AOS Semiconductor Product Reliability Report AOZ8006FI, rev 1 Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Jun 25, 2007 1 This AOS product reliability report summarizes the qualification result for AOZ8006FI. Review of the electrical test results confirm that AOZ8006FI pass AOS quality and reliability requirements for product release. The continuous qualification testing and reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and reliability standards. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Qualification Test Requirements Qualification Tests Result Quality Assurance Information I. Product Description: The AOZ8006FI is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. The product comes in RoHS compliant, MSOP10 package and is rated over a -40°C to +85°C ambient temperature range. . Absolute Maximum Ratings Parameter VP-VN 6V Peak Pulse Current (Ipp), tp=8/20uS 5A Storage Temperature (TS) -65°C to +150°C ESD Rating per IEC61000-4-2, contact (1) ±8kV ESD Rating per IEC61000-4-2, air (2) ±15kV ESD Rating per Human Body Model (2) ±8kV Junction Temperature (Tj) -40°C to +125°C Notes: (1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω (2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ II. Package and Die Information: Product ID Process Package Type Die L/F material Die attach material Die bond wire Mold Material Plating Material AOZ8006FI UMC 0.5um 5/18V 2P3M process MSOP10 UI001A1_EPI (size: 716 x 616 um) ASM A194FH Ablestik 8360 epoxy Au, 1mil Sumitomo EME-6600D Matte Tin 2 III. Qualification Tests Requirments • • Same package as AOZ8007FI, therefore, the part will be qual. by extension. Same package as AOZ8005FI, only difference is the die has BM (back metal) and die attach material is conductive epoxy. Therefore, AOZ8005FI test data can be used for qual. also. IV. Qualification Tests Result Test Item Test Condition Sample Size Result PreConditioning (qual by Per JESD 22-A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C 3 lots (82 /lot) pass Lots 1 (wafer lot# FN646.52-6, marking: B1002), 82 units, passed pre-con. Lots 2 (wafer lot# FN646.52-6, marking: B1003), 82 units, passed pre-con. Lots 3 (wafer lot# FN646.52-6, marking: B1004), 82 units, passed pre-conditioning. HTOL (pkg qual burn-in, using AOZ8005FI data) Per JESD 22-A108_B Vdd=6V Temp = 125 0C 3 lots (80 /lot) pass Lots 1 (wafer lot# F9AN1.51-01 , marking: Z96R11A ), 80 units, passed 500 hrs . Lots 2 (wafer lot# F9AN1.51-01 , marking: Z96R11B ), 80 units, passed 500 hrs . Lots 3 (wafer lot# F9AN1.51-01 , marking: B1001 ), 82 units, passed 500 hrs . HTOL (die qual burn-in, using Per JESD 22-A108_B Vdd=6V Temp = 125 0C 2 lots (80 /lot) pass '130 +/- 2 0C, 85%RH, 33.3 3 lots (60 /lot) psi, at VCC min power dissapation pass IC Qual by extension using AOZ8005CI which uses the same die. Lots 1 (wafer lot# FN2MT.01-12, marking: AC001), 80 units, passed 500 hrs . Lots 2 (wafer lot# FN646.03-4 marking: AC003), 80 units, passed 168 hrs . Lots 1 (wafer lot# F9AN1.51-01 , marking: Z96R11A), 60 units, passed HAST 100 hr . Lots 2 (wafer lot# F9AN1.51-01 , marking: Z96R11B), 60 units, passed HAST 100 h . Lots 3 (wafer lot# F162T , marking: B1001), 60 units, passed HAST 100 h rs. '-65 0C to +150 0C, air to air (2cyc/hr) 3 lots (82 /lot) pass 121C, 15+/-1 PSIG, RH= 100% 3 lots (82 /lot) pass ESD Rating Per IEC-61000-4-2, contact 3 units pass ESD Rating Per IEC-61000-4-2, air 3 units pass Lot 1 (wafer lot# FN646.52-6 , marking: B1001 ), 3 units passed ±15kV Latch-up (AOZ8005CI Per JESD78A 3 units pass Lot 1 (wafer lot# FN646.03-4 , marking: AC003 ), 3 units passed Latch-up. extension, using AOZ8007FI data) AOZ8005CI data) HAST (qual by extension, using AOZ8005FI data) Temperature Cycle (qual by extension, using AOZ8007FI data) Pressure Pot (qual by extension, using AOZ8007FI data) data) Comment Lots 1 (wafer lot# FN646.52-6 , marking: B1002), 82 units, passed TC 500 cycles. Lots 2 (wafer lot# FN646.52-6 , marking: B1003), 82 units, passed TC 500 cycles. Lots 3 (wafer lot# FN646.52-6 , marking: B1004), 82 units, passed TC 500 cycles. Lots 1 (wafer lot# FN646.52-6 , marking: B1002), 82 units, passed PCT 96 hrs. Lots 2 (wafer lot# FN646.52-6 , marking: B1003), 82 units, passed PCT 96 hrs. Lots 3 (wafer lot# FN646.52-6 , marking: B1004 ), 82 units, passed PCT 96 hrs. Lot 1 (wafer lot# FN646.52-6 , marking: B1001 ), 3 units passed ±8kV The qualification test results confirm that AOZ8006FI pass AOS quality and reliability requirements for product release. 3 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 50 ppm Quality Sample Plan: conform to Mil-Std -105D 4