HITACHI HAF2008

HAF2008
Silicon N Channel MOS FET Series
Power Switching
Target specification
ADE-208-707 (Z)
1st. Edition
Dec. 1998
This FET has the over temperature shut–down capability sensing to the junction temperature. This FET has
the built–in over temperature shut–down circuit in the gate area. And this circuit operation to shut–down
the gate voltage in case of high junction temperature like applying over power consumption, over current
etc.
Features
•
•
•
•
Logic level operation (4 to 6 V Gate drive)
High endurance capability against to the short circuit
Built–in the over temperature shut–down circuit
Latch type shut–down operation (Need 0 voltage recovery)
Outline
TO–220FM
2
D
1
Gate resistor
G
Tempe–
rature
Sencing
Circuit
Latch
Circuit
Gate
Shut–
down
Circuit
1 2
3
S
3
1. Gate
2. Drain
3. Source
HAF2008
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDSS
60
V
Gate to source voltage
VGSS
(16)
V
Gate to source voltage
VGSS
(–2.5)
V
Drain current
ID
20
A
40
A
20
A
30
W
Drain peak current
I D(pulse)
Body-drain diode reverse drain current
I DR
Note1
Note2
Channel dissipation
Pch
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Note:
1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Ta = 25°C
Typical Operation Characteristics
Item
Symbol
Min
Typ
Max
Unit
Input voltage
VIH
3.5
—
—
V
VIL
—
—
1.2
V
Input current
I IH1
—
—
100
µA
Vi = 8V, VDS = 0
(Gate non shut down)
I IH2
—
—
50
µA
Vi = 3.5V, VDS = 0
I IL
—
—
1
µA
Vi = 1.2V, VDS = 0
Input current
I IH(sd)1
—
0.8
—
mA
Vi = 8V, VDS = 0
(Gate non shut down)
I IH(sd)2
—
0.35
—
mA
Vi = 3.5V, VDS = 0
Shut down temperature Tsd
—
175
—
°C
Channel temperature
Gate operation voltage Vop
3.5
—
12
V
2
Test Conditions
HAF2008
Electrical Characteristics (Ta = 25°C)
Item
Symbol Min
Typ
Max
Unit
Test Conditions
Drain current
I D1
(25)
—
—
A
VGS = 3.5V, VDS = 2V
Drain current
I D2
—
—
10
mA
VGS = 1.2V, VDS = 2V
Drain to source breakdown voltage V(BR)DSS
60
—
—
V
I D = 10mA, VGS = 0
Gate to source breakdown voltage V(BR)GSS
(16)
—
—
V
I G = (300µA), VDS = 0
Gate to source breakdown voltage V(BR)GSS
(–2.5)
—
—
V
I G = (–100µA), VDS = 0
Gate to source leak current
I GSS1
—
—
100
µA
VGS = 8V, VDS = 0
I GSS2
—
—
50
µA
VGS = 3.5V, VDS = 0
I GSS3
—
—
1
µA
VGS = 1.2V, VDS = 0
I GSS4
—
—
–100
µA
VGS = –2.4V, VDS = 0
I GS(op)1
—
0.8
—
mA
VGS = 8V, VDS = 0
I GS(op)2
—
0.35
—
mA
VGS = 3.5V, VDS = 0
Zero gate voltege drain current
I DSS
—
—
10
µA
VDS = 60 V, VGS = 0
Gate to source cutoff voltage
VGS(off)
1.0
—
2.25
V
I D = 1mA, VDS = 10V
Static drain to source on state
resistance
RDS(on)
—
45
60
mΩ
I D = 10A, VGS = 4V Note3
Static drain to source on state
resistance
RDS(on)
—
28
40
mΩ
I D = 10A, VGS = 10V Note3
Forward transfer admittance
|yfs|
(11)
(17)
—
S
I D = 10A, VDS = 10V Note3
Output capacitance
Coss
—
(380)
—
pF
VDS = 10V , VGS = 0
f = 1 MHz
Turn-on delay time
t d(on)
—
(
)
—
µs
I D = 10A, VGS = 5V
Rise time
tr
—
(
)
—
µs
RL = 3Ω
Turn-off delay time
t d(off)
—
(
)
—
µs
Fall time
tf
—
(
)
—
µs
Body–drain diode forward voltage
VDF
—
(1.0)
—
V
I F = 20A, VGS = 0
Body–drain diode reverse
recovery time
t rr
—
(
)
—
ns
I F = 20A, VGS = 0
diF/ dt =50A/µs
Over load shut down
t os1
—
(
)
—
ms
VGS = 5V, VDD = 12V
t os2
—
(
)
—
ms
VGS = 5V, VDD = 24V
Input current (shut down)
operation time
Note:
Note4
3. Pulse test
4. Include the time shift based on increasing of chennel temperature when operete under over load
condition.
3
HAF2008
Main Characteristics
Power vs. Temperature Derating
Channel Dissipation
Pch (W)
40
30
20
10
0
50
100
Case Temperature
4
150
Tc (°C)
200
HAF2008
Package Dimensions
Unit: mm
2.8 ± 0.2
2.5 ± 0.2
10.0 ± 0.3
7.0 ± 0.3
2.54 ± 0.5
2.54 ± 0.5
2.7
14.0 ± 1.0
0.7 ± 0.1
4.45 ± 0.3
2.0 ± 0.3
5.0 ± 0.3
1.2 ± 0.2
1.4 ± 0.2
17.0 ± 0.3
12.0 ± 0.3
0.6
φ 3.2 ± 0.2
0.5 ± 0.1
Hitachi Code TO–220FM
SC–72
EIAJ Code
—
JEDEC Code
5
HAF2008
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
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