The Future of Analog IC Technology

QUARTERLY RELIABILITY MONITOR
REPORT
Q1, Jan. ~ Mar. 2014
Prepared by MPSCD Reliability Engineering
The Future of Analog IC Technology®
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
INDEX
1.0 INTRODUCTION ...........................................................................2 1.1 SHORT TERM RELIBILITY MONITORING .........................................................................................................2 1.2 LONG TERM RELIBILITY MONITORING ............................................................................................................ 2 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS ..............3 3.0 PROCESS RELIABILITY MONITORING DATA............................4 3.1 BCM12B Process Technology ................................................................................................................................. 4 3.2 BCM12S Process Technology ................................................................................................................................. 6 3.3 BCM35 Process Technology .................................................................................................................................... 8 3.4 BCM18 Process Technology ................................................................................................................................. 10 4.0 PACKAGE RELIABILITY MONITORING DATA ......................... 11 4.1 QFN ................................................................................................................................................................................... 11 4.2 SOIC ................................................................................................................................................................................. 20 4.3 MSOP ............................................................................................................................................................................... 31 4.4 TSOT ................................................................................................................................................................................ 33 4.5 TSSOP ............................................................................................................................................................................. 37 4.6 FLIP CHIP-QFN .......................................................................................................................................................... 40 4.7 FLIP CHIP-SOIC......................................................................................................................................................... 51 4.8 FLIP CHIP-TSOT ....................................................................................................................................................... 52 The Future of Analog IC Technology®
-1-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
1.0 INTRODUCTION
This report summarizes the reliability testing results for MPS products as of Q1 2014.
1.1 SHORT TERM RELIBILITY MONITORING
The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product
reliability performance or any potential quality issues.
Stress Test Name
Test Condition
Duration
JEDEC
EARLY LIFE
125°C, Vccmax
48 ~168 hrs
JESD22-A108
Convection Reflow
260°C
3 times
JESD22-A113
Temperature Cycle
Cond C:-65°C ~ 150°C
100~200 cycles
JESD22-A104
Autoclave
121°C /100%RH
48~96 hrs
JESD22-A102
1.2 LONG TERM RELIBILITY MONITORING
The long term monitoring runs on a quarterly basis. It provides the life stresses to the products to monitor
product long term reliability.
Stress Test Name
Durati
Test Condition
JEDEC
on
HTOL
125°C, Vccmax
1000 hrs
JESD22-A108
HTSL
150°C
1000 hrs
JESD22-A103
Precondition
/
/
JESD22-A113
Autoclave
121°C /100%RH
168 hrs
JESD22-A102
Temperature Cycle
Cond C:-65°C ~ 150°C
1000 cycles
JESD22-A104
85°C, 85% R.H., VDD
1000 hrs
JESD22-A101
130°C, 85% R.H., VDD
96 hrs
JESD22-A110
Temperature Humidity Bias
(THB)
High Accelerated Stress Test
(HAST)
The Future of Analog IC Technology®
-2-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS
The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon
accelerated stress data. The units for FIT are failures per Billion device hours.
( χ / 2) *10
2
FITRate =
9
stress * device hours
The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL
is accelerated by temperature and by voltage. The total number of failures in stress determines the
chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number
of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses
the activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g.
55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is
AF(T) times the device-Hours number. Another acceleration is voltage, i.e. AFv= Exp(β∗(Vtest- Vuse)), Vtest
= Stress Voltage (V), Vuse = Nominal Voltage (V), and β = Voltage Acceleration Constant. But, normally, the
voltage acceleration is not accounted in our calculation, i.e. AFv = 1.
The Future of Analog IC Technology®
-3-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
3.0 PROCESS RELIABILITY MONITORING DATA
3.1 BCM12B Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC, SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MPQ1530DQ-AEC1
FA342757A
1333
01-13-14
80
168
0
HFC0400GS
C582639.8E
1251
01-22-14
80
168
0
HFC0300HS
B883704.7C
1339
01-15-14
80
168
0
HFC0300HS
B883704.7E
1346
02-19-14
80
168
0
HFC0300HS
B883704.7D
1346
03-05-14
80
168
0
HFC0300HS
D681288.7A
1350
03-12-14
80
168
0
MPQ2483DQ-AEC1
D572842.7C-MPQ
1335
01-21-14
78
96
0
MPQ2451DT
D672108.9-MPQ
1344
01-15-14
77
96
0
MP4459DQT
D672136.9-MPQ
1348
01-15-14
77
96
0
MPQ4462DQ-AEC1
DA72529.9A-MPQ
1350
01-15-14
80
96
0
MPQ4559DQ
D372556.7BR-MPQ
1319
01-17-14
77
96
0
MPQ4560DQ
D872363.9A-MPQ
1349
01-22-14
77
96
0
MP4459DQT
D672146.9-MPQ
1401
03-26-14
77
96
0
MPQ4456GQT
C772927.9A-MPQ
1402
03-26-14
77
96
0
MPQ2483DQ-AEC1
DA72509.9A-MPQ
1403
02-26-14
80
96
0
MPQ2451DT
D672115.9-MPQ
1404
03-05-14
77
96
0
MPQ2560DN
D872339.9-MPQ
1402
03-05-14
80
96
0
MP4459DQT
D872340.9-MPQ
1404
03-19-14
78
96
0
MP1482DN
D881865.9
1350
01-09-14
80
48
0
MP1482DN
D881918.9
1350
01-09-14
78
48
0
MP1482DN
D881925.9
1350
01-09-14
80
48
0
MP1482DN
D781736.9
1351
01-15-14
80
48
0
MP2105DK
D380037.7
1344
01-15-14
80
48
0
MP1482DN
D881919.9
1351
01-15-14
80
48
0
MP1411DH
D982164.9
1345
01-15-14
80
48
0
MP2105DK
D480315.7
1331
01-17-14
80
48
0
MP1482DN
D480495.7
1352
01-22-14
80
48
0
MP1482DN
D881920.9
1352
01-22-14
78
48
0
MP1411DH
DA82505.9
1401
01-22-14
80
48
0
MP1482DN
D881921.9
1352
01-22-14
80
48
0
MP1482DN
D480498.7
1352
01-12-14
80
48
0
FA No.
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1484EN
D580602.7
1401
01-23-14
78
48
0
MP1482DN
D480492.7
1352
01-29-14
80
48
0
MP1484EN
D881875.9
1402
01-29-14
80
48
0
MP1482DN
D580666.7
1401
02-19-14
80
48
0
MP1482DN
D480501.7
1401
02-19-14
80
48
0
MP1482DN
D480488.7
1402
02-19-14
80
48
0
MP1482DN
D881923.9
1401
02-19-14
80
48
0
MP1482DN
D189657.7
1402
02-19-14
80
48
0
MP1482DN
D580669.7
1402
02-19-14
78
48
0
MP1482DN
D580667.7
1402
02-19-14
78
48
0
MP1482DN
D881924.9
1402
02-19-14
80
48
0
MP1482DN
D580663.7
1402
02-26-14
80
48
0
MP1482DN
D580661.7
1402
02-26-14
78
48
0
MP1530DQ
DA82512.9
1405
02-26-14
80
48
0
MP1482DN
D480504.7
1404
02-26-14
80
48
0
MP1482DN
D881922.9
1404
02-26-14
78
48
0
MP1484EN
D882006.7
1403
02-26-14
80
48
0
MP1482DN
D580668.7
1404
02-26-14
80
48
0
MP1482DN
D781735.9
1404
02-26-14
78
48
0
MP1482DN
D480502.7
1405
02-26-14
80
48
0
MP1411DH
DA82436.9
1403
03-05-14
80
48
0
MP1482DN
D580665.7
1407
03-05-14
80
48
0
MP1482DN
D580670.7
1407
03-05-14
80
48
0
MP1530DQ
DB82676.9
1407
03-05-14
80
48
0
MP1411DH
DB82653.7
1408
03-26-14
80
48
0
MP1411DH
DB82761.7
1408
03-26-14
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP1930GQN
EP295900
1317
01-08-14
80
0
MP1530DQ
C9025902
1323
01-13-14
80
0
HFC0501GS
EP301302
1339
01-16-14
80
0
MP1530DQ
EP327300
1345
02-13-14
80
0
HF01B04DS
EP322400
1342
02-25-14
80
0
HF01B04DS
EP322400
1342
02-25-14
80
0
MPQ2489DQ-AEC1
FA362058A
1343
01-27-14
80
0
MP1530DQ
EP333800
1401
03-12-14
80
0
Total
FA No.
0
The Future of Analog IC Technology®
-5-
MONOLITHIC POWER SYSTEMS
BCM12B
Q1 2014
PRODUCT RELIABILITY REPORT
#fail
#device hours
Accel Factor
FIT Rate
0
640000
348
4
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP18030GQN
EP295900
1319
01-08-14
50
0
MPQ1530DQ-AEC1
FA342757A
1333
01-13-14
50
0
MP18030GQN
EP295900
1321
01-08-14
50
0
MP1930GQN
EP295900
1317
01-08-14
50
0
MP1530DQ
C9025902
1323
01-13-14
50
0
HFC0500GS
EP301300
1338
01-16-14
50
0
MPQ18201HQ-A
C486591.7
1341
01-16-14
50
0
MP1530DQ
EP327300
1345
02-13-14
50
0
MP1530DQ
EP333800
1401
03-12-14
50
0
Total
FA No.
0
3.2 BCM12S Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC, SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
DAS09
D772276.1C
1343
01-21-14
80
168
0
MP1494DJ
D64U982.8
1346
03-13-14
50
168
0
MP1494DJ
D64W047.8
1343
03-13-14
50
168
0
MP1494DJ
D943952_8AQ
1352
03-06-14
80
168
0
MP4032-1GS
D380244.7
1323
01-15-14
79
168
0
MPQ28261DL
D882057.9Y
1349
03-26-14
79
168
0
MPQ28261DL
D982290.9Y
1346
01-09-14
79
96
0
MPQ28261DL
D982182.9Y
1345
01-15-14
79
96
0
MPQ28261DL
D982226.9Y
1349
01-22-14
77
96
0
MPQ28261DL
D882057.9Y
1349
03-26-14
79
96
0
MPQ9361DJ
CB89176.7R-MPQ
1339
03-05-14
80
96
0
MPQ28261DL-C554
D881949.9AY
1403
02-26-14
80
96
0
FA No.
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MPQ28261DL-C554
D982289.9DY
1404
03-05-14
79
96
0
MPQ28261DL-C554
D982289.9AY
1404
03-12-14
79
96
0
MPQ28261DL-C554
D881949.9BY
1403
03-12-14
79
96
0
MPQ4470AGL-AEC1
DB82795.8B-MPQ
1409
03-19-14
80
96
0
MPQ4470GL
D881951.8-MPQ
1404
03-19-14
80
96
0
MP1495DJ
D64W655.8
1350
01-15-14
80
48
0
MP1495DJ
D64W673.8
1349
01-15-14
80
48
0
MP1495DJ
D64W395.8A
1347
01-15-14
80
96
0
MP1495DJ
D64W445.8A
1347
01-17-14
80
96
0
MP1495DJ
D64W674.8A
1349
01-29-14
80
96
0
MP1495DJ
D64W572.8
1350
02-26-14
79
96
0
MP1495DJ
D64W674.8
1349
02-26-14
80
96
0
MP1495DJ
D64W622.8
1401
02-26-14
80
96
0
MP6002DN
D783178.9
1402
02-19-14
75
96
0
MP1495DJ
D741192.8
1406
03-26-14
80
96
0
MP1495DJ
D943469.8Y
1407
03-26-14
80
96
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ-ACQ10
EP268400
1243
01-27-14
80
0
MP8726EL
D882069.9B
1344
01-08-14
80
0
MP8708EN
D944389.9A
1348
01-08-14
80
0
MP44010HS
EP298800
1315
02-11-14
80
0
MP44010HS
EP298802
1334
02-11-14
80
0
MP020-5GS
EP309500
1335
02-21-14
80
0
MP4021GS
D781623.9BQ
1339
02-27-14
80
0
MPQ3386DR-AEC1
EP277001
1331
03-18-14
80
0
MPQ3386DR-AEC1
EP277001
1331
03-18-14
80
0
Total
FA No.
0
BCM12S
#fail
#device hours
Accel Factor
FIT Rate
0
720000
348
3.8
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ-ACQ10
EP268400
1243
01-27-14
50
0
FA No.
*
The Future of Analog IC Technology®
-7-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP150GS
EP282600
1315
01-22-14
50
0
MP150GS
EP282600
1315
01-13-14
50
0
MP150GS
EP282600
1315
01-22-14
50
0
MPQ8632GL-10
EP300500
1326
01-21-14
50
0
MP2615GQ
HP368305
1336
01-08-14
50
0
MP2615GQ
HP368305
1336
01-08-14
50
0
MP44010HS
EP298800
1315
02-11-14
50
0
MPQ4420GJ
EP305702
1323
02-21-14
50
0
MP44010HS
EP298802
1334
02-11-14
50
0
MP150GJ
EP282600
1311
02-25-14
50
0
MP4021GS
D781623.9BQ
1339
02-27-14
50
0
MP1494DJ
H8076501
1343
02-21-14
50
0
MP1494DJ
H8076501
1343
02-21-14
50
0
MP1494DJ
H8076501
1343
02-21-14
50
0
MP1494DJ
H8076501
1343
02-21-14
50
0
MPQ8636HGV-20
EP292406
1343
01-27-14
50
0
MP3399EF
D34R504.9A
1330
01-27-14
50
0
MP020-5GS
EP319502
1348
02-11-14
50
0
MP1494DJ
D64U982.8
1346
03-13-14
50
0
MP1494DJ
D64W047.8
1343
03-13-14
50
0
MP45100GL
EP302904
1346
03-26-14
50
0
MPQ4570GF
FA322429
1344
03-11-14
50
0
MPQ3386DR-AEC1
EP277001
1331
03-18-14
50
0
MPQ3386DR-AEC1
EP277001
1331
03-18-14
50
0
MP45100GN
EP302904
1346
03-26-14
50
0
Total
FA No.
0
3.3 BCM35 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC, SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2633GR
D34R468.1AL
1341
01-08-14
80
168
0
MP2633GR
D34R468.1AM
1341
01-08-14
80
168
0
MP2633GR
D34R468.1AH
1341
01-08-14
80
168
0
MP5010BDQ-J102
D944494.9A
1349
01-08-14
80
168
0
FA No.
The Future of Analog IC Technology®
-8-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP5010ADQ
D54T592.1B
1346
02-13-14
80
168
0
MP4027GJ
CB43216.8D
1330
03-13-14
50
168
0
MP4027GJ
D543600.8C
1329
03-13-14
50
168
0
MPQ2013GG
DA43773.1A-MPQ
1350
01-22-14
80
96
0
MPQ2013GG
DA43773.1B-MPQ
1402
02-19-14
80
96
0
MP5010ADQ
D54T592.9
1350
01-15-14
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5018GD
HP370202
1341
01-22-14
80
0
MP3387GRT
HP337903
1327
01-13-14
90
0
MP3312GC
EP3027
1335
03-18-14
80
0
MP9950DQ
HP388001
1407
03-26-14
80
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
330000
348
8.4
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5018GD
HP370202
1341
01-22-14
50
0
MPM3805GQB-33
HP317307
1334
01-16-14
50
0
MPM3805GQB-25
HP3173
1337
01-16-14
50
0
MPM3810GQB
CA43173.8E
1334
01-23-14
50
0
MPM3805GQB
D443551.8C
1341
01-23-14
50
0
MP3373GM
HP362706
1329
02-21-14
50
0
MP2161GJ
H7U74902
1340
02-21-14
50
0
MP2161GJ
H7U749028
1340
02-21-14
50
0
MP2161GJ
H7U749026
1340
02-21-14
50
0
MP2161GJ
H7U749027
1340
02-21-14
50
0
MP5010ADQ
D54T592.1B
1346
02-13-14
50
0
MP4027GJ
CB43216.8D
1330
03-13-14
50
0
MP3312GC
EP3027
1335
03-18-14
50
0
MP4027GJ
D543600.8C
1329
03-13-14
50
0
MP3312GC
EP3027R1B
1349
03-18-14
50
0
MP3312GC
EP3027R2TR
1349
03-18-14
50
0
Total
FA No.
0
The Future of Analog IC Technology®
-9-
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
3.4 BCM18 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
NB671GQ
D44S609.8
1339
03-14-14
50
168
0
NB671GQ
D44S761.8Q
1339
03-14-14
50
168
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax and 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB671GQ
D44S609.8
1339
03-14-14
80
0
NB671GQ
HP319006
1339
03-14-14
80
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
160000
348
15.3
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2229GQ
HP339804
1341
01-22-14
50
0
MP2145GD
HP319006
1332
01-13-14
50
0
MP2145GD
HP319006
1332
01-13-14
50
0
MP2145GD
HP319006
1332
01-13-14
50
0
MP2225GJ
HP318909
1344
02-13-14
50
0
NB671GQ
D44S609.8
1339
03-14-14
50
0
NB671GQ
D44S761.8Q
1339
03-14-14
50
0
Total
FA No.
0
The Future of Analog IC Technology®
- 10 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.0 PACKAGE RELIABILITY MONITORING DATA
4.1 QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
QFN2*2
ASAT
QFN2*2
UCD
QFN2*3
ASAT
QFN2*3
UCD
QFN3*3
ASAT
QFN3*3
UCD
QFN3*4
ASAT
QFN3*4
UCD
QFN4*4
ASAT
QFN4*4
UCD
QFN4*5
ASAT
QFN5*5
UCD
QFN5*5
ASAT
QFN7*7
UCD
QFN5*6
UTAC
QFN3*3
UCD
QFN6*6
JCET
QFN2*2
UCD
QFN7*7
JCET
QFN4*4
4.1.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP18030GQN
1319
01-08-14
290
0
MP1530DQ
1323
01-13-14
305
0
MP1530DQ
1323
01-13-14
305
0
MPQ1530DQ-AEC1
1333
01-13-14
300
0
MP2633GR
1341
01-08-14
200
0
MP2633GR
1341
01-08-14
200
0
MP2633GR
1341
01-08-14
200
0
MP18030GQN
1321
01-08-14
290
0
MP1930GQN
1317
01-08-14
290
0
MP1530DQ
1323
01-13-14
305
0
MP1530DQ
1323
01-13-14
305
0
MPQ4569GQ-AEC1
1329
01-21-14
202
0
MP3213DQ
1202
01-08-14
160
0
MPQ18201HQ-A
1341
01-16-14
300
0
MP1530DQ
1345
02-13-14
300
0
MP1530DQ
1347
02-13-14
250
0
MP5010ADQ
1346
02-13-14
190
0
MP45100GL
1346
03-26-14
260
0
MP1530DQ
1401
03-12-14
250
0
MPQ3386DR-AEC1
1331
03-18-14
187
0
MPQ3386DR-AEC1
1331
03-18-14
187
0
FA NO.
The Future of Analog IC Technology®
- 11 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2932GQK
1323
03-26-14
100
0
MP2932GQK
1338
03-26-14
100
0
Total
FA NO.
0
SAT picture of QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.1.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
MP18030GQN
1319
01-08-14
94
0
1000
MP1530DQ
1323
01-13-14
100
0
1000
MP1530DQ
1323
01-13-14
100
0
1000
MPQ1530DQ-AEC1 1333
01-13-14
94
0
1000
94
0
1000
MP18030GQN
1321
01-08-14
MP1930GQN
1317
01-08-14
94
0
1000
MP1530DQ
1323
01-13-14
100
0
1000
MP1530DQ
1323
01-13-14
100
0
1000
MPQ4569GQ-AEC1 1329
01-21-14
94
0
1000
MPQ18201HQ-A
1341
01-16-14
97
0
1000
MP1530DQ
1345
02-13-14
94
0
1000
MP1530DQ
1347
02-13-14
79
0
1000
MP5010ADQ
1346
02-13-14
82
0
1000
MP45100GL
1346
03-26-14
79
0
1000
MP1530DQ
1401
03-12-14
79
0
1000
MPQ3386DR-AEC1 1331
03-18-14
79
0
1000
The Future of Analog IC Technology®
- 12 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
MPQ3386DR-AEC1 1331
03-18-14
79
0
1000
MPQ2483DQ-AEC1 1335
Device
D/C
FA NO.
# of
cycle
01-21-14
84
0
100
MP3212DQ
1346
01-09-14
84
0
100
MPQ28261DL
1346
01-09-14
84
0
100
MPQ28261DL
1345
01-15-14
94
0
100
MPQ28261DL
1349
01-22-14
94
0
100
MP5010ADQ
1350
01-15-14
94
0
100
MPQ28261DL
1349
03-26-14
93
0
100
MP3388DR-C414
1351
01-09-14
94
0
100
MP5000DQ
1351
01-09-14
97
0
100
MP2633GR
1352
01-09-14
94
0
100
MP4459DQT
1348
01-15-14
97
0
100
01-15-14
94
0
100
01-09-14
94
0
100
MPQ4462DQ-AEC1 1350
MP2633GR
1401
NB634EL-C285
1351
01-09-14
96
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
96
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP3388DR-C414
1350
01-09-14
97
0
100
MP28253EL
1352
01-15-14
50
0
100
MP2633GR
1352
01-15-14
50
0
100
MPQ4561DQ-AEC1 1351
01-15-14
50
0
100
MPQ4559DQ
1319
01-17-14
50
0
100
MP2116DQ
1352
01-17-14
50
0
100
MP28256EL
1351
01-17-14
50
0
100
MP2633GR
1352
01-17-14
50
0
100
MPQ4560DQ
1349
01-22-14
50
0
100
NB634EL
1349
01-17-14
50
0
100
MPQ2013GG
1350
01-22-14
50
0
100
MP8904DD
1352
01-22-14
50
0
100
MP2633GR
1401
01-17-14
50
0
100
MPQ2451DG-AEC1 1351
01-22-14
50
0
100
MP8126DR
1402
01-23-14
50
0
100
MP28253EL-C323
1402
01-23-14
50
0
100
MP2005DD
1402
01-23-14
50
0
100
MP2633AGR
1328
01-29-14
50
0
100
MP28256EL
1402
01-29-14
50
0
100
MP3213DQ
1352
01-29-14
50
0
100
The Future of Analog IC Technology®
- 13 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
Close
Date
Sample
Size
PRODUCT RELIABILITY REPORT
# of
Fail
FA NO.
# of
cycle
MP2633GR
1402
01-29-14
50
0
100
MP5010SDQ
1401
01-29-14
50
0
100
MP28253EL-C323
1404
02-19-14
50
0
100
MPQ2128DG-AEC1 1350
02-19-14
50
0
100
MPQ2013GQ
1402
02-19-14
50
0
100
MP1907GQ
1401
02-19-14
50
0
100
MP5011DQ
1403
02-19-14
50
0
100
MP1531DQ
1403
02-19-14
50
0
100
MP28256EL
1402
02-19-14
50
0
100
MP26021DQ-C163
1341
02-19-14
50
0
100
MP2633GR
1402
02-19-14
50
0
100
PQ20056GG-18-AEC 1403
02-19-14
50
0
100
MP2128DG
1336
02-26-14
50
0
100
MP4459DQT
1401
03-26-14
50
0
100
MPQ2013GG
1402
02-19-14
50
0
100
MP26123DR
1404
02-19-14
50
0
100
MP28255EL
1404
02-19-14
50
0
100
MP2155GQ
1404
02-19-14
50
0
100
PQ2451GG-33-AEC 1323
02-19-14
50
0
100
1302
02-26-14
50
0
100
MP1530DQ
1405
02-26-14
50
0
100
MP4566DD
1403
02-26-14
50
0
100
MPQ4456GQT
1402
03-26-14
50
0
100
MPQ4558DQ-AEC1 1404
02-26-14
50
0
100
MPQ2483DQ-AEC1 1403
02-26-14
50
0
100
MPQ20051DQ-AEC
MP5000DQ
1404
02-26-14
50
0
100
MP3388DR-C414
1405
03-12-14
50
0
100
MP28256EL
1404
03-12-14
50
0
100
MPQ28261DL-C554 1403
02-26-14
50
0
100
MPQ28261DL-C554 1404
03-05-14
50
0
100
MP2607DL
1405
03-05-14
50
0
100
MP2030DQ
1404
03-05-14
50
0
100
MP2633GR
1406
03-05-14
50
0
100
MPQ28261DL-C554 1404
03-12-14
50
0
100
1407
03-05-14
50
0
100
MPQ28261DL-C554 1403
03-12-14
50
0
100
1406
03-05-14
50
0
100
MP8668DL-C223
MP28256EL
MP2108DQ
1405
03-05-14
50
0
100
MP8903DG-3.3
1405
03-05-14
50
0
100
MP28253EL
1407
03-05-14
50
0
100
MP1530DQ
1407
03-05-14
50
0
100
MP2633GR
1407
03-05-14
50
0
100
The Future of Analog IC Technology®
- 14 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3430HQ
1408
03-12-14
50
0
100
MP3213DQ
1408
03-12-14
50
0
100
MP3213DQ
1408
03-12-14
50
0
100
MP28253EL
1408
03-12-14
50
0
100
MP3212DQ
1408
03-12-14
50
0
100
MP3430HQ
1321
03-12-14
50
0
100
MP2012DQ
1406
03-12-14
50
0
100
FA NO.
# of
cycle
NB600CQ
1408
03-12-14
50
0
100
MP28253EL
1408
03-12-14
50
0
100
NB600CQ
1408
03-12-14
50
0
100
MP4459DQT
1404
03-19-14
50
0
100
MPQ8904DD-AEC1 1407
03-12-14
50
0
100
MP2136EG
1408
03-12-14
50
0
100
MP2936DQK
1409
03-12-14
50
0
100
MP3388DR-C414
1408
03-12-14
50
0
100
MP2492DQ
1408
03-12-14
50
0
100
MP2125DL
1409
03-12-14
50
0
100
MP2108DQ
1407
03-19-14
50
0
100
MP2633GR
1407
03-19-14
50
0
100
MP5010DQ-C347
1408
03-19-14
50
0
100
MPQ4561DQ-AEC1 1351
03-19-14
50
0
100
MP2303ADN
1408
03-19-14
50
0
100
MP1484EN-C321
1406
03-19-14
50
0
100
MP1518DJ
1409
03-19-14
50
0
100
MP3213DQ
1409
03-19-14
50
0
100
MP5010DQ
1409
03-19-14
50
0
100
MP28252EL
1407
03-19-14
50
0
100
MP3388DR-C414
1410
03-19-14
50
0
100
MP2602DQ
1409
03-19-14
50
0
100
MP28256EL
1410
03-19-14
50
0
100
MP8904DD
1410
03-19-14
50
0
100
NB634EL
1410
03-26-14
50
0
100
MP5000ADQ
1409
03-26-14
50
0
100
MP2452DD
1411
03-26-14
50
0
100
MP2489DQ
1409
03-26-14
50
0
100
MP28114DG
1409
03-26-14
50
0
100
MP3212DQ
1409
03-26-14
50
0
100
MP3430HQ
1410
03-26-14
50
0
100
MP2303DQ
1410
03-26-14
50
0
100
MP28255EL
1409
03-26-14
50
0
100
Total
0
The Future of Analog IC Technology®
- 15 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.1.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP18030GQN
1319
01-08-14
97
0
168
MP1530DQ
1323
01-13-14
100
0
168
MP1530DQ
1323
01-13-14
100
0
168
MPQ1530DQ-AEC1 1333
01-13-14
96
0
168
FA NO.
# of hrs
MP2633GR
1341
01-08-14
97
0
168
MP2633GR
1341
01-08-14
96
0
168
MP2633GR
1341
01-08-14
96
0
168
MP18030GQN
1321
01-08-14
97
0
168
MP1930GQN
1317
01-08-14
97
0
168
MP1530DQ
1323
01-13-14
100
0
168
MP1530DQ
1323
01-13-14
100
0
168
MP3213DQ
1202
01-08-14
80
0
168
MPQ18201HQ-A
1341
01-16-14
97
0
168
MP1530DQ
1345
02-13-14
97
0
168
MP1530DQ
1347
02-13-14
77
0
168
MP5010ADQ
1346
02-13-14
77
0
168
MP45100GL
1346
03-26-14
77
0
168
MP1530DQ
1401
03-12-14
77
0
168
MPQ3386DR-AEC1 1331
03-18-14
77
0
168
MPQ3386DR-AEC1 1331
03-18-14
77
0
168
MPQ2483DQ-AEC1 1335
01-21-14
50
0
48
MP3212DQ
1346
01-09-14
50
0
48
MPQ28261DL
1346
01-09-14
50
0
48
MPQ28261DL
1345
01-15-14
50
0
48
MPQ28261DL
1349
01-22-14
50
0
48
MP5010ADQ
1350
01-15-14
50
0
48
MPQ28261DL
1349
03-26-14
50
0
48
MP3388DR-C414
1351
01-09-14
50
0
48
MP5000DQ
1351
01-09-14
50
0
48
MP2633GR
1352
01-09-14
50
0
48
MP4459DQT
1348
01-15-14
50
0
48
MPQ4462DQ-AEC1 1350
01-15-14
50
0
48
MP2633GR
1401
01-09-14
50
0
48
NB634EL-C285
1351
01-09-14
50
0
48
MP3388DR-C414
1350
01-09-14
50
0
48
MP3388DR-C414
1350
01-09-14
97
0
48
MP3388DR-C414
1350
01-09-14
97
0
48
MP3388DR-C414
1350
01-09-14
97
0
48
MP3388DR-C414
1350
01-09-14
50
0
48
The Future of Analog IC Technology®
- 16 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3388DR-C414
1350
01-09-14
50
0
48
MP3388DR-C414
1350
01-09-14
50
0
48
MP3388DR-C414
1350
01-09-14
50
0
48
MP28253EL
1352
01-15-14
50
0
48
MP2633GR
1352
01-15-14
50
0
48
MPQ4561DQ-AEC1 1351
01-15-14
50
0
48
01-17-14
50
0
48
MPQ4559DQ
1319
FA NO.
# of hrs
MP2116DQ
1352
01-17-14
50
0
48
MP28256EL
1351
01-17-14
50
0
48
MP2633GR
1352
01-17-14
50
0
48
MPQ4560DQ
1349
01-22-14
50
0
48
NB634EL
1349
01-17-14
50
0
48
MPQ2013GG
1350
01-22-14
50
0
48
MP8904DD
1352
01-22-14
50
0
48
MP2633GR
1401
01-17-14
50
0
48
MPQ2451DG-AEC1 1351
01-22-14
50
0
48
MP8126DR
1402
01-23-14
50
0
48
MP28253EL-C323
1402
01-23-14
50
0
48
MP2005DD
1402
01-23-14
50
0
48
MP2633AGR
1328
01-29-14
50
0
48
MP28256EL
1402
01-29-14
50
0
48
MP3213DQ
1352
01-29-14
50
0
48
MP2633GR
1402
01-29-14
50
0
48
MP5010SDQ
1401
01-29-14
50
0
48
MP28253EL-C323
1404
02-19-14
50
0
48
MPQ2128DG-AEC1 1350
02-19-14
50
0
48
02-19-14
50
0
48
MPQ2013GQ
1402
MP1907GQ
1401
02-19-14
50
0
48
MP5011DQ
1403
02-19-14
50
0
48
MP1531DQ
1403
02-19-14
50
0
48
MP28256EL
1402
02-19-14
50
0
48
MP26021DQ-C163
1341
02-19-14
50
0
48
MP2633GR
1402
02-19-14
50
0
48
PQ20056GG-18-AEC 1403
02-19-14
50
0
48
MP2128DG
1336
02-26-14
50
0
48
MP4459DQT
1401
03-26-14
50
0
48
MPQ2013GG
1402
02-19-14
50
0
48
MP26123DR
1404
02-19-14
50
0
48
MP28255EL
1404
02-19-14
50
0
48
MP2155GQ
1404
02-19-14
50
0
48
PQ2451GG-33-AEC 1323
02-19-14
50
0
48
02-26-14
50
0
48
MPQ20051DQ-AEC
1302
The Future of Analog IC Technology®
- 17 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1530DQ
1405
02-26-14
50
0
48
MP4566DD
1403
02-26-14
50
0
48
MPQ4456GQT
FA NO.
# of hrs
1402
03-26-14
50
0
48
MPQ4558DQ-AEC1 1404
02-26-14
50
0
48
MPQ2483DQ-AEC1 1403
02-26-14
50
0
48
MP5000DQ
1404
02-26-14
50
0
48
MP3388DR-C414
1405
03-12-14
50
0
48
MP28256EL
1404
03-12-14
50
0
48
MPQ28261DL-C554 1403
02-26-14
50
0
48
MPQ28261DL-C554 1404
03-05-14
50
0
48
MP2607DL
1405
03-05-14
50
0
48
MP2030DQ
1404
03-05-14
50
0
48
MP2633GR
1406
03-05-14
50
0
48
MPQ28261DL-C554 1404
03-12-14
50
0
48
1407
03-05-14
50
0
48
MPQ28261DL-C554 1403
03-12-14
50
0
48
MP8668DL-C223
MP28256EL
1406
03-05-14
50
0
48
MP2108DQ
1405
03-05-14
50
0
48
MP8903DG-3.3
1405
03-05-14
48
0
48
MP28253EL
1407
03-05-14
50
0
48
MP1530DQ
1407
03-05-14
50
0
48
MP2633GR
1407
03-05-14
50
0
48
MP3430HQ
1408
03-12-14
50
0
48
MP3213DQ
1408
03-12-14
50
0
48
MP3213DQ
1408
03-12-14
50
0
48
MP28253EL
1408
03-12-14
50
0
48
MP3212DQ
1408
03-12-14
50
0
48
MP3430HQ
1321
03-12-14
50
0
48
MP2012DQ
1406
03-12-14
50
0
48
NB600CQ
1408
03-12-14
50
0
48
MP28253EL
1408
03-12-14
50
0
48
NB600CQ
1408
03-12-14
50
0
48
MP4459DQT
1404
03-19-14
50
0
48
MPQ8904DD-AEC1 1407
03-12-14
50
0
48
MP2136EG
1408
03-12-14
50
0
48
MP2936DQK
1409
03-12-14
50
0
48
MP3388DR-C414
1408
03-12-14
50
0
48
MP2492DQ
1408
03-12-14
50
0
48
MP2125DL
1409
03-12-14
50
0
48
MP2108DQ
1407
03-19-14
50
0
48
MP2633GR
1407
03-19-14
50
0
48
MP5010DQ-C347
1408
03-19-14
50
0
48
The Future of Analog IC Technology®
- 18 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
Close
Date
Sample
Size
# of
Fail
03-19-14
50
0
48
D/C
MPQ4561DQ-AEC1 1351
PRODUCT RELIABILITY REPORT
FA NO.
# of hrs
MP2303ADN
1408
03-19-14
50
0
48
MP1484EN-C321
1406
03-19-14
50
0
48
MP1518DJ
1409
03-19-14
50
0
48
MP3213DQ
1409
03-19-14
50
0
48
MP5010DQ
1409
03-19-14
50
0
48
MP28252EL
1407
03-19-14
50
0
48
MP3388DR-C414
1410
03-19-14
50
0
48
MP2602DQ
1409
03-19-14
50
0
48
MP28256EL
1410
03-19-14
50
0
48
MP8904DD
1410
03-19-14
50
0
48
NB634EL
1410
03-26-14
50
0
48
MP5000ADQ
1409
03-26-14
50
0
48
MP2452DD
1411
03-26-14
50
0
48
MP2489DQ
1409
03-26-14
50
0
48
MP28114DG
1409
03-26-14
50
0
48
MP3212DQ
1409
03-26-14
50
0
48
MP3430HQ
1410
03-26-14
50
0
48
MP2303DQ
1410
03-26-14
50
0
48
MP28255EL
1409
03-26-14
50
0
48
Total
0
4.1.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP18030GQN
1319
01-08-14
90
0
MP18030GQN
1321
01-08-14
80
0
MP1930GQN
1317
01-08-14
90
0
MP1530DQ
1323
01-13-14
85
0
MPQ4569GQ-AEC1
1329
01-21-14
101
0
MP3213DQ
1202
01-08-14
80
0
MP1530DQ
1345
02-13-14
85
0
MP1530DQ
1347
02-13-14
80
0
MP45100GL
1346
03-26-14
80
0
MP1530DQ
1401
03-12-14
80
0
MP5010ADQ
1350
01-15-14
50
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 19 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.2 SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
SOIC8
ANST
SOIC14
UCD
SOIC8-EP
ANST
SOIC16
ANST
SOIC8-7
ANST
SOIC20
ANST
SOIC8
ANST
SOIC28
ANST
SOIC8-EP
UTAC
SOIC8
UTAC
SOIC8-EP
JCET
SOIC8
JCET
SOIC8-EP
JCET
SOIC16
ASE-KS
SOIC8-EP
ASE-KS
SOIC8
4.2.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP150GS
1315
01-22-14
304
0
MP4032-2GS
1323
01-13-14
300
0
MP150GS
1315
01-13-14
306
0
MP150GS
1315
01-22-14
307
0
MP150GS
1315
01-22-14
100
0
MP4032-2GS
1341
01-10-14
380
0
MPQ4569GN-AEC1
1329
01-21-14
80
0
HFC0501GS
1339
01-16-14
300
0
MP44010HS
1315
02-11-14
200
0
MP44010HS
1315
02-11-14
100
0
MP44010HS
1315
02-11-14
80
0
MP44010HS
1334
02-11-14
280
0
MP4021GS
1339
02-27-14
200
0
MP020-5GS
1348
02-11-14
165
0
MPQ8040GDN
1332
03-06-14
100
0
MPQ8040GDN
1332
03-06-14
100
0
MP157GS
1322
03-18-14
175
0
MP45100GN
1346
03-26-14
267
0
MP6922AGN
1350
03-26-14
85
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 20 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
SAT picture of SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.2.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4032-2GS
1323
01-13-14
94
0
1000
MP4032-2GS
1341
01-10-14
94
0
1000
MP44010HS
1315
02-11-14
94
0
1000
MP44010HS
1334
02-11-14
94
0
1000
MP4021GS
1339
02-27-14
94
0
1000
MP020-5GS
1348
02-11-14
82
0
1000
FA NO.
# of
cycle
MP157GS
1322
03-18-14
77
0
1000
MP45100GN
1346
03-26-14
79
0
1000
MP6922AGN
1350
03-26-14
79
0
1000
MP24943DS
1325
01-09-14
50
0
100
HFC0400GS
1251
01-22-14
50
0
100
HFC0300HS
1339
01-15-14
50
0
100
HFC0300HS
1346
02-19-14
50
1
MP2380DN-C341
1345
01-09-14
50
0
8178
100
100
MP1584EN-C461
1349
01-09-14
50
0
100
MP1482DN
1350
01-09-14
50
0
100
MP9415EN
1349
01-09-14
50
0
100
MP1482DN
1350
01-09-14
50
0
100
MP62340DS-1
1351
01-09-14
50
0
100
MP1482DN
1350
01-09-14
50
0
100
MP2303ADN
1351
01-09-14
50
0
100
MP2307DN
1346
01-09-14
50
0
100
MP4030GS
1350
01-09-14
50
0
100
CM500GS
1348
01-09-14
50
0
100
MP1482DS-C165
1351
01-09-14
50
0
100
The Future of Analog IC Technology®
- 21 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1351
01-15-14
50
0
100
MP3394ES-C462
1343
01-09-14
50
0
100
MP2303ADN
1351
01-09-14
50
0
100
MP020-5GS
1347
01-15-14
50
0
100
MP1484EN
1348
01-15-14
50
0
100
MP3394SGS-C556
1350
01-17-14
50
0
100
MP1482DN-C165
1310
01-15-14
50
0
100
MP1482DN
1351
01-15-14
50
0
100
MP3398AGS
1346
01-15-14
50
0
100
FA NO.
# of
cycle
MP6903DS
1348
01-15-14
50
0
100
MP24830HS-C470
1350
01-17-14
50
0
100
DAS09
1352
01-17-14
50
0
100
MP020-5GS
1349
01-17-14
50
0
100
MP2305DS
1350
01-17-14
50
0
100
MP4021GS-A
1352
01-17-14
50
0
100
MP1482DN
1352
01-22-14
50
0
100
CM500GS
1352
01-22-14
50
0
100
MP62340DS-1
1402
01-22-14
50
0
100
MP1482DN
1352
01-22-14
50
0
100
MP8708EN
1402
01-22-14
50
0
100
MP1482DN
1352
01-22-14
50
0
100
MP3398GS
1348
01-23-14
50
0
100
MP2307DN
1347
01-23-14
50
0
100
MP1482DN
1352
01-23-14
50
0
100
MP38894DN
1402
01-23-14
50
0
100
MP1484EN-C166
1350
01-23-14
50
0
100
MP1484EN
1401
01-23-14
50
0
100
MP1484EN
1352
01-23-14
50
0
100
MP4653GY-C548
1336
01-23-14
50
0
100
MP3399EY
1333
02-19-14
50
0
100
MP4653GY-C548
1336
01-23-14
50
0
100
MP4653GY-C548
1339
01-23-14
50
0
100
MP3393EY
1341
01-23-14
50
0
100
MP3399EY
1341
01-23-14
50
0
100
MP3394SGS
1349
01-23-14
50
0
100
MP4653GY-C548
1348
01-23-14
50
0
100
MP4051GS
1405
02-26-14
50
0
100
MP1482DN
1352
01-29-14
50
0
100
MP020-5GS
1351
01-29-14
50
0
100
MP1484EN
1402
01-29-14
50
0
100
MP6001DN
1352
01-29-14
50
0
100
MP62351ES
1402
01-29-14
50
0
100
The Future of Analog IC Technology®
- 22 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1484EN-C166
1352
01-29-14
50
0
100
MP1482DN
1401
02-19-14
50
0
100
MP3394SGS
1352
02-19-14
50
0
100
MP1482DN
1401
02-19-14
50
0
100
MP2305DS
1352
01-29-14
50
0
100
MP24830HS
1350
01-29-14
50
0
100
FA NO.
# of
cycle
CM500GS
1350
01-29-14
50
0
100
MP1583DN
1401
01-29-14
50
0
100
MP4030AGS
1350
02-19-14
50
0
100
MP6920DN
1402
01-29-14
50
0
100
MP4012DS-C546
1402
02-19-14
50
0
100
MP1482DN
1402
02-19-14
50
0
100
MP1584EN-C461
1352
02-19-14
50
0
100
MP1410ES-C019
1402
02-19-14
50
0
100
MP3394SGS
1352
02-19-14
50
0
100
MP18021HN
1403
02-19-14
50
0
100
MP111DS
1402
02-19-14
50
0
100
MP1482DN
1401
02-19-14
50
0
100
MP2374DS
1402
02-19-14
50
0
100
MP44010HS
1349
02-19-14
50
0
100
MP1482DN
1402
02-19-14
50
0
100
MPQ2249DN
1345
02-19-14
50
0
100
MP200DS
1401
02-19-14
50
0
100
MP4030GS
1351
02-19-14
50
0
100
MP3398AGS
1349
02-19-14
50
0
100
MP1582EN
1403
02-19-14
50
0
100
MP2467DN
1404
02-19-14
50
0
100
MP1482DS-C165
1352
02-19-14
50
0
100
MP1482DN
1402
02-19-14
50
0
100
MP1482DN
1402
02-19-14
50
0
100
MP28313CS
1403
02-19-14
50
0
100
MP1482DN
1402
02-19-14
50
0
100
MP3394SGS
1350
02-26-14
50
0
100
MP1583DN
1402
02-19-14
50
0
100
MP3398AGS
1349
02-19-14
50
0
100
MP1484EN
1352
02-19-14
50
0
100
MP6002DN
1402
02-19-14
50
0
100
MP1482DN
1402
02-26-14
50
0
100
MP1482DN
1402
02-26-14
50
0
100
HFC0300HS
1346
03-05-14
50
0
100
MP4051GS
1404
02-26-14
50
0
100
HFC0300HS
1350
03-12-14
50
0
100
The Future of Analog IC Technology®
- 23 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
MPQ4558DN
1403
02-26-14
50
0
100
MP1482DN
1404
02-26-14
50
0
100
MP1482DN
1404
02-26-14
50
0
100
HR1000AGS
1403
02-26-14
50
0
100
MP2307DN
1347
02-26-14
50
0
100
MP1484EN
1403
02-26-14
50
0
100
DAS09
1403
02-26-14
50
0
100
MP1482DN
1404
02-26-14
50
0
100
MPQ4462DN
1403
03-05-14
50
0
100
MP2363DN
1404
02-26-14
50
0
100
MP1584EN
1404
02-26-14
50
0
100
MP9141ES
1404
03-05-14
50
0
100
MP1482DN
1404
02-26-14
50
0
100
MP1482DN
1405
02-26-14
50
0
100
MP6902DS-C530
1404
03-05-14
50
0
100
MP1482DS
1404
02-26-14
50
0
100
MP2305DS
1405
02-26-14
50
0
100
MP1584EN
1404
03-05-14
50
0
100
MP3394ES
1401
03-05-14
50
0
100
MP1482DS-C165
1407
03-05-14
50
0
100
MP2303ADN
1401
03-05-14
50
0
100
MP8718EN
1405
03-05-14
50
0
100
MP8709EN
1407
03-05-14
50
0
100
MP1482DN
1407
03-05-14
50
0
100
MP1410ES-C019
1407
03-05-14
50
0
100
MP1482DN
1407
03-05-14
50
0
100
MP020-5GS
1402
03-05-14
50
0
100
DAS09
1403
03-05-14
50
0
100
MP111DS
1352
03-05-14
50
0
100
MPQ2560DN
1402
03-05-14
50
0
100
MP4462DN
1407
03-05-14
50
0
100
MP2565DN
1408
03-12-14
50
0
100
MP6205DN
1405
03-12-14
50
0
100
MP2482DN
1405
03-12-14
50
0
100
MP2495DS
1406
03-12-14
50
0
100
MP1484EN
1406
03-12-14
50
0
100
MP8706EN
1408
03-12-14
50
0
100
MP4030AGS
1408
03-12-14
50
0
100
MP1432DN
1408
03-12-14
50
0
100
MP2482DN
1350
03-12-14
50
0
100
MP9141ES
1408
03-12-14
50
0
100
MP1423DN
1408
03-19-14
50
0
100
The Future of Analog IC Technology®
- 24 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1484EN-C166
1402
03-19-14
50
0
100
MP2565DN
1409
03-19-14
50
0
100
MP1423DN
1407
03-19-14
50
0
100
MP26123DR
1408
03-19-14
50
0
100
MP1482DN
1410
03-19-14
50
0
100
MP8709EN
1408
03-19-14
50
0
100
MP2249DN
1345
03-19-14
50
0
100
MP44011HS
1409
03-19-14
50
0
100
MP1484EN
1402
03-19-14
50
0
100
MPGC01DN
1405
03-19-14
50
0
100
MP2490DS
1408
03-19-14
50
0
100
MP1593DN-C218
1409
03-19-14
50
0
100
MP1580HS
1410
03-26-14
50
0
100
MP1482DS
1404
03-26-14
50
0
100
MP1484EN-C166
1402
03-26-14
50
0
100
DAS09
1404
03-26-14
50
0
100
MP8708EN
1404
03-26-14
50
0
100
MP6902DS
1408
03-26-14
50
0
100
MP200DS
1409
03-26-14
50
0
100
MP1583DN
1410
03-26-14
50
0
100
FA NO.
# of
cycle
MP1484EN
1403
03-26-14
50
0
100
MP4560DN
1410
03-26-14
50
0
100
MP6211DN
1409
03-26-14
50
0
100
MP6211DN
1407
03-26-14
50
0
100
MP8709EN
1408
03-26-14
50
0
100
MPQ2249DN
1409
03-26-14
50
0
100
MP2494DN
1408
03-26-14
50
0
100
MP2307DN
1405
03-26-14
50
0
100
MP2303DN
1410
03-26-14
50
0
100
MP3398AGY
1405
03-26-14
50
0
100
MP3398AGY
1403
03-26-14
50
0
100
MP3398AGY
1402
03-26-14
50
0
100
MP3399EY
1350
03-26-14
50
0
100
MP3394SGS
1349
03-26-14
50
0
100
MP3394SGS
1401
03-26-14
50
0
100
MP3398AGY
1403
03-26-14
50
0
100
MP3394SGS
1402
03-26-14
50
0
100
MP3394SGS
1404
03-26-14
50
0
100
Total
1
The Future of Analog IC Technology®
- 25 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.2.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4032-2GS
1323
01-13-14
97
0
168
MP4032-2GS
1341
01-10-14
97
0
168
MP44010HS
1315
02-11-14
96
0
168
MP44010HS
1315
02-11-14
97
0
168
FA NO.
# of hrs
MP44010HS
1334
02-11-14
97
0
168
MP020-5GS
1348
02-11-14
77
0
168
MP45100GN
1346
03-26-14
77
0
168
MP24943DS
1325
01-09-14
50
0
48
HFC0400GS
1251
01-22-14
50
0
48
HFC0300HS
1339
01-15-14
50
0
48
HFC0300HS
1346
02-19-14
50
0
48
MP2380DN-C341
1345
01-09-14
50
0
48
MP1584EN-C461
1349
01-09-14
50
0
48
MP1482DN
1350
01-09-14
50
0
48
MP9415EN
1349
01-09-14
50
0
48
MP1482DN
1350
01-09-14
50
0
48
MP62340DS-1
1351
01-09-14
50
0
48
MP1482DN
1350
01-09-14
50
0
48
MP2303ADN
1351
01-09-14
50
0
48
MP2307DN
1346
01-09-14
50
0
48
MP4030GS
1350
01-09-14
50
0
48
CM500GS
1348
01-09-14
50
0
48
MP1482DS-C165
1351
01-09-14
50
0
48
MP1482DN
1351
01-15-14
50
0
48
MP3394ES-C462
1343
01-09-14
50
0
48
MP2303ADN
1351
01-09-14
50
0
48
MP020-5GS
1347
01-15-14
50
0
48
MP1484EN
1348
01-15-14
50
0
48
MP3394SGS-C556
1350
01-17-14
50
0
48
MP1482DN-C165
1310
01-15-14
50
0
48
MP1482DN
1351
01-15-14
50
0
48
MP3398AGS
1346
01-15-14
50
0
48
MP6903DS
1348
01-15-14
50
0
48
MP24830HS-C470
1350
01-17-14
50
0
48
DAS09
1352
01-17-14
50
0
48
MP020-5GS
1349
01-17-14
50
0
48
MP2305DS
1350
01-17-14
50
0
48
MP4021GS-A
1352
01-17-14
50
0
48
MP1482DN
1352
01-22-14
50
0
48
The Future of Analog IC Technology®
- 26 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
Close
Date
Sample
Size
PRODUCT RELIABILITY REPORT
# of
Fail
FA NO.
# of hrs
CM500GS
1352
01-22-14
50
0
48
MP62340DS-1
1402
01-22-14
50
0
48
MP1482DN
1352
01-22-14
50
0
48
MP8708EN
1402
01-22-14
50
0
48
MP1482DN
1352
01-22-14
50
0
48
MP3398GS
1348
01-23-14
50
0
48
MP2307DN
1347
01-23-14
50
0
48
MP1482DN
1352
01-23-14
50
0
48
MP38894DN
1402
01-23-14
50
0
48
MP1484EN-C166
1350
01-23-14
50
0
48
MP1484EN
1401
01-23-14
50
0
48
MP1484EN
1352
01-23-14
50
0
48
MP4653GY-C548
1336
01-23-14
50
0
48
MP3399EY
1333
02-19-14
50
0
48
MP4653GY-C548
1336
01-23-14
50
0
48
MP4653GY-C548
1339
01-23-14
50
0
48
MP3393EY
1341
01-23-14
50
0
48
MP3399EY
1341
01-23-14
50
0
48
MP3394SGS
1349
01-23-14
50
0
48
MP4653GY-C548
1348
01-23-14
50
0
48
MP4051GS
1405
02-26-14
50
0
48
MP1482DN
1352
01-29-14
50
0
48
MP020-5GS
1351
01-29-14
50
0
48
MP1484EN
1402
01-29-14
50
0
48
MP6001DN
1352
01-29-14
50
0
48
MP62351ES
1402
01-29-14
50
0
48
MP1484EN-C166
1352
01-29-14
50
0
48
MP1482DN
1401
02-19-14
50
0
48
MP3394SGS
1352
02-19-14
50
0
48
MP1482DN
1401
02-19-14
50
0
48
MP2305DS
1352
01-29-14
50
0
48
MP24830HS
1350
01-29-14
50
0
48
CM500GS
1350
01-29-14
50
0
48
MP1583DN
1401
01-29-14
50
0
48
MP4030AGS
1350
02-19-14
50
0
48
MP6920DN
1402
01-29-14
50
0
48
MP4012DS-C546
1402
02-19-14
50
0
48
MP1482DN
1402
02-19-14
50
0
48
MP1584EN-C461
1352
02-19-14
50
0
48
MP1410ES-C019
1402
02-19-14
50
0
48
MP3394SGS
1352
02-19-14
50
0
48
MP18021HN
1403
02-19-14
50
0
48
The Future of Analog IC Technology®
- 27 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP111DS
1402
02-19-14
50
0
48
MP1482DN
1401
02-19-14
50
0
48
FA NO.
# of hrs
MP2374DS
1402
02-19-14
50
0
48
MP44010HS
1349
02-19-14
50
0
48
MP1482DN
1402
02-19-14
50
0
48
MPQ2249DN
1345
02-19-14
50
0
48
MP200DS
1401
02-19-14
50
0
48
MP4030GS
1351
02-19-14
50
0
48
MP3398AGS
1349
02-19-14
50
0
48
MP1582EN
1403
02-19-14
50
0
48
MP2467DN
1404
02-19-14
50
0
48
MP1482DS-C165
1352
02-19-14
50
0
48
MP1482DN
1402
02-19-14
50
0
48
MP1482DN
1402
02-19-14
50
0
48
MP28313CS
1403
02-19-14
49
0
48
MP1482DN
1402
02-19-14
46
0
48
MP3394SGS
1350
02-26-14
50
0
48
MP1583DN
1402
02-19-14
50
0
48
MP3398AGS
1349
02-19-14
50
0
48
MP1484EN
1352
02-19-14
50
0
48
MP6002DN
1402
02-19-14
50
0
48
MP1482DN
1402
02-26-14
50
0
48
MP1482DN
1402
02-26-14
50
0
48
HFC0300HS
1346
03-05-14
50
0
48
MP4051GS
1404
02-26-14
50
0
48
HFC0300HS
1350
03-12-14
50
0
48
MPQ4558DN
1403
02-26-14
50
0
48
MP1482DN
1404
02-26-14
50
0
48
MP1482DN
1404
02-26-14
50
0
48
MP2307DN
1347
02-26-14
50
0
48
MP1484EN
1403
02-26-14
50
0
48
DAS09
1403
02-26-14
50
0
48
MP1482DN
1404
02-26-14
50
0
48
MPQ4462DN
1403
03-05-14
50
0
48
MP2363DN
1404
02-26-14
50
0
48
MP1584EN
1404
02-26-14
50
0
48
MP9141ES
1404
03-05-14
50
0
48
MP1482DN
1404
02-26-14
50
0
48
MP1482DN
1405
02-26-14
50
0
48
MP6902DS-C530
1404
03-05-14
50
0
48
MP1482DS
1404
02-26-14
50
0
48
MP2305DS
1405
02-26-14
50
0
48
The Future of Analog IC Technology®
- 28 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1584EN
1404
03-05-14
50
0
48
MP3394ES
1401
03-05-14
50
0
48
MP1482DS-C165
1407
03-05-14
50
0
48
MP2303ADN
1401
03-05-14
50
0
48
MP8718EN
1405
03-05-14
50
0
48
MP8709EN
1407
03-05-14
50
0
48
MP1482DN
1407
03-05-14
50
0
48
FA NO.
# of hrs
MP1410ES-C019
1407
03-05-14
50
0
48
MP1482DN
1407
03-05-14
50
0
48
MP020-5GS
1402
03-05-14
50
0
48
DAS09
1403
03-05-14
50
0
48
MP111DS
1352
03-05-14
50
0
48
MPQ2560DN
1402
03-05-14
50
0
48
MP4462DN
1407
03-05-14
50
0
48
MP2565DN
1408
03-12-14
50
0
48
MP6205DN
1405
03-12-14
50
0
48
MP2482DN
1405
03-12-14
50
0
48
MP2495DS
1406
03-12-14
50
0
48
MP1484EN
1406
03-12-14
50
0
48
MP8706EN
1408
03-12-14
50
0
48
MP4030AGS
1408
03-12-14
50
0
48
MP1432DN
1408
03-12-14
50
0
48
MP2482DN
1350
03-12-14
50
0
48
MP9141ES
1408
03-12-14
50
0
48
MP1423DN
1408
03-19-14
50
0
48
MP1484EN-C166
1402
03-19-14
50
0
48
MP2565DN
1409
03-19-14
50
0
48
MP1423DN
1407
03-19-14
50
0
48
MP26123DR
1408
03-19-14
50
0
48
MP1482DN
1410
03-19-14
50
0
48
MP8709EN
1408
03-19-14
50
0
48
MP2249DN
1345
03-19-14
50
0
48
MP44011HS
1409
03-19-14
50
0
48
MP1484EN
1402
03-19-14
50
0
48
MPGC01DN
1405
03-19-14
50
0
48
MP2490DS
1408
03-19-14
50
0
48
MP1593DN-C218
1409
03-19-14
50
0
48
MP1580HS
1410
03-26-14
50
0
48
MP1482DS
1404
03-26-14
50
0
48
MP1484EN-C166
1402
03-26-14
50
0
48
DAS09
1404
03-26-14
50
0
48
MP8708EN
1404
03-26-14
50
0
48
The Future of Analog IC Technology®
- 29 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6902DS
1408
03-26-14
50
0
48
MP200DS
1409
03-26-14
50
0
48
MP1583DN
1410
03-26-14
50
0
48
MP1484EN
1403
03-26-14
50
0
48
MP4560DN
1410
03-26-14
50
0
48
MP6211DN
1409
03-26-14
50
0
48
MP6211DN
1407
03-26-14
50
0
48
FA NO.
# of hrs
MP8709EN
1408
03-26-14
50
0
48
MPQ2249DN
1409
03-26-14
50
0
48
MP2494DN
1408
03-26-14
50
0
48
MP2307DN
1405
03-26-14
50
0
48
MP2303DN
1410
03-26-14
50
0
48
MP3398AGY
1405
03-26-14
50
0
48
MP3398AGY
1403
03-26-14
50
0
48
MP3398AGY
1402
03-26-14
50
0
48
MP3399EY
1350
03-26-14
50
0
48
MP3394SGS
1349
03-26-14
50
0
48
MP3394SGS
1401
03-26-14
50
0
48
MP3398AGY
1403
03-26-14
50
0
48
MP3394SGS
1402
03-26-14
50
0
48
MP3394SGS
1404
03-26-14
50
0
48
Total
0
4.2.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4032-2GS
1341
11-14-13
80
0
MPQ4569GN-AEC1
1329
12-26-13
78
0
MP44010HS
1315
12-31-13
80
0
MP44010HS
1334
12-26-13
80
0
MP4021GS
1339
12-03-13
80
0
MPQ8040GDN
1332
12-20-13
80
0
MPQ8040GDN
1332
12-17-13
80
0
MP45100GN
1346
12-03-13
80
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 30 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.3 MSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
MSOP8
ANST
MSOP8-EP
UCD
MSOP10-EP
ANST
MSOP10
UCD
MSOP10
ANST
MSOP10-EP
ANST
MSOP8
4.3.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1542DK
1202
01-08-14
160
0
Total
FA NO.
0
SAT picture of MSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.3.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3213DH
1344
01-09-14
50
0
100
MP6211DH
1350
01-09-14
50
0
100
MP1542DK
1331
01-09-14
50
0
100
FA NO.
# of
cycle
MP2105DK
1344
01-15-14
50
0
100
MP1411DH
1345
01-15-14
50
0
100
MP2105DK
1331
01-17-14
50
0
100
The Future of Analog IC Technology®
- 31 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1542DK
1352
01-17-14
50
0
100
MP1542DK-C472
1352
01-22-14
50
0
100
FA NO.
# of
cycle
MP1411DH
1401
01-22-14
50
0
100
MP62071DH
1352
01-29-14
50
0
100
MP6211DH
1352
01-29-14
50
0
100
MP2481DH
1352
01-29-14
50
0
100
MP1542DK
1402
02-19-14
50
0
100
MP1412DH
1352
02-19-14
50
0
100
MP62341DH
1403
02-19-14
50
0
100
MP1542DK
1404
02-26-14
50
0
100
MP1542DK-C472
1406
02-26-14
50
0
100
MP20073DH
1407
03-05-14
50
0
100
MP1542DK
1406
03-05-14
50
0
100
MP1411DH
1403
03-05-14
50
0
100
MP2481DH
1405
03-05-14
50
0
100
MP1542DK
1407
03-05-14
50
0
100
MP1542DK-C472
1407
03-12-14
50
0
100
MP1542DK-C472
1407
03-12-14
50
0
100
MP1542DK
1402
03-19-14
50
0
100
MP1542DK-C472
1408
03-19-14
50
0
100
MP1411DH
1408
03-26-14
50
0
100
MP3213DH
1406
03-26-14
50
0
100
MP2481DH
1407
03-26-14
50
0
100
MP1411DH
1408
03-26-14
50
0
100
Total
0
4.3.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1542DK
1202
01-08-14
80
0
168
MP3213DH
1344
01-09-14
50
0
48
MP6211DH
1350
01-09-14
50
0
48
MP1542DK
1331
01-09-14
50
0
48
MP2105DK
1344
01-15-14
50
0
48
MP1411DH
1345
01-15-14
50
0
48
MP2105DK
1331
01-17-14
50
0
48
FA NO.
# of hrs
MP1542DK
1352
01-17-14
50
0
48
MP1542DK-C472
1352
01-22-14
50
0
48
MP1411DH
1401
01-22-14
50
0
48
MP62071DH
1352
01-29-14
50
0
48
The Future of Analog IC Technology®
- 32 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6211DH
1352
01-29-14
50
0
48
MP2481DH
1352
01-29-14
50
0
48
MP1542DK
1402
02-19-14
50
0
48
FA NO.
# of hrs
MP1412DH
1352
02-19-14
50
0
48
MP62341DH
1403
02-19-14
50
0
48
MP1542DK
1404
02-26-14
50
0
48
MP1542DK-C472
1406
02-26-14
50
0
48
MP20073DH
1407
03-05-14
50
0
48
MP1542DK
1406
03-05-14
50
0
48
MP1411DH
1403
03-05-14
50
0
48
MP2481DH
1405
03-05-14
50
0
48
MP1542DK
1407
03-05-14
50
0
48
MP1542DK-C472
1407
03-12-14
50
0
48
MP1542DK-C472
1407
03-12-14
50
0
48
MP1542DK
1402
03-19-14
50
0
48
MP1542DK-C472
1408
03-19-14
50
0
48
MP1411DH
1408
03-26-14
50
0
48
MP3213DH
1406
03-26-14
50
0
48
MP2481DH
1407
03-26-14
50
0
48
MP1411DH
1408
03-26-14
50
0
48
Total
0
4.3.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1542DK
1202
10-09-13
80
0
Total
FA NO.
0
4.4 TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
TSOT23-5
JCET
TSOT23-5
ASNT
TSOT23-6
JCET
TSOT23-6
ASNT
TSOT23-8
JCET
TSOT23-8
The Future of Analog IC Technology®
- 33 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.4.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ
1243
01-27-14
260
0
MP3209DJ
1237
03-06-14
100
0
MP2359DJ
1402
03-06-14
80
0
Total
FA NO.
0
SAT picture of TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.4.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ
1243
01-27-14
90
0
1000
MPQ2013GJ
1335
01-09-14
50
0
100
MP2359DJ
1342
01-09-14
50
0
100
MPQ2451DT
1344
01-15-14
50
0
100
MP3217DJ
1349
01-09-14
50
0
100
MP3209DJ
1349
01-09-14
50
0
100
MP2359DT
1349
01-15-14
50
0
100
MP3204DJ
1347
01-15-14
50
0
100
MP2104DJ
1350
01-15-14
50
0
100
MP1518DJ
1352
01-15-14
50
0
100
MP3217DJ
1351
01-22-14
50
0
100
MP62551DJ
1350
01-22-14
50
0
100
MP3217DJ
1351
01-22-14
50
0
100
MP6400DJ-01
1352
01-17-14
50
0
100
MP3217DJ
1351
01-22-14
50
0
100
FA NO.
The Future of Analog IC Technology®
- 34 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2357DT
1401
01-23-14
50
0
100
MP62055EJ
1349
01-23-14
50
0
100
FA NO.
# of
cycle
MP2359DJ
1336
01-23-14
50
0
100
MP6400DJ-01
1351
01-29-14
50
0
100
MP2259DJ
1349
01-29-14
50
0
100
MP3217DJ
1349
02-19-14
50
0
100
MP2456GJ
1322
01-29-14
50
0
100
MP2105DJ
1402
02-19-14
50
0
100
MP3216DJ
1401
02-19-14
50
0
100
MP2459GJ
1351
02-19-14
50
0
100
MP1469GJ
1403
02-19-14
50
0
100
MP2451DT
1402
02-19-14
50
0
100
MP62055EJ
1351
02-26-14
50
0
100
MP6400DJ-01
1402
02-26-14
50
0
100
MP8801DJ-2.85
1404
02-26-14
50
0
100
MP3205DJ
1405
02-26-14
50
0
100
MPQ9361DJ
1339
03-05-14
50
0
100
MP2451DT
1402
02-26-14
50
0
100
MP6400DJ-33
1407
03-05-14
50
0
100
MPQ2451DT
1404
03-05-14
50
0
100
MP6400DJ-01
1404
03-05-14
50
0
100
MP2370DJ
1352
03-05-14
50
0
100
MP62551DJ
1401
03-12-14
50
0
100
MP1540DJ
1404
03-12-14
50
0
100
MP6400DJ-01
1405
03-12-14
50
0
100
MP65151DJ
1407
03-12-14
50
0
100
MP62551DJ
1408
03-12-14
50
0
100
MP2451DT
1404
03-12-14
50
0
100
MP1540DJ
1405
03-19-14
50
0
100
MP3217DJ
1408
03-19-14
50
0
100
MP3120DJ
1408
03-19-14
50
0
100
MP3217DJ
1408
03-19-14
50
0
100
MP2357DJ
1405
03-19-14
50
0
100
MP62055EJ
1408
03-19-14
50
0
100
MP2105DJ
1409
03-19-14
50
0
100
MP65150DJ
1401
03-19-14
50
0
100
MP1469GJ
1410
03-26-14
50
0
100
MP65151DJ
1410
03-26-14
50
0
100
MP2451DT
1404
03-26-14
50
0
100
MP2103DJ
1221
03-26-14
50
0
100
MP2451DT
1406
03-26-14
50
0
100
Total
0
The Future of Analog IC Technology®
- 35 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.4.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ
1243
01-27-14
90
0
168
FA NO.
# of hrs
MP2359DJ
1402
03-06-14
80
0
168
MPQ2013GJ
1335
01-09-14
50
0
48
MP2359DJ
1342
01-09-14
50
0
48
MPQ2451DT
1344
01-15-14
50
0
48
MP3217DJ
1349
01-09-14
50
0
48
MP3209DJ
1349
01-09-14
50
0
48
MP2359DT
1349
01-15-14
50
0
48
MP3204DJ
1347
01-15-14
50
0
48
MP2104DJ
1350
01-15-14
50
0
48
MP3204DJ
1350
01-15-14
50
0
48
MP1518DJ
1352
01-15-14
50
0
48
MP3217DJ
1351
01-22-14
50
0
48
MP62551DJ
1350
01-22-14
50
0
48
MP3217DJ
1351
01-22-14
50
0
48
MP6400DJ-01
1352
01-17-14
50
0
48
MP3217DJ
1351
01-22-14
50
0
48
MP2357DT
1401
01-23-14
50
0
48
MP62055EJ
1349
01-23-14
50
0
48
MP2359DJ
1336
01-23-14
50
0
48
MP6400DJ-01
1351
01-29-14
50
0
48
MP2259DJ
1349
01-29-14
50
0
48
MP3217DJ
1349
02-19-14
50
0
48
MP2456GJ
1322
01-29-14
50
0
48
MP2105DJ
1402
02-19-14
50
0
48
MP3216DJ
1401
02-19-14
50
0
48
MP2459GJ
1351
02-19-14
50
0
48
MP1469GJ
1403
02-19-14
50
0
48
MP2451DT
1402
02-19-14
50
0
48
MP62055EJ
1351
02-26-14
50
0
48
MP6400DJ-01
1402
02-26-14
50
0
48
MP8801DJ-2.85
1404
02-26-14
50
0
48
MP3205DJ
1405
02-26-14
50
0
48
MPQ9361DJ
1339
03-05-14
50
0
48
MP2451DT
1402
02-26-14
50
0
48
MP6400DJ-33
1407
03-05-14
50
0
48
MPQ2451DT
1404
03-05-14
50
0
48
MP6400DJ-01
1404
03-05-14
50
0
48
MP2370DJ
1352
03-05-14
50
0
48
The Future of Analog IC Technology®
- 36 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP62551DJ
1401
03-12-14
50
0
48
MP1540DJ
1404
03-12-14
50
0
48
MP6400DJ-01
1405
03-12-14
50
0
48
MP65151DJ
1407
03-12-14
50
0
48
MP62551DJ
1408
03-12-14
50
0
48
MP2451DT
1404
03-12-14
50
0
48
MP1540DJ
1405
03-19-14
50
0
48
MP3217DJ
1408
03-19-14
50
0
48
MP3120DJ
1408
03-19-14
50
0
48
MP3217DJ
1408
03-19-14
50
0
48
MP2357DJ
1405
03-19-14
50
0
48
MP62055EJ
1408
03-19-14
50
0
48
MP2105DJ
1409
03-19-14
50
0
48
MP65150DJ
1401
03-19-14
50
0
48
MP1469GJ
1410
03-26-14
50
0
48
MP65151DJ
1410
03-26-14
50
0
48
FA NO.
# of hrs
MP2451DT
1404
03-26-14
50
0
48
MP2103DJ
1221
03-26-14
50
0
48
MP2451DT
1406
03-26-14
50
0
48
MP6400DJ-01
1410
03-26-14
50
0
48
Total
0
4.4.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ2459GJ
1243
01-27-14
80
0
MP3209DJ
1237
03-06-14
80
0
Total
FA NO.
0
4.5 TSSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
TSSOP20
ASNT
TSSOP16-EP
UCD
TSSOP20-EP
ASNT
TSSOP20
ASNT
TSSOP8
ASNT
TSSOP20-EP
ASNT
TSSOP14
ASNT
TSSOP24
ASNT
TSSOP16
ASNT
TSSOP28
ASNT
TSSOP28-EP
JCET
TSSOP8
The Future of Analog IC Technology®
- 37 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.5.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3373GM
1329
02-21-14
300
0
MP3399EF
1330
01-27-14
165
0
MPQ7731DF
1310
03-06-14
100
0
MPQ4570GF
1344
03-11-14
250
0
Total
FA NO.
0
SAT picture of TSSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.5.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3373GM
1329
02-21-14
94
0
FA NO.
# of
cycle
1000
MP3399EF
1330
01-27-14
82
0
1000
MPQ4570GF
1344
03-11-14
79
0
1000
MP2364DF
1351
01-09-14
50
0
100
MP3394EF
1351
01-15-14
50
0
100
MP3394EF
1351
01-15-14
50
0
100
MP7782DF
1350
01-15-14
50
0
100
MP8126DF
1401
01-29-14
50
0
100
MP8125EF
1352
01-22-14
50
0
100
MP8126DF
1401
01-29-14
50
0
100
MP3394SGF
1351
02-19-14
50
0
100
MP3391EF
1351
02-19-14
50
0
100
The Future of Analog IC Technology®
- 38 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8126DF
1401
02-19-14
50
0
100
MP8126DF
1402
02-26-14
50
0
100
MP6507GF
1402
03-05-14
50
0
100
MP8125EF
1404
03-05-14
50
0
100
MP8125EF
1405
03-05-14
50
0
100
FA NO.
# of
cycle
MP6507GF
1402
03-05-14
50
0
100
MP1530DM
1351
03-12-14
50
0
100
MP6505DM
1402
03-12-14
50
0
100
MP8125EF
1407
03-26-14
50
0
100
MP6507GF
1406
03-19-14
50
0
100
MP6507AGF
1335
03-26-14
50
0
100
MP6507GF
1402
03-26-14
50
0
100
MP6507GF
1408
03-26-14
50
0
100
Total
0
4.5.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3373GM
1329
02-21-14
97
0
168
FA NO.
# of hrs
MP3399EF
1330
01-27-14
77
0
168
MPQ4570GF
1344
03-11-14
77
0
168
MP2364DF
1351
01-09-14
50
0
48
MP3394EF
1351
01-15-14
50
0
48
MP3394EF
1351
01-15-14
50
0
48
MP7782DF
1350
01-15-14
50
0
48
MP8126DF
1401
01-29-14
50
0
48
MP8125EF
1352
01-22-14
50
0
48
MP8126DF
1401
01-29-14
50
0
48
MP3394SGF
1351
02-19-14
50
0
48
MP3391EF
1351
02-19-14
50
0
48
MP8126DF
1401
02-19-14
50
0
48
MP8126DF
1402
02-26-14
50
0
48
MP6507GF
1402
03-05-14
50
0
48
MP8125EF
1404
03-05-14
50
0
48
MP8125EF
1405
03-05-14
50
0
48
MP6507GF
1402
03-05-14
50
0
48
MP1530DM
1351
03-12-14
50
0
48
MP6505DM
1402
03-12-14
50
0
48
MP8125EF
1407
03-26-14
50
0
48
MP6507GF
1406
03-19-14
50
0
48
The Future of Analog IC Technology®
- 39 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6507AGF
1335
03-26-14
50
0
48
MP6507GF
1402
03-26-14
50
0
48
MP6507GF
1408
03-26-14
50
0
48
Total
FA NO.
# of hrs
0
4.5.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ7731DF
1310
03-06-14
78
0
MPQ4570GF
1344
03-11-14
78
0
Total
FA NO.
0
4.6 FLIP CHIP-QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
FCQFN1*1.5
UTAC
FCQFN2*2
UCD
FCQFN1.5*2
UTAC
FCQFN2*3
UCD
FCQFN2*2
UTAC
FCQFN3*3
UCD
FCQFN2*3
UTAC
FCQFN3*4
UCD
FCQFN3*3
UTAC
FCQFN4*4
UCD
FCQFN3*4
UTAC
FCQFN4*5
UCD
FCQFN3*5
UTAC
FCQFN4*6
UCD
FCQFN4*4
UTAC
FCQFN5*5
UCD
FCQFN4*5
UTAC
FCQFN5*6
UCD
FCQFN4*6
UTAC
FCQFN6*6
4.6.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3830GQV
1341
01-21-14
400
0
MP5018GD
1341
01-22-14
400
0
MPQ8632GL-10
1326
01-21-14
300
0
MP2145GD
1332
01-13-14
97
0
MPM3830GQV
1333
01-21-14
400
0
MP2145GD
1332
01-13-14
402
0
MPM3805GQB-33
1334
01-16-14
300
0
FA NO.
The Future of Analog IC Technology®
- 40 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3805GQB-25
1337
01-16-14
300
0
MPM3830GQV
1333
01-21-14
110
0
MP2615GQ
1336
01-08-14
400
0
MPM3810GQB
1334
01-23-14
50
0
MPM3805GQB
1341
01-23-14
50
0
MP1499GD
1335
02-13-14
100
0
MPQ8636HGV-20
1343
01-27-14
200
0
MPM3820GQV
1347
02-21-14
270
0
MP2316DG
1338
12-05-13
100
0
MP28251GD
1339
12-05-13
173
0
MP28251GD
1339
12-05-13
200
0
Total
FA NO.
0
SAT picture of FLIP CHIP-QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.6.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of
cycle
MPM3830GQV
1341
01-21-14
94
0
1000
MPQ8632GL-10
1326
01-21-14
94
0
1000
MP2145GD
1332
01-13-14
97
0
1000
MPM3830GQV
1333
01-21-14
94
0
1000
MP2145GD
1332
01-13-14
94
0
1000
MPM3805GQB-33
1334
01-16-14
94
0
1000
MPM3805GQB-25
1337
01-16-14
94
0
1000
MP2615GQ
1336
01-08-14
94
0
1000
MPM3810GQB
1334
01-23-14
47
0
1000
The Future of Analog IC Technology®
- 41 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3805GQB
1341
01-23-14
46
0
1000
MPQ8636HGV-20
1343
01-27-14
91
0
1000
MPM3820GQV
1347
02-21-14
79
0
1000
MP5505GL
1329
03-26-14
50
0
100
FA NO.
# of
cycle
MP5505GL
1335
03-12-14
50
0
100
NB671GQ
1339
01-09-14
50
0
100
NB671LGQ
1339
01-09-14
50
0
100
NB671GQ
1342
01-23-14
50
0
100
NB671GQ
1339
01-17-14
50
0
100
NB671GQ
1342
01-15-14
50
0
100
NB671GQ
1342
01-21-14
50
0
100
MPM3805GQB
1347
01-29-14
50
0
100
NB671GQ
1345
01-21-14
50
0
100
MPM3810GQB
1347
01-17-14
50
0
100
MP28251GD
1345
01-17-14
50
0
100
NB671GQ
1346
01-21-14
50
0
100
NB671GQ
1346
01-21-14
50
0
100
NB671LGQ
1341
01-29-14
50
0
100
NB671GQ
1346
01-21-14
50
0
100
NB650AGL
1344
01-16-14
50
0
100
NB671GQ
1349
01-21-14
50
0
100
NB671GQ
1345
01-21-14
50
0
100
NB671LGQ
1349
03-12-14
50
0
100
MP9180DG
1351
01-09-14
50
0
100
MP8760GL
1349
01-09-14
50
0
100
MP28251GD
1351
01-23-14
50
0
100
MP9180DG
1351
01-09-14
50
0
100
MP86885GQWT
1329
01-09-14
50
0
100
MP2158GQH
1351
01-09-14
50
0
100
NB650AGL
1351
01-16-14
50
0
100
NB650AGL
1351
01-16-14
50
0
100
MP28258DD-C471
1351
01-09-14
50
0
100
MP8736DL
1352
01-09-14
50
0
100
NB671LGQ
1349
03-12-14
50
0
100
MPQ8636GVE-20
1349
01-09-14
50
0
100
MPQ8636HGL-10
1350
01-09-14
50
0
100
NB671GQ
1347
01-09-14
50
0
100
MP2130DG
1350
01-09-14
50
0
100
NB671GQ
1349
01-09-14
50
0
100
MPQ8632GV-20
1344
01-09-14
50
0
100
MPQ8632GLE-12
1348
01-15-14
50
0
100
NB671GQ
1352
01-21-14
50
0
100
The Future of Analog IC Technology®
- 42 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8632GL-6
1351
01-15-14
50
0
FA NO.
# of
cycle
100
MP28258DD-C471
1352
01-15-14
50
0
100
NB671GQ
1401
01-17-14
50
0
100
NB671GQ
1401
01-17-14
50
0
100
MP8620DQK
1349
01-15-14
50
0
100
MP28251GD
1352
01-15-14
50
0
100
MPQ8632GL-12
1352
01-23-14
50
0
100
MP86884DOKT
1351
01-15-14
50
0
100
MP28251GD
1349
01-15-14
50
0
100
MP9180DG
1351
01-15-14
50
0
100
NB671GQ
1401
01-15-14
50
0
100
MPQ8632GL-12
1351
01-17-14
50
0
100
MPQ8632GL-6
1351
01-17-14
50
0
100
MPM3810GQB
1351
03-05-14
50
0
100
MPQ8632GVE-15
1351
01-17-14
50
0
100
NB671GQ
1351
01-17-14
50
0
100
MP28251GD
1351
01-17-14
50
0
100
MP28251GD
1351
02-19-14
50
0
100
MP8762GL
1352
01-17-14
50
0
100
MPM3805GQB
1352
03-05-14
50
0
100
MPQ8632GL-10
1352
01-17-14
50
0
100
NB671AGQ
1402
01-22-14
50
0
100
NB671GQ
1347
01-17-14
50
0
100
NB671GQ
1351
01-17-14
50
0
100
MP28251GD
1349
01-22-14
50
0
100
NB671GQ
1351
01-23-14
50
0
100
MP28251GD
1352
01-22-14
50
0
100
NB671GQ
1401
01-22-14
50
0
100
MP28251GD
1350
01-22-14
50
0
100
MP2130DG-C423
1312
01-22-14
50
0
100
MP28258DD
1352
01-22-14
50
0
100
MP8736DL
1401
01-22-14
50
0
100
NB671GQ
1401
01-22-14
50
0
100
NB670GQ
1322
01-22-14
50
0
100
MPQ8632GL-10
1401
01-22-14
50
0
100
NB671GQ
1349
01-23-14
50
0
100
NB671GQ
1401
01-23-14
50
0
100
MPQ8632GL-10
1352
01-23-14
50
0
100
MP28258DD
1349
01-23-14
50
0
100
MP9447GL
1403
01-29-14
50
0
100
MP28251GD
1352
01-29-14
50
0
100
MP28259DD
1352
01-29-14
50
0
100
The Future of Analog IC Technology®
- 43 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
Close
Date
PRODUCT RELIABILITY REPORT
Sample
Size
# of
Fail
FA NO.
# of
cycle
MP8760GLE
1401
01-29-14
50
0
100
MP28251GD
1352
01-29-14
50
0
100
MPQ8632DGLE-6
1344
01-29-14
50
0
100
MP8620DQK
1352
01-29-14
50
0
100
NB671LGQ
1350
01-29-14
50
0
100
MP8761GLE
1335
02-26-14
50
0
100
MPQ8632GVE-20
1401
02-19-14
50
0
100
MP8620DQK
1352
02-19-14
50
0
100
MPQ8632GL-8
1346
02-19-14
50
0
100
MP8620DQK
1352
02-19-14
50
0
100
MP28251GD
1403
02-26-14
50
0
100
MPQ8632GL-12
1402
02-19-14
50
0
100
NB671LGQ
1349
03-26-14
50
0
100
MP28251GD
1402
02-19-14
50
0
100
MP8606DL
1402
02-19-14
50
0
100
NB671GQ
1401
02-19-14
50
0
100
MPQ8632GVE-20
1401
02-19-14
50
0
100
NB671GQ
1402
02-19-14
50
0
100
NB650GL
1403
02-19-14
50
0
100
NB670GQ
1322
02-19-14
50
0
100
MP2308GD
1404
02-19-14
50
0
100
MP2162GQH
1402
02-19-14
50
0
100
MPQ8636GVE-20
1401
02-19-14
50
0
100
MP8760GL
1404
02-19-14
50
0
100
MP28251GD
1404
02-19-14
50
0
100
MP2162GQH
1401
02-19-14
50
0
100
MP28251GD
1352
02-19-14
50
0
100
MP28258DD
1401
02-19-14
50
0
100
NB650HGL
1352
02-19-14
50
0
100
MP28251GD
1403
02-19-14
50
0
100
NB671LGQ
1351
03-26-14
50
0
100
NB671GQ
1402
02-19-14
50
0
100
MP9151GD
1404
02-19-14
50
0
100
MP38876DL
1404
02-26-14
50
0
100
MP2140DD
1404
02-26-14
50
0
100
MP2139DD-C563
1329
02-26-14
50
0
100
MP28258DD-C471
1403
02-26-14
50
0
100
MP86884DOKT
1403
02-26-14
50
0
100
MP2162GQH
1403
02-26-14
50
0
100
NB671GQ
1351
02-26-14
50
0
100
MP86884DOKT
1403
02-26-14
50
0
100
NB671AGQ
1403
02-26-14
50
0
100
The Future of Analog IC Technology®
- 44 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1404
03-05-14
50
0
100
MP8620DQK
1406
03-05-14
50
0
100
FA NO.
# of
cycle
MPQ8636GL-10
1405
03-05-14
50
0
100
MPQ8632GVE-15
1344
02-26-14
50
0
100
NB670GQ
1322
03-05-14
50
0
100
NB670GQ
1323
03-05-14
50
0
100
MP28258DD-C471
1403
03-05-14
50
0
100
MPM3805GQB-12
1405
03-05-14
50
0
100
MPQ8632GL-6
1401
03-05-14
50
0
100
MP2139DD-C563
1329
03-05-14
50
0
100
MP28251GD
1408
03-05-14
50
0
100
NB670GQ
1323
03-05-14
50
0
100
MP28251GD
1404
03-05-14
50
0
100
NB650AGL
1409
03-12-14
50
0
100
NB650AGL
1408
03-12-14
50
0
100
MPQ8636GL-10
1404
03-12-14
50
0
100
NB670GQ
1404
03-12-14
50
0
100
MPQ8636GLE-10
1408
03-12-14
50
0
100
MPQ8632GL-10
1404
03-12-14
50
0
100
MPQ8636GL-10
1408
03-12-14
50
0
100
MPQ8616GL-6
1351
03-19-14
50
0
100
MPQ8636GL-10
1408
03-12-14
50
0
100
MP2140DD
1404
03-12-14
50
0
100
NB671AGQ
1404
03-19-14
50
0
100
MP38875DL
1409
03-19-14
50
0
100
MPQ8616GL-12
1408
03-19-14
50
0
100
NB650AGL
1409
03-19-14
50
0
100
NB650AGL
1409
03-19-14
50
0
100
MPQ4470AGL-AEC1 1409
03-19-14
50
0
100
03-19-14
50
0
100
MPQ8632GLE-10
1346
MPQ4470GL
1404
03-19-14
50
0
100
MP28251GD
1408
03-19-14
50
0
100
MPQ8632GL-4
1403
03-19-14
50
0
100
MP8620DQK
1408
03-19-14
50
0
100
MP5018GD
1410
03-26-14
50
0
100
NB671LAGQ
1408
03-26-14
50
0
100
MPQ8632DGLE12-12 1344
03-26-14
50
0
100
NB670GQ
1404
03-26-14
50
0
100
MP2158GQH
1409
03-26-14
50
0
100
MP9180DG
1409
03-26-14
50
0
100
MP28258DD-C471
1410
03-26-14
50
0
100
MPQ8636GLE-10
1408
03-26-14
50
0
100
The Future of Analog IC Technology®
- 45 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1408
03-26-14
50
0
100
MP28251GD
1409
03-26-14
50
0
100
FA NO.
# of
cycle
NB670GQ
1329
03-26-14
50
0
100
MP28258DD-C471
1410
03-26-14
50
0
100
MPQ4470GL-AEC1
1409
03-26-14
50
0
100
MP2162GQH
1409
03-26-14
50
0
100
Total
0
4.6.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3830GQV
1341
01-21-14
97
0
168
MP5018GD
1341
01-22-14
97
0
168
MPQ8632GL-10
1326
01-21-14
97
0
168
MPM3830GQV
1333
01-21-14
97
0
168
MP2145GD
1332
01-13-14
97
0
168
MPM3805GQB-33
1334
01-16-14
97
0
168
FA NO.
# of hrs
MPM3805GQB-25
1337
01-16-14
97
0
168
MP2615GQ
1336
01-08-14
97
0
168
MPM3810GQB
1334
01-23-14
47
0
168
MPM3805GQB
1341
01-23-14
47
0
168
MPQ8636HGV-20
1343
01-27-14
97
0
168
MPM3820GQV
1347
02-21-14
77
0
168
MP5505GL
1329
03-26-14
50
0
48
MP5505GL
1335
03-12-14
50
0
48
NB671GQ
1339
01-09-14
50
0
48
NB671LGQ
1339
01-09-14
50
0
48
NB671GQ
1342
01-23-14
50
0
48
NB671GQ
1339
01-17-14
50
0
48
NB671GQ
1342
01-15-14
50
0
48
NB671GQ
1342
01-21-14
50
0
48
MPM3805GQB
1347
01-29-14
50
0
48
NB671GQ
1345
01-21-14
50
0
48
MPM3810GQB
1347
01-17-14
50
0
48
MP28251GD
1345
01-17-14
50
0
168
NB671GQ
1346
01-21-14
50
0
168
NB671GQ
1346
01-21-14
50
0
168
NB671LGQ
1341
01-29-14
50
0
168
NB671GQ
1346
01-21-14
50
0
168
NB650AGL
1344
01-16-14
50
0
168
The Future of Analog IC Technology®
- 46 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB671GQ
1349
01-21-14
50
0
168
NB671GQ
1345
01-21-14
50
0
168
FA NO.
# of hrs
NB671LGQ
1349
03-12-14
50
0
168
MP9180DG
1351
01-09-14
50
0
168
MP8760GL
1349
01-09-14
50
0
168
MP28251GD
1351
01-23-14
50
0
168
MP9180DG
1351
01-09-14
50
0
168
MP86885GQWT
1329
01-09-14
50
0
168
MP2158GQH
1351
01-09-14
50
0
168
NB650AGL
1351
01-16-14
50
0
168
NB650AGL
1351
01-16-14
50
0
168
MP28258DD-C471
1351
01-09-14
50
0
168
MP8736DL
1352
01-09-14
50
0
168
NB671LGQ
1349
03-12-14
50
0
168
MPQ8636GVE-20
1349
01-09-14
50
0
168
MPQ8636HGL-10
1350
01-09-14
50
0
168
NB671GQ
1347
01-09-14
50
0
168
MP2130DG
1350
01-09-14
50
0
168
NB671GQ
1349
01-09-14
50
0
168
MPQ8632GV-20
1344
01-09-14
50
0
168
MPQ8632GLE-12
1348
01-15-14
50
0
168
NB671GQ
1352
01-21-14
50
0
168
MPQ8632GL-6
1351
01-15-14
50
0
168
MP28258DD-C471
1352
01-15-14
50
0
168
NB671GQ
1401
01-17-14
49
0
48
NB671GQ
1401
01-17-14
50
0
48
MP8620DQK
1349
01-15-14
50
0
48
MP28251GD
1352
01-15-14
50
0
48
MPQ8632GL-12
1352
01-23-14
50
0
48
MP86884DOKT
1351
01-15-14
50
0
48
MP28251GD
1349
01-15-14
50
0
48
MP9180DG
1351
01-15-14
50
0
48
NB671GQ
1401
01-15-14
50
0
48
MPQ8632GL-12
1351
01-17-14
50
0
48
MPQ8632GL-6
1351
01-17-14
50
0
48
MPM3810GQB
1351
03-05-14
50
0
48
MPQ8632GVE-15
1351
01-17-14
50
0
48
NB671GQ
1351
01-17-14
50
0
48
MP28251GD
1351
01-17-14
50
0
48
MP28251GD
1351
02-19-14
50
0
48
MP8762GL
1352
01-17-14
50
0
48
MPM3805GQB
1352
03-05-14
50
0
48
The Future of Analog IC Technology®
- 47 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
FA NO.
# of hrs
MPQ8632GL-10
1352
01-17-14
50
0
48
NB671AGQ
1402
01-22-14
50
0
48
NB671GQ
1347
01-17-14
50
0
48
NB671GQ
1351
01-17-14
50
0
48
MP28251GD
1349
01-22-14
50
0
48
NB671GQ
1351
01-23-14
50
0
48
MP28251GD
1352
01-22-14
50
0
48
NB671GQ
1401
01-22-14
50
0
48
MP28251GD
1350
01-22-14
50
0
48
MP2130DG-C423
1312
01-22-14
50
0
48
MP28258DD
1352
01-22-14
50
0
48
MP8736DL
1401
01-22-14
50
0
48
NB671GQ
1401
01-22-14
50
0
48
NB670GQ
1322
01-22-14
50
0
48
MPQ8632GL-10
1401
01-22-14
50
0
48
NB671GQ
1349
01-23-14
50
0
48
NB671GQ
1401
01-23-14
50
0
48
MPQ8632GL-10
1352
01-23-14
50
0
48
MP28258DD
1349
01-23-14
50
0
48
MP9447GL
1403
01-29-14
50
0
48
MP28251GD
1352
01-29-14
50
0
48
MP28259DD
1352
01-29-14
50
0
48
MP8760GLE
1401
01-29-14
50
0
48
MP28251GD
1352
01-29-14
50
0
48
MPQ8632DGLE-6
1344
01-29-14
50
0
48
MP8620DQK
1352
01-29-14
50
0
48
NB671LGQ
1350
01-29-14
50
0
48
MP8761GLE
1335
02-26-14
50
0
48
MPQ8632GVE-20
1401
02-19-14
50
0
48
MP8620DQK
1352
02-19-14
50
0
48
MPQ8632GL-8
1346
02-19-14
50
0
48
MP8620DQK
1352
02-19-14
50
0
48
MP28251GD
1403
02-26-14
50
0
48
MPQ8632GL-12
1402
02-19-14
50
0
48
NB671LGQ
1349
03-26-14
50
0
48
MP28251GD
1402
02-19-14
50
0
48
MP8606DL
1402
02-19-14
50
0
48
NB671GQ
1401
02-19-14
50
0
48
MPQ8632GVE-20
1401
02-19-14
50
0
48
NB671GQ
1402
02-19-14
50
0
48
NB650GL
1403
02-19-14
50
0
48
NB670GQ
1322
02-19-14
50
0
48
The Future of Analog IC Technology®
- 48 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of hrs
MP2308GD
1404
02-19-14
50
0
48
MP2162GQH
1402
02-19-14
50
0
48
MPQ8636GVE-20
1401
02-19-14
50
0
48
MP8760GL
1404
02-19-14
50
0
48
MP28251GD
1404
02-19-14
50
0
48
MP2162GQH
1401
02-19-14
50
0
48
MP28251GD
1352
02-19-14
50
0
48
MP28258DD
1401
02-19-14
50
0
48
NB650HGL
1352
02-19-14
50
0
48
MP28251GD
1403
02-19-14
50
0
48
NB671LGQ
1351
03-26-14
50
0
48
NB671GQ
1402
02-19-14
50
0
48
MP9151GD
1404
02-19-14
50
0
48
MP38876DL
1404
02-26-14
50
0
48
MP2140DD
1404
02-26-14
50
0
48
MP2139DD-C563
1329
02-26-14
50
0
48
MP28258DD-C471
1403
02-26-14
50
0
48
MP86884DOKT
1403
02-26-14
50
0
48
MP2162GQH
1403
02-26-14
50
0
48
NB671GQ
1351
02-26-14
50
0
48
MP86884DOKT
1403
02-26-14
50
0
48
NB671AGQ
1403
02-26-14
50
0
48
MP2130DG
1404
03-05-14
50
0
48
MP8620DQK
1406
03-05-14
50
0
48
MPQ8636GL-10
1405
03-05-14
50
0
48
MPQ8632GVE-15
1344
02-26-14
50
0
48
NB670GQ
1322
03-05-14
50
0
48
NB670GQ
1323
03-05-14
50
0
48
MP28258DD-C471
1403
03-05-14
50
0
48
MPM3805GQB-12
1405
03-05-14
50
0
48
MPQ8632GL-6
1401
03-05-14
50
0
48
MP2139DD-C563
1329
03-05-14
50
0
48
MP28251GD
1408
03-05-14
50
0
48
NB670GQ
1323
03-05-14
50
0
48
MP28251GD
1404
03-05-14
50
0
48
NB650AGL
1409
03-12-14
50
0
48
NB650AGL
1408
03-12-14
50
0
48
MPQ8636GL-10
1404
03-12-14
50
0
48
NB670GQ
1404
03-12-14
50
0
48
MPQ8636GLE-10
1408
03-12-14
50
0
48
MPQ8632GL-10
1404
03-12-14
50
0
48
MPQ8636GL-10
1408
03-12-14
50
0
48
The Future of Analog IC Technology®
- 49 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8616GL-6
1351
03-19-14
50
0
FA NO.
# of hrs
48
MPQ8636GL-10
1408
03-12-14
50
0
48
MP2140DD
1404
03-12-14
50
0
48
NB671AGQ
1404
03-19-14
50
0
48
MP38875DL
1409
03-19-14
50
0
48
MPQ8616GL-12
1408
03-19-14
50
0
48
NB650AGL
1409
03-19-14
50
0
48
NB650AGL
1409
03-19-14
50
0
48
MPQ4470AGL-AEC1 1409
03-19-14
50
0
48
MPQ8632GLE-10
1346
03-19-14
50
0
48
MPQ4470GL
1404
03-19-14
50
0
48
MP28251GD
1408
03-19-14
50
0
48
MPQ8632GL-4
1403
03-19-14
50
0
48
MP8620DQK
1408
03-19-14
50
0
48
MP5018GD
1410
03-26-14
50
0
48
NB671LAGQ
1408
03-26-14
50
0
48
MPQ8632DGLE12-12 1344
03-26-14
50
0
48
50
0
48
NB670GQ
1404
03-26-14
MP2158GQH
1409
03-26-14
50
0
48
MP9180DG
1409
03-26-14
50
0
48
MP28258DD-C471
1410
03-26-14
50
0
48
MPQ8636GLE-10
1408
03-26-14
50
0
48
MP2130DG
1408
03-26-14
50
0
48
MP28251GD
1409
03-26-14
50
0
48
NB670GQ
1329
03-26-14
50
0
48
MP28258DD-C471
1410
03-26-14
50
0
48
MPQ4470GL-AEC1
1409
03-26-14
50
0
48
MP2162GQH
1409
03-26-14
50
0
48
Total
0
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3830GQV
1341
01-21-14
90
0
MP5018GD
1341
01-22-14
100
0
MPQ8632GL-10
1326
01-21-14
90
0
MPM3830GQV
1333
01-21-14
90
0
MP2145GD
1332
01-13-14
90
0
MPM3805GQB-33
1334
01-16-14
102
0
MPM3830GQV
1333
01-21-14
90
0
FA NO.
The Future of Analog IC Technology®
- 50 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2615GQ
1336
01-08-14
80
0
MPM3810GQB
1334
01-23-14
50
0
MPM3805GQB
1341
01-23-14
50
0
MPM3820GQV
1347
02-21-14
81
0
MP5505GL
1329
03-26-14
50
0
MP5505GL
1335
03-12-14
50
0
NB671GQ
1339
01-09-14
50
0
NB671LGQ
1339
01-09-14
50
0
NB671GQ
1342
01-23-14
50
0
NB671GQ
1339
01-17-14
50
0
NB671GQ
1342
01-15-14
50
0
MPM3805GQB
1347
01-29-14
50
0
MPM3810GQB
1347
01-17-14
50
0
MP28251GD
1345
01-17-14
50
0
NB671LGQ
1341
01-29-14
50
0
NB671LGQ
1349
03-12-14
50
0
MP28251GD
1351
01-23-14
50
0
NB671LGQ
1349
03-12-14
50
0
MPM3810GQB
1351
03-05-14
50
0
MP28251GD
1351
02-19-14
50
0
MPM3805GQB
1352
03-05-14
50
0
MP28251GD
1403
02-26-14
50
0
NB671LGQ
1349
03-26-14
50
0
NB671LGQ
1351
03-26-14
50
0
MPM3805GQB-12
1405
03-05-14
50
0
Total
FA NO.
0
4.7 FLIP CHIP-SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE PACKAGE
ASSY SITE
PACKAGE
UCD
ANST
FCSOIC8
FCSOIC8
JCET
FCSOIC8
ANST
FCSOIC16
4.7.1 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1251
01-09-14
50
0
FA NO.
# of
cycle
100
The Future of Analog IC Technology®
- 51 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DS
1329
12-31-13
50
0
100
MP1493DS
1349
01-17-14
50
0
100
MP1492DS
1351
01-22-14
50
0
100
MP28258DS
1401
01-29-14
50
0
100
MP1493DS
1402
02-19-14
50
0
100
MP1492DS
1404
02-26-14
50
0
100
MP28258DS
1408
03-12-14
50
0
100
MP1493DS
1408
03-19-14
50
0
100
MP1493DS
1407
03-26-14
50
0
100
Total
FA NO.
# of
cycle
0
4.7.2 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DS
1329
12-31-13
50
0
48
MP1493DS
1349
01-17-14
50
0
48
MP1492DS
1351
01-22-14
50
0
48
MP28258DS
1401
01-29-14
50
0
48
MP1493DS
1402
02-19-14
50
0
48
MP1492DS
1404
02-26-14
50
0
48
MP28258DS
1408
03-12-14
50
0
48
MP1493DS
1408
03-19-14
50
0
48
MP1493DS
1407
03-26-14
50
0
48
Total
FA NO.
# of
hrs
0
4.8 FLIP CHIP-TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
FCTSOT-5
JCET
FCTSOT-6
ANST
FCTSOT-6
JCET
FCTSOT-8
ANST
FCTSOT-8
4.8.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4026GJ
1338
01-13-14
100
0
MP4027GJ
1337
01-13-14
100
0
FA NO.
The Future of Analog IC Technology®
- 52 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4027GJ
1337
01-13-14
200
0
MP2318GJ
1342
01-10-14
85
0
MP4026GJ
1351
02-25-14
85
0
MP4026GJ
1351
02-25-14
88
0
MPQ4420GJ
1323
02-21-14
400
0
MP150GJ
1311
02-25-14
200
0
MP2225GJ
1344
02-13-14
396
0
MP1494DJ
1349
02-11-14
245
0
MP4026GJ
1351
02-25-14
89
0
MP1494DJ
1351
02-21-14
170
0
MP1494DJ
1351
02-21-14
170
0
MP4027GJ
1330
03-13-14
260
0
MP4027GJ
1329
03-13-14
260
0
MP150GJ
1348
03-11-14
100
0
MPQ2143DJ
1347
01-27-14
165
0
MPQ2143DJ
1347
01-27-14
165
0
MPQ2143DJ
1304
01-27-14
50
0
Total
FA NO.
0
SAT picture of FLIP CHIP-TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.8.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4027GJ
1337
01-13-14
92
0
1000
MPQ4420GJ
1323
02-21-14
94
0
1000
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 53 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2225GJ
1344
02-13-14
94
0
1000
FA NO.
# of
cycle
MP1494DJ
1349
02-11-14
79
0
1000
MP4026GJ
1351
02-25-14
79
0
1000
MP1494DJ
1351
02-21-14
79
0
1000
MP1494DJ
1351
02-21-14
79
0
1000
MP4027GJ
1329
03-13-14
47
0
1000
MP1494DJ
1346
03-13-14
47
0
1000
MP1494DJ
1343
03-13-14
47
0
1000
MP1495DJ
1350
01-15-14
50
0
100
MP1472GJ-C452
1344
01-09-14
50
0
100
MP1494DJ
1348
01-09-14
50
0
100
MP9495DJ
1349
01-09-14
50
0
100
MP3414DJ
1349
01-09-14
50
0
100
MP1472GJ-C452
1340
01-09-14
50
0
100
MP2314GJ
1350
01-09-14
50
0
100
MP1495DJ
1349
01-15-14
50
0
100
MP1495DJ
1347
01-15-14
50
0
100
MP1495DJ
1347
01-17-14
46
0
100
MP1472GJ
1349
01-09-14
50
0
100
MP1495DJ
1349
01-29-14
50
0
100
MP2315GJ
1346
01-09-14
50
0
100
MP2315GJ
1346
01-15-14
50
0
100
MP1472GJ
1349
01-09-14
50
0
100
MP3414DJ
1349
01-09-14
50
0
100
MP1470GJ
1352
01-09-14
50
0
100
MP9495DJ
1349
01-09-14
50
0
100
MP1470GJ
1349
01-15-14
50
0
100
MP1470GJ
1350
01-15-14
50
0
100
MP1495DJ
1350
02-26-14
50
0
100
MP1470GJ
1352
01-15-14
50
0
100
MP1470GJ
1350
01-15-14
50
0
100
MP1495DJ
1349
02-26-14
50
0
100
MP2235GJ
1350
01-17-14
50
0
100
MP1494DJ
1351
01-17-14
50
0
100
MP2235GJ
1352
01-17-14
50
0
100
MP3414DJ
1344
01-17-14
50
0
100
MP1470GJ
1352
01-17-14
50
0
100
MP3414DJ
1344
01-17-14
50
0
100
MP1495DJ
1350
01-17-14
50
0
100
MP3414DJ
1349
01-17-14
50
0
100
MP1470GJ
1352
01-17-14
50
0
100
MP2143DJ-C463
1351
01-22-14
50
0
100
The Future of Analog IC Technology®
- 54 -
MONOLITHIC POWER SYSTEMS
Device
Q1 2014
D/C
Close
Date
Sample
Size
PRODUCT RELIABILITY REPORT
# of
Fail
FA NO.
# of
cycle
MP2314GJ
1350
01-22-14
50
0
100
MP1496DJ
1343
01-22-14
50
0
100
MP1496DJ
1344
01-22-14
50
0
100
MP1496DJ
1344
01-22-14
50
0
100
MP1496DJ
1340
01-22-14
50
0
100
MP1496DJ
1343
01-22-14
50
0
100
MP1496DJ
1343
01-22-14
50
0
100
MP1470GJ
1345
01-22-14
50
0
100
MP1494DJ
1343
01-22-14
50
0
100
MP1470GJ
1343
01-22-14
50
0
100
MP1495DJ
1343
01-22-14
50
0
100
MP1494DJ
1344
01-22-14
50
0
100
MP1494DJ
1343
01-22-14
50
0
100
MP1495DJ
1344
01-22-14
50
0
100
MP1495DJ
1343
01-22-14
50
0
100
MP1470GJ
1345
01-22-14
50
0
100
MP1494DJ
1343
01-22-14
50
0
100
MP1470GJ
1346
01-22-14
50
0
100
MP1494DJ
1343
01-22-14
50
0
100
MP1470GJ
1346
01-22-14
50
0
100
MP1470GJ
1347
01-22-14
50
0
100
MP1495DJ
1344
01-22-14
50
0
100
MP1494DJ
1344
01-22-14
50
0
100
MP1495DJ
1341
01-22-14
50
0
100
MP1495DJ
1343
01-22-14
50
0
100
MP1494DJ
1344
01-22-14
50
0
100
MP1495DJ
1344
01-22-14
50
0
100
MP1494DJ
1344
01-22-14
50
0
100
MP1470GJ
1347
01-22-14
50
0
100
MP1470GJ
1349
01-22-14
50
0
100
MP1470GJ
1347
01-23-14
50
0
100
MP1496DJ
1341
01-22-14
50
0
100
MP1470GJ
1347
01-22-14
50
0
100
MP1496DJ
1345
01-22-14
50
0
100
MP1496DJ
1344
01-22-14
50
0
100
MP1496DJ
1341
01-22-14
50
0
100
MP1470GJ
1349
01-22-14
50
0
100
MP1470GJ
1347
01-22-14
50
0
100
MP1495DJ
1341
01-22-14
50
0
100
MP2122GJ
1352
01-23-14
50
0
100
MP2234GJ
1352
01-22-14
50
0
100
MP1496DJ
1351
01-29-14
50
0
100
The Future of Analog IC Technology®
- 55 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1470GJ
1352
01-22-14
50
0
100
MP1470GJ
1401
01-23-14
50
0
100
MP2314GJ
1350
01-23-14
50
0
100
MP1496DJ
1350
01-29-14
50
0
100
MP2161GJ-C499
1402
01-29-14
50
0
100
MP1470GJ
1401
01-29-14
50
0
100
MP2161GJ-C499
1401
01-29-14
50
0
100
MP1495DJ
1401
02-26-14
50
0
100
MP3414DJ
1401
01-29-14
50
0
100
MP1495DJ
1350
01-29-14
50
0
100
MP2314GJ
1401
01-29-14
50
0
100
MP1472GJ
1312
01-29-14
50
0
100
MP1472GJ
1307
01-29-14
50
0
100
MP2161GJ-C499
1402
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP2235GJ
1403
02-19-14
50
0
100
MP3414DJ
1401
02-19-14
50
0
100
FA NO.
# of
cycle
MP1475DJ
1336
02-19-14
50
0
100
MP1471GJ
1401
02-19-14
50
0
100
MP1498DJ
1402
02-19-14
50
0
100
MP2314GJ
1402
02-19-14
50
0
100
MP1470GJ
1401
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP1494DJ
1402
02-19-14
50
0
100
MP9495DJ
1352
02-19-14
50
0
100
MP1497DJ
1403
02-19-14
50
0
100
MP2161GJ-C514
1402
02-19-14
50
0
100
MP1497DJ
1405
02-19-14
50
0
100
MP1496DJ
1351
02-19-14
50
0
100
MP3414DJ
1401
02-19-14
50
0
100
MP1471AGJ
1404
02-19-14
50
0
100
MP1470GJ
1403
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP1495DJ
1402
02-19-14
50
0
100
MP1495DJ
1402
02-19-14
50
0
100
MP1495DJ
1402
02-19-14
50
0
100
MP1494J
1401
02-19-14
50
0
100
MP1495DJ
1402
02-19-14
50
0
100
MP1495DJ
1402
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP1494J
1401
02-19-14
50
0
100
The Future of Analog IC Technology®
- 56 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1470GJ
1402
02-19-14
50
0
100
MP1470GJ
1402
02-19-14
50
0
100
MP2144GJ
1351
02-26-14
50
0
100
MP1497DJ
1405
02-26-14
50
0
100
FA NO.
# of
cycle
MP1470GJ
1403
02-26-14
50
0
100
MP24894GJ
1401
02-26-14
50
0
100
MP3414DJ
1352
02-26-14
50
0
100
MP1470GJ
1403
02-26-14
50
0
100
MP1470GJ
1403
02-26-14
50
0
100
MP2144GJ
1404
02-26-14
50
0
100
MP1470GJ
1403
03-05-14
50
0
100
MP2143DJ
1404
03-05-14
50
0
100
MP1495DJ
1337
03-05-14
50
0
100
MP1471GJ
1406
03-05-14
50
0
100
MP2144GJ
1405
03-05-14
50
0
100
MP1474DJ-C491
1352
03-05-14
50
0
100
MP2161GJ-C499
1406
03-05-14
50
0
100
MP2315GJ
1346
03-19-14
50
0
100
MP1470GJ
1406
03-05-14
50
0
100
MP9495DJ
1405
03-05-14
50
0
100
MP2315GJ
1346
03-05-14
50
0
100
MP1494DJ
1350
03-05-14
50
0
100
MP3418GJ-C567
1407
03-05-14
50
0
100
MP2159GJ
1403
03-12-14
50
0
100
MP1470GJ
1407
03-12-14
50
0
100
MP2234GJ
1407
03-12-14
50
0
100
MP1470GJ
1406
03-12-14
50
0
100
MP9495DJ
1406
03-12-14
50
0
100
MP1495DJ-C494
1402
03-12-14
50
0
100
MP1470GJ
1407
03-12-14
50
0
100
MP2161GJ-C514
1406
03-12-14
50
0
100
MP1471GJ
1408
03-19-14
50
0
100
MP1470GJ
1406
03-19-14
50
0
100
MP2161GJ
1343
03-12-14
50
0
100
MP9495DJ
1407
03-12-14
50
0
100
MP1470GJ
1407
03-19-14
50
0
100
MP1471AGJ
1408
03-19-14
50
0
100
MP1470GJ
1407
03-19-14
50
0
100
MP1470GJ
1406
03-19-14
50
0
100
MP1472GJ
1407
03-19-14
50
0
100
MP2159GJ
1403
03-19-14
50
0
100
MP1470GJ
1407
03-19-14
50
0
100
The Future of Analog IC Technology®
- 57 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2315GJ
1346
03-19-14
50
0
100
MP1470GJ
1406
03-19-14
50
0
100
MP1495DJ
1406
03-26-14
50
0
100
MP1470GJ
1409
03-19-14
50
0
100
FA NO.
# of
cycle
MP2489DJ
1352
03-19-14
50
0
100
MP2314GJ
1404
03-26-14
50
0
100
MP1495DJ
1407
03-26-14
50
0
100
MP1470GJ
1407
03-26-14
50
0
100
MP1470GJ
1408
03-26-14
50
0
100
MP1470GJ
1407
03-26-14
50
0
100
MP2161GJ-C499
1409
03-26-14
50
0
100
MP2161GJ-C514
1409
03-26-14
50
0
100
MP2314GJ
1402
03-26-14
50
0
100
MP4027GJ
1336
03-26-14
50
0
100
MP2234GJ
1403
03-26-14
50
0
100
Total
0
4.8.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃, 100%RH, 29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of hrs
MPQ4420GJ
1323
02-21-14
97
0
168
MP150GJ
1311
02-25-14
96
0
168
MP2225GJ
1344
02-13-14
97
0
168
MP1494DJ
1349
02-11-14
77
0
168
MP1494DJ
1351
02-21-14
77
0
168
MP1494DJ
1351
02-21-14
77
0
168
MP4027GJ
1329
03-13-14
50
0
168
MP1494DJ
1346
03-13-14
50
0
168
MP1494DJ
1343
03-13-14
50
0
168
MPQ2143DJ
1347
01-27-14
77
0
168
MPQ2143DJ
1347
01-27-14
77
0
168
MP1495DJ
1350
01-15-14
850
0
48
MP1472GJ-C452
1344
01-09-14
50
0
48
MP1494DJ
1348
01-09-14
50
0
48
MP9495DJ
1349
01-09-14
50
0
48
MP3414DJ
1349
01-09-14
50
0
48
MP1472GJ-C452
1340
01-09-14
50
0
48
MP2314GJ
1350
01-09-14
50
0
48
MP1495DJ
1349
01-15-14
850
0
48
The Future of Analog IC Technology®
- 58 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1347
01-15-14
850
0
48
MP1495DJ
1347
01-17-14
850
0
48
MP1472GJ
1349
01-09-14
50
0
48
MP1495DJ
1349
01-29-14
850
0
48
MP2315GJ
1346
01-09-14
50
0
48
MP2315GJ
1346
01-15-14
50
0
48
MP1472GJ
1349
01-09-14
50
0
48
FA NO.
# of hrs
MP3414DJ
1349
01-09-14
50
0
48
MP1470GJ
1352
01-09-14
50
0
48
MP9495DJ
1349
01-09-14
50
0
48
MP1470GJ
1349
01-15-14
50
0
48
MP1470GJ
1350
01-15-14
50
0
48
MP1495DJ
1350
02-26-14
850
0
48
MP1470GJ
1352
01-15-14
50
0
48
MP1470GJ
1350
01-15-14
50
0
48
MP1495DJ
1349
02-26-14
850
0
48
MP2235GJ
1350
01-17-14
50
0
48
MP1494DJ
1351
01-17-14
50
0
48
MP2235GJ
1352
01-17-14
50
0
48
MP3414DJ
1344
01-17-14
50
0
48
MP1470GJ
1352
01-17-14
50
0
48
MP3414DJ
1344
01-17-14
50
0
48
MP1495DJ
1350
01-17-14
50
0
48
MP3414DJ
1349
01-17-14
45
0
48
MP1470GJ
1352
01-17-14
50
0
48
MP2143DJ-C463
1351
01-22-14
50
0
48
MP2314GJ
1350
01-22-14
50
0
48
MP1496DJ
1343
01-22-14
50
0
48
MP1496DJ
1344
01-22-14
50
0
48
MP1496DJ
1344
01-22-14
50
0
48
MP1496DJ
1340
01-22-14
50
0
48
MP1496DJ
1343
01-22-14
50
0
48
MP1496DJ
1343
01-22-14
50
0
48
MP1470GJ
1345
01-22-14
50
0
48
MP1494DJ
1343
01-22-14
50
0
48
MP1470GJ
1343
01-22-14
50
0
48
MP1495DJ
1343
01-22-14
50
0
48
MP1494DJ
1344
01-22-14
50
0
48
MP1494DJ
1343
01-22-14
50
0
48
MP1495DJ
1344
01-22-14
50
0
48
MP1495DJ
1343
01-22-14
50
0
48
MP1470GJ
1345
01-22-14
50
0
48
The Future of Analog IC Technology®
- 59 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1343
01-22-14
50
0
48
MP1470GJ
1346
01-22-14
50
0
48
FA NO.
# of hrs
MP1494DJ
1343
01-22-14
50
0
48
MP1470GJ
1346
01-22-14
50
0
48
MP1470GJ
1347
01-22-14
50
0
48
MP1495DJ
1344
01-22-14
50
0
48
MP1494DJ
1344
01-22-14
50
0
48
MP1495DJ
1341
01-22-14
50
0
48
MP1495DJ
1343
01-22-14
50
0
48
MP1494DJ
1344
01-22-14
50
0
48
MP1495DJ
1344
01-22-14
50
0
48
MP1494DJ
1344
01-22-14
50
0
48
MP1470GJ
1347
01-22-14
50
0
48
MP1470GJ
1349
01-22-14
50
0
48
MP1470GJ
1347
01-23-14
50
0
48
MP1496DJ
1341
01-22-14
50
0
48
MP1470GJ
1347
01-22-14
50
0
48
MP1496DJ
1345
01-22-14
50
0
48
MP1496DJ
1344
01-22-14
50
0
48
MP1496DJ
1341
01-22-14
50
0
48
MP1470GJ
1349
01-22-14
50
0
48
MP1470GJ
1347
01-22-14
50
0
48
MP1495DJ
1341
01-22-14
50
0
48
MP2122GJ
1352
01-23-14
50
0
48
MP2234GJ
1352
01-22-14
50
0
48
MP1496DJ
1351
01-29-14
50
0
48
MP1470GJ
1352
01-22-14
50
0
48
MP1470GJ
1401
01-23-14
50
0
48
MP2314GJ
1350
01-23-14
50
0
48
MP1496DJ
1350
01-29-14
50
0
48
MP2161GJ-C499
1402
01-29-14
50
0
48
MP1470GJ
1401
01-29-14
50
0
48
MP2161GJ-C499
1401
01-29-14
50
0
48
MP1495DJ
1401
02-26-14
850
0
48
MP3414DJ
1401
01-29-14
50
0
48
MP1495DJ
1350
01-29-14
50
0
48
MP2314GJ
1401
01-29-14
50
0
48
MP1472GJ
1312
01-29-14
50
0
48
MP1472GJ
1307
01-29-14
50
0
48
MP2161GJ-C499
1402
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP2235GJ
1403
02-19-14
50
0
48
The Future of Analog IC Technology®
- 60 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1401
02-19-14
50
0
48
MP1475DJ
1336
02-19-14
50
0
48
MP1471GJ
1401
02-19-14
50
0
48
FA NO.
# of hrs
MP1498DJ
1402
02-19-14
50
0
48
MP2314GJ
1402
02-19-14
50
0
48
MP1470GJ
1401
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP1494DJ
1402
02-19-14
50
0
48
MP9495DJ
1352
02-19-14
50
0
48
MP1497DJ
1403
02-19-14
50
0
48
MP2161GJ-C514
1402
02-19-14
50
0
48
MP1497DJ
1405
02-19-14
50
0
48
MP1496DJ
1351
02-19-14
50
0
48
MP3414DJ
1401
02-19-14
50
0
48
MP1471AGJ
1404
02-19-14
50
0
48
MP1470GJ
1403
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP1495DJ
1402
02-19-14
50
0
48
MP1495DJ
1402
02-19-14
50
0
48
MP1495DJ
1402
02-19-14
50
0
48
MP1494J
1401
02-19-14
50
0
48
MP1495DJ
1402
02-19-14
50
0
48
MP1495DJ
1402
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP1494J
1401
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP1470GJ
1402
02-19-14
50
0
48
MP2144GJ
1351
02-26-14
50
0
48
MP1497DJ
1405
02-26-14
50
0
48
MP1470GJ
1403
02-26-14
50
0
48
MP24894GJ
1401
02-26-14
50
0
48
MP3414DJ
1352
02-26-14
50
0
48
MP1470GJ
1403
02-26-14
50
0
48
MP1470GJ
1403
02-26-14
50
0
48
MP2144GJ
1404
02-26-14
50
0
48
MP1470GJ
1403
03-05-14
50
0
48
MP2143DJ
1404
03-05-14
50
0
48
MP1495DJ
1337
03-05-14
50
0
48
MP1471GJ
1406
03-05-14
50
0
48
MP2144GJ
1405
03-05-14
50
0
48
MP1474DJ-C491
1352
03-05-14
50
0
48
The Future of Analog IC Technology®
- 61 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C499
1406
03-05-14
50
0
48
MP2315GJ
1346
03-19-14
50
0
48
MP1470GJ
1406
03-05-14
50
0
48
FA NO.
# of hrs
MP9495DJ
1405
03-05-14
50
0
48
MP2315GJ
1346
03-05-14
50
0
48
MP1494DJ
1350
03-05-14
50
0
48
MP3418GJ-C567
1407
03-05-14
50
0
48
MP2159GJ
1403
03-12-14
50
0
48
MP1470GJ
1407
03-12-14
50
0
48
MP2234GJ
1407
03-12-14
50
0
48
MP1470GJ
1406
03-12-14
50
0
48
MP9495DJ
1406
03-12-14
50
0
48
MP1495DJ-C494
1402
03-12-14
50
0
48
MP1470GJ
1407
03-12-14
50
0
48
MP2161GJ-C514
1406
03-12-14
50
0
48
MP1471GJ
1408
03-19-14
50
0
48
MP1470GJ
1406
03-19-14
50
0
48
MP2161GJ
1343
03-12-14
50
0
48
MP9495DJ
1407
03-12-14
50
0
48
MP1470GJ
1407
03-19-14
50
0
48
MP1471AGJ
1408
03-19-14
50
0
48
MP1470GJ
1407
03-19-14
50
0
48
MP1470GJ
1406
03-19-14
50
0
48
MP1472GJ
1407
03-19-14
50
0
48
MP2159GJ
1403
03-19-14
50
0
48
MP1470GJ
1407
03-19-14
50
0
48
MP2315GJ
1346
03-19-14
50
0
48
MP1470GJ
1406
03-19-14
50
0
48
MP1495DJ
1406
03-26-14
850
0
48
MP1470GJ
1409
03-19-14
50
0
48
MP2489DJ
1352
03-19-14
50
0
48
MP2314GJ
1404
03-26-14
50
0
48
MP1495DJ
1407
03-26-14
850
0
48
MP1470GJ
1407
03-26-14
50
0
48
MP1470GJ
1408
03-26-14
50
0
48
MP1470GJ
1407
03-26-14
50
0
48
MP2161GJ-C499
1409
03-26-14
50
0
48
MP2161GJ-C514
1409
03-26-14
50
0
48
MP2314GJ
1402
03-26-14
50
0
48
MP4027GJ
1336
03-26-14
50
0
48
MP2234GJ
1403
03-26-14
50
0
48
Total
0
The Future of Analog IC Technology®
- 62 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
4.8.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2318GJ
1342
01-10-14
85
0
MPQ4420GJ
1323
02-21-14
98
0
MP150GJ
1311
02-25-14
100
0
MP2161GJ
1341
02-21-14
102
0
MP2161GJ
1340
02-21-14
100
0
MP2161GJ
1340
02-21-14
100
0
MP2161GJ
1340
02-21-14
100
0
MP2161GJ
1340
02-21-14
102
0
MP2225GJ
1344
02-13-14
96
0
MP1494DJ
1349
02-11-14
80
0
MP4027GJ
1329
03-13-14
50
0
MP1494DJ
1346
03-13-14
50
0
MP1494DJ
1343
03-13-14
50
0
MPQ2143DJ
1347
01-27-14
80
0
MPQ2143DJ
1347
01-27-14
80
0
MPQ2143DJ
1304
01-27-14
50
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 63 -
MONOLITHIC POWER SYSTEMS
Q1 2014
PRODUCT RELIABILITY REPORT
Monolithic Power Systems (Chengdu) Co., Ltd.
No.8 Kexin Rd. West Park of Export Processing Zone,
West Hi-Tech Zone, Chengdu, Sichuan 611731
Tel: 86-28-87303000
Fax: 86-28-87303060
www.monolithicpower.com
The Future of Analog IC Technology®
- 64 -