QUARTERLY RELIABILITY MONITOR REPORT Q1, Jan. ~ Mar. 2014 Prepared by MPSCD Reliability Engineering The Future of Analog IC Technology® MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT INDEX 1.0 INTRODUCTION ...........................................................................2 1.1 SHORT TERM RELIBILITY MONITORING .........................................................................................................2 1.2 LONG TERM RELIBILITY MONITORING ............................................................................................................ 2 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS ..............3 3.0 PROCESS RELIABILITY MONITORING DATA............................4 3.1 BCM12B Process Technology ................................................................................................................................. 4 3.2 BCM12S Process Technology ................................................................................................................................. 6 3.3 BCM35 Process Technology .................................................................................................................................... 8 3.4 BCM18 Process Technology ................................................................................................................................. 10 4.0 PACKAGE RELIABILITY MONITORING DATA ......................... 11 4.1 QFN ................................................................................................................................................................................... 11 4.2 SOIC ................................................................................................................................................................................. 20 4.3 MSOP ............................................................................................................................................................................... 31 4.4 TSOT ................................................................................................................................................................................ 33 4.5 TSSOP ............................................................................................................................................................................. 37 4.6 FLIP CHIP-QFN .......................................................................................................................................................... 40 4.7 FLIP CHIP-SOIC......................................................................................................................................................... 51 4.8 FLIP CHIP-TSOT ....................................................................................................................................................... 52 The Future of Analog IC Technology® -1- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 1.0 INTRODUCTION This report summarizes the reliability testing results for MPS products as of Q1 2014. 1.1 SHORT TERM RELIBILITY MONITORING The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product reliability performance or any potential quality issues. Stress Test Name Test Condition Duration JEDEC EARLY LIFE 125°C, Vccmax 48 ~168 hrs JESD22-A108 Convection Reflow 260°C 3 times JESD22-A113 Temperature Cycle Cond C:-65°C ~ 150°C 100~200 cycles JESD22-A104 Autoclave 121°C /100%RH 48~96 hrs JESD22-A102 1.2 LONG TERM RELIBILITY MONITORING The long term monitoring runs on a quarterly basis. It provides the life stresses to the products to monitor product long term reliability. Stress Test Name Durati Test Condition JEDEC on HTOL 125°C, Vccmax 1000 hrs JESD22-A108 HTSL 150°C 1000 hrs JESD22-A103 Precondition / / JESD22-A113 Autoclave 121°C /100%RH 168 hrs JESD22-A102 Temperature Cycle Cond C:-65°C ~ 150°C 1000 cycles JESD22-A104 85°C, 85% R.H., VDD 1000 hrs JESD22-A101 130°C, 85% R.H., VDD 96 hrs JESD22-A110 Temperature Humidity Bias (THB) High Accelerated Stress Test (HAST) The Future of Analog IC Technology® -2- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon accelerated stress data. The units for FIT are failures per Billion device hours. ( χ / 2) *10 2 FITRate = 9 stress * device hours The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL is accelerated by temperature and by voltage. The total number of failures in stress determines the chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses the activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g. 55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is AF(T) times the device-Hours number. Another acceleration is voltage, i.e. AFv= Exp(β∗(Vtest- Vuse)), Vtest = Stress Voltage (V), Vuse = Nominal Voltage (V), and β = Voltage Acceleration Constant. But, normally, the voltage acceleration is not accounted in our calculation, i.e. AFv = 1. The Future of Analog IC Technology® -3- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 3.0 PROCESS RELIABILITY MONITORING DATA 3.1 BCM12B Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC, SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MPQ1530DQ-AEC1 FA342757A 1333 01-13-14 80 168 0 HFC0400GS C582639.8E 1251 01-22-14 80 168 0 HFC0300HS B883704.7C 1339 01-15-14 80 168 0 HFC0300HS B883704.7E 1346 02-19-14 80 168 0 HFC0300HS B883704.7D 1346 03-05-14 80 168 0 HFC0300HS D681288.7A 1350 03-12-14 80 168 0 MPQ2483DQ-AEC1 D572842.7C-MPQ 1335 01-21-14 78 96 0 MPQ2451DT D672108.9-MPQ 1344 01-15-14 77 96 0 MP4459DQT D672136.9-MPQ 1348 01-15-14 77 96 0 MPQ4462DQ-AEC1 DA72529.9A-MPQ 1350 01-15-14 80 96 0 MPQ4559DQ D372556.7BR-MPQ 1319 01-17-14 77 96 0 MPQ4560DQ D872363.9A-MPQ 1349 01-22-14 77 96 0 MP4459DQT D672146.9-MPQ 1401 03-26-14 77 96 0 MPQ4456GQT C772927.9A-MPQ 1402 03-26-14 77 96 0 MPQ2483DQ-AEC1 DA72509.9A-MPQ 1403 02-26-14 80 96 0 MPQ2451DT D672115.9-MPQ 1404 03-05-14 77 96 0 MPQ2560DN D872339.9-MPQ 1402 03-05-14 80 96 0 MP4459DQT D872340.9-MPQ 1404 03-19-14 78 96 0 MP1482DN D881865.9 1350 01-09-14 80 48 0 MP1482DN D881918.9 1350 01-09-14 78 48 0 MP1482DN D881925.9 1350 01-09-14 80 48 0 MP1482DN D781736.9 1351 01-15-14 80 48 0 MP2105DK D380037.7 1344 01-15-14 80 48 0 MP1482DN D881919.9 1351 01-15-14 80 48 0 MP1411DH D982164.9 1345 01-15-14 80 48 0 MP2105DK D480315.7 1331 01-17-14 80 48 0 MP1482DN D480495.7 1352 01-22-14 80 48 0 MP1482DN D881920.9 1352 01-22-14 78 48 0 MP1411DH DA82505.9 1401 01-22-14 80 48 0 MP1482DN D881921.9 1352 01-22-14 80 48 0 MP1482DN D480498.7 1352 01-12-14 80 48 0 FA No. The Future of Analog IC Technology® -4- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP1484EN D580602.7 1401 01-23-14 78 48 0 MP1482DN D480492.7 1352 01-29-14 80 48 0 MP1484EN D881875.9 1402 01-29-14 80 48 0 MP1482DN D580666.7 1401 02-19-14 80 48 0 MP1482DN D480501.7 1401 02-19-14 80 48 0 MP1482DN D480488.7 1402 02-19-14 80 48 0 MP1482DN D881923.9 1401 02-19-14 80 48 0 MP1482DN D189657.7 1402 02-19-14 80 48 0 MP1482DN D580669.7 1402 02-19-14 78 48 0 MP1482DN D580667.7 1402 02-19-14 78 48 0 MP1482DN D881924.9 1402 02-19-14 80 48 0 MP1482DN D580663.7 1402 02-26-14 80 48 0 MP1482DN D580661.7 1402 02-26-14 78 48 0 MP1530DQ DA82512.9 1405 02-26-14 80 48 0 MP1482DN D480504.7 1404 02-26-14 80 48 0 MP1482DN D881922.9 1404 02-26-14 78 48 0 MP1484EN D882006.7 1403 02-26-14 80 48 0 MP1482DN D580668.7 1404 02-26-14 80 48 0 MP1482DN D781735.9 1404 02-26-14 78 48 0 MP1482DN D480502.7 1405 02-26-14 80 48 0 MP1411DH DA82436.9 1403 03-05-14 80 48 0 MP1482DN D580665.7 1407 03-05-14 80 48 0 MP1482DN D580670.7 1407 03-05-14 80 48 0 MP1530DQ DB82676.9 1407 03-05-14 80 48 0 MP1411DH DB82653.7 1408 03-26-14 80 48 0 MP1411DH DB82761.7 1408 03-26-14 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of Fail MP1930GQN EP295900 1317 01-08-14 80 0 MP1530DQ C9025902 1323 01-13-14 80 0 HFC0501GS EP301302 1339 01-16-14 80 0 MP1530DQ EP327300 1345 02-13-14 80 0 HF01B04DS EP322400 1342 02-25-14 80 0 HF01B04DS EP322400 1342 02-25-14 80 0 MPQ2489DQ-AEC1 FA362058A 1343 01-27-14 80 0 MP1530DQ EP333800 1401 03-12-14 80 0 Total FA No. 0 The Future of Analog IC Technology® -5- MONOLITHIC POWER SYSTEMS BCM12B Q1 2014 PRODUCT RELIABILITY REPORT #fail #device hours Accel Factor FIT Rate 0 640000 348 4 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP18030GQN EP295900 1319 01-08-14 50 0 MPQ1530DQ-AEC1 FA342757A 1333 01-13-14 50 0 MP18030GQN EP295900 1321 01-08-14 50 0 MP1930GQN EP295900 1317 01-08-14 50 0 MP1530DQ C9025902 1323 01-13-14 50 0 HFC0500GS EP301300 1338 01-16-14 50 0 MPQ18201HQ-A C486591.7 1341 01-16-14 50 0 MP1530DQ EP327300 1345 02-13-14 50 0 MP1530DQ EP333800 1401 03-12-14 50 0 Total FA No. 0 3.2 BCM12S Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC, SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail DAS09 D772276.1C 1343 01-21-14 80 168 0 MP1494DJ D64U982.8 1346 03-13-14 50 168 0 MP1494DJ D64W047.8 1343 03-13-14 50 168 0 MP1494DJ D943952_8AQ 1352 03-06-14 80 168 0 MP4032-1GS D380244.7 1323 01-15-14 79 168 0 MPQ28261DL D882057.9Y 1349 03-26-14 79 168 0 MPQ28261DL D982290.9Y 1346 01-09-14 79 96 0 MPQ28261DL D982182.9Y 1345 01-15-14 79 96 0 MPQ28261DL D982226.9Y 1349 01-22-14 77 96 0 MPQ28261DL D882057.9Y 1349 03-26-14 79 96 0 MPQ9361DJ CB89176.7R-MPQ 1339 03-05-14 80 96 0 MPQ28261DL-C554 D881949.9AY 1403 02-26-14 80 96 0 FA No. The Future of Analog IC Technology® -6- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MPQ28261DL-C554 D982289.9DY 1404 03-05-14 79 96 0 MPQ28261DL-C554 D982289.9AY 1404 03-12-14 79 96 0 MPQ28261DL-C554 D881949.9BY 1403 03-12-14 79 96 0 MPQ4470AGL-AEC1 DB82795.8B-MPQ 1409 03-19-14 80 96 0 MPQ4470GL D881951.8-MPQ 1404 03-19-14 80 96 0 MP1495DJ D64W655.8 1350 01-15-14 80 48 0 MP1495DJ D64W673.8 1349 01-15-14 80 48 0 MP1495DJ D64W395.8A 1347 01-15-14 80 96 0 MP1495DJ D64W445.8A 1347 01-17-14 80 96 0 MP1495DJ D64W674.8A 1349 01-29-14 80 96 0 MP1495DJ D64W572.8 1350 02-26-14 79 96 0 MP1495DJ D64W674.8 1349 02-26-14 80 96 0 MP1495DJ D64W622.8 1401 02-26-14 80 96 0 MP6002DN D783178.9 1402 02-19-14 75 96 0 MP1495DJ D741192.8 1406 03-26-14 80 96 0 MP1495DJ D943469.8Y 1407 03-26-14 80 96 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of Fail MPQ2459GJ-ACQ10 EP268400 1243 01-27-14 80 0 MP8726EL D882069.9B 1344 01-08-14 80 0 MP8708EN D944389.9A 1348 01-08-14 80 0 MP44010HS EP298800 1315 02-11-14 80 0 MP44010HS EP298802 1334 02-11-14 80 0 MP020-5GS EP309500 1335 02-21-14 80 0 MP4021GS D781623.9BQ 1339 02-27-14 80 0 MPQ3386DR-AEC1 EP277001 1331 03-18-14 80 0 MPQ3386DR-AEC1 EP277001 1331 03-18-14 80 0 Total FA No. 0 BCM12S #fail #device hours Accel Factor FIT Rate 0 720000 348 3.8 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MPQ2459GJ-ACQ10 EP268400 1243 01-27-14 50 0 FA No. * The Future of Analog IC Technology® -7- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP150GS EP282600 1315 01-22-14 50 0 MP150GS EP282600 1315 01-13-14 50 0 MP150GS EP282600 1315 01-22-14 50 0 MPQ8632GL-10 EP300500 1326 01-21-14 50 0 MP2615GQ HP368305 1336 01-08-14 50 0 MP2615GQ HP368305 1336 01-08-14 50 0 MP44010HS EP298800 1315 02-11-14 50 0 MPQ4420GJ EP305702 1323 02-21-14 50 0 MP44010HS EP298802 1334 02-11-14 50 0 MP150GJ EP282600 1311 02-25-14 50 0 MP4021GS D781623.9BQ 1339 02-27-14 50 0 MP1494DJ H8076501 1343 02-21-14 50 0 MP1494DJ H8076501 1343 02-21-14 50 0 MP1494DJ H8076501 1343 02-21-14 50 0 MP1494DJ H8076501 1343 02-21-14 50 0 MPQ8636HGV-20 EP292406 1343 01-27-14 50 0 MP3399EF D34R504.9A 1330 01-27-14 50 0 MP020-5GS EP319502 1348 02-11-14 50 0 MP1494DJ D64U982.8 1346 03-13-14 50 0 MP1494DJ D64W047.8 1343 03-13-14 50 0 MP45100GL EP302904 1346 03-26-14 50 0 MPQ4570GF FA322429 1344 03-11-14 50 0 MPQ3386DR-AEC1 EP277001 1331 03-18-14 50 0 MPQ3386DR-AEC1 EP277001 1331 03-18-14 50 0 MP45100GN EP302904 1346 03-26-14 50 0 Total FA No. 0 3.3 BCM35 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC, SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP2633GR D34R468.1AL 1341 01-08-14 80 168 0 MP2633GR D34R468.1AM 1341 01-08-14 80 168 0 MP2633GR D34R468.1AH 1341 01-08-14 80 168 0 MP5010BDQ-J102 D944494.9A 1349 01-08-14 80 168 0 FA No. The Future of Analog IC Technology® -8- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP5010ADQ D54T592.1B 1346 02-13-14 80 168 0 MP4027GJ CB43216.8D 1330 03-13-14 50 168 0 MP4027GJ D543600.8C 1329 03-13-14 50 168 0 MPQ2013GG DA43773.1A-MPQ 1350 01-22-14 80 96 0 MPQ2013GG DA43773.1B-MPQ 1402 02-19-14 80 96 0 MP5010ADQ D54T592.9 1350 01-15-14 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of Fail MP5018GD HP370202 1341 01-22-14 80 0 MP3387GRT HP337903 1327 01-13-14 90 0 MP3312GC EP3027 1335 03-18-14 80 0 MP9950DQ HP388001 1407 03-26-14 80 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 330000 348 8.4 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP5018GD HP370202 1341 01-22-14 50 0 MPM3805GQB-33 HP317307 1334 01-16-14 50 0 MPM3805GQB-25 HP3173 1337 01-16-14 50 0 MPM3810GQB CA43173.8E 1334 01-23-14 50 0 MPM3805GQB D443551.8C 1341 01-23-14 50 0 MP3373GM HP362706 1329 02-21-14 50 0 MP2161GJ H7U74902 1340 02-21-14 50 0 MP2161GJ H7U749028 1340 02-21-14 50 0 MP2161GJ H7U749026 1340 02-21-14 50 0 MP2161GJ H7U749027 1340 02-21-14 50 0 MP5010ADQ D54T592.1B 1346 02-13-14 50 0 MP4027GJ CB43216.8D 1330 03-13-14 50 0 MP3312GC EP3027 1335 03-18-14 50 0 MP4027GJ D543600.8C 1329 03-13-14 50 0 MP3312GC EP3027R1B 1349 03-18-14 50 0 MP3312GC EP3027R2TR 1349 03-18-14 50 0 Total FA No. 0 The Future of Analog IC Technology® -9- MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 3.4 BCM18 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail NB671GQ D44S609.8 1339 03-14-14 50 168 0 NB671GQ D44S761.8Q 1339 03-14-14 50 168 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax and 125°C Device LOT# D/C Close Date Sample Size # of Fail NB671GQ D44S609.8 1339 03-14-14 80 0 NB671GQ HP319006 1339 03-14-14 80 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 160000 348 15.3 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP2229GQ HP339804 1341 01-22-14 50 0 MP2145GD HP319006 1332 01-13-14 50 0 MP2145GD HP319006 1332 01-13-14 50 0 MP2145GD HP319006 1332 01-13-14 50 0 MP2225GJ HP318909 1344 02-13-14 50 0 NB671GQ D44S609.8 1339 03-14-14 50 0 NB671GQ D44S761.8Q 1339 03-14-14 50 0 Total FA No. 0 The Future of Analog IC Technology® - 10 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.0 PACKAGE RELIABILITY MONITORING DATA 4.1 QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD QFN2*2 ASAT QFN2*2 UCD QFN2*3 ASAT QFN2*3 UCD QFN3*3 ASAT QFN3*3 UCD QFN3*4 ASAT QFN3*4 UCD QFN4*4 ASAT QFN4*4 UCD QFN4*5 ASAT QFN5*5 UCD QFN5*5 ASAT QFN7*7 UCD QFN5*6 UTAC QFN3*3 UCD QFN6*6 JCET QFN2*2 UCD QFN7*7 JCET QFN4*4 4.1.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP18030GQN 1319 01-08-14 290 0 MP1530DQ 1323 01-13-14 305 0 MP1530DQ 1323 01-13-14 305 0 MPQ1530DQ-AEC1 1333 01-13-14 300 0 MP2633GR 1341 01-08-14 200 0 MP2633GR 1341 01-08-14 200 0 MP2633GR 1341 01-08-14 200 0 MP18030GQN 1321 01-08-14 290 0 MP1930GQN 1317 01-08-14 290 0 MP1530DQ 1323 01-13-14 305 0 MP1530DQ 1323 01-13-14 305 0 MPQ4569GQ-AEC1 1329 01-21-14 202 0 MP3213DQ 1202 01-08-14 160 0 MPQ18201HQ-A 1341 01-16-14 300 0 MP1530DQ 1345 02-13-14 300 0 MP1530DQ 1347 02-13-14 250 0 MP5010ADQ 1346 02-13-14 190 0 MP45100GL 1346 03-26-14 260 0 MP1530DQ 1401 03-12-14 250 0 MPQ3386DR-AEC1 1331 03-18-14 187 0 MPQ3386DR-AEC1 1331 03-18-14 187 0 FA NO. The Future of Analog IC Technology® - 11 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2932GQK 1323 03-26-14 100 0 MP2932GQK 1338 03-26-14 100 0 Total FA NO. 0 SAT picture of QFN T-SCAN PICTURE C-SCAN PICTURE 4.1.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail FA NO. # of cycle MP18030GQN 1319 01-08-14 94 0 1000 MP1530DQ 1323 01-13-14 100 0 1000 MP1530DQ 1323 01-13-14 100 0 1000 MPQ1530DQ-AEC1 1333 01-13-14 94 0 1000 94 0 1000 MP18030GQN 1321 01-08-14 MP1930GQN 1317 01-08-14 94 0 1000 MP1530DQ 1323 01-13-14 100 0 1000 MP1530DQ 1323 01-13-14 100 0 1000 MPQ4569GQ-AEC1 1329 01-21-14 94 0 1000 MPQ18201HQ-A 1341 01-16-14 97 0 1000 MP1530DQ 1345 02-13-14 94 0 1000 MP1530DQ 1347 02-13-14 79 0 1000 MP5010ADQ 1346 02-13-14 82 0 1000 MP45100GL 1346 03-26-14 79 0 1000 MP1530DQ 1401 03-12-14 79 0 1000 MPQ3386DR-AEC1 1331 03-18-14 79 0 1000 The Future of Analog IC Technology® - 12 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail MPQ3386DR-AEC1 1331 03-18-14 79 0 1000 MPQ2483DQ-AEC1 1335 Device D/C FA NO. # of cycle 01-21-14 84 0 100 MP3212DQ 1346 01-09-14 84 0 100 MPQ28261DL 1346 01-09-14 84 0 100 MPQ28261DL 1345 01-15-14 94 0 100 MPQ28261DL 1349 01-22-14 94 0 100 MP5010ADQ 1350 01-15-14 94 0 100 MPQ28261DL 1349 03-26-14 93 0 100 MP3388DR-C414 1351 01-09-14 94 0 100 MP5000DQ 1351 01-09-14 97 0 100 MP2633GR 1352 01-09-14 94 0 100 MP4459DQT 1348 01-15-14 97 0 100 01-15-14 94 0 100 01-09-14 94 0 100 MPQ4462DQ-AEC1 1350 MP2633GR 1401 NB634EL-C285 1351 01-09-14 96 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 96 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP3388DR-C414 1350 01-09-14 97 0 100 MP28253EL 1352 01-15-14 50 0 100 MP2633GR 1352 01-15-14 50 0 100 MPQ4561DQ-AEC1 1351 01-15-14 50 0 100 MPQ4559DQ 1319 01-17-14 50 0 100 MP2116DQ 1352 01-17-14 50 0 100 MP28256EL 1351 01-17-14 50 0 100 MP2633GR 1352 01-17-14 50 0 100 MPQ4560DQ 1349 01-22-14 50 0 100 NB634EL 1349 01-17-14 50 0 100 MPQ2013GG 1350 01-22-14 50 0 100 MP8904DD 1352 01-22-14 50 0 100 MP2633GR 1401 01-17-14 50 0 100 MPQ2451DG-AEC1 1351 01-22-14 50 0 100 MP8126DR 1402 01-23-14 50 0 100 MP28253EL-C323 1402 01-23-14 50 0 100 MP2005DD 1402 01-23-14 50 0 100 MP2633AGR 1328 01-29-14 50 0 100 MP28256EL 1402 01-29-14 50 0 100 MP3213DQ 1352 01-29-14 50 0 100 The Future of Analog IC Technology® - 13 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C Close Date Sample Size PRODUCT RELIABILITY REPORT # of Fail FA NO. # of cycle MP2633GR 1402 01-29-14 50 0 100 MP5010SDQ 1401 01-29-14 50 0 100 MP28253EL-C323 1404 02-19-14 50 0 100 MPQ2128DG-AEC1 1350 02-19-14 50 0 100 MPQ2013GQ 1402 02-19-14 50 0 100 MP1907GQ 1401 02-19-14 50 0 100 MP5011DQ 1403 02-19-14 50 0 100 MP1531DQ 1403 02-19-14 50 0 100 MP28256EL 1402 02-19-14 50 0 100 MP26021DQ-C163 1341 02-19-14 50 0 100 MP2633GR 1402 02-19-14 50 0 100 PQ20056GG-18-AEC 1403 02-19-14 50 0 100 MP2128DG 1336 02-26-14 50 0 100 MP4459DQT 1401 03-26-14 50 0 100 MPQ2013GG 1402 02-19-14 50 0 100 MP26123DR 1404 02-19-14 50 0 100 MP28255EL 1404 02-19-14 50 0 100 MP2155GQ 1404 02-19-14 50 0 100 PQ2451GG-33-AEC 1323 02-19-14 50 0 100 1302 02-26-14 50 0 100 MP1530DQ 1405 02-26-14 50 0 100 MP4566DD 1403 02-26-14 50 0 100 MPQ4456GQT 1402 03-26-14 50 0 100 MPQ4558DQ-AEC1 1404 02-26-14 50 0 100 MPQ2483DQ-AEC1 1403 02-26-14 50 0 100 MPQ20051DQ-AEC MP5000DQ 1404 02-26-14 50 0 100 MP3388DR-C414 1405 03-12-14 50 0 100 MP28256EL 1404 03-12-14 50 0 100 MPQ28261DL-C554 1403 02-26-14 50 0 100 MPQ28261DL-C554 1404 03-05-14 50 0 100 MP2607DL 1405 03-05-14 50 0 100 MP2030DQ 1404 03-05-14 50 0 100 MP2633GR 1406 03-05-14 50 0 100 MPQ28261DL-C554 1404 03-12-14 50 0 100 1407 03-05-14 50 0 100 MPQ28261DL-C554 1403 03-12-14 50 0 100 1406 03-05-14 50 0 100 MP8668DL-C223 MP28256EL MP2108DQ 1405 03-05-14 50 0 100 MP8903DG-3.3 1405 03-05-14 50 0 100 MP28253EL 1407 03-05-14 50 0 100 MP1530DQ 1407 03-05-14 50 0 100 MP2633GR 1407 03-05-14 50 0 100 The Future of Analog IC Technology® - 14 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3430HQ 1408 03-12-14 50 0 100 MP3213DQ 1408 03-12-14 50 0 100 MP3213DQ 1408 03-12-14 50 0 100 MP28253EL 1408 03-12-14 50 0 100 MP3212DQ 1408 03-12-14 50 0 100 MP3430HQ 1321 03-12-14 50 0 100 MP2012DQ 1406 03-12-14 50 0 100 FA NO. # of cycle NB600CQ 1408 03-12-14 50 0 100 MP28253EL 1408 03-12-14 50 0 100 NB600CQ 1408 03-12-14 50 0 100 MP4459DQT 1404 03-19-14 50 0 100 MPQ8904DD-AEC1 1407 03-12-14 50 0 100 MP2136EG 1408 03-12-14 50 0 100 MP2936DQK 1409 03-12-14 50 0 100 MP3388DR-C414 1408 03-12-14 50 0 100 MP2492DQ 1408 03-12-14 50 0 100 MP2125DL 1409 03-12-14 50 0 100 MP2108DQ 1407 03-19-14 50 0 100 MP2633GR 1407 03-19-14 50 0 100 MP5010DQ-C347 1408 03-19-14 50 0 100 MPQ4561DQ-AEC1 1351 03-19-14 50 0 100 MP2303ADN 1408 03-19-14 50 0 100 MP1484EN-C321 1406 03-19-14 50 0 100 MP1518DJ 1409 03-19-14 50 0 100 MP3213DQ 1409 03-19-14 50 0 100 MP5010DQ 1409 03-19-14 50 0 100 MP28252EL 1407 03-19-14 50 0 100 MP3388DR-C414 1410 03-19-14 50 0 100 MP2602DQ 1409 03-19-14 50 0 100 MP28256EL 1410 03-19-14 50 0 100 MP8904DD 1410 03-19-14 50 0 100 NB634EL 1410 03-26-14 50 0 100 MP5000ADQ 1409 03-26-14 50 0 100 MP2452DD 1411 03-26-14 50 0 100 MP2489DQ 1409 03-26-14 50 0 100 MP28114DG 1409 03-26-14 50 0 100 MP3212DQ 1409 03-26-14 50 0 100 MP3430HQ 1410 03-26-14 50 0 100 MP2303DQ 1410 03-26-14 50 0 100 MP28255EL 1409 03-26-14 50 0 100 Total 0 The Future of Analog IC Technology® - 15 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.1.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail MP18030GQN 1319 01-08-14 97 0 168 MP1530DQ 1323 01-13-14 100 0 168 MP1530DQ 1323 01-13-14 100 0 168 MPQ1530DQ-AEC1 1333 01-13-14 96 0 168 FA NO. # of hrs MP2633GR 1341 01-08-14 97 0 168 MP2633GR 1341 01-08-14 96 0 168 MP2633GR 1341 01-08-14 96 0 168 MP18030GQN 1321 01-08-14 97 0 168 MP1930GQN 1317 01-08-14 97 0 168 MP1530DQ 1323 01-13-14 100 0 168 MP1530DQ 1323 01-13-14 100 0 168 MP3213DQ 1202 01-08-14 80 0 168 MPQ18201HQ-A 1341 01-16-14 97 0 168 MP1530DQ 1345 02-13-14 97 0 168 MP1530DQ 1347 02-13-14 77 0 168 MP5010ADQ 1346 02-13-14 77 0 168 MP45100GL 1346 03-26-14 77 0 168 MP1530DQ 1401 03-12-14 77 0 168 MPQ3386DR-AEC1 1331 03-18-14 77 0 168 MPQ3386DR-AEC1 1331 03-18-14 77 0 168 MPQ2483DQ-AEC1 1335 01-21-14 50 0 48 MP3212DQ 1346 01-09-14 50 0 48 MPQ28261DL 1346 01-09-14 50 0 48 MPQ28261DL 1345 01-15-14 50 0 48 MPQ28261DL 1349 01-22-14 50 0 48 MP5010ADQ 1350 01-15-14 50 0 48 MPQ28261DL 1349 03-26-14 50 0 48 MP3388DR-C414 1351 01-09-14 50 0 48 MP5000DQ 1351 01-09-14 50 0 48 MP2633GR 1352 01-09-14 50 0 48 MP4459DQT 1348 01-15-14 50 0 48 MPQ4462DQ-AEC1 1350 01-15-14 50 0 48 MP2633GR 1401 01-09-14 50 0 48 NB634EL-C285 1351 01-09-14 50 0 48 MP3388DR-C414 1350 01-09-14 50 0 48 MP3388DR-C414 1350 01-09-14 97 0 48 MP3388DR-C414 1350 01-09-14 97 0 48 MP3388DR-C414 1350 01-09-14 97 0 48 MP3388DR-C414 1350 01-09-14 50 0 48 The Future of Analog IC Technology® - 16 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3388DR-C414 1350 01-09-14 50 0 48 MP3388DR-C414 1350 01-09-14 50 0 48 MP3388DR-C414 1350 01-09-14 50 0 48 MP28253EL 1352 01-15-14 50 0 48 MP2633GR 1352 01-15-14 50 0 48 MPQ4561DQ-AEC1 1351 01-15-14 50 0 48 01-17-14 50 0 48 MPQ4559DQ 1319 FA NO. # of hrs MP2116DQ 1352 01-17-14 50 0 48 MP28256EL 1351 01-17-14 50 0 48 MP2633GR 1352 01-17-14 50 0 48 MPQ4560DQ 1349 01-22-14 50 0 48 NB634EL 1349 01-17-14 50 0 48 MPQ2013GG 1350 01-22-14 50 0 48 MP8904DD 1352 01-22-14 50 0 48 MP2633GR 1401 01-17-14 50 0 48 MPQ2451DG-AEC1 1351 01-22-14 50 0 48 MP8126DR 1402 01-23-14 50 0 48 MP28253EL-C323 1402 01-23-14 50 0 48 MP2005DD 1402 01-23-14 50 0 48 MP2633AGR 1328 01-29-14 50 0 48 MP28256EL 1402 01-29-14 50 0 48 MP3213DQ 1352 01-29-14 50 0 48 MP2633GR 1402 01-29-14 50 0 48 MP5010SDQ 1401 01-29-14 50 0 48 MP28253EL-C323 1404 02-19-14 50 0 48 MPQ2128DG-AEC1 1350 02-19-14 50 0 48 02-19-14 50 0 48 MPQ2013GQ 1402 MP1907GQ 1401 02-19-14 50 0 48 MP5011DQ 1403 02-19-14 50 0 48 MP1531DQ 1403 02-19-14 50 0 48 MP28256EL 1402 02-19-14 50 0 48 MP26021DQ-C163 1341 02-19-14 50 0 48 MP2633GR 1402 02-19-14 50 0 48 PQ20056GG-18-AEC 1403 02-19-14 50 0 48 MP2128DG 1336 02-26-14 50 0 48 MP4459DQT 1401 03-26-14 50 0 48 MPQ2013GG 1402 02-19-14 50 0 48 MP26123DR 1404 02-19-14 50 0 48 MP28255EL 1404 02-19-14 50 0 48 MP2155GQ 1404 02-19-14 50 0 48 PQ2451GG-33-AEC 1323 02-19-14 50 0 48 02-26-14 50 0 48 MPQ20051DQ-AEC 1302 The Future of Analog IC Technology® - 17 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1530DQ 1405 02-26-14 50 0 48 MP4566DD 1403 02-26-14 50 0 48 MPQ4456GQT FA NO. # of hrs 1402 03-26-14 50 0 48 MPQ4558DQ-AEC1 1404 02-26-14 50 0 48 MPQ2483DQ-AEC1 1403 02-26-14 50 0 48 MP5000DQ 1404 02-26-14 50 0 48 MP3388DR-C414 1405 03-12-14 50 0 48 MP28256EL 1404 03-12-14 50 0 48 MPQ28261DL-C554 1403 02-26-14 50 0 48 MPQ28261DL-C554 1404 03-05-14 50 0 48 MP2607DL 1405 03-05-14 50 0 48 MP2030DQ 1404 03-05-14 50 0 48 MP2633GR 1406 03-05-14 50 0 48 MPQ28261DL-C554 1404 03-12-14 50 0 48 1407 03-05-14 50 0 48 MPQ28261DL-C554 1403 03-12-14 50 0 48 MP8668DL-C223 MP28256EL 1406 03-05-14 50 0 48 MP2108DQ 1405 03-05-14 50 0 48 MP8903DG-3.3 1405 03-05-14 48 0 48 MP28253EL 1407 03-05-14 50 0 48 MP1530DQ 1407 03-05-14 50 0 48 MP2633GR 1407 03-05-14 50 0 48 MP3430HQ 1408 03-12-14 50 0 48 MP3213DQ 1408 03-12-14 50 0 48 MP3213DQ 1408 03-12-14 50 0 48 MP28253EL 1408 03-12-14 50 0 48 MP3212DQ 1408 03-12-14 50 0 48 MP3430HQ 1321 03-12-14 50 0 48 MP2012DQ 1406 03-12-14 50 0 48 NB600CQ 1408 03-12-14 50 0 48 MP28253EL 1408 03-12-14 50 0 48 NB600CQ 1408 03-12-14 50 0 48 MP4459DQT 1404 03-19-14 50 0 48 MPQ8904DD-AEC1 1407 03-12-14 50 0 48 MP2136EG 1408 03-12-14 50 0 48 MP2936DQK 1409 03-12-14 50 0 48 MP3388DR-C414 1408 03-12-14 50 0 48 MP2492DQ 1408 03-12-14 50 0 48 MP2125DL 1409 03-12-14 50 0 48 MP2108DQ 1407 03-19-14 50 0 48 MP2633GR 1407 03-19-14 50 0 48 MP5010DQ-C347 1408 03-19-14 50 0 48 The Future of Analog IC Technology® - 18 - MONOLITHIC POWER SYSTEMS Device Q1 2014 Close Date Sample Size # of Fail 03-19-14 50 0 48 D/C MPQ4561DQ-AEC1 1351 PRODUCT RELIABILITY REPORT FA NO. # of hrs MP2303ADN 1408 03-19-14 50 0 48 MP1484EN-C321 1406 03-19-14 50 0 48 MP1518DJ 1409 03-19-14 50 0 48 MP3213DQ 1409 03-19-14 50 0 48 MP5010DQ 1409 03-19-14 50 0 48 MP28252EL 1407 03-19-14 50 0 48 MP3388DR-C414 1410 03-19-14 50 0 48 MP2602DQ 1409 03-19-14 50 0 48 MP28256EL 1410 03-19-14 50 0 48 MP8904DD 1410 03-19-14 50 0 48 NB634EL 1410 03-26-14 50 0 48 MP5000ADQ 1409 03-26-14 50 0 48 MP2452DD 1411 03-26-14 50 0 48 MP2489DQ 1409 03-26-14 50 0 48 MP28114DG 1409 03-26-14 50 0 48 MP3212DQ 1409 03-26-14 50 0 48 MP3430HQ 1410 03-26-14 50 0 48 MP2303DQ 1410 03-26-14 50 0 48 MP28255EL 1409 03-26-14 50 0 48 Total 0 4.1.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MP18030GQN 1319 01-08-14 90 0 MP18030GQN 1321 01-08-14 80 0 MP1930GQN 1317 01-08-14 90 0 MP1530DQ 1323 01-13-14 85 0 MPQ4569GQ-AEC1 1329 01-21-14 101 0 MP3213DQ 1202 01-08-14 80 0 MP1530DQ 1345 02-13-14 85 0 MP1530DQ 1347 02-13-14 80 0 MP45100GL 1346 03-26-14 80 0 MP1530DQ 1401 03-12-14 80 0 MP5010ADQ 1350 01-15-14 50 0 Total FA NO. 0 The Future of Analog IC Technology® - 19 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.2 SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD SOIC8 ANST SOIC14 UCD SOIC8-EP ANST SOIC16 ANST SOIC8-7 ANST SOIC20 ANST SOIC8 ANST SOIC28 ANST SOIC8-EP UTAC SOIC8 UTAC SOIC8-EP JCET SOIC8 JCET SOIC8-EP JCET SOIC16 ASE-KS SOIC8-EP ASE-KS SOIC8 4.2.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP150GS 1315 01-22-14 304 0 MP4032-2GS 1323 01-13-14 300 0 MP150GS 1315 01-13-14 306 0 MP150GS 1315 01-22-14 307 0 MP150GS 1315 01-22-14 100 0 MP4032-2GS 1341 01-10-14 380 0 MPQ4569GN-AEC1 1329 01-21-14 80 0 HFC0501GS 1339 01-16-14 300 0 MP44010HS 1315 02-11-14 200 0 MP44010HS 1315 02-11-14 100 0 MP44010HS 1315 02-11-14 80 0 MP44010HS 1334 02-11-14 280 0 MP4021GS 1339 02-27-14 200 0 MP020-5GS 1348 02-11-14 165 0 MPQ8040GDN 1332 03-06-14 100 0 MPQ8040GDN 1332 03-06-14 100 0 MP157GS 1322 03-18-14 175 0 MP45100GN 1346 03-26-14 267 0 MP6922AGN 1350 03-26-14 85 0 Total FA NO. 0 The Future of Analog IC Technology® - 20 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT SAT picture of SOIC T-SCAN PICTURE C-SCAN PICTURE 4.2.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP4032-2GS 1323 01-13-14 94 0 1000 MP4032-2GS 1341 01-10-14 94 0 1000 MP44010HS 1315 02-11-14 94 0 1000 MP44010HS 1334 02-11-14 94 0 1000 MP4021GS 1339 02-27-14 94 0 1000 MP020-5GS 1348 02-11-14 82 0 1000 FA NO. # of cycle MP157GS 1322 03-18-14 77 0 1000 MP45100GN 1346 03-26-14 79 0 1000 MP6922AGN 1350 03-26-14 79 0 1000 MP24943DS 1325 01-09-14 50 0 100 HFC0400GS 1251 01-22-14 50 0 100 HFC0300HS 1339 01-15-14 50 0 100 HFC0300HS 1346 02-19-14 50 1 MP2380DN-C341 1345 01-09-14 50 0 8178 100 100 MP1584EN-C461 1349 01-09-14 50 0 100 MP1482DN 1350 01-09-14 50 0 100 MP9415EN 1349 01-09-14 50 0 100 MP1482DN 1350 01-09-14 50 0 100 MP62340DS-1 1351 01-09-14 50 0 100 MP1482DN 1350 01-09-14 50 0 100 MP2303ADN 1351 01-09-14 50 0 100 MP2307DN 1346 01-09-14 50 0 100 MP4030GS 1350 01-09-14 50 0 100 CM500GS 1348 01-09-14 50 0 100 MP1482DS-C165 1351 01-09-14 50 0 100 The Future of Analog IC Technology® - 21 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1351 01-15-14 50 0 100 MP3394ES-C462 1343 01-09-14 50 0 100 MP2303ADN 1351 01-09-14 50 0 100 MP020-5GS 1347 01-15-14 50 0 100 MP1484EN 1348 01-15-14 50 0 100 MP3394SGS-C556 1350 01-17-14 50 0 100 MP1482DN-C165 1310 01-15-14 50 0 100 MP1482DN 1351 01-15-14 50 0 100 MP3398AGS 1346 01-15-14 50 0 100 FA NO. # of cycle MP6903DS 1348 01-15-14 50 0 100 MP24830HS-C470 1350 01-17-14 50 0 100 DAS09 1352 01-17-14 50 0 100 MP020-5GS 1349 01-17-14 50 0 100 MP2305DS 1350 01-17-14 50 0 100 MP4021GS-A 1352 01-17-14 50 0 100 MP1482DN 1352 01-22-14 50 0 100 CM500GS 1352 01-22-14 50 0 100 MP62340DS-1 1402 01-22-14 50 0 100 MP1482DN 1352 01-22-14 50 0 100 MP8708EN 1402 01-22-14 50 0 100 MP1482DN 1352 01-22-14 50 0 100 MP3398GS 1348 01-23-14 50 0 100 MP2307DN 1347 01-23-14 50 0 100 MP1482DN 1352 01-23-14 50 0 100 MP38894DN 1402 01-23-14 50 0 100 MP1484EN-C166 1350 01-23-14 50 0 100 MP1484EN 1401 01-23-14 50 0 100 MP1484EN 1352 01-23-14 50 0 100 MP4653GY-C548 1336 01-23-14 50 0 100 MP3399EY 1333 02-19-14 50 0 100 MP4653GY-C548 1336 01-23-14 50 0 100 MP4653GY-C548 1339 01-23-14 50 0 100 MP3393EY 1341 01-23-14 50 0 100 MP3399EY 1341 01-23-14 50 0 100 MP3394SGS 1349 01-23-14 50 0 100 MP4653GY-C548 1348 01-23-14 50 0 100 MP4051GS 1405 02-26-14 50 0 100 MP1482DN 1352 01-29-14 50 0 100 MP020-5GS 1351 01-29-14 50 0 100 MP1484EN 1402 01-29-14 50 0 100 MP6001DN 1352 01-29-14 50 0 100 MP62351ES 1402 01-29-14 50 0 100 The Future of Analog IC Technology® - 22 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1484EN-C166 1352 01-29-14 50 0 100 MP1482DN 1401 02-19-14 50 0 100 MP3394SGS 1352 02-19-14 50 0 100 MP1482DN 1401 02-19-14 50 0 100 MP2305DS 1352 01-29-14 50 0 100 MP24830HS 1350 01-29-14 50 0 100 FA NO. # of cycle CM500GS 1350 01-29-14 50 0 100 MP1583DN 1401 01-29-14 50 0 100 MP4030AGS 1350 02-19-14 50 0 100 MP6920DN 1402 01-29-14 50 0 100 MP4012DS-C546 1402 02-19-14 50 0 100 MP1482DN 1402 02-19-14 50 0 100 MP1584EN-C461 1352 02-19-14 50 0 100 MP1410ES-C019 1402 02-19-14 50 0 100 MP3394SGS 1352 02-19-14 50 0 100 MP18021HN 1403 02-19-14 50 0 100 MP111DS 1402 02-19-14 50 0 100 MP1482DN 1401 02-19-14 50 0 100 MP2374DS 1402 02-19-14 50 0 100 MP44010HS 1349 02-19-14 50 0 100 MP1482DN 1402 02-19-14 50 0 100 MPQ2249DN 1345 02-19-14 50 0 100 MP200DS 1401 02-19-14 50 0 100 MP4030GS 1351 02-19-14 50 0 100 MP3398AGS 1349 02-19-14 50 0 100 MP1582EN 1403 02-19-14 50 0 100 MP2467DN 1404 02-19-14 50 0 100 MP1482DS-C165 1352 02-19-14 50 0 100 MP1482DN 1402 02-19-14 50 0 100 MP1482DN 1402 02-19-14 50 0 100 MP28313CS 1403 02-19-14 50 0 100 MP1482DN 1402 02-19-14 50 0 100 MP3394SGS 1350 02-26-14 50 0 100 MP1583DN 1402 02-19-14 50 0 100 MP3398AGS 1349 02-19-14 50 0 100 MP1484EN 1352 02-19-14 50 0 100 MP6002DN 1402 02-19-14 50 0 100 MP1482DN 1402 02-26-14 50 0 100 MP1482DN 1402 02-26-14 50 0 100 HFC0300HS 1346 03-05-14 50 0 100 MP4051GS 1404 02-26-14 50 0 100 HFC0300HS 1350 03-12-14 50 0 100 The Future of Analog IC Technology® - 23 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail FA NO. # of cycle MPQ4558DN 1403 02-26-14 50 0 100 MP1482DN 1404 02-26-14 50 0 100 MP1482DN 1404 02-26-14 50 0 100 HR1000AGS 1403 02-26-14 50 0 100 MP2307DN 1347 02-26-14 50 0 100 MP1484EN 1403 02-26-14 50 0 100 DAS09 1403 02-26-14 50 0 100 MP1482DN 1404 02-26-14 50 0 100 MPQ4462DN 1403 03-05-14 50 0 100 MP2363DN 1404 02-26-14 50 0 100 MP1584EN 1404 02-26-14 50 0 100 MP9141ES 1404 03-05-14 50 0 100 MP1482DN 1404 02-26-14 50 0 100 MP1482DN 1405 02-26-14 50 0 100 MP6902DS-C530 1404 03-05-14 50 0 100 MP1482DS 1404 02-26-14 50 0 100 MP2305DS 1405 02-26-14 50 0 100 MP1584EN 1404 03-05-14 50 0 100 MP3394ES 1401 03-05-14 50 0 100 MP1482DS-C165 1407 03-05-14 50 0 100 MP2303ADN 1401 03-05-14 50 0 100 MP8718EN 1405 03-05-14 50 0 100 MP8709EN 1407 03-05-14 50 0 100 MP1482DN 1407 03-05-14 50 0 100 MP1410ES-C019 1407 03-05-14 50 0 100 MP1482DN 1407 03-05-14 50 0 100 MP020-5GS 1402 03-05-14 50 0 100 DAS09 1403 03-05-14 50 0 100 MP111DS 1352 03-05-14 50 0 100 MPQ2560DN 1402 03-05-14 50 0 100 MP4462DN 1407 03-05-14 50 0 100 MP2565DN 1408 03-12-14 50 0 100 MP6205DN 1405 03-12-14 50 0 100 MP2482DN 1405 03-12-14 50 0 100 MP2495DS 1406 03-12-14 50 0 100 MP1484EN 1406 03-12-14 50 0 100 MP8706EN 1408 03-12-14 50 0 100 MP4030AGS 1408 03-12-14 50 0 100 MP1432DN 1408 03-12-14 50 0 100 MP2482DN 1350 03-12-14 50 0 100 MP9141ES 1408 03-12-14 50 0 100 MP1423DN 1408 03-19-14 50 0 100 The Future of Analog IC Technology® - 24 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1484EN-C166 1402 03-19-14 50 0 100 MP2565DN 1409 03-19-14 50 0 100 MP1423DN 1407 03-19-14 50 0 100 MP26123DR 1408 03-19-14 50 0 100 MP1482DN 1410 03-19-14 50 0 100 MP8709EN 1408 03-19-14 50 0 100 MP2249DN 1345 03-19-14 50 0 100 MP44011HS 1409 03-19-14 50 0 100 MP1484EN 1402 03-19-14 50 0 100 MPGC01DN 1405 03-19-14 50 0 100 MP2490DS 1408 03-19-14 50 0 100 MP1593DN-C218 1409 03-19-14 50 0 100 MP1580HS 1410 03-26-14 50 0 100 MP1482DS 1404 03-26-14 50 0 100 MP1484EN-C166 1402 03-26-14 50 0 100 DAS09 1404 03-26-14 50 0 100 MP8708EN 1404 03-26-14 50 0 100 MP6902DS 1408 03-26-14 50 0 100 MP200DS 1409 03-26-14 50 0 100 MP1583DN 1410 03-26-14 50 0 100 FA NO. # of cycle MP1484EN 1403 03-26-14 50 0 100 MP4560DN 1410 03-26-14 50 0 100 MP6211DN 1409 03-26-14 50 0 100 MP6211DN 1407 03-26-14 50 0 100 MP8709EN 1408 03-26-14 50 0 100 MPQ2249DN 1409 03-26-14 50 0 100 MP2494DN 1408 03-26-14 50 0 100 MP2307DN 1405 03-26-14 50 0 100 MP2303DN 1410 03-26-14 50 0 100 MP3398AGY 1405 03-26-14 50 0 100 MP3398AGY 1403 03-26-14 50 0 100 MP3398AGY 1402 03-26-14 50 0 100 MP3399EY 1350 03-26-14 50 0 100 MP3394SGS 1349 03-26-14 50 0 100 MP3394SGS 1401 03-26-14 50 0 100 MP3398AGY 1403 03-26-14 50 0 100 MP3394SGS 1402 03-26-14 50 0 100 MP3394SGS 1404 03-26-14 50 0 100 Total 1 The Future of Analog IC Technology® - 25 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.2.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail MP4032-2GS 1323 01-13-14 97 0 168 MP4032-2GS 1341 01-10-14 97 0 168 MP44010HS 1315 02-11-14 96 0 168 MP44010HS 1315 02-11-14 97 0 168 FA NO. # of hrs MP44010HS 1334 02-11-14 97 0 168 MP020-5GS 1348 02-11-14 77 0 168 MP45100GN 1346 03-26-14 77 0 168 MP24943DS 1325 01-09-14 50 0 48 HFC0400GS 1251 01-22-14 50 0 48 HFC0300HS 1339 01-15-14 50 0 48 HFC0300HS 1346 02-19-14 50 0 48 MP2380DN-C341 1345 01-09-14 50 0 48 MP1584EN-C461 1349 01-09-14 50 0 48 MP1482DN 1350 01-09-14 50 0 48 MP9415EN 1349 01-09-14 50 0 48 MP1482DN 1350 01-09-14 50 0 48 MP62340DS-1 1351 01-09-14 50 0 48 MP1482DN 1350 01-09-14 50 0 48 MP2303ADN 1351 01-09-14 50 0 48 MP2307DN 1346 01-09-14 50 0 48 MP4030GS 1350 01-09-14 50 0 48 CM500GS 1348 01-09-14 50 0 48 MP1482DS-C165 1351 01-09-14 50 0 48 MP1482DN 1351 01-15-14 50 0 48 MP3394ES-C462 1343 01-09-14 50 0 48 MP2303ADN 1351 01-09-14 50 0 48 MP020-5GS 1347 01-15-14 50 0 48 MP1484EN 1348 01-15-14 50 0 48 MP3394SGS-C556 1350 01-17-14 50 0 48 MP1482DN-C165 1310 01-15-14 50 0 48 MP1482DN 1351 01-15-14 50 0 48 MP3398AGS 1346 01-15-14 50 0 48 MP6903DS 1348 01-15-14 50 0 48 MP24830HS-C470 1350 01-17-14 50 0 48 DAS09 1352 01-17-14 50 0 48 MP020-5GS 1349 01-17-14 50 0 48 MP2305DS 1350 01-17-14 50 0 48 MP4021GS-A 1352 01-17-14 50 0 48 MP1482DN 1352 01-22-14 50 0 48 The Future of Analog IC Technology® - 26 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C Close Date Sample Size PRODUCT RELIABILITY REPORT # of Fail FA NO. # of hrs CM500GS 1352 01-22-14 50 0 48 MP62340DS-1 1402 01-22-14 50 0 48 MP1482DN 1352 01-22-14 50 0 48 MP8708EN 1402 01-22-14 50 0 48 MP1482DN 1352 01-22-14 50 0 48 MP3398GS 1348 01-23-14 50 0 48 MP2307DN 1347 01-23-14 50 0 48 MP1482DN 1352 01-23-14 50 0 48 MP38894DN 1402 01-23-14 50 0 48 MP1484EN-C166 1350 01-23-14 50 0 48 MP1484EN 1401 01-23-14 50 0 48 MP1484EN 1352 01-23-14 50 0 48 MP4653GY-C548 1336 01-23-14 50 0 48 MP3399EY 1333 02-19-14 50 0 48 MP4653GY-C548 1336 01-23-14 50 0 48 MP4653GY-C548 1339 01-23-14 50 0 48 MP3393EY 1341 01-23-14 50 0 48 MP3399EY 1341 01-23-14 50 0 48 MP3394SGS 1349 01-23-14 50 0 48 MP4653GY-C548 1348 01-23-14 50 0 48 MP4051GS 1405 02-26-14 50 0 48 MP1482DN 1352 01-29-14 50 0 48 MP020-5GS 1351 01-29-14 50 0 48 MP1484EN 1402 01-29-14 50 0 48 MP6001DN 1352 01-29-14 50 0 48 MP62351ES 1402 01-29-14 50 0 48 MP1484EN-C166 1352 01-29-14 50 0 48 MP1482DN 1401 02-19-14 50 0 48 MP3394SGS 1352 02-19-14 50 0 48 MP1482DN 1401 02-19-14 50 0 48 MP2305DS 1352 01-29-14 50 0 48 MP24830HS 1350 01-29-14 50 0 48 CM500GS 1350 01-29-14 50 0 48 MP1583DN 1401 01-29-14 50 0 48 MP4030AGS 1350 02-19-14 50 0 48 MP6920DN 1402 01-29-14 50 0 48 MP4012DS-C546 1402 02-19-14 50 0 48 MP1482DN 1402 02-19-14 50 0 48 MP1584EN-C461 1352 02-19-14 50 0 48 MP1410ES-C019 1402 02-19-14 50 0 48 MP3394SGS 1352 02-19-14 50 0 48 MP18021HN 1403 02-19-14 50 0 48 The Future of Analog IC Technology® - 27 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP111DS 1402 02-19-14 50 0 48 MP1482DN 1401 02-19-14 50 0 48 FA NO. # of hrs MP2374DS 1402 02-19-14 50 0 48 MP44010HS 1349 02-19-14 50 0 48 MP1482DN 1402 02-19-14 50 0 48 MPQ2249DN 1345 02-19-14 50 0 48 MP200DS 1401 02-19-14 50 0 48 MP4030GS 1351 02-19-14 50 0 48 MP3398AGS 1349 02-19-14 50 0 48 MP1582EN 1403 02-19-14 50 0 48 MP2467DN 1404 02-19-14 50 0 48 MP1482DS-C165 1352 02-19-14 50 0 48 MP1482DN 1402 02-19-14 50 0 48 MP1482DN 1402 02-19-14 50 0 48 MP28313CS 1403 02-19-14 49 0 48 MP1482DN 1402 02-19-14 46 0 48 MP3394SGS 1350 02-26-14 50 0 48 MP1583DN 1402 02-19-14 50 0 48 MP3398AGS 1349 02-19-14 50 0 48 MP1484EN 1352 02-19-14 50 0 48 MP6002DN 1402 02-19-14 50 0 48 MP1482DN 1402 02-26-14 50 0 48 MP1482DN 1402 02-26-14 50 0 48 HFC0300HS 1346 03-05-14 50 0 48 MP4051GS 1404 02-26-14 50 0 48 HFC0300HS 1350 03-12-14 50 0 48 MPQ4558DN 1403 02-26-14 50 0 48 MP1482DN 1404 02-26-14 50 0 48 MP1482DN 1404 02-26-14 50 0 48 MP2307DN 1347 02-26-14 50 0 48 MP1484EN 1403 02-26-14 50 0 48 DAS09 1403 02-26-14 50 0 48 MP1482DN 1404 02-26-14 50 0 48 MPQ4462DN 1403 03-05-14 50 0 48 MP2363DN 1404 02-26-14 50 0 48 MP1584EN 1404 02-26-14 50 0 48 MP9141ES 1404 03-05-14 50 0 48 MP1482DN 1404 02-26-14 50 0 48 MP1482DN 1405 02-26-14 50 0 48 MP6902DS-C530 1404 03-05-14 50 0 48 MP1482DS 1404 02-26-14 50 0 48 MP2305DS 1405 02-26-14 50 0 48 The Future of Analog IC Technology® - 28 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1584EN 1404 03-05-14 50 0 48 MP3394ES 1401 03-05-14 50 0 48 MP1482DS-C165 1407 03-05-14 50 0 48 MP2303ADN 1401 03-05-14 50 0 48 MP8718EN 1405 03-05-14 50 0 48 MP8709EN 1407 03-05-14 50 0 48 MP1482DN 1407 03-05-14 50 0 48 FA NO. # of hrs MP1410ES-C019 1407 03-05-14 50 0 48 MP1482DN 1407 03-05-14 50 0 48 MP020-5GS 1402 03-05-14 50 0 48 DAS09 1403 03-05-14 50 0 48 MP111DS 1352 03-05-14 50 0 48 MPQ2560DN 1402 03-05-14 50 0 48 MP4462DN 1407 03-05-14 50 0 48 MP2565DN 1408 03-12-14 50 0 48 MP6205DN 1405 03-12-14 50 0 48 MP2482DN 1405 03-12-14 50 0 48 MP2495DS 1406 03-12-14 50 0 48 MP1484EN 1406 03-12-14 50 0 48 MP8706EN 1408 03-12-14 50 0 48 MP4030AGS 1408 03-12-14 50 0 48 MP1432DN 1408 03-12-14 50 0 48 MP2482DN 1350 03-12-14 50 0 48 MP9141ES 1408 03-12-14 50 0 48 MP1423DN 1408 03-19-14 50 0 48 MP1484EN-C166 1402 03-19-14 50 0 48 MP2565DN 1409 03-19-14 50 0 48 MP1423DN 1407 03-19-14 50 0 48 MP26123DR 1408 03-19-14 50 0 48 MP1482DN 1410 03-19-14 50 0 48 MP8709EN 1408 03-19-14 50 0 48 MP2249DN 1345 03-19-14 50 0 48 MP44011HS 1409 03-19-14 50 0 48 MP1484EN 1402 03-19-14 50 0 48 MPGC01DN 1405 03-19-14 50 0 48 MP2490DS 1408 03-19-14 50 0 48 MP1593DN-C218 1409 03-19-14 50 0 48 MP1580HS 1410 03-26-14 50 0 48 MP1482DS 1404 03-26-14 50 0 48 MP1484EN-C166 1402 03-26-14 50 0 48 DAS09 1404 03-26-14 50 0 48 MP8708EN 1404 03-26-14 50 0 48 The Future of Analog IC Technology® - 29 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6902DS 1408 03-26-14 50 0 48 MP200DS 1409 03-26-14 50 0 48 MP1583DN 1410 03-26-14 50 0 48 MP1484EN 1403 03-26-14 50 0 48 MP4560DN 1410 03-26-14 50 0 48 MP6211DN 1409 03-26-14 50 0 48 MP6211DN 1407 03-26-14 50 0 48 FA NO. # of hrs MP8709EN 1408 03-26-14 50 0 48 MPQ2249DN 1409 03-26-14 50 0 48 MP2494DN 1408 03-26-14 50 0 48 MP2307DN 1405 03-26-14 50 0 48 MP2303DN 1410 03-26-14 50 0 48 MP3398AGY 1405 03-26-14 50 0 48 MP3398AGY 1403 03-26-14 50 0 48 MP3398AGY 1402 03-26-14 50 0 48 MP3399EY 1350 03-26-14 50 0 48 MP3394SGS 1349 03-26-14 50 0 48 MP3394SGS 1401 03-26-14 50 0 48 MP3398AGY 1403 03-26-14 50 0 48 MP3394SGS 1402 03-26-14 50 0 48 MP3394SGS 1404 03-26-14 50 0 48 Total 0 4.2.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MP4032-2GS 1341 11-14-13 80 0 MPQ4569GN-AEC1 1329 12-26-13 78 0 MP44010HS 1315 12-31-13 80 0 MP44010HS 1334 12-26-13 80 0 MP4021GS 1339 12-03-13 80 0 MPQ8040GDN 1332 12-20-13 80 0 MPQ8040GDN 1332 12-17-13 80 0 MP45100GN 1346 12-03-13 80 0 Total FA NO. 0 The Future of Analog IC Technology® - 30 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.3 MSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD MSOP8 ANST MSOP8-EP UCD MSOP10-EP ANST MSOP10 UCD MSOP10 ANST MSOP10-EP ANST MSOP8 4.3.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP1542DK 1202 01-08-14 160 0 Total FA NO. 0 SAT picture of MSOP T-SCAN PICTURE C-SCAN PICTURE 4.3.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3213DH 1344 01-09-14 50 0 100 MP6211DH 1350 01-09-14 50 0 100 MP1542DK 1331 01-09-14 50 0 100 FA NO. # of cycle MP2105DK 1344 01-15-14 50 0 100 MP1411DH 1345 01-15-14 50 0 100 MP2105DK 1331 01-17-14 50 0 100 The Future of Analog IC Technology® - 31 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1542DK 1352 01-17-14 50 0 100 MP1542DK-C472 1352 01-22-14 50 0 100 FA NO. # of cycle MP1411DH 1401 01-22-14 50 0 100 MP62071DH 1352 01-29-14 50 0 100 MP6211DH 1352 01-29-14 50 0 100 MP2481DH 1352 01-29-14 50 0 100 MP1542DK 1402 02-19-14 50 0 100 MP1412DH 1352 02-19-14 50 0 100 MP62341DH 1403 02-19-14 50 0 100 MP1542DK 1404 02-26-14 50 0 100 MP1542DK-C472 1406 02-26-14 50 0 100 MP20073DH 1407 03-05-14 50 0 100 MP1542DK 1406 03-05-14 50 0 100 MP1411DH 1403 03-05-14 50 0 100 MP2481DH 1405 03-05-14 50 0 100 MP1542DK 1407 03-05-14 50 0 100 MP1542DK-C472 1407 03-12-14 50 0 100 MP1542DK-C472 1407 03-12-14 50 0 100 MP1542DK 1402 03-19-14 50 0 100 MP1542DK-C472 1408 03-19-14 50 0 100 MP1411DH 1408 03-26-14 50 0 100 MP3213DH 1406 03-26-14 50 0 100 MP2481DH 1407 03-26-14 50 0 100 MP1411DH 1408 03-26-14 50 0 100 Total 0 4.3.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1542DK 1202 01-08-14 80 0 168 MP3213DH 1344 01-09-14 50 0 48 MP6211DH 1350 01-09-14 50 0 48 MP1542DK 1331 01-09-14 50 0 48 MP2105DK 1344 01-15-14 50 0 48 MP1411DH 1345 01-15-14 50 0 48 MP2105DK 1331 01-17-14 50 0 48 FA NO. # of hrs MP1542DK 1352 01-17-14 50 0 48 MP1542DK-C472 1352 01-22-14 50 0 48 MP1411DH 1401 01-22-14 50 0 48 MP62071DH 1352 01-29-14 50 0 48 The Future of Analog IC Technology® - 32 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6211DH 1352 01-29-14 50 0 48 MP2481DH 1352 01-29-14 50 0 48 MP1542DK 1402 02-19-14 50 0 48 FA NO. # of hrs MP1412DH 1352 02-19-14 50 0 48 MP62341DH 1403 02-19-14 50 0 48 MP1542DK 1404 02-26-14 50 0 48 MP1542DK-C472 1406 02-26-14 50 0 48 MP20073DH 1407 03-05-14 50 0 48 MP1542DK 1406 03-05-14 50 0 48 MP1411DH 1403 03-05-14 50 0 48 MP2481DH 1405 03-05-14 50 0 48 MP1542DK 1407 03-05-14 50 0 48 MP1542DK-C472 1407 03-12-14 50 0 48 MP1542DK-C472 1407 03-12-14 50 0 48 MP1542DK 1402 03-19-14 50 0 48 MP1542DK-C472 1408 03-19-14 50 0 48 MP1411DH 1408 03-26-14 50 0 48 MP3213DH 1406 03-26-14 50 0 48 MP2481DH 1407 03-26-14 50 0 48 MP1411DH 1408 03-26-14 50 0 48 Total 0 4.3.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MP1542DK 1202 10-09-13 80 0 Total FA NO. 0 4.4 TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST TSOT23-5 JCET TSOT23-5 ASNT TSOT23-6 JCET TSOT23-6 ASNT TSOT23-8 JCET TSOT23-8 The Future of Analog IC Technology® - 33 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.4.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MPQ2459GJ 1243 01-27-14 260 0 MP3209DJ 1237 03-06-14 100 0 MP2359DJ 1402 03-06-14 80 0 Total FA NO. 0 SAT picture of TSOT T-SCAN PICTURE C-SCAN PICTURE 4.4.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) # of cycle Device D/C Close Date Sample Size # of Fail MPQ2459GJ 1243 01-27-14 90 0 1000 MPQ2013GJ 1335 01-09-14 50 0 100 MP2359DJ 1342 01-09-14 50 0 100 MPQ2451DT 1344 01-15-14 50 0 100 MP3217DJ 1349 01-09-14 50 0 100 MP3209DJ 1349 01-09-14 50 0 100 MP2359DT 1349 01-15-14 50 0 100 MP3204DJ 1347 01-15-14 50 0 100 MP2104DJ 1350 01-15-14 50 0 100 MP1518DJ 1352 01-15-14 50 0 100 MP3217DJ 1351 01-22-14 50 0 100 MP62551DJ 1350 01-22-14 50 0 100 MP3217DJ 1351 01-22-14 50 0 100 MP6400DJ-01 1352 01-17-14 50 0 100 MP3217DJ 1351 01-22-14 50 0 100 FA NO. The Future of Analog IC Technology® - 34 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2357DT 1401 01-23-14 50 0 100 MP62055EJ 1349 01-23-14 50 0 100 FA NO. # of cycle MP2359DJ 1336 01-23-14 50 0 100 MP6400DJ-01 1351 01-29-14 50 0 100 MP2259DJ 1349 01-29-14 50 0 100 MP3217DJ 1349 02-19-14 50 0 100 MP2456GJ 1322 01-29-14 50 0 100 MP2105DJ 1402 02-19-14 50 0 100 MP3216DJ 1401 02-19-14 50 0 100 MP2459GJ 1351 02-19-14 50 0 100 MP1469GJ 1403 02-19-14 50 0 100 MP2451DT 1402 02-19-14 50 0 100 MP62055EJ 1351 02-26-14 50 0 100 MP6400DJ-01 1402 02-26-14 50 0 100 MP8801DJ-2.85 1404 02-26-14 50 0 100 MP3205DJ 1405 02-26-14 50 0 100 MPQ9361DJ 1339 03-05-14 50 0 100 MP2451DT 1402 02-26-14 50 0 100 MP6400DJ-33 1407 03-05-14 50 0 100 MPQ2451DT 1404 03-05-14 50 0 100 MP6400DJ-01 1404 03-05-14 50 0 100 MP2370DJ 1352 03-05-14 50 0 100 MP62551DJ 1401 03-12-14 50 0 100 MP1540DJ 1404 03-12-14 50 0 100 MP6400DJ-01 1405 03-12-14 50 0 100 MP65151DJ 1407 03-12-14 50 0 100 MP62551DJ 1408 03-12-14 50 0 100 MP2451DT 1404 03-12-14 50 0 100 MP1540DJ 1405 03-19-14 50 0 100 MP3217DJ 1408 03-19-14 50 0 100 MP3120DJ 1408 03-19-14 50 0 100 MP3217DJ 1408 03-19-14 50 0 100 MP2357DJ 1405 03-19-14 50 0 100 MP62055EJ 1408 03-19-14 50 0 100 MP2105DJ 1409 03-19-14 50 0 100 MP65150DJ 1401 03-19-14 50 0 100 MP1469GJ 1410 03-26-14 50 0 100 MP65151DJ 1410 03-26-14 50 0 100 MP2451DT 1404 03-26-14 50 0 100 MP2103DJ 1221 03-26-14 50 0 100 MP2451DT 1406 03-26-14 50 0 100 Total 0 The Future of Analog IC Technology® - 35 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.4.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail MPQ2459GJ 1243 01-27-14 90 0 168 FA NO. # of hrs MP2359DJ 1402 03-06-14 80 0 168 MPQ2013GJ 1335 01-09-14 50 0 48 MP2359DJ 1342 01-09-14 50 0 48 MPQ2451DT 1344 01-15-14 50 0 48 MP3217DJ 1349 01-09-14 50 0 48 MP3209DJ 1349 01-09-14 50 0 48 MP2359DT 1349 01-15-14 50 0 48 MP3204DJ 1347 01-15-14 50 0 48 MP2104DJ 1350 01-15-14 50 0 48 MP3204DJ 1350 01-15-14 50 0 48 MP1518DJ 1352 01-15-14 50 0 48 MP3217DJ 1351 01-22-14 50 0 48 MP62551DJ 1350 01-22-14 50 0 48 MP3217DJ 1351 01-22-14 50 0 48 MP6400DJ-01 1352 01-17-14 50 0 48 MP3217DJ 1351 01-22-14 50 0 48 MP2357DT 1401 01-23-14 50 0 48 MP62055EJ 1349 01-23-14 50 0 48 MP2359DJ 1336 01-23-14 50 0 48 MP6400DJ-01 1351 01-29-14 50 0 48 MP2259DJ 1349 01-29-14 50 0 48 MP3217DJ 1349 02-19-14 50 0 48 MP2456GJ 1322 01-29-14 50 0 48 MP2105DJ 1402 02-19-14 50 0 48 MP3216DJ 1401 02-19-14 50 0 48 MP2459GJ 1351 02-19-14 50 0 48 MP1469GJ 1403 02-19-14 50 0 48 MP2451DT 1402 02-19-14 50 0 48 MP62055EJ 1351 02-26-14 50 0 48 MP6400DJ-01 1402 02-26-14 50 0 48 MP8801DJ-2.85 1404 02-26-14 50 0 48 MP3205DJ 1405 02-26-14 50 0 48 MPQ9361DJ 1339 03-05-14 50 0 48 MP2451DT 1402 02-26-14 50 0 48 MP6400DJ-33 1407 03-05-14 50 0 48 MPQ2451DT 1404 03-05-14 50 0 48 MP6400DJ-01 1404 03-05-14 50 0 48 MP2370DJ 1352 03-05-14 50 0 48 The Future of Analog IC Technology® - 36 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP62551DJ 1401 03-12-14 50 0 48 MP1540DJ 1404 03-12-14 50 0 48 MP6400DJ-01 1405 03-12-14 50 0 48 MP65151DJ 1407 03-12-14 50 0 48 MP62551DJ 1408 03-12-14 50 0 48 MP2451DT 1404 03-12-14 50 0 48 MP1540DJ 1405 03-19-14 50 0 48 MP3217DJ 1408 03-19-14 50 0 48 MP3120DJ 1408 03-19-14 50 0 48 MP3217DJ 1408 03-19-14 50 0 48 MP2357DJ 1405 03-19-14 50 0 48 MP62055EJ 1408 03-19-14 50 0 48 MP2105DJ 1409 03-19-14 50 0 48 MP65150DJ 1401 03-19-14 50 0 48 MP1469GJ 1410 03-26-14 50 0 48 MP65151DJ 1410 03-26-14 50 0 48 FA NO. # of hrs MP2451DT 1404 03-26-14 50 0 48 MP2103DJ 1221 03-26-14 50 0 48 MP2451DT 1406 03-26-14 50 0 48 MP6400DJ-01 1410 03-26-14 50 0 48 Total 0 4.4.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MPQ2459GJ 1243 01-27-14 80 0 MP3209DJ 1237 03-06-14 80 0 Total FA NO. 0 4.5 TSSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD TSSOP20 ASNT TSSOP16-EP UCD TSSOP20-EP ASNT TSSOP20 ASNT TSSOP8 ASNT TSSOP20-EP ASNT TSSOP14 ASNT TSSOP24 ASNT TSSOP16 ASNT TSSOP28 ASNT TSSOP28-EP JCET TSSOP8 The Future of Analog IC Technology® - 37 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.5.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3373GM 1329 02-21-14 300 0 MP3399EF 1330 01-27-14 165 0 MPQ7731DF 1310 03-06-14 100 0 MPQ4570GF 1344 03-11-14 250 0 Total FA NO. 0 SAT picture of TSSOP T-SCAN PICTURE C-SCAN PICTURE 4.5.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3373GM 1329 02-21-14 94 0 FA NO. # of cycle 1000 MP3399EF 1330 01-27-14 82 0 1000 MPQ4570GF 1344 03-11-14 79 0 1000 MP2364DF 1351 01-09-14 50 0 100 MP3394EF 1351 01-15-14 50 0 100 MP3394EF 1351 01-15-14 50 0 100 MP7782DF 1350 01-15-14 50 0 100 MP8126DF 1401 01-29-14 50 0 100 MP8125EF 1352 01-22-14 50 0 100 MP8126DF 1401 01-29-14 50 0 100 MP3394SGF 1351 02-19-14 50 0 100 MP3391EF 1351 02-19-14 50 0 100 The Future of Analog IC Technology® - 38 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8126DF 1401 02-19-14 50 0 100 MP8126DF 1402 02-26-14 50 0 100 MP6507GF 1402 03-05-14 50 0 100 MP8125EF 1404 03-05-14 50 0 100 MP8125EF 1405 03-05-14 50 0 100 FA NO. # of cycle MP6507GF 1402 03-05-14 50 0 100 MP1530DM 1351 03-12-14 50 0 100 MP6505DM 1402 03-12-14 50 0 100 MP8125EF 1407 03-26-14 50 0 100 MP6507GF 1406 03-19-14 50 0 100 MP6507AGF 1335 03-26-14 50 0 100 MP6507GF 1402 03-26-14 50 0 100 MP6507GF 1408 03-26-14 50 0 100 Total 0 4.5.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail MP3373GM 1329 02-21-14 97 0 168 FA NO. # of hrs MP3399EF 1330 01-27-14 77 0 168 MPQ4570GF 1344 03-11-14 77 0 168 MP2364DF 1351 01-09-14 50 0 48 MP3394EF 1351 01-15-14 50 0 48 MP3394EF 1351 01-15-14 50 0 48 MP7782DF 1350 01-15-14 50 0 48 MP8126DF 1401 01-29-14 50 0 48 MP8125EF 1352 01-22-14 50 0 48 MP8126DF 1401 01-29-14 50 0 48 MP3394SGF 1351 02-19-14 50 0 48 MP3391EF 1351 02-19-14 50 0 48 MP8126DF 1401 02-19-14 50 0 48 MP8126DF 1402 02-26-14 50 0 48 MP6507GF 1402 03-05-14 50 0 48 MP8125EF 1404 03-05-14 50 0 48 MP8125EF 1405 03-05-14 50 0 48 MP6507GF 1402 03-05-14 50 0 48 MP1530DM 1351 03-12-14 50 0 48 MP6505DM 1402 03-12-14 50 0 48 MP8125EF 1407 03-26-14 50 0 48 MP6507GF 1406 03-19-14 50 0 48 The Future of Analog IC Technology® - 39 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6507AGF 1335 03-26-14 50 0 48 MP6507GF 1402 03-26-14 50 0 48 MP6507GF 1408 03-26-14 50 0 48 Total FA NO. # of hrs 0 4.5.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MPQ7731DF 1310 03-06-14 78 0 MPQ4570GF 1344 03-11-14 78 0 Total FA NO. 0 4.6 FLIP CHIP-QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD FCQFN1*1.5 UTAC FCQFN2*2 UCD FCQFN1.5*2 UTAC FCQFN2*3 UCD FCQFN2*2 UTAC FCQFN3*3 UCD FCQFN2*3 UTAC FCQFN3*4 UCD FCQFN3*3 UTAC FCQFN4*4 UCD FCQFN3*4 UTAC FCQFN4*5 UCD FCQFN3*5 UTAC FCQFN4*6 UCD FCQFN4*4 UTAC FCQFN5*5 UCD FCQFN4*5 UTAC FCQFN5*6 UCD FCQFN4*6 UTAC FCQFN6*6 4.6.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MPM3830GQV 1341 01-21-14 400 0 MP5018GD 1341 01-22-14 400 0 MPQ8632GL-10 1326 01-21-14 300 0 MP2145GD 1332 01-13-14 97 0 MPM3830GQV 1333 01-21-14 400 0 MP2145GD 1332 01-13-14 402 0 MPM3805GQB-33 1334 01-16-14 300 0 FA NO. The Future of Analog IC Technology® - 40 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPM3805GQB-25 1337 01-16-14 300 0 MPM3830GQV 1333 01-21-14 110 0 MP2615GQ 1336 01-08-14 400 0 MPM3810GQB 1334 01-23-14 50 0 MPM3805GQB 1341 01-23-14 50 0 MP1499GD 1335 02-13-14 100 0 MPQ8636HGV-20 1343 01-27-14 200 0 MPM3820GQV 1347 02-21-14 270 0 MP2316DG 1338 12-05-13 100 0 MP28251GD 1339 12-05-13 173 0 MP28251GD 1339 12-05-13 200 0 Total FA NO. 0 SAT picture of FLIP CHIP-QFN T-SCAN PICTURE C-SCAN PICTURE 4.6.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail FA NO. # of cycle MPM3830GQV 1341 01-21-14 94 0 1000 MPQ8632GL-10 1326 01-21-14 94 0 1000 MP2145GD 1332 01-13-14 97 0 1000 MPM3830GQV 1333 01-21-14 94 0 1000 MP2145GD 1332 01-13-14 94 0 1000 MPM3805GQB-33 1334 01-16-14 94 0 1000 MPM3805GQB-25 1337 01-16-14 94 0 1000 MP2615GQ 1336 01-08-14 94 0 1000 MPM3810GQB 1334 01-23-14 47 0 1000 The Future of Analog IC Technology® - 41 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPM3805GQB 1341 01-23-14 46 0 1000 MPQ8636HGV-20 1343 01-27-14 91 0 1000 MPM3820GQV 1347 02-21-14 79 0 1000 MP5505GL 1329 03-26-14 50 0 100 FA NO. # of cycle MP5505GL 1335 03-12-14 50 0 100 NB671GQ 1339 01-09-14 50 0 100 NB671LGQ 1339 01-09-14 50 0 100 NB671GQ 1342 01-23-14 50 0 100 NB671GQ 1339 01-17-14 50 0 100 NB671GQ 1342 01-15-14 50 0 100 NB671GQ 1342 01-21-14 50 0 100 MPM3805GQB 1347 01-29-14 50 0 100 NB671GQ 1345 01-21-14 50 0 100 MPM3810GQB 1347 01-17-14 50 0 100 MP28251GD 1345 01-17-14 50 0 100 NB671GQ 1346 01-21-14 50 0 100 NB671GQ 1346 01-21-14 50 0 100 NB671LGQ 1341 01-29-14 50 0 100 NB671GQ 1346 01-21-14 50 0 100 NB650AGL 1344 01-16-14 50 0 100 NB671GQ 1349 01-21-14 50 0 100 NB671GQ 1345 01-21-14 50 0 100 NB671LGQ 1349 03-12-14 50 0 100 MP9180DG 1351 01-09-14 50 0 100 MP8760GL 1349 01-09-14 50 0 100 MP28251GD 1351 01-23-14 50 0 100 MP9180DG 1351 01-09-14 50 0 100 MP86885GQWT 1329 01-09-14 50 0 100 MP2158GQH 1351 01-09-14 50 0 100 NB650AGL 1351 01-16-14 50 0 100 NB650AGL 1351 01-16-14 50 0 100 MP28258DD-C471 1351 01-09-14 50 0 100 MP8736DL 1352 01-09-14 50 0 100 NB671LGQ 1349 03-12-14 50 0 100 MPQ8636GVE-20 1349 01-09-14 50 0 100 MPQ8636HGL-10 1350 01-09-14 50 0 100 NB671GQ 1347 01-09-14 50 0 100 MP2130DG 1350 01-09-14 50 0 100 NB671GQ 1349 01-09-14 50 0 100 MPQ8632GV-20 1344 01-09-14 50 0 100 MPQ8632GLE-12 1348 01-15-14 50 0 100 NB671GQ 1352 01-21-14 50 0 100 The Future of Analog IC Technology® - 42 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ8632GL-6 1351 01-15-14 50 0 FA NO. # of cycle 100 MP28258DD-C471 1352 01-15-14 50 0 100 NB671GQ 1401 01-17-14 50 0 100 NB671GQ 1401 01-17-14 50 0 100 MP8620DQK 1349 01-15-14 50 0 100 MP28251GD 1352 01-15-14 50 0 100 MPQ8632GL-12 1352 01-23-14 50 0 100 MP86884DOKT 1351 01-15-14 50 0 100 MP28251GD 1349 01-15-14 50 0 100 MP9180DG 1351 01-15-14 50 0 100 NB671GQ 1401 01-15-14 50 0 100 MPQ8632GL-12 1351 01-17-14 50 0 100 MPQ8632GL-6 1351 01-17-14 50 0 100 MPM3810GQB 1351 03-05-14 50 0 100 MPQ8632GVE-15 1351 01-17-14 50 0 100 NB671GQ 1351 01-17-14 50 0 100 MP28251GD 1351 01-17-14 50 0 100 MP28251GD 1351 02-19-14 50 0 100 MP8762GL 1352 01-17-14 50 0 100 MPM3805GQB 1352 03-05-14 50 0 100 MPQ8632GL-10 1352 01-17-14 50 0 100 NB671AGQ 1402 01-22-14 50 0 100 NB671GQ 1347 01-17-14 50 0 100 NB671GQ 1351 01-17-14 50 0 100 MP28251GD 1349 01-22-14 50 0 100 NB671GQ 1351 01-23-14 50 0 100 MP28251GD 1352 01-22-14 50 0 100 NB671GQ 1401 01-22-14 50 0 100 MP28251GD 1350 01-22-14 50 0 100 MP2130DG-C423 1312 01-22-14 50 0 100 MP28258DD 1352 01-22-14 50 0 100 MP8736DL 1401 01-22-14 50 0 100 NB671GQ 1401 01-22-14 50 0 100 NB670GQ 1322 01-22-14 50 0 100 MPQ8632GL-10 1401 01-22-14 50 0 100 NB671GQ 1349 01-23-14 50 0 100 NB671GQ 1401 01-23-14 50 0 100 MPQ8632GL-10 1352 01-23-14 50 0 100 MP28258DD 1349 01-23-14 50 0 100 MP9447GL 1403 01-29-14 50 0 100 MP28251GD 1352 01-29-14 50 0 100 MP28259DD 1352 01-29-14 50 0 100 The Future of Analog IC Technology® - 43 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C Close Date PRODUCT RELIABILITY REPORT Sample Size # of Fail FA NO. # of cycle MP8760GLE 1401 01-29-14 50 0 100 MP28251GD 1352 01-29-14 50 0 100 MPQ8632DGLE-6 1344 01-29-14 50 0 100 MP8620DQK 1352 01-29-14 50 0 100 NB671LGQ 1350 01-29-14 50 0 100 MP8761GLE 1335 02-26-14 50 0 100 MPQ8632GVE-20 1401 02-19-14 50 0 100 MP8620DQK 1352 02-19-14 50 0 100 MPQ8632GL-8 1346 02-19-14 50 0 100 MP8620DQK 1352 02-19-14 50 0 100 MP28251GD 1403 02-26-14 50 0 100 MPQ8632GL-12 1402 02-19-14 50 0 100 NB671LGQ 1349 03-26-14 50 0 100 MP28251GD 1402 02-19-14 50 0 100 MP8606DL 1402 02-19-14 50 0 100 NB671GQ 1401 02-19-14 50 0 100 MPQ8632GVE-20 1401 02-19-14 50 0 100 NB671GQ 1402 02-19-14 50 0 100 NB650GL 1403 02-19-14 50 0 100 NB670GQ 1322 02-19-14 50 0 100 MP2308GD 1404 02-19-14 50 0 100 MP2162GQH 1402 02-19-14 50 0 100 MPQ8636GVE-20 1401 02-19-14 50 0 100 MP8760GL 1404 02-19-14 50 0 100 MP28251GD 1404 02-19-14 50 0 100 MP2162GQH 1401 02-19-14 50 0 100 MP28251GD 1352 02-19-14 50 0 100 MP28258DD 1401 02-19-14 50 0 100 NB650HGL 1352 02-19-14 50 0 100 MP28251GD 1403 02-19-14 50 0 100 NB671LGQ 1351 03-26-14 50 0 100 NB671GQ 1402 02-19-14 50 0 100 MP9151GD 1404 02-19-14 50 0 100 MP38876DL 1404 02-26-14 50 0 100 MP2140DD 1404 02-26-14 50 0 100 MP2139DD-C563 1329 02-26-14 50 0 100 MP28258DD-C471 1403 02-26-14 50 0 100 MP86884DOKT 1403 02-26-14 50 0 100 MP2162GQH 1403 02-26-14 50 0 100 NB671GQ 1351 02-26-14 50 0 100 MP86884DOKT 1403 02-26-14 50 0 100 NB671AGQ 1403 02-26-14 50 0 100 The Future of Analog IC Technology® - 44 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2130DG 1404 03-05-14 50 0 100 MP8620DQK 1406 03-05-14 50 0 100 FA NO. # of cycle MPQ8636GL-10 1405 03-05-14 50 0 100 MPQ8632GVE-15 1344 02-26-14 50 0 100 NB670GQ 1322 03-05-14 50 0 100 NB670GQ 1323 03-05-14 50 0 100 MP28258DD-C471 1403 03-05-14 50 0 100 MPM3805GQB-12 1405 03-05-14 50 0 100 MPQ8632GL-6 1401 03-05-14 50 0 100 MP2139DD-C563 1329 03-05-14 50 0 100 MP28251GD 1408 03-05-14 50 0 100 NB670GQ 1323 03-05-14 50 0 100 MP28251GD 1404 03-05-14 50 0 100 NB650AGL 1409 03-12-14 50 0 100 NB650AGL 1408 03-12-14 50 0 100 MPQ8636GL-10 1404 03-12-14 50 0 100 NB670GQ 1404 03-12-14 50 0 100 MPQ8636GLE-10 1408 03-12-14 50 0 100 MPQ8632GL-10 1404 03-12-14 50 0 100 MPQ8636GL-10 1408 03-12-14 50 0 100 MPQ8616GL-6 1351 03-19-14 50 0 100 MPQ8636GL-10 1408 03-12-14 50 0 100 MP2140DD 1404 03-12-14 50 0 100 NB671AGQ 1404 03-19-14 50 0 100 MP38875DL 1409 03-19-14 50 0 100 MPQ8616GL-12 1408 03-19-14 50 0 100 NB650AGL 1409 03-19-14 50 0 100 NB650AGL 1409 03-19-14 50 0 100 MPQ4470AGL-AEC1 1409 03-19-14 50 0 100 03-19-14 50 0 100 MPQ8632GLE-10 1346 MPQ4470GL 1404 03-19-14 50 0 100 MP28251GD 1408 03-19-14 50 0 100 MPQ8632GL-4 1403 03-19-14 50 0 100 MP8620DQK 1408 03-19-14 50 0 100 MP5018GD 1410 03-26-14 50 0 100 NB671LAGQ 1408 03-26-14 50 0 100 MPQ8632DGLE12-12 1344 03-26-14 50 0 100 NB670GQ 1404 03-26-14 50 0 100 MP2158GQH 1409 03-26-14 50 0 100 MP9180DG 1409 03-26-14 50 0 100 MP28258DD-C471 1410 03-26-14 50 0 100 MPQ8636GLE-10 1408 03-26-14 50 0 100 The Future of Analog IC Technology® - 45 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2130DG 1408 03-26-14 50 0 100 MP28251GD 1409 03-26-14 50 0 100 FA NO. # of cycle NB670GQ 1329 03-26-14 50 0 100 MP28258DD-C471 1410 03-26-14 50 0 100 MPQ4470GL-AEC1 1409 03-26-14 50 0 100 MP2162GQH 1409 03-26-14 50 0 100 Total 0 4.6.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail MPM3830GQV 1341 01-21-14 97 0 168 MP5018GD 1341 01-22-14 97 0 168 MPQ8632GL-10 1326 01-21-14 97 0 168 MPM3830GQV 1333 01-21-14 97 0 168 MP2145GD 1332 01-13-14 97 0 168 MPM3805GQB-33 1334 01-16-14 97 0 168 FA NO. # of hrs MPM3805GQB-25 1337 01-16-14 97 0 168 MP2615GQ 1336 01-08-14 97 0 168 MPM3810GQB 1334 01-23-14 47 0 168 MPM3805GQB 1341 01-23-14 47 0 168 MPQ8636HGV-20 1343 01-27-14 97 0 168 MPM3820GQV 1347 02-21-14 77 0 168 MP5505GL 1329 03-26-14 50 0 48 MP5505GL 1335 03-12-14 50 0 48 NB671GQ 1339 01-09-14 50 0 48 NB671LGQ 1339 01-09-14 50 0 48 NB671GQ 1342 01-23-14 50 0 48 NB671GQ 1339 01-17-14 50 0 48 NB671GQ 1342 01-15-14 50 0 48 NB671GQ 1342 01-21-14 50 0 48 MPM3805GQB 1347 01-29-14 50 0 48 NB671GQ 1345 01-21-14 50 0 48 MPM3810GQB 1347 01-17-14 50 0 48 MP28251GD 1345 01-17-14 50 0 168 NB671GQ 1346 01-21-14 50 0 168 NB671GQ 1346 01-21-14 50 0 168 NB671LGQ 1341 01-29-14 50 0 168 NB671GQ 1346 01-21-14 50 0 168 NB650AGL 1344 01-16-14 50 0 168 The Future of Analog IC Technology® - 46 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB671GQ 1349 01-21-14 50 0 168 NB671GQ 1345 01-21-14 50 0 168 FA NO. # of hrs NB671LGQ 1349 03-12-14 50 0 168 MP9180DG 1351 01-09-14 50 0 168 MP8760GL 1349 01-09-14 50 0 168 MP28251GD 1351 01-23-14 50 0 168 MP9180DG 1351 01-09-14 50 0 168 MP86885GQWT 1329 01-09-14 50 0 168 MP2158GQH 1351 01-09-14 50 0 168 NB650AGL 1351 01-16-14 50 0 168 NB650AGL 1351 01-16-14 50 0 168 MP28258DD-C471 1351 01-09-14 50 0 168 MP8736DL 1352 01-09-14 50 0 168 NB671LGQ 1349 03-12-14 50 0 168 MPQ8636GVE-20 1349 01-09-14 50 0 168 MPQ8636HGL-10 1350 01-09-14 50 0 168 NB671GQ 1347 01-09-14 50 0 168 MP2130DG 1350 01-09-14 50 0 168 NB671GQ 1349 01-09-14 50 0 168 MPQ8632GV-20 1344 01-09-14 50 0 168 MPQ8632GLE-12 1348 01-15-14 50 0 168 NB671GQ 1352 01-21-14 50 0 168 MPQ8632GL-6 1351 01-15-14 50 0 168 MP28258DD-C471 1352 01-15-14 50 0 168 NB671GQ 1401 01-17-14 49 0 48 NB671GQ 1401 01-17-14 50 0 48 MP8620DQK 1349 01-15-14 50 0 48 MP28251GD 1352 01-15-14 50 0 48 MPQ8632GL-12 1352 01-23-14 50 0 48 MP86884DOKT 1351 01-15-14 50 0 48 MP28251GD 1349 01-15-14 50 0 48 MP9180DG 1351 01-15-14 50 0 48 NB671GQ 1401 01-15-14 50 0 48 MPQ8632GL-12 1351 01-17-14 50 0 48 MPQ8632GL-6 1351 01-17-14 50 0 48 MPM3810GQB 1351 03-05-14 50 0 48 MPQ8632GVE-15 1351 01-17-14 50 0 48 NB671GQ 1351 01-17-14 50 0 48 MP28251GD 1351 01-17-14 50 0 48 MP28251GD 1351 02-19-14 50 0 48 MP8762GL 1352 01-17-14 50 0 48 MPM3805GQB 1352 03-05-14 50 0 48 The Future of Analog IC Technology® - 47 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail FA NO. # of hrs MPQ8632GL-10 1352 01-17-14 50 0 48 NB671AGQ 1402 01-22-14 50 0 48 NB671GQ 1347 01-17-14 50 0 48 NB671GQ 1351 01-17-14 50 0 48 MP28251GD 1349 01-22-14 50 0 48 NB671GQ 1351 01-23-14 50 0 48 MP28251GD 1352 01-22-14 50 0 48 NB671GQ 1401 01-22-14 50 0 48 MP28251GD 1350 01-22-14 50 0 48 MP2130DG-C423 1312 01-22-14 50 0 48 MP28258DD 1352 01-22-14 50 0 48 MP8736DL 1401 01-22-14 50 0 48 NB671GQ 1401 01-22-14 50 0 48 NB670GQ 1322 01-22-14 50 0 48 MPQ8632GL-10 1401 01-22-14 50 0 48 NB671GQ 1349 01-23-14 50 0 48 NB671GQ 1401 01-23-14 50 0 48 MPQ8632GL-10 1352 01-23-14 50 0 48 MP28258DD 1349 01-23-14 50 0 48 MP9447GL 1403 01-29-14 50 0 48 MP28251GD 1352 01-29-14 50 0 48 MP28259DD 1352 01-29-14 50 0 48 MP8760GLE 1401 01-29-14 50 0 48 MP28251GD 1352 01-29-14 50 0 48 MPQ8632DGLE-6 1344 01-29-14 50 0 48 MP8620DQK 1352 01-29-14 50 0 48 NB671LGQ 1350 01-29-14 50 0 48 MP8761GLE 1335 02-26-14 50 0 48 MPQ8632GVE-20 1401 02-19-14 50 0 48 MP8620DQK 1352 02-19-14 50 0 48 MPQ8632GL-8 1346 02-19-14 50 0 48 MP8620DQK 1352 02-19-14 50 0 48 MP28251GD 1403 02-26-14 50 0 48 MPQ8632GL-12 1402 02-19-14 50 0 48 NB671LGQ 1349 03-26-14 50 0 48 MP28251GD 1402 02-19-14 50 0 48 MP8606DL 1402 02-19-14 50 0 48 NB671GQ 1401 02-19-14 50 0 48 MPQ8632GVE-20 1401 02-19-14 50 0 48 NB671GQ 1402 02-19-14 50 0 48 NB650GL 1403 02-19-14 50 0 48 NB670GQ 1322 02-19-14 50 0 48 The Future of Analog IC Technology® - 48 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail FA NO. # of hrs MP2308GD 1404 02-19-14 50 0 48 MP2162GQH 1402 02-19-14 50 0 48 MPQ8636GVE-20 1401 02-19-14 50 0 48 MP8760GL 1404 02-19-14 50 0 48 MP28251GD 1404 02-19-14 50 0 48 MP2162GQH 1401 02-19-14 50 0 48 MP28251GD 1352 02-19-14 50 0 48 MP28258DD 1401 02-19-14 50 0 48 NB650HGL 1352 02-19-14 50 0 48 MP28251GD 1403 02-19-14 50 0 48 NB671LGQ 1351 03-26-14 50 0 48 NB671GQ 1402 02-19-14 50 0 48 MP9151GD 1404 02-19-14 50 0 48 MP38876DL 1404 02-26-14 50 0 48 MP2140DD 1404 02-26-14 50 0 48 MP2139DD-C563 1329 02-26-14 50 0 48 MP28258DD-C471 1403 02-26-14 50 0 48 MP86884DOKT 1403 02-26-14 50 0 48 MP2162GQH 1403 02-26-14 50 0 48 NB671GQ 1351 02-26-14 50 0 48 MP86884DOKT 1403 02-26-14 50 0 48 NB671AGQ 1403 02-26-14 50 0 48 MP2130DG 1404 03-05-14 50 0 48 MP8620DQK 1406 03-05-14 50 0 48 MPQ8636GL-10 1405 03-05-14 50 0 48 MPQ8632GVE-15 1344 02-26-14 50 0 48 NB670GQ 1322 03-05-14 50 0 48 NB670GQ 1323 03-05-14 50 0 48 MP28258DD-C471 1403 03-05-14 50 0 48 MPM3805GQB-12 1405 03-05-14 50 0 48 MPQ8632GL-6 1401 03-05-14 50 0 48 MP2139DD-C563 1329 03-05-14 50 0 48 MP28251GD 1408 03-05-14 50 0 48 NB670GQ 1323 03-05-14 50 0 48 MP28251GD 1404 03-05-14 50 0 48 NB650AGL 1409 03-12-14 50 0 48 NB650AGL 1408 03-12-14 50 0 48 MPQ8636GL-10 1404 03-12-14 50 0 48 NB670GQ 1404 03-12-14 50 0 48 MPQ8636GLE-10 1408 03-12-14 50 0 48 MPQ8632GL-10 1404 03-12-14 50 0 48 MPQ8636GL-10 1408 03-12-14 50 0 48 The Future of Analog IC Technology® - 49 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ8616GL-6 1351 03-19-14 50 0 FA NO. # of hrs 48 MPQ8636GL-10 1408 03-12-14 50 0 48 MP2140DD 1404 03-12-14 50 0 48 NB671AGQ 1404 03-19-14 50 0 48 MP38875DL 1409 03-19-14 50 0 48 MPQ8616GL-12 1408 03-19-14 50 0 48 NB650AGL 1409 03-19-14 50 0 48 NB650AGL 1409 03-19-14 50 0 48 MPQ4470AGL-AEC1 1409 03-19-14 50 0 48 MPQ8632GLE-10 1346 03-19-14 50 0 48 MPQ4470GL 1404 03-19-14 50 0 48 MP28251GD 1408 03-19-14 50 0 48 MPQ8632GL-4 1403 03-19-14 50 0 48 MP8620DQK 1408 03-19-14 50 0 48 MP5018GD 1410 03-26-14 50 0 48 NB671LAGQ 1408 03-26-14 50 0 48 MPQ8632DGLE12-12 1344 03-26-14 50 0 48 50 0 48 NB670GQ 1404 03-26-14 MP2158GQH 1409 03-26-14 50 0 48 MP9180DG 1409 03-26-14 50 0 48 MP28258DD-C471 1410 03-26-14 50 0 48 MPQ8636GLE-10 1408 03-26-14 50 0 48 MP2130DG 1408 03-26-14 50 0 48 MP28251GD 1409 03-26-14 50 0 48 NB670GQ 1329 03-26-14 50 0 48 MP28258DD-C471 1410 03-26-14 50 0 48 MPQ4470GL-AEC1 1409 03-26-14 50 0 48 MP2162GQH 1409 03-26-14 50 0 48 Total 0 4.6.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MPM3830GQV 1341 01-21-14 90 0 MP5018GD 1341 01-22-14 100 0 MPQ8632GL-10 1326 01-21-14 90 0 MPM3830GQV 1333 01-21-14 90 0 MP2145GD 1332 01-13-14 90 0 MPM3805GQB-33 1334 01-16-14 102 0 MPM3830GQV 1333 01-21-14 90 0 FA NO. The Future of Analog IC Technology® - 50 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2615GQ 1336 01-08-14 80 0 MPM3810GQB 1334 01-23-14 50 0 MPM3805GQB 1341 01-23-14 50 0 MPM3820GQV 1347 02-21-14 81 0 MP5505GL 1329 03-26-14 50 0 MP5505GL 1335 03-12-14 50 0 NB671GQ 1339 01-09-14 50 0 NB671LGQ 1339 01-09-14 50 0 NB671GQ 1342 01-23-14 50 0 NB671GQ 1339 01-17-14 50 0 NB671GQ 1342 01-15-14 50 0 MPM3805GQB 1347 01-29-14 50 0 MPM3810GQB 1347 01-17-14 50 0 MP28251GD 1345 01-17-14 50 0 NB671LGQ 1341 01-29-14 50 0 NB671LGQ 1349 03-12-14 50 0 MP28251GD 1351 01-23-14 50 0 NB671LGQ 1349 03-12-14 50 0 MPM3810GQB 1351 03-05-14 50 0 MP28251GD 1351 02-19-14 50 0 MPM3805GQB 1352 03-05-14 50 0 MP28251GD 1403 02-26-14 50 0 NB671LGQ 1349 03-26-14 50 0 NB671LGQ 1351 03-26-14 50 0 MPM3805GQB-12 1405 03-05-14 50 0 Total FA NO. 0 4.7 FLIP CHIP-SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD ANST FCSOIC8 FCSOIC8 JCET FCSOIC8 ANST FCSOIC16 4.7.1 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1482DS 1251 01-09-14 50 0 FA NO. # of cycle 100 The Future of Analog IC Technology® - 51 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28258DS 1329 12-31-13 50 0 100 MP1493DS 1349 01-17-14 50 0 100 MP1492DS 1351 01-22-14 50 0 100 MP28258DS 1401 01-29-14 50 0 100 MP1493DS 1402 02-19-14 50 0 100 MP1492DS 1404 02-26-14 50 0 100 MP28258DS 1408 03-12-14 50 0 100 MP1493DS 1408 03-19-14 50 0 100 MP1493DS 1407 03-26-14 50 0 100 Total FA NO. # of cycle 0 4.7.2 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP28258DS 1329 12-31-13 50 0 48 MP1493DS 1349 01-17-14 50 0 48 MP1492DS 1351 01-22-14 50 0 48 MP28258DS 1401 01-29-14 50 0 48 MP1493DS 1402 02-19-14 50 0 48 MP1492DS 1404 02-26-14 50 0 48 MP28258DS 1408 03-12-14 50 0 48 MP1493DS 1408 03-19-14 50 0 48 MP1493DS 1407 03-26-14 50 0 48 Total FA NO. # of hrs 0 4.8 FLIP CHIP-TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST FCTSOT-5 JCET FCTSOT-6 ANST FCTSOT-6 JCET FCTSOT-8 ANST FCTSOT-8 4.8.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP4026GJ 1338 01-13-14 100 0 MP4027GJ 1337 01-13-14 100 0 FA NO. The Future of Analog IC Technology® - 52 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP4027GJ 1337 01-13-14 200 0 MP2318GJ 1342 01-10-14 85 0 MP4026GJ 1351 02-25-14 85 0 MP4026GJ 1351 02-25-14 88 0 MPQ4420GJ 1323 02-21-14 400 0 MP150GJ 1311 02-25-14 200 0 MP2225GJ 1344 02-13-14 396 0 MP1494DJ 1349 02-11-14 245 0 MP4026GJ 1351 02-25-14 89 0 MP1494DJ 1351 02-21-14 170 0 MP1494DJ 1351 02-21-14 170 0 MP4027GJ 1330 03-13-14 260 0 MP4027GJ 1329 03-13-14 260 0 MP150GJ 1348 03-11-14 100 0 MPQ2143DJ 1347 01-27-14 165 0 MPQ2143DJ 1347 01-27-14 165 0 MPQ2143DJ 1304 01-27-14 50 0 Total FA NO. 0 SAT picture of FLIP CHIP-TSOT T-SCAN PICTURE C-SCAN PICTURE 4.8.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP4027GJ 1337 01-13-14 92 0 1000 MPQ4420GJ 1323 02-21-14 94 0 1000 FA NO. # of cycle The Future of Analog IC Technology® - 53 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2225GJ 1344 02-13-14 94 0 1000 FA NO. # of cycle MP1494DJ 1349 02-11-14 79 0 1000 MP4026GJ 1351 02-25-14 79 0 1000 MP1494DJ 1351 02-21-14 79 0 1000 MP1494DJ 1351 02-21-14 79 0 1000 MP4027GJ 1329 03-13-14 47 0 1000 MP1494DJ 1346 03-13-14 47 0 1000 MP1494DJ 1343 03-13-14 47 0 1000 MP1495DJ 1350 01-15-14 50 0 100 MP1472GJ-C452 1344 01-09-14 50 0 100 MP1494DJ 1348 01-09-14 50 0 100 MP9495DJ 1349 01-09-14 50 0 100 MP3414DJ 1349 01-09-14 50 0 100 MP1472GJ-C452 1340 01-09-14 50 0 100 MP2314GJ 1350 01-09-14 50 0 100 MP1495DJ 1349 01-15-14 50 0 100 MP1495DJ 1347 01-15-14 50 0 100 MP1495DJ 1347 01-17-14 46 0 100 MP1472GJ 1349 01-09-14 50 0 100 MP1495DJ 1349 01-29-14 50 0 100 MP2315GJ 1346 01-09-14 50 0 100 MP2315GJ 1346 01-15-14 50 0 100 MP1472GJ 1349 01-09-14 50 0 100 MP3414DJ 1349 01-09-14 50 0 100 MP1470GJ 1352 01-09-14 50 0 100 MP9495DJ 1349 01-09-14 50 0 100 MP1470GJ 1349 01-15-14 50 0 100 MP1470GJ 1350 01-15-14 50 0 100 MP1495DJ 1350 02-26-14 50 0 100 MP1470GJ 1352 01-15-14 50 0 100 MP1470GJ 1350 01-15-14 50 0 100 MP1495DJ 1349 02-26-14 50 0 100 MP2235GJ 1350 01-17-14 50 0 100 MP1494DJ 1351 01-17-14 50 0 100 MP2235GJ 1352 01-17-14 50 0 100 MP3414DJ 1344 01-17-14 50 0 100 MP1470GJ 1352 01-17-14 50 0 100 MP3414DJ 1344 01-17-14 50 0 100 MP1495DJ 1350 01-17-14 50 0 100 MP3414DJ 1349 01-17-14 50 0 100 MP1470GJ 1352 01-17-14 50 0 100 MP2143DJ-C463 1351 01-22-14 50 0 100 The Future of Analog IC Technology® - 54 - MONOLITHIC POWER SYSTEMS Device Q1 2014 D/C Close Date Sample Size PRODUCT RELIABILITY REPORT # of Fail FA NO. # of cycle MP2314GJ 1350 01-22-14 50 0 100 MP1496DJ 1343 01-22-14 50 0 100 MP1496DJ 1344 01-22-14 50 0 100 MP1496DJ 1344 01-22-14 50 0 100 MP1496DJ 1340 01-22-14 50 0 100 MP1496DJ 1343 01-22-14 50 0 100 MP1496DJ 1343 01-22-14 50 0 100 MP1470GJ 1345 01-22-14 50 0 100 MP1494DJ 1343 01-22-14 50 0 100 MP1470GJ 1343 01-22-14 50 0 100 MP1495DJ 1343 01-22-14 50 0 100 MP1494DJ 1344 01-22-14 50 0 100 MP1494DJ 1343 01-22-14 50 0 100 MP1495DJ 1344 01-22-14 50 0 100 MP1495DJ 1343 01-22-14 50 0 100 MP1470GJ 1345 01-22-14 50 0 100 MP1494DJ 1343 01-22-14 50 0 100 MP1470GJ 1346 01-22-14 50 0 100 MP1494DJ 1343 01-22-14 50 0 100 MP1470GJ 1346 01-22-14 50 0 100 MP1470GJ 1347 01-22-14 50 0 100 MP1495DJ 1344 01-22-14 50 0 100 MP1494DJ 1344 01-22-14 50 0 100 MP1495DJ 1341 01-22-14 50 0 100 MP1495DJ 1343 01-22-14 50 0 100 MP1494DJ 1344 01-22-14 50 0 100 MP1495DJ 1344 01-22-14 50 0 100 MP1494DJ 1344 01-22-14 50 0 100 MP1470GJ 1347 01-22-14 50 0 100 MP1470GJ 1349 01-22-14 50 0 100 MP1470GJ 1347 01-23-14 50 0 100 MP1496DJ 1341 01-22-14 50 0 100 MP1470GJ 1347 01-22-14 50 0 100 MP1496DJ 1345 01-22-14 50 0 100 MP1496DJ 1344 01-22-14 50 0 100 MP1496DJ 1341 01-22-14 50 0 100 MP1470GJ 1349 01-22-14 50 0 100 MP1470GJ 1347 01-22-14 50 0 100 MP1495DJ 1341 01-22-14 50 0 100 MP2122GJ 1352 01-23-14 50 0 100 MP2234GJ 1352 01-22-14 50 0 100 MP1496DJ 1351 01-29-14 50 0 100 The Future of Analog IC Technology® - 55 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1470GJ 1352 01-22-14 50 0 100 MP1470GJ 1401 01-23-14 50 0 100 MP2314GJ 1350 01-23-14 50 0 100 MP1496DJ 1350 01-29-14 50 0 100 MP2161GJ-C499 1402 01-29-14 50 0 100 MP1470GJ 1401 01-29-14 50 0 100 MP2161GJ-C499 1401 01-29-14 50 0 100 MP1495DJ 1401 02-26-14 50 0 100 MP3414DJ 1401 01-29-14 50 0 100 MP1495DJ 1350 01-29-14 50 0 100 MP2314GJ 1401 01-29-14 50 0 100 MP1472GJ 1312 01-29-14 50 0 100 MP1472GJ 1307 01-29-14 50 0 100 MP2161GJ-C499 1402 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP2235GJ 1403 02-19-14 50 0 100 MP3414DJ 1401 02-19-14 50 0 100 FA NO. # of cycle MP1475DJ 1336 02-19-14 50 0 100 MP1471GJ 1401 02-19-14 50 0 100 MP1498DJ 1402 02-19-14 50 0 100 MP2314GJ 1402 02-19-14 50 0 100 MP1470GJ 1401 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP1494DJ 1402 02-19-14 50 0 100 MP9495DJ 1352 02-19-14 50 0 100 MP1497DJ 1403 02-19-14 50 0 100 MP2161GJ-C514 1402 02-19-14 50 0 100 MP1497DJ 1405 02-19-14 50 0 100 MP1496DJ 1351 02-19-14 50 0 100 MP3414DJ 1401 02-19-14 50 0 100 MP1471AGJ 1404 02-19-14 50 0 100 MP1470GJ 1403 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP1495DJ 1402 02-19-14 50 0 100 MP1495DJ 1402 02-19-14 50 0 100 MP1495DJ 1402 02-19-14 50 0 100 MP1494J 1401 02-19-14 50 0 100 MP1495DJ 1402 02-19-14 50 0 100 MP1495DJ 1402 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP1494J 1401 02-19-14 50 0 100 The Future of Analog IC Technology® - 56 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1470GJ 1402 02-19-14 50 0 100 MP1470GJ 1402 02-19-14 50 0 100 MP2144GJ 1351 02-26-14 50 0 100 MP1497DJ 1405 02-26-14 50 0 100 FA NO. # of cycle MP1470GJ 1403 02-26-14 50 0 100 MP24894GJ 1401 02-26-14 50 0 100 MP3414DJ 1352 02-26-14 50 0 100 MP1470GJ 1403 02-26-14 50 0 100 MP1470GJ 1403 02-26-14 50 0 100 MP2144GJ 1404 02-26-14 50 0 100 MP1470GJ 1403 03-05-14 50 0 100 MP2143DJ 1404 03-05-14 50 0 100 MP1495DJ 1337 03-05-14 50 0 100 MP1471GJ 1406 03-05-14 50 0 100 MP2144GJ 1405 03-05-14 50 0 100 MP1474DJ-C491 1352 03-05-14 50 0 100 MP2161GJ-C499 1406 03-05-14 50 0 100 MP2315GJ 1346 03-19-14 50 0 100 MP1470GJ 1406 03-05-14 50 0 100 MP9495DJ 1405 03-05-14 50 0 100 MP2315GJ 1346 03-05-14 50 0 100 MP1494DJ 1350 03-05-14 50 0 100 MP3418GJ-C567 1407 03-05-14 50 0 100 MP2159GJ 1403 03-12-14 50 0 100 MP1470GJ 1407 03-12-14 50 0 100 MP2234GJ 1407 03-12-14 50 0 100 MP1470GJ 1406 03-12-14 50 0 100 MP9495DJ 1406 03-12-14 50 0 100 MP1495DJ-C494 1402 03-12-14 50 0 100 MP1470GJ 1407 03-12-14 50 0 100 MP2161GJ-C514 1406 03-12-14 50 0 100 MP1471GJ 1408 03-19-14 50 0 100 MP1470GJ 1406 03-19-14 50 0 100 MP2161GJ 1343 03-12-14 50 0 100 MP9495DJ 1407 03-12-14 50 0 100 MP1470GJ 1407 03-19-14 50 0 100 MP1471AGJ 1408 03-19-14 50 0 100 MP1470GJ 1407 03-19-14 50 0 100 MP1470GJ 1406 03-19-14 50 0 100 MP1472GJ 1407 03-19-14 50 0 100 MP2159GJ 1403 03-19-14 50 0 100 MP1470GJ 1407 03-19-14 50 0 100 The Future of Analog IC Technology® - 57 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2315GJ 1346 03-19-14 50 0 100 MP1470GJ 1406 03-19-14 50 0 100 MP1495DJ 1406 03-26-14 50 0 100 MP1470GJ 1409 03-19-14 50 0 100 FA NO. # of cycle MP2489DJ 1352 03-19-14 50 0 100 MP2314GJ 1404 03-26-14 50 0 100 MP1495DJ 1407 03-26-14 50 0 100 MP1470GJ 1407 03-26-14 50 0 100 MP1470GJ 1408 03-26-14 50 0 100 MP1470GJ 1407 03-26-14 50 0 100 MP2161GJ-C499 1409 03-26-14 50 0 100 MP2161GJ-C514 1409 03-26-14 50 0 100 MP2314GJ 1402 03-26-14 50 0 100 MP4027GJ 1336 03-26-14 50 0 100 MP2234GJ 1403 03-26-14 50 0 100 Total 0 4.8.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃, 100%RH, 29.7psia Device D/C Close Date Sample Size # of Fail FA NO. # of hrs MPQ4420GJ 1323 02-21-14 97 0 168 MP150GJ 1311 02-25-14 96 0 168 MP2225GJ 1344 02-13-14 97 0 168 MP1494DJ 1349 02-11-14 77 0 168 MP1494DJ 1351 02-21-14 77 0 168 MP1494DJ 1351 02-21-14 77 0 168 MP4027GJ 1329 03-13-14 50 0 168 MP1494DJ 1346 03-13-14 50 0 168 MP1494DJ 1343 03-13-14 50 0 168 MPQ2143DJ 1347 01-27-14 77 0 168 MPQ2143DJ 1347 01-27-14 77 0 168 MP1495DJ 1350 01-15-14 850 0 48 MP1472GJ-C452 1344 01-09-14 50 0 48 MP1494DJ 1348 01-09-14 50 0 48 MP9495DJ 1349 01-09-14 50 0 48 MP3414DJ 1349 01-09-14 50 0 48 MP1472GJ-C452 1340 01-09-14 50 0 48 MP2314GJ 1350 01-09-14 50 0 48 MP1495DJ 1349 01-15-14 850 0 48 The Future of Analog IC Technology® - 58 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1495DJ 1347 01-15-14 850 0 48 MP1495DJ 1347 01-17-14 850 0 48 MP1472GJ 1349 01-09-14 50 0 48 MP1495DJ 1349 01-29-14 850 0 48 MP2315GJ 1346 01-09-14 50 0 48 MP2315GJ 1346 01-15-14 50 0 48 MP1472GJ 1349 01-09-14 50 0 48 FA NO. # of hrs MP3414DJ 1349 01-09-14 50 0 48 MP1470GJ 1352 01-09-14 50 0 48 MP9495DJ 1349 01-09-14 50 0 48 MP1470GJ 1349 01-15-14 50 0 48 MP1470GJ 1350 01-15-14 50 0 48 MP1495DJ 1350 02-26-14 850 0 48 MP1470GJ 1352 01-15-14 50 0 48 MP1470GJ 1350 01-15-14 50 0 48 MP1495DJ 1349 02-26-14 850 0 48 MP2235GJ 1350 01-17-14 50 0 48 MP1494DJ 1351 01-17-14 50 0 48 MP2235GJ 1352 01-17-14 50 0 48 MP3414DJ 1344 01-17-14 50 0 48 MP1470GJ 1352 01-17-14 50 0 48 MP3414DJ 1344 01-17-14 50 0 48 MP1495DJ 1350 01-17-14 50 0 48 MP3414DJ 1349 01-17-14 45 0 48 MP1470GJ 1352 01-17-14 50 0 48 MP2143DJ-C463 1351 01-22-14 50 0 48 MP2314GJ 1350 01-22-14 50 0 48 MP1496DJ 1343 01-22-14 50 0 48 MP1496DJ 1344 01-22-14 50 0 48 MP1496DJ 1344 01-22-14 50 0 48 MP1496DJ 1340 01-22-14 50 0 48 MP1496DJ 1343 01-22-14 50 0 48 MP1496DJ 1343 01-22-14 50 0 48 MP1470GJ 1345 01-22-14 50 0 48 MP1494DJ 1343 01-22-14 50 0 48 MP1470GJ 1343 01-22-14 50 0 48 MP1495DJ 1343 01-22-14 50 0 48 MP1494DJ 1344 01-22-14 50 0 48 MP1494DJ 1343 01-22-14 50 0 48 MP1495DJ 1344 01-22-14 50 0 48 MP1495DJ 1343 01-22-14 50 0 48 MP1470GJ 1345 01-22-14 50 0 48 The Future of Analog IC Technology® - 59 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1494DJ 1343 01-22-14 50 0 48 MP1470GJ 1346 01-22-14 50 0 48 FA NO. # of hrs MP1494DJ 1343 01-22-14 50 0 48 MP1470GJ 1346 01-22-14 50 0 48 MP1470GJ 1347 01-22-14 50 0 48 MP1495DJ 1344 01-22-14 50 0 48 MP1494DJ 1344 01-22-14 50 0 48 MP1495DJ 1341 01-22-14 50 0 48 MP1495DJ 1343 01-22-14 50 0 48 MP1494DJ 1344 01-22-14 50 0 48 MP1495DJ 1344 01-22-14 50 0 48 MP1494DJ 1344 01-22-14 50 0 48 MP1470GJ 1347 01-22-14 50 0 48 MP1470GJ 1349 01-22-14 50 0 48 MP1470GJ 1347 01-23-14 50 0 48 MP1496DJ 1341 01-22-14 50 0 48 MP1470GJ 1347 01-22-14 50 0 48 MP1496DJ 1345 01-22-14 50 0 48 MP1496DJ 1344 01-22-14 50 0 48 MP1496DJ 1341 01-22-14 50 0 48 MP1470GJ 1349 01-22-14 50 0 48 MP1470GJ 1347 01-22-14 50 0 48 MP1495DJ 1341 01-22-14 50 0 48 MP2122GJ 1352 01-23-14 50 0 48 MP2234GJ 1352 01-22-14 50 0 48 MP1496DJ 1351 01-29-14 50 0 48 MP1470GJ 1352 01-22-14 50 0 48 MP1470GJ 1401 01-23-14 50 0 48 MP2314GJ 1350 01-23-14 50 0 48 MP1496DJ 1350 01-29-14 50 0 48 MP2161GJ-C499 1402 01-29-14 50 0 48 MP1470GJ 1401 01-29-14 50 0 48 MP2161GJ-C499 1401 01-29-14 50 0 48 MP1495DJ 1401 02-26-14 850 0 48 MP3414DJ 1401 01-29-14 50 0 48 MP1495DJ 1350 01-29-14 50 0 48 MP2314GJ 1401 01-29-14 50 0 48 MP1472GJ 1312 01-29-14 50 0 48 MP1472GJ 1307 01-29-14 50 0 48 MP2161GJ-C499 1402 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP2235GJ 1403 02-19-14 50 0 48 The Future of Analog IC Technology® - 60 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3414DJ 1401 02-19-14 50 0 48 MP1475DJ 1336 02-19-14 50 0 48 MP1471GJ 1401 02-19-14 50 0 48 FA NO. # of hrs MP1498DJ 1402 02-19-14 50 0 48 MP2314GJ 1402 02-19-14 50 0 48 MP1470GJ 1401 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP1494DJ 1402 02-19-14 50 0 48 MP9495DJ 1352 02-19-14 50 0 48 MP1497DJ 1403 02-19-14 50 0 48 MP2161GJ-C514 1402 02-19-14 50 0 48 MP1497DJ 1405 02-19-14 50 0 48 MP1496DJ 1351 02-19-14 50 0 48 MP3414DJ 1401 02-19-14 50 0 48 MP1471AGJ 1404 02-19-14 50 0 48 MP1470GJ 1403 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP1495DJ 1402 02-19-14 50 0 48 MP1495DJ 1402 02-19-14 50 0 48 MP1495DJ 1402 02-19-14 50 0 48 MP1494J 1401 02-19-14 50 0 48 MP1495DJ 1402 02-19-14 50 0 48 MP1495DJ 1402 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP1494J 1401 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP1470GJ 1402 02-19-14 50 0 48 MP2144GJ 1351 02-26-14 50 0 48 MP1497DJ 1405 02-26-14 50 0 48 MP1470GJ 1403 02-26-14 50 0 48 MP24894GJ 1401 02-26-14 50 0 48 MP3414DJ 1352 02-26-14 50 0 48 MP1470GJ 1403 02-26-14 50 0 48 MP1470GJ 1403 02-26-14 50 0 48 MP2144GJ 1404 02-26-14 50 0 48 MP1470GJ 1403 03-05-14 50 0 48 MP2143DJ 1404 03-05-14 50 0 48 MP1495DJ 1337 03-05-14 50 0 48 MP1471GJ 1406 03-05-14 50 0 48 MP2144GJ 1405 03-05-14 50 0 48 MP1474DJ-C491 1352 03-05-14 50 0 48 The Future of Analog IC Technology® - 61 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ-C499 1406 03-05-14 50 0 48 MP2315GJ 1346 03-19-14 50 0 48 MP1470GJ 1406 03-05-14 50 0 48 FA NO. # of hrs MP9495DJ 1405 03-05-14 50 0 48 MP2315GJ 1346 03-05-14 50 0 48 MP1494DJ 1350 03-05-14 50 0 48 MP3418GJ-C567 1407 03-05-14 50 0 48 MP2159GJ 1403 03-12-14 50 0 48 MP1470GJ 1407 03-12-14 50 0 48 MP2234GJ 1407 03-12-14 50 0 48 MP1470GJ 1406 03-12-14 50 0 48 MP9495DJ 1406 03-12-14 50 0 48 MP1495DJ-C494 1402 03-12-14 50 0 48 MP1470GJ 1407 03-12-14 50 0 48 MP2161GJ-C514 1406 03-12-14 50 0 48 MP1471GJ 1408 03-19-14 50 0 48 MP1470GJ 1406 03-19-14 50 0 48 MP2161GJ 1343 03-12-14 50 0 48 MP9495DJ 1407 03-12-14 50 0 48 MP1470GJ 1407 03-19-14 50 0 48 MP1471AGJ 1408 03-19-14 50 0 48 MP1470GJ 1407 03-19-14 50 0 48 MP1470GJ 1406 03-19-14 50 0 48 MP1472GJ 1407 03-19-14 50 0 48 MP2159GJ 1403 03-19-14 50 0 48 MP1470GJ 1407 03-19-14 50 0 48 MP2315GJ 1346 03-19-14 50 0 48 MP1470GJ 1406 03-19-14 50 0 48 MP1495DJ 1406 03-26-14 850 0 48 MP1470GJ 1409 03-19-14 50 0 48 MP2489DJ 1352 03-19-14 50 0 48 MP2314GJ 1404 03-26-14 50 0 48 MP1495DJ 1407 03-26-14 850 0 48 MP1470GJ 1407 03-26-14 50 0 48 MP1470GJ 1408 03-26-14 50 0 48 MP1470GJ 1407 03-26-14 50 0 48 MP2161GJ-C499 1409 03-26-14 50 0 48 MP2161GJ-C514 1409 03-26-14 50 0 48 MP2314GJ 1402 03-26-14 50 0 48 MP4027GJ 1336 03-26-14 50 0 48 MP2234GJ 1403 03-26-14 50 0 48 Total 0 The Future of Analog IC Technology® - 62 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT 4.8.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃, 85%RH, 33.3psia, 96h, Vcc max; Device D/C Close Date Sample Size # of Fail MP2318GJ 1342 01-10-14 85 0 MPQ4420GJ 1323 02-21-14 98 0 MP150GJ 1311 02-25-14 100 0 MP2161GJ 1341 02-21-14 102 0 MP2161GJ 1340 02-21-14 100 0 MP2161GJ 1340 02-21-14 100 0 MP2161GJ 1340 02-21-14 100 0 MP2161GJ 1340 02-21-14 102 0 MP2225GJ 1344 02-13-14 96 0 MP1494DJ 1349 02-11-14 80 0 MP4027GJ 1329 03-13-14 50 0 MP1494DJ 1346 03-13-14 50 0 MP1494DJ 1343 03-13-14 50 0 MPQ2143DJ 1347 01-27-14 80 0 MPQ2143DJ 1347 01-27-14 80 0 MPQ2143DJ 1304 01-27-14 50 0 Total FA NO. 0 The Future of Analog IC Technology® - 63 - MONOLITHIC POWER SYSTEMS Q1 2014 PRODUCT RELIABILITY REPORT Monolithic Power Systems (Chengdu) Co., Ltd. No.8 Kexin Rd. West Park of Export Processing Zone, West Hi-Tech Zone, Chengdu, Sichuan 611731 Tel: 86-28-87303000 Fax: 86-28-87303060 www.monolithicpower.com The Future of Analog IC Technology® - 64 -