Rectifier HR Flow

High-reliability discrete products
and engineering services since 1977
HR FLOW
RECTIFIER DIODES
All parts are screened per MIL-PRF-19500, JANTX Level and the device detail specification. All
testing is performed at room temperature, unless indicated otherwise. For testing at high and low
temperatures, Group A testing is required.
Test
Method
Conditions / Notes
1
Temperature Cycling
MIL-STD-750 Method 1051
2
Surge Test
MIL-STD-750 Method 4066
Test condition C or maximum
storage temperature, whichever
less. 20 cycles, 10 minutes per
extreme.
Rated IFSM as specified in the
detail drawing.
3
Thermal Impedance
MIL-STD-750 Method 3101
As specified in the detail
drawing.
4
High Temperature
Reverse Bias Burn-in
(HTRB)
Interim Electrical
Testing
MIL-STD-750 Method 1038
Condition A. 80% of rated VR for
48 hours at 150°C.
6
Power Burn-in
MIL-STD-750 Method 1038
7
Final Electrical Testing
DC parameters per device detail
specification.
8
Delta Calculation
Delta parameters and limits per
device detail specification.
9
PDA Calculation
10 percent defective allowed.
5
10
Seal Test Gross Leak
DC parameters per device detail
specification.
MIL-STD-750 Method 1071
96 hours of forward bias per
device detail specification.
Condition C
Notes:
1. Testing varies in accordance with the device detail specification.
2. Specific customer testing needs may be accommodated into any testing flow (selection
tests, temperature requirements, special tests).
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fax +1.908.245-0555
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www.digitroncorp.com