Cu Wirebond Fact Sheet

Copper Wirebond
A JCET Company
Technology Overview
HIGHLIGHTS
• STATS ChipPAC is ready to engage on all wirebond
package types and in all manufacturing locations
• QFNp, QFNs, QFN-dr, QFNs-st, QFNs-st-mr, QFP,
TSOP, FBGA, FBGA-SD, FBGA-MD, FBGA-SS and
PBGA package types supported
• Full turnkey services available
DESCRIPTION
• Advanced design rules supported for bond pad opening (BPO), bond pad pitch (BPP), stacked die
and die-to-die bonding
• Advanced assembly processes and materials including 0.6 mil Cu wire
• Assembly yields with Pd-coated Cu wire comparable
to Au at >99.9%
COST BENEFITS
•
Copper wire offers significant cost savings over gold wire and
a hedge against continued increases in gold prices
•
Best Value BOM (BVB) available for each package for the most
cost-effective copper wirebond solution
Copper (Cu) wire is increasingly becoming the material of choice for
interconnection in wirebond packages. Cost reduction is the primary
driver for the industry’s conversion to copper wire, replacing traditional
gold (Au) wire interconnects to achieve lower cost without sacrificing
performance, quality and reliability. Increasingly implemented as a low
risk replacement for gold wire in many mobile, consumer and computing
applications, copper wire provides similar electrical characteristics and
performance to gold wire, and also offers lower resistivity which can
be a benefit where lower bond wire resistance is needed for device
performance. STATS ChipPAC has focused on material and process
enhancements such as Palladium (Pd) coated wire and ultra high density
substrates to drive cost reduction and enable customers to realise the
full benefits of copper wire interconnect.
As the semiconductor industry moves towards higher pin counts,
finer bond pad pitches and thinner wire diameters, there is a growing
demand to utilize copper wire in more advanced multi-die laminate and
leaded packages, including 3D packaging. STATS ChipPAC offers copper
wirebond solutions in a wide range of leaded and laminate packages.
STATS ChipPAC’s copper wire offering includes die-to-die bonding and
a range of 3D package configurations including stacked die, side-byside die and a combination of stacked plus side-by-side die packages.
PALLADIUM-COATED COPPER WIRE
COPPER WIREBOND CONSIDERATIONS
Palladium-coated copper wire (Pd-Cu)
recommended for all applications, fab nodes
and development programs
With significant experience in copper wire conversions, STATS ChipPAC understands the requirements for successful copper wirebonding.
While the customer’s existing structure can be successfully utilized
in many cases, STATS ChipPAC recommends the following “ideal”
guidelines:
•
Thicker aluminum pad (>0.8mm, ideally >1.0mm)
•
Thick barrier metal layer under pad (Ti or W)
•
0.4mm larger bond pad vs Au to allow for metal splash
•
Provides enhanced reliability
•
Improves corrosion resistance
Pd concentration
Electron Probe Micro
Analyzer image
www.cj-elec.com www.statschippac.com
Consult STATS ChipPAC for a review of your design for copper
wirebond readiness.
Copper Wirebond
A JCET Company
Data
PACKAGE SUPPORT BY SITE
SPECIFICATIONS
Standard Wire Diameter 18mm / 0.7mil - 20mm / 0.8mil
Optional Wire Diameter 15mm / 0.6mil - 50mm / 2.0mil
• Contact STATS ChipPAC for site-specific availability
• Pd-coated Cu wire recommended
Wafer Nodes
>28nm; non-Low-K, Low-K
40 - 28/32nm; Low-K, Extra Low-K
Both CUP and non-CUP devices
CUP Support
China
Korea
Singapore
FBGA



FBGA-SD



FBGA-MD



FBGA-SS



PBGA

QFN


QFN-dr

QFNs-st

QFNs-st-mr
COPPER WIRE CHARACTERISTICS

QFP

TSOP

Wire Material
Melting Point
(Deg, oC)
Thermal Cond
(W/m-c)
Electrical Resistance
(ohm-m)
Young’s Modulus
(Gpa)
Tensile Strength
(Mpa)
Hardness @ Ball
(Hv)
Gold (Au)
Copper (Cu)
Pd Coated Copper
1064
1083
1083
315
393
393
2.33x10 -8
1.72 x 10-8
1.80 x 10-8
80
120
120
240
290
290
60-80
80 – 90
85 – 95
R Wire / mm (mOhms / mm)
Bondwire
Diameter
Frequency
DC
Frequency 10
MHz
Frequency 25
MHz
0.8 mil
1.0 mil
1.3 mil
72.49
46.48
27.61
72.75
46.77
27.94
73.29
47.44
28.86
Frequency 75 Frequency 500
MHz
MHz
76.08
51.33
34.39
129.37
101.52
76.53
Frequency 1
GHz
Frequency 10
GHz
L Wire
(nH / mm)
C Wire
(pF/mm)
175.50
138.06
105.16
518.58
416.80
324.29
0.82
0.78
0.73
0.06
0.06
0.06
Frequency 1
GHz
Frequency 10
GHz
L Wire
(nH / mm)
C Wire
(pF/mm)
152.55
120.56
92.24
456.54
367.86
287.11
0.82
0.78
0.73
0.06
0.06
0.06
Frequency 1
GHz
Frequency 10
GHz
L Wire
(nH / mm)
C Wire
(pF/mm)
149.06
117.88
90.26
447.20
360.31
281.37
0.82
0.78
0.73
0.06
0.06
0.06
Pd-coated Copper (Conductivity = 5.55 x 10^7 siemens / meter; R Wire / mm (mOhms / mm)
Bondwire
Diameter
Frequency
DC
Frequency 10
MHz
Frequency 25
MHz
0.8 mil
1.0 mil
1.3 mil
56.04
35.95
21.38
56.32
36.26
21.75
56.92
37.04
22.84
Frequency 75 Frequency 500
MHz
MHz
60.31
41.71
29.13
112.46
88.20
66.85
Copper (Conductivity = 5.8 x 10^7 siemens / meter)
Bondwire
Diameter
Frequency
DC
Frequency 10
MHz
Frequency 25
MHz
0.8 mil
1.0 mil
1.3 mil
53.68
34.45
20.48
53.96
34.76
20.86
54.58
35.56
21.98
Frequency 75 Frequency 500
MHz
MHz
58.08
40.36
28.38
109.84
86.17
65.37
RELIABILITY
Item
MRT MSL3
MRT MSL2aA
mHAST
PCT
TC”C”
HTST
Condition
30’C / 60%
192hrs / 260’C
85’C / 85%
8 hrs / 260’C
130’C / 85% RH
after MSL3, 168 hrs
121’C / 100% RH
after MSL3, 168 hrs
-65’C~150’C
after MSL3, 1000 cycles
150’C
w/o Precon, 1000 hrs
Corporate Office
Global Offices
10 Ang Mo Kio St. 65, #04-08/09 Techpoint, Singapore 569059 Tel: 65-6824-7777 Fax: 65-6720-7823
USA 510-979-8000
CHINA 86-21-5976-5858
KOREA 82-32-340-3114
SWITZERLAND 41-22-929-5658
The STATS ChipPAC logo is a registered trademark of STATS ChipPAC Pte. Ltd. Trademark registered in United States. Singapore company registration number 199407932D. All other product names and other company names herein are for identification purposes
only and may be the trademarks or registered trademarks of their respective owners. STATS ChipPAC disclaims any and all rights in those marks. STATS ChipPAC makes no guarantee or warranty of its accuracy in the information given, or that the use of such
information will not infringe on intellectual rights of third parties. Under no circumstances shall STATS ChipPAC be liable for any damages whatsoever arising out of the use of, or inability to use the materials in this document. STATS ChipPAC reserves the right
to change the information at any time and without notice.
©Copyright 2016. STATS ChipPAC Pte. Ltd. All rights reserved.
Apr 2016