PHILIPS PHP130N03LT

Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
FEATURES
PHP130N03LT, PHB130N03LT
SYMBOL
• ’Trench’ technology
• Very low on-state resistance
• Fast switching
• Stable off-state characteristics
• High thermal cycling performance
• Low thermal resistance
QUICK REFERENCE DATA
VDSS = 30 V
d
ID = 75 A
RDS(ON) ≤ 6 mΩ (VGS = 5 V)
g
s
RDS(ON) ≤ 5 mΩ (VGS = 10 V)
GENERAL DESCRIPTION
N-channel enhancement mode logic level field-effect power transistor in a plastic envelope using ’trench’ technology.
The device has very low on-state resistance. It is intended for use in dc to dc converters and general purpose switching
applications.
The PHP130N03LT is supplied in the SOT78 (TO220AB) conventional leaded package.
The PHB130N03LT is supplied in the SOT404 surface mounting package.
PINNING
SOT78 (TO220AB)
PIN
SOT404
DESCRIPTION
tab
tab
1
gate
2
drain1
3
source
tab
2
drain
1
1 23
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDSS
VDGR
VGS
ID
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Continuous drain current
Tj = 25 ˚C to 175˚C
Tj = 25 ˚C to 175˚C; RGS = 20 kΩ
IDM
PD
Tj, Tstg
Pulsed drain current
Total power dissipation
Operating junction and
storage temperature
- 55
30
30
± 13
75
75
240
187
175
V
V
V
A
A
A
W
˚C
Tmb = 25 ˚C; VGS = 5 V
Tmb = 100 ˚C; VGS = 5 V
Tmb = 25 ˚C
Tmb = 25 ˚C
1 It is not possible to make connection to pin 2 of the SOT404 package.
January 1998
1
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP130N03LT, PHB130N03LT
ESD LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
VC
Human body model (100 pF, 1.5 kΩ)
Electrostatic discharge
capacitor voltage, all pins
MIN.
MAX.
UNIT
-
2
kV
THERMAL RESISTANCES
SYMBOL PARAMETER
Rth j-mb
Rth j-a
Thermal resistance junction
to mounting base
Thermal resistance junction
to ambient
CONDITIONS
MIN.
SOT78 package, in free air
SOT404 package, pcb mounted, minimum
footprint
TYP. MAX. UNIT
-
-
0.8
K/W
-
60
50
-
K/W
K/W
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
V(BR)DSS
VGS = 0 V; ID = 0.25 mA;
V(BR)GSS
VGS(TO)
Drain-source breakdown
voltage
Gate-source breakdown
voltage
Gate threshold voltage
MIN.
Tj = -55˚C
IG = 1 mA
VDS = VGS; ID = 1 mA
Tj = 175˚C
Tj = -55˚C
RDS(ON)
gfs
IGSS
IDSS
Drain-source on-state
resistance
VGS = 5 V; ID = 25 A
VGS = 10 V; ID = 25 A
VGS = 5 V; ID = 25 A; Tj = 175˚C
Forward transconductance
VDS = 25 V; ID = 25 A
Gate-source leakage current VGS = ±5 V; VDS = 0 V;
Tj = 175˚C
Zero gate voltage drain
VDS = 30 V; VGS = 0 V;
current
Tj = 175˚C
TYP. MAX. UNIT
30
27
10
-
-
V
V
V
1
0.5
20
-
1.5
5
4.5
40
0.02
0.05
-
2
2.3
6
5
11
1
10
10
500
V
V
V
mΩ
mΩ
mΩ
S
µA
µA
µA
µA
Qg(tot)
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain (Miller) charge
ID = 75 A; VDD = 24 V; VGS = 5 V
-
92
10
36
-
nC
nC
nC
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 15 V; ID = 25 A;
VGS = 5 V; RG = 5 Ω
Resistive load
-
45
120
225
100
60
170
300
135
ns
ns
ns
ns
Ld
Ld
Internal drain inductance
Internal drain inductance
-
3.5
4.5
-
nH
nH
Ls
Internal source inductance
Measured tab to centre of die
Measured from drain lead to centre of die
(SOT78 package only)
Measured from source lead to source
bond pad
-
7.5
-
nH
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
5000
1150
500
-
pF
pF
pF
January 1998
2
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP130N03LT, PHB130N03LT
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
VSD
Continuous source current
(body diode)
Pulsed source current (body
diode)
Diode forward voltage
trr
Qrr
Reverse recovery time
Reverse recovery charge
IS
ISM
MIN.
TYP. MAX. UNIT
-
-
75
A
-
-
240
A
IF = 25 A; VGS = 0 V
IF = 75 A; VGS = 0 V
-
0.85
1.0
1.2
-
V
IF = 75 A; -dIF/dt = 100 A/µs;
VGS = -10 V; VR = 25 V
-
100
0.6
-
ns
µC
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
Drain-source non-repetitive ID = 75 A; VDD ≤ 15 V;
unclamped inductive turn-off VGS = 5 V; RGS = 50 Ω; Tmb = 25 ˚C
energy
WDSS
120
Normalised Power Derating
PD%
ID (A)
MIN.
MAX.
UNIT
-
500
mJ
Current Derating
140
110
100
120
90
80
Limited by package
100
70
80
60
50
60
40
30
40
20
20
10
0
0
20
40
60
80 100
Tmb / C
120
140
160
0
0
180
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
January 1998
20
40
60
80 100 120 140 160 180
Tmb / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 5 V
3
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP130N03LT, PHB130N03LT
7506-30
Drain current, ID (A)
1000
RDS(ON) / mOhm
9506-30
10
=
N)
S/
VD
ID
8
S(O
3.5
tp = 10 us
RD
100
3
4
6
100 us
5
1 ms
DC
10
6
4
10 ms
100 ms
2
1
1
10
Drain-source voltage, VDS (V)
0
100
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
0
20
Zth / (K/W)
0.2
9506-30
0.05
tp
PD
0.02
0
D=
T
1E-03
1E-07
1E-05
1E-03
t/s
tp
T
40
t
20
1E-01
0
1E+01
Tj / C = 175
0
1
2
25
3
4
5
VGS / V
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
ID / A
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
BUK9506-30
100
3.5
gfs / S
9506-30
3
5
80
100
60
0.1
6
80
80
0.5
100
60
ID / A
100
1E-02
ID / A
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID); parameter VGS
1E+00
1E-01
40
80
VGS / V =
2.8
60
40
2.6
40
20
2.4
20
60
Tj / C = 25
175
2.2
0
0
2
4
6
8
0
10
VDS / V
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS); parameter VGS
January 1998
0
20
40
ID / A
60
80
100
Fig.8. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID); conditions: VDS = 25 V
4
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
PHP130N03LT, PHB130N03LT
a
30V TrenchMOS
2
10000
C / pF
9506-30
Ciss
1.5
1
Coss
1000
Crss
0.5
0
-100
-50
0
50
Tj / C
100
100
0.1
200
150
Fig.9. Normalised drain-source on-state resistance.
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 25 A; VGS = 5 V
2.5
VDS / V
10
100
Fig.12. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
BUK959-60
VGS(TO) / V
1
5
VGS / V
9506-30
max.
2
4
VDS / V = 6
24
typ.
3
1.5
min.
1
2
0.5
1
0
-100
-50
0
50
Tj / C
100
150
0
200
20
40
60
80
100
QG / nC
Fig.10. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Fig.13. Typical turn-on gate-charge characteristics.
VGS = f(QG); conditions: ID = 75 A; parameter VDS
Sub-Threshold Conduction
1E-01
0
100
IF / A
9506-30
80
1E-02
2%
1E-03
typ
98%
60
Tj / C = 175
25
0.5
1
VSDS / V
40
1E-04
20
1E-05
0
1E-05
0
0.5
1
1.5
2
2.5
3
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS
January 1998
0
1.5
2
Fig.14. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
5
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOS transistor
Logic level FET
120
PHP130N03LT, PHB130N03LT
WDSS%
VDD
+
110
100
L
90
80
VDS
-
70
VGS
60
-ID/100
50
T.U.T.
0
40
30
20
RGS
10
R 01
shunt
0
20
40
60
80
100
120
Tmb / C
140
160
180
Fig.16. Avalanche energy test circuit.
WDSS = 0.5 ⋅ LID2 ⋅ BVDSS /(BVDSS − VDD )
Fig.15. Normalised avalanche energy rating.
WDSS% = f(Tmb); conditions: ID = 75 A
January 1998
6
Rev 1.300