MM60F120B - Thinki Semiconductor Co.,Ltd.

MM60F120B
®
Pb
MM60F120B
Pb Free Plating Product
60 Ampere,1200 Volt SwitchMode Single Fast Recovery Epitaxial Diode
TO-247-2L
APPLICATION
·
·
·
·
·
·
·
Cathode(Bottom Side Metal Heatsink)
Freewheeling, Snubber, Clamp
Inversion Welder
PFC
Plating Power Supply
Ultrasonic Cleaner and Welder
Converter & Chopper
UPS
Anode
PRODUCT FEATURE
· Ultrafast Recovery Time
Internal Configuration
· Soft Recovery Characteristics
Cathode
Base Backside
· Low Recovery Loss
· Low Forward Voltage
· High Surge Current Capability
· Low Leakage Current
GENERAL DESCRIPTION
MM60F120B using the lastest FRED FAB process(planar passivation chip) with ultrafast and soft recovery characteristic.
ABSOLUTE MAXIMUM RATINGS
Symbol
T C =25°C unless otherwise specified
Parameter
Test Conditions
Values
Unit
VR
Maximum D.C. Reverse Voltage
1200
V
V RRM
Maximum Repetitive Reverse Voltage
1200
V
I F(AV)
Average Forward Current
60
A
I F(RMS)
RMS Forward Current
T C =110°C
84
A
I FSM
Non-Repetitive Surge Forward Current
T J =45°C, t=10ms, 50Hz, Sine
500
A
PD
Power Dissipation
312
W
TJ
Junction Temperature
-40 to +150
°C
T STG
Storage Temperature Range
-40 to +150
°C
Torque
Module-to-Sink
Recommended(M3)
1.1
N·m
R θJC
Thermal Resistance
Junction-to-Case
0.4
°C /W
6.0
g
T C =110°C
Weight
ELECTRICAL CHARACTERISTICS
Symbol
Parameter
T C =25°C unless otherwise specified
Test Conditions
Min.
Typ.
Max.
Unit
V R =1200V
--
--
500
µA
V R =1200V, T J =125°C
--
--
5
mA
I F =60A
--
2.10
--
V
I F =60A, T J =125°C
--
1.75
I RM
Reverse Leakage Current
VF
Forward Voltage
t rr
Reverse Recovery Time
I F =1A, V R =30V, di F /dt=-200A/μs
--
40
--
ns
t rr
Reverse Recovery Time
V R =600V, I F =60A
--
90
--
ns
I RRM
Max. Reverse Recovery Current
di F /dt=-200A/μs, T J =25°C
--
7.5
--
A
t rr
Reverse Recovery Time
V R =600V, I F =60A
--
320
--
ns
I RRM
Max. Reverse Recovery Current
di F /dt=-200A/μs, T J =125°C
--
14
--
A
Rev.05
© 2006 Thinki Semiconductor Co.,Ltd.
V
Page 1/3
http://www.thinkisemi.com/
MM60F120B
®
120
500
VR=600V
TJ =125°C
100
400
60
trr (ns)
IF (A)
80
TJ =125°C
300
200
40
IF=120A
IF=60A
IF=30A
TJ =25°C
100
20
0
0
0
1.5
2.0
3.0
2.5
VF(V)
Figure1. Forward Voltage Drop vs Forward Current
0.5
1.0
100
1000
400
600
800
diF/dt(A/μs)
Figure2. Reverse Recovery Time vs diF/dt
0
200
10
VR=600V
TJ =125°C
80
8
60
6
Qrr (μc)
IRRM (A)
VR=600V
TJ =125°C
40
IF=120A
4
IF=120A
IF=60A
IF=60A
20
IF=30A
2
IF=30A
0
0
0
400
600
1000
800
diF/dt(A/μs)
Figure3. Reverse Recovery Current vs diF/dt
400
600
800
1000
diF/dt(A/μs)
Figure4. Reverse Recovery Charge vs diF/dt
200
1.4
0
200
1
1.2
10
ZthJC (K/W)
1.0
Kf
0.8
0.6
IRRM
0.4
trr
0.2
0
0
-1
10
-2
10
-3
Duty
0.5
0.2
0.1
0.05
Single Pulse
Qrr
25
50
100 125 150
75
TJ (°C)
Figure5. Dynamic Parameters vs Junction Temperature
Rev.05
© 2006 Thinki Semiconductor Co.,Ltd.
10
-4
10
-4
-3
-2
-1
10
10
10
1
Rectangular Pulse Duration (seconds)
Fig6. Transient Thermal Impedance
Page 2/3
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MM60F120B
®
IF
trr
IRRM
dIF/dt
0.25 IRRM
Qrr
0.9 IRRM
Fig7. Diode Reverse Recovery Test Circuit and Waveform
Dimensions in Millimeters
Fig8. Package Outline
Rev.05
© 2006 Thinki Semiconductor Co.,Ltd.
Page 3/3
http://www.thinkisemi.com/