High-reliability discrete products and engineering services since 1977 HR FLOW SILICON CONTROLLED RECTIFIERS All parts are screened per MIL-PRF-19500, JANTX Level and the device detail specification. All testing is performed at room temperature, unless indicated otherwise. For testing at high and low temperatures, Group A testing is required. Test Method Conditions / Notes 1 Temperature Cycling MIL-STD-750 Method 1051 2 Interim Electrical Testing Test condition C or maximum storage temperature, whichever less. 20 cycles, 10 minutes per extreme. 25°C static parameters per device detail specification. 3 Power Burn-in MIL-STD-750 Method 1040 96 hours minimum at specified bias conditions and temperature. 4 Final Electrical Testing 25°C static parameters per device detail specification. 5 Delta Calculation Delta parameters and limits per device detail specification. 6 PDA Calculation 10 percent defective allowed. 7 Seal Test Fine Leak MIL-STD-750 Method 1071 Condition G or H. 8 Seal Test Gross Leak MIL-STD-750 Method 1071 Condition C Notes: 1. Testing varies in accordance with the device detail specification. 2. Specific customer testing needs may be accommodated into any testing flow (selection tests, temperature requirements, special tests). 144 Market Street Kenilworth NJ 07033 USA phone +1.908.245-7200 fax +1.908.245-0555 [email protected] www.digitroncorp.com