STMICROELECTRONICS STN2NF06

STN2NF06

N - CHANNEL 60V - 0.12Ω - 2A - SOT-223
STripFET POWER MOSFET
TYPE
V DSS
R DS(on)
ID
ST N2NF06
60 V
< 0.15 Ω
2 A
■
■
■
■
■
TYPICAL RDS(on) = 0.12 Ω
EXCEPTIONAL dv/dt CAPABILITY
AVALANCHE RUGGED TECHNOLOGY
100 % AVALANCHE TESTED
APPLICATION ORIENTED
CHARACTERIZATION
2
DESCRIPTION
This Power Mosfet is the latest development of
STMicroelectronics unique ”Single Feature
Size ” stip-based process. The resulting transistor shows extremely high packing density for low
on-resistance, rugged avalanche characteristics
and less critical alignment steps therefore a remarkable manufacturing reproducibility.
1
2
3
SOT-223
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
DC MOTOR CONTROL (DISK DRIVES,etc.)
■
DC-DC & DC-AC CONVERTERS
■
SYNCHRONOUS RECTIFICATION
ABSOLUTE MAXIMUM RATINGS
Symbol
V DS
Parameter
Drain-source Voltage (VGS = 0)
V DGR
Drain- gate Voltage (RGS = 20 kΩ)
V GS
Gate-source Voltage
o
ID
Drain Current (continuous) at T c = 25 C
ID
Drain Current (continuous) at T c = 100 C
I DM (•)
P to t
o
Drain Current (pulsed)
o
Total Dissipation at Tc = 25 C
Derating Factor
dv/dt( 1 )
T st g
Tj
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction T emperature
(•) Pulse width limited by safe operating area
New RDS (on) spec. starting from JULY 98
July 1998
Value
Unit
60
V
60
V
± 20
V
2
A
1.8
A
8
A
2.5
W
0.02
W/ o C
6
V/ns
-65 to 150
o
C
150
o
C
(1) ISD ≤ 8 A, di/dt ≤ 200 A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX
1/9
STN2NF06
THERMAL DATA
R thj -pcb
R t hj- amb
Tl
Thermal Resistance Junction-PC Board
Max
Thermal Resistance Junction-ambient
Max
(Surface Mounted)
Maximum Lead Temperature For Soldering Purpose
o
50
60
o
C/W
C/W
o
260
C
AVALANCHE CHARACTERISTICS
Symb ol
Parameter
Max Valu e
Unit
I AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
2
A
E AS
Single Pulse Avalanche Energy
(starting Tj = 25 o C, I D = IAR , VDD = 25 V)
20
mJ
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symb ol
V (BR)DSS
I DSS
I GSS
Parameter
Drain-source
Breakdown Voltage
Test Cond ition s
I D = 250 µA
V DS = Max Rating
Zero G ate Voltage
Drain Current (VGS = 0) V DS = Max Rating
Gate-body Leakage
Current (V DS = 0)
Min.
Typ .
Max.
60
V GS = 0
Un it
V
o
T c = 125 C
V GS = ± 20 V
1
10
µA
µA
± 100
nA
ON (∗)
Symb ol
Parameter
Test Cond ition s
ID = 250 µA
V GS(th)
Gate Threshold
Voltage
R DS( on)
Static Drain-source On V GS = 10 V
Resistance
ID(o n)
V DS = VGS
Min.
Typ .
Max.
Un it
2
3
4
V
0.12
0.15
Ω
I D = 6A
2
On State Drain Current V DS > I D(on) x R DS(on) max
V GS = 10 V
A
DYNAMIC
Symb ol
g fs (∗)
C iss
C oss
C rss
2/9
Parameter
Test Cond ition s
Forward
Transconductance
V DS > I D(on) x R DS(on) max
Input Capacitance
Output Capacitance
Reverse T ransfer
Capacitance
V DS = 25 V
f = 1 MHz
ID = 1 A
VGS = 0 V
Min.
Typ .
Max.
Un it
1
3
S
760
100
30
pF
pF
pF
STN2NF06
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symb ol
t d(on)
tr
(di/dt) on
Qg
Q gs
Q gd
Parameter
Test Cond ition s
Min.
Typ .
Max.
Un it
Turn-on Time
Rise Time
V DD = 30 V
R G = 4.7 Ω
ID = 6 A
VGS = 10 V
10
35
ns
ns
Turn-on Current Slope
V DD = 25 V
R G = 4.7 Ω
ID = 6 A
VGS = 10 V
200
A/µs
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 40 V
I D = 12 A
20
5
7
nC
nC
nC
V GS = 10 V
SWITCHING OFF
Symb ol
t r(Vof f)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Cond ition s
V DD = 48 V
R G = 4.7 Ω
Min.
Typ .
Max.
7
18
30
I D = 12 A
V GS = 10 V
Un it
ns
ns
ns
SOURCE DRAIN DIODE
Symb ol
I SD
I SDM (•)
V SD (∗)
t rr
Q rr
I RRM
Parameter
Test Cond ition s
Min.
Typ .
Source-drain Current
Source-drain Current
(pulsed)
Forward On Voltage
I SD = 2 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 12 A
V DD = 30 V
VGS = 0
Max.
Un it
2
8
A
A
1.5
di/dt = 100 A/µs
o
T j = 150 C
V
65
ns
0.18
µC
5.5
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area
Thermal Impedance
3/9
STN2NF06
Derating Curve
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
4/9
STN2NF06
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Turn-on Current Slope
Turn-off Drain-source Voltage Slope
Cross-over Time
5/9
STN2NF06
Switching Safe Operating Area
Accidental Overload Area
Source-drain Diode Forward Characteristics
Fig. 1: Unclamped Inductive Load Test Circuit
6/9
Fig. 2: Unclamped Inductive Waveform
STN2NF06
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And DIode Recovery Times
7/9
STN2NF06
SOT-223 MECHANICAL DATA
mm
DIM.
mils
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
a
2.27
2.3
2.33
89.4
90.6
91.7
b
4.57
4.6
4.63
179.9
181.1
182.3
c
0.2
0.4
0.6
7.9
15.7
23.6
d
0.63
0.65
0.67
24.8
25.6
26.4
e1
1.5
1.6
1.7
59.1
63
66.9
e4
0.32
12.6
f
2.9
3
3.1
114.2
118.1
122.1
g
0.67
0.7
0.73
26.4
27.6
28.7
l1
6.7
7
7.3
263.8
275.6
287.4
l2
3.5
3.5
3.7
137.8
137.8
145.7
L
6.3
6.5
6.7
248
255.9
263.8
L
e1
l2
d
a
c
b
e4
f
l1
C
B
C
E
g
P008B
8/9
STN2NF06
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical compone nts in life support devices or systems without express written approval of STMicroelectronics.
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 1998 STMicroelectronics – Printed in Italy – All Rights Reserved
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