STMICROELECTRONICS STD35NF06LT4

STD35NF06L
N-CHANNEL 60V - 0.014 Ω - 35A DPAK
STripFET™ II POWER MOSFET
TYPE
STD35NF06L
■
■
■
■
VDSS
RDS(on)
ID
60 V
< 0.017 Ω
35 A
TYPICAL RDS(on) = 0.014 Ω
LOW THRESHOLD DRIVE
GATE CHARGE MINIMIZED
SURFACE-MOUNTING DPAK (TO-252)
POWER PACKAGE IN TAPE & REEL
(SUFFIX “T4")
3
1
DPAK
TO-252
(Suffix “T4”)
DESCRIPTION
This Power MOSFET is the latest development of
STMicroelectronis unique "Single Feature Size™" stripbased process. The resulting transistor shows extremely
high packing density for low on-resistance, rugged
avalanche characteristics and less critical alignment
steps
therefore
a
remarkable
manufacturing
reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ DC-AC CONVERTERS
■ AUTOMOTIVE SWITCHING APPLICATION
Ordering Information
SALES TYPE
STD35NF06LT4
MARKING
D35NF06L
PACKAGE
TO-252
PACKAGING
TAPE & REEL
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
ID
ID
IDM(•)
Ptot
Parameter
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
Value
60
60
± 16
35
24.5
140
80
0.67
5
Unit
V
V
V
A
A
A
W
W/°C
V/ns
dv/dt (1)
Gate- source Voltage
Drain Current (continuous) at TC = 25°C
Drain Current (continuous) at TC = 100°C
Drain Current (pulsed)
Total Dissipation at TC = 25°C
Derating Factor
Peak Diode Recovery voltage slope
EAS (2)
Single Pulse Avalanche Energy
280
mJ
Tstg
Tj
Storage Temperature
Operating Junction Temperature
-55 to 175
°C
(•) Pulse width limited by safe operating area.
November 2003
(1) ISD ≤35A, di/dt ≤100A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX
(2) Starting T j = 25 oC, ID = 30A, VDD =30V
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STD35NF06L
THERMAL DATA
Rthj-case
Rthj-amb
Tl
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
(1.6 mm from case, for 10 sec)
1.88
100
275
Max
Max
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating TC = 125°C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 16V
V(BR)DSS
Min.
Typ.
Max.
60
Unit
V
1
10
µA
µA
±100
nA
Max.
Unit
ON (*)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
RDS(on)
Static Drain-source On
Resistance
VGS = 10 V
VGS = 4.5 V
ID = 250 µA
Min.
Typ.
1
ID = 17.5 A
ID = 17.5 A
V
0.014
0.016
0.017
0.020
Ω
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
2/9
Parameter
Test Conditions
gfs (*)
Forward Transconductance
VDS = 15 V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25V f = 1 MHz VGS = 0
ID = 17.5 A
Min.
28
S
1700
305
105
pF
pF
pF
STD35NF06L
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
ID =27.5 A
VDD = 30 V
RG = 4.7 Ω
VGS = 4.5 V
(Resistive Load, Figure 3)
20
100
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD= 48 V ID= 55 A VGS=4.5 V
25
5
10
33
nC
nC
nC
Typ.
Max.
Unit
ns
ns
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Test Conditions
Min.
ID =27.5 A
VDD = 30 V
RG = 4.7 Ω
VGS = 4.5 V
(Resistive Load, Figure 3)
Turn-off Delay Time
Fall Time
40
20
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM (•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD = 35 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
di/dt = 100A/µs
ISD = 35 A
VDD = 30 V
Tj = 150°C
(see test circuit, Figure 5)
trr
Qrr
IRRM
(*)Pulsed: Pulse duration = 300 µs, duty cycle
(•)Pulse width limited by safe operating area.
Safe Operating Area
Test Conditions
Min.
Typ.
VGS = 0
80
200
5
Max.
Unit
35
140
A
A
1.5
V
ns
QC
A
1.5 %.
Thermal Impedance
3/9
STD35NF06L
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STD35NF06L
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
.
.
5/9
STD35NF06L
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STD35NF06L
TO-252 (DPAK) MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
2.2
2.4
0.086
0.094
A1
0.9
1.1
0.035
0.043
A2
0.03
0.23
0.001
0.009
B
0.64
0.9
0.025
0.035
B2
5.2
5.4
0.204
0.212
C
0.45
0.6
0.017
0.023
C2
0.48
0.6
0.019
0.023
D
6
6.2
0.236
0.244
E
6.4
6.6
0.252
0.260
G
4.4
4.6
0.173
0.181
H
9.35
10.1
0.368
0.397
L2
0.8
L4
0.031
0.6
1
0.023
0.039
A1
C2
A
H
A2
C
DETAIL "A"
L2
D
=
1
=
G
2
=
=
=
E
=
B2
3
B
DETAIL "A"
L4
0068772-B
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STD35NF06L
*on sales type
8/9
STD35NF06L
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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