STMICROELECTRONICS STW240NF55

STW240NF55
N-CHANNEL 55V - 0.0027 Ω - 120A TO-247
STripFET™ II POWER MOSFET
TYPE
STW240NF55
■
■
■
VDSS
RDS(on)
ID(1)
55V
<0.0035Ω
120A
TYPICAL RDS(on) = 0.0027Ω
STANDARD THRESHOLD DRIVE
100% AVALANCHE TESTED
DESCRIPTION
This Power MOSFET is the latest development of
STMicroelectronis unique "Single Feature Size™" stripbased process. The resulting transistor shows extremely
high packing density for low on-resistance, rugged
avalanche characteristics and less critical alignment
steps
therefore
a
remarkable
manufacturing
reproducibility.
APPLICATIONS
■ HIGH CURRENT, HIGH SWITCHING SPEED
■ OR-ING FUNCTION
1
2
3
TO-247
INTERNAL SCHEMATIC DIAGRAM
Ordering Information
SALES TYPE
STW240NF55
MARKING
W240NF55
PACKAGE
TO-247
PACKAGING
TUBE
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
ID(1)
ID(1)
IDM(•)
Ptot
dv/dt (2)
EAS(3)
Tstg
Tj
Parameter
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
Gate- source Voltage
Drain Current (continuous) at TC = 25°C
Drain Current (continuous) at TC = 100°C
Drain Current (pulsed)
Total Dissipation at TC = 25°C
Derating Factor
Peak Diode Recovery voltage slope
Single Pulse Avalanche Energy
Storage Temperature
Operating Junction Temperature
(•) Pulse width limited by safe operating area.
(1)Current Limited by Package
May 2004
Value
55
55
± 20
120
120
480
500
3.33
5
3.5
Unit
V
V
V
A
A
A
W
W/°C
V/ns
J
-55 to 175
°C
(2) ISD ≤ 120A, di/dt ≤ 600A/µs, VDD ≤ 48V, Tj ≤ TJMAX.
(3) Starting Tj = 25 oC, ID = 60A, VDD = 30V
1/8
STW240NF55
THERMAL DATA
Rthj-case
Rthj-amb
Tl
°C/W
°C/W
°C
0.3
50
300
Max
Max
Typ
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
(1.6 mm from case, for 10 sec)
ELECTRICAL CHARACTERISTICS (Tcase = 25 °C unless otherwise specified)
OFF
Symbol
Parameter
Test Conditions
V(BR)DSS
Drain-source Breakdown
Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating TC = 125°C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
Min.
Typ.
Max.
55
Unit
V
1
10
µA
µA
±100
nA
Max.
Unit
4
V
2.7
3.5
mΩ
Typ.
Max.
Unit
ON (*)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
RDS(on)
Static Drain-source On
Resistance
VGS = 10 V
ID = 250 µA
Min.
Typ.
2
ID = 60 A
DYNAMIC
Symbol
2/8
Parameter
Test Conditions
gfs (*)
Forward Transconductance
VDS = 15 V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25V, f = 1 MHz, VGS = 0
ID = 60 A
Min.
100
S
12250
2600
745
pF
pF
pF
STW240NF55
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
VDD = 27.5 V
ID = 60 A
VGS = 10 V
RG = 4.7 Ω
(Resistive Load, Figure 3)
52
235
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD=27.5V ID=120A VGS=10V
350
75
140
480
nC
nC
nC
Typ.
Max.
Unit
ns
ns
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Turn-off Delay Time
Fall Time
Test Conditions
Min.
VDD = 27.5 V
ID = 60 A
VGS = 10 V
RG = 4.7Ω,
(Resistive Load, Figure 3)
225
115
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM (•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD = 120 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 120 A
di/dt = 100A/µs
Tj = 150°C
VDD = 20 V
(see test circuit, Figure 5)
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
VGS = 0
115
435
7.6
Max.
Unit
120
480
A
A
1.5
V
ns
nC
A
(*)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(•)Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/8
STW240NF55
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STW240NF55
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature
.
.
5/8
STW240NF55
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STW240NF55
TO-247 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
4.7
5.3
0.185
0.209
D
2.2
2.6
0.087
0.102
E
0.4
0.8
0.016
0.031
F
1
1.4
0.039
0.055
F3
2
2.4
0.079
0.094
F4
3
3.4
0.118
0.134
G
10.9
0.429
H
15.3
15.9
0.602
0.626
L
19.7
20.3
0.776
0.779
L3
14.2
14.8
0.559
0.582
L4
34.6
1.362
L5
5.5
0.217
M
2
3
0.079
0.118
P025P
7/8
STW240NF55
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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All other names are the property of their respective owners.
© 2004 STMicroelectronics - All Rights Reserved
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