IS61C5128AL/AS IS64C5128AL/AS 512K x 8 HIGH-SPEED CMOS STATIC RAM FEATURES HIGH SPEED: (IS61/64C5128AL) • High-speed access time: 10ns, 12 ns • Low Active Power: 150 mW (typical) • Low Standby Power: 10 mW (typical) CMOS standby LOW POWER: (IS61/64C5128AS) • High-speed access time: 25ns • Low Active Power: 75 mW (typical) • Low Standby Power: 1 mW (typical) CMOS standby • TTL compatible interface levels • Single 5V ± 10% power supply • Fully static operation: no clock or refresh required • Available in 36-pin SOJ (400-mil), 32-pin sTSOP-I, 32-pin SOP, 44-pin TSOP-II and 32-pin TSOP-II packages • Commercial, Industrial and Automotive temperature ranges available • Lead-free available DECEMBER 2013 DESCRIPTION The ISSI IS61C5128AL/AS and IS64C5128AL/AS are high- speed, 4,194,304-bit static RAMs organized as 524,288 words by 8 bits. They are fabricated using ISSI's highperformance CMOS technology.This highly reliable process coupled with innovative circuit design techniques, yields access times as fast as 12 ns with low power consumption. When CE is HIGH (deselected), the device assumes a standby mode at which the power dissipation can be reduced down with CMOS input levels. Easy memory expansion is provided by using Chip Enable and Output Enable inputs, CE and OE. The active LOW Write Enable (WE) controls both writing and reading of the memory. A data byte allows Upper Byte (UB) and Lower Byte (LB) access. The IS61C5128AL/AS and IS64C5128AL/AS are packaged in the JEDEC standard 36-pin SOJ (400-mil), 32-pin sTSOP-I, 32-pin SOP, 44-pin TSOP-II and 32-pin TSOP-II packages FUNCTIONAL BLOCK DIAGRAM A0-A18 DECODER 512K X 8 MEMORY ARRAY I/O DATA CIRCUIT COLUMN I/O VDD GND I/O0-I/O7 CE OE CONTROL CIRCUIT WE Copyright © 2013 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that: a.) the risk of injury or damage has been minimized; b.) the user assume all such risks; and c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances Integrated Silicon Solution, Inc. — www.issi.com 1 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS HIGH SPEED (IS61/64C5128AL) PIN CONFIGURATION 36-Pin SOJ (400-mil) 44-Pin TSOP (Type II) A0 1 36 NC A1 2 35 A18 A2 3 34 A17 A3 4 33 A16 A4 5 32 A15 CE 6 31 OE I/O0 7 30 I/O7 I/O1 8 29 I/O6 VDD 9 28 GND GND 10 27 VDD I/O2 11 26 I/O5 I/O3 12 25 I/O4 WE 13 24 A14 A5 14 23 A13 A6 15 22 A12 A7 16 21 A11 A8 17 20 A10 A9 18 19 NC NC NC A0 A1 A2 A3 A4 CE I/O0 I/O1 VDD GND I/O2 I/O3 WE A5 A6 A7 A8 A9 NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 NC NC NC A18 A17 A16 A15 OE I/O7 I/O6 GND VDD I/O5 I/O4 A14 A13 A12 A11 A10 NC NC NC PIN DESCRIPTIONS A0-A18 Address Inputs CE Chip Enable Input OE Output Enable Input WE Write Enable Input I/O0-I/O7 Bidirectional Ports VddPower GND Ground NC No Connection 2 Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS LOW POWER (IS61/64C5128AS) PIN CONFIGURATION 32-pin sTSOP (TYPE I) A11 A9 A8 A13 WE A18 A15 VDD A17 A16 A14 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32-pin SOP 32-pin TSOP (TYPE II) 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 GND I/O2 I/O1 I/O0 A0 A1 A2 A3 A17 A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VDD A15 A18 WE A13 A8 A9 A11 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 PIN DESCRIPTIONS A0-A18 Address Inputs CE Chip Enable 1 Input OE Output Enable Input WE Write Enable Input I/O0-I/O7Input/Output VddPower GNDGround Integrated Silicon Solution, Inc. — www.issi.com3 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS TRUTH TABLE I/O PIN Mode WE CE OE I/O0-I/O7Vdd Current Not Selected X H X High-Z Isb1, Isb2 Output Disabled H L H High-Z Icc1, Icc2 Read H L L DoutIcc1, Icc2 Write L L X DinIcc1, Icc2 ABSOLUTE MAXIMUM RATINGS(1) SymbolParameter Vterm Terminal Voltage with Respect to GND Tstg Storage Temperature Pt Power Dissipation Iout DC Output Current (LOW) Value –0.5 to +7.0 –65 to +150 1.5 20 Unit V °C W mA Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. CAPACITANCE(1,2) SymbolParameter Cin Input Capacitance Cout Output Capacitance Conditions Vin = 0V Vout = 0V Max.Unit 5 pF 7 pF Notes: 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: Ta = 25°C, f = 1 MHz, Vdd = 5.0V. DC ELECTRICAL CHARACTERISTICS (Over Operating Range) SymbolParameter Test Conditions Min. Max. Unit Output HIGH Voltage Vdd = Min., Ioh = –4.0 mA 2.4 — V Voh Vol Output LOW Voltage Vdd = Min., Iol = 8.0 mA — 0.4 V Vih Input HIGH Voltage 2.2 Vdd + 0.5 V (1) Vil Input LOW Voltage –0.3 0.8 V Ili Input Leakage GND ≤ Vin ≤ Vdd Com.–1 1 µA Ind. –2 2 Auto. –5 5 Ilo Output Leakage GND ≤ Vout ≤ Vdd Com.–1 1 µA Outputs Disabled Ind. –2 2 Auto. –5 5 Note: 4 1. Vil = –3.0V for pulse width less than 10 ns. Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS OPERATING RANGE: high speed option (IS61/64C5128AL) Range Commercial Industrial Automotive Ambient Temperature Vdd 0°C to +70°C 5V ± 10% -40°C to +85°C 5V ± 10% -40°C to +125°C 5V ± 10% Speed (ns) 10 10 12 OPERATING RANGe: low power option (IS61/64C5128AS) Range Commercial Industrial Automotive Ambient Temperature 0°C to +70°C -40°C to +85°C -40°C to +125°C Vdd 5V ± 10% 5V ± 10% 5V ± 10% Speed (ns) 25 25 25 Integrated Silicon Solution, Inc. — www.issi.com5 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS HIGH SPEED OPTION (IS61/64C5128AL) POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) Symbol Parameter Test Conditions Icc1 Vdd Operating Vdd = Vdd max., CE = Vil Com. Supply Current Iout = 0 mA, f = 0 Ind. Auto. Icc2 Vdd Dynamic Operating Vdd = Vdd max., CE = Vil Com. Supply Current Iout = 0 mA, f = fmax Ind. Auto. typ.(2) Isb1 TTL Standby Current Vdd = Vdd max., Com. (TTL Inputs) Vin = Vih or Vil Ind. CE ≥ Vih, f = 0 Auto. CMOS Standby Vdd = Vdd max., Com. Isb2 Current (CMOS Inputs) CE ≤ Vdd – 0.2V, Ind. Vin ≥ Vdd – 0.2V, or Auto. Vin ≤ 0.2V, f = 0 typ.(2) -10 ns -12 ns Min. Max. Min. Max. Unit — 45 — 45 mA — 50 —50 — 55 — 55 — 50 — 45 mA — 55 — 50 — 70 — 60 30 25 — 15 —15 mA — 20 —20 — 30 — 30 — — — 8 12 20 2 —8 —12 —20 mA Note: 1. At f = fmax, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. 2. Typical values are measured at Vdd = 5V, Ta = 25% and not 100% tested. LOW POWER OPTION (IS61/64C5128AS) POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) -25 ns SymbolParameter Test Conditions Min. Max. Unit Icc Average operating CE = Vil, Vdd = Max. Com. — 10 mA Current I OUT= 0 mA, f= 0 Ind. —15 Auto. —20 Icc1 Vdd Dynamic Operating Vdd = Max., CE = Vil Com. — 25 mA Supply Current Iout = 0 mA, f = fmax Ind. —30 Auto. —40 typ.(2) 15 Isb1 TTL Standby Current Vdd = Max., Com. — 1 mA (TTL Inputs) Vin = Vih or Vil, CE ≥ Vih, Ind.— 1.5 f = 0 Auto. — 2 Isb2 CMOS Standby Vdd = Max., Com. — 0.8mA Current (CMOS Inputs) CE ≥ Vdd – 0.2V, Ind.— 0.9 Vin ≥ Vdd – 0.2V, Auto. —2 or Vin ≤ Vss + 0.2V, f = 0 typ. 0.2 Note: 1. At f = fmax, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. 2. Typical values are measured at Vdd = 5V, Ta = 25% and not 100% tested. 6 Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range) Symbol trc taa toha tace tdoe thzoe(2) tlzoe(2) thzce(2) tlzce(2) Parameter Read Cycle Time Address Access Time Output Hold Time CE Access Time OE Access Time OE to High-Z Output OE to Low-Z Output CE to High-Z Output CE to Low-Z Output -10 -12-25 Min.Max. Min. Max. Min. Max. 10 — 12 — 25 — — 10 — 12 — 25 3 — 3 — 3 — — 10 — 12 — 25 — 5 — 6 — 15 0 5 0 6 0 8 0 — 0 — 2 — 0 5 0 6 0 8 2 — 2 — 2 — Unit ns ns ns ns ns ns ns ns ns Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested. 3. Not 100% tested. AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load Unit 0V to 3.0V 3 ns 1.5V See Figures 1 and 2 AC TEST LOADS 480 Ω 480 Ω 5V 5V OUTPUT OUTPUT 30 pF Including jig and scope 255 Ω 5 pF Including jig and scope Figure 1 Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 255 Ω Figure 2 7 IS61C5128AL/AS IS64C5128AL/AS AC WAVEFORMS READ CYCLE NO. 1(1,2) t RC ADDRESS t AA t OHA DOUT t OHA DATA VALID PREVIOUS DATA VALID READ1.eps READ CYCLE NO. 2(1,3) t RC ADDRESS t AA t OHA OE t HZOE t DOE t LZOE CE t LZCS DOUT t ACS HIGH-Z t HZCS DATA VALID CE_RD2.eps Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CE = Vil. 3. Address is valid prior to or coincident with CE LOW transitions. 8 Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS WRITE CYCLE SWITCHING CHARACTERISTICS(1,3) (Over Operating Range) SymbolParameter twc Write Cycle Time tsce CE to Write End taw Address Setup Time to Write End tha Address Hold from Write End tsa Address Setup Time tpwe1 WE Pulse Width (OE =High) tpwe2 WE Pulse Width (OE=Low) tsd Data Setup to Write End thd Data Hold from Write End (2) thzwe WE LOW to High-Z Output tlzwe(2) WE HIGH to Low-Z Output -10-12 -25 Min.Max. Min.Max. Min.Max. 10 — 12 — 25 — 7 — 9 — 18 — 7 — 9 — 18 — Unit ns ns ns 0 0 7 7 6 0 — — — — — — 0 0 9 9 6 0 — — — — — — 0 0 15 15 15 0 — — — — — — ns ns ns ns ns ns — 3 6 — — 3 6 — — 5 15 — ns ns Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested. 3. The internal write time is defined by the overlap of CE LOW, and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the write. Integrated Silicon Solution, Inc. — www.issi.com9 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS AC WAVEFORMS WRITE CYCLE NO. 1 (WE Controlled)(1,2) t WC VALID ADDRESS ADDRESS t SA t SCS t HA CE t AW t PWE1 t PWE2 WE t HZWE DOUT DATA UNDEFINED t LZWE HIGH-Z t SD DIN t HD DATAIN VALID CE_WR1.eps Notes: 1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the Write. 2. I/O will assume the High-Z state if OE ≥ Vih. 10 Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS WRITE CYCLE NO. 2 (OE is HIGH During Write Cycle) (1,2) t WC ADDRESS VALID ADDRESS t HA OE CE LOW t AW t PWE1 WE t SA DOUT t HZWE t LZWE HIGH-Z DATA UNDEFINED t SD t HD DATAIN VALID DIN CE_WR2.eps WRITE CYCLE NO. 3 (OE is LOW During Write Cycle) (1) t WC ADDRESS VALID ADDRESS OE LOW CE LOW t HA t AW t PWE2 WE t SA DOUT DATA UNDEFINED t HZWE t LZWE HIGH-Z t SD DIN t HD DATAIN VALID CE_WR3.eps Notes: 1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the Write. 2. I/O will assume the High-Z state if OE ≥ Vih. Integrated Silicon Solution, Inc. — www.issi.com11 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS DATA RETENTION SWITCHING CHARACTERISTICS (HIGH SPEED) (IS61/64C5128AL) Symbol Parameter Test Condition Vdr Vdd for Data Retention See Data Retention Waveform Idr Data Retention Current Vdd = 2.9V, CE ≥ Vdd – 0.2V Com. Vin ≥ Vdd – 0.2V, or Vin ≤ Vss + 0.2VInd. Auto. typ. (1) tsdr Data Retention Setup Time See Data Retention Waveform trdr Recovery Time See Data Retention Waveform Note: Min. Max.Unit 2.9 5.5 V — 8 mA — 10 — 15 1 0 — ns trc —ns 1. Typical Values are measured at Vdd = 5V, Ta = 25oC and not 100% tested. DATA RETENTION WAVEFORM (CE Controlled) tSDR 4.5V Data Retention Mode tRDR VDD VDR CE GND 12 CE ≥ VDD - 0.2V Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS DATA RETENTION SWITCHING CHARACTERISTICS (LOW POWER) (IS61/64C5128AS) Symbol Parameter Test Condition Vdr Vdd for Data Retention See Data Retention Waveform Idr Data Retention Current Vdd = 2.9V, CE ≥ Vdd – 0.2V Com. Vin ≥ Vdd – 0.2V, or Vin ≤ Vss + 0.2VInd. Auto. typ. (1) tsdr Data Retention Setup Time See Data Retention Waveform trdr Recovery Time See Data Retention Waveform Note: Min. Max.Unit 2.9 5.5 V — 0.8 mA — 0.9 — 2 0.2 0 — ns trc —ns 1. Typical Values are measured at Vdd = 5V, Ta = 25oC and not 100% tested. DATA RETENTION WAVEFORM (CE Controlled) tSDR 4.5V Data Retention Mode tRDR VDD VDR CE GND CE ≥ VDD - 0.2V Integrated Silicon Solution, Inc. — www.issi.com13 Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS HIGH SPEED (IS61/64C5128Al) ORDERING INFORMATION Industrial Range: –40°C to +85°C Speed (ns) 10 Order Part No. IS61C5128AL-10KI IS61C5128AL-10KLI IS61C5128AL-10TI IS61C5128AL-10TLI Package 400-mil Plastic SOJ 400-mil Plastic SOJ, Lead-free 44-pin TSOP-II 44-pin TSOP-II, Lead-free Automotive Range: –40°C to +125°C Speed (ns) 12 Order Part No. IS64C5128AL-12KA3 IS64C5128AL-12CTA3 IS64C5128AL-12CTLA3 Package 400-mil Plastic SOJ 44-pin TSOP-II, Copper Leadframe 44-pin TSOP-II, Lead-free, Copper Leadframe LOW POWER (IS61/64C5128AS) ORDERING INFORMATION Industrial Range: –40°C to +85°C Speed (ns) 25 14 Order Part No. IS61C5128AS-25QI IS61C5128AS-25QLI IS61C5128AS-25HI IS61C5128AS-25HLI IS61C5128AS-25TI IS61C5128AS-25TLI Package 450-mil Plastic SOP 450-mil Plastic SOP, Lead-free 32-pin STSOP-I 32-pin STSOP-I, Lead-free 32-pin TSOP-II 32-pin TSOP-II, Lead-free Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS Integrated Silicon Solution, Inc. — www.issi.com15 Rev. C 12/18/2013 IS61C5128AL/AS 16 IS64C5128AL/AS Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 IS61C5128AL/AS IS64C5128AL/AS Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 17 18 4. Formed leads shall be planar with respect to one another within 0.1mm at the seating plane after final test. 5. Reference document : JEDEC SPEC MS-027. 3. Dimension b2 does not include dambar protrusion/intrusion. 2. Dimension D and E1 do not include mold protrusion . 1. Controlling dimension : mm NOTE : 12/20/2007 IS61C5128AL/AS IS64C5128AL/AS Integrated Silicon Solution, Inc. — www.issi.com Rev. C 12/18/2013 Rev. C 12/18/2013 Θ Package Outline 06/04/2008 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION/INTRUSION. 2. DIMENSION D AND E1 DO NOT INCLUDE MOLD PROTRUSION. 1. CONTROLLING DIMENSION : MM NOTE : Θ IS61C5128AL/AS IS64C5128AL/AS Integrated Silicon Solution, Inc. — www.issi.com19