ETC BAX12A/A52R

DISCRETE SEMICONDUCTORS
DATA SHEET
M3D176
BAX12
Controlled avalanche diode
Product specification
Supersedes data of April 1996
1996 Sep 17
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
FEATURES
DESCRIPTION
• Hermetically sealed leaded glass
SOD27 (DO-35) package
The BAX12 is a controlled avalanche diode fabricated in planar technology, and
encapsulated in the hermetically sealed leaded glass SOD27 (DO-35)
package.
• Switching speed: max. 50 ns
• General application
• Continuous reverse voltage:
max. 90 V
• Repetitive peak reverse voltage:
max. 90 V
• Repetitive peak forward current:
max. 800 mA
handbook, halfpage
k
a
• Repetitive peak reverse current:
max. 600 mA
MAM246
• Capable of absorbing transients
repetitively.
Marking code: BAX12.
APPLICATIONS
Fig.1 Simplified outline (SOD27; DO35) and symbol.
• Switching of inductive loads in
semi-electronic telephone
exchanges.
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
90
UNIT
VRRM
repetitive peak reverse voltage
note 1
−
VR
continuous reverse voltage
note 1
−
90
IF
continuous forward current
see Fig.2; note 2
−
400
mA
IFRM
repetitive peak forward current
−
800
mA
IFSM
non-repetitive peak forward current
t = 1 µs
−
55
A
t = 100 µs
−
15
A
V
V
square wave; Tj = 25 °C prior to
surge; see Fig.4
t = 10 ms
Tamb = 25 °C; note 2
−
9
−
450
mW
−
600
mA
A
Ptot
total power dissipation
IRRM
repetitive peak reverse current
ERRM
repetitive peak reverse energy
Tstg
storage temperature
−65
+200
°C
Tj
junction temperature
−
200
°C
tp ≥ 50 µs; f ≤ 20 Hz; Tj = 25 °C
−
5.0
Notes
1. It is allowed to exceed this value; see Figs 8 and 9. Care should be taken not to exceed the IRRM rating.
2. Device mounted on an FR4 printed circuit-board; lead length 10 mm.
1996 Sep 17
2
mJ
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
ELECTRICAL CHARACTERISTICS
Tj = 25 °C; unless otherwise specified.
SYMBOL
VF
IR
PARAMETER
forward voltage
reverse current
CONDITIONS
MIN.
MAX.
UNIT
see Fig.3
IF = 10 mA
−
750
mV
IF = 50 mA
−
840
mV
IF = 100 mA
−
900
mV
IF = 200 mA
−
1.0
V
IF = 400 mA
−
1.25
V
see Fig.5
VR = 90 V
−
100
nA
VR = 90 V; Tj = 150 °C
−
100
µA
120
170
V
V(BR)R
reverse avalanche breakdown voltage
IR = 1 mA
Cd
diode capacitance
f = 1 MHz; VR = 0;
see Fig.6
−
35
pF
trr
reverse recovery time
when switched from
IF = 30 mA to IR = 30 mA;
RL = 100 Ω; measured at
IR = 3 mA; see Fig.10
−
50
ns
THERMAL CHARACTERISTICS
SYMBOL
PARAMETER
CONDITIONS
VALUE
UNIT
Rth j-tp
thermal resistance from junction to tie-point
lead length 10 mm
240
K/W
Rth j-a
thermal resistance from junction to ambient
lead length 10 mm; note 1
375
K/W
Note
1. Device mounted on a printed circuit-board without metallization pad.
1996 Sep 17
3
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
GRAPHICAL DATA
MBG455
500
IF
(mA)
MBG463
600
handbook, halfpage
handbook, halfpage
IF
(mA)
400
(1)
(2)
(3)
400
300
200
200
100
0
0
0
100
Tamb (oC)
200
0
2
VF (V)
(1) Tj = 175 °C; typical values.
(2) Tj = 25 °C; typical values.
(3) Tj = 25 °C; maximum values.
Device mounted on an FR4 printed-circuit board; lead length 10 mm.
Fig.2
1
Maximum permissible continuous forward
current as a function of ambient
temperature.
Fig.3
Forward current as a function of forward
voltage.
MBG702
102
handbook, full pagewidth
IFSM
(A)
10
1
10−1
1
10
102
103
tp (µs)
Based on square wave currents.
Tj = 25 °C prior to surge.
Fig.4 Maximum permissible non-repetitive peak forward current as a function of pulse duration.
1996 Sep 17
4
104
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
MBG696
107
handbook, full pagewidth
IR
(nA)
106
105
104
103
102
10
0
100
200
Tj (oC)
VR = 90 V.
Solid line; maximum values. Dotted line; typical values.
Fig.5 Reverse current as a function of junction temperature.
handbook, half age
MGD003
MBG701
103
40
handbook, halfpage
Cd
(pF)
PRRM
(W)
30
102
(1)
20
10
10
0
0
10
20
VR (V)
1
10−2
30
10−1
1
t (ms)
10
Solid line; rectangular waveform; δ ≤ 0.01.
Dotted line; triangular waveform; δ ≤ 0.02.
(1) Limited by IRMM = 600 mA.
f = 1 MHz; Tj = 25 °C.
Fig.6
Fig.7
Diode capacitance as a function of reverse
voltage; typical values.
1996 Sep 17
5
Maximum permissible repetitive peak
reverse power as a function of the pulse
duration T ≥ 50 ms; Tj = 25 °C.
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
MBG699
handbook, halfpage
VR
MBG698
600
handbook, halfpage
IR
(mA)
time
400
(1)
(2)
(3)
(4)
IR
200
0
100
t (rectangular waveform)
t
t
(triangular
δ=
T
waveform)
150
VR (V)
200
T
Reverse voltages higher than the VR ratings are allowed, provided:
a. The transient energy ≤ 7.5 mJ at PRRM ≤30 W; Tj = 25 °C;
the transient energy ≤ 5 mJ at PRRM = 120 W; Tj = 25 °C (see Fig.7).
b. T ≥ 50 ms; δ ≤0.01 (rectangular waveform) (see Fig.9).
δ ≤0.02 (triangular waveform) (see Fig.9).
With increasing temperature, the maximum permissible transient
energy must be decreased by 0.03 mJ/K.
(1) Tj = 25 °C; minimum values.
(2) Tj = 175 °C; minimum values.
(3) Tj = 25 °C; maximum values.
(4) Tj = 175 °C; maximum values.
Fig.8
Reverse current as a function of continuous
reverse voltage.
1996 Sep 17
Fig.9
6
Peak reverse voltage and current test
pulses.
time
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
handbook, full pagewidth
tr
tp
t
D.U.T.
RS = 50 Ω
V = VR I F x R S
IF
10%
IF
SAMPLING
OSCILLOSCOPE
t
R i = 50 Ω
MGA881
(1)
90%
VR
input signal
Input signal: reverse pulse rise time tr = 0.6 ns; reverse pulse duration tp = 100 ns; duty factor δ = 0.05.
Oscilloscope: rise time tr = 0.35 ns.
Circuit capacitance: C ≤ 1 pF (oscilloscope input capacitance + parasitic capacitance).
(1) IR = 3 mA.
Fig.10 Reverse recovery voltage test circuit and waveforms.
1996 Sep 17
t rr
7
output signal
Philips Semiconductors
Product specification
Controlled avalanche diode
BAX12
PACKAGE OUTLINE
andbook, full pagewidth
0.56
max
1.85
max
4.25
max
25.4 min
25.4 min
MLA428 - 1
Dimensions in mm.
Fig.11 SOD27 (DO-35).
DEFINITIONS
Data Sheet Status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1996 Sep 17
8