Reliability Report: Qualification/Reliability Data for 250-350 Volt Form-B Relay Products and Depletion Mode MOSFET Products IXYS IC Division (Process P 7.1) Qualification Report No.: 2013-011 Reliability Report Qualification/Reliability Data for 250-350 Volt Form-B Relay Products and Depletion mode MOSFET Products IXYS IC Division (Process P7.1) Report Number: 2013-011 Date: 9/12/13 IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 1 of 4 Reliability Report: Qualification/Reliability Data for 250-350 Volt Form-B Relay Products and Depletion Mode MOSFET Products IXYS IC Division (Process P 7.1) Qualification Report No.: 2013-011 Introduction: This summarizes the Qualification/Reliability Life-test and Environmental data on LCB/LBB/PBB 110/127/150 series- Form-B Relay products and CPC37XX/CPC560X-Depletion Mode Vertical DMOS FETs that were collected during Qualification or as ongoing Monthly Reliability Monitor Program. Some data is represented by P7.1 discrete Form B MOSFET’s from IXYS IC Division product CPC5602C and can be used for qualification by comparison for CPC1130N and CPC1150N. Also, Since CPC37XX/CPC560X product families and LBB110 use the same Depletion Mode Vertical DMOS FETs and share the same design and wafer fabrication processes, CPC5602 and LBB110 data presented here can be shared for CPC37XX/CPC560X Reliability lifetime calculation. Qualification/Reliability Results: The stress tests data and associated results for the LCB/LBB127/PBB 110, 127, 150 Form-B Relay products are summarized in Table 1. Product/ Package Table 1: P7.1 – High Voltage Form-B Reliability Data Stress Test/ Kits Read-points/ Conditions Number (Reject/SS) Comments CPC5603C/ SOT-223 CPC5603C/ SOT-223 CPC5602C/ SOT-223 CPC3703C/ SOT-89 CPC1117N/ 4-Pin SOP CPC5602C/ SOT-223 CPC5602C/ SOT-223 HTGB 125°C, Gate Bias -15V HTGB 125°C, Gate Bias -15V HTRB 125°C, 80% WVDC HTRB 125°C, 80% WVDC HTRB 125°C, 80% WVDC THB 85°C/85% RH, 1000 hrs. THB 85°C/85% RH, 1000 hrs. F238 F338 K636 FE018 TE2534 Qual Lot#1 Qual Lot#2 1000 hrs. 0/77 1000 hrs. 0/77 1000 hrs. 0/36 1000 hrs. 0/210 1000 hrs. 0/105 1000 hrs. 0/77 1000 hrs. 0/77 Qualification Data Qualification Data Reliability Monitor Data Qualification Data Qualification Data Qualification Data Qualification Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 2 of 4 Reliability Report: Qualification/Reliability Data for 250-350 Volt Form-B Relay Products and Depletion Mode MOSFET Products IXYS IC Division (Process P 7.1) Qualification Report No.: 2013-011 Product/ Package Stress Test/ Conditions Kits Number CPC5602C/ SOT-223 CPC5602C/ SOT-223 THB 85°C/85% RH, 1000 hrs. Thermal Shock,(T/S) 0 to 100°C, 10/10 dwell Qual Lot #3 K636 1000 hrs. 0/77 15 cycles 0/55 Qualification Data Reliability Monitor Data CPC5602C/ SOT-223 M043031311 IR Reflow Qualification Data CPC5602C/ SOT-223 Pre-Condition Bake, Soak @L1, Reflow 245C, 3X Pre-Condition Bake, Soak @L1, Reflow 260C, 3X HTS Bake at 150C, 1000 hrs CPC5602C/ SOT-223 Temp Cycle -65 to 150C, 1000 cycles FE014 CPC5602C/ SOT-223 FE014 CPC5602C/ SOT-223 PCT 121C, 15 psig, 100% RH, 168 hrs Thermal Shock -55 to 125C, 500 cycles CPC5602C/ SOT-223 Temp Cycle -65 to 150C, 1000 cycles M043031311 CPC5602C/ SOT-223 Autoclave 121C, 100% RH, 2 atm M043031311 CPC5602C/ SOT-223 HTS Bake at 150C, 1008 hrs M043031311 CPC5602C/ SOT-223 ESD-HBM RC Network: 1.5 kΩ, 100 pF FE030 CPC5602C/ SOT-223 Read-points/ (Reject/SS) Comments 0/231 FE014 IR Reflow Qualification Data 0/231 FE014 M043031311 1000 hrs Qualification Data 0/77 1000 cycles Qualification Data 0/77 168 hrs Qualification Data 0/77 500 cycles 0/77 1000 cycles 0/77 2 atm 0/77 1008 hrs 0/77 Zap 0/12 Qualification Data Qualification Data Qualification Data Qualification Data Qualification Data IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 3 of 4 Reliability Report: Qualification/Reliability Data for 250-350 Volt Form-B Relay Products and Depletion Mode MOSFET Products IXYS IC Division (Process P 7.1) Qualification Report No.: 2013-011 ESD Testing Results: As part of this qualification, the product CPC5602C was subjected to Human Body Model (HBM) ESD Sensitivity Classification testing using a KeyTek Zapmaster system. The results are summarized in Table 2. All samples were electrically tested to data sheet limits before and after ESD stressing and they passed after +/- 1000V zapping. ESD Model HBM Table2: Product CPC5602C ESD Characterization Results Kit Package ESD Test RC Highest Class Number Spec Network Passed JESD22, 1000V 1C CPC5602C SOT-223 1.5kΩ, FE030 A114-E 100pF FIT (Failure in Time) Rate of P7.1 – High Voltage Form-B Relays: The Table 3 below summarizes the number of devices tested and their test duration along with the associated failures from Qualification and Reliability Monitoring. Using the Reliability Monitoring stress data from HTRB, FIT rate was calculated based on the equivalent device hours at use condition of 40°C compared to 125°C test condition at 0.7eV of activation energy. For THB stress, FIT rate was calculated based on the 85°C/85% RH test condition, and 40°C/60% RH ambient use condition using the activation energy of 0.7eV. The FIT rates came out to be 23.39 FITs, 14.64 FITs and 35.05 FITs for HTGB, HTRB and THB respectively. Stress HTGB HTGB HTRB HTRB THB THB THB Table 3: P7.1 – High Voltage Form-B FIT Rate Calculation Use # of # of Hours AE Eq. Dev. FITs Cond. Devices Fails. Tested (eV) Hours @ 60% CL Tested 77 0 1000 0.7 40°C 23.39 77 0 1000 0.7 39,332,519 40°C 0.7 36 0 1000 40°C 14.64 210 0 1000 0.7 62,829,868 40°C 77 0 1000 0.7 40°C/60% 35.05 77 0 1000 0.7 26,248,530 40°C/60% 77 0 1000 0.7 40°C/60% IXYS Integrated Circuits Division, 78 Cherry Hill Drive, Beverly, MA 01915, USA Tel: 1-978-524-6700, Fax: 1-978-27-CLARE, WWW.IXYSIC.COM Page 4 of 4