AOS Semiconductor Product Reliability Report AOD2910, rev B Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOD2910. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AOD2910 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. II. III. IV. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation I. Product Description: The AOD2910 uses trench MOSFET technology that is uniquely optimized to provide the most efficient high frequency switching performance. Both conduction and switching power losses are minimized due to an extremely low combination of RDS(ON), Ciss and Coss. This device is ideal for boost converters and synchronous rectifiers for consumer, telecom, industrial power supplies and LED backlighting. -RoHS Compliant -Halogen-Free Details refer to the datasheet. II. Die / Package Information: Process Package Type Lead Frame Die Attach Bonding Mold Material Moisture Level AOD2910 Standard sub-micron 100V N channel process TO252 Bare Cu Soft solder Al wire Epoxy resin with silica filler Up to Level 1 2 III. Result of Reliability Stress for AOD2910 Test Item Test Condition Time Point MSL Precondition 168hr 85°c /85%RH +3 cycle reflow@260°c Temp = 150°c , Vgs=100% of Vgsmax - 15 lots 168hrs 500 hrs 1000 hrs 3 lots 3 lots Temp = 150°c , Vds=80% of Vdsmax 168hrs 500 hrs 1000 hrs HAST 130 °c , 85%RH, 33.3 psi, Vgs = 100% of Vgsmax 96 hrs Pressure Pot 121°c , 29.7psi, RH=100% 96 hrs HTGB Lot Attribution Temperature Cycle -65°c to 150°c , air to air, 250 / 500 cycles Number of Failures Reference Standard 3003pcs 0 JESD22A113 462pcs 0 JESD22A108 77 pcs / lot 462pcs 0 JESD22A108 (Note A*) 12 lots 77 pcs / lot 924pcs 0 JESD22A110 (Note A*) 12 lots 77 pcs / lot 924pcs 0 JESD22A102 (Note A*) 77 pcs / lot 0 JESD22A104 (Note A*) HTRB Total Sample size 3 lots 3 lots 15 lots (Note A*) 1155pcs 77 pcs / lot Note A: The reliability data presents total of available generic data up to the published date. IV. Reliability Evaluation FIT rate (per billion): 5.09 MTTF = 22440 years The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AOD2910). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. 2 9 Failure Rate = Chi x 10 / [2 (N) (H) (Af)] 9 = 1.83 x 10 / [2x (6x77x500+6x77x1000) x259] = 5.09 9 8 MTTF = 10 / FIT = 1.97 x 10 hrs = 22440 years Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: Af 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C 130 deg C 150 deg C 259 87 32 13 5.64 2.59 1 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u =The use junction temperature in degree (Kelvin), K = C+273.16 3 k = Boltzmann’s constant, 8.617164 X 10-5eV / K 4