.70E-02 4.67E-02 4.93E-02 4.91E-02 5.05E-02 5.05E-02 4.80E-02 4.59E-04 4.93E-02 4.67E-02 4.78E-02 5.13E-04 4.92E-02 4.64E-02 4.76E-02 4.41E-04 4.88E-02 4.64E-02 4.74E-02 4.20E-04 4.86E-02 4.63E-02 1.25E-02 PASS 4.73E-02 4.27E-04 4.84E-02 4.61E-02 8.00E-03 PASS 4.71E-02 4.27E-04 4.83E-02 4.59E-02 8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 401 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Figure 5.196. Plot of -Short-Circuit Current2_4 5V (A) @ VS=+5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DLA Certified Company 402 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table 5.196. Raw data for -Short-Circuit Current2_4 5V (A) @ VS=+5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -Short-Circuit Current2_4 5V (A) @ VS=+5V Device 543 544 545 546 547 548 549 559 560 561 562 563 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 200 4.79E-02 4.62E-02 4.70E-02 4.58E-02 4.63E-02 4.79E-02 4.60E-02 4.71E-02 4.74E-02 4.55E-02 4.88E-02 4.85E-02 24-hr Anneal 225 4.83E-02 4.63E-02 4.71E-02 4.60E-02 4.65E-02 4.81E-02 4.62E-02 4.72E-02 4.75E-02 4.57E-02 4.88E-02 4.85E-02 168-hr Anneal 250 4.86E-02 4.69E-02 4.77E-02 4.64E-02 4.70E-02 4.86E-02 4.67E-02 4.77E-02 4.80E-02 4.62E-02 4.90E-02 4.88E-02 4.68E-02 8.87E-04 4.92E-02 4.44E-02 4.66E-02 8.37E-04 4.89E-02 4.44E-02 4.68E-02 9.06E-04 4.93E-02 4.43E-02 4.73E-02 8.62E-04 4.97E-02 4.50E-02 4.70E-02 9.50E-04 4.96E-02 4.44E-02 8.00E-03 PASS 4.68E-02 9.85E-04 4.95E-02 4.41E-02 8.00E-03 PASS 4.70E-02 9.81E-04 4.96E-02 4.43E-02 8.00E-03 PASS 4.75E-02 9.75E-04 5.01E-02 4.48E-02 8.00E-03 PASS 0 4.89E-02 4.72E-02 4.79E-02 4.66E-02 4.72E-02 4.88E-02 4.69E-02 4.78E-02 4.81E-02 4.65E-02 4.89E-02 4.85E-02 Total 20 4.86E-02 4.69E-02 4.76E-02 4.65E-02 4.70E-02 4.86E-02 4.68E-02 4.77E-02 4.79E-02 4.62E-02 4.88E-02 4.85E-02 Dose (krad(Si)) 50 100 4.85E-02 4.82E-02 4.67E-02 4.62E-02 4.75E-02 4.71E-02 4.61E-02 4.60E-02 4.67E-02 4.65E-02 4.84E-02 4.82E-02 4.66E-02 4.63E-02 4.75E-02 4.73E-02 4.78E-02 4.76E-02 4.60E-02 4.58E-02 4.88E-02 4.87E-02 4.85E-02 4.85E-02 4.76E-02 8.88E-04 5.00E-02 4.51E-02 4.73E-02 8.47E-04 4.96E-02 4.50E-02 4.71E-02 9.18E-04 4.96E-02 4.46E-02 4.76E-02 9.13E-04 5.01E-02 4.51E-02 1.25E-02 PASS 4.74E-02 9.65E-04 5.01E-02 4.48E-02 8.00E-03 PASS 4.73E-02 9.51E-04 4.99E-02 4.47E-02 8.00E-03 PASS An ISO 9001:2008 and DLA Certified Company 403 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s, determined by the distance from the source. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet specification limits, then the lot could be logged as a failure. Based on this criterion the RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp (from the lot traceability information provided on the first page of this test report) the units-under-test: PASSED the total ionizing dose test to the 200krad(Si) dose level PASSED following 24-hour room temperature anneal PASSED following 168-hour 100°C anneal An ISO 9001:2008 and DLA Certified Company 404 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of Packing Label and a Sample Unit-Under-Test to Show Part Traceability An ISO 9001:2008 and DLA Certified Company 405 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Appendix B: Radiation Bias Connections and Absolute Maximum Ratings TID Radiation Biased Conditions: Extracted from Linear Technology RH1499M Datasheet ID No. 66-10-1499 Revision F. Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -INPUT A +INPUT A V+ +INPUT B -INPUT B OUT B OUT C -INPUT C +INPUT C V+INPUT D -INPUT D OUT D Connection / Bias To Pin 2 via 5kΩ & 40pF, in Parallel To Pin 1 via 5kΩ & 40pF, in Parallel To 8V via 5kΩ Resistor To +15V using 0.1μF Decoupling To 8V via 5kΩ Resistor To Pin 7 via 5kΩ & 40pF, in Parallel To Pin 6 via 5kΩ & 40pF, in Parallel To Pin 9 via 5kΩ & 40pF, in Parallel To Pin 8 via 5kΩ & 40pF, in Parallel To 8V via 5kΩ Resistor To -15V using 0.1μF Decoupling To 8V via 10kΩ Resistor To Pin 14 via 5kΩ & 40pF, in Parallel To Pin 13 via 5kΩ & 40pF, in Parallel Figure B.1. Irradiation bias circuit. This figure was extracted from Linear Technology RH1499M Datasheet ID No. 66-10-1499 Revision F. An ISO 9001:2008 and DLA Certified Company 406 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 TID Radiation Unbiased Conditions: All pins grounded. Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -INPUT A +INPUT A V+ +INPUT B -INPUT B OUT B OUT C -INPUT C +INPUT C V+INPUT D -INPUT D OUT D Connection / Bias GND GND GND GND GND GND GND GND GND GND GND GND GND GND Figure B.2. W package drawing (for reference only). This figure was extracted from Linear Technology RH1499M Datasheet ID No. 66-10-1499 Revision F. Absolute Maximum Ratings: Parameter Max Rating Total Supply Voltage (V+ to V-) 36V Input Current ±10mA Output Short-Circuit Duration Continuous An ISO 9001:2008 and DLA Certified Company 407 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions The expected ranges of values as well as the measurement conditions are taken from Linear Technology RH1499M Datasheet ID No. 66-10-1499 Revision F. All electrical tests for this device are performed on one of Aeroflex RAD's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020 for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DLA Certified Company 408 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions for the RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp. Parameter Symbol Test Conditions +Supply Current 15V (A) +ICC15 VS=+/-15V -Supply Current 15V (A) -IEE15 VS=+/-15V Input Offset Voltage1 15V (V) VOS1_14 15V VS=+/-15V, VCM=0V Input Offset Current1 15V (A) IOS1_14 15V VS=+/-15V, VCM=0V +Input Bias Current BIAS1 15V (A) +IBIAS1_14 15V VS=+/-15V, VCM=0V -Input Bias Current BIAS1 15V (A) -IBIAS1_14 15V VS=+/-15V, VCM=0V Input Offset Voltage2 15V (V) VOS2_14 15V VS=+/-15V, VCM=15V Input Offset Current2 15V (A) IOS2_14 15V VS=+/-15V, VCM=15V +Input Bias Current BIAS2 15V (A) +IBIAS2_14 15V VS=+/-15V, VCM=15V -Input Bias Current BIAS2 15V (A) -IBIAS2_14 15V VS=+/-15V, VCM=15V Input Offset Voltage3 15V (V) VOS3_14 15V VS=+/-15V, VCM=-15V Input Offset Current3 15V (A) IOS3_14 15V VS=+/-15V, VCM=-15V +Input Bias Current BIAS3 15V (A) +IBIAS3_14 15V VS=+/-15V, VCM=-15V -Input Bias Current BIAS3 15V (A) -IBIAS3_14 15V VS=+/-15V, VCM=-15V Output Voltage Swing High1 15V (V) +VOUT1_14 15V VS=+/-15V IL=0mA Output Voltage Swing High2 15V (V) +VOUT2_14 15V VS=+/-15V IL=1mA Output Voltage Swing High3 15V (V) +VOUT3_14 15V VS=+/-15V IL=10mA Output Voltage Swing Low1 15V (V) -VOUT1_14 15V VS=+/-15V IL=0mA Output Voltage Swing Low2 15V (V) -VOUT2_14 15V VS=+/-15V IL=1mA Output Voltage Swing Low3 15V (V) -VOUT3_14 15V VS=+/-15V IL=10mA Large Signal Voltage Gain1 15V (V/mV) AVOL1_14 15V VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain2 15V (V/mV) AVOL2_14 15V VO=+/-10V, RL=2kΩ Common Mode Rejection Ratio1 15V (dB) CMRR1_14 15V VS=+/-15V, VCM=+/-15V CMRR Match1 1 to 4 15V (dB) CMRR1 MATCH 1 to 4 15V VS=+/-15V, VCM=+/-15V CMRR Match1 2 to 3 15V (dB) CMRR1 MATCH 2 to 3 15V VS=+/-15V, VCM=+/-15V Power Supply Rejection Ratio1 (dB) PSRR1_14 VS=+/-2V to +/-16V PSRR Match1 1 to 4 (dB) PSRR1 MATCH 1 to 4 VS=+/-2V to +/-16V PSRR Match1 2 to 3 (dB) PSRR1 MATCH 2 to 3 VS=+/-2V to +/-16V An ISO 9001:2008 and DLA Certified Company 409 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 +Short-Circuit Current1 15V (A) +ISC1_14 15V VS=+/-15V, VOUT=0V -Short-Circuit Current1 15V (A) -ISC1_14 15V VS=+/-15V, VOUT=0V Gain-Bandwidth Product 15V (MHz) GBW_14 15V +Slew Rate 15V (V/us) +SR_14 5V -Slew Rate 15V (V/us) -SR_14 5V +Supply Current 5V (A) +ICC5 VS=+/-15V, f=100kHz VS=+/-15V, AV=-1, RL=10K, VO=+/-10V VS=+/-15V, AV=-1, RL=10K, VO=+/-10V VS=+5V -Supply Current 5V (A) -IEE5 VS=+5V Input Offset Voltage4 5V (V) VOS4_14 5V VS=+5V, VCM=0V Input Offset Current4 5V (A) IOS4_14 5V VS=+5V, VCM=0V +Input Bias Current BIAS4 5V (A) +IBIAS4_14 5V VS=+5V, VCM=0V -Input Bias Current BIAS4 5V (A) -IBIAS4_14 5V VS=+5V, VCM=0V Input Offset Voltage5 5V (V) VOS5_14 5V VS=+5V, VCM=5V Input Offset Current5 5V (A) IOS5_14 5V VS=+5V, VCM=5V +Input Bias Current BIAS5 5V (A) +IBIAS5_14 5V VS=+5V, VCM=5V -Input Bias Current BIAS5 5V (A) -IBIAS5_14 5V VS=+5V, VCM=5V Output Voltage Swing High4 5V (V) +VOUT4_14 5V VS=+5V IL=0mA Output Voltage Swing High5 5V (V) +VOUT5_14 5V VS=+5V IL=1mA Output Voltage Swing High6 5V (V) +VOUT6_14 5V VS=+5V IL=2.5mA Output Voltage Swing Low4 5V (V) -VOUT4_14 5V VS=+5V IL=0mA Output Voltage Swing Low5 5V (V) -VOUT5_14 5V VS=+5V IL=1mA Output Voltage Swing Low6 5V (V) -VOUT6_14 5V VS=+5V IL=2.5mA Large Signal Voltage Gain3 5V (V/mV) AVOL3_14 5V VO=75mV to 4.8V, RL=10kΩ Common Mode Rejection Ratio2 5V (dB) CMRR2_14 5V VS=+5V, VCM=0 to +5V CMRR Match2 1 to 4 5V (dB) CMRR2 MATCH 1 to 4 5V VS=+5V, VCM=0 to +5V CMRR Match2 2 to 3 5V (dB) CMRR2 MATCH 2 to 3 5V VS=+5V, VCM=0 to +5V Power Supply Rejection Ratio2 (dB) PSRR2_14 VS=+4.5V to +12V PSRR Match2 1 to 4 (dB) PSRR2 MATCH 1 to 4 VS=+4.5V to +12V PSRR Match2 2 to 3 (dB) PSRR2 MATCH 2 to 3 VS=+4.5V to +12V +Short-Circuit Current2 5V (A) +ISC2_14 5V VS=+5V -Short-Circuit Current2 5V (A) -ISC2_14 5V VS=+5V An ISO 9001:2008 and DLA Certified Company 410 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH1499MW Quad Rail-to-Rail Input and Output Precision C-Load Op Amp. Pre-Irradiation Specification MIN MAX Parameter +Supply Current 15V (A) 1.00E-02 Measurement Precision/Resolution ±7.89E-05 -Supply Current 15V (A) -1.00E-02 ±7.71E-05 Input Offset Voltage1 15V (V) -8.00E-04 8.00E-04 ±5.00E-06 Input Offset Current1 15V (A) -7.00E-08 7.00E-08 ±3.70E-10 +Input Bias Current BIAS1 15V (A) -7.15E-07 7.15E-07 ±3.89E-09 -Input Bias Current BIAS1 15V (A) -7.15E-07 7.15E-07 ±3.65E-09 Input Offset Voltage2 15V (V) -8.00E-04 8.00E-04 ±5.45E-06 Input Offset Current2 15V (A) -7.00E-08 7.00E-08 ±3.25E-09 +Input Bias Current BIAS2 15V (A) -7.15E-07 7.15E-07 ±4.01E-09 -Input Bias Current BIAS2 15V (A) -7.15E-07 7.15E-07 ±3.72E-09 Input Offset Voltage3 15V (V) -8.00E-04 8.00E-04 ±4.92E-06 Input Offset Current3 15V (A) -7.00E-08 7.00E-08 ±4.20E-10 +Input Bias Current BIAS3 15V (A) -7.15E-07 7.15E-07 ±2.63E-09 -Input Bias Current BIAS3 15V (A) -7.15E-07 7.15E-07 ±2.79E-09 Output Voltage Swing High1 15V (V) 1.00E-02 ±2.00E-04 Output Voltage Swing High2 15V (V) 1.50E-01 ±4.15E-04 Output Voltage Swing High3 15V (V) 8.00E-01 ±1.96E-03 Output Voltage Swing Low1 15V (V) 3.00E-02 ±2.24E-04 Output Voltage Swing Low2 15V (V) 1.00E-01 ±2.78E-04 Output Voltage Swing Low3 15V (V) 5.00E-01 ±1.37E-03 Large Signal Voltage Gain1 15V (V/mV) 1.00E+03 ±6.79E+01% Large Signal Voltage Gain2 15V (V/mV) 5.00E+02 ±2.60E+01% Common Mode Rejection Ratio1 15V (dB) 9.00E+01 ±1.48E-01 CMRR Match1 1 to 4 15V (dB) 8.40E+01 ±8.75E-01 CMRR Match1 2 to 3 15V (dB) 8.40E+01 ±2.85E-01 Power Supply Rejection Ratio1 (dB) 9.00E+01 ±1.04E-01 PSRR Match1 1 to 4 (dB) 8.30E+01 ±7.12E-01 An ISO 9001:2008 and DLA Certified Company 411 TID Report 15-0020 03/10/15 R1.1 PSRR Match1 2 to 3 (dB) 8.30E+01 +Short-Circuit Current1 15V (A) Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 ±1.52E-01 -1.50E-02 ±1.16E-04 -Short-Circuit Current1 15V (A) 1.50E-02 ±1.52E-04 Gain-Bandwidth Product 15V (MHz) 6.80E+00 ±2.83E-02 +Slew Rate 15V (V/us) 3.50E+00 ±1.86E-01 -Slew Rate 15V (V/us) -3.50E+00 ±1.72E-01 +Supply Current 5V (A) 8.80E-03 ±3.40E-05 -Supply Current 5V (A) -8.80E-03 ±3.33E-05 Input Offset Voltage4 5V (V) -8.00E-04 8.00E-04 ±4.66E-06 Input Offset Current4 5V (A) -6.50E-08 6.50E-08 ±4.45E-10 +Input Bias Current BIAS4 5V (A) -6.50E-07 6.50E-07 ±2.25E-09 -Input Bias Current BIAS4 5V (A) -6.50E-07 6.50E-07 ±2.70E-09 Input Offset Voltage5 5V (V) -8.00E-04 8.00E-04 ±4.53E-06 Input Offset Current5 5V (A) -6.50E-08 6.50E-08 ±3.70E-09 +Input Bias Current BIAS5 5V (A) -6.50E-07 6.50E-07 ±3.57E-09 -Input Bias Current BIAS5 5V (A) -6.50E-07 6.50E-07 ±2.32E-09 Output Voltage Swing High4 5V (V) 1.00E-02 ±1.84E-04 Output Voltage Swing High5 5V (V) 1.50E-01 ±2.91E-04 Output Voltage Swing High6 5V (V) 2.50E-01 ±5.13E-04 Output Voltage Swing Low4 5V (V) 3.00E-02 ±1.93E-04 Output Voltage Swing Low5 5V (V) 1.00E-01 ±1.61E-04 Output Voltage Swing Low6 5V (V) 2.00E-01 ±2.84E-04 Large Signal Voltage Gain3 5V (V/mV) 6.00E+02 ±3.92E+02% Common Mode Rejection Ratio2 5V (dB) 7.60E+01 ±1.80E-01 CMRR Match2 1 to 4 5V (dB) 7.50E+01 ±1.82E+00 CMRR Match2 2 to 3 5V (dB) 7.50E+01 ±3.02E-01 Power Supply Rejection Ratio2 (dB) 8.80E+01 ±1.29E+00 PSRR Match2 1 to 4 (dB) 8.20E+01 ±4.53E-01 PSRR Match2 2 to 3 (dB) 8.20E+01 ±3.80E-01 +Short-Circuit Current2 5V (A) -Short-Circuit Current2 5V (A) -1.25E-02 1.25E-02 An ISO 9001:2008 and DLA Certified Company 412 ±2.08E-05 ±8.21E-05 TID Report 15-0020 03/10/15 R1.1 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures Used in the Results Section (Section 5) 5.1. 5.2. 5.3. 5.4. 5.5. 5.6. 5.7. 5.8. 5.9. 5.10. 5.11. 5.12. 5.13. 5.14. 5.15. 5.16. 5.17. 5.18. 5.19. 5.20. 5.21. 5.22. 5.23. 5.24. 5.25. 5.26. 5.27. 5.28. 5.29. 5.30. 5.31. 5.32. 5.33. 5.34. 5.35. 5.36. 5.37. 5.38. 5.39. 5.40. +Supply Current 15V (A) @ VS=+/-15V -Supply Current 15V (A) @ VS=+/-15V Input Offset Voltage1_1 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_2 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_3 15V (V) @ VS=+/-15V, VCM=0V Input Offset Voltage1_4 15V (V) @ VS=+/-15V, VCM=0V Input Offset Current1_1 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_2 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_3 15V (A) @ VS=+/-15V, VCM=0V Input Offset Current1_4 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V +Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_1 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_2 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_3 15V (A) @ VS=+/-15V, VCM=0V -Input Bias Current BIAS1_4 15V (A) @ VS=+/-15V, VCM=0V Input Offset Voltage2_1 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_2 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_3 15V (V) @ VS=+/-15V, VCM=15V Input Offset Voltage2_4 15V (V) @ VS=+/-15V, VCM=15V Input Offset Current2_1 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_2 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_3 15V (A) @ VS=+/-15V, VCM=15V Input Offset Current2_4 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V +Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_1 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_2 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_3 15V (A) @ VS=+/-15V, VCM=15V -Input Bias Current BIAS2_4 15V (A) @ VS=+/-15V, VCM=15V Input Offset Voltage3_1 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_2 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_3 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Voltage3_4 15V (V) @ VS=+/-15V, VCM=-15V Input Offset Current3_1 15V (A) @ VS=+/-15V, VCM=-15V Input Offset Current3_2 15V (A) @ VS=+/-15V, VCM=-15V An ISO 9001:2008 and DLA Certified Company 413 TID Report 15-0020 03/10/15 R1.1 5.41. 5.42. 5.43. 5.44. 5.45. 5.46. 5.47. 5.48. 5.49. 5.50. 5.51. 5.52. 5.53. 5.54. 5.55. 5.56. 5.57. 5.58. 5.59. 5.60. 5.61. 5.62. 5.63. 5.64. 5.65. 5.66. 5.67. 5.68. 5.69. 5.70. 5.71. 5.72. 5.73. 5.74. 5.75. 5.76. 5.77. 5.78. 5.79. 5.80. 5.81. 5.82. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current3_3 15V (A) @ VS=+/-15V, VCM=-15V Input Offset Current3_4 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V +Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_1 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_2 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_3 15V (A) @ VS=+/-15V, VCM=-15V -Input Bias Current BIAS3_4 15V (A) @ VS=+/-15V, VCM=-15V Output Voltage Swing High1_1 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_2 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_3 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High1_4 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing High2_1 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_2 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_3 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High2_4 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing High3_1 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_2 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_3 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing High3_4 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low1_1 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_2 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_3 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low1_4 15V (V) @ VS=+/-15V IL=0mA Output Voltage Swing Low2_1 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_2 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_3 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low2_4 15V (V) @ VS=+/-15V IL=1mA Output Voltage Swing Low3_1 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_2 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_3 15V (V) @ VS=+/-15V IL=10mA Output Voltage Swing Low3_4 15V (V) @ VS=+/-15V IL=10mA Large Signal Voltage Gain1_1 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_2 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_3 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain1_4 15V (V/mV) @ VO=+/-14.5V, RL=10kΩ Large Signal Voltage Gain2_1 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_2 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_3 15V (V/mV) @ VO=+/-10V, RL=2kΩ Large Signal Voltage Gain2_4 15V (V/mV) @ VO=+/-10V, RL=2kΩ An ISO 9001:2008 and DLA Certified Company 414 TID Report 15-0020 03/10/15 R1.1 5.83. 5.84. 5.85. 5.86. 5.87. 5.88. 5.89. 5.90. 5.91. 5.92. 5.93. 5.94. 5.95. 5.96. 5.97. 5.98. 5.99. 5.100. 5.101. 5.102. 5.103. 5.104. 5.105. 5.106. 5.107. 5.108. 5.109. 5.110. 5.111. 5.112. 5.113. 5.114. 5.115. 5.116. 5.117. 5.118. 5.119. 5.120. 5.121. 5.122. 5.123. 5.124. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio1_1 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_2 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_3 15V (dB) @ VS=+/-15V, VCM=+/-15V Common Mode Rejection Ratio1_4 15V (dB) @ VS=+/-15V, VCM=+/-15V CMRR Match1 1 to 4 15V (dB) @ VS=+/-15V, VCM=+/-15V CMRR Match1 2 to 3 15V (dB) @ VS=+/-15V, VCM=+/-15V Power Supply Rejection Ratio1_1 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection Ratio1_2 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection_Ratio1_3 (dB) @ VS=+/-2V to +/-16V Power Supply Rejection Ratio1_4 (dB) @ VS=+/-2V to +/-16V PSRR Match1 1 to 4 (dB) @ VS=+/-2V to +/-16V PSRR Match1 2 to 3 (dB) @ VS=+/-2V to +/-16V +Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V +Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_1 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_2 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_3 15V (A) @ VS=+/-15V, VOUT=0V -Short-Circuit Current1_4 15V (A) @ VS=+/-15V, VOUT=0V Gain-Bandwidth Product_1 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_2 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_3 15V (MHz) @ VS=+/-15V, f=100kHz Gain-Bandwidth Product_4 15V (MHz) @ VS=+/-15V, f=100kHz +Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_1 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_2 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_3 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ -Slew Rate_4 15V (V/us) @ VS=+/-15, AV=-1, RL=10kΩ +Supply Current 5V (A) @ VS=+5V -Supply Current 5V (A) @ VS=+5V Input Offset Voltage4_1 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_2 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_3 5V (V) @ VS=+5V, VCM=0V Input Offset Voltage4_4 5V (V) @ VS=+5V, VCM=0V Input Offset Current4_1 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_2 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_3 5V (A) @ VS=+5V, VCM=0V Input Offset Current4_4 5V (A) @ VS=+5V, VCM=0V An ISO 9001:2008 and DLA Certified Company 415 TID Report 15-0020 03/10/15 R1.1 5.125. 5.126. 5.127. 5.128. 5.129. 5.130. 5.131. 5.132. 5.133. 5.134. 5.135. 5.136. 5.137. 5.138. 5.139. 5.140. 5.141. 5.142. 5.143. 5.144. 5.145. 5.146. 5.147. 5.148. 5.149. 5.150. 5.151. 5.152. 5.153. 5.154. 5.155. 5.156. 5.157. 5.158. 5.159. 5.160. 5.161. 5.162. 5.163. 5.164. 5.165. 5.166. +Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V +Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_1 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_2 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_3 5V (A) @ VS=+5V, VCM=0V -Input Bias Current BIAS4_4 5V (A) @ VS=+5V, VCM=0V Input Offset Voltage5_1 5V (V) @ VS=+5V, VCM=5V Input Offset Voltage5_2 5V (V) @ VS=+5V, VCM=5V Input Offset Voltage5_3 5V (V) @ VS=+5V, VCM=5V Input Offset Voltage5_4 5V (V) @ VS=+5V, VCM=5V Input Offset Current5_1 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_2 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_3 5V (A) @ VS=+5V, VCM=5V Input Offset Current5_4 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V +Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_1 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_2 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_3 5V (A) @ VS=+5V, VCM=5V -Input Bias Current BIAS5_4 5V (A) @ VS=+5V, VCM=5V Output Voltage Swing High4_1 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_2 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_3 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High4_4 5V (V) @ VS=+5V IL=0mA Output Voltage Swing High5_1 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_2 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_3 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High5_4 5V (V) @ VS=+5V IL=1mA Output Voltage Swing High6_1 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_2 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_3 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing High6_4 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low4_1 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_2 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_3 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low4_4 5V (V) @ VS=+5V IL=0mA Output Voltage Swing Low5_1 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low5_2 5V (V) @ VS=+5V IL=1mA An ISO 9001:2008 and DLA Certified Company 416 Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 TID Report 15-0020 03/10/15 R1.1 5.167. 5.168. 5.169. 5.170. 5.171. 5.172. 5.173. 5.174. 5.175. 5.176. 5.177. 5.178. 5.179. 5.180. 5.181. 5.182. 5.183. 5.184. 5.185. 5.186. 5.187. 5.188. 5.189. 5.190. 5.191. 5.192. 5.193. 5.194. 5.195. 5.196. Aeroflex RAD 5030 Centennial Blvd. Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low5_3 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low5_4 5V (V) @ VS=+5V IL=1mA Output Voltage Swing Low6_1 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_2 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_3 5V (V) @ VS=+5V IL=2.5mA Output Voltage Swing Low6_4 5V (V) @ VS=+5V IL=2.5mA Large Signal Voltage Gain3_1 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_2 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_3 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Large Signal Voltage Gain3_4 5V (V/mV) @ VO=75mV to 4.8V, RL=10kΩ Common Mode Rejection Ratio2_1 5V (dB) @ VS=+5V, VCM=0 to +5V Common Mode Rejection Ratio2_2 5V (dB) @ VS=+5V, VCM=0 to +5V Common Mode Rejection Ratio2_3 5V (dB) @ VS=+5V, VCM=0 to +5V Common Mode Rejection Ratio2_4 5V (dB) @ VS=+5V, VCM=0 to +5V CMRR Match2 1 to 4 5V (dB) @ VS=+5V, VCM=0 to +5V CMRR Match2 2 to 3 5V (dB) @ VS=+5V, VCM=0 to +5V Power Supply Rejection Ratio2_1 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_2 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_3 (dB) @ VS=+4.5V to +12V Power Supply Rejection Ratio2_4 (dB) @ VS=+4.5V to +12V PSRR Match2 1 to 4 (dB) @ VS=+4.5V to +12V PSRR Match2 2 to 3 (dB) @ VS=+4.5V to +12V +Short-Circuit Current2_1 5V (A) @ VS=+5V +Short-Circuit Current2_2 5V (A) @ VS=+5V +Short-Circuit Current2_3 5V (A) @ VS=+5V +Short-Circuit Current2_4 5V (A) @ VS=+5V -Short-Circuit Current2_1 5V (A) @ VS=+5V -Short-Circuit Current2_2 5V (A) @ VS=+5V -Short-Circuit Current2_3 5V (A) @ VS=+5V -Short-Circuit Current2_4 5V (A) @ VS=+5V An ISO 9001:2008 and DLA Certified Company 417