MITSUBISHI RA30H1317M1

Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RA30H1317M1
RoHS Compliance , 135-175MHz 30W 12.5V 2 Stage Amp. For MOBILE RADIO
DESCRIPTION
The RA30H1317M1 is a 30-watt RF MOSFET Amplifier
Module for 12.5-volt mobile radios that operate in the 135- to
175-MHz range.
The battery can be connected directly to the drain of the
enhancement-mode MOSFET transistors. The output power and
drain current increase as the gate voltage increases. With a gate
voltage around 3.5V (minimum), output power and drain current
increases substantially. The nominal output power becomes
available at 4V (typical) and 5V (maximum). At VGG=5V, the
typical gate current is 1 mA.
This module is designed for non-linear FM modulation.
FEATURES
• Enhancement-Mode MOSFET Transistors
(IDD≅0 @ VDD=12.5V, VGG=0V)
• Pout>30W, ηT>40% @ VDD=12.5V, VGG=5V, Pin=50mW
• Broadband Frequency Range: 135-175MHz
• Low-Power Control Current IGG=1mA (typ) at VGG=5V
• Module Size: 67 x 19.4 x 9.9 mm
BLOCK DIAGRAM
2
3
1
4
5
1
RF Input (Pin)
2
Gate Voltage (VGG), Power Control
3
Drain Voltage (VDD), Battery
4
RF Output (Pout)
5
RF Ground (Case)
PACKAGE CODE: H2M
RoHS COMPLIANCE
• RA30H1317M1-201 is a RoHS compliant product.
• RoHS compliance is indicate by the letter “G” after the Lot Marking.
• This product include the lead in the Glass of electronic parts and the
lead in electronic Ceramic parts.
How ever ,it applicable to the following exceptions of RoHS Directions.
1.Lead in the Glass of a cathode-ray tube, electronic parts, and
fluorescent tubes.
2.Lead in electronic Ceramic parts.
ORDERING INFORMATION:
ORDER NUMBER
SUPPLY FORM
RA30H1317M1-201
Antistatic tray,
10 modules/tray
RA30H1317M1
24 Jun 2010
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
MAXIMUM RATINGS (Tcase=+25°C, unless otherwise specified)
SYMBOL PARAMETER
CONDITIONS
RATING
UNIT
VDD
Drain Voltage
VGG<5V, ZG=ZL=50Ω
17
V
VGG
Gate Voltage
VDD<12.5V, Pin=50mW, ZG=ZL=50Ω
6
V
Pin
Input Power
100
mW
Pout
Output Power
45
W
Operation Case Temperature Range
-30 to +100
°C
Storage Temperature Range
-40 to +110
°C
MIN
TYP
MAX
UNIT
Frequency Range
135
-
175
MHz
Pout
Output Power
30
-
-
W
ηT
Total Efficiency
40
-
-
%
Tcase(OP)
Tstg
f=135-175MHz, VGG<5V
The above parameters are independently guaranteed.
ELECTRICAL CHARACTERISTICS (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
SYMBOL PARAMETER
f
nd
Harmonic
CONDITIONS
VDD=12.5V,VGG=5V,Pin=50mW
2fo
2
-
-
-35
dBc
3fo
3 Harmonic
-
-
-45
dBc
ρin
Input VSWR
-
-
3:1
—
IGG
Leakage Current
VDD=12.5V,VGG=0V,Pin=0W
-
-
1
mA
—
Stability
VDD=10.0-15.2V, Pin=25-70mW,
Pout<30W (VGG control), Load VSWR=3:1
—
Load VSWR Tolerance
VDD=15.2V, Pin=50mW, Pout=30W (VGG control),
Load VSWR=20:1
rd
No parasitic oscillation
More than –60dBc
No degradation or destroy
—
—
All parameters, conditions, ratings, and limits are subject to change without notice.
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
OUTPUT POWER, TOTAL EFFICIENCY,
and INPUT VSWR versus Frequency
100
-20
45
90
-25
80
-30
ηt
30
60
25
50
20
40
VDD=12.5V
VGG=5V
Pin=50mW
15
10
ρin
5
30
20
0
130
140
150
160
170
VDD=12.5V
VGG=5V
Pin=50mW
-35
-40
-45
-50
2nd
-55
-60
10
-65
0
-70
180
3rd
130
140
150
Frequency f(MHz)
50
9
45
8
40
Pout
Gp
35
7
30
6
25
5
4
IDD
15
3
f=135MHz
VDD=12.5V
VGG=5V
10
5
2
0
-10
-5
0
5
10
15
Power Gain Gp(dB)
10
45
Output Power Pout(dBm)
50
20
170
180
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
Drain Current IDD(A)
Power Gain Gp(dB)
Output Power Pout(dBm)
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
40
160
Frequency f(MHz)
8
Gp
7
30
6
25
5
20
4
IDD
15
0
0
3
f=155MHz
VDD=12.5V
VGG=5V
10
5
2
1
0
-10
Input Power Pin(dBm)
9
Pout
35
1
20
10
Drain Current IDD(A)
Input VSWR ρin (-)
70
35
Harmonics (dBc)
Pout
Total Efficiency ηt(%)
50
40
Output Power Pout(W)
2nd, 3rd HARMONICS versus FREQUENCY
-5
0
5
10
15
20
Input Power Pin(dBm)
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
10
50
9
Pout
8
Gp
35
7
30
6
25
5
20
4
IDD
15
3
f=175MHz
VDD=12.5V
VGG=5V
10
5
2
Drain Current IDD(A)
40
Power Gain Gp(dB)
Output Power Pout(dBm)
45
1
0
0
-10
-5
0
5
10
15
20
Input Power Pin(dBm)
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
Output Power Pout(W)
40
Pout
10
50
9
45
8
40
35
7
30
6
IDD
25
5
20
4
15
3
10
5
0
2
4
6
8
10
12
Output Power Pout(W)
f=135MHz
VGG=5V
Pin=50mW
45
Drain Current IDD(A)
50
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
10
f=155MHz
VGG=5V
Pin=50mW
9
Pout
8
7
35
30
6
IDD
25
5
20
4
15
3
2
10
2
1
5
1
0
0
14
0
2
Drain Voltage VDD(V)
Drain Current IDD(A)
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
4
6
8
10
12
14
Drain Voltage VDD(V)
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
40
Output Power Pout(W)
10
f=175MHz
VGG=5V
Pin=50mW
45
9
Pout
8
7
35
IDD
30
6
25
5
20
4
15
3
10
2
5
1
Drain Current IDD(A)
50
0
0
2
4
6
8
10
12
14
Drain Voltage VDD(V)
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
35
Pout
50
9
45
8
40
7
IDD
30
6
25
5
20
4
15
3
10
5
0
2.5
3.0
3.5
4.0
4.5
5.0
10
f=155MHz
VDD=12.5V
Pin=50mW
35
9
Pout
8
7
6
30
IDD
25
5
20
4
15
3
2
10
2
1
5
1
0
0
5.5
0
2.5
Gate Voltage VGG(V)
Drain Current IDD(A)
Output Power Pout(W)
40
10
Output Power Pout(W)
f=135MHz
VDD=12.5V
Pin=50mW
45
Drain Current IDD(A)
50
3.0
3.5
4.0
4.5
5.0
5.5
Gate Voltage VGG(V)
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
10
50
Output Power Pout(W)
40
35
9
Pout
8
7
IDD
30
6
25
5
20
4
15
3
10
2
5
1
Drain Current IDD(A)
f=175MHz
VDD=12.5V
Pin=50mW
45
0
0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
Gate Voltage VGG(V)
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
OUTLINE DRAWING (mm)
67±1
④
⑤
18±1
10.7±1
③
15±1
① ②
4±0.5
49.8±1
2-R2±0.5
19.4±1
(3.26)
60±1
12.5±1
0.6±0.2
17±1
44±1
(2.6)
(9.9)
3.1+0.6/-0.4
7.3±0.5
56±1
1 RF Input (Pin)
2 Gate Voltage (VGG)
3 Drain Voltage (VDD)
4 RF Output (Pout)
5 RF Ground (Case)
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24 Jun 2010
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
TEST BLOCK DIAGRAM
Power
Meter
DUT
1
Signal
Generator
Attenuator
Preamplifier
Attenuator
Directional
Coupler
C1, C2: 4700pF, 22uF in parallel
3
2
Spectrum
Analyzer
4
ZL=50Ω
ZG=50Ω
C1
5
Directional
Coupler
Attenuator
Power
Meter
C2
+
DC Power
Supply VGG
+
DC Power
Supply VDD
1 RF Input (Pin)
2 Gate Voltage (VGG)
3 Drain Voltage (VDD)
4 RF Output (Pout)
5 RF Ground (Case)
EQUIVALENT CIRCUIT
3
2
4
1
5
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
RECOMMENDATIONS and APPLICATION INFORMATION:
Construction:
This module consists of a glass-epoxy substrate soldered onto a copper flange. For mechanical protection, a metal
cap is attached (which makes the improvement of RF radiation easy). The MOSFET transistor chips are die
bonded onto metal, wire bonded to the substrate, and coated with resin. Lines on the substrate (eventually
inductors), chip capacitors, and resistors form the bias and matching circuits. Wire leads soldered onto the
glass-epoxy substrate provide the DC and RF connection.
Following conditions must be avoided:
a) Bending forces on the glass-epoxy substrate (for example, by driving screws or from fast thermal changes)
b) Mechanical stress on the wire leads (for example, by first soldering then driving screws or by thermal expansion)
c) Defluxing solvents reacting with the resin coating on the MOSFET chips (for example, Trichloroethylene)
d) Frequent on/off switching that causes thermal expansion of the resin
e) ESD, surge, overvoltage in combination with load VSWR, and oscillation
ESD:
This MOSFET module is sensitive to ESD voltages down to 1000V. Appropriate ESD precautions are required.
Mounting:
A thermal compound between module and heat sink is recommended for low thermal contact resistance.
The module must first be screwed to the heat sink, then the leads can be soldered to the printed circuit board.
M3 screws are recommended with a tightening torque of 4.0 to 6.0 kgf-cm.
Soldering and Defluxing:
This module is designed for manual soldering.
The leads must be soldered after the module is screwed onto the heat sink.
The temperature of the lead (terminal) soldering should be lower than 350°C and shorter than 3 second.
Ethyl Alcohol is recommend for removing flux. Trichloroethylene solvents must not be used (they may cause
bubbles in the coating of the transistor chips which can lift off the bond wires).
Thermal Design of the Heat Sink:
At Pout=30W, VDD=12.5V and Pin=50mW each stage transistor operating conditions are:
Pout
Rth(ch-case)
IDD @ ηT=40%
VDD
Pin
Stage
(W)
(W)
(V)
(°C/W)
(A)
st
0.05
5.0
2.9
0.84
1
12.5
nd
2
5.0
30.0
0.7
5.16
The channel temperatures of each stage transistor Tch = Tcase + (VDD x IDD - Pout + Pin) x Rth(ch-case) are:
Tch1 = Tcase + (12.5V x 0.84A – 5.0W + 0.05W) x 2.9°C/W = Tcase + 16.1 °C
Tch2 = Tcase + (12.5V x 5.16A - 30.0W + 5.0W) x 0.7°C/W = Tcase + 27.7 °C
For long-term reliability, it is best to keep the module case temperature (Tcase) below 90°C. For an ambient
temperature Tair=60°C and Pout=30W, the required thermal resistance Rth (case-air) = ( Tcase - Tair) / ( (Pout / ηT ) Pout + Pin ) of the heat sink, including the contact resistance, is:
Rth(case-air) = (90°C - 60°C) / (30W/40% – 30W + 0.05W) = 0.67 °C/W
When mounting the module with the thermal resistance of 0.67 °C/W, the channel temperature of each stage
transistor is:
Tch1 = Tair + 46.1 °C
Tch2 = Tair + 57.7 °C
The 175°C maximum rating for the channel temperature ensures application under derated conditions.
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
Output Power Control:
By the gate voltage (VGG).
Around VGG=3.5V, the output power and drain current increases substantially.
Around VGG=4V (typical) to VGG=5V (maximum), the nominal output power becomes available.
Oscillation:
To test RF characteristics, this module is put on a fixture with two bias decoupling capacitors each on gate and
drain, a 4.700 pF chip capacitor, located close to the module, and a 22 µF (or more) electrolytic capacitor.
When an amplifier circuit around this module shows oscillation, the following may be checked:
a) Do the bias decoupling capacitors have a low inductance pass to the case of the module?
b) Is the load impedance ZL=50Ω?
c) Is the source impedance ZG=50Ω?
ATTENTION:
1.High Temperature; This product might have a heat generation while operation,Please take notice that have a
possibility to receive a burn to touch the operating product directly or touch the product until cold after switch off.
At the near the product,do not place the combustible material that have possibilities to arise the fire.
2. Generation of High Frequency Power; This product generate a high frequency power. Please take notice that do
not leakage the unnecessary electric wave and use this products without cause damage for human and property per
normal operation.
3. Before use; Before use the product,Please design the equipment in consideration of the risk for human and
electric wave obstacle for equipment.
PRECAUTION FOR THE USE OF MITSUBISHI SILICON RF POWER AMPLIFIER DEVICES:
1.The specifications of mention are not guarantee values in this data sheet. Please confirm additional details
regarding operation of these products from the formal specification sheet. For copies of the formal specification
sheets, please contact one of our sales offices.
2.RA series products (RF power amplifier modules) are designed for consumer mobile communication terminals
and were not specifically designed for use in other applications. In particular, while these products are highly
reliable for their designed purpose, they are not manufactured under a quality assurance testing protocol that is
sufficient to guarantee the level of reliability typically deemed necessary for critical communications elements.
Examples of critical communications elements would include transmitters for base station applications and fixed
station applications that operate with long term continuous transmission and a higher on-off frequency during
transmitting, especially for systems that may have a high impact to society.
3.RA series products use MOSFET semiconductor technology. They are sensitive to ESD voltage therefore
appropriate ESD precautions are required.
4.In order to maximize reliability of the equipment, it is better to keep the devices temperature low. It is
recommended to utilize a sufficient sized heat-sink in conjunction with other cooling methods as needed (fan,
etc.) to keep the case temperature for RA series products lower than 60deg/C under standard conditions, and
less than 90deg/C under extreme conditions.
5.RA series products are designed to operate into a nominal load impedance of 50 ohms. Under the condition of
operating into a severe high load VSWR approaching an open or short, an over load condition could occur. In the
worst case there is risk for burn out of the transistors and burning of other parts including the substrate in the
module.
6.The formal specification includes a guarantee against parasitic oscillation under a specified maximum load
mismatch condition. The inspection for parasitic oscillation is performed on a sample basis on our manufacturing
line. It is recommended that verification of no parasitic oscillation be performed at the completed equipment level
also.
7.For specific precautions regarding assembly of these products into the equipment, please refer to the
supplementary items in the specification sheet.
8.Warranty for the product is void if the products protective cap (lid) is removed or if the product is modified in any
way from it’s original form.
9.For additional “Safety first” in your circuit design and notes regarding the materials, please refer the last page of
this data sheet.
10. Please refer to the additional precautions in the formal specification sheet.
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Silicon RF Power Semiconductors
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RoHS COMPLIANCE
RA30H1317M1
Keep safety first in your circuit designs !
Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better
and more reliable, but there is always the possibility that trouble may occur with them. Trouble with
semiconductors may lead to personal injury, fire or property damage. Remember to give due
consideration to safety when making your circuit designs, with appropriate measures such as (i)
placement of substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against
any malfunction or mishap.
Notes regarding these materials
- These materials are intended as a reference to assist our customers in the selection of the Mitsubishi
semiconductor product best suited to the customer’s application; they do not convey any license under
any intellectual property rights, or any other rights, belonging to Mitsubishi Electric Corporation or a
third party.
- Mitsubishi Electric Corporation assumes no responsibility for any damage, or infringement of any thirdparty’s rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or
circuit application examples contained in these materials.
- All information contained in these materials, including product data, diagrams, charts, programs and
algorithms represents information on products at the time of publication of these materials, and are
subject to change by Mitsubishi Electric Corporation without notice due to product improvements or
other reasons. It is therefore recommended that customers contact Mitsubishi Electric Corporation or
an authorized Mitsubishi Semiconductor product distributor for the latest product information before
purchasing a product listed herein. The information described here may contain technical inaccuracies
or typographical errors. Mitsubishi Electric Corporation assumes no responsibility for any damage,
liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information
published by Mitsubishi Electric Corporation by various means, including the Mitsubishi Semiconductor
home page (http://www.mitsubishichips.com).
- When using any or all of the information contained in these materials, including product data,
diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total
system before making a final decision on the applicability of the information and products. Mitsubishi
Electric Corporation assumes no responsibility for any damage, liability or other loss resulting from the
information contained herein.
- Mitsubishi Electric Corporation semiconductors are not designed or manufactured for use in a device
or system that is used under circumstances in which human life is potentially at stake. Please contact
Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product distributor when
considering the use of a product contained herein for any specific purposes, such as apparatus or
systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use.
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whole or in part these materials.
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than the approved destination.
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