CPC5750

Reliability Report-CPC5750
Qualification No: 2012-003
Reliability Report
Reliability Data for CPC5750
Report Title: Reliability Data for CPC5750
Report Number: 2012-003
Date:
3/14/12
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 1 of 6
Reliability Report-CPC5750
Qualification No: 2012-003
Introduction:
This report summarizes the reliability data of IXYS Integrated Circuits Division CPC5750.
The reliability data presented here were collected during IXYS ICD product qualification,
ON Semiconductor process qualification and Greatek Electronics, Inc. package
qualification. The purpose of this qualification was to verify the IXYS ICD quality and
reliability requirements as outlined in IXYS ICD internal specifications. The CPC5750
silicon is foundered at ON Semiconductor and assembled at Greatek Electronics, Inc. in
Taiwan. The ON Semiconductor process is D3N (reference qual by comparison for
CPC5902, CPC5002).
Reliability Tests:
Table 1 below provides the qualification tests that were performed. The stress tests and
sample size are chosen based on the IXYS ICD internal specifications and with the
approval of the product development team and quality assurance.
Table 1: Product CPC5750 Reliability Tests
Stress
Test
HTOL
THB
Applicable
Specs
Mil-Std-883
JESD22,
A101
HAST
JESD22A110
ELFR
JESD74A
Autoclave
JESD22A104
Temp Cycle JESD22(T/C)
A112-A
Pressure
JESD22Cooker Test A102
High Temp JESD22Storage
A103C
MSL
J-STD020D.1
MSL
J-STD020D.1
Solderability JESD22B102E
ESD
JESD22,
A114-E
Stress
Conditions
125°C, 1000hrs
85°C, 85%
1000hrs, 500 hrs
130°C, 85% RH,
96 hrs
125°C, 168 hrs
121°C, 100% RH,
96 hrs
-65 to 150°C,
500 cycles
121°C, 2 atm,
168 hrs
150°C, 1000hrs
500 hrs
IR Reflow,
Level 1
IR Reflow,
Level 3
245 +/- 5°C,
5 +/- 0.5 sec, dwell
Steam Age 8 hrs
1.5kΩ, 100pF
Number
of Lots
3
3
1
3
Sample Total
Size (SS) SS
236
708
44
132
45
45
84
252
3
1
236
71
708
71
3
1
1
84
45
45
252
45
45
3
1
1
84
45
135
252
45
135
1
135
135
1
15
15
1
15
15
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 2 of 6
Reliability Report-CPC5750
Qualification No: 2012-003
Reliability Test Results:
The stress tests and associated results (10_d3_tep_rel_summary_2005081.doc in
S:/REED/Projects/Development/CPC5750/Qual_Report/ESD) for the product CPC5750
qualification are summarized in Table 2. The devices chosen for the qualification were from
standard material manufactured through normal production test flow
Table 2: Product CPC5750 Reliability Test Results
Stress Test
HTOL
Readpoint
/ (Reject/
SS)
D3N Technology 1000 hrs.
Process/Pkg
0/708
THB
D3N Technology 1000 hrs.
0/132
THB
24L SSOP
500 hrs.
0/45
HAST
D3N Technology 96 hrs.
0/252
ELFR
D3N Technology 168 hrs
0/708
Autoclave
D3N Technology 96 hrs
0/71*
Temp Cycle
D3N Technology 500 Cycles
0/252
Temp Cycle
24L SSOP
500 Cycles
0/45
Pressure
Cooker Test
24L SSOP
168 hrs
High Temp
Storage
D3N Technology 1000 hrs
0/45
0/252
Comments
AMI/On Semiconductor Qual
Report Data
AMI/On Semiconductor Qual
Report Data
Greatek Electronics, Inc. Qual
Report Data
AMI/On Semiconductor Qual
Report Data
AMI/On Semiconductor Qual
Report Data
AMI/On Semiconductor Qual
Report Data
AMI/On Semiconductor Qual
Report Data
Greatek Electronics, Inc. Qual
Report Data
Greatek Electronics, Inc. Qual
Report Data
AMI/On Semiconductor Qual
Report Data
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 3 of 6
Reliability Report-CPC5750
Qualification No: 2012-003
Stress Test
Process/Pkg
High Temp
Storage
24L SSOP
MSL
24L SSOP
Readpoint
/ (Reject/
SS)
500 hrs.
0/45
Level 3
0/135
Solderability
24L SSOP
Steam Age
8 hrs
0/15
Comments
Greatek Electronics, Inc. Qual
Report Data
Greatek Electronics, Inc. Qual
Report Data
Greatek Electronics, Inc. Qual
Report Data
*Note: 3 parts failing for In_LKG Low FA050314; failures due to material on the
package leads; leakage too low for FA (SEM0514AHTD).
ESD Testing Results:
As part of this qualification, the product CPC5750 was subjected to Human Body Model
(HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The
results are summarized in Table 3. All samples were electrically tested to data sheet limits
before and after ESD stressing and they passed after +/- 2000V testing.
Table3: Product CPC5750 ESD Characterization Results
ESD
Product
Package
ESD Test
RC
Highest
Class
Model
Spec
Network Passed
HBM CPC5750
24L SSOP
JESD22,
2000V
2
1.5kΩ,
A114-E
100pF
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 4 of 6
Reliability Report-CPC5750
Qualification No: 2012-003
FIT (Failure in Time) Rate on the Product CPC5750:
Table 4 summarizes the number of devices used for the product CPC5750 reliability stress
with associated failures. Using the HTOL data, FITs were calculated based on the
Acceleration Factor (AF) and equivalent device hours at 0.7eV of activation energy for
125°C test temperature and 40°C use temperatures. For THB stress, FITs were calculated
based on the 85°C /85% RH test condition with 40°C/60% RH ambient use conditions at the
activation energy of 0.7eV. The calculated FITs from the reliability stress came out to be
5.09 and 61.34 for HTOL and THB respectively.
Table 4: Product CPC5750 FIT Rate Summary
Qual# Stress Product/Pkg # of
# of Hours Act.
Acc.
Devices Fails Tested Energy Factor
1
1
HTOL CPC5750
24L SSOP
708
THB
132
CPC5750
24L SSOP
0
1000
0.7
Equivalent FIT Rate
Dev. Hours @ 60%
CL
180,827,424 5.09
255.41
0
1000
0.7
1.1363E
+02
14,998,630
Conclusion:
The qualification of the product CPC5750 has been successfully completed for the
production release. The reliability and process data for D3N can be found at
S:/Quality/Qualifications/CPC5750/Qual_Reports & ESD.
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
Page 5 of 6
61.34
Reliability Report-CPC5750
Qualification No: 2012-003
APPROVAL:
Prepared by:
_Martha W. Brandt*___________________________________3/14/12_____
Martha W. Brandt
Date
Quality Engineer
Approved by:
_Jose Alvarez*_______________________________________3/15/12______
Jose Alvarez
Date
Product Engineer
Approved by:
_Ronald P. Clark*_____________________________________3/14/12______
Ronald P. Clark
Date
Director of Quality
Approved by:
_James Archibald*____________________________________3/14/12_______
James Archibald
Date
Director of Development Engineering
*Signature on File
IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA
Tel: 1-978-524-6700, Fax: 1-978-524-4700, Toll Free: 1-800-272-5273, WWW.IXYSIC.COM
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