________________________________________________________________________ BCB QUALIFICATION BCB qualification plan: NE.32S.04591/B Storage 20 PPH25 TCV CHA5295 complete wafer 275°C / 2000h Storage 20 PPH25 TCV CHA5295 complete wafer 300°C / 1000h Storage with humidity 20 PPH25 TCV CHA5295 complete wafer 85°C / 85% / 2000h HTRB 12 PPH25 CHA5295 Ta=200°C/2000h HTOL 12 PPH25 CHA5295 Ta=220°C/2000h HTOL 12 PPH25 CHA5295 Ta=250°C/2000h HTOL with humidity 6 PH25 TCV Ta=95°C 95%RH 1000h HTOL with humidity 6 DEC PH15 Ta=85°C 85%RH 2000h HTOL with humidity 10 DEC PH15 Ta=85°C 85%RH 2000h Vds=3.5V Ids=35mA HTOL with humidity 10 DEC PH15 Ta=85°C 85%RH 2000h Vds=3V Vgs=-2.5V Thermal cycling 5 PPH25 TCV 500 cycles at 2cph -55°C to +125 ‹C Test results Type of test standard duration RH Ta Failures Dry storage - 2000h - 275°C 0/20 Dry storage - 2000h - 300°C 0/20 HAST JESD22-A118 2000h 85% 85°C 0/20 HTOL - 2000h - 160°C 3/12* HTOL - 2000h - 135°C 2/12* HTRB - 2000h - 200°C 0/12 HTOL with humidity JESD22-A101-B 1000h 95% 95°C 0/6 HTOL with humidity JESD22-A101-B 2000h 85% 85°C 0/6 HTOL with humidity JESD22-A101-B 2000h 85% 85°C 0/10 HTOL with humidity JESD22-A101-B 1000h 85% 85°C 1/10 ** Thermal cycling JESD22-A104-B 500 cycles - -55°+125°C 0/5 ** Failure with a signature not related to humidity effect