RENESAS H7N0310LD

To all our customers
Regarding the change of names mentioned in the document, such as Hitachi
Electric and Hitachi XX, to Renesas Technology Corp.
The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas
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these changes do not constitute any alteration to the contents of the document itself.
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Renesas Technology Corp.
Customer Support Dept.
April 1, 2003
Cautions
Keep safety first in your circuit designs!
1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better
and more reliable, but there is always the possibility that trouble may occur with them. Trouble with
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Remember to give due consideration to safety when making your circuit designs, with appropriate
measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or
(iii) prevention against any malfunction or mishap.
Notes regarding these materials
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contained therein.
H7N0310LD, H7N0310LS, H7N0310LM
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-1422C(Z)
4th. Edition
Aug. 2002
Features
• Low on-resistance
• RDS(on) = 8 mΩ typ.
• Low drive current
Outline
LDPAK
4
4
4
D
1
G
1
2
2
3
H7N0310LS
3
S
H7N0310LD
1
2
3
H7N0310LM
1. Gate
2. Drain
3. Source
4. Drain
H7N0310LD, H7N0310LS, H7N0310LM
Absolute Maximum Ratings
(Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDSS
30
V
Gate to source voltage
VGSS
±20
V
Drain current
ID
30
A
120
A
Drain peak current
ID(pulse)
Body-drain diode reverse drain current
IDR
Channel dissipation
Pch
Channel to Case Thermal Impedance
Note 1
30
A
50
W
θch-c
2.5
°C/W
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Notes: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
Rev.3, Aug. 2002, page 2 of 2
Note 2
H7N0310LD, H7N0310LS, H7N0310LM
Electrical Characteristics
(Ta = 25°C)
Item
Symbol Min
Typ
Max
Unit
V
Test Conditions
Drain to source breakdown voltage V(BR)DSS
30
—
—
Gate to source breakdown voltage
V(BR)GSS
±20
—
—
Gate to source leak current
IGSS
—
—
±10
µA
VGS = ±16 V, VDS = 0
Zero gate voltege drain current
IDSS
—
—
10
µA
VDS = 30 V, VGS = 0
Gate to source cutoff voltage
VGS(off)
1.0
—
2.5
V
ID = 1 mA, VDS = 10 V
Static drain to source on state
RDS(on)
—
8.0
10
mΩ
ID = 15 A, VGS = 10 V
—
13
19
mΩ
ID = 15 A, VGS = 5 V
|yfs|
21
35
—
S
ID = 15 A, VDS = 10 V
Input capacitance
Ciss
—
1400
—
pF
VDS = 10 V
Output capacitance
Coss
—
380
—
pF
VGS = 0
Reverse transfer capacitance
Crss
—
210
—
pF
f = 1 MHz
Total gate charge
Qg
—
24
—
nc
VDD = 10 V
Gate to source charge
Qgs
—
4.8
—
nc
VGS = 10 V
Gate to drain charge
Qgd
—
4.6
—
nc
ID = 30 A
Turn-on delay time
td(on)
—
21
—
ns
VGS = 10 V, ID = 15 A
Rise time
tr
—
250
—
ns
RL = 0.67 Ω
Turn-off delay time
td(off)
—
55
—
ns
Rg = 4.7 Ω
Fall time
tf
—
16
—
ns
Body–drain diode forward voltage
VDF
—
0.90
—
V
IF = 30 A, VGS = 0
—
35
—
ns
IF = 30 A, VGS = 0
diF/ dt = 50 A/µs
resistance
Forward transfer admittance
Body–drain diode reverse recovery trr
time
ID = 10 mA, VGS = 0
IG = ±100 µA, VDS = 0
Note1
Note1
Note1
Note1
Notes: 1. Pulse test
Rev.3, Aug. 2002, page 3 of 3
H7N0310LD, H7N0310LS, H7N0310LM
Main Characteristics
Power vs. Temperature Derating
Maximum Safe Operation Area
500
I D (A)
10 µs
60
100
10
Drain Current
Channel Dissipation
Pch (W)
80
40
20
Op
PW
era
tio
1
0.1
50
100
Case Temperature
150
200
n
=1
0m
s
Operation in
this area is
limited by R DS(on)
Tc (°C)
0.01
0.1 0.3
1
3
10
30
100
Drain to Source Voltage V DS (V)
Typical Output Characteristics
50
Typical Transfer Characteristics
50
10 V
V DS = 10 V
Pulse Test
4V
Pulse Test
(A)
6V
30
3.5 V
20
10
VGS = 3 V
ID
40
Drain Current
I D (A)
DC
Tc = 25°C
1 shot Pulse
0
Drain Current
10
0
1 m µs
s
40
30
20
25°C
10
Tc = 75°C
−25°C
0
2
4
6
Drain to Source Voltage
Rev.3, Aug. 2002, page 4 of 4
8
10
V DS (V)
0
1
2
3
Gate to Source Voltage
5
4
V GS (V)
H7N0310LD, H7N0310LS, H7N0310LM
Static Drain to Source on State Resistance
vs. Drain Current
100
Pulse Test
50
0.4
0.2
10 A
5A
0.1
0
Static Drain to Source on State Resistance
R DS(on) (m Ω)
I D = 20 A
4
8
12
Gate to Source Voltage
16
20
V GS (V)
Static Drain to Source on State Resistance
vs. Temperature
40
Pulse Test
32
24
16
I D = 5 A, 10 A
20 A
V GS = 5 V
8
10 V
0
−40
Drain to Source On State Resistance
R DS(on) (m Ω)
0.3
Pulse Test
5 A, 10 A, 20 A
0
40
80
120
160
Case Temperature Tc (°C)
20
VGS = 5 V
10
10 V
5
2
1
0.1 0.2 0.5 1 2
5 10 20 50 100
Drain Current I D (A)
Forward Transfer Admittance vs.
Drain Current
Forward Transfer Admittance |yfs| (S)
V DS(on) (V)
0.5
Drain to Source Voltage
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
100
Tc = −25°C
30
10
75°C
25°C
3
1
0.3
0.1
0.1
V DS = 10 V
Pulse Test
0.3
1
3
10
30
100
Drain Current I D (A)
Rev.3, Aug. 2002, page 5 of 5
H7N0310LD, H7N0310LS, H7N0310LM
Typical Capacitance vs.
Drain to Source Voltage
Body-Drain Diode Reverse
Recovery Time
500
3000
Capacitance C (pF)
10000
Reverse Recovery Time trr (ns)
1000
200
100
50
20
10
0.1
Ciss
1000
Coss
300
Crss
100
30
di / dt = 50 A / µs
V GS = 0, Ta = 25°C
VGS = 0
f = 1 MHz
10
0
0.3
1
3
10
30
100
Reverse Drain Current I DR (A)
20
10
0
12
8
VDD = 25 V
10 V
5V
8
16
24
32
Gate Charge Qg (nc)
Rev.3, Aug. 2002, page 6 of 6
4
0
40
20
30
40
50
Switching Characteristics
tr
Switching Time t (ns)
V DS
V DD = 25 V
10 V
5V
16
V GS (V)
V GS
40
30
500
20
I D = 30 A
Gate to Source Voltage
Drain to Source Voltage
V DS (V)
Dynamic Input Characteristics
50
10
Drain to Source Voltage V DS (V)
200
100
t d(off)
50
t d(on)
20
tf
10
V GS = 10 V, V DS = 10 V
Rg = 4.7 Ω, duty < 1 %
5
2 5 10 20
0.1 0.2 0.5 1
Drain Current I D (A)
50 100
H7N0310LD, H7N0310LS, H7N0310LM
Reverse Drain Current vs.
Source to Drain Voltage
Reverse Drain Current I DR (A)
50
40
10 V
30
V GS = 0
5V
20
10
Pulse Test
0
0.4
0.8
1.2
Source to Drain Voltage
1.6
2.0
V SD (V)
Normalized Transient Thermal Impedance vs. Pulse Width
Normalized Transient Thermal Impedance
γ s (t)
3
Tc = 25°C
1
D=1
0.5
0.3
0.1
0.03
0.2
θch − c(t) = γs (t) • θch − c
θch − c = 2.5°C/ W, Tc = 25°C
0.1
0.05
0.02
e
1
0.0 puls
t
o
h
1s
PDM
D=
PW
T
PW
T
0.01
10 µ
100 µ
1m
10 m
100 m
1
10
Pulse Width PW (s)
Rev.3, Aug. 2002, page 7 of 7
H7N0310LD, H7N0310LS, H7N0310LM
Switching Time Test Circuit
Switching Time Waveform
Vout
Monitor
Vin Monitor
Rg
90%
D.U.T.
RL
Vin
Vin
10 V
V DS
= 10 V
Vout
10%
10%
90%
td(on)
Rev.3, Aug. 2002, page 8 of 8
tr
10%
90%
td(off)
tf
H7N0310LD, H7N0310LS, H7N0310LM
Package Dimensions
• H7N0310LD
Unit: mm
2.54 ± 0.5
(1.4)
2.54 ± 0.5
11.0 ± 0.5
10.0
0.2
0.86 +– 0.1
11.3 ± 0.5
1.37 ± 0.2
1.3 ± 0.2
4.44 ± 0.2
1.3 ± 0.15
+ 0.3
– 0.5
8.6 ± 0.3
10.2 ± 0.3
2.49 ± 0.2
0.4 ± 0.1
Hitachi Code
JEDEC
JEITA
Mass (reference value)
LDPAK (L)
—
—
1.4 g
Rev.3, Aug. 2002, page 9 of 9
H7N0310LD, H7N0310LS, H7N0310LM
• H7N0310LS
Unit: mm
7.8
7.0
(1.5)
0.3
10.0 +– 0.5
0.2
0.1 +– 0.1
2.2
2.49 ± 0.2
0.2
0.86 +– 0.1
2.54 ± 0.5
0.3
3.0 +– 0.5
1.3 ± 0.2
2.54 ± 0.5
8.6 ± 0.3
(1.5)
1.37 ± 0.2
7.8
6.6
1.3 ± 0.2
0.4 ± 0.1
Hitachi Code
JEDEC
JEITA
Mass (reference value)
Rev.3, Aug. 2002, page 10 of 10
1.7
(1.4)
4.44 ± 0.2
10.2 ± 0.3
LDPAK (S)-(1)
—
—
1.3 g
H7N0310LD, H7N0310LS, H7N0310LM
• H7N0310LM
Unit: mm
2.54 ± 0.5
7.8
7.0
(2.3)
0.3
10.0 +– 0.5
0.2
0.1 +– 0.1
2.2
2.49 ± 0.2
0.2
0.86 +– 0.1
2.54 ± 0.5
1.7
7.8
6.6
1.3 ± 0.2
0.3
5.0 +– 0.5
1.3 ± 0.2
8.6 ± 0.3
(1.5)
1.37 ± 0.2
(1.4)
4.44 ± 0.2
10.2 ± 0.3
0.4 ± 0.1
Hitachi Code
JEDEC
JEITA
Mass (reference value)
LDPAK (S)-(2)
—
—
1.35 g
Rev.3, Aug. 2002, page 11 of 11
H7N0310LD, H7N0310LS, H7N0310LM
Disclaimer
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
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intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
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7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
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URL
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Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan.
Colophon 6.0
Rev.3, Aug. 2002, page 12 of 12