REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET PMIC N/A PREPARED BY Greg Cecil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A 1 2 3 4 5 7 8 9 10 11 12 13 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 CHECKED BY Greg Cecil http://www.landandmaritime.dla.mil/ APPROVED BY Charles F. Saffle DRAWING APPROVAL DATE 14-03-26 REVISION LEVEL MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, SWITCHING, VOLTAGE REGULATOR SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 6 1 OF 5962-11232 13 5962-E441-11 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 Federal stock class designator \ R RHA designator (see 1.2.1) 11232 01 Device type (see 1.2.2) K Device class designator (see 1.2.3) / X Case outline (see 1.2.4) A Lead finish (see 1.2.5) \/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type 01 Generic number MSK 5048RH Circuit function Radiation hardened, 3.5 A, switching voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter X Y Z Descriptive designator See figure 1 See figure 1 See figure 1 STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Terminals 5 5 5 Package style Single row flange, mount, straight leads, glass sealed Single row flange, gull wing, glass sealed Single row flange, leads formed down, glass sealed SIZE 5962-11232 A REVISION LEVEL SHEET 2 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) .......................................................................... Output current (IOUT) ...................................................................... Sync pin voltage ............................................................................ Junction temperature (TJ) .............................................................. Thermal resistance, junction-to-case at +125°C: Forward switch ........................................................................... Catch diode ................................................................................ Storage temperature range ............................................................ Lead temperature (soldering, 10 seconds) .................................... +16 V dc 4A 7.0 V +150°C 14.0°C/W 20.0°C/W -65°C to +150°C +300°C 1.4 Recommended operating conditions. Input voltage range (VIN)................................................................ Case operating temperature range (TC)......................................... +4.5 V dc to +12.8 V dc -55°C to +125°C 1.5 Radiation features. 2/ 3/ Maximum total dose available (dose rate ≤ 50-300 rads(Si)/s) ...... Maximum total dose available (dose rate ≤ 10 mrads(Si)/s) .......... 100 krads(Si) 4/ 50 krads(Si) 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http://quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ 2/ 3/ 4/ 5/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. See 4.3.5 for the manufacturer’s radiation hardness assurance analysis and testing. Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. The device on this SMD has been high dose rate tested using condition A to 150 krads(Si) to ensure RHA designator level “R” (100 krads(Si)), per test method 1019 of MIL-STD-883. This testing will be repeated after any design or process changes that can affect RHA response. This device has not been low dose rate tested, but a similar device, 5962-1123401, has been Low Dose Rate (LDR) tested per method 1019 of MIL-STD-883 condition D for initial qualification. This device has not been characterized for Enhanced Low Dose Rate Sensitivity (ELDRS). This device or a similar device will be low dose rate tested after any design or process changes that can affect RHA response. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 3 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 4 TABLE I. Electrical performance characteristics. Test Symbol Feedback voltage Conditions 1/ 2/ 3/ -55°C ≤ TC ≤ +125°C unless otherwise specified Group A subgroups VFB 1,2,3 Device type 01 1 Post 100 Krad (Si) Limits Unit Min Max 1.19 1.23 1.17 1.24 V Line regulation VRLINE 4.3 V ≤ VIN ≤ 15 V 1,2,3 01 ±0.5 % Load regulation VRLOAD 1 A ≤ IOUT ≤ 3 A 1,2,3 01 ±1.0 % Efficiency EFF 1,2,3 01 Current limit 4/ ILIM 1,2,3 01 3.5 Switching frequency 5/ SF 4 01 460 540 5,6 440 560 4 410 540 Post 100 Krad (Si) Synchronization range 6/ 1/ 2/ 3/ 4/ 5/ 6/ SYNC 580 kHz ≤ SYNC ≤ 1 MHz 7,8A,8B 75 % A 01 kHz PASS/ FAIL The device on this SMD has been high dose rate tested using condition A to 150 krads(Si) to ensure RHA designator level “R” (100 krads(Si)), per test method 1019 of MIL-STD-883. This testing will be repeated after any design or process changes that can affect RHA response. This device has not been low dose rate tested, but a similar device, 5962-1123401, has been Low Dose Rate (LDR) tested per method 1019 of MIL-STD-883 condition D for initial qualification. This device has not been characterized for Enhanced Low Dose Rate Sensitivity (ELDRS). This device or a similar device will be low dose rate tested after any design or process changes that can affect RHA response. Unless otherwise specified, VIN = 5.0 V, VOUT = 2.5 V, and IOUT = 1.0 A. Radiation end-point limits are as specified in Table II. Output current limit function provides protection from transient overloads, but it may exceed the maximum continuous rating. Continuous operation in current limit may damage the device. Parameter shall be guaranteed to the limits specified for subgroups 5 and 6 for all lots not specifically tested. Parameter shall be guaranteed to the limits specified for subgroups 8A and 8B for all lots not specifically tested. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 5 Case outline X. Symbol A A1 A2 øb D E E1 e e1 L L1 L2 øP S1 Millimeters Min Max --6.48 0.76 1.27 3.30 3.81 0.71 0.81 20.57 21.08 17.27 17.78 8.51 9.02 2.54 TYP 9.91 10.41 12.70 --13.34 13.84 2.74 3.25 3.81 4.31 3.68 REF Inches Min Max --.255 .030 .050 .130 .150 .028 .032 .810 .830 .680 .700 .335 .355 .100 TYP .390 .410 .500 --.525 .545 .108 .128 .150 .170 .145 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline X weight: 7.87 grams typical. FIGURE 1. Case outlines - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 6 Case outline Y. Symbol A A1 A2 øb D E E1 e e1 L L1 L2 L3 L4 øP S1 Millimeters Min Max --6.48 0.76 1.27 3.30 3.81 0.71 0.81 20.57 21.08 17.27 17.78 8.51 9.02 2.54 TYP 9.91 10.41 4.70 5.46 13.34 13.84 2.74 3.25 --6.47 11.43 11.94 3.81 4.31 3.68 REF Inches Min Max --.255 .030 .050 .130 .150 .028 .032 .810 .830 .680 .700 .335 .355 .100 TYP .390 .410 .095 .115 .525 .545 .108 .128 --.255 .450 .470 .150 .170 .145 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline Y weight: 7.87 grams typical. FIGURE 1. Case outlines - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 7 Case outline Z. Symbol A A1 A2 øb D E E1 e e1 L L1 L2 L3 øP S1 Millimeters Min Max --6.48 0.76 1.27 3.30 3.81 0.71 0.81 20.57 21.08 17.27 17.78 8.51 9.02 2.54 TYP 9.91 10.41 4.70 5.46 13.34 13.84 2.74 3.25 8.38 --3.81 4.31 3.68 REF Inches Min Max --.255 .030 .050 .130 .150 .028 .032 .810 .830 .680 .700 .335 .355 .100 TYP .390 .410 .185 .215 .525 .545 .108 .128 .330 --.150 .170 .145 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline Z weight: 7.87 grams typical. FIGURE 1. Case outlines - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 8 Device type 01 Case outlines X, Y, and Z Terminal number Terminal symbol 1 VIN 2 FEEDBACK 3 VOUT 4 SYNC 5 COMP Case GND FIGURE 2. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 9 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4, 5, 6, 7, 8A, 8B Group A test requirements 1, 2, 3, 4, 5, 6, 7, 8A, 8B Group C end-point electrical parameters 1, 2, 3, 4, 7 End-point electrical parameters for radiation hardness assurance (RHA) devices 1, 4, 7 * PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TC = +125°C minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 10 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TC = +125°C minimum. (3) Test duration: 1,000 hours minimum as specified in 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA). RHA qualification is required for those devices with the RHA designator as specified herein. See table IIIA and IIIB. Table IIIA. Radiation Hardness Assurance Methods Table. Worst Case Analysis Not Performed. RHA Method Employed Testing at rated total dose of 100 krads(Si) Element Level Hybrid Device Level 1.5X 1/ 1.5X End point electrical tests after dose Includes Combines Combines total temperature temperature and dose and radiation effects displacement effects effects NA NA NA End-of-life Element Level Hybrid device level NA TA = +25ºC TA = +25ºC 1/ Elements tested only as part of the hybrid device, since there is only one microcircuit element in the device along with passive elements and diodes. See 4.3.5.1.2. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 11 Table IIIB. Hybrid level and element level test table. MS Kennedy SMD 596211232 Hybrid Level Testing Radiation Test Total Dose Low Dose High Dose ELDRS Displacement Rate Rate (HDR) Characterization Damage (DD) Tested (1X) Element Level Testing Bipolar Linear or Mixed Signal Neutron Tested (1.5X) 1X 1.5X (hybrid level (hybrid level test) 1/ test) 1/ Not Tested Not Tested Not Tested Not Tested 1/ Elements tested only as part of the hybrid device, since there is only one microcircuit element in the device along with passive elements and diodes. See 4.3.5.1.2. 4.3.5.1 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime -VQ) approved plan and with MIL-PRF-38534, Appendix G. a. The hybrid device manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test plans used to implement component lot qualification during procurement. Test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. b. The hybrid device manufacturer shall oversee component lot qualification, and monitor design changes for continued compliance to RHA requirements. 4.3.5.1.1 Hybrid level radiation qualification. 4.3.5.1.1.1 Qualification by similarity. This device has been identified as “similar” to SMD 5962-11234 for the purpose of performing representative testing. 4.3.5.1.1.2 Total ionizing dose irradiation testing. 4.3.5.1.1.2.1 High Dose Rate (HDR) testing: This device is characterized and tested initially, and after any design or process changes which may affect the RHA response of the device type. This device is tested at (HDR) in accordance with condition A of method 1019 of MIL-STD-883 to 150 krads(Si) using a sample size of 4 biased and 4 unbiased. 0.9900/90% statistics are applied to the device parameter degradations for HDR in Table I herein. 4.3.5.1.1.2.2 Low Dose Rate (LDR) testing. A representative device 5962-1123401 has been LDR tested to condition D of test method 1019 of MIL-STD-883 in a 16 pin flat pack (not the package in this SMD) to 50 krads(Si). Internal gas analysis shows that the package in this SMD has negligible hydrogen. A minimum of 8 of these devices or representative devices (4 bias and 4 unbiased) will be LDR tested after any design or process change that can affect RHA responses of this device. 0.9900/90% statistics are applied to the device parameter degradations for LDR in Table I herein, or in the SMD for the representative device. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 12 4.3.5.1.2 Element level radiation qualification. Element are tested at the hybrid level since this device contains only one microcircuit element along with passive elements and diodes. 4.3.5.2 Radiation lot acceptance. Each wafer lot of microcircuit elements shall be evaluated for acceptance in accordance with the approved plan and MIL-PRF-38534 and herein. 4.3.5.2.1 Total Ionizing Dose. Every wafer lot of the microcircuit elements will be RLAT (Radiation Lot Acceptance Testing) tested to 150 krads(Si) at hybrid level (in this device or a similar device) at HDR in accordance with condition A of method 1019 of MIL-STD-883. A minimum of 4 biased samples and 4 unbiased samples will be tested. 0.9900/90% statistics are applied to the device parameter degradations which are compared against Table I herein or in the SMD for the similar device for lot acceptance. 4.3.5.2.2 Technologies not being tested. Testing is not performed on diodes which the manufacturer considers to be radiation hard. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-11232 A REVISION LEVEL SHEET 13 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 14-03-26 Approved sources of supply for SMD 5962-11232 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/ Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962R1123201HXA 5962R1123201HXC 5962R1123201HYA 5962R1123201HYC 5962R1123201HZA 5962R1123201HZC 51651 51651 51651 51651 51651 51651 MSK 5048HRHS MSK 5048HRHS MSK 5048HRHGW MSK 5048HRHGW MSK 5048HRHD MSK 5048HRHD 5962R1123201KXA 5962R1123201KXC 5962R1123201KYA 5962R1123201KYC 5962R1123201KZA 5962R1123201KZC 51651 51651 51651 51651 51651 51651 MSK 5048KRHS MSK 5048KRHS MSK 5048KRHGW MSK 5048KRHGW MSK 5048KRHD MSK 5048KRHD 1/ 2/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its availability. Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 51651 Vendor name and address M. S. Kennedy Corporation 4707 Dey Road Liverpool, NY 13088 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.