RELIABILITY AND QUALIFICATION

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BCB QUALIFICATION
BCB qualification plan: NE.32S.04591/B
Storage
20 PPH25 TCV
CHA5295 complete wafer
275°C / 2000h
Storage
20 PPH25 TCV
CHA5295 complete wafer
300°C / 1000h
Storage with humidity
20 PPH25 TCV
CHA5295 complete wafer
85°C / 85% / 2000h
HTRB
12 PPH25 CHA5295
Ta=200°C/2000h
HTOL
12 PPH25 CHA5295
Ta=220°C/2000h
HTOL
12 PPH25 CHA5295
Ta=250°C/2000h
HTOL with humidity
6 PH25 TCV
Ta=95°C 95%RH 1000h
HTOL with humidity
6 DEC PH15
Ta=85°C 85%RH 2000h
HTOL with humidity
10 DEC PH15
Ta=85°C 85%RH 2000h
Vds=3.5V Ids=35mA
HTOL with humidity
10 DEC PH15
Ta=85°C 85%RH 2000h
Vds=3V Vgs=-2.5V
Thermal cycling
5 PPH25 TCV
500 cycles at 2cph
-55°C to +125 ‹C
Test results
Type of test
standard
duration
RH
Ta
Failures
Dry storage
-
2000h
-
275°C
0/20
Dry storage
-
2000h
-
300°C
0/20
HAST
JESD22-A118
2000h
85%
85°C
0/20
HTOL
-
2000h
-
160°C
3/12*
HTOL
-
2000h
-
135°C
2/12*
HTRB
-
2000h
-
200°C
0/12
HTOL with humidity
JESD22-A101-B
1000h
95%
95°C
0/6
HTOL with humidity
JESD22-A101-B
2000h
85%
85°C
0/6
HTOL with humidity
JESD22-A101-B
2000h
85%
85°C
0/10
HTOL with humidity
JESD22-A101-B
1000h
85%
85°C
1/10 **
Thermal cycling
JESD22-A104-B
500 cycles
-
-55°+125°C
0/5
** Failure with a signature not related to humidity effect