Quality & Reliability Quarterly Report Q1, 2016 Macronix Confidential The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 1 of 7 1. Quality/Reliability monitoring test items and condition--------------------------------------------------------------------------- 3 2. Flash Quarterly reliability monitor results ---------------------------------------------------------------------------------------- 4 2-1. Quality Validation & Early Life Failure Rate ------------------------------------------------------------------------------------ 4 2-2. Non-Volatile Memory Cycling Endurance Test---------------------------------------------------------------------------------- 4 2-3 Data Retention test-------------------------------------------------------------------------------------------------------------------- 4 2-4. Non-Volatile Memory Program/ Erase Endurance, Data Retention and Operation Life Test (For Automotive Product) ------------------------------------------------------------------------------------------------------------------------------- 5 2-5. High Temperature Operating Life and High Temperature Storage Life Test------------------------------------------------ 5 2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test ---------------------------------------------------------------------------------------------------------------- 6 3. XtraRom Quarterly reliability monitor results-------------------------------------------------------------------------------------- 6 3-1. Quality Validation & Early Life Failure Rate ----------------------------------------------------------------------------------- 6 3-2. High Temperature Operating Life and High Temperature Storage Life Test ----------------------------------------------- 6 3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test ---------------------------------------------------------------------------------------------------------------- 6 3-4. Electrostatic Discharge Sensitivity Test------------------------------------------------------------------------------------------- 7 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 2 of 7 1. Quality/Reliability monitoring test items and conditions: Test Item Test Method Test Conditions Typical Sample Size (units) QV (Quality Validation) JESD86 Per datasheet, at high/room/cold temperatures All samples ELFR (Early Life Failure Rate) JESD22-A108 and JESD74 125 oC, Vcc(max), 48 hrs 2000 NVCE (Non-Volatile Memory Cycling Endurance) LTDR (NVM Low Temperature Retention and Read Disturb) HTDR (High Temperature Data Retention) HTOL (High Temperature Operating Life) HTSL (High Temperature Storage Life) JESD47 JESD22-A117 AEC-Q100-005D (For Automotive Product) JESD47 JESD22-A117 AEC-Q100-005D (For Automotive Product) JESD47 JESD22-A117 AEC-Q100-005D (For Automotive Product) JESD22-A108 JESD85 AEC-Q100-005D (For Automotive Product) JESD22-A103 Half samples at 25 oC, half samples at max 77 operating Temperature, 1K/10K/100K Automotive Product: Sum Program/Erase cycles. For flash products of sample size for HTDR, only. LTDR, and HTOL 38 25 oC, Vcc(max), 168hrs/500hrs. For flash products only. Automotive Product:154 125 oC, 10hrs/100hrs or equivalent stress time per lifetime model. For flash products 39 only. Automotive Product:154 (10 hrs for 100K-cyc, 100 hrs for 1K/10K-cyc) 125 oC, Vcc(max), 168hrs/500hrs/1000hrs (For Automotive Product with P/E cycle pre-conditioning) 77 Automotive Product:77 150 oC, 168hrs/500hrs/1000hrs 77 TCT(-65 oC to 150 oC) 10 cycles, All SMD samples before IR reflow 3 cycles, HTSL 125 oC 24hrs, 30 TCT, PCT, HAST o C/60%RH 192hrs (MSL 3) PC (Pre-conditioning) JESD22-A113 TCT (Temperature Cycle Test) JESD22-A104 -65oC←→150oC (condition C), 200/500 cycles 77 JESD22-A102 121 oC, 100%RH, 2 atm, 96hrs 77 JESD22-A110 130oC, 85% RH, 33.3 psia, Vcc(max), 96hrs 77 JS-001-2012(HBM) JESD22-A115 (MM) JESD22-C101(CDM) NTD: 1000V or till failure HBM: 500~2000V or till failure MM: 50~200V or till failure CDM:750V or till failure Optional test in response to specific customer 3 PCT (Pressure Cooker Test) HAST (Highly Accelerated Temperature and Humidity Stress Test) ESD (Electro-Static Discharge) The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 3 of 7 2. Flash Quarterly reliability monitor results: 2-1. Quality Validation & Early Life Failure Rate: Tech. 0.15 µm 0.13 µm 0.11 µm 75 nm 55 nm 36 nm EPN Code MX29F400CT MX29LV160DT MX25L12845E MX29GL256EH MX25L3206E MX29GL256FH MX25L12835F MX25R8035F MX29GL128FH MX25L51245G MX30LF1G18AC QV SS 2000 2000 2000 600 600 *1 2000 2000 600 *1 2000 ELFR Reject 0 0 0 0 0 0 0 0 0 0 0 SS 1 * *1 *1 *2 *2 *1 2000 *1 *2 *1 *1 Reject 0 0 0 NA NA 0 0 0 NA 0 0 *1: Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in this document. *2 : No ELFR test, the samples are only used for QV and NVCE test. 2-2. Non-Volatile Memory Cycling Endurance Test: NVCE@25°C Tech. EPN Code SS Reject 0.15 µm MX29F400CT 154 0 0.13 µm MX29LV160DT 38 0 0.11 µm MX25L12845E 38 0 *1 MX29GL256FH 0 75 nm MX25L12835F 38 0 *1 MX25R8035F 0 1 * 55 nm MX25L51245G 0 *1 36 nm MX30LF1G18AC 0 2-3. Data Retention Test: LTDR@25°C 500hrs Tech. EPN Code SS Reject 1 * 0.13 µm MX29LV160DT 0 *1 0.11 µm MX25L12845E 0 1 * MX29GL256FH 0 *1 75 nm MX25L12835F 0 1 * MX25R8035F 0 *1 55 nm MX25L51245G 0 1 * 36 nm MX30LF1G18AC 0 NVCE@85°C SS Reject 77 0 39 0 39 0 *1 0 39 0 *1 0 1 * 0 *1 0 HTDR@125°C 100hrs SS Reject 1 * 0 *1 0 1 * 0 *1 0 1 * 0 *1 0 1 * 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 4 of 7 2-4. Non-Volatile Memory Program/ Erase Endurance, Data Retention and Operation Life Test (For Automotive Product) a. High Temperature: Tech. EPN Code SS 0.11 µm 75 nm HTDR@150°C 500hrs SS Reject 1 * 0 NVCE@105°C HTOL@125°C 1000hrs SS Reject 1 * 0 MX29GL256EH * Reject 0 MX25L3206E *1 0 *1 0 *1 0 MX29GL128FH 231 0 *1 0 *1 0 1 b. Low Temperature: Tech. 0.11 µm 75 nm EPN Code MX29GL256EH MX25L3206E MX29GL128FH NVCE@25°C SS Reject 1 * 0 *1 154 LTDR@25°C 1000hrs SS Reject 1 * 0 0 *1 0 0 1 0 * 2-5 High Temperature Operating Life and High Temperature Storage Life Test: HTOL 1000hrs HTSL 1000hrs Tech. EPN Code SS Reject SS Reject 1 1 * * 0.15 µm MX29F400CT 0 0 1 1 * * 0.13 µm MX29LV160DT 0 0 1 1 * * 0.11 µm MX25L12845E 0 0 1 1 * * MX29GL256FH 0 0 1 1 * * 75 nm MX25L12835F 0 0 1 1 * * MX25R8035F 0 0 1 1 * * 55 nm MX25L51245G 0 0 1 1 * * 36 nm MX30LF1G18AC 0 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 5 of 7 2-6. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test: PC Tech. EPN Code SS Reject 0.15 µm MX29F400CT 231 0 0.13 µm MX29LV160DT 231 0 0.11 µm MX25L12845E 231 0 1 * MX29GL256FH 0 75 nm MX25L12835F 231 0 MX25R8035F 231 0 1 * 55 nm MX25L51245G 0 36 nm MX30LF1G18AC 231 0 TCT 500cycles SS 77 77 *1 *1 77 1 * *1 *1 Reject 0 0 0 0 0 0 0 0 PCT 96hrs HAST 96hrs SS 77 77 77 SS 77 77 77 *1 77 1 * *1 *1 Reject 0 0 0 0 0 0 0 0 Reject 0 0 0 0 0 0 0 0 *1 77 *1 *1 *1 3. XtraROM Quarterly reliability monitor results: 3-1. Quality Validation & Early Life Failure Rate: QV Tech. EPN Code 75 nm 32 nm MX23J51208YC MX23J16GC0TC SS 385 ELFR Reject 0 0 *1 SS 385 Reject 0 0 *1 *1: Means the test is “on going”. The results will be updated next quarter. The way of expression is applied to all tables in this document. 3-2. High Temperature Operating Life and High Temperature Storage Life Test: Tech. EPN Code 75 nm 32 nm MX23J51208YC MX23J16GC0TC HTOL 1000hrs SS Reject 1 * 0 1 * 0 HTSL 1000hrs SS Reject 1 * 0 1 * 0 3-3. Pre-Condition Test / Pressure Cooker Test / Temperature Cycling Test / Highly Accelerated Temperature and Humidity Stress Test: PC Tech. EPN Code SS Reject 75 nm 32 nm MX23J51208YC MX23J16GC0TC 231 1 * TCT 500cycles PCT 96hrs HAST 96hrs SS Reject SS Reject SS Reject 0 77 0 77 0 77 0 0 1 0 1 0 1 0 * * * The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 6 of 7 3-4. Electrostatic Discharge Sensitivity Test: Tech. EPN Code Mode HBM 75 nm MX23J51208YC CDM NTD Classification 2.0 KV 2.5 KV 3.0 KV 0.75 KV 1.0 KV SS 3 3 3 3 12 Reject 0 0 0 0 0 The information contained herein is the exclusive property of Macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of Macronix. Page 7 of 7