SSF5NS65UF Main Product Characteristics: VDSS 650V RDS(on) 0.9Ω (typ.) ID 5A ① TO-220F Marking and pin Schematic diagram Assignment Features and Benefits: High dv/dt and avalanche capabilities 100% avalanche tested Low input capacitance and gate charge Low gate input resistance Description: The SSF5NS65UF series MOSFETs is a new technology, which combines an innovative super junction technology and advance process. This new technology achieves low Rdson, energy saving, high reliability and uniformity, superior power density and space saving. Absolute max Rating: Symbol Parameter Max. ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 5① ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 3.1① IDM Pulsed Drain Current ② 15 Power Dissipation ③ 28 W Linear Derating Factor 0.224 W/°C VDS Drain-Source Voltage 650 V VGS Gate-to-Source Voltage ± 30 V EAS Single Pulse Avalanche Energy @ L=100mH 144 mJ IAS Avalanche Current @ L=100mH 1.7 A -55 to +150 °C PD @TC = 25°C TJ TSTG Operating Junction and Storage Temperature Range ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 Units A page 1 of 8 SSF5NS65UF Thermal Resistance Symbol Characterizes Typ. Max. Units RθJC Junction-to-case ③ — 4.4 ℃/W RθJA Junction-to-ambient (t ≤ 10s) ④ — 80 ℃/W Electrical Characterizes @TA=25℃ unless otherwise specified Symbol Parameter V(BR)DSS Drain-to-Source breakdown voltage RDS(on) Min. Static Drain-to-Source on-resistance Typ. Max. Units V 650 — — — 0.9 1.2 — 2.0 — — 1.0 1.4 — 2.6 — 2 — 4 — 2.5 — — — 1 — — 50 — — 100 — — -100 10 — VGS(th) Gate threshold voltage IDSS Drain-to-Source leakage current IGSS Gate-to-Source forward leakage Qg Total gate charge — Qgs Gate-to-Source charge — 2.0 — Qgd Gate-to-Drain("Miller") charge — 2.4 — td(on) Turn-on delay time — 9.1 — tr Rise time — 5.8 — td(off) Turn-Off delay time — 23 — tf Fall time — 14 — Ciss Input capacitance — 353 — Coss Output capacitance — 18 — Crss Reverse transfer capacitance — 2.9 — Ω Ω V μA nA Conditions VGS = 0V, ID = 250μA VGS=10V,ID = 1A TJ = 125°C VGS=10V,ID = 2.8A TJ = 125°C VDS = VGS, ID = 250μA TJ = 125°C VDS =650V,VGS = 0V TJ = 125°C VGS =30V VGS = -30V ID = 5A, nC VDS=200V, VGS = 10V ns VGS=10V, VDS =400V, RGEN=10.2Ω,ID =1.5A VGS = 0V pF VDS = 100V ƒ = 1MHz Source-Drain Ratings and Characteristics Symbol IS ISM Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Min. Typ. Max. Units — — 5① A — — 15 A Conditions MOSFET symbol showing the integral reverse p-n junction diode. VSD Diode Forward Voltage — 0.8 1.2 V IS=2.8A, VGS=0V trr Reverse Recovery Time — 97 — nS TJ = 25°C, IF = 1.5A, Qrr Reverse Recovery Charge — 431 — nC di/dt = 100A/μs ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 page 2 of 8 SSF5NS65UF Test circuits and Waveforms Switch Waveforms: Notes: ①Calculated continuous current based on maximum allowable junction temperature. ②Repetitive rating; pulse width limited by max. junction temperature. ③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 page 3 of 8 SSF5NS65UF Typical electrical and thermal characteristics Figure 2. Gate to source cut-off voltage Figure 1: Typical Output Characteristics Figure 3. Drain-to-Source Breakdown Voltage Vs. Case Temperature ©Silikron Semiconductor CO.,LTD. Figure 4: Normalized On-Resistance Vs. Case Temperature 2013.04.27 www.silikron.com Version : 1.0 page 4 of 8 SSF5NS65UF Typical electrical and thermal characteristics Figure 5. Maximum Drain Current Vs. Case Figure 6. Typical Capacitance Vs. Drain-to-Source Temperature Voltage Figure7.Drain-to-Source Voltage Vs. Gate-to-Source Voltage ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 page 5 of 8 SSF5NS65UF Mechanical Data: TO220F PACKAGE OUTLINE DIMENSION_GN Symbol E E1 E2 A A1 A2 A3 c D D1 H1 e ФP ФP1 ФP2 ФP3 L L1 L2 Q1 Q2 b1 b2 b3 Dimension In Millimeters Min Nom Max 9.960 10.160 10.360 9.840 10.040 10.240 6.800 7.000 7.200 4.600 4.700 4.800 2.440 2.540 2.640 2.660 2.760 2.860 0.600 0.700 0.800 0.500 15.780 15.870 15.980 8.970 9.170 9.370 6.500 6.700 6.800 2.54BSC 3.080 3.180 3.280 1.400 1.500 1.600 0.900 1.000 1.100 0.100 0.200 0.300 12.780 12.980 13.180 2.970 3.170 3.370 0.830 0.930 1.030 3o 5o 7o o o 43 45 47o 1.180 1.280 1.380 0.760 0.800 0.840 1.420 ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Min 0.392 0.387 0.268 0.181 0.096 0.105 0.024 0.621 0.353 0.256 0.121 0.055 0.035 0.004 0.503 0.117 0.033 3o 43o 0.046 0.030 - Dimension In Inches Nom 0.400 0.395 0.276 0.185 0.100 0.109 0.028 0.020 0.625 0.361 0.264 0.10BSC 0.125 0.059 0.039 0.008 0.511 0.125 0.037 5o 45o 0.050 0.031 - Version : 1.0 Max 0.408 0.403 0.283 0.189 0.104 0.113 0.031 0.629 0.369 0.268 0.129 0.063 0.043 0.012 0.519 0.133 0.041 7o 47o 0.054 0.033 0.056 page 6 of 8 SSF5NS65UF Ordering and Marking Information Device Marking: SSF5NS65UF Package (Available) TO-220F Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tube Tubes/Inner Box Units/Inner Inner Box Boxes/Carton Box Units/Carton Box TO-220F 50 20 1000 6000 6 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) High Temperature Gate Bias(HTGB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices Tj=150℃@ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 page 7 of 8 SSF5NS65UF ATTENTION: ■ ■ ■ ■ ■ ■ ■ ■ ■ Any and all Silikron products described or contained herein do not have specifications that can handle applications that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with your Silikron representative nearest you before using any Silikron products described or contained herein in such applications. Silikron assumes no responsibility for equipment failures that result from using products at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in products specifications of any and all Silikron products described or contained herein. Specifications of any and all Silikron products described or contained herein stipulate the performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the performance, characteristics, and functions of the described products as mounted in the customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the customer’s products or equipment. 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Specifications and information herein are subject to change without notice. Customer Service Worldwide Sales and Service: [email protected] Technical Support: [email protected] Suzhou Silikron Semiconductor Corp. 11A, 428 Xinglong Street, Suzhou Industrial Park, P.R.China TEL: (86-512) 62560688 FAX: (86-512) 65160705 E-mail: [email protected] ©Silikron Semiconductor CO.,LTD. 2013.04.27 www.silikron.com Version : 1.0 page 8 of 8