NEC UPD43256B-XXLL

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD43256B
256K-BIT CMOS STATIC RAM
32K-WORD BY 8-BIT
Description
The µPD43256B is a high speed, low power, and 262,144 bits (32,768 words by 8 bits) CMOS static RAM.
Battery backup is available. And A and B versions are wide voltage operations.
The µPD43256B is packed in 28-pin plastic DIP, 28-pin plastic SOP and 28-pin plastic TSOP (I) (8 x 13.4 mm).
Features
• 32,768 words by 8 bits organization
• Fast access time: 70, 85, 100, 120, 150 ns (MAX.)
• Low voltage operation (A version: VCC = 3.0 to 5.5 V, B version: VCC = 2.7 to 5.5 V)
• Low VCC data retention: 2.0 V (MIN.)
• /OE input for easy application
Part number
Access time
Operating supply Operating ambient
ns (MAX.)
µPD43256B-xxL
70, 85
Supply current
voltage
temperature
At operating
At standby
At data retention
V
°C
mA (MAX.)
µA (MAX.)
µA (MAX.) Note1
4.5 to 5.5
0 to 70
45
50
3
15
2
µPD43256B-xxLL
µPD43256B-Axx
µPD43256B-Bxx Note2
85, 100
Note2
, 120
Note2
100, 120, 150
3.0 to 5.5
2.7 to 5.5
Notes 1. TA ≤ 40 °C, VCC = 3.0 V
2. Access time: 85 ns (MAX.) (VCC = 4.5 to 5.5 V)
Version X and P
This Data sheet can be applied to the version X and P. Each version is identified with its lot number. Letter X in the
fifth character position in a lot number signifies version X, letter P, version P.
JAPAN
D43256B
Lot number
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. M10770EJCV0DS00 (12th edition)
Date Published June 2000 NS CP (K)
Printed in Japan
The mark ★ shows major revised points.
©
1990, 1993, 1994
µPD43256B
Ordering Information
Part number
Package
Access time
ns (MAX.)
µPD43256BCZ-70L
28-PIN PLASTIC DIP
70
µPD43256BCZ-85L
(15.24 mm (600))
85
µPD43256BCZ-70LL
70
µPD43256BCZ-85LL
85
µPD43256BGU-70L
28-PIN PLASTIC SOP
70
µPD43256BGU-85L
(11.43 mm (450))
85
µPD43256BGU-70LL
70
µPD43256BGU-85LL
85
µPD43256BGU-A85
85
µPD43256BGU-A10
100
µPD43256BGU-A12
120
µPD43256BGU-B10
100
µPD43256BGU-B12
120
µPD43256BGW-70LL-9JL
28-PIN PLASTIC TSOP (I)
70
µPD43256BGW-85LL-9JL
(8x13.4) (Normal bent)
85
µPD43256BGW-A85-9JL
85
µPD43256BGW-A10-9JL
100
µPD43256BGW-A12-9JL
120
µPD43256BGW-B10-9JL
100
µPD43256BGW-B12-9JL
120
µPD43256BGW-B15-9JL
150
µPD43256BGW-70LL-9KL
28-PIN PLASTIC TSOP (I)
70
µPD43256BGW-85LL-9KL
(8x13.4) (Reverse bent)
85
µPD43256BGW-A85-9KL
85
µPD43256BGW-A10-9KL
100
µPD43256BGW-A12-9KL
120
µPD43256BGW-B10-9KL
100
µPD43256BGW-B12-9KL
120
µPD43256BGW-B15-9KL
150
2
Data Sheet M10770EJCV0DS00
Operating supply Operating ambient
voltage
temperature
V
°C
4.5 to 5.5
0 to 70
Remark
L version
LL version
L version
LL version
3.0 to 5.5
A version
2.7 to 5.5
B version
4.5 to 5.5
LL version
3.0 to 5.5
A version
2.7 to 5.5
B version
4.5 to 5.5
LL version
3.0 to 5.5
A version
2.7 to 5.5
B version
µPD43256B
Pin Configurations (Marking Side)
/xxx indicates active low signal.
28-PIN PLASTIC DIP (15.24 mm (600))
[ µPD43256BCZ-xxL ]
[ µPD43256BCZ-xxLL ]
A14
1
28
VCC
A12
2
27
/WE
A7
3
26
A13
A6
4
25
A8
A5
5
24
A9
A4
6
23
A11
A3
7
22
/OE
A2
8
21
A10
A1
9
20
/CS
A0
10
19
I/O8
I/O1
11
18
I/O7
I/O2
12
17
I/O6
I/O3
13
16
I/O5
GND
14
15
I/O4
A0 - A14
: Address inputs
I/O1 - I/O8
: Data inputs / outputs
/CS
: Chip Select
/WE
: Write Enable
/OE
: Output Enable
VCC
: Power supply
GND
: Ground
Remark Refer to Package Drawings for the 1-pin index mark.
Data Sheet M10770EJCV0DS00
3
µPD43256B
28-PIN PLASTIC SOP (11.43 mm (450))
[ µPD43256BGU-xxL ]
[ µPD43256BGU-xxLL ]
[ µPD43256BGU-Axx ]
[ µPD43256BGU-Bxx ]
A14
1
28
VCC
A12
2
27
/WE
A7
3
26
A13
A6
4
25
A8
A5
5
24
A9
A4
6
23
A11
A3
7
22
/OE
A2
8
21
A10
A1
9
20
/CS
A0
10
19
I/O8
I/O1
11
18
I/O7
I/O2
12
17
I/O6
I/O3
13
16
I/O5
GND
14
15
I/O4
A0 - A14
: Address inputs
I/O1 - I/O8
: Data inputs / outputs
/CS
: Chip Select
/WE
: Write Enable
/OE
: Output Enable
VCC
: Power supply
GND
: Ground
Remark Refer to Package Drawings for the 1-pin index mark.
4
Data Sheet M10770EJCV0DS00
µPD43256B
28-PIN PLASTIC TSOP (I) (8x13.4) (Normal bent)
[ µPD43256BGW-xxLL-9JL ]
[ µPD43256BGW-Axx-9JL ]
[ µPD43256BGW-Bxx-9JL ]
/OE
A11
A9
A8
A13
/WE
VCC
A14
A12
A7
A6
A5
A4
A3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
A10
/CS
I/O8
I/O7
I/O6
I/O5
I/O4
GND
I/O3
I/O2
I/O1
A0
A1
A2
28-PIN PLASTIC TSOP (I) (8x13.4) (Reverse bent)
[ µPD43256BGW-xxLL-9KL ]
[ µPD43256BGW-Axx-9KL ]
[ µPD43256BGW-Bxx-9KL ]
A10
/CS
I/O8
I/O7
I/O6
I/O5
I/O4
GND
I/O3
I/O2
I/O1
A0
A1
A2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
A0 - A14
: Address inputs
I/O1 - I/O8
: Data inputs / outputs
/CS
: Chip Select
/WE
: Write Enable
/OE
: Output Enable
VCC
: Power supply
GND
: Ground
/OE
A11
A9
A8
A13
/WE
VCC
A14
A12
A7
A6
A5
A4
A3
Remark Refer to Package Drawings for the 1-pin index mark.
Data Sheet M10770EJCV0DS00
5
µPD43256B
Block Diagram
A0
Address
buffer
A14
Row
decoder
I/O1
Input data
controller
I/O8
Memory cell array
262,144 bits
Sense amplifier /
Switching circuit
Column decoder
Output data
controller
Address buffer
/CS
/OE
/WE
VCC
GND
Truth Table
/CS
/OE
/WE
Mode
I/O
Supply current
H
×
×
Not selected
High impedance
ISB
L
H
H
Output disable
L
×
L
Write
DIN
L
L
H
Read
DOUT
ICCA
Remark × : VIH or VIL
6
Data Sheet M10770EJCV0DS00
µPD43256B
Electrical Specifications
Absolute Maximum Ratings
Parameter
Symbol
Supply voltage
Condition
Rating
VCC
–0.5
–0.5
Note
Note
Unit
to +7.0
V
to VCC + 0.5
V
Input / Output voltage
VT
Operating ambient temperature
TA
0 to 70
°C
Storage temperature
Tstg
–55 to +125
°C
Note –3.0 V (MIN.) (Pulse width : 50 ns)
Caution Exposing the device to stress above those listed in Absolute Maximum Rating could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter
Symbol Condition
µPD43256B-xxL
µPD43256B-Axx
µPD43256B-Bxx
Unit
µPD43256B-xxLL
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
Supply voltage
VCC
4.5
5.5
3.0
5.5
2.7
5.5
V
High level input voltage
VIH
2.2
VCC+0.5
2.2
VCC+0.5
2.2
VCC+0.5
V
+0.5
V
70
°C
Low level input voltage
VIL
–0.3
Operating ambient temperature
TA
0
Note
+0.8
–0.3
70
Note
+0.5
0
70
–0.3
0
Note
Note –3.0 V (MIN.) (Pulse width: 50 ns)
Capacitance (TA = 25 °C, f = 1 MHz)
Parameter
Symbol
Test conditions
MIN.
TYP.
MAX.
Unit
Input capacitance
CIN
VIN = 0 V
5
pF
Input / Output capacitance
CI/O
VI/O = 0 V
8
pF
Remarks 1. VIN : Input voltage
VI/O : Input / Output voltage
2. These parameters are periodically sampled and not 100% tested.
Data Sheet M10770EJCV0DS00
7
µPD43256B
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) (1/2)
Parameter
Symbol
Test condition
µPD43256B-xxL
MIN.
TYP.
µPD43256B-xxLL
MAX.
MIN.
TYP.
Unit
MAX.
Input leakage current
ILI
VIN = 0 V to VCC
–1.0
+1.0
–1.0
+1.0
µA
I/O leakage current
ILO
VI/O = 0 V to VCC, /OE = VIH or
–1.0
+1.0
–1.0
+1.0
µA
mA
/CS = VIH or /WE = VIL
Operating supply current
ICCA1
/CS = VIL, Minimum cycle time, II/O = 0 mA
45
45
ICCA2
/CS = VIL, II/O = 0 mA
10
10
ICCA3
/CS ≤ 0.2 V, Cycle = 1 MHz,
10
10
3
3
mA
15
µA
II/O = 0 mA, VIL ≤ 0.2 V, VIH ≥ VCC – 0.2 V
Standby supply current
High level output voltage
Low level output voltage
ISB
/CS = VIH
ISB1
/CS ≥ VCC − 0.2 V
VOH1
IOH = –1.0 mA
2.4
2.4
VOH2
IOH = –0.1 mA
VCC–0.5
VCC–0.5
VOL
IOL = 2.1 mA
1.0
0.4
Remarks 1. VIN : Input voltage
VI/O : Input / Output voltage
2. These DC characteristics are in common regardless of package types.
8
50
Data Sheet M10770EJCV0DS00
0.5
V
0.4
V
µPD43256B
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) (2/2)
Parameter
Symbol
µPD43256B-Axx
Test condition
MIN.
TYP.
µPD43256B-Bxx
MAX.
MIN.
TYP.
Unit
MAX.
Input leakage current
ILI
VIN = 0 V to VCC
–1.0
+1.0
–1.0
+1.0
µA
I/O leakage current
ILO
VI/O = 0 V to VCC, /OE = VIH or
–1.0
+1.0
–1.0
+1.0
µA
mA
/CS = VIH or /WE = VIL
Operating supply current
ICCA1
/CS = VIL,
µPD43256B-Axx
45
–
Minimum cycle time,
µPD43256B-Bxx
–
45
VCC ≤ 3.3 V
–
20
10
10
–
5
/CS ≤ 0.2 V, Cycle = 1 MHz, II/O = 0 mA,
10
10
VIL ≤ 0.2 V, VIH ≥ VCC – 0.2 V
–
5
3
3
–
2
II/O = 0 mA
ICCA2
/CS = VIL, II/O = 0 mA
VCC ≤ 3.3 V
ICCA3
Standby supply current
ISB
VCC ≤ 3.3 V
/CS = VIH
VCC ≤ 3.3 V
ISB1
/CS ≥ VCC − 0.2 V
0.5
VCC ≤ 3.3 V
High level output voltage
Low level output voltage
VOH1
15
0.5
15
–
0.5
10
IOH = –1.0 mA, VCC ≥ 4.5 V
2.4
2.4
IOH = –0.5 mA, VCC < 4.5 V
2.4
2.4
VCC–0.1
VCC–0.1
µA
V
VOH2
IOH = –0.02 mA
VOL
IOL = 2.1 mA, VCC ≥ 4.5 V
0.4
0.4
IOL = 1.0 mA, VCC < 4.5 V
0.4
0.4
IOL = 0.02 mA
0.1
0.1
VOL1
mA
V
Remarks 1. VIN : Input voltage
VI/O : Input / Output voltage
2. These DC characteristics are in common regardless of package types.
Data Sheet M10770EJCV0DS00
9
µPD43256B
AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)
AC Test Conditions
[ µPD43256B-70L, µPD43256B-85L, µPD43256B-70LL, µPD43256B-85LL ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
2.2 V
Test points
1.5 V
1.5 V
0.8 V
Output Waveform
1.5 V
Test points
1.5 V
Output Load
AC characteristics should be measured with the following output load conditions.
Figure 1
Figure 2
(tAA, tACS, tOE, tOH)
(tCHZ, tCLZ, tOHZ, tOLZ, tWHZ, tOW)
+5 V
+5 V
1.8 kΩ
I/O (Output)
1.8 kΩ
I/O (Output)
990 Ω
990 Ω
100 pF
CL
5 pF
CL
Remark CL includes capacitance of the probe and jig, and stray capacitance.
[ µPD43256B-A85, µPD43256B-A10, µPD43256B-A12, µPD43256B-B10, µPD43256B-B12, µPD43256B-B15 ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
2.2 V
1.5 V
Test points
1.5 V
0.5 V
Output Waveform
1.5 V
Test points
1.5 V
Output Load
AC characteristics should be measured with the following output load conditions.
10
tAA, tACS, tOE, tOH
tCHZ, tCLZ, tOHZ, tOLZ, tWHZ, tOW
1TTL + 100 pF
1TTL + 5 pF
Data Sheet M10770EJCV0DS00
µPD43256B
Read Cycle (1/2)
Parameter
VCC ≥ 4.5 V
Symbol
Unit
µPD43256B-70
Condition
µPD43256B-85
µPD43256B-A85/A10/A12
µPD43256B-B10/B12/B15
MIN.
MAX.
MIN.
Read cycle time
tRC
Address access time
tAA
70
85
ns
/CS access time
tACS
70
85
ns
/OE access time
tOE
35
40
ns
Output hold from address change
tOH
10
10
ns
/CS to output in low impedance
tCLZ
10
10
ns
/OE to output in low impedance
tOLZ
5
5
ns
/CS to output in high impedance
tCHZ
30
30
ns
/OE to output in high impedance
tOHZ
30
30
ns
Note
70
MAX.
85
ns
Note
See the output load.
Remark These AC characteristics are in common regardless of package types and L, LL versions.
Read Cycle (2/2)
Parameter
VCC ≥ 3.0 V
Symbol
µPD43256B
-A85
µPD43256B
-A10
VCC ≥ 2.7 V
µPD43256B
-A12
µPD43256B
-B10
µPD43256B
-B12
Unit
µPD43256B
-B15
Condition
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
Read cycle time
tRC
Address access
time
tAA
85
100
120
100
120
150
ns
/CS access time
tACS
85
100
120
100
120
150
ns
/OE access time
tOE
50
60
60
60
60
70
ns
Output hold from
address change
tOH
10
10
10
10
10
10
ns
/CS to output in
low impedance
tCLZ
10
10
10
10
10
10
ns
/OE to output in
low impedance
tOLZ
5
5
5
5
5
5
ns
/CS to output in
high impedance
tCHZ
35
35
40
35
40
50
ns
/OE to output in
high impedance
tOHZ
35
35
40
35
40
50
ns
Note
85
100
120
100
120
150
ns
Note
See the output load.
Remark These AC characteristics are in common regardless of package types.
Data Sheet M10770EJCV0DS00
11
µPD43256B
Read Cycle Timing Chart
tRC
Address (Input)
tAA
tOH
/CS (Input)
tCHZ
tACS
tCLZ
/OE (Input)
tOHZ
tOE
tOLZ
I/O (Output)
Remark
12
High impedance
In read cycle, /WE should be fixed to high level.
Data Sheet M10770EJCV0DS00
Data out
µPD43256B
Write Cycle (1/2)
Parameter
VCC ≥ 4.5 V
Symbol
Unit
µPD43256B-70
Condition
µPD43256B-85
µPD43256B-A85/A10/A12
µPD43256B-B10/B12/B15
MIN.
MAX.
MIN.
MAX.
Write cycle time
tWC
70
85
ns
/CS to end of write
tCW
50
70
ns
Address valid to end of write
tAW
50
70
ns
Write pulse width
tWP
55
60
ns
Data valid to end of write
tDW
30
35
ns
Data hold time
tDH
0
0
ns
Address setup time
tAS
0
0
ns
Write recovery time
tWR
0
0
ns
/WE to output in high impedance
tWHZ
Output active from end of write
tOW
Note
30
30
10
Note
ns
10
ns
See the output load.
Remark These AC characteristics are in common regardless of package types and L, LL versions.
Write Cycle (2/2)
Parameter
VCC ≥ 3.0 V
Symbol
µPD43256B
-A85
µPD43256B
-A10
VCC ≥ 2.7 V
µPD43256B
-A12
µPD43256B
-B10
µPD43256B
-B12
Unit Con-
µPD43256B
-B15
dition
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
Write cycle time
tWC
85
100
120
100
120
150
ns
/CS to end of write
tCW
70
70
90
70
90
100
ns
Address valid to
end of write
tAW
70
70
90
70
90
100
ns
Write pulse width
tWP
60
60
80
60
80
90
ns
Data valid to end
of write
tDW
60
60
70
60
70
80
ns
Data hold time
tDH
0
0
0
0
0
0
ns
Address setup
tAS
0
0
0
0
0
0
ns
Write recovery
tWR
0
0
0
0
0
0
ns
/WE to output in
high impedance
tWHZ
Output active
from end of write
tOW
Note
30
10
35
10
40
10
35
10
40
10
50
10
ns
Note
ns
See the output load.
Remark These AC characteristics are in common regardless of package types.
Data Sheet M10770EJCV0DS00
13
µPD43256B
Write Cycle Timing Chart 1 (/WE Controlled)
tWC
Address (Input)
tCW
/CS (Input)
tAW
tAS
tWP
tWR
/WE (Input)
tOW
tWHZ
I/O (Input / Output)
Indefinite data out
tDW
High
impedance
Data in
tDH
High
impedance
Indefinite data out
Cautions 1. /CS or /WE should be fixed to high level during address transition.
•
2. When I/O pins are in the output state, therefore the input signals must not be applied to
the output.
Remarks 1. Write operation is done during the overlap time of a low level /CS and a low level /WE.
2. When /WE is at low level, the I/O pins are always high impedance. When /WE is at high level,
read operation is executed. Therefore /OE should be at high level to make the I/O pins high
impedance.
3. If /CS changes to low level at the same time or after the change of /WE to low level, the I/O
pins will remain high impedance state.
14
Data Sheet M10770EJCV0DS00
µPD43256B
Write Cycle Timing Chart 2 (/CS Controlled)
tWC
Address (Input)
tAS
tCW
/CS (Input)
tAW
tWP
tWR
/WE (Input)
tDW
tDH
High impedance
Data in
I/O (Input)
High
impedance
Cautions 1. /CS or /WE should be fixed to high level during address transition.
•
2. When I/O pins are in the output state, therefore the input signals must not be applied to
the output.
Remark
Write operation is done during the overlap time of a low level /CS and a low level /WE.
Data Sheet M10770EJCV0DS00
15
µPD43256B
Low VCC Data Retention Characteristics (TA = 0 to 70 °C)
Parameter
Symbol
µPD43256B-xxL
Test Condition
µPD43256B-xxLL
Unit
µPD43256B-Axx
µPD43256B-Bxx
MIN.
TYP.
MAX.
MIN.
5.5
2.0
TYP.
MAX.
VCCDR
/CS ≥ VCC − 0.2 V
Data retention supply current
ICCDR
VCC = 3.0 V, /CS ≥ VCC − 0.2 V
Chip deselection
to data retention mode
tCDR
0
0
ns
tR
5
5
ms
Data retention supply voltage
Operation recovery time
2.0
0.5
20
Note1
Notes 1. 3 µA (TA ≤ 40 °C)
2. 2 µA (TA ≤ 40 °C), 1 µA (TA ≤ 25 °C)
Data Retention Timing Chart
tCDR
Data retention mode
VCC
4.5 V
Note
/CS
VIH (MIN.)
VCCDR (MIN.)
/CS ≥ VCC – 0.2 V
VIL (MAX.)
GND
Note A version : 3.0 V, B version : 2.7 V
Remark The other pins (Address, /OE, /WE, I/O) can be in high impedance state.
16
Data Sheet M10770EJCV0DS00
tR
5.5
0.5
7
Note2
V
µA
µPD43256B
Package Drawings
28-PIN PLASTIC DIP (15.24 mm (600))
28
15
1
14
A
J
K
I
L
F
D
C
N
B
R
M
M
H
G
NOTES
1. Each lead centerline is located within 0.25 mm
of its true position (T.P.) at maximum material condition.
2. Item "K" to center of leads when formed parallel.
ITEM
MILLIMETERS
A
38.10 MAX.
B
2.54 MAX.
C
2.54 (T.P.)
D
0.50±0.10
F
1.2 MIN.
G
3.6±0.3
H
0.51 MIN.
I
4.31 MAX.
J
5.72 MAX.
K
L
15.24 (T.P.)
13.2
M
0.25 +0.10
−0.05
N
0.25
R
0 - 15°
P28C-100-600A1-2
Data Sheet M10770EJCV0DS00
17
µPD43256B
•
28-PIN PLASTIC SOP (11.43 mm (450))
28
15
detail of lead end
P
1
14
A
F
H
G
I
J
S
C
D
M
N
M
L
S
B
K
E
NOTE
Each lead centerline is located within 0.12 mm of
its true position (T.P.) at maximum material condition.
ITEM
MILLIMETERS
A
18.0 +0.6
−0.05
B
1.27 MAX.
C
1.27 (T.P.)
D
0.42 +0.08
−0.07
E
0.2±0.1
F
2.95 MAX.
G
2.55±0.1
H
11.8±0.3
I
8.4±0.1
J
1.7±0.2
K
0.22±0.05
L
M
0.7±0.2
0.12
N
0.10
P
3° +7°
−3°
P28GU-50-450A-4
18
Data Sheet M10770EJCV0DS00
µPD43256B
28-PIN PLASTIC TSOP(I) (8x13.4)
1
28
detail of lead end
S
R
14
Q
15
P
A
J
I
G
S
L
B
C
H
N
S
D
M
M
K
NOTES
1. Each lead centerline is located within 0.08 mm of
its true position (T.P.) at maximum material condition.
2. "A" excludes mold flash. (Includes mold flash : 8.4mm MAX.)
ITEM
A
MILLIMETERS
8.0±0.1
B
C
0.6 MAX.
0.55 (T.P.)
D
0.22 +0.08
−0.07
G
H
1.0
12.4±0.2
I
11.8±0.1
J
0.8±0.2
K
0.145 +0.025
−0.015
L
0.5±0.1
M
0.08
N
0.10
P
13.4±0.2
Q
0.1±0.05
R
S
3° +7°
−3°
1.2 MAX.
P28GW-55-9JL-2
Data Sheet M10770EJCV0DS00
19
µPD43256B
28-PIN PLASTIC TSOP(I) (8x13.4)
1
28
detail of lead end
Q
R
14
15
S
K
N
H
D
S
L
M
M
C
B
S
G
I
J
A
P
NOTE
1. Each lead centerline is located within 0.08 mm of
its true position (T.P.) at maximum material condition.
2. "A" excludes mold flash. (Includes mold flash : 8.4mm MAX.)
ITEM
MILLIMETERS
A
8.0±0.1
B
C
0.6 MAX.
0.55 (T.P.)
D
0.22 +0.08
−0.07
G
H
1.0
12.4±0.2
I
11.8±0.1
J
0.8±0.2
K
0.145 +0.025
−0.015
L
M
0.5±0.1
0.08
N
0.10
P
13.4±0.2
Q
0.1±0.05
R
3° +7°
−3°
S
1.2 MAX.
P28GW-55-9KL-2
20
Data Sheet M10770EJCV0DS00
µPD43256B
Recommended Soldering Conditions
The following conditions (See table below) must be met when soldering µPD43256B. For more details, refer to our
document “SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL” (C10535E).
Please consult with our sales offices in case other soldering process is used, or in case soldering is done under
different conditions.
Types of Surface Mount Device
µPD43256BGU-xxL
: 28-PIN PLASTIC SOP (11.43 mm (450))
µPD43256BGU-xxLL
: 28-PIN PLASTIC SOP (11.43 mm (450))
µPD43256BGU-Axx
: 28-PIN PLASTIC SOP (11.43 mm (450))
µPD43256BGU-Bxx
: 28-PIN PLASTIC SOP (11.43 mm (450))
µPD43256BGW-xxLL-9JL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Normal bent)
µPD43256BGW-xxLL-9KL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Reverse bent)
µPD43256BGW-Axx-9JL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Normal bent)
µPD43256BGW-Axx-9KL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Reverse bent)
µPD43256BGW-Bxx-9JL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Normal bent)
µPD43256BGW-Bxx-9KL
: 28-PIN PLASTIC TSOP (I) (8x13.4) (Reverse bent)
Please consult with our sales offices.
Types of Through Hole Mount Device
µPD43256BCZ-xxL
: 28-PIN PLASTIC DIP (15.24 mm (600))
µPD43256BCZ-xxLL
: 28-PIN PLASTIC DIP (15.24 mm (600))
Soldering process
Wave soldering (only to leads)
Soldering conditions
Solder temperature : 260 °C or below,
Flow time : 10 seconds or below
Partial heating method
Terminal temperature : 300 °C or below,
Time : 3 seconds or below (Per one lead)
Caution Do not jet molten solder on the surface of package.
Data Sheet M10770EJCV0DS00
21
µPD43256B
[ MEMO ]
22
Data Sheet M10770EJCV0DS00
µPD43256B
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Data Sheet M10770EJCV0DS00
23
µPD43256B
• The information in this document is current as of June, 2000. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
• While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4