REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to the PD, θJC, and θJA limits as specified under paragraph 1.3. - ro 08-01-29 R. HEBER B Make corrections to title block and figure 3. Make changes to paragraphs 1.2.2, 1.5, and A.1.2.2. Delete dose rate burnout, paragraph 4.4.4.2. - ro 10-12-14 C. SAFFLE C Add device type 02. Make changes to paragraphs 1.2.2, 1.5, 4.4.4.1, A.1.2.2, A.1.2.4, Table I, figure 1, and figure 4. Add paragraph A.1.5. - ro 12-01-31 C. SAFFLE REV SHEET REV C C C C C C C C C SHEET 15 16 17 18 19 20 21 22 23 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.landandmaritime.dla.mil CHECKED BY RAJESH PITHADIA APPROVED BY THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A ROBERT M. HEBER DRAWING APPROVAL DATE 07-12-18 REVISION LEVEL C MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 5962-07215 1 OF 23 5962-E536-11 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 F Federal stock class designator \ RHA designator (see 1.2.1) 07215 01 V X C Device type (see 1.2.2) Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) / \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 ISL7119RH 02 ISL7119EH Circuit function Radiation hardened, dielectrically isolated (DI), BiCMOS dual, high speed, voltage comparator Radiation hardened dielectrically isolated (DI), BiCMOS dual, high speed, voltage comparator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter X Descriptive designator CDFP3-F10 Terminals 10 Package style Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 2 1.3 Absolute maximum ratings. 1/ Total supply voltage ................................................................................................... Output to negative supply voltage ............................................................................. Ground to negative supply voltage ............................................................................ Ground to positive supply voltage .............................................................................. Differential input voltage ............................................................................................ Input voltage .............................................................................................................. Output short circuit duration ...................................................................................... Maximum storage temperature range ........................................................................ Maximum power dissipation (PD) for case outline X: 36 V 36 V 25 V 18 V ±5 V ±15 V 2/ 10 seconds 3/ -65°C to 150°C TA = +25°C .............................................................................................................. 0.338 W TA = +125°C ............................................................................................................ 0.1 W Lead temperature (soldering, 10 seconds) ................................................................ +265°C maximum Junction temperature (TJ) .......................................................................................... +175°C maximum Thermal resistance, junction-to-case (θJC): Case outline X ........................................................................................................... 60°C/W Thermal resistance, junction-to-ambient (θJA): Case outline X ........................................................................................................... 165°C/W 4/ 1.4 Recommended operating conditions. Single supply voltage ................................................................................................. 5 V Dual supply voltage ................................................................................................... ±15 V Ambient operating temperature range (TA) ............................................................... -55°C to +125°C 1.5 Radiation features. Maximum total dose available (dose rate = 50 – 300 rad(Si)/s): Device type 01 ........................................................................................................... 300 krad(Si) 5/ Device type 02 ........................................................................................................... 300 krad (Si) 6/ Maximum total dose available (dose rate ≤ 0.01 rad(Si)/s): Device type 02 .......................................................................................................... 50 krad(Si) 6/ Single event latch up (SEL) ........................................................................................... No latch up 7/ ______ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ For supply voltages less than ±15 V, the absolute maximum input voltage is equal to the supply voltage. 3/ Short circuit from the output to +VS can cause excessive heating and eventual destruction. 4/ 5/ 6/ 7/ θJA is measured with the component mounted on an evaluation printed circuit (PC) board in free air. Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. The radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum total dose of 300 krad(Si) . The device type 02 radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A to a maximum total dose of 300 krad(Si), and condition D to a maximum total dose of 50 krad(Si). Devices use dielectrically isolated (DI) technology and latch up is physically not possible. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 3 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.1.1 Microcircuit die. For the requirements of microcircuit die, see appendix A to this document. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.2.4 Timing diagrams. The timing diagrams shall be as specified on figure 3. 3.2.5 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 4 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 74 (see MIL-PRF-38535, appendix A). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 5 TABLE I. Electrical performance characteristics. Test Conditions 1/ -55°C ≤ TA ≤ +125°C GND = 0 V Symbol Group A subgroups Device type unless otherwise specified Input offset voltage VIO +VS = 5 V, -VS = 0 V, RL = 1.4 kΩ pullup to 5 V M,D,P,L,R,F +VS = 5 V, -VS = 0 V, VCM = 3 V, RS ≤ 5 kΩ, RL = 1.4 kΩ pullup to 5 V M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VCM = 12 V, RS ≤ 5 kΩ, RL = 1.4 kΩ pullup to 5 V M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VCM = -12 V, RS ≤ 5 kΩ, RL = 1.4 kΩ pullup to 5 V M,D,P,L,R,F Saturation voltage VSAT +VS = 3.5 V, -VS = -1 V, Max -4 4 2,3 -8 8 1 -8 8 1 -4 4 2,3 -8 8 1 -8 8 1 -4 4 2,3 -8 8 1 -8 8 1 -4 4 2,3 -8 8 1 -8 8 1 VIN ≤ -8 mV, ISINK ≤ 3.2 mA M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VIN ≤ -8 mV, ISINK ≤ 25 mA M,D,P,L,R,F Unit Min 1 VCM = 1 V, RS ≤ 5 kΩ, Limits 01, 02 01, 02 mV 0.55 2,3 0.65 1 0.65 1 1.5 2.3 1.8 1 1.8 V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 6 TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ -55°C ≤ TA ≤ +125°C GND = 0 V Symbol Group A subgroups Device type unless otherwise specified Common mode rejection ratio CMRR Min +VS = 15 V, -VS = -15 V, 1 M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VCM = -12 V, RL = 1.4 kΩ pullup to 5 V M,D,P,L,R,F IIO Max 80 M,D,P,L,R,F +VS = 5 V, -VS = 0 V, VCM = 3 V M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VCM = 12 V M,D,P,L,R,F +VS = 15 V, -VS = -15 V, VCM = -12 V M,D,P,L,R,F IBIAS 2,3 74 1 74 1 80 2,3 74 1 74 1 +VS = 5 V, -VS = 0 V, VCM = 1 V Input bias current 01, 02 Unit dB VCM = +12 V, RL = 1.4 kΩ pullup to 5 V Input offset current Limits RL = 1.4 kΩ M,D,P,L,R,F +VS = 15 V, -VS = -15 V, RL = 1.4 kΩ M,D,P,L,R,F 75 2,3 150 1 150 1 75 2,3 150 1 150 1 75 2,3 150 1 150 1 75 2,3 150 1 150 1 +VS = 5 V, -VS = 0 V, 01, 02 01, 02 500 2,3 1000 1 1000 1 500 2,3 1000 1 1000 nA nA See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 7 TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ -55°C ≤ TA ≤ +125°C GND = 0 V Symbol Group A subgroups Device type unless otherwise specified Positive supply current ICC Min 1 +VS = 15 V, -VS = -15 V, ISINK ≤ 25 mA M,D,P,L,R,F Negative supply current IEE M,D,P,L,R,F AVOL +VS = 5 V, -VS = 0 V, 01, 02 Unit Max 10 2,3 12 1 12 1 +VS = 15 V, -VS = -15 V, ISINK ≤ 25 mA Voltage gain Limits 01, 02 -4.0 2,3 -5.0 1 -5.0 1 01, 02 mA mA 78 dB RL = 10 kΩ pullup to 15 V, ∆VOUT = 10 V M,D,P,L,R,F +VS = 15 V, -VS = -15 V, RL = 10 kΩ pullup to 15 V, ∆VOUT = 10 V M,D,P,L,R,F Output leakage current ICEX +VS = 15 V, -VS = -1 V, M,D,P,L,R,F VIN 72 1 72 1 80 2,3 74 1 74 1 VIN < VIO(min), VOUT = 35 V Input voltage range 2,3 20 1 20 M,D,P,L,R,F +VS = 15 V, -VS = -15 V M,D,P,L,R,F 01, 02 µA 10 2,3 1 +VS = 5 V, -VS = 0 V 01, 02 1 3 V 2,3 1 3 1 1 3 1 -12 12 2,3 -12 12 1 -12 12 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 8 TABLE I. Electrical performance characteristics – Continued. Test Conditions 1/ -55°C ≤ TA ≤ +125°C GND = 0 V Symbol Group A subgroups Device type unless otherwise specified Limits Min Unit Max +VS = 15 V, -VS = -15 V, Response time tPD RL = 500 Ω pullup to 5 V, 9 01, 02 125 ns CL = 50 pF to ground, VIN = VIO + 5 mV, ∆VIN = 100 mV M,D,P,L,R,F 10,11 160 9 160 9 150 10,11 185 9 185 +VS = 5 V, -VS = 0 V, RL = 500 Ω pullup to 5 V, CL = 50 pF to ground, VIN = VIO + 5 mV, ∆VIN = 100 mV M,D,P,L,R,F 1/ Device types 01 and 02 supplied to this drawing meet all levels M, D, P, L, R, and F of irradiation. However, these devices are only tested at the “F” level in accordance with MIL-STD-883 method 1019 condition A. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA = +25°C (see 1.5 herein). Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. In addition, device 02 is production lot acceptance tested on a wafer by wafer basis to 300 krad(Si) in accordance with MIL-STD-883 method 1019 condition A, and 50 krad(Si) in accordance with MIL-STD-883 method 1019 condition D. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 9 Device types 01 and 02 Case outline X Terminal number Terminal symbol 1 OUT 1 2 GND 1 3 +IN 1 4 -IN 1 5 -VS 6 OUT 2 7 GND 2 8 +IN 2 9 -IN 2 10 +VS FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 10 FIGURE 2. Block diagram. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 11 FIGURE 3. Timing waveforms. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 12 FIGURE 4. Radiation exposure circuit. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 13 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125°C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 14 TABLE IIA. Electrical test requirements. Test requirements Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) Subgroups (in accordance with MIL-STD-883, method 5005, table I) Device class M 1, 9 Subgroups (in accordance with MIL-PRF-38535, table III) Device class Q 1, 9 Device class V 1, 9 1, 9 1, 2, 3, 1/ 9, 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 1, 9 1, 2, 3, 1/ 2/ 9, 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3, 2/ 9, 10, 11 1, 9 1, 9 1, 9 1, 9 1, 2, 3, 9, 10, 11 1/ 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 1/ PDA applies to Subgroup 1 for class M and Q. For class V, PDA applies to subgroup 1 and deltas. 2/ Delta limits as specified in table IIB shall be required and the delta values shall be computed with reference to the zero hour electrical parameters (see table I). TABLE IIB. Burn-in and life test delta parameters. (TA = +25°C). Parameters Symbol Min Max Units Input offset voltage VIO -1 +1 mV Positive supply current ICC -1 +1 mA Negative supply current IEE -500 +500 µA 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 15 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein. 4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A, and as specified herein for device types 01 and 02. In addition for device type 02 low dose rate test shall be performed in accordance with MIL-STD-883 method 1019, condition D and as specified herein. 4.4.4.1.1 Accelerated annealing test. Accelerated annealing testing shall be performed on all devices requiring a RHA level greater than 5 krad(Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and shall be the pre-irradiation end-point electrical parameter limits at 25°C ±5°C. Testing shall be performed at initial qualification and after any design or process changes which may affect the RHA response of the device. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. 6.1.2 Substitutability. Device class Q devices will replace device class M devices. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0544. 6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0540. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 16 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime -VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DLA Land and Maritime -VA. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 17 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 A.1 SCOPE A.1.1 Scope. This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multi-chip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device class V) are reflected in the Part or Identification Number (PIN). When available, a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN. A.1.2 PIN. The PIN is as shown in the following example: 5962 F Federal stock class designator \ RHA designator (see A.1.2.1) 07215 01 V 9 A Device type (see A.1.2.2) Device class designator (see A.1.2.3) Die code Die details (see A.1.2.4) / \/ Drawing number A.1.2.1 RHA designator. Device classes Q and V RHA identified die meet the MIL-PRF-38535 specified RHA levels. A dash (-) indicates a non-RHA die. A.1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ISL7119RH Radiation hardened , dielectrically isolated (DI), BiCMOS, dual, high speed, voltage comparator 02 ISL7119EH Radiation hardened, dielectrically isolated (DI), BiCMOS dual, high speed, voltage comparator A.1.2.3 Device class designator. Device class Q or V STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device requirements documentation Certification and qualification to the die requirements of MIL-PRF-38535 SIZE 5962-07215 A REVISION LEVEL C SHEET 18 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 A.1.2.4 Die details. The die details designation is a unique letter which designates the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product and variant supplied to this appendix. A.1.2.4.1 Die physical dimensions. Die type Figure number 01, 02 A-1 A.1.2.4.2 Die bonding pad locations and electrical functions. Die type Figure number 01, 02 A-1 A.1.2.4.3 Interface materials. Die type Figure number 01, 02 A-1 A.1.2.4.4 Assembly related information. Die type Figure number 01, 02 A-1 A.1.3 Absolute maximum ratings. See paragraph 1.3 herein for details. A.1.4 Recommended operating conditions. See paragraph 1.4 herein for details. A.1.5 Radiation features. See paragraph 1.5 herein for details. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 19 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 A.2 APPLICABLE DOCUMENTS. A.2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARD MIL-STD-883 - Test Method Standard Microcircuits. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) A.2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. A.3 REQUIREMENTS A.3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. A.3.2 Design, construction and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein and the manufacturer’s QM plan for device classes Q and V. A.3.2.1 Die physical dimensions. The die physical dimensions shall be as specified in A.1.2.4.1 and on figure A-1. A.3.2.2 Die bonding pad locations and electrical functions. The die bonding pad locations and electrical functions shall be as specified in A.1.2.4.2 and on figure A-1. A.3.2.3 Interface materials. The interface materials for the die shall be as specified in A.1.2.4.3 and on figure A-1. A.3.2.4 Assembly related information. The assembly related information shall be as specified in A.1.2.4.4 and on figure A-1. A.3.2.5 Radiation exposure circuit. The radiation exposure circuit shall be as defined in paragraph 3.2.5 herein. A.3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I of the body of this document. A.3.4 Electrical test requirements. The wafer probe test requirements shall include functional and parametric testing sufficient to make the packaged die capable of meeting the electrical performance requirements in table I. A.3.5 Marking. As a minimum, each unique lot of die, loaded in single or multiple stack of carriers, for shipment to a customer, shall be identified with the wafer lot number, the certification mark, the manufacturer’s identification and the PIN listed in A.1.2 herein. The certification mark shall be a “QML” or “Q” as required by MIL-PRF-38535. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 20 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 A.3.6 Certification of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see A.6.4 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this appendix shall affirm that the manufacturer’s product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and the requirements herein. A.3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuit die delivered to this drawing. A.4 VERIFICATION A.4.1 Sampling and inspection. For device classes Q and V, die sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer’s Quality Management (QM) plan. The modifications in the QM plan shall not affect the form, fit, or function as described herein. A.4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and as defined in the manufacturer’s QM plan. As a minimum, it shall consist of: a. Wafer lot acceptance for class V product using the criteria defined in MIL-STD-883, method 5007. b. 100% wafer probe (see paragraph A.3.4 herein). c. 100% internal visual inspection to the applicable class Q or V criteria defined in MIL-STD-883, method 2010 or the alternate procedures allowed in MIL-STD-883, method 5004. A.4.3 Conformance inspection. A.4.3.1 Group E inspection. Group E inspection is required only for parts intended to be identified as radiation assured (see A.3.5 herein). RHA levels for device classes Q and V shall be as specified in MIL-PRF-38535. End point electrical testing of packaged die shall be as specified in table IIA herein. Group E tests and conditions are as specified in paragraphs 4.4.4, 4.4.4.1, and 4.4.4.1.1 herein. A.5 DIE CARRIER A.5.1 Die carrier requirements. The requirements for the die carrier shall be accordance with the manufacturer’s QM plan or as specified in the purchase order by the acquiring activity. The die carrier shall provide adequate physical, mechanical and electrostatic protection. A.6 NOTES A.6.1 Intended use. Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original equipment), design applications, and logistics purposes. A.6.2 Comments. Comments on this appendix should be directed to DLA Land and Maritime -VA, Columbus, Ohio, 43218-3990 or telephone (614)-692-0540. A.6.3 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. A.6.4 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed within QML-38535 have submitted a certificate of compliance (see A.3.6 herein) to DLA Land and Maritime -VA and have agreed to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 21 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 NOTE: Pad numbers reflect terminal numbers when placed in case outline X (see figure 1). FIGURE A-1. Die bonding pad locations and electrical functions. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 22 APPENDIX A APPENDIX A FORMS A PART OF SMD 5962-07215 Die bonding pad locations and electrical functions Die physical dimensions. Die size: 2032 µm x 2030 µm Die thickness: 483 µm ±25.4 µm Interface materials. Top metallization: Al Si Cu 16.0 kÅ ±2 kÅ Backside metallization: None Glassivation. Type: PSG Thickness: 8.0 kÅ ±1.0 kÅ Substrate: Dielectrically isolated (D.I.) Assembly related information. Substrate potential: Unbiased Special assembly instructions: None FIGURE A-1. Die bonding pad locations and electrical functions - continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-07215 A REVISION LEVEL C SHEET 23 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 12-01-31 Approved sources of supply for SMD 5962-07215 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962F0721501QXC 34371 ISL7119RHQF 5962F0721501VXC 34371 ISL7119RHVF 5962F0721501V9A 34371 ISL7119RHVX 5962F0721502VXC 34371 ISL7119EHVF 5962F0721502V9A 34371 ISL7119EHVX 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 34371 Vendor name and address Intersil Corporation 1001 Murphy Ranch Road Milpitas, CA 95035-6803 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.