Reliability Report AE Series

Reliability Report
AE Series
SOT-89 Package
AE Series Part Number
AE305, AE312, AE314, AE342A, AE362,
AE365, AE366, AE367, AE384, AE427
Description
This document describes the reliability performance of AE305, AE312, AE314, AE342A,
Package : SOT-89
AE362, AE365, AE366, AE367, AE384 and AE427 based on a series of reliability tests
conducted. AE305, AE312, AE342A, AE362, AE365, AE366, AE367, AE384 and AE427 reliability performances were
leveraged on AE314, based on similarities in wafer fabrication, packaging process and technologies.
AE305, AE312, AE314, A342A, AE362, AE365, AE366, AE367, AE384 and AE427 are RFHIC’s proprietary E-pHEMT
(Enhancement Mode Pseudomorphic High Electron Mobility Transistor) MMIC specifically designed for various
applications such as Cellular, GSM, PCS, DCS, W-CDMA, Wibro, WiMax, WiFi, RFID, Femtocell, Multi-metering,
HDTV, CATV set-top box, HD cable modem, HD satellite set-top box, VOD and IPTV. These MMICs are based on
Gallium Arsenide Enhancement Mode E-pHEMT which generates low current draw and very low noise. All RFHIC’s
AD series is valid only for 50ohm and 75ohm application.
Qualification Methodology
RFHIC’s qualification process consists of a series of tests designed to stress various potential failure mechanisms.
This testing is performed to ensure that RFHIC products are robust against potential failure modes that could arise
from the various die and package failure mechanisms stressed. The qualification testing is based on JEDEC test
methods common to the semiconductor industry, and the specifications are used as the PASS/FAIL criteria for initial
and final DC/RF tests.
1. Estimates for various channel temperature are as follows
<Graph-1>MTTF
For product information and a complete list of distributors, please go to our web site: www.rfhic.com
RFHIC and its logo are trademarks of RFHIC Corporation in Korea and other countries.
Data subject to change. Copyright @ 2010 RFHIC Corporation. All rights reserved.
<Graph-2>FIT
Ver1.3
RHQD-1207-001
Reliability Report
AE Series
SOT-89 Package
2. Thermal information
<Figure-1>Infrared Thermal Image of AE314
Condition
Tc = 85℃, Tj = 133℃ Vdd = 5V, Ids = 150mA
3. Product Qualification - Operational Life Test Results
Test Name
Standard
Test Condition
Duration
Sample Size
Results
JESD22-A108B
Tj=150°C
1000hours
77
Pass
JESD22-A110C
+130°C/85%/230kPa
96hours
77
Pass
High Temperature
Operating
Life(HTOL)
High Accelerated
Temperature and
Humidity Stress
Test(HAST)
4. Product Qualification - Environment Stress Results
Test Name
Temperature
Cycling(TC)
Unbiased
Autoclave(UA)
Standard
Test Condition
Duration
Sample Size
Results
JESD22-A104D
-65°C to +150°C 2cycle=1hours
500cycles
77
Pass
JESD22-A102C
+121°C/100%/205kPa
96hours
77
Pass
11
Pass
Dip & Look Sn/Ag/Cu solder
Solderability
JESD22-B102E
Steam Age Condition C
Dip Condition B, 245°C
For product information and a complete list of distributors, please go to our web site: www.rfhic.com
RFHIC and its logo are trademarks of RFHIC Corporation in Korea and other countries.
Data subject to change. Copyright @ 2010 RFHIC Corporation. All rights reserved.
Ver1.3
RHQD-1207-001
AE Series
Reliability Report
SOT-89 Package
5. Electrostatic Discharge Test Results
ESD TEST
Standard
Part Number
Results
AE305, AE312, AE314,
AE342A, AE362, AE365,
Human Body Model(HBM)
JESD22-A114F
Class1A
AE366, AE384, AE427
AE367
Class1B
AE305, AE312, AE314,
Machine Model(MM)
JESD22-A115A
AE342A, AE362, AE365,
Class A
AE366, AE384, AE367,
AE427
6. Moisture Sensitivity Level 1 Test
Standard
JESD020C
Test Condition
+85℃/85% 168hours
Sample Size
Results
38
Pass
Reflow Pack Temperature 260℃ 3Cycles
For product information and a complete list of distributors, please go to our web site: www.rfhic.com
RFHIC and its logo are trademarks of RFHIC Corporation in Korea and other countries.
Data subject to change. Copyright @ 2010 RFHIC Corporation. All rights reserved.
Ver1.3
RHQD-1207-001