Project Number: Design Qualification Test Report Requested by: James Borgelt Tracking Code: 139088_Report_Rev_2 Date: 8/23/2012 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Product Rev: N/A Lot #: N/A Tech: Craig Ryan Part description: ACP\ACR Test Start: 04/26/2011 Eng: Eric Mings Qty to test: 30 Test Completed: 05/17/2011 DESIGN QUALIFICATION TEST REPORT ACP-16-01-H-00.35-T-S-P-1 ACR-16-01-H-00.35-S-S1-P-1 Page 1 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR CERTIFICATION All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST) traceable standards according to IS0 10012-l and ANSI/NCSL 2540-1, as applicable. All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be reproduced without prior written approval of Samtec. SCOPE To perform the following tests: Design Qualification test. Please see test plan. APPLICABLE DOCUMENTS Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1) 2) 3) 4) 5) 6) 7) 8) All materials were manufactured in accordance with the applicable product specification. All test samples were identified and encoded to maintain traceability throughout the test sequences. After soldering, the parts to be used for LLCR and DWV/IR testing were cleaned according to TLWI-0001. Either an automated cleaning procedure or an ultrasonic cleaning procedure may be used. The automated procedure is used with aqueous compatible soldering materials. Parts not intended for testing LLCR and DWV/IR are visually inspected and cleaned if necessary. Any additional preparation will be noted in the individual test sequences. Samtec Test PCBs used: PCB-103219-TST-XX Page 2 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR FLOWCHARTS Gas Tight TEST GROUP A1 STEP 01 8 Assemblies 02 Gas Tight 03 LLCR-2 LLCR-1 Gas Tight = EIA-364-36A LLCR = EIA-364-23, LLCR 20 mV Max, 100 mA Max Use Keithley 580 or 3706 in 4 wire dry circuit mode Thermal Aging TEST STEP GROUP A1 6 Assemblies Thermal Aging (Mated) 02 Forces - Mating / Unmating 03 LLCR-1 04 Thermal Aging (Mated and Undisturbed) 05 LLCR-2 06 Forces - Mating / Unmating Therm al Aging = EIA-364-17, Test Condition 4 (105°C) Tim e Condition 'B' (250 Hours) Mating / Unm ating Forces = EIA-364-13 LLCR = EIA-364-23, LLCR 20 m V Max, 100 m A Max Use Keithley 580 or 3706 in 4 w ire dry circuit m ode Page 3 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR FLOWCHARTS Continued IR & DWV TEST GROUP A1 GROUP A2 GROUP A3 GROUP B1 STEP 2 Mated Sets 2 Unm ated of Part # Being Tested 2 Unmated of Mating Part # 2 Mated Sets Break Down Pin-to-Pin Break Down Pin-to-Pin Break Down Pin-to-Pin Pin-to-Pin DW V/Break Down Voltage DWV/Break Down Voltage DW V/Break Down Voltage IR & DW V at test voltage (on both mated sets and on each connector unmated) 01 02 Thermal Shock (Mated and Undisturbed) 03 IR & DW V at test voltage (on both mated sets and on each connector unmated) 04 Cyclic Humidity (Mated and Undisturbed) 05 IR & DW V at test voltage (on both mated sets and on each connector unmated) DWV on Group B1 to be performed at Test Voltage DWV test voltage is equal to 75% of the lowest break down voltage from Groups A1, A2 or A3 Thermal Shock = EIA-364-32, Table II, Test Condition I: -55oC to +85 oC 1/2 hour dwell, 100 cycles Humidity = EIA-364-31, Test Condition B (240 Hours) and Method III (+25°C to +65°C @ 90% RH to 98% RH) ambient pre-condition and delete steps 7a and 7b IR = EIA-364-21 DWV = EIA-364-20, Test Condition 1 Page 4 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR FLOWCHARTS Continued Durability/Mating/Unmating/Gaps TEST GROUP A1 STEP 6 Assemblies 02 LLCR-1 03 Forces - Mating / Unmating 04 25 Cycles 05 Forces - Mating / Unmating 06 25 Cycles (50 Total) 07 Forces - Mating / Unmating 08 25 Cycles (75 Total) 09 Forces - Mating / Unmating 10 25 Cycles (100 Total) 11 Forces - Mating / Unmating 12 Clean w/Compressed Air 14 LLCR-2 15 Thermal Shock (Mated and Undisturbed) 16 LLCR-3 18 Cyclic Humidity (Mated and Undisturbed) LLCR-4 19 Forces - Mating / Unmating 17 Therm al Shock = EIA-364-32, Table II, Test Condition I: -55oC to +85oC 1/2 hour dw ell, 100 cycles Hum idity = EIA-364-31, Test Condition B (240 Hours) and Method III (+25°C to +65°C @ 90% RH to 98% RH) am bient pre-condition and delete steps 7a and 7b Mating / Unm ating Forces = EIA-364-13 LLCR = EIA-364-23, LLCR 20 m V Max, 100 m A Max Use Keithley 580 or 3706 in 4 w ire dry circuit m ode Page 5 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR FLOWCHARTS Continued Current Carrying Capacity - Array TEST STEP GROUP A1 3 Mated Assemblies All Contacts Powered 01 CCC (TIN PLATING) - Tabulate calculated current at RT, 65°C, 75°C and 95°C after derating 20% and based on 105°C (GOLD PLATING) - Tabulate calculated current at RT, 85°C, 95°C and 115°C after derating 20% and based on 125°C CCC, Temp rise = EIA-364-70 Page 6 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. THERMAL SHOCK: 1) 2) 3) 4) 5) 6) EIA-364-32, Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors. Test Condition 1: -55°C to +85°C Test Time: ½ hour dwell at each temperature extreme Number of Cycles: 100 All test samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. THERMAL: 1) 2) 3) 4) 5) EIA-364-17, Temperature Life with or without Electrical Load Test Procedure for Electrical Connectors. Test Condition 4 at 105° C. Test Time Condition B for 250 hours. All test samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. HUMIDITY: 1) 2) 3) 4) 5) Reference document: EIA-364-31, Humidity Test Procedure for Electrical Connectors. Test Condition B, 240 Hours. Method III, +25° C to + 65° C, 90% to 98% Relative Humidity excluding sub-cycles 7a and 7b. All samples are pre-conditioned at ambient. All test samples are exposed to environmental stressing in the mated condition. MATING/UNMATING: 1) Reference document: EIA-364-13, Mating and Unmating Forces Test Procedure for Electrical Connectors. 2) The full insertion position was to within 0.003” to 0.004” of the plug bottoming out in the receptacle to prevent damage to the system under test. 3) One of the mating parts is secured to a floating X-Y table to prevent damage during cycling. LLCR: 1) EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. 2) A computer program, LLCR 221.exe, ensures repeatability for data acquisition. 3) The following guidelines are used to categorize the changes in LLCR as a result from stressing a. <= +5.0 mOhms: --------------------------- Stable b. +5.1 to +10.0 mOhms:--------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms: ------------------ Unstable f. >+2000 mOhms:---------------------------- Open Failure Page 7 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. INSULATION RESISTANCE (IR): To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. 1) PROCEDURE: a. Reference document: EIA-364-21, Insulation Resistance Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts or Signal-to-Ground ii. Electrification Time 2.0 minutes iii. Test Voltage (500 VDC) corresponds to calibration settings for measuring resistances. 2) MEASUREMENTS: a. When the specified test voltage is applied (VDC), the insulation resistance shall not be less than 1000 MegOhms. DIELECTRIC WITHSTANDING VOLTAGE (DWV): To determine if the sockets can operate at its rated voltage and withstand momentary over potentials due to switching, surges, and other similar phenomenon. Separate samples are used to evaluate the effect of environmental stresses so not to influence the readings from arcing that occurs during the measurement process. 1) PROCEDURE: a. Reference document: EIA-364-20, Withstanding Voltage Test Procedure for Electrical Connectors. b. Test Conditions: i. Between Adjacent Contacts or Signal-to-Ground ii. Barometric Test Condition 1 iii. Rate of Application 500 V/Sec iv. Test Voltage (VAC) until breakdown occurs 2) MEASUREMENTS/CALCULATIONS a. The breakdown voltage shall be measured and recorded. b. The dielectric withstanding voltage shall be recorded as 75% of the minimum breakdown voltage. c. The working voltage shall be recorded as one-third (1/3) of the dielectric withstanding voltage (onefourth of the breakdown voltage). Page 8 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. GAS TIGHT: 1) 2) 3) 4) To provide method for evaluating the ability of the contacting surfaces in preventing penetration of harsh vapors which might lead to oxide formation that may degrade the electrical performance of the contact system. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing a. <= +5.0 mOhms: --------------------------- Stable b. +5.1 to +10.0 mOhms:--------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms: ------------------ Unstable f. >+2000 mOhms:---------------------------- Open Failure Procedure: a. Reference document: EIA-364-36, Test Procedure for Determination of Gas-Tight Characteristics for Electrical Connectors, Sockets and/or Contact Systems. b. Test Conditions: i. Class II--- Mated pairs of contacts assembled to their plastic housings. ii. Reagent grade Nitric Acid shall be used of sufficient volume to saturate the test chamber iii. The ratio of the volume of the test chamber to the surface area of the acid shall be 10:1. iv. The chamber shall be saturated with the vapor for at least 15 minutes before samples are added. v. Exposure time, 55 to 65 minutes. vi. The samples shall be no closer to the chamber walls than 1 inches and no closer to the surface of the acid than 3 inches. vii. The samples shall be dried after exposure for a minimum of 1 hour. о viii. Drying temperature 50 C ix. The final LLCR shall be conducted within 1 hour after drying. Page 9 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR ATTRIBUTE DEFINITIONS The following is a brief, simplified description of attributes. TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) EIA-364-70, Temperature Rise versus Current Test Procedure for Electrical Connectors and Sockets. 2 2) When current passes through a contact, the temperature of the contact increases as a result of I R (resistive) heating. 3) The number of contacts being investigated plays a significant part in power dissipation and therefore temperature rise. 4) The size of the temperature probe can affect the measured temperature. 5) Copper traces on PC boards will contribute to temperature rise: a. Self heating (resistive) b. Reduction in heat sink capacity affecting the heated contacts 6) A de-rating curve, usually 20%, is calculated. 7) Calculated de-rated currents at three temperature points are reported: a. Ambient о b. 80 C о c. 95 C о d. 115 C 8) Typically, neighboring contacts (in close proximity to maximize heat build up) are energized. 9) The thermocouple (or temperature measuring probe) will be positioned at a location to sense the maximum temperature in the vicinity of the heat generation area. 10) A computer program, TR 803.exe, ensures accurate stability for data acquisition. 11) Hook-up wire cross section is larger than the cross section of any connector leads/PC board traces, jumpers, etc. 12) Hook-up wire length is longer than the minimum specified in the referencing standard. Page 10 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR RESULTS Temperature Rise, CCC at a 20% de-rating • CCC for a 30°C Temperature Rise ---------------1.3A per contact with all contacts powered (ACP Cable Bundle) Mating – Unmating Forces Thermal Aging Group • Initial o Mating Min --------------------------------------- 5.94 Lbs Max--------------------------------------- 7.98 Lbs o Unmating Min --------------------------------------- 2.73 Lbs Max--------------------------------------- 3.42 Lbs • After Thermal o Mating Min --------------------------------------- 3.81 Lbs Max--------------------------------------- 5.80 Lbs o Unmating Min --------------------------------------- 1.70 Lbs Max--------------------------------------- 3.96 Lbs Page 11 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR RESULTS Continued Mating\Unmating Durability Group • Initial o Mating Min --------------------------------------- 5.95 Lbs Max--------------------------------------- 8.31 Lbs o Unmating Min --------------------------------------- 3.17 Lbs Max--------------------------------------- 3.65 Lbs • After 25 Cycles o Mating Min --------------------------------------- 6.42 Lbs Max--------------------------------------- 9.94 Lbs o Unmating Min --------------------------------------- 3.44 Lbs Max--------------------------------------- 3.84 Lbs • After 50 Cycles o Mating Min --------------------------------------- 6.71 Lbs Max--------------------------------------10.22 Lbs o Unmating Min --------------------------------------- 3.76 Lbs Max--------------------------------------- 4.61 Lbs • After 75 Cycles o Mating Min --------------------------------------- 6.89 Lbs Max--------------------------------------10.52 Lbs o Unmating Min --------------------------------------- 4.07 Lbs Max--------------------------------------- 5.75 Lbs • After 100 Cycles o Mating Min --------------------------------------- 7.01 Lbs Max--------------------------------------10.63 Lbs o Unmating Min --------------------------------------- 4.32 Lbs Max--------------------------------------- 6.74 Lbs • After Humidity o Mating Min --------------------------------------- 5.04 Lbs Max--------------------------------------- 6.41 Lbs o Unmating Min --------------------------------------- 2.64 Lbs Max--------------------------------------- 2.86 Lbs Page 12 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR RESULTS Continued Insulation Resistance minimums, IR • • • Initial o Mated------------------------------------------------50000 Meg Ohms ------------------- Pass o Unmated --------------------------------------------50000 Meg Ohms ------------------ Pass Thermal o Mated---------------------------------------------- 100000 Meg Ohms ------------------ Pass o Unmated ------------------------------------------ 100000 Meg Ohms ------------------ Pass Humidity o Mated------------------------------------------------- 3000 Meg Ohms ------------------ Pass o Unmated --------------------------------------------- 3700 Meg Ohms ------------------ Pass Dielectric Withstanding Voltage minimums, DWV • Minimums o Breakdown Voltage -------------------------------- 1200 VAC o Test Voltage -------------------------------------------900 VAC o Working Voltage -------------------------------------300 VAC • • • Initial DWV --------------------------------------------------Passed Thermal DWV-----------------------------------------------Passed Humidity DWV----------------------------------------------Passed Page 13 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR RESULTS Continued LLCR: Mating\Unmating Durability Group (96 LLCR test points) • • • • Initial --------------------------------------------------------------117.7 mOhms Max Durability, 100 Cycles o <= +5.0 mOhms ------------------------------------ 96 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Thermal o <= +5.0 mOhms ------------------------------------ 96 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Humidity o <= +5.0 mOhms ------------------------------------ 96 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Thermal Aging Group (96 LLCR test points) • • Initial --------------------------------------------------------------145.81 mOhms Max Thermal o <= +5.0 mOhms ------------------------------------ 96 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Gas Tight Group (96 LLCR test points) • • Initial --------------------------------------------------------------116.9 mOhms Max Gas-Tight o <= +5.0 mOhms ------------------------------------ 96 Points ------------------------- Stable o +5.1 to +10.0 mOhms -----------------------------------0 Points ------------------------- Minor o +10.1 to +15.0 mOhms ---------------------------------0 Points ------------------------- Acceptable o +15.1 to +50.0 mOhms ---------------------------------0 Points ------------------------- Marginal o +50.1 to +2000 mOhms---------------------------------0 Points ------------------------- Unstable o >+2000 mOhms ------------------------------------------0 Points ------------------------- Open Failure Page 14 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES TEMPERATURE RISE (Current Carrying Capacity, CCC): 1) High quality thermocouples whose temperature slopes track one another were used for temperature monitoring. 2) The thermocouples were placed at a location to sense the maximum temperature generated during testing. 3) Temperature readings recorded are those for which three successive readings, 15 minutes apart, differ less than 1° C (computer controlled data acquisition). 4) Adjacent contacts were powered: a. Linear configuration with all adjacent conductors/cable bundle powered Base Curve 139088 14 (All Power) Contacts Powered in Series (ACP Cable Bundle) ACP-16-01-H-00.35-T-S-P-1/ACR-16-01-H-00.35-S-S1-P-1 Derated 20 % RT Peak Amp RT Derated Amp Measured Current 60 ° C Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.3 Amps 60 ° C Peak Amp 3.0 60 ° C Derated Amp Room Temp= 22.9 C 70 ° C 70 ° C Peak Amp 2.7 70 ° C Derated Amp Limit 2.5 90 ° C Peak Amp Maximum Current, Amp per Contact 90 ° C Derated Amp 90 ° C 2.2 Room Temp 100° C Limit 2.0 1.9 1.7 1.5 1.5 1.3 1.0 0.9 0.8 0.5 Useful Range 0.0 20 30 40 50 60 70 Ambient Temperature, ° C Page 15 of 22 80 90 100 110 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES Continued MATING/UNMATING FORCE: Thermal Aging Group I nitial After Thermals Mating Unmating Mating Unmating Newtons Force (Lbs) Newtons Forc e (Lbs) Newtons F orc e (Lbs ) Newtons Force (Lbs) Minim um 26.42 5.94 12.14 2.73 16.96 3.81 7.55 1.70 Maxi mum 35.50 32.07 2.82 8 7.98 7.21 0.63 8 15.21 13.81 0.92 8 3.42 3.10 0.21 8 25.81 20.72 3.37 6 5.80 4.66 0.76 6 17.62 11.73 3.75 6 3.96 2.64 0.84 6 Aver age St Dev Count Mating\Unmating Durability Group Initial 25 Cycles Mating Minimum Maximum Average St Dev Count Unmating Mating Unmating Newtons Force (Lbs) Newtons Force (Lbs) Newtons Forc e (Lbs ) Newtons Force (Lbs) 26.47 36.96 5.95 8.31 7.46 14.10 16.24 3.17 3.65 3.41 28.56 44.21 6.42 9.94 8.29 15.30 17.08 3.44 3.84 3.61 33.17 3.14 8 0.71 8 15.16 0.72 8 0.16 8 36.87 4.82 8 1.08 8 50 Cycles Mating Newtons 0.13 8 75 Cycles Mating Unmating Force (Lbs) 16.06 0.57 8 Newtons Force (Lbs) Newtons Unmating Forc e (Lbs ) Newtons Force (Lbs) Minimum 29.85 6.71 16.72 3.76 30.65 6.89 18.10 4.07 Maximum 45.46 38.20 10.22 20.51 18.49 4.61 46.79 38.72 10.52 25.58 20.83 5.75 Average St Dev Count 8.59 1.20 8 5.32 8 1.49 8 4.16 0.33 8 8.71 1.18 8 5.23 8 100 Cycles Mating 2.80 8 4.68 0.63 8 After Humidity Unmating Mating Unmating Newtons Force (Lbs) Newtons Force (Lbs) Newtons Forc e (Lbs ) Newtons Force (Lbs) Minimum 31.18 7.01 19.22 4.32 22.42 5.04 11.74 2.64 Maximum 47.28 10.63 29.98 6.74 28.51 6.41 12.72 2.86 Average 38.61 8.68 23.38 5.26 25.94 5.83 12.33 2.77 5.01 8 1.13 8 4.18 8 0.94 8 2.03 8 0.46 8 0.35 8 0.08 8 St Dev Count Page 16 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES Continued INSULATION RESISTANCE (IR): Pin to Pin Mated Unmated Unmated ACP/ACR ACP ACR Initial Thermal 50000 100000 50000 100000 100000 100000 Humidity 3000 25000 3700 Minimum DIELECTRIC WITHSTANDING VOLTAGE (DWV): Voltage Rating Summ ary Minimum ACP/ACR 1200 Break Down Voltage Test Voltage 900 Working Voltage 300 Pin to Pin Initial Test Voltage After Thermal Test Voltage Passed After Humidity Test Voltage Passed Page 17 of 22 Passed Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES Continued LLCR: Mating\Unmating Durability Group: 1) 2) 3) 4) A total of 96 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms:--------------------------- Stable b. +5.1 to +10.0 mOhms: -------------------- Minor c. +10.1 to +15.0 mOhms: ------------------ Acceptable d. +15.1 to +50.0 mOhms: ------------------ Marginal e. +50.1 to +2000 mOhms------------------- Unstable f. >+2000 mOhms: --------------------------- Open Failure Date Room Temp C RH Name mOhm values Average St. Dev. Min Max Count 2011-4-26 22 56% Craig Ryan Actual Initial 114.0 1.7 111.1 117.7 96 2011-4-26 23 53% Craig Ryan Delta 100 Cycles -0.2 0.2 -0.8 0.1 96 2011-5-3 23 40% Craig Ryan Delta Thermal 0.1 0.4 -2.1 1.1 96 2011-5-17 23 37% Craig Ryan Delta Humidity 0.0 0.5 -2.1 1.6 96 How many samples are being tested? How many contacts are on each board? 100 Cycles Thermal Humidity Stable 96 96 96 Minor 0 0 0 Acceptable 0 0 0 Page 18 of 22 Marginal 0 0 0 4 24 Unstable 0 0 0 Open 0 0 0 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES Continued Thermal Age Group: 1) 2) 3) 4) A total of 96 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms:--------------------------- Stable b. +5.1 to +10.0 mOhms: -------------------- Minor c. +10.1 to +15.0 mOhms: ------------------ Acceptable d. +15.1 to +50.0 mOhms: ------------------ Marginal e. +50.1 to +2000 mOhms------------------- Unstable f. >+2000 mOhms: --------------------------- Open Failure LLCR Measurement Summaries by Pin Type Date 11/16/2011 Room Temp (Deg C) 22 Rel Humidity (%) 40 Technician Craig Ryan mOhm values Actual Initial Average St. Dev. Min Max Summary Count Total Count 137.81 2.51 132.77 145.18 84 84 11/29/2011 22 30 Craig Ryan Delta Delta Thermal Pin Type 1: Signal 0.84 0.44 0.24 2.96 84 84 Delta LLCR Delta Count by Category mOhms Thermal Stable Minor Acceptable Marginal Unstable <=5 >5 & <=10 >10 & <=15 >15 & <=50 >50 & <=1000 84 0 0 0 0 Page 19 of 22 Open >1000 0 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR DATA SUMMARIES Continued GAS TIGHT: 1) 2) 3) 4) A total of 96 points were measured. EIA-364-23, Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets. A computer program, LLCR 221.exe, ensures repeatability for data acquisition. The following guidelines are used to categorize the changes in LLCR as a result from stressing. a. <= +5.0 mOhms: --------------------------- Stable b. +5.1 to +10.0 mOhms:--------------------- Minor c. +10.1 to +15.0 mOhms: ------------------- Acceptable d. +15.1 to +50.0 mOhms: ------------------- Marginal e. +50.1 to +2000 mOhms: ------------------ Unstable f. >+2000 mOhms:---------------------------- Open Failure Date Room Temp C RH Name mOhm values Average St. Dev. Min Max Count 2011-4-25 22 46% Craig Ryan Actual Initial 113.8 1.4 110.6 116.9 96 2011-4-26 23 50% Craig Ryan Delta Gas Tight -0.2 0.1 -0.3 0.1 96 How many samples are being tested? How many contacts are on each board? Gas Tight Stable 96 Minor 0 Acceptable 0 Page 20 of 22 Marginal 0 4 24 Unstable 0 Open 0 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR EQUIPMENT AND CALIBRATION SCHEDULES Equipment #: MO-04 Description: Multimeter /Data Acquisition System Manufacturer: Keithley Model: 2700 Serial #: 0798688 Accuracy: See Manual … Last Cal: 04/30/2011, Next Cal: 04/30/2012 Equipment #: PS-07 Description: Power Supply Manufacturer: Agilent Model: AT-6031A Serial #: 2721A00648 Accuracy: See Manual See Manual … Last Cal: 08/21/2010, Next Cal: 08/21/2011 Equipment #: OV-5 Description: Forced Air Oven, 5 Cu. Ft., 120 V Manufacturer: Sheldon Mfg. Model: CE5F Serial #: 02008008 Accuracy: +/- 5 deg. C … Last Cal: 02/16/2011, Next Cal: 02/16/2012 Equipment #: TCT-04 Description: Dillon Quantrol TC2 Test Stand Manufacturer: Dillon Quantrol Model: TC2 Serial #: 04-1041-04 Accuracy: Speed Accuracy: +/- 5% of indicated speed; Displacement: +/- 5 micrometers. … Last Cal: 05/21/2011, Next Cal: 05/21/2012 Equipment #: THC-02 Description: Temperature/Humidity Chamber Manufacturer: Thermotron Model: SE-1000-6-6 Serial #: 31808 Accuracy: See Manual … Last Cal: 02/16/2011, Next Cal: 02/16/2012 Page 21 of 22 Tracking Code: 139088_Report_Rev_2 Part #: ACP-16-01-H-00.35-T-S-P-1\ ACR-16-01-H-00.35-S-S1-P-1 Part description: ACP\ACR EQUIPMENT AND CALIBRATION SCHEDULES Continued Equipment #: HPM-01 Description: Hipot Megommeter Manufacturer: Hipotronics Model: H306B-A Serial #: M9905004 Accuracy: 2 % Full Scale Accuracy … Last Cal: 11/30/2010, Next Cal: 11/30/2011 Equipment #: TSC-01 Description: Vertical Thermal Shock Chamber Manufacturer: Cincinnatti Sub Zero Model: VTS-3-6-6-SC/AC Serial #: 10-VT14993 Accuracy: See Manual … Last Cal: 05/18/2011, Next Cal: 05/18/2012 Page 22 of 22