INTERSIL HCTS245KTR

HCTS245T
Data Sheet
July 1999
Radiation Hardened Octal Bus
Transceiver, Three-State, Non-Inverting
Intersil’s Satellite Applications FlowTM (SAF) devices are fully
tested and guaranteed to 100kRAD total dose. These QML
Class T devices are processed to a standard flow intended
to meet the cost and shorter lead-time needs of large
volume satellite manufacturers, while maintaining a high
level of reliability.
The Intersil HCTS245T is a Radiation Hardened NonInverting Octal Bidirectional Bus Transceiver, Three-State,
intended for two-way asynchronous communication between
data busses. The HCTS245T allows data transmission from
the A bus to the B bus or from the B bus to the A bus. The
logic level at the direction input (DIR) determines the data
direction. The output enable input (OE) puts the I/O port in
the high-impedance state when high.
Specifications
Specifications for Rad Hard QML devices are controlled by
the Defense Supply Center in Columbus (DSCC). The SMD
numbers listed below must be used when ordering.
• QML Class T, Per MIL-PRF-38535
• Radiation Performance
- Gamma Dose (γ) 1 x 105 RAD(Si)
- Latch-Up Free Under Any Conditions
- SEP Effective LET No Upsets: >100 MEV-cm2/mg
- Single Event Upset (SEU) Immunity < 2 x 10-9
Errors/Bit-Day (Typ)
• 3 Micron Radiation Hardened CMOS SOS
• Fanout (Over Temperature Range)
- Bus Driver Outputs - 15 LSTTL Loads
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5mA at VOL, VOH
Pinouts
HCTS245DTR (SBDIP), CDIP2-T20
TOP VIEW
Intersil’s Quality Management Plan (QM Plan), listing all
Class T screening operations, is also available on our
website.
www.intersil.com/quality/manuals.asp
Ordering Information
PART
NUMBER
TEMP.
RANGE
(oC)
5962R9574501TRC
HCTS245DTR
-55 to 125
5962R9574501TXC
HCTS245KTR
-55 to 125
NOTE: Minimum order quantity for -T is 150 units through
distribution, or 450 units direct.
DIR
1
A0
2
19 OE
A1
3
18 B0
A2
4
17 B1
A3
5
16 B2
A4
6
15 B3
A5
7
14 B4
A6
8
13 B5
A7
9
12 B6
GND 10
11 B7
20 VCC
HCTS245KTR (FLATPACK), CDFP4-F20
TOP VIEW
DIR
1
20
VCC
A0
2
19
OE
A1
3
18
B0
A2
4
17
B1
A3
5
16
B2
A4
6
15
B3
A5
7
14
B4
A6
8
13
B5
A7
9
12
B6
10
11
B7
GND
1
4619.1
Features
Detailed Electrical Specifications for the HCTS245T are
contained in SMD 5962-95745. A “hot-link” is provided from
our website for downloading.
www.intersil.com/spacedefense/newsafclasst.asp
ORDERING
NUMBER
File Number
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
Satellite Applications Flow™ (SAF) is a trademark of Intersil Corporation.
HCTS245T
Functional Diagram
ONE OF 8 TRANSCEIVERS
P
A DATA
9
N
P
B DATA
(2, 3, 4, 5,
6, 7, 8)
N
11
(18, 17, 16, 15,
14, 13, 12)
TO OTHER
7 CIRCUITS
DIR
1
OUTPUT
ENABLE 19
TRUTH TABLE
CONTROL
INPUTS
OE
DIR
OPERATION
L
L
B Data to A Bus
L
H
A Data to B Bus
H
X
Isolation
H = High Voltage Level, L = Low Voltage Level,
X = Immaterial
To prevent excess currents in the High-Z (Isolation) modes, all I/O terminals
should be terminated with 10kΩ to 1MΩ resistors.
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HCTS245T
Die Characteristics
DIE DIMENSIONS:
PASSIVATION:
(3149µm x 2794µm x 533µm ±51µm)
Type: Silox (SiO2)
124 x 110 x 21mils ±2mil
Thickness: 13kÅ ±2.6kÅ
METALLIZATION:
WORST CASE CURRENT DENSITY:
< 2.0e5 A/cm2
Type: Al Si
Thickness: 11.0kÅ ±1kÅ
TRANSISTOR COUNT:
SUBSTRATE POTENTIAL:
274
Unbiased Silicon on Sapphire
PROCESS:
BACKSIDE FINISH:
CMOS SOS
Sapphire
Metallization Mask Layout
(19) OE
NC
NC
(20) VCC
(1) DIR
NC
NC
HCTS245T
A0 (2)
(18) B0
A1 (3)
(17) B1
A2 (4)
(16) B2
A3 (5)
(15) B3
B6 (12)
B7 (11)
(13) B5
GND (10)
A5 (7)
A7 (9)
(14) B4
A6 (8)
A4 (6)
NOTE: The die diagram is a generic plot from a similar HCS device. It is intended to indicate approximate die size and bond pad location. The mask
series for the HCTS245 is TA14417A.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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