SSFD4004
Main Product Characteristics:
VDSS
40V
RDS(on)
3.2mohm(typ.)
ID
145A
TO-252
Schematic diagram
Assignment
Features and Benefits:
Marking and pin
Advanced MOSFET process technology
Special designed for PWM, load switching and
general purpose applications
Ultra low on-resistance with low gate charge
Fast switching and reverse body recovery
175℃ operating temperature
Description:
It utilizes the latest trench processing techniques to achieve the high cell density and reduces the
on-resistance with high repetitive avalanche rating. These features combine to make this design an extremely
efficient and reliable device for use in power switching application and a wide variety of other applications
Absolute max Rating:
Symbol
Parameter
Max.
ID @ TC = 25°C
Continuous Drain Current, VGS @ 10V
145①
ID @ TC = 100°C
Continuous Drain Current, VGS @ 10V
100①
IDM
Pulsed Drain Current ②
580
Power Dissipation ③
153
W
Linear Derating Factor
1.02
W/°C
VDS
Drain-Source Voltage
40
V
VGS
Gate-to-Source Voltage
± 20
V
EAS
Single Pulse Avalanche Energy @ L=0.1mH
281.3
mJ
IAS
Avalanche Current @ L=0.1mH
75
A
-55 to + 175
°C
PD @TC = 25°C
TJ
TSTG
Operating Junction and Storage Temperature Range
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Units
A
page 1 of 8
SSFD4004
Thermal Resistance
Symbol
Characterizes
RθJC
RθJA
Typ.
Max.
Units
Junction-to-case ③
—
0.98
℃/W
Junction-to-ambient (t ≤ 10s) ④
—
62
℃/W
Junction-to-Ambient (PCB mounted, steady-state) ④
—
40
℃/W
Electrical Characterizes @TA=25℃ unless otherwise specified
Symbol
Parameter
V(BR)DSS
Drain-to-Source breakdown voltage
RDS(on)
Static Drain-to-Source on-resistance
VGS(th)
Gate threshold voltage
IDSS
Drain-to-Source leakage current
IGSS
Gate-to-Source forward leakage
Qg
Min.
Typ.
Max.
Units
40
—
—
V
—
3.2
4
—
6.17
—
1
—
3
—
1.11
—
—
—
1
—
—
50
—
—
100
—
—
-100
Total gate charge
—
52.3
—
Qgs
Gate-to-Source charge
—
20.3
—
Qgd
Gate-to-Drain("Miller") charge
—
23.1
—
VGS = 4.5V
td(on)
Turn-on delay time
—
15.9
—
VGS=10V, VDS =15V,
tr
Rise time
—
49.0
—
td(off)
Turn-Off delay time
—
61.6
—
tf
Fall time
—
25.6
—
ID =20A
Ciss
Input capacitance
—
6653
—
VGS = 0V
Coss
Output capacitance
—
632
—
Crss
Reverse transfer capacitance
—
603
—
mΩ
V
μA
nA
Conditions
VGS = 0V, ID = 250μA
VGS=10V,ID = 30A
TJ = 125°C
VDS = VGS, ID = 250μA
TJ = 125°C
VDS = 40V,VGS = 0V
TJ = 125°C
VGS =20V
VGS = -20V
ID = 20A,
nC
nS
pF
VDS=15V,
RL=0.75Ω,
RGEN=3Ω
VDS = 15V
ƒ =1MHz
Source-Drain Ratings and Characteristics
Symbol
IS
ISM
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Min.
Typ.
Max.
Units
—
—
145①
A
—
—
580
A
Conditions
MOSFET symbol
showing
the
integral reverse
p-n junction diode.
VSD
Diode Forward Voltage
—
0.72
1.2
V
IS=2.1A, VGS=0V
trr
Reverse Recovery Time
—
30.8
—
nS
TJ = 25°C, IF =20A, di/dt =
Qrr
Reverse Recovery Charge
—
31.1
—
nC
100A/μs
©Silikron Semiconductor CO.,LTD.
2012.02.01
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SSFD4004
Test circuits and Waveforms
Switch Waveforms:
Notes:
①Calculated continuous current based on maximum allowable junction temperature. Package
limitation current is 75A.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C.
⑤These curves are based on the junction-to-case thermal impedence which is measured with the
device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C.
©Silikron Semiconductor CO.,LTD.
2012.02.01
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SSFD4004
Typical electrical and thermal characteristics
Figure 2. Gate to source cut-off voltage
Figure 1: Typical Output Characteristics
Figure 3. Drain-to-Source Breakdown Voltage vs.
Temperature
©Silikron Semiconductor CO.,LTD.
Figure 4: Normalized On-Resistance Vs. Case
Temperature
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SSFD4004
Typical electrical and thermal characteristics
Figure 5. Maximum Drain Current Vs. Case
Figure 6.Typical Capacitance Vs. Drain-to-Source
Temperature
Voltage
Case Temperature
Figure7. Maximum Effective Transient Thermal Impedance, Junction-to-Case
©Silikron Semiconductor CO.,LTD.
2012.02.01
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SSFD4004
Mechanical Data：
DPAK PACKAGE OUTLINE DIMENSION
Symbol
A
A1
B
B1
C
D
D1
D2
E
E1
e
H
F
K
V2
Dimension In Millimeters
Nom
Max
2.300
2.380
1.010
1.110
0.760
0.810
5.330
5.460
0.510
0.560
6.100
6.200
5.350 (REF)
2.900 (REF)
6.500
6.600
6.700
4.83 (REF)
2.186
2.286
2.386
9.800
10.100
10.400
1.400
1.500
1.700
1.600 (REF)
Min
2.200
0.910
0.710
5.130
0.460
6.000
©Silikron Semiconductor CO.,LTD.
Min
0.087
0.036
0.028
0.202
0.018
0.236
0.256
0.086
0.386
0.055
80 (REF)
Dimension In Inches
Nom
0.091
0.040
0.030
0.210
0.020
0.240
0.211 (REF)
0.114 (REF)
0.260
0.190 (REF)
0.090
0.398
0.059
0.063 (REF)
Max
0.094
0.044
0.032
0.215
0.022
0.244
0.264
0.094
0.409
0.067
80 (REF)
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SSFD4004
Ordering and Marking Information
Device Marking: SSFD4004
Package (Available)
DPAK（TO-252）
Operating Temperature Range
C : -55 to 175 ºC
Devices per Unit
Option1：
Package
Type
TO-252
Option2：
Package
Type
TO-252
Units/Tap Tapes/Inner
e
Box
2500
2
Units/Tap Tapes/Inner
e
Box
2500
1
Reliability Test Program
Test Item
Conditions
High
Temperature
Reverse
Bias(HTRB)
High
Temperature
Gate
Bias(HTGB)
Units/Inner
Box
5000
Units/Inner
Box
2500
Inner
Boxes/Carton
Box
7
Units/Carton
Box
Inner
Boxes/Carton
Box
10
Units/Carton
Box
Duration
Sample Size
Tj=125℃ to 175℃ @
80% of Max
VDSS/VCES/VR
168 hours
500 hours
1000 hours
3 lots x 77 devices
Tj=150℃ or 175℃ @
100% of Max VGSS
168 hours
500 hours
1000 hours
3 lots x 77 devices
©Silikron Semiconductor CO.,LTD.
2012.02.01
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Version : 1.0
35000
25000
page 7 of 8
SSFD4004
ATTENTION:
■
■
■
■
■
■
■
■
■
Any and all Silikron products described or contained herein do not have specifications that can handle applications
that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other
applications whose failure can be reasonably expected to result in serious physical and/or material damage.
Consult with your Silikron representative nearest you before using any Silikron products described or contained
herein in such applications.
Silikron assumes no responsibility for equipment failures that result from using products at values that exceed,
even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed
in products specifications of any and all Silikron products described or contained herein.
Specifications of any and all Silikron products described or contained herein stipulate the performance,
characteristics, and functions of the described products in the independent state, and are not guarantees of the
performance, characteristics, and functions of the described products as mounted in the customer’s products or
equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer
should always evaluate and test devices mounted in the customer’s products or equipment.
Silikron Semiconductor CO.,LTD. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to
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Any and all information described or contained herein are subject to change without notice due to
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This catalog provides information as of Dec, 2008. Specifications and information herein are subject to change
without notice.
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[email protected]
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E-mail: [email protected]
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