PANASONIC 2SK3560

Power MOSFETs
2SK3560
Silicon N-channel power MOSFET
Unit: mm
■ Absolute Maximum Ratings TC = 25°C
VDSS
230
V
Gate-source surrender voltage
VGSS
±30
V
Drain current
ID
30
A
Peak drain current
IDP
120
A
PD
50
W
Ta = 25°C
0 to 0.3
(10.2)
(8.9)
Unit
Drain-source surrender voltage
Power
dissipation
2.5±0.2
2.54±0.3
1
2
3
(6.4) (1.4)
Rating
1.4±0.1
0.8±0.1
(2.1)
Symbol
0.6±0.1
3.0±0.5
0 to 0.5
• Low on-resistance, low Qg
• High avalanche resistance
1.5±0.3
■ Features
Parameter
1.4±0.1
10.1±0.3
For PDP/For high-speed switching
4.6±0.2
(1.4)
10.5±0.3
1: Gate
2: Drain
3: Source
TO-220C-G1 Package
3
Channel temperature
Tch
150
°C
Storage temperature
Tstg
−55 to +150
°C
Internal Connection
D
G
S
■ Electrical Characteristics TC = 25°C ± 3°C
Parameter
Symbol
Conditions
Gate-drain surrender voltage
VDSS
ID = 1 mA, VGS = 0
Diode forward voltage
VDSF
IDR = 30 A, VGS = 0
Gate threshold voltage
Vth
VDS = 25 V, ID = 1 mA
Drain-source cutoff current
IDSS
VDS = 184 V, VGS = 0
Gate-source cutoff currentt
IGSS
VGS = ±30 V, VDS = 0
Drain-source on resistance
RDS(on)
VGS = 10 V, ID = 15 A
Forward transfer admittance
Yfs
VDS = 25 V, ID = 15 A
Min
Typ
Max
230
V
−1.5
2
55
V
4
V
100
µA
±1
µA
74
mΩ
19
S
2 330
pF
Coss
356
pF
Reverse transfer capacitance
(Common-source)
Crss
44
pF
Turn-on delay time
td(on)
VDD ≈ 100 V, ID = 15 A
39
ns
tr
RL ≈ 6.7 Ω, VGS = 10 V
Short-circuit forward transfer capacitance
(Common-source)
Ciss
Short-circuit output capacitance
(Common-source)
Rise time
Turn-off delay time
VDS = 25 V, VGS = 0, f = 1 MHz
td(off)
8
Unit
37
ns
221
ns
Fall time
tf
46
ns
Reverse recovery time
trr
L = 230 µH, VDD = 100 V
164
ns
Reverse recovery charge
Qrr
IDR = 15 A, di /dt = 100 A/ µs
853
nC
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
Publication date: February 2004
SJG00033AED
1
2SK3560
■ Electrical Characteristics (Continued) TC = 25°C ± 3°C
Parameter
Symbol
Conditions
Qg
VDD = 100 V, ID = 25 A
Gate-source charge
Qgs
VGS = 10 V
Gate-drain charge
Qgd
Total gate charge
Min
Typ
Max
Unit
51.2
nC
8.2
nC
19.4
nC
Channel-case heat resistance
Rth(ch-c)
2.5
°C/W
Channel-atmosphere heat resistance
Rth(ch-a)
89.2
°C/W
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
PC  Ta
Safe operation area
103
IDP
Drain current ID (A)
ID
t = 100 µs
10
1 ms
1
10 ms
(1) TC = Ta
(2) Without heat sink
80
60
(1)
40
20
(2)
1
10
102
Drain-source voltage VDS (V)
2
Collector power dissipation PC (W)
Non repetitive pulse
TC = 25°C
102
10−1
100
103
0
0
50
100
Ambient temperature Ta (°C)
SJG00033AED
150
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and semiconductors described in this material
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the products or technical information described in this material and controlled under the "Foreign Exchange
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Consult our sales staff in advance for information on the following applications:
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(5) The products and product specifications described in this material are subject to change without notice for
modification and/or improvement. At the final stage of your design, purchasing, or use of the products,
therefore, ask for the most up-to-date Product Standards in advance to make sure that the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not
be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of
break down and failure mode, possible to occur to semiconductor products. Measures on the systems such
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2003 SEP