4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM

4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Features
1.35V DDR3L SDRAM SODIMM
MT18KSF51272HZ – 4GB
MT18KSF1G72HZ – 8GB
Features
Figure 1: 204-Pin SODIMM
(MO-268 R/C D1)
• DDR3L functionality and operations supported as
defined in the component data sheet
• 204-pin, small outline dual in-line memory module
(SODIMM) with ECC
• Fast data transfer rates: PC3-12800, PC3-10600
• 4GB (512 Meg x 72), 8GB (1 Gig x 72)
• VDD = 1.35V (1.283–1.45V)
• VDD = 1.5V (1.425–1.575V)
• Backward compatible to V DD = 1.5V ±0.075V
• VDDSPD = 3.0–3.6V
• Supports ECC error detection and correction
• Nominal and dynamic on-die termination (ODT) for
data, strobe, and mask signals
• Dual-rank
• On-board I2C temperature sensor with integrated
serial presence-detect (SPD) EEPROM
• Fixed burst chop (BC) of 4 and burst length (BL) of 8
via the mode register set (MRS)
• Selectable BC4 or BL8 on-the-fly (OTF)
• Gold edge contacts
• Halogen-free
• Fly-by topology
• Terminated control, command, and address bus
Module height: 30mm (1.181in)
Options
Marking
• Operating temperature
– Commercial (0°C ≤ T A ≤ +70°C)
• Package
– 204-pin DIMM (halogen-free)
• Frequency/CAS latency
– 1.25ns @ CL = 11 (DDR3-1600)
– 1.5ns @ CL = 9 (DDR3-1333)
None
Z
-1G6
-1G4
Table 1: Key Timing Parameters
Data Rate (MT/s)
tRCD
tRP
tRC
Speed
Grade
Industry
Nomenclature
CL = 9
CL = 8
CL = 7
CL = 6
CL = 5
(ns)
(ns)
(ns)
-1G6
PC3-12800
1600
1333
1333
1066
1066
800
667
13.125
13.125
48.125
-1G4
PC3-10600
–
1333
1333
1066
1066
800
667
13.125
13.125
49.125
-1G1
PC3-8500
–
–
–
1066
1066
800
667
13.125
13.125
50.625
-1G0
PC3-8500
–
–
–
1066
–
800
667
15
15
52.5
-80B
PC3-6400
–
–
–
–
–
800
667
15
15
52.5
1
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
CL = 11 CL = 10
Products and specifications discussed herein are subject to change by Micron without notice.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Features
Table 2: Addressing
Parameter
4GB
8GB
8K
8K
Refresh count
Row address
32K A[14:0]
64K A[15:0]
Device bank address
8 BA[2:0]
8 BA[2:0]
Device configuration
2Gb (256 Meg x 8)
4Gb (512 Meg x 8)
Column address
1K A[9:0]
1K A[9:0]
Module rank address
2 S#[1:0]
2 S#[1:0]
Table 3: Part Numbers and Timing Parameters – 4GB Modules
Base device: MT41K256M8,1 2Gb 1.35V DDR3L SDRAM
Module
Part Number2
Density
Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
MT18KSF51272HZ-1G6__
4GB
512 Meg x 72
12.8 GB/s
1.25ns/1600 MT/s
11-11-11
MT18KSF51272HZ-1G4__
4GB
512 Meg x 72
10.6 GB/s
1.5ns/1333 MT/s
9-9-9
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
Table 4: Part Numbers and Timing Parameters – 8GB Modules
Base device: MT41K512M8,1 4Gb 1.35V DDR3L SDRAM
Module
Part Number2
Density
Configuration
MT18KSF1G72HZ-1G6__
8GB
1 Gig x 72
12.8 GB/s
1.25ns/1600 MT/s
11-11-11
MT18KSF1G72HZ-1G4__
8GB
1 Gig x 72
10.6 GB/s
1.5ns/1333 MT/s
9-9-9
Notes:
1. The data sheet for the base device can be found on Micron’s web site.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions. Consult factory for current revision codes. Example: MT18KSF1G72HZ-1G6P1.
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Assignments
Pin Assignments
Table 5: Pin Assignments
204-Pin DDR3 SODIMM Front
204-Pin DDR3 SODIMM Back
Pin
Symbol
Pin
Symbol
Pin
Symbol
Pin
Symbol
Pin
Symbol
Pin
Symbol
Pin
Symbol
Pin
1
VREFDQ
53
VSS
105
A1
157
DM5
2
VSS
54
DQ28
106
A2
158
Symbol
VSS
3
VSS
55
DQ24
107
A0
159
DQ42
4
DQ4
56
DQ29
108
BA1
160
DQ46
5
DQ0
57
DQ25
109
VDD
161
DQ43
6
DQ5
58
VSS
110
VDD
162
DQ47
7
DQ1
59
DM3
111
CK0
163
VSS
8
VSS
60
DQS3#
112
CK1
164
VSS
9
VSS
61
VSS
113
CK0#
165
DQ48
10
DQS0#
62
DQS3
114
CK1#
166
DQ52
11
DM0
63
DQ26
115
VDD
167
DQ49
12
DQS0
64
VSS
116
VDD
168
DQ53
13
DQ2
65
DQ27
117
A10/AP
169
VSS
14
VSS
66
DQ30
118
NC
170
VSS
15
DQ3
67
VSS
119
BA0
171
DQS6#
16
DQ6
68
DQ31
120
NC
172
DM6
17
VSS
69
CB0
121
WE#
173
DQS6
18
DQ7
70
VSS
122
RAS#
174
DQ54
19
DQ8
71
CB1
123
VDD
175
VSS
20
VSS
72
CB4
124
VDD
176
DQ55
21
DQ9
73
VSS
125
CAS#
177
DQ50
22
DQ12
74
CB5
126
ODT0
178
VSS
23
VSS
75
DQS8#
127
S0#
179
DQ51
24
DQ13
76
DM8
128
ODT1
180
DQ60
25
DQS1#
77
DQS8
129
S1#
181
VSS
26
VSS
78
VSS
130
A13
182
DQ61
27
DQS1
79
VSS
131
VDD
183
DQ56
28
DM1
80
CB6
132
VDD
184
VSS
29
VSS
81
CB2
133
DQ32
185
DQ57
30
RESET#
82
CB7
134
DQ36
186
DQS7#
31
DQ10
83
CB3
135
DQ33
187
VSS
32
VSS
84
VREFCA
136
DQ37
188
DQS7
33
DQ11
85
VDD
137
VSS
189
DM7
34
DQ14
86
VDD
138
VSS
190
VSS
35
VSS
87
CKE0
139
DQS4#
191
DQ58
36
DQ15
88
NF/A151
140
DM4
192
DQ62
37
DQ16
89
CKE1
141
DQS4
193
DQ59
38
VSS
90
A14
142
DQ38
194
DQ63
39
DQ17
91
BA2
143
VSS
195
VSS
40
DQ20
92
A9
144
DQ39
196
VSS
41
VSS
93
VDD
145
DQ34
197
SA0
42
DQ21
94
VDD
146
VSS
198
EVENT#
43
DQS2#
95
A12
147
DQ35
199
VDDSPD
44
DM2
96
A11
148
DQ44
200
SDA
45
DQS2
97
A8
149
VSS
201
SA1
46
VSS
98
A7
150
DQ45
202
SCL
47
VSS
99
A5
151
DQ40
203
VTT
48
DQ22
100
A6
152
VSS
204
VTT
49
DQ18
101
VDD
153
DQ41
–
–
50
DQ23
102
VDD
154
DQS5#
–
–
51
DQ19
103
A3
155
VSS
–
–
52
VSS
104
A4
156
DQS5
–
–
Note:
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
1. Pin 88 is NF for 4GB; A15 for 8GB.
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Descriptions
Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for all DDR3
modules. All pins listed may not be supported on this module. See Pin Assignments for
information specific to this module.
Table 6: Pin Descriptions
Symbol
Type
Description
Ax
Input
Address inputs: Provide the row address for ACTIVE commands, and the column address and auto precharge bit (A10) for READ/WRITE commands, to select one location
out of the memory array in the respective bank. A10 sampled during a PRECHARGE
command determines whether the PRECHARGE applies to one bank (A10 LOW, bank
selected by BAx) or all banks (A10 HIGH). The address inputs also provide the op-code
during a LOAD MODE command. See the Pin Assignments table for density-specific addressing information.
BAx
Input
Bank address inputs: Define the device bank to which an ACTIVE, READ, WRITE, or
PRECHARGE command is being applied. BA define which mode register (MR0, MR1,
MR2, or MR3) is loaded during the LOAD MODE command.
CKx,
CKx#
Input
Clock: Differential clock inputs. All control, command, and address input signals are
sampled on the crossing of the positive edge of CK and the negative edge of CK#.
CKEx
Input
Clock enable: Enables (registered HIGH) and disables (registered LOW) internal circuitry and clocks on the DRAM.
DMx
Input
Data mask (x8 devices only): DM is an input mask signal for write data. Input data
is masked when DM is sampled HIGH, along with that input data, during a write access. Although DM pins are input-only, DM loading is designed to match that of the
DQ and DQS pins.
ODTx
Input
On-die termination: Enables (registered HIGH) and disables (registered LOW) termination resistance internal to the DDR3 SDRAM. When enabled in normal operation,
ODT is only applied to the following pins: DQ, DQS, DQS#, DM, and CB. The ODT input
will be ignored if disabled via the LOAD MODE command.
Par_In
Input
Parity input: Parity bit for Ax, RAS#, CAS#, and WE#.
RAS#, CAS#, WE#
Input
Command inputs: RAS#, CAS#, and WE# (along with S#) define the command being
entered.
RESET#
Input
(LVCMOS)
Reset: RESET# is an active LOW asychronous input that is connected to each DRAM
and the registering clock driver. After RESET# goes HIGH, the DRAM must be reinitialized as though a normal power-up was executed.
Sx#
Input
Chip select: Enables (registered LOW) and disables (registered HIGH) the command
decoder.
SAx
Input
Serial address inputs: Used to configure the temperature sensor/SPD EEPROM address range on the I2C bus.
SCL
Input
Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communication to and from the temperature sensor/SPD EEPROM on the I2C bus.
CBx
I/O
Check bits: Used for system error detection and correction.
DQx
I/O
Data input/output: Bidirectional data bus.
DQSx,
DQSx#
I/O
Data strobe: Differential data strobes. Output with read data; edge-aligned with
read data; input with write data; center-aligned with write data.
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Descriptions
Table 6: Pin Descriptions (Continued)
Symbol
Type
SDA
I/O
Description
Serial data: Used to transfer addresses and data into and out of the temperature sensor/SPD EEPROM on the I2C bus.
TDQSx,
TDQSx#
Output
Redundant data strobe (x8 devices only): TDQS is enabled/disabled via the LOAD
MODE command to the extended mode register (EMR). When TDQS is enabled, DM is
disabled and TDQS and TDQS# provide termination resistance; otherwise, TDQS# are
no function.
Err_Out#
Output
Parity error output: Parity error found on the command and address bus.
(open drain)
EVENT#
Output
Temperature event: The EVENT# pin is asserted by the temperature sensor when crit(open drain) ical temperature thresholds have been exceeded.
VDD
Supply
Power supply: 1.35V (1.283–1.45V) backward-compatible to 1.5V (1.425–1.575V). The
component VDD and VDDQ are connected to the module VDD.
VDDSPD
Supply
Temperature sensor/SPD EEPROM power supply: 3.0–3.6V.
VREFCA
Supply
Reference voltage: Control, command, and address VDD/2.
VREFDQ
Supply
Reference voltage: DQ, DM VDD/2.
VSS
Supply
Ground.
VTT
Supply
Termination voltage: Used for control, command, and address VDD/2.
NC
–
No connect: These pins are not connected on the module.
NF
–
No function: These pins are connected within the module, but provide no functionality.
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
DQ Map
Table 7: Component-to-Module DQ Map, Front
Component
Reference
Number
Component
DQ
U1
U3
U5
U7
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ
Module DQ
Module Pin
Number
0
2
13
U2
0
23
50
1
0
5
1
21
42
2
3
15
2
19
51
3
5
6
3
20
40
4
7
18
4
22
48
5
4
4
5
16
37
6
6
16
6
18
49
7
1
7
7
17
39
0
CB2
81
0
42
159
1
CB1
71
1
45
150
2
CB3
83
2
46
160
3
CB4
72
3
40
151
4
CB6
80
4
43
161
5
CB0
69
5
44
148
6
CB7
82
6
47
162
7
CB5
74
7
41
153
0
59
193
0
14
34
1
57
185
1
9
21
2
62
192
2
11
33
3
56
183
3
8
19
4
58
191
4
10
31
5
61
182
5
13
24
6
63
194
6
15
36
7
60
180
7
12
22
0
29
56
0
38
142
1
26
63
1
33
135
2
28
54
2
35
147
3
31
68
3
37
136
4
25
57
4
39
144
5
27
65
5
32
133
6
24
55
6
34
145
7
30
66
7
36
134
U4
U6
U8
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
Table 7: Component-to-Module DQ Map, Front (Continued)
Component
Reference
Number
Component
DQ
Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ
Module DQ
Module Pin
Number
U9
0
55
176
U10
0
57
185
1
53
168
1
59
193
2
54
174
2
56
183
3
52
166
3
62
192
4
51
179
4
60
180
5
48
165
5
63
194
6
50
177
6
61
182
7
49
167
7
58
191
Table 8: Component-to-Module DQ Map, Back
Component
Reference
Number
Component
DQ
U11
U13
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ
Module DQ
Module Pin
Number
0
45
150
U12
0
CB1
71
1
42
159
1
CB2
81
2
40
151
2
CB4
72
3
46
160
3
CB3
83
4
41
153
4
CB5
74
5
47
162
5
CB7
82
6
44
148
6
CB0
69
7
43
161
7
CB6
80
0
21
42
0
0
5
1
23
50
1
2
13
2
20
40
2
5
6
3
19
51
3
3
15
4
17
39
4
1
7
5
18
49
5
6
16
6
16
37
6
4
4
7
22
48
7
7
18
U14
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
Table 8: Component-to-Module DQ Map, Back (Continued)
Component
Reference
Number
Component
DQ
U16
U18
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ
Module DQ
Module Pin
Number
0
53
168
U17
0
33
135
1
55
176
1
38
142
2
52
166
2
37
136
3
54
174
3
35
147
4
49
167
4
36
134
5
50
177
5
34
145
6
48
165
6
32
133
7
51
179
7
39
144
0
26
63
0
9
21
1
29
56
1
14
34
2
31
68
2
8
19
3
28
54
3
11
33
4
30
66
4
12
22
5
24
55
5
15
36
6
27
65
6
13
24
7
25
57
7
10
31
U19
8
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© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Functional Block Diagram
Functional Block Diagram
Figure 2: Functional Block Diagram
S1#
S0#
DQS0
DQS0#
DM0
DQS4
DQS4#
DM4
DM CS# DQS DQS#
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
VSS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U1
U14
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
U6
U19
VSS
ZQ
DM CS# DQS DQS#
VSS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
U2
VSS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
U13
VSS
U7
U16
U9
ZQ
VSS
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U18
VSS
ZQ
DQS8
DQS8#
DM8
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQS7
DQS7#
DM7
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U11
ZQ
DM CS# DQS DQS#
ZQ
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
U4
VSS
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
VSS
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQS6
DQS6#
DM6
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQS3
DQS3#
DM3
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U10
U5
ZQ
VSS
DM CS# DQS DQS#
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
VSS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
VSS
Rank 0: U1–U4, U6, U7, U10, U16, U17
Rank 1: U5, U8, U9, U11–U14, U18, U19
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U3
BA[2:0]: DDR3 SDRAM
A[15/14:0]: DDR3 SDRAM
RAS#: DDR3 SDRAM
CAS#: DDR3 SDRAM
WE#: DDR3 SDRAM
CKE0: Rank 0
CKE1: Rank 1
ODT0: Rank 0
ODT1: Rank 1
RESET#: DDR3 SDRAM
Note:
PDF: 09005aef84567057
ksf18c512_1gx72hz.pdf – Rev. I 8/15 EN
DM CS# DQS DQS#
VSS
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
U8
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS2
DQS2#
DM2
U17
VSS
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DM CS# DQS DQS#
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQS5
DQS5#
DM5
VSS
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
VSS
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
VSS
ZQ
DQS1
DQS1#
DM1
BA[2:0]
A[15/14:0]
RAS#
CAS#
WE#
CKE0
CKE1
ODT0
ODT1
RESET#
DM CS# DQS DQS#
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
U12
U15
Temperature
sensor/
SPD EEPROM
SCL
EVT A0
A1 A2
SA0 SA1
EVENT#
ZQ
VSS
Temperature sensor/
SPD EEPROM
VDDSPD
VDD
DDR3 SDRAM
VTT
Control, command,
and address termination
VREFCA
DDR3 SDRAM
VREFDQ
DDR3 SDRAM
VSS
DDR3 SDRAM
CK0
CK0#
Rank 0
CK1
CK1#
Rank 1
SDA
VSS
Clock, control, command, and address line terminations:
CKE[1:0], A[15/14:0],
RAS#, CAS#, WE#,
ODT[1:0], BA[2:0],
S#[1:0]
CK
CK#
DDR3
SDRAM
VTT
DDR3
SDRAM
VDD
1. The ZQ ball on each DDR3 component is connected to an external 240Ω ±1% resistor
that is tied to ground. It is used for the calibration of the component’s ODT and output
driver.
9
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
General Description
General Description
DDR3 SDRAM modules are high-speed, CMOS dynamic random access memory modules that use internally configured 8-bank DDR3 SDRAM devices. DDR3 SDRAM modules use DDR architecture to achieve high-speed operation. DDR3 architecture is essentially an 8n-prefetch architecture with an interface designed to transfer two data words
per clock cycle at the I/O pins. A single read or write access for the DDR3 SDRAM module effectively consists of a single 8n-bit-wide, one-clock-cycle data transfer at the internal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O pins.
DDR3 modules use two sets of differential signals: DQS, DQS# to capture data and CK
and CK# to capture commands, addresses, and control signals. Differential clocks and
data strobes ensure exceptional noise immunity for these signals and provide precise
crossing points to capture input signals.
Fly-By Topology
DDR3 modules use faster clock speeds than earlier DDR technologies, making signal
quality more important than ever. For improved signal quality, the clock, control, command, and address buses have been routed in a fly-by topology, where each clock, control, command, and address pin on each DRAM is connected to a single trace and terminated (rather than a tree structure, where the termination is off the module near the
connector). Inherent to fly-by topology, the timing skew between the clock and DQS signals can be easily accounted for by using the write-leveling feature of DDR3.
Temperature Sensor with Serial Presence-Detect EEPROM
Thermal Sensor Operations
The temperature from the integrated thermal sensor is monitored and converts into a
digital word via the I2C bus. System designers can use the user-programmable registers
to create a custom temperature-sensing solution based on system requirements. Programming and configuration details comply with JEDEC standard No. 21-C page 4.7-1,
"Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor."
Serial Presence-Detect EEPROM Operation
DDR3 SDRAM modules incorporate serial presence-detect. The SPD data is stored in a
256-byte EEPROM. The first 128 bytes are programmed by Micron to comply with JEDEC standard JC-45, "Appendix X: Serial Presence Detect (SPD) for DDR3 SDRAM Modules." These bytes identify module-specific timing parameters, configuration information, and physical attributes. The remaining 128 bytes of storage are available for use by
the customer. System READ/WRITE operations between the master (system logic) and
the slave EEPROM device occur via a standard I2C bus using the DIMM’s SCL (clock)
SDA (data), and SA (address) pins. Write protect (WP) is connected to V SS, permanently
disabling hardware write protection. For further information refer to Micron technical
note TN-04-42, "Memory Module Serial Presence-Detect."
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed may cause permanent damage to the module. This is a
stress rating only, and functional operation of the module at these or any other conditions outside those indicated in each device's data sheet is not implied. Exposure to absolute maximum rating conditions for extended periods may adversely affect reliability.
Table 9: Absolute Maximum Ratings
Symbol
Parameter
Min
Max
Units
VDD
VDD supply voltage relative to VSS
–0.4
1.975
V
VIN, VOUT
Voltage on any pin relative to VSS
–0.4
1.975
V
Table 10: Operating Conditions
Symbol
VDD
Parameter
Min
Nom
Max
Units Notes
VDD supply voltage
1.283
1.35
1.45
V
1.425
1.5
1.575
V
VREFCA(DC)
Input reference voltage command/address bus
0.49 × VDD
0.5 × VDD
0.51 × VDD
V
VREFDQ(DC)
I/O reference voltage DQ bus
0.49 × VDD
0.5 × VDD
0.51 × VDD
V
–600
–
600
mA
0.49 × VDD 20mV
0.5 × VDD
0.51 × VDD +
20mV
V
Address inputs,
RAS#, CAS#,
WE#, BA
–36
0
36
µA
S#, CKE, ODT,
CK, CK#
–18
0
18
DM
–4
0
4
DQ, DQS, DQS#,
CB
–10
0
10
µA
–18
0
18
µA
IVTT
Termination reference current from VTT
VTT
Termination reference voltage (DC) – command/
address bus
II
IOZ
IVREF
Input leakage current; Any input 0V ≤ VIN ≤ VDD; VREF input
0V ≤ VIN ≤ 0.95V (All other pins
not under test = 0V)
Output leakage current; 0V ≤
VOUT ≤ VDD; DQ and ODT are
disabled; ODT is HIGH
VREF supply leakage current;
VREFDQ = VDD/2 or VREFCA = VDD/2
(All other pins not under test = 0V)
1
2
TA
Module ambient operating temperature
0
–
70
°C
3, 4
TC
DDR3 SDRAM component case operating temperature
0
–
95
°C
3, 4, 5
Notes:
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1. Module is backward-compatible with 1.5V operation. Refer to device specification for
details and operation guidance.
2. VTT termination voltage in excess of the stated limit will adversely affect the command
and address signals’ voltage margin and will reduce timing margins.
3. TA and TC are simultaneous requirements.
4. For further information, refer to technical note TN-00-08: “Thermal Applications,”
available on Micron’s Web site.
5. The refresh rate is required to double when 85°C < TC ≤ 95°C.
11
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DRAM Operating Conditions
DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR3 component data sheets.
Component specifications are available at micron.com. Module speed grades correlate
with component speed grades, as shown below.
Table 11: Module and Component Speed Grades
DDR3 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade
Component Speed Grade
-2G1
-093
-1G9
-107
-1G6
-125
-1G4
-15E
-1G1
-187E
-1G0
-187
-80C
-25E
-80B
-25
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully designed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level.
Micron encourages designers to simulate the signal characteristics of the system's
memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to ensure the required supply voltage is maintained.
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
IDD Specifications
Table 12: DDR3 IDD Specifications and Conditions – 4GB (Die Revision K)
Values are for the MT41K256M8 DDR3L SDRAM only and are computed from values specified in the 2Gb 1.35V (256 Meg x
8) component data sheet
Parameter
Symbol
1600
1333
Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE
IDD01
459
450
mA
1
576
558
mA
216
216
mA
IDD1
2
Precharge power-down current: Slow exit
IDD2P0
Precharge power-down current: Fast exit
IDD2P1
2
252
252
mA
Precharge quiet standby current
IDD2Q2
360
360
mA
2
378
378
mA
1
387
369
mA
Precharge standby current
IDD2N
Precharge standby ODT current
IDD2NT
Active power-down current
IDD3P
2
378
378
mA
Active standby current
IDD3N2
576
540
mA
Burst read operating current
IDD4R1
954
846
mA
1
981
873
mA
1
Burst write operating current
IDD4W
Refresh current
IDD5B
1728
1719
mA
Self refresh temperature current: MAX TC = 85°C
IDD62
216
216
mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C
All banks interleaved read current
IDD6ET
270
270
mA
1
1512
1458
mA
2
252
252
mA
IDD7
Reset current
IDD8
Notes:
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2
1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
13
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© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
Table 13: DDR3 IDD Specifications and Conditions – 8GB (Die Revision E)
Values are for the MT41K512M8 DDR3L SDRAM only and are computed from values specified in the 4Gb 1.35V (512 Meg x
8) component data sheet
Parameter
Symbol
1600
1333
Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE
IDD01
657
585
mA
1
756
720
mA
324
324
mA
IDD1
2
Precharge power-down current: Slow exit
IDD2P0
Precharge power-down current: Fast exit
IDD2P1
2
576
504
mA
Precharge quiet standby current
IDD2Q2
576
504
mA
2
576
522
mA
1
513
477
mA
Precharge standby current
IDD2N
Precharge standby ODT current
IDD2NT
Active power-down current
IDD3P
2
684
630
mA
Active standby current
IDD3N2
684
630
mA
Burst read operating current
IDD4R1
1575
1422
mA
1
1287
1152
mA
1
Burst write operating current
IDD4W
Refresh current
IDD5B
2277
2214
mA
Self refresh temperature current: MAX TC = 85°C
IDD62
360
360
mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C
All banks interleaved read current
IDD6ET
450
450
mA
1
2142
1872
mA
2
360
360
mA
IDD7
Reset current
IDD8
Notes:
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2
1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
14
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© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
Table 14: DDR3 IDD Specifications and Conditions – 8GB (Die Revision P)
Values are for the MT41K512M8 DDR3L SDRAM only and are computed from values specified in the 4Gb 1.35V (512 Meg x
8) component data sheet
Parameter
Symbol
1600
Units
IDD01
Operating current 0: One bank ACTIVATE-to-PRECHARGE
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE
1
mA
477
mA
2
180
mA
Precharge power-down current: Fast exit
IDD2P1
2
198
mA
Precharge quiet standby current
IDD2Q2
270
mA
2
288
mA
1
Precharge power-down current: Slow exit
IDD1
342
IDD2P0
Precharge standby current
IDD2N
Precharge standby ODT current
IDD2NT
270
mA
Active power-down current
IDD3P
2
270
mA
Active standby current
IDD3N2
360
mA
1
900
mA
1
999
mA
1
Burst read operating current
IDD4R
Burst write operating current
IDD4W
Refresh current
IDD5B
1458
mA
Self refresh temperature current: MAX TC = 85°C
IDD62
270
mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C
All banks interleaved read current
IDD6ET
417
mA
1
1260
mA
2
234
mA
IDD7
Reset current
IDD8
Notes:
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2
1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
15
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© 2011 Micron Technology, Inc. All rights reserved.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Temperature Sensor with Serial Presence-Detect EEPROM
Temperature Sensor with Serial Presence-Detect EEPROM
The temperature sensor continuously monitors the module's temperature and can be
read back at any time over the I2C bus shared with the SPD EEPROM. Refer to JEDEC
standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with
Temperature Sensor."
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: micron.com/SPD.
Table 15: Temperature Sensor with SPD EEPROM Operating Conditions
Parameter/Condition
Symbol
Min
Max
Units
VDDSPD
3.0
3.6
V
Supply current: VDD = 3.3V
IDD
–
2.0
mA
Input high voltage: Logic 1; SCL, SDA
VIH
VDDSPD x 0.7
VDDSPD + 1
V
Input low voltage: Logic 0; SCL, SDA
VIL
–0.5
VDDSPD x 0.3
V
Output low voltage: IOUT = 2.1mA
VOL
–
0.4
V
Input current
IIN
–5.0
5.0
µA
Temperature sensing range
–
–40
125
°C
Temperature sensor accuracy (class B)
–
–1.0
1.0
°C
Supply voltage
Table 16: Temperature Sensor and SPD EEPROM Serial Interface Timing
Parameter/Condition
Symbol
Min
Max
Units
tBUF
4.7
–
µs
SDA fall time
tF
20
300
ns
SDA rise time
tR
–
1000
ns
tHD:DAT
200
900
ns
Time bus must be free before a new transition can
start
Data hold time
Start condition hold time
tH:STA
4.0
–
µs
Clock HIGH period
tHIGH
4.0
50
µs
Clock LOW period
tLOW
4.7
–
µs
tSCL
10
100
kHz
Data setup time
tSU:DAT
250
–
ns
Start condition setup time
tSU:STA
4.7
–
µs
Stop condition setup time
tSU:STO
4.0
–
µs
SCL clock frequency
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Temperature Sensor with Serial Presence-Detect EEPROM
EVENT# Pin
The temperature sensor also adds the EVENT# pin (open-drain). Not used by the SPD
EEPROM, EVENT# is a temperature sensor output used to flag critical events that can be
set up in the sensor’s configuration register.
EVENT# has three defined modes of operation: interrupt mode, compare mode, and
critical temperature mode. Event thresholds are programmed in the 0x01 register using
a hysteresis. The alarm window provides a comparison window, with upper and lower
limits set in the alarm upper boundary register and the alarm lower boundary register,
respectively. When the alarm window is enabled, EVENT# will trigger whenever the
temperature is outside the MIN or MAX values set by the user.
The interrupt mode enables software to reset EVENT# after a critical temperature
threshold has been detected. Threshold points are set in the configuration register by
the user. This mode triggers the critical temperature limit and both the MIN and MAX of
the temperature window.
The compare mode is similar to the interrupt mode, except EVENT# cannot be reset by
the user and returns to the logic HIGH state only when the temperature falls below the
programmed thresholds.
Critical temperature mode triggers EVENT# only when the temperature has exceeded
the programmed critical trip point. When the critical trip point has been reached, the
temperature sensor goes into comparator mode, and the critical EVENT# cannot be
cleared through software.
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4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Module Dimensions
Module Dimensions
Figure 3: 204-Pin DDR3 SODIMM
Front view
3.8 (0.150)
MAX
67.75 (2.667)
67.45 (2.656)
2.0 (0.079) R
(2X)
U1
1.8 (0.071)
(2X)
U3
U2
U6
U5
U4
U7
U9
U8
30.15 (1.187)
29.85 (1.175)
20.0 (0.787)
TYP
6.0 (0.236)
TYP
1.0 (0.039)
TYP
2.0 (0.079)
TYP
Pin 1
0.45 (0.018)
TYP
Pin 203
63.6 (2.504)
TYP
45° 4X
1.10 (0.043)
0.90 (0.035)
0.6 (0.024)
TYP
Back view
U10
U16
U11
U17
U12
U14
U13
U19
U18
U15
4.0 (0.157)
TYP
2.55 (0.10)
TYP
3.0 (0.12)
TYP
Pin 204
39.0 (1.535)
TYP
Pin 2
21.0 (0.827)
TYP
24.8 (0.976)
TYP
Notes:
1. All dimensions are in millimeters (inches); MAX/MIN or typical (TYP) where noted.
2. The dimensional diagram is for reference only.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-4000
www.micron.com/products/support Sales inquiries: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization sometimes occur.
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