Process Change Notice #1001251 ____________________________________________________________________________________________________ User Registration Register today to create your account on Silabs.com. Your personalized profile allows you to receive technical document updates, new product announcements, “how-to” and design documents, product change notices (PCN) and other valuable content available only to registered users. http://www.silabs.com/profile PCN Date: 25Jan10 Effective Date: 22Feb10 Title: Si471x and Si472x Transition from rev A to rev B Originator: Wade Gillham Phone: 512-532-5248 Dept: Broadcast Customer Contact: Kathy Haggar Phone: 512-532-5261 Dept: Sales/ Customer Service PCN Type: Assembly Discontinuance Package Datasheet Fabrication Product Revision Packing Labeling Location Test Other Last Order Date: 22Feb10 PCN Details Description of Change: The Revision A variants of the Silicon Labs FM Transmitters and FM Transceivers will be discontinued and replaced with the Revision B variants. Discontinued Revision A part numbers and their corresponding Revision B replacement part numbers are shown in the Product Identification section. Revision B variants of these products are in Mass Production as of March, 2009. Reason for Change: New revision silicon. A detailed list of changes from revision A to revision B is available in the associated PCNs for the Si471x-B30 (0903091-SI471x-B30_Announcement) and Si472x-B20 (0903092-SI472x-B20_Announcement). Each is available from Silicon Laboratories sales representatives. Impact on Form, Fit, Function, Quality, Reliability: The revision B replacement parts are pin compatible, drop-in replacements for the Si471x-Axx and Si472x-Axx devices. The revision B devices are designed to support higher FM transmit output power for small form factor antennas; however, the output power is identical at the same programmed levels between revision A and revision B. A revision B part dropped into a revision A socket will output identical FM transmit power to the revision A part unless the client software is changed by the customer to program a higher output power. End-user devices that have been certified under FCC or ETSI regulations with a revision A part should have identical performance using a revision B part with the same programmed output power. Further details are provided in the associated revision B PCNs. W7206F1 Process Change Notice Form rev V The information contained in this document is PROPRIETARY to Silicon Laboratories, Inc. and shall not be reproduced or used in part or whole without Silicon Laboratories’ written consent. The document is uncontrolled if printed or electronically saved. Pg 1 Process Change Notice #1001251 ____________________________________________________________________________________________________ Product Identification: Silicon Labs will be discontinuing the following ordering part numbers: Discontinued Part Si4710-A01-GM(R) Si4710-A01-ZM(R) Si4710-A01-ZM1(R) Si4712-A01-GM(R) Si4710-A20-GM(R) Si4711-A20-GM(R) Si4712-A20-GM(R) Si4713-A20-GM(R) Si4720-A10-GM(R) Function FM Transmitter FM Transmitter FM Transmitter FM Transmitter FM Transmitter FM Transmitter w/ RDS FM Transmitter w/ RPS FM Transmitter w/ RDS and RPS FM Transceiver Replacement Part Si4710-B30-GM(R) Si4710-B30-GM(R) Si4710-B30-GM(R) Si4712-B30-GM(R) Si4710-B30-GM(R) Si4711-B30-GM(R) Si4712-B30-GM(R) Si4713-B30-GM(R) Si4720-B20-GM(R) Last Date of Unchanged Product: 22Feb10 Subsequent to the Effective Date of this PCN, Silicon Labs will supply the new revision B parts for all Si471x & Si472x orders. Customers currently using revision A should work with their local sales representative to create a transition plan prior to the Effective Date. Qualification Samples: Revision B samples are available now. Please contact your local Silicon Laboratories sales representative to request samples. A list of Silicon Laboratories sales representatives is available at www.silabs.com. Customer Early Acceptance Sign Off: Customers may approve early PCN acceptance by completing the information below: Early Acceptance Date: Name: Company: Email your Early Acceptance approval to: [email protected] Qualification Data: See Appendix A for Qualification Reports. The Si471x-B30 and Si472x-B20 Datasheets are available upon request. Please contact your local Silicon Laboratories sales representative to request the Datasheets. A list of Silicon Laboratories sales representatives is available at www.silabs.com. W7206F1 Process Change Notice Form rev V The information contained in this document is PROPRIETARY to Silicon Laboratories, Inc. and shall not be reproduced or used in part or whole without Silicon Laboratories’ written consent. The document is uncontrolled if printed or electronically saved. Pg 2 Process Change Notice #1001251 ____________________________________________________________________________________________________ Appendix A – Qualification Reports Si471x-B30-GM Qualification Report Test Name Die Qualification Tests High Temp Operating Life Test Condition(1) JA108, 125C, 1000hr Qualification 3 lots, N=>77 Lot ID (2) Q24153 0/80 0/79(8) 0/80 5 lots 0/80 0/398 Q24016(2) 0/515 3 lots, N>=500 Q24134(2) 0/520 2 lots, rev B die Q24793(2) 0/504 Q25030(2) 0/252 Q25032(2) 0/252 (3) Q25158 0/251 7 lots Q25196(3) 0/502 0/2796 Q22643(2) 0/80 1 lot JA108, -10C, 1000hr 1 lot, N=>77 ESD: Human Body Model JA114 1 lot, N=>3 JA115 ESD: Charged Device Model JC101 Latch-up JESD78, ±200mA 1 lot, N=>3 1 lot, N=>3 Status(1) 0/79 Q24739(2) Q25223(3) JA108, 125C, 48hr Low Temp Operating Life ESD: Machine Model Summary (6) Q24531(2) Q25222(3) Early Life Failure Rate Fail/Pass Complete Complete 0/3 0/80 ±1000V Complete Q25256(3) Q25257(3,5) 0/3 ±1500V Complete Q25227(3) 0/3 ±50V Q25228(3,5) 0/3 ±100V Q25253(3) 0/3 ±750V Q25151(3,5) 0/6 85C Q25152(3,5) 0/6 0/6 25C 85C 0/6 25C Complete Complete 1 lot, N=>6 Q25229(3) Q25230(3) Complete Package Qualification Tests - ASEKR Temperature Cycling (4) JA104, -65C to +150C 500 cycles HAST (4) 3 lots, N=>77 JA110, 130C, Vcc=3.6V 85%RH, 96hr Unbiased HAST (4) 3 lots, N=>77 JA110, 130°C 85%RH, 96 hours High Temp Storage Life 3 lots, N=>77 JA103, 150C, 1000hr 3 lots, N=>77 Q25083 0/80 Q23546 0/78 Q23549 0/78 Q25083 0/80 Q25109 0/79 6 lots Q25115 0/76 0/471 Q23521 0/78 Q23544 0/78 3 lots Q23548 0/78 0/234 Q23522 0/78 Q23545 0/78 3 lots Q23547 0/78 0/234 Complete Q23616 0/78 Q23617 Q23618 0/78 0/78 3 lots 0/234 Complete Q24260 0/80 Q24263 0/80 Q24269 0/80 Q24335 0/80 Q24402 0/80 Q24405 0/80 Q24470 0/80 Q24689 0/80 9 lots Q24772 Q24258 Q24262 Q24270 0/80 0/80 0/80 0/80 0/720 Q24333 0/80 Q24400 0/80 Q24403 0/80 Q24469 0/80 Q24692 0/80 9 lots Q24774 Q24259 Q24261 Q24271 0/80 0/80 0/80 0/80 0/720 Q24334 0/80 Q24401 0/80 Q24404 0/80 Q24468 0/80 Q24690 0/80 9 lots Q24773 Q24171 Q24187 Q24192 0/80 0/80 0/80 0/80 0/720 Complete Q24203 0/80 Q24275 0/80 Q24307 0/80 Q24554 0/80 Q24714 Q24788 0/80 0/80 9 lots 0/720 Complete Complete Complete Package Qualification Tests - Unisem Temperature Cycling (4) JA104, -65C to +150C 500 cycles HAST (4) Unbiased HAST JA110, 130C, Vcc=3.6V 85%RH, 96hr (4) High Temp Storage Life JA110, 130°C 85%RH, 96 hours 3 lots, N=>77 3 lots, N=>77 3 lots, N=>77 JA103, 150C, 1000hr 3 lots, N=>77 (1) (2) (3) (4) (5) (6) (7) (8) Complete Complete All qualifications tested using Production Test Program; full functionality verified Qual performed with Rev A die Qual performed with Rev B die Preceded by MSL2@260C Preconditioning No-connect pins 1 and 20 excluded One (1) device removed from qualification for non-chargeable EOS damage Two (2) devices removed from qualification after damage in ATE handler One (1) device lost during retest W7206F1 Process Change Notice Form rev V The information contained in this document is PROPRIETARY to Silicon Laboratories, Inc. and shall not be reproduced or used in part or whole without Silicon Laboratories’ written consent. The document is uncontrolled if printed or electronically saved. Pg 3 Process Change Notice #1001251 ____________________________________________________________________________________________________ Appendix A – Qualification Reports (cont) Si472x-B20-GM QUALIFICATION REPORT TEST NAME Die Qualification Tests TEST CONDITION(1) QUALIFICATION High Temp Operating Life JA108, 125C, 1000hr 3 lots, N=>77 Lot ID Fail/Pass Q24153(2) 0/79(6) Q24531(2) 0/80 Q24739(2) 0/79(8) Q25222(3) Early Life Failure Rate Summary 0/80 5 lots Q25223(3) 0/80 0/398 Q24016(2) 0/515 3 lots, N>=500 (2) Q24134 0/520 2 lots, rev B die Q24793(2) 0/504 Q25030(2) 0/252 Q25032(2) 0/252 (3) 0/251 7 lots (3) Q25196 JA108, 125C, 48hr Q25158 Status(1) Complete 0/502 0/2796 Low Temp Operating Life JA108, -10C, 1000hr 1 lot, N=>77 Q22643(2) 0/80 1 lot Low Temp Storage Life JA119, -55C, 1000hr 1 lot, N=>77 Q24836(2) 0/79(9) 1 lot Complete Complete 0/80 ESD: Human Body Model JA114 1 lot, N=>3 ESD: Machine Model JA115 1 lot, N=>3 ESD: Charged Device Model JC101 Latch-up JESD78, ±200mA 1 lot, N=>3 0/3 0/79 ±1000V Q25257(3,5) 0/3 ±1500V Q25227(3) 0/3 ±50V Q25228(3,5) 0/3 ±100V (3) Q25256 (3) 0/3 ±750V Q25151(3,5) 0/6 85C Q25152(3,5) 0/6 0/6 25C 85C 0/6 25C Q25253 Complete Complete Complete Complete 1 lot, N=>6 (3) Q25229 Q25230(3) Complete Package Qualification Tests - ASEKR Temperature Cycling (4) JA104, -65C to +150C 500 cycles HAST (4) 3 lots, N=>77 JA110, 130C, Vcc=3.6V 85%RH, 96hr Unbiased HAST (4) 3 lots, N=>77 JA110, 130°C 85%RH, 96 hours High Temp Storage Life 3 lots, N=>77 JA103, 150C, 1000hr Q25083 0/80 Q23546 0/78 Q23549 0/78 Q25083 0/80 Q25109 0/79 6 lots Q25115 0/76 0/471 Q23521 0/78 Q23544 0/78 3 lots Q23548 0/78 0/234 Q23522 0/78 Q23545 0/78 3 lots Q23547 0/78 0/234 Complete 3 lots 0/234 Complete Complete Complete Q23616 0/78 3 lots, N=>77 Q23617 Q23618 0/78 0/78 JA113, 85C, 60%RH, 168hr HAST, UHAST Q24340 0/240 Reflow 3x @260C, 22pc CSAM TC devices Q24609 0/240 3 lots Q24712 0/240 0/720 Q24260 0/80 Q24263 0/80 Q24269 0/80 Q24335 0/80 Q24402 0/80 Q24405 0/80 Q24470 0/80 Q24689 0/80 9 lots Q24772 Q24258 Q24262 Q24270 0/80 0/80 0/80 0/80 0/720 Q24333 0/80 Q24400 0/80 Q24403 0/80 Q24469 0/80 Q24692 0/80 9 lots Q24774 Q24259 Q24261 Q24271 0/80 0/80 0/80 0/80 0/720 Q24334 0/80 Q24401 0/80 Q24404 0/80 Q24468 0/80 Q24690 0/80 9 lots Q24773 Q24171 Q24187 Q24192 0/80 0/80 0/80 0/80 0/720 Q24203 0/80 Q24275 0/80 Q24307 0/80 Q24554 0/80 Q24714 0/80 9 lots Q24788 316808.1 0/80 0/5 0/720 Complete 316814.1 316816.1 0/5 0/5 3 lots 0/15 Complete Oki Eng 0/5 Oki Eng 0/5 Package Qualification Tests - Unisem Preconditioning (MSL 2@260C) Temperature Cycling (4) JA104, -65C to +150C 500 cycles HAST (4) Unbiased HAST (4) High Temp Storage Life JA110, 130C, Vcc=3.6V 85%RH, 96hr JA110, 130°C 85%RH, 96 hours 3 lots, N=>77 3 lots, N=>77 3 lots, N=>77 JA103, 150C, 1000hr 3 lots, N=>77 Solderability JB102, Peak 230C 1 lot, N>=5 Complete Complete Complete Complete Additional Qualifications Vibration Freq: 10 to 2000 Hz (two ways) Amp (peak to peak): 1.52 mm 1 lot, N>=5 1 lot Acceleration: 20 G Drop Test Drop from 1.5m (6x) 0/5 1 lot, N>=5 0/5 Dew Condensation Test Oki Eng Ramp +/-20C (1hr), Store -20C (2hr), 1 lot 0/5 Cycle 5x Ta = -55C to +125C, 5 min each 1 lot, N>=5 Oki Eng 0/5 Ta = -40C to +85C, 1000 cycles Bend test, 100,000 cycles Oki Eng 1 lot 0/5 T = 25C, RH = 95% 168hr Oki Eng Physical Inspection Within 80mm @ 25C, 50mm @ 220C 3 lots, N>=5 Varied, See separate report 1 lot, N>=6 Complete 0/5 1 lot 1 lot, N>=5 0/5 Coplanarity Complete 0/5 1 lot, N>=5 Drop from 1.5m (100 cycles) Std. Temp, High Humidity Bias Complete 1 lot 0/5 PCB Thermal Shock Complete 0/5 Ramp +/-20C (0.5hr), Store 20C (0.5hr) 1 lot, N>=5 IC Thermal Shock Complete 1 lot Fuji Print 25C 0/5 Fuji Print 25C 0/5 Complete Fuji Print 25C 0/5 Fuji Print 220C 0/5 Fuji Print 220C 0/5 Fuji Print 220C 0/5 0/30 Complete AR-07-0159 0/6 1 lot 0/6 Complete 6 lots (1) All qualifications tested using Production Test Program; full functionality verified Qual performed with Rev A die (3) Qual performed with Rev B die (4) Preceded by MSL2@260C Preconditioning (5) No-connect pins 1 and 20 excluded (6) One (1) device removed from qualification for non-chargeable EOS damage (7) Two (2) devices removed from qualification after damage in ATE handler (8) One (1) device lost during retest (9) One (1) device removed from qualification after damage loading into oven (2) W7206F1 Process Change Notice Form rev V The information contained in this document is PROPRIETARY to Silicon Laboratories, Inc. and shall not be reproduced or used in part or whole without Silicon Laboratories’ written consent. 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