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MYX29GL01GS11DPIV2
1Gbit - 64M x 16 GL-S MirrorBit® Eclipse™ Flash Memory
Advanced information. Subject to change without notice.
Features
• Advanced Sector Protection (ASP)
ƒƒ Volatile and non-volatile protection methods for
each sector
• Tin-lead ball metallurgy
• 65 nm MirrorBit Eclipse technology
• Single supply (VCC) for read / program / erase (2.7V to
3.6V)
• Separate 1024-byte One Time Program (OTP) array
with two lockable regions
• Common Flash Interface (CFI) parameter table
• 100,000 erase cycles for any sector typical
• Versatile I/O Feature
ƒƒ Wide I/O voltage range (VIO): 1.65V to VCC
• 20-year data retention typical
• Configuration: 64M x 16
• Asynchronous 32-byte page read
Options
• 512-byte programming buffer
ƒƒ Programming in page multiples, up to a maximum
of 512 bytes
• FBGA package (Sn63 Pb37 solder)
ƒƒ 64-ball FBGA (9mm x 9mm)
• Single word and multiple program on same
word options
• Operating temperature
• Sector Erase
• Marking
ƒƒ Industrial (-40°C ≤ TC ≤ +85°C)
ƒƒ Orange dot, label
ƒƒ Uniform 128-kbyte sectors
• Suspend and resume commands for program and
erase operations
• Revision
• Status register, data polling, and ready/busy pin
methods to determine device status
Table 1: Performance Summary
Maximum Read Access Times
Density
Voltage Range
Random
Access Time (tACC)
Page
Access Time (tPACC)
CE#
Access Time (tCE)
OE#
Access Time (tOE)
1Gb
VersatileIO VIO
110
25
110
35
Spansion Part. No. S29GL01GS11DHIV2
April 15, 2015 • Revision 1.7
Micross US (Americas) 407.298.7100 • Micross UK (EMEA & ROW) +44 (0) 1603 788967 • [email protected] • www.micross.com
Form #: CSI-D-686 Document 001
a t a xS
e e t MirrorBit® Eclipse™ Flash Memory
MYX29GL01GS11DPIV2 • 1Gbit D- 64M
16h GL-S
Advanced information. Subject to change without notice.
11.2.2
Physical Diagram – LAE064
Figure 1: Physical Diagram – LAE064
Figure 11.4 LAE064—64-ball Fortified Ball Grid Array (FBGA), 9 x 9 mm
PACKAGE
NOTES:
LAE 064
JEDEC
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994.
N/A
2. ALL DIMENSIONS ARE IN MILLIMETERS.
9.00 mm x 9.00 mm
PACKAGE
SYMBOL
MIN
NOM
MAX
NOTE
A
---
---
1.40
A1
0.40
---
---
STANDOFF
A2
0.60
---
---
BODY THICKNESS
PROFILE HEIGHT
D
9.00 BSC.
BODY SIZE
E
9.00 BSC.
BODY SIZE
D1
7.00 BSC.
MATRIX FOOTPRINT
E1
7.00 BSC.
MATRIX FOOTPRINT
MD
8
MATRIX SIZE D DIRECTION
ME
8
MATRIX SIZE E DIRECTION
N
64
b
0.50
0.60
BALL DIAMETER
eD
1.00 BSC.
BALL PITCH - D DIRECTION
eE
1.00 BSC.
BALL PITCH - E DIRECTION
SD / SE
0.50 BSC.
SOLDER BALL PLACEMENT
?
NONE
4.
e REPRESENTS THE SOLDER BALL GRID PITCH.
5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE
"D" DIRECTION.
SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE
"E" DIRECTION.
N IS THE TOTAL NUMBER OF SOLDER BALLS.
BALL COUNT
0.70
3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010?
EXCEPT AS NOTED).
DEPOPULATED SOLDER BALLS
6
DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL
DIAMETER IN A PLANE PARALLEL TO DATUM C.
7
SD AND SE ARE MEASURED WITH RESPECT TO DATUMS
A AND B AND DEFINE THE POSITION OF THE CENTER
SOLDER BALL IN THE OUTER ROW.
WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN ?
THE OUTER ROW PARALLEL TO THE D OR E DIMENSION,
RESPECTIVELY, SD OR SE = 0.000.
WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN
THE OUTER ROW, SD OR SE = e/2
8. NOT USED.
9. "+" INDICATES THE THEORETICAL CENTER OF
DEPOPULATED BALLS.
3623 \ 16-038.12 \ 1.16.07
April 15, 2015 • Revision 1.7
Micross US (Americas) • 407.298.7100
Micross UK (EMEA & ROW) • +44 (0) 1603 788967
[email protected]
www.micross.com
Form #: CSI-D-686 Document 001