- Ironwood Electronics

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Spring Pin
Test Report
IP, Mar 2011
High Performance
IC Sockets And
Test Adaptors
Pin Configuration
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Pitch: 0.5mm
PLUNGER B
PLUNGER A
Ø 0.35mm
[0.014"]
Ø 0.19mm
[0.008"]
60°
0. 61mm [0.024"]
2. 87mm [0.113"]
Ø 0.19mm
[0.008"]
0. 64mm [0.025"]
3. 66mm [0.144"] Final
3.81mm [0.150"] Operating Position
4. 11mm [0.162"] I nitial
MATERIAL:
Plungers: Hardened Steel / Finish- Gold Plated
Barrel: Copper Alloy / Finish- Gold Plated
Spring: Stainless Steel / Finish- Gold Plated
ELECTRICAL DATA:
Average Resistance: 82.28mOhms
Probe Self Inductance: 1.3 nH
Propagation Delay: 28 picoseconds
Insertion Loss: < 0.25 dB to 4.5 GHz
Cross Talk: <-15 dB up to 6.5 GHz
Rise Time: 26 picoseconds
Capacitance: 0.53 pF
IP, Mar 2011
NOTES:
1. Force: 7 grams [0.25 oz.] inital, 16 grams (0.56 oz.) at 0.150" [3.81mm] operating position (0.012" deflection).
Test Method: Release rate 1.6 grams / 0.001" [0.025mm]
2. Indent Form: Either 4 way conical indent or roll crimp, 2 places.
3. Plunger "A" is a fixed plunger.
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Socket Configuration
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Socket in assembled state
Test procedure:
1.
Mount socket to the test board
2.
Place daisy chained test chip inside the socket
3.
Close socket lid and apply recommended pressure
4.
Using multi meter read contact resistance of
complete chain and record contact resistance per pin
5.
Open socket, remove and reseat test chip
6.
Repeat step 3 and 4
7.
After 10 insertions, reflow test chip.
Pitch: 0.5mm
Daisy chained test chip (lead & lead free) and test board (lead)
IP, Mar 2011
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Test Data (SnPb Test Chip)
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Contact resistance
Resistance per pin (ohms)
0.2500
0.2000
0.1500
0.1000
0.0500
0.0000
1
7
13 19 25 31 37 43 49 55 61 67 73 79 85 91 97
Cycle
Average: 0.128 ohms
IP, Mar 2011
Standard Deviation: 0.033 ohms
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Test Data (SnAgCu Test Chip)
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Contact resistance
Resistance per pin (ohms)
0.2500
0.2000
0.1500
0.1000
0.0500
0.0000
1
7
13 19 25 31 37 43 49 55 61 67 73 79 85 91 97
Cycle
Average: 0.089 ohms
IP, Mar 2011
Standard Deviation: 0.030 ohms
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